CN1825128A - LED tester - Google Patents
LED tester Download PDFInfo
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- CN1825128A CN1825128A CN 200510052584 CN200510052584A CN1825128A CN 1825128 A CN1825128 A CN 1825128A CN 200510052584 CN200510052584 CN 200510052584 CN 200510052584 A CN200510052584 A CN 200510052584A CN 1825128 A CN1825128 A CN 1825128A
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- light emitting
- emitting diode
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Abstract
The invention relates to a mass producing light emitting diode testing device. It includes a control module, at least integrating sphere testing module, and at least a test board. The integrating sphere testing module, each of which has electrical output, light output and a light intake, connects to the control module. The testing board setting corresponds to the integrating sphere, and each testing board has several LEDs. The light intake has a preset area that could cover preset quantity of LEDs. The integrating sphere testing module contains several probes corresponding to the quantity of LEDs that could test the electric feature of LEDs one to one.
Description
Technical field
The invention relates to a kind of light-emitting diode detection device, refer to a kind of light-emitting diode detection device that can produce in a large number, enhance productivity especially.
Background technology
Since the sixties in 19th century, light emitting diode began commercialization, because it is long to have high vibration strength, life-span, simultaneously power consumption is few, the heating degree is little, so its range of application spreads all over the every articles for use in the daily life, as the pilot lamp of tame electrical article and various instruments or light source etc.In recent years, because of the development of multicolour and high brightnessization, range of application is more towards the outdoor display development, as large-scale outdoor display board and traffic sign lamp etc.
Light emitting diode is to utilize to form a then interface between P type and the N-type semiconductor mutually, when its band structure when not applying any voltage, the P type can align mutually with the fermi level (Fermilevel) of N-type semiconductor, and is forming an electric field (promptly having an electrical potential energy) at the interface.And then add suitable forward bias voltage drop, and after electronics, hole are injected P type and N-type semiconductor two ends respectively, just can be at the P/N interface zone in conjunction with and luminous, promptly electronics falls back low-energy state by the high-energy situation and combines with the hole, and the form of energy with light discharged; By constantly injecting electronics, P side injected hole by the N side, make the action of " electronics, hole in conjunction with and luminous " continue to carry out, it is luminous that light emitting diode is continued; Different along with material and design, its characteristics of luminescence is also different thereupon.
Usually the light emitting diode product can carry out the test of its electric characteristics after completing, as forward bias voltage (Forward Bias Voltage, VF), reverse-breakdown voltage (VZ), inverse current (ReverseCurrent, IR), and the VF difference before and after the heating (Data Forward Voltage, DVF), the instantaneous peak value of VF (VFD) and optical characteristics are as light intensity (Luminous Intensity, Iv), peak wavelength (Peak Length, λ
p), ripple wide (HW), and chromaticity coordinate (ChromaticityCoordinates, CIE), main wavelength (Dominated Length, λ
d), colour purity (Purity), colour temperature (Color Temperature) etc., with further classify, flow process such as packing and shipment.Yet, if each procedure links has delay slightly, promptly influence subsequent product greatly and hand over phase and company image, the testing classification of known existing light emitting diode, be to confirm one by one again that to test electric characteristics one by one the mode of optical characteristics classifies, in fact do not meet the volume production demand of the light emitting diode that is subjected to widespread use gradually, significantly reduce production efficiency yet, increase company cost.
