CN1818743A - Farady rotator and optical device comprising same, and antireflection film and optical device comprising same - Google Patents
Farady rotator and optical device comprising same, and antireflection film and optical device comprising same Download PDFInfo
- Publication number
- CN1818743A CN1818743A CNA200610019815XA CN200610019815A CN1818743A CN 1818743 A CN1818743 A CN 1818743A CN A200610019815X A CNA200610019815X A CN A200610019815XA CN 200610019815 A CN200610019815 A CN 200610019815A CN 1818743 A CN1818743 A CN 1818743A
- Authority
- CN
- China
- Prior art keywords
- light
- magnetic field
- faraday
- faraday rotor
- antireflection film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Landscapes
- Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)
Abstract
The invention relates to an optical device for polarizing light by changing its Faraday rotation angle, such as optical attenuators, optical switches or polarization controllers, and its object is to provide such an optical device which can be driven even by small-sized and power-saving magnetic circuits and in which the insertion loss in the Faraday rotator may be reduced. The optical device comprises a Faraday rotator formed of a garnet single crystal, and a magnetic circuit applying an external magnetic field H that is smaller than the saturation magnetic field Hs of the Faraday rotator to the Faraday rotator.
Description
The application is female case (application number: division 03101284.1).
Technical field
The present invention relates to adopt bismuth displacement rare earths iron garnet single crystal,, also relate to the light parts (optoisolator, light circulator, photoswitch, optical attenuator, plane of polarization controller etc.) that utilized this rotor the Faraday rotor that polarization surface is carried out reversible control.
In addition, the present invention relates to antireflection film that the surface at Bi displacement rare earths iron garnet material that Faraday rotor uses is formed and the light parts that adopted this film.
Background technology
The Bi displacement rare earths iron garnet film that is generated by liquid phase epitaxial method (LPE method) was widely used in optical communication system as the Faraday rotor that optoisolator is used in the past.Especially in recent years as other purposes that is different from optoisolator, in magnetooptics formula optical attenuator and photoswitch and polarized wave controller etc., adopted Faraday rotor, be used for WDM (optical wavelength multiplexing communication) system (such as, open flat 6-51255 communique with reference to the spy).
Optoisolator is by applying the external magnetic field to Faraday rotor, or makes Faraday rotor self become permanent magnet, makes the working direction of light and magnetic moment direction much at one, and faraday's rotation angle of regulation takes place.
On the other hand, in having utilized the light parts such as magnetooptics type optical attenuator of Faraday rotor, Faraday rotor is applied the external magnetic field H that its orientation is different from the working direction of light, faraday's rotation angle is reversibly changed.
At this moment, the saturation magnetic field Hs by applying Faraday rotor or its size (intensity) surpass the external magnetic field H in this magnetic field, reduce the diffraction of light loss that is caused by the magnetic region structure that Faraday rotor had.Magnetic anisotropy (growing response magnetic anisotropy) takes place in Faraday rotor on the direction of growth when rheotaxial growth, in the direction of growth formation easy magnetization orientation (easy magnetizing axis) of crystal.Therefore, light entrance face and crystal growth direction be quadrature almost, and under the situation of not implementing heat treated Faraday rotor, even light entrance face is applied oblique external magnetic field H, the orientation of magnetic moment also departs from the direction of growth of crystal hardly.
