CN200986593Y - A examine and determine frame for alpha, beta surface contamination appearance - Google Patents
A examine and determine frame for alpha, beta surface contamination appearance Download PDFInfo
- Publication number
- CN200986593Y CN200986593Y CN 200620035543 CN200620035543U CN200986593Y CN 200986593 Y CN200986593 Y CN 200986593Y CN 200620035543 CN200620035543 CN 200620035543 CN 200620035543 U CN200620035543 U CN 200620035543U CN 200986593 Y CN200986593 Y CN 200986593Y
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- probe
- frame
- panel
- props
- supporter
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- Expired - Lifetime
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- 238000011109 contamination Methods 0.000 title claims abstract description 23
- 239000000523 sample Substances 0.000 claims abstract description 81
- 238000006073 displacement reaction Methods 0.000 claims description 10
- 230000008878 coupling Effects 0.000 claims description 2
- 238000010168 coupling process Methods 0.000 claims description 2
- 238000005859 coupling reaction Methods 0.000 claims description 2
- 230000003028 elevating effect Effects 0.000 abstract 2
- 210000003128 head Anatomy 0.000 description 4
- 238000012795 verification Methods 0.000 description 4
- 239000000463 material Substances 0.000 description 3
- 238000005259 measurement Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- 238000010008 shearing Methods 0.000 description 2
- 238000010276 construction Methods 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
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Abstract
The utility model provides a examine and decide frame for examining and determine alpha, beta surface contamination appearance, examine and determine the frame and contain frame, probe, support frame, standard source hold in the palm put the panel, be provided with and hold in the palm the replacement formula probe of putting the groove and hold in the palm and put the panel and cut the shape elevating platform, be connected with fixed end angle on the frame post all around of frame, still fixed being provided with the scale on the frame post, the probe is supported the ware and is connected with fixed end angle, standard source holds in the palm puts the panel and fixes the setting on cutting the shape elevating platform, replacement formula probe holds in the palm puts the panel setting on last frame. The utility model discloses an examine and decide frame for alpha, beta surface contamination appearance effectively protects the standard source not damaged when the operation, simple structure, and the operation is swift, can follow the difference of examination, calibration place, uses in a flexible way, improves examination, the work efficiency of calibration.
Description
Technical field
The utility model belongs to ionising radiation metering calibrating field, is specifically related to the calibrating frame of a kind of α of being used for, β surface contamination instrument.
Background technology
In the actinometry or radiation protection process of China, need to use a large amount of α, β surface contamination analyzer at present, the regulation of pressing measurement verification regulations JJG478-96 need be carried out compulsory verification to these α, β surface pollution measuring instrument and monitor in accordance with the law.Because shape, the size of α, β surface contamination instrument probe there are differences, when making calibrating, calibration, there are certain uncertainty in the height of source and detector, centre distance, cause examining and determine, the uncertainty of calibration result increases, have influence on actual measurement result the most at last, and in operation, also cause easily examining and determine with radioactivity plane source surface and be subjected to a certain degree damage.
Summary of the invention
In order to overcome calibrating or calibration α in the prior art; the uncertainty that causes during β surface contamination instrument increases; calibrating is subjected to a certain degree damage with the source; the unshielded deficiency of tested instrument probe; the utility model provides a kind of α of being used for; the calibrating frame of β surface contamination instrument; this calibrating frame is in calibrating or imitate accurate α; can reduce during β surface contamination instrument because of adjusting the error that distance is brought; improve the accuracy of verification result; avoid operation because of distance between the adjustment criteria source surface lies probe protection aperture plate; calibrating is caused damage with the source; the oblique back skating that also can prevent to pop one's head in falls, and has effectively protected by test examination instrument.
A kind of calibrating frame that is used for α, β surface contamination instrument of the present utility model contains that framework, probe supporter, standard source prop up panel, the displaced type probe props up panel and the lifting table of cultrating; Described framework is square two frame bodies that base is arranged, the probe supporter is made up of supporter support, supporter pole and swinging arms, its annexation is, be connected with the stiff end angle on the upright frame post around the framework, the supporter pole of probe supporter is connected with the stiff end angle, and supporter pole is connected with the supporter support by swinging arms; Also be set with rule on the upright frame post of the right-hand member of framework; The lifting table of cultrating is fixedly installed on the base center of framework, and the upper end of the lifting table of cultrating is provided with the lifting handwheel, also disposes the locking handwheel on the lifting handwheel.Standard source props up the upper surface that panel is fixedly installed on the lifting table of cultrating; The displaced type probe props up panel and is arranged on the upper frame of framework, be equipped with the displacement breach on four angles, the displaced type probe props up panel and flexibly connects by the stiff end angle on displacement breach and the framework, and the center that the displaced type probe props up panel is provided with the groove of placing by the calibrating probe that props up.