See also existing light-emitting diode detection device shown in Figure 1, it comprises the control module 10a that is made up of computing machine and peripherals thereof, be electrically connected to the optical gauge 20a of this processing unit 10a and be arranged at light emitting diode 30a under this optical gauge 20a; Wherein, the optical input 21a of this optical gauge 20a must be accurately corresponding on this light emitting diode 30a, otherwise the easy dissipation of light that this light emitting diode 30a discharges influences accuracy of measurement; This optical gauge 20a has light output 22a and electrically exports 23a in addition, and is connected respectively to this control module 10a; So, move this optical gauge 20a or this light emitting diode 30a separately to carry out correspondence no matter be, all need reach the purpose of accurate correspondence, it is luminous after conducting to utilize this light emitting diode 30a to connect a current source again, 20a measures its optical characteristics by this optical gauge, before or after this step, removable this optical gauge 20a or this light emitting diode 30a carry out the measurement of electric characteristics with contact the other side, according to the optics and the electric characteristics of gained this light emitting diode 30a are classified again.Yet these methods of testing one by one add the numerous and diverse of test event, and the huge light emitting diode of quantity will be I'm afraid useless worker consuming time by the test screening, and the bottleneck station that becomes significantly in the processing procedure is other.
So the inventor is thoughts on above-mentioned shortcoming, be that the spy concentrates on studies and cooperates the theoretical utilization and the consideration of the characteristic that is easy to carry, propose a kind of reasonable in design and effectively improve the present invention of above-mentioned shortcoming finally.
Summary of the invention
The invention provides a kind of LED tester, can once carry out the test of most light emitting diodes,, meet the volume production demand to enhance productivity.
The invention provides a kind of LED tester, the optical input that can utilize integrating sphere to have preliminary dimension is to be covered by the optic test of the most light emitting diodes under it.
The invention provides a kind of LED tester, can utilize integrating sphere that most probes are set, once to be covered by the testing electrical property of the most light emitting diodes under it.
This light emitting diode the invention provides a kind of LED tester, can utilize the most light emitting diodes of test board load, and design the layout of this test board, so that can carry out electrically or optic test according to demand by actual demand.
The invention provides a kind of LED tester, comprise control module, at least one integrating sphere test module and at least one test board.Wherein but this control module comprises CPU (central processing unit) with programmed logic control and the communications interface unit that is connected with this CPU (central processing unit); This integrating sphere test module is the communications interface unit that is connected to this control module, and each integrating sphere test module has electrical output, light output and an optical input; This test board is provided with corresponding to this integrating sphere test module, and each test board is to be placed with a plurality of light emitting diodes, each test board and layout thereon a plurality of electrical contacts corresponding to this light emitting diode are arranged, for output and input that should the required electric current of light emitting diode; Wherein, this optical input of this integrating sphere test module offers a predetermined area, this light emitting diode that can once contain predetermined quantity is below it, this integrating sphere test module includes the most probes corresponding to this light emitting diode of predetermined quantity, and can be simultaneously surveys the electric characteristics of this light emitting diode of predetermined quantity with contact one to one.
Description of drawings
Shown in Figure 1, be the synoptic diagram of existing light-emitting diode detection device;
Shown in Figure 2, be the synoptic diagram of LED tester of the present invention;
Shown in Figure 3, for LED tester of the present invention contain in correspondence with each other most integrating sphere proving installations and the synoptic diagram of test board.
Description of reference numerals:
10a control module 20a optical gauge
The output of 21a optical input 22a light
23a electrically exports the 30a light emitting diode
10 control modules, 11 CPU (central processing unit)
12 communications interface units, 13 software modules
20 integrating sphere test modules, 21 optical inputs
22 electrical delivery outlet 23 smooth delivery outlets
30 test boards, 40 light emitting diodes
50 constant current source, 60 motor units
Embodiment
Can further understand feature of the present invention and technology contents for the auditor is got, see also following about detailed description of the present invention and accompanying drawing; Yet accompanying drawing only provides reference and explanation usefulness, is not in order to restriction the present invention.
Integrating sphere is the ball chamber of a hollow, can offer input hole and the delivery outlet that quantity does not wait according to demand on the ball chamber, internal chamber wall is generally the coating with diffuse reflective nature, when integrating sphere during in practical application, tested light beam is injected from input hole, after the diffuse reflection through chamber wall complexity, by the luminous energy that the decision of the material of this coating is absorbed by the chamber wall, all the other penetrate from input hole and delivery outlet.Diffuse by collection and to carry out qualitative or quantitative test, the effect of integrating sphere is exactly to collect these by the light of light to be detected by detecting device that reflects from all directions, by special design, luminous power, waveform and the energy at place of portalling of can taking a sample can obtain the relevant parameter of former incident beam after the conversion.