, under near 1000 ℃ high temperature, Faraday rotor is heat-treated for this reason, reduce the growing response magnetic anisotropy.Like this, easy magnetizing axis be not in crystal growth unidirectional<111〉orientation, and be in since shape magnetic anisotropy effect and with the approaching direction of the face direction of aufwuchsplate on exist other<111〉orientation.As shown in figure 24,<111〉there are 4 orientation in the orientation on substrate.The 1st orientation is vertical with substrate face<and 111〉orientation α, remaining 3 orientation<111〉orientation β 1, β 2, β 3 approximately be 20 ° angle with substrate face, from<111〉orientation α looks, and the angle between the orientation β 1-β 2, between the orientation β 2-β 3, between the orientation β 3-β 1 is respectively 120 °.When the growing response magnetic anisotropy reduced, the magnetic moment orientation was easy to towards the orientation parallel with substrate face owing to the shape effects of the epitaxial film of disk shape growth.Therefore the magnetic moment orientation will towards with the immediate orientation β 1 in the orientation that is parallel to substrate face, β 2, β 3 these 3 orientation.Like this, can surpass the variation that applies direction of the external magnetic field H of saturation magnetic field H s, change the magnetic moment orientation of Faraday rotor, obtain the variable Faraday rotor of its rotation angle according to its size.
Fig. 8 is the chart that expression puts on the relation of the external magnetic field H of Faraday rotor and faraday's rotation angle.Transverse axis is represented external magnetic field H (Oe), and the longitudinal axis is represented faraday's rotation angle (deg.).Curve α represents to have applied faraday's rotation angle under the H situation of external magnetic field to having implemented heat treated Faraday rotor, and curve β represents not applied faraday's rotation angle under the H situation of external magnetic field to implementing heat treated Faraday rotor.Transverse axis value Hs β represents not implement the size (intensity) of the saturation magnetic field Hs of heat treated Faraday rotor.Transverse axis value Hs α has represented to implement the size of the saturation magnetic field Hs of heat treated Faraday rotor.In the example of this external Fig. 8, external magnetic field H is the direction of growth that constitutes the garnet crystal of Faraday rotor, is applied to light incident exit direction.
The growing response magnetic anisotropy is more little, and according to the direction variation of external magnetic field H, the magnetic moment orientation is easy more to be moved.At high temperature carry out long thermal treatment more, the arrangement again of easy more generation atom, the growing response magnetic anisotropy reduces more.But saturation magnetic field Hs is also bigger simultaneously.Consequently, as shown in Figure 8, the saturation magnetic field Hs α that has reduced the Faraday rotor of growing response magnetic anisotropy by thermal treatment compares its value with the saturation magnetic field Hs β of the Faraday rotor of not heat-treating and greatly increases.
Therefore be used to make the magnet (permanent magnet or electromagnet) of the saturated external magnetic field H of Faraday rotor just to be maximization.Be configured for making the electromagnet of the variable magnetic field of the variable resultant magnetic field of faraday's rotation angle also to be maximization in addition, thereby be necessary the big electric current that circulates in coil, thereby the problem that manufacturing cost rises when being created in the light parts that carried this Faraday rotor and magnetic circuit and maximizing.If thermal treatment deficiency then can residual growing response magnetic anisotropy, even change the direction of external magnetic field H, the magnetic moment orientation does not also move, and faraday's rotation angle can not fully change.
In addition in this manual, even Faraday rotor being applied bigger magnetic field, the magnetic field of the minimum strength that faraday's rotation angle also no longer increases is as saturation magnetic field Hs.
As mentioned above, in the Bi displacement rare earths iron garnet single crystal film that generates by liquid phase epitaxial method the growing response magnetic anisotropy takes place on the film direction of growth.Therefore the magnetic moment orientation of garnet monocrystal film is fixed on the direction identical with the epitaxial growth direction.Faraday rotor to general optoisolator use, owing to use after making the magnetic moment orientation and the epitaxial growth direction of garnet monocrystal film being in identical direction, thereby can not have problems in the use based on the peculiar magnetic feature of this epitaxially grown garnet monocrystal film.