The groove that props up that the displaced type probe props up the center setting of panel is that square probe props up groove, also can be set to circular probe and prop up groove or other groove that props up corresponding to calibrating probe shape.
Described displaced type probe props up displacement breach and cun coupling of the stiff end angle square on the framework that is provided with on the panel.
Framework of the present utility model and stiff end welded corner joint form, and are mainly used in support, fix each parts, can be placed on ground or the desktop with the difference in calibrating, calibration place.Lifting table is set is fixed on the frame base center, lifting table adopts the lifting of cultrating to support, and the lappingout leading screw drives, and five on two guide rails are crossed detent mechanism, and are furnished with the locking handwheel.Lifting table is fixed on the frame base, can determine concrete distance by rule according to the requirement adjustment height of distance between difference probe protection aperture plate and the standard source surface, is fixed with the locking handwheel simultaneously.The source props up panel and is fixed on the lifting table, is used to deposit and asks calibrating to use the source.Displaced type probe props up panel and is arranged on the framework and is fixed by the stiff end angle, is used to prop up the probe by test examination instrument.Face plate center is provided with and props up groove, can be according to being designed by the difformity size of calibrating probe.The probe supporter is connected with the right front angle of calibrating frame stiff end, and during for the calibrating probe, the probe handle is by being placed on the probe supporter pole, and the oblique back skating that prevents to pop one's head in falls.Rule is fixed on the right back pillar of calibrating frame, specifically requires the distance of adjusting between read out protection aperture plate and the standard source surface.
In calibrating; when imitating accurate work; elder generation is according to the shape of the tested probe of instrument; selected good used displaced type probe props up panel; place the displaced type probe to prop up on the panel tested probe; measure calibrating then and set off the thickness of material with plane source; twist the lifting handwheel counterclockwise; lifting table is dropped to enough low; to examine and determine with the source and insert on the lifting table panel; continue clockwise shearing lifting handwheel; determine to adjust the height of lifting table according to rule, be elevated to the distance of standard source surface lies probe protection aperture plate requirement after, twisting locking handwheel will be apart from locking; adjust the direction of probe supporter then; the probe handle can be relied on, tested instrument probe is placed on the replaceable probe of calibrating frame props up on the panel slotted eye, handle relies on the oblique back skating that prevents to pop one's head on the probe supporter and falls.
A kind of calibrating frame that is used for α, β surface contamination instrument of the present utility model; in calibrating, the accurate instrument process of effect; avoid protecting the operation of distance between the aperture plate to give and examine and determine the damage that causes with the plane source surface because of adjustment criteria source surface lies probe; can reduce because of adjusting the error that distance is brought, improve the accuracy of verification result.The probe supporter is set, makes probe have the protection of support to prevent that oblique back skating from falling, and effectively protected by test examination instrument.Simple in structure, swift to operate, can be placed on the enterprising line operate of ground or desktop with the difference in calibrating, calibration place, improved the work efficiency of calibrating, calibration.
Description of drawings
The utility model is described in further detail below in conjunction with accompanying drawing
Fig. 1 is a kind of structure front elevation that is used for the calibrating frame embodiment of α, β surface contamination instrument of the present utility model
Fig. 2 is a kind of structure vertical view that is used for the calibrating frame embodiment of α, β surface contamination instrument of the present utility model
Fig. 3 is that the displaced type probe of the calibrating frame embodiment of a kind of α of being used for of the present utility model, β surface contamination instrument props up the panel construction synoptic diagram
Fig. 4 is a kind of probe supporter structural representation that is used for the calibrating frame embodiment of α, β surface contamination instrument of the present utility model.