The present invention promptly uses integrating sphere and carries out the light collection, need not integrating sphere accurately be set directly over light emitting diode, can collect enough light for detection, thereby learn the optical characteristics of this light emitting diode.
See also LED tester shown in Figure 2, the motor unit 60 that comprises control module 10 (can comprise full light territory photoelectricity test machine (YTSD02)), at least one integrating sphere test module 20, at least one test board 30 and be connected to this control module 10 and this integrating sphere test module 20.Wherein but this control module 10 comprises CPU (central processing unit) 11, communications interface unit 12 that is connected with this CPU (central processing unit) 11 with programmed logic control and the software module 13 that is connected with this CPU (central processing unit) 11; This integrating sphere test module 20 is the communications interface units 12 that are connected to this control module 10, and each integrating sphere test module 20 is to have electrical output 22, light delivery outlet 23 and optical input 21; This test board 30 is provided with corresponding to this integrating sphere test module 20, and each test board 30 is to be placed with a plurality of light emitting diodes 40, each test board 30 and layout thereon a plurality of electrical contacts corresponding to this light emitting diode 40 (accompanying drawing does not indicate) are arranged, for output and input that should light emitting diode 40 required electric currents; Wherein, this optical input 21 of this integrating sphere test module 20 offers a predetermined area, this light emitting diode 40 that can once contain predetermined quantity (majority) is below it, need not be through moving the optical characteristic test that this integrating sphere test module 20 can reach this light emitting diode 40 of predetermined quantity, this integrating sphere test module 20 includes the most probes (accompanying drawing does not indicate) corresponding to this light emitting diode 40 of predetermined quantity, and can be simultaneously survey the electric characteristics of this light emitting diode 40 of predetermined quantity with contact one to one, as forward bias voltage (Forward Bias Voltage, VF), reverse-breakdown voltage (VZ), inverse current (ReverseCurrent, IR), VF difference before and after the heating (Data Forward Voltage, DVF), instantaneous peak value of VF (VFD) or the like; Whereby, can shorten and test one by one each required time of light emitting diode 40 electric characteristics.
Wherein, this communications interface unit 12 comprises RS 485 communication interfaces, and this integrating sphere test module 20 is to be electrically connected to this control module 10 by these RS 485 communication interfaces; This test board 30 is to connect at least one constant current source 50, so that this light emitting diode 40 fixed currents (as Fig. 2) to be provided respectively; This test board 30 is the constant current source (accompanying drawing does not indicate) that connect predetermined quantity (quantity is equivalent to this light emitting diode 40), with this light emitting diode 40 of corresponding respectively to predetermined quantity and fixed current is provided.
This test board 30 is to be electrically connected at this control module 10, can control the conducting state of each light emitting diode 40 on this test board 30 respectively by this software module 13; Wherein, when testing the optical characteristics of each light emitting diode 40, as: light intensity (Luminous Intensity, Iv), peak wavelength (Peak Length, λ
p), ripple wide (HW), and chromaticity coordinate (Chromaticity Coordinates, CIE), main wavelength (Dominated Length, λ
d), colour purity (Purity), colour temperature (Color Temperature) etc., these light emitting diode 40 Be Controlled and the conducting in regular turn that are covered by predetermined quantity are luminance; Or this control module 10 can be by at least one operating unit (accompanying drawing indicate), as keyboard, mouse or the like, so as to artificial setting test and class condition are provided.
Wherein, this motor unit 60 is to be used for driving and controlling this 20 translations of integrating sphere test module and landing, is arranged at the top of this light emitting diode 40 of predetermined quantity to move this integrating sphere test module 20, and this motor unit can be servo motor or step motor.