Yet, in the Faraday rotor under the formation of the changed faraday rotation angle of variable optical attenuator and so on, be necessary on the direction of the epitaxial growth direction that is different from garnet monocrystal film, to apply magnetic field, the epitaxial growth direction of the relative garnet monocrystal film in magnetic moment orientation is tilted.At this moment, stronger growing response magnetic anisotropy becomes the stopping cause that makes magnetic moment orientation tilt variation.Therefore by under the high temperature more than 1000 ℃, Bi displacement rare earths iron garnet single crystal film being heat-treated, weaken the growing response magnetic anisotropy, control towards the principle of the direction of externally-applied magnetic field according to the magnetic moment orientation, obtain the variable Faraday rotor of faraday's rotation angle (such as, open flat 10-1398 communique with reference to the spy).
If weaken the growing response magnetic anisotropy of garnet monocrystal film by thermal treatment, beyond the film direction of growth of garnet monocrystal film though the magnetic moment orientation is easy to also be difficult to towards the film direction of growth conversely.Therefore, compare bigger before the saturation magnetic field Hs of the film direction of growth of the garnet monocrystal film after the thermal treatment and the thermal treatment.The externally-applied magnetic field intensity of the film direction of growth is slowly increased since 0, and measure faraday's rotation angle, the externally-applied magnetic field when faraday's rotation angle is no longer changed is as saturation magnetic field Hs.Fig. 2 represents the state that almost vertically has been applied to the light entrance face of Faraday rotor 1 less than the external magnetic field H (not shown) of saturation magnetic field Hs.As shown in Figure 2, because the part of magnetic moment 2 is towards adding magnetic direction, other parts are towards in the other direction, thereby garnet monocrystal film has different magnetic region structures.
If under having applied, have the light Ii of specific polarization face, then will become magnetic moment 2 has the different polarization face in forward and reverse zone light to Faraday rotor 1 incident less than the state of the external magnetic field H of saturation magnetic field Hs.Therefore as shown in Figure 2, diffraction of light will take place, diffraction light Ir is used as scattered light output, and output light Io reduces, and light loss takes place, thereby has used the light loss of the light parts of Faraday rotor 1 to increase.
Therefore, the thermal treatment that is used to weaken the growing response magnetic anisotropy of garnet monocrystal film is necessary that by when applying external magnetic field H and can easily change the orientation of magnetic moment 2, the condition of selecting saturation magnetic field Hs as far as possible not increase is implemented.But, for having implemented heat treated Faraday rotor under the condition of foregoing satisfying, can take place owing to apply the repeatability reduction in the magnetic moment orientation when making the magnetic moment orientation consistent behind the magnetic field, thereby can not correctly change the problem of faraday's rotation angle in required scope with the externally-applied magnetic field direction.Therefore can take place such as the problem that can not obtain enough decay by magnetooptics type optical attenuator.
Prior art 3
Antireflection film is the reflection of light that takes place at the interface that light parts and the material different with its refractive index join for preventing, at the light entrance face of light parts and the optical thin film of light-emitting face formation.
In the various smooth parts that in optical communication system, adopt, also form antireflection film, reduce and reflect the light that returns that causes by interface at light transmission.In the Faraday rotor that in the optoisolator of the passive component of using as optical communication and optical attenuator, is used, also form antireflection film, be assembled in the device on its light incident/outgoing two sides.The antireflection film of Faraday rotor is as the magnetic garnet of the constituent material of Faraday rotor and the interface of air, or the interface of magnetic garnet and epoxy resin resin is formed.The epoxy resin resin is used for bonding Faraday rotor and other light parts, and light sees through from its bonding plane.
Open in the flat 4-230701 communique disclosedly as the spy, these antireflection films generally are made of the film of the different various material of the refractive index that adopts vapour deposition method to form.Therefore, traditional antireflection film is according to being that the principle that the light of a kind of specific wavelength of using in the optical communication system of 1310nm and 1550nm obtains antiradar reflectivity is formed such as wavelength X.