Among the figure, 1. probe supporter 2. displaced types probe props up panel 3. standard sources and props up the panel 4. lifting handwheels 5. locking handwheels 6. rules 7. probe supporter supports 8. stiff end angles 9. lifting table 10. frameworks 11. square probes of cultrating and prop up groove 12. displacement breach 14. supporter pole swinging arms 15. supporter poles 16. supporter support swinging arms 17. stiff end angles
Embodiment
Embodiment 1
In Fig. 1～Fig. 4, the utility model is a kind of calibrating frame that is used to examine and determine α, β surface contamination instrument, contains that framework, probe supporter 1, standard source prop up panel 3, the displaced type probe props up panel 2 and the lifting table 9 of cultrating; The present embodiment middle frame is the framework 10 that square two frame stainless steels that base arranged are made, probe supporter 1 is made up of supporter support 7, supporter pole 15 and swinging arms (14,16), be welded with stiff end angle 8 on the upright frame post of framework 10, be provided with four stiff end angles all around altogether, the supporter pole 15 of probe supporter 1 is connected with the stiff end angle 17 at right front angle, and supporter pole 15 is connected with supporter support 7 by swinging arms (14,16); Also be set with rule 6 on the upright frame post of the right-hand member of framework 10; The lifting table 9 of cultrating is fixedly installed on the base center of framework 10, and the upper end of the lifting table 9 of cultrating is provided with lifting handwheel 4, also disposes locking handwheel 5 on the lifting handwheel 4.Standard source props up the upper surface that panel 3 is fixedly installed on the lifting table 9 of cultrating; The displaced type probe props up panel 2 and is arranged on the upper frame of framework 10, be equipped with displacement breach 12 on four angles, displaced type probe props up panel 2 and flexibly connects by displacement breach 12 and stiff end angle 8 on the framework 10, and the center that the displaced type probe props up panel 2 is provided with the groove of placing by the calibrating probe that props up.
The groove that props up that the displaced type probe props up the center setting of panel is that square probe props up groove 11.
The displaced type probe props up the displacement breach 12 of setting on the panel 2 and the size match at the stiff end angle on the framework 10.
A kind of α that is used for of the present utility model; the calibrating frame operation steps of β surface contamination instrument is: in calibrating; when imitating accurate work; elder generation is according to the shape of instrument probe; selected good used displaced type probe props up panel 2; measure calibrating and set off the thickness of material with plane source; twist lifting handwheel 4 counterclockwise; lifting table 9 is dropped to enough low; to examine and determine and insert the lifting table source with the source and prop up on the panel 3; continue clockwise shearing lifting handwheel 4 then; determine to adjust the height of lifting table 9 according to rule 6; after being elevated to the distance of standard source surface lies probe protection aperture plate requirement; twisting locking handwheel 5 will be apart from locking; adjust the height of probe supporter 1 then; direction; the probe handle can be relied on; tested instrument probe is placed on the replaceable probe of calibrating frame props up on panel 2 slotted eyes, handle relies on the oblique back skating that prevents to pop one's head on the probe supporter 1 and falls, and begins operation then.
The basic structure of embodiment 2 of the present utility model is identical with embodiment 1, and difference is that center that displaced type probe props up panel is provided with circular probe and props up groove, and framework is square two frame metal support bodys that base is arranged.
A kind of framework that is used for the calibrating frame of α, β surface contamination instrument of the present utility model also can be made of wooden, plastic or other material.
Claims (4)
1. calibrating frame that is used for α, β surface contamination instrument is characterized in that: contain that framework (10), probe supporter (1), standard source prop up panel (3), the displaced type probe props up panel (2) and the lifting table of cultrating (9); Described framework (10) is square two frame bodies that base is arranged, probe supporter (1) is made up of supporter support (7), supporter pole (15) and swinging arms (14,16), and supporter pole (15) and supporter support (7) junction are provided with swinging arms (14,16); Its annexation is, be connected with stiff end angle (8) on the upright frame post of framework (10), the supporter pole (15) of probe supporter (1) is connected with the stiff end angle (17) at right front angle, and supporter pole (15) is connected with supporter support (7) by swinging arms (14,16); Also be set with rule (6) on the upright frame post of the right-hand member of framework (10); The lifting table (9) of cultrating is fixedly installed on the base center of framework (10), and the upper end of the lifting table of cultrating (9) is provided with lifting handwheel (4), and standard source props up the upper surface that panel (3) is fixedly installed on the lifting table of cultrating (9); The displaced type probe props up panel (2) and is arranged on the upper frame of framework (10), be equipped with displacement breach (12) on four angles, displaced type probe props up panel (2) and flexibly connects by displacement breach (12) and stiff end angle (8) on the framework (10), and the center that the displaced type probe props up panel (2) is provided with the groove of placing by the calibrating probe that props up.