By as can be known aforementioned, LED tester of the present invention has following advantage:
1. can once contain more light emitting diode,, record the electric characteristics of each light emitting diode simultaneously by the most probes that are arranged at this light emitting diode by being arranged at after light emitting diode on the test board drives with series system.
2. can once contain more light emitting diode, need not drive this light emitting diode one by one by this test board and discharge light through moving this integrating sphere test module to test the optical characteristics of each light emitting diode.
3. in correspondence with each other several integrating sphere test module and test boards can be set simultaneously, further to reach the volume production demand.
But the above only is a preferable possible embodiments of the present invention, non-so and limit to claim of the present invention, so the equivalent structure that every utilization instructions of the present invention and accompanying drawing content have been done changes, all should be contained in protection scope of the present invention.
Claims (11)
1. LED tester comprises:
Control module, but comprise CPU (central processing unit) with programmed logic control and the communications interface unit that is connected with this CPU (central processing unit);
At least one integrating sphere test module is connected to the communications interface unit of this control module, and each integrating sphere test module has electrical output, light output and an optical input; And
At least one test board, be provided with corresponding to this integrating sphere test module, each test board be placed with thereon a plurality of light emitting diodes, each test board also layout a plurality of electrical contacts corresponding to this light emitting diode are arranged, for output and input that should the required electric current of light emitting diode;
Wherein, this optical input of this integrating sphere test module offers a predetermined area, this light emitting diode that can once contain predetermined quantity is below it, this integrating sphere test module includes the most probes corresponding to this light emitting diode of predetermined quantity, and can be simultaneously surveys the electric characteristics of this light emitting diode of predetermined quantity with contact one to one.
2. LED tester as claimed in claim 1 is characterized in that, described communications interface unit comprises RS 485 communication interfaces, and described integrating sphere test module is to be electrically connected to this control module by these RS 485 communication interfaces.
3. LED tester as claimed in claim 1 is characterized in that described test board connects at least one constant current source, so that this light emitting diode fixed current to be provided respectively.
4. LED tester as claimed in claim 1 is characterized in that, described test board connects the constant current source of predetermined quantity, with this light emitting diode of corresponding respectively to predetermined quantity and fixed current is provided.
5. LED tester as claimed in claim 1, it is characterized in that, described control module further comprises software module, and this test board is to be electrically connected at this control module, can control the conducting state of each light emitting diode on this test board respectively by this software module.
6. LED tester as claimed in claim 5 is characterized in that, when testing the optical characteristics of each light emitting diode, this light emitting diode Be Controlled and the conducting in regular turn that are covered by predetermined quantity are luminance.
7. LED tester as claimed in claim 5 is characterized in that, described software module comprises the test and the class condition that can automatically perform.
8. LED tester as claimed in claim 1 is characterized in that, described control module can be passed through at least one operating unit, so as to artificial setting test and class condition are provided.
9. LED tester as claimed in claim 1 is characterized in that, described control module comprises full light territory photoelectricity test machine (YTSD02).
10. LED tester as claimed in claim 1 is characterized in that, also further comprises the motor unit that is connected to this control module and this integrating sphere test module, to drive and to control this translation of integrating sphere test module and landing.