Along with the swift and violent increase of amount of communication data in recent years, present optical communication technique makes the light wavelength λ that uses in the communication reach a plurality of by adopting wavelength multiplexing (WDM) optical communication system, realizes the significantly enhancing of message capacity thus.The light that uses in this wavelength multiplexing optical communication is compared with traditional single wavelength light, and multi-wavelength's light disperses in broadband, passes through from optical fiber and light passive component.But in present optical communication technique,, reach in the Faraday rotor of 45 degree (deg.), form the antireflection film that the single wavelength light of 1550nm is had antiradar reflectivity in faraday's rotation angle for light such as the 1550nm wavelength.Therefore in this antireflection film, can not give full play to anti-reflective function for the light of wavelength beyond the 1550nm.Therefore the light that wavelength beyond the 1550nm occurs returns light in the light entrance face of the Faraday rotor back that is reflected, perhaps the problem of the insertion of Faraday rotor loss increase.
In addition, because that the wavelength that uses in the wavelength multiplexing optical communication system has is a plurality of, thereby the Faraday rotor that uses in these light sources is made according to the principle that the light rotation angle for specific wavelength reaches 45deg..If because magnetic garnet has incident light wavelength difference then the also different characteristic of faraday's rotation angle, thereby be necessary to make the Faraday rotor that every kind of wavelength rotation angle is all reached 45deg..Thereby in the evaporation operation of the antireflection film of prior art, for each wavelength with each Faraday rotor of making in, formed for this wavelength and be best antireflection film.Because antireflection film becomes embrane method to form by batch processing by the evaporation equal vacuum, if thereby number of wavelengths increase, then membrane formation times also increases, the operation that produces antireflection film becomes complicated, the problem that productivity descends.
Summary of the invention
The object of the present invention is to provide the light parts that can adopt the little magnetic circuit of small-sized power consumption and the insertion of Faraday rotor loss can be suppressed to low degree.
In addition, even the object of the present invention is to provide Bi displacement rare earths iron garnet single crystal film is heat-treated, weaken the growing response magnetic anisotropy, also can make faraday's rotation angle stable and variable, and the bigger Faraday rotor of variable-angle and adopted the light parts of this rotor.
In addition, the object of the present invention is to provide in broadband and obtain the antireflection film that can easily form with low cost of antiradar reflectivity and the light parts that adopted this film.
Above-mentioned the 1st purpose reaches by following smooth parts, and these light parts are characterised in that: have Faraday rotor, it is formed by garnet crystal; Magnetic circuit, its external magnetic field H less than the saturation magnetic field Hs of above-mentioned Faraday rotor is applied to above-mentioned Faraday rotor.
The light parts of the invention described above are characterised in that: above-mentioned garnet crystal is with Bi
aA
3-aFe
5-xM
xO
12(here, A is more than one the element of Y, Lu, Yb, Er, Ho, Dy, Tb, Gd, Eu, Sm, Nd, Pr, Ce, La, Pb, Ca, and a satisfies 0.6≤a≤2.0.M is more than one the element of Ga, Al, Sc, In, Si, Ge, Ti, Au, Ir, Pt, and x satisfies 0≤x≤1.5.) expression.
The light parts of the invention described above are characterised in that: above-mentioned garnet crystal is with Bi
bA
cB
3-b-cFe
5-xM
xO
12(here, A is more than one the element of Y, Lu, Yb, Er, Ho, Eu, Sm, Nd, Pr, Ce, La, Pb, Ca, and B is more than one the element of Tb, Gd, Dy, and b and c satisfy 0.6≤b≤2.0,0.6<b+c≤3.0.M is more than one the element of Ga, Al, Sc, In, Si, Ge, Ti, Au, Ir, Pt, and x satisfies 0≤x≤1.5.) expression.
The light parts of the invention described above are characterised in that: big or small the said external magnetic field H as | H|, and big or small above-mentioned saturation magnetic field Hs as | Hs|, 0.4 * | Hs|<| H|<| the scope of Hs| applies above-mentioned external magnetic field H.