2. a kind of calibrating frame that is used for α, β surface contamination instrument according to claim 1 is characterized in that: the groove that props up that the center that described displaced type probe props up panel is provided with is that square probe props up groove (11).
3. a kind of calibrating frame that is used for α, β surface contamination instrument according to claim 1 is characterized in that: the groove that props up that the center that described displaced type probe props up panel is provided with is that circular probe props up groove.
4. a kind of calibrating frame that is used for α, β surface contamination instrument according to claim 1 is characterized in that: described displaced type probe props up panel (2) and goes up displacement breach and cun coupling of the stiff end angle square on the framework (10) that is provided with.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200620035543 CN200986593Y (en) | 2006-09-08 | 2006-09-08 | A examine and determine frame for alpha, beta surface contamination appearance |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200620035543 CN200986593Y (en) | 2006-09-08 | 2006-09-08 | A examine and determine frame for alpha, beta surface contamination appearance |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN200986593Y true CN200986593Y (en) | 2007-12-05 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 200620035543 Expired - Lifetime CN200986593Y (en) | 2006-09-08 | 2006-09-08 | A examine and determine frame for alpha, beta surface contamination appearance |
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| Country | Link |
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| CN (1) | CN200986593Y (en) |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102147476A (en) * | 2010-12-23 | 2011-08-10 | 中国原子能科学研究院 | Positioning and measuring support for high-purity germanium detector |
| CN105021763A (en) * | 2014-04-22 | 2015-11-04 | 天津天锐哥马克阻燃测试技术有限公司 | Inflaming retarding tester combustor adjusting device |
| CN105883694A (en) * | 2016-06-03 | 2016-08-24 | 中国工程物理研究院核物理与化学研究所 | Lifting system for radioactive building surface contamination measurement |
| CN107390254A (en) * | 2016-05-16 | 2017-11-24 | 中国辐射防护研究院 | A kind of high-precision positioner and method of distance adjustable calibrating installation |
| CN109061709A (en) * | 2018-06-14 | 2018-12-21 | 海南核电有限公司 | A kind of α, beta probe examine and determine radioactive stand |
| CN110941008A (en) * | 2019-12-17 | 2020-03-31 | 中国原子能科学研究院 | Portable detection device for α and β surface pollution meters |
| CN110988972A (en) * | 2019-10-12 | 2020-04-10 | 中国辐射防护研究院 | High-precision three-dimensional portable surface pollution instrument calibrating device |
-
2006
- 2006-09-08 CN CN 200620035543 patent/CN200986593Y/en not_active Expired - Lifetime
Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102147476A (en) * | 2010-12-23 | 2011-08-10 | 中国原子能科学研究院 | Positioning and measuring support for high-purity germanium detector |
| CN102147476B (en) * | 2010-12-23 | 2012-10-17 | 中国原子能科学研究院 | Positioning and measuring support for high-purity germanium detector |
| CN105021763A (en) * | 2014-04-22 | 2015-11-04 | 天津天锐哥马克阻燃测试技术有限公司 | Inflaming retarding tester combustor adjusting device |
| CN107390254A (en) * | 2016-05-16 | 2017-11-24 | 中国辐射防护研究院 | A kind of high-precision positioner and method of distance adjustable calibrating installation |
| CN107390254B (en) * | 2016-05-16 | 2021-12-17 | 中国辐射防护研究院 | High-precision positioning device and method of distance-adjustable calibration device |
| CN105883694A (en) * | 2016-06-03 | 2016-08-24 | 中国工程物理研究院核物理与化学研究所 | Lifting system for radioactive building surface contamination measurement |
| CN109061709A (en) * | 2018-06-14 | 2018-12-21 | 海南核电有限公司 | A kind of α, beta probe examine and determine radioactive stand |
| CN109061709B (en) * | 2018-06-14 | 2022-10-11 | 海南核电有限公司 | Radioactive source bracket for detecting alpha and beta probes |
| CN110988972A (en) * | 2019-10-12 | 2020-04-10 | 中国辐射防护研究院 | High-precision three-dimensional portable surface pollution instrument calibrating device |
| CN110988972B (en) * | 2019-10-12 | 2022-10-21 | 中国辐射防护研究院 | High-precision three-dimensional portable surface pollution instrument calibrating device |
| CN110941008A (en) * | 2019-12-17 | 2020-03-31 | 中国原子能科学研究院 | Portable detection device for α and β surface pollution meters |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CX01 | Expiry of patent term |
Granted publication date: 20071205 |
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| EXPY | Termination of patent right or utility model |