11. LED tester as claimed in claim 10 is characterized in that, described motor unit comprises servo motor or step motor.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200510052584 CN1825128A (en) | 2005-02-22 | 2005-02-22 | LED tester |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200510052584 CN1825128A (en) | 2005-02-22 | 2005-02-22 | LED tester |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN1825128A true CN1825128A (en) | 2006-08-30 |
Family
ID=36935892
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 200510052584 Pending CN1825128A (en) | 2005-02-22 | 2005-02-22 | LED tester |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN1825128A (en) |
Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2010034140A1 (en) * | 2008-09-27 | 2010-04-01 | 中茂电子(深圳)有限公司 | A test table with solar cells for light-emitting components and a test method thereof |
| CN102096035A (en) * | 2010-11-22 | 2011-06-15 | 金天 | Thermal cycling load test system for diode |
| CN101581742B (en) * | 2008-05-15 | 2011-07-20 | 中茂电子(深圳)有限公司 | Detection machine station with contact impedance detection device |
| CN102183718A (en) * | 2011-02-25 | 2011-09-14 | 致茂电子(苏州)有限公司 | Method for testing light emitting diode crystal particle |
| CN102466787A (en) * | 2010-11-18 | 2012-05-23 | 亚旭电脑股份有限公司 | Light emitting diode array detection jig |
| CN102486520A (en) * | 2010-12-04 | 2012-06-06 | 展晶科技(深圳)有限公司 | Light emitting diode (LED) light source test device |
| CN101369550B (en) * | 2008-08-12 | 2012-07-11 | 中国电子科技集团公司第四十五研究所 | Gold thread break detection apparatus of full-automatic lead bonding machine |
| CN103487670A (en) * | 2012-06-08 | 2014-01-01 | 旺矽科技股份有限公司 | Photoelectric component detection method and detection equipment implementing same |
| CN105785254A (en) * | 2016-03-10 | 2016-07-20 | 厦门市三安光电科技有限公司 | Wafer testing device and testing method thereof |
| CN106405364A (en) * | 2016-08-31 | 2017-02-15 | 吉林华微电子股份有限公司 | Diode life tester provided with series test circuit |
| CN113884849A (en) * | 2020-06-17 | 2022-01-04 | Tcl科技集团股份有限公司 | Method and device for testing light-emitting diode device |
-
2005
- 2005-02-22 CN CN 200510052584 patent/CN1825128A/en active Pending
Cited By (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101581742B (en) * | 2008-05-15 | 2011-07-20 | 中茂电子(深圳)有限公司 | Detection machine station with contact impedance detection device |
| CN101369550B (en) * | 2008-08-12 | 2012-07-11 | 中国电子科技集团公司第四十五研究所 | Gold thread break detection apparatus of full-automatic lead bonding machine |
| CN102159957B (en) * | 2008-09-27 | 2013-04-10 | 中茂电子(深圳)有限公司 | Test table with solar cells for light-emitting components and test method thereof |
| WO2010034140A1 (en) * | 2008-09-27 | 2010-04-01 | 中茂电子(深圳)有限公司 | A test table with solar cells for light-emitting components and a test method thereof |
| CN102466787A (en) * | 2010-11-18 | 2012-05-23 | 亚旭电脑股份有限公司 | Light emitting diode array detection jig |
| CN102096035A (en) * | 2010-11-22 | 2011-06-15 | 金天 | Thermal cycling load test system for diode |
| CN102096035B (en) * | 2010-11-22 | 2012-08-08 | 金天 | Thermal cycling load test system for diode |
| CN102486520A (en) * | 2010-12-04 | 2012-06-06 | 展晶科技(深圳)有限公司 | Light emitting diode (LED) light source test device |
| CN102183718A (en) * | 2011-02-25 | 2011-09-14 | 致茂电子(苏州)有限公司 | Method for testing light emitting diode crystal particle |
| CN102183718B (en) * | 2011-02-25 | 2013-08-14 | 致茂电子(苏州)有限公司 | Method for testing light emitting diode crystal particle |
| CN103487670A (en) * | 2012-06-08 | 2014-01-01 | 旺矽科技股份有限公司 | Photoelectric component detection method and detection equipment implementing same |
| CN105785254A (en) * | 2016-03-10 | 2016-07-20 | 厦门市三安光电科技有限公司 | Wafer testing device and testing method thereof |
| CN106405364A (en) * | 2016-08-31 | 2017-02-15 | 吉林华微电子股份有限公司 | Diode life tester provided with series test circuit |
| CN113884849A (en) * | 2020-06-17 | 2022-01-04 | Tcl科技集团股份有限公司 | Method and device for testing light-emitting diode device |
| CN113884849B (en) * | 2020-06-17 | 2023-06-20 | Tcl科技集团股份有限公司 | Method and device for testing light-emitting diode device |
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