The light parts of the invention described above are characterised in that: above-mentioned magnetic circuit applies above-mentioned external magnetic field H to the light entrance face of above-mentioned Faraday rotor is oblique.
The light parts of the invention described above are characterised in that: above-mentioned magnetic circuit is applied to above-mentioned Faraday rotor to the said external magnetic field H as the resultant magnetic field in a plurality of magnetic fields.
Above-mentioned in addition the 2nd purpose reaches by following Faraday rotor, it is characterized in that: have garnet crystal, if the saturated rotation angle when almost vertical direction has applied saturation magnetic field Hs at the light entrance face to above-mentioned garnet crystal is made as Fs, the faraday's rotation angle F when then having applied the external magnetic field H of 0.9 dual intensity of above-mentioned saturation magnetic field Hs satisfies the relation of 1>F/Fs 〉=0.96.
The Faraday rotor of the invention described above is characterized in that: above-mentioned garnet crystal is with Bi
aA
3-aFe
5-xM
xO
12(here, A is more than one a element among Y, Lu, Yb, Er, Ho, Dy, Tb, Gd, Eu, Sm, Nd, Pr, Ce, La, Pb, the Ca, and a satisfies 0.6≤a≤2.0.M is more than one a element among Ga, Al, Sc, In, Si, Ge, Ti, Au, Ir, the Pt, and x satisfies 0≤x≤1.5.) expression.
The Faraday rotor of the invention described above is characterized in that: above-mentioned garnet crystal is with Bi
bA
cB
3-b-cFe
5-xM
xO
12(here, A is more than one a element among Y, Lu, Yb, Er, Ho, Eu, Sm, Nd, Pr, Ce, La, Pb, the Ca, and B is the element more than a kind among Tb, Gd, the Dy, and b and c satisfy 0.6<b≤2.0,0.6<b+c≤3.0.M is more than one a element among Ga, Al, Sc, In, Si, Ge, Ti, Au, Ir, the Pt, and x satisfies 0≤x≤1.5.) expression.
The Faraday rotor of the invention described above is characterized in that: the size of control said external magnetic field H changes above-mentioned faraday's rotation angle F.
In addition, above-mentioned purpose reaches by following smooth parts, it is characterized in that: the Faraday rotor with the invention described above; The said external magnetic field H is applied to the magnetic circuit of above-mentioned Faraday rotor.
Above-mentioned in addition the 3rd purpose reaches by following antireflection film, it is characterized in that: on substrate face, satisfy the 1Ta of 0.17≤nd/ λ≤0.80
2O
5The 1SiO of layer, satisfied 0.02≤nd/ λ≤0.54
2The 2Ta of layer, satisfied 0.16≤nd/ λ≤0.38
2O
5The 2SiO of layer, satisfied 0.20≤nd/ λ≤0.29
2Layer is by this order stacked (at this, λ sees through light wavelength, and n is the refractive index of each layer, and d is the thickness of each layer).
In the antireflection film of the invention described above, be characterised in that: the opposite side of above-mentioned substrate face contacts with air.
The antireflection film of the invention described above is characterised in that: with the above-mentioned light wavelength λ that sees through is the center, is below 0.1% at the wavelength band reflectivity of λ ± 70nm.
The antireflection film of the invention described above is characterised in that: above-mentioned wavelength X is 1310nm≤λ≤1750nm.
In addition, above-mentioned purpose reaches by the following light parts of garnet crystal that adopted, and it is characterized in that: at the light entrance face and the light-emitting face of above-mentioned garnet crystal, be formed with the antireflection film of the invention described above.
The light parts of the invention described above are characterised in that: above-mentioned garnet crystal is with Bi
aA
3-aFe
5-xM
xO
12(here, A is more than one the element of Y, Lu, Yb, Er, Ho, Dy, Tb, Gd, Eu, Sm, Nd, Pr, Ce, La, Pb, Ca, M is more than one the element of Ga, Al, Sc, In, Si, Ge, Ti, Au, Ir, and a and x satisfy 1.0≤a≤2.4,0<x≤1.5.) expression.
The light parts of the invention described above are characterised in that: above-mentioned garnet crystal is with Bi
aA
bB
3-a-bFe
5-xM
xO
12(here, A is more than one the element of Er, Dy, Tb, Sm, Nd, Pr, B is more than one the element of Y, Lu, Yb, Ho, Gd, Ce, La, Pb, Ca, M is more than one the element of Ga, Al, Sc, In, Si, Ge, Ti, Au, Ir, and a, b and x satisfy 1.0≤a≤2.4,0≤b≤0.1,0<x≤1.5.) expression.
The light parts of the invention described above are characterised in that: at light wavelength λ is the four corner of 1460nm≤λ≤1530nm, and the reflection of light rate is below 0.1%.
The light parts of the invention described above are characterised in that: at light wavelength λ is the four corner of 1530nm≤λ≤1565nm, and the reflection of light rate is below 0.1%.
The light parts of the invention described above are characterised in that: at light wavelength λ is the four corner of 1565nm≤λ≤1625nm, and the reflection of light rate is below 0.1%.
The light parts of the invention described above are characterised in that: above-mentioned garnet crystal is used as Faraday rotor and uses.
Above-mentioned purpose reaches by following optoisolator in addition, and this optoisolator has the Faraday rotor that is formed with antireflection film at light incident/exit facet, it is characterized in that: above-mentioned antireflection film is above-described antireflection film of the present invention.
In addition, above-mentioned purpose reaches by following optical attenuator, and this optical attenuator has the Faraday rotor that is formed with antireflection film at light incident/exit facet, it is characterized in that: above-mentioned antireflection film is above-described antireflection film of the present invention.
Description of drawings
Fig. 1 is based on the operating principle explanation of the light parts of embodiment of the present invention 1, is the accompanying drawing of size (intensity) relation of explanation magnetic moment direction and external magnetic field H.
Fig. 2 is based on the operating principle explanation of the light parts of embodiment of the present invention 1, is the explanation magnetic moment direction and accompanying drawing based on the light loss relation of diffraction light.
Fig. 3 is an accompanying drawing of representing not implement heat treated Faraday rotor magnetic region structure.
Fig. 4 accompanying drawing that to be the explanation magnetic moment direction of having implemented heat treated Faraday rotor 1 concern with the size (intensity) of external magnetic field H.
Fig. 5 is expression to having implemented the chart that external magnetic field H that heat treated Faraday rotor 1 applies and faraday's rotation angle concern.
Fig. 6 is the summary formation accompanying drawing of expression based on the related light parts of the embodiment 1-1 of embodiment of the present invention 1.
Fig. 7 is the accompanying drawing of expression based on the change action of faraday's rotation angle of light parts shown in Figure 6.
Fig. 8 chart that to be expression external magnetic field H that Faraday rotor is applied concern with faraday's rotation angle.
Fig. 9 is to the operating principle key diagram based on the Faraday rotor of embodiment of the present invention 2.Transverse axis is represented heat treatment time, the hypomere of the longitudinal axis is represented the intensity (Oe) of the saturation magnetic field Hs of the film direction of growth, faraday's rotation angle (deg.) is represented in the stage casing, the ratio F/Fs of the saturated rotation angle Fs when the faraday's rotation angle F when epimere has represented to apply the magnetic field of 0.9 dual intensity of saturation magnetic field Hs has applied saturation magnetic field Hs relatively.
Figure 10 is the operating principle of explanation based on the Faraday rotor of embodiment of the present invention 2, and the accompanying drawing that the magnetic moment direction of not implementing heat treated Faraday rotor and external magnetic field H concern be described.
Figure 11 is the operating principle of explanation based on the Faraday rotor of embodiment of the present invention 2, and the accompanying drawing that the magnetic moment direction of having implemented heat treated Faraday rotor and external magnetic field H concern be described.
Figure 12 is the operating principle of explanation based on the Faraday rotor of embodiment of the present invention 2, and the accompanying drawing that the faraday's rotation angle of not implementing heat treated Faraday rotor and external magnetic field H concern be described.
Figure 13 is the operating principle of explanation based on the Faraday rotor of embodiment of the present invention 2, and the accompanying drawing that the faraday's rotation angle of having implemented heat treated Faraday rotor and external magnetic field H concern be described.
Figure 14 is expression based on the Faraday rotor of embodiment of the present invention 2 and the accompanying drawing that adopted the summary of the optoisolator of this rotor to constitute.
Figure 15 is expression based on the Faraday rotor of embodiment of the present invention 2 and the accompanying drawing that adopted the summary of the optical attenuator of this rotor to constitute.
Figure 16 is that the light incident/outgoing two sides that is illustrated in magnetite garnet monocrystal chip 31 has formed the accompanying drawing based on the state of the antireflection film of embodiment of the present invention 3.
Figure 17 is that light incident/outgoing two sides of being illustrated in magnetite garnet monocrystal chip 31 has formed the accompanying drawing based on the state of the antireflection film among the embodiment 1 of embodiment of the present invention 3.
Figure 18 is the accompanying drawing of expression based on the related antireflection film characteristic of the embodiment 3-1 of embodiment of the present invention 3.
Figure 19 is the accompanying drawing of expression based on the related antireflection film characteristic of the embodiment 3-2 of embodiment of the present invention 3.
Figure 20 is the accompanying drawing of expression based on the related antireflection film characteristic of the embodiment 3-3 of embodiment of the present invention 3.
Figure 21 is the accompanying drawing of expression based on the related antireflection film characteristic of the embodiment 3-4 of embodiment of the present invention 3.
Figure 22 is the accompanying drawing of expression based on the related antireflection film characteristic of the embodiment 3-5 of embodiment of the present invention 3.
Figure 23 is the accompanying drawing of expression based on the related antireflection film characteristic of the comparative example of embodiment of the present invention 3.
Figure 24 be the explanation easy magnetizing axis not with crystal growth unidirectional<111〉orientation, and with the approaching direction of the face direction of aufwuchsplate on other<111〉orientation accompanying drawing.
Embodiment
[embodiment 1]
Utilize Fig. 1 to Fig. 7 that the light parts based on embodiment of the present invention 1 are explained.At first, utilize Fig. 1 to Fig. 4 that the operating principle based on the light parts of present embodiment is explained.Fig. 1 is the accompanying drawing of relation of the size (intensity) of explanation magnetic moment direction and external magnetic field H.Fig. 2 is the explanation magnetic moment direction and accompanying drawing based on the relation of the light loss of diffraction light.Fig. 1 and Fig. 2 represent not implement heat treated Faraday rotor 1.The crystal growth direction of the light entrance face of Faraday rotor 1 and garnet crystal quadrature almost in addition.
Shown in Fig. 1 (a), at crystal growth direction easy magnetizing axis is arranged owing to constitute the garnet crystal of not implementing heat treated Faraday rotor 1, thereby the part of the magnetic moment in the Faraday rotor under not applying magnetic field state 12 is towards a direction of easy magnetizing axis, remaining forms different magnetic region structures towards reverse direction.
Shown in Fig. 1 (b), when behind the external magnetic field H that applies on the Faraday rotor 1 greater than saturation magnetic field H s, magnetic moment 2 forms identical magnetic region structure at four corner facing one direction.Such as the light Ii of the wavelength that uses as 1550nm, even the light loss (inserting loss) that is caused by the magnetic region structure can not take place to Faraday rotor 1 incident of this state yet in optical communication.But, apply external magnetic field H less than saturation magnetic field Hs after, as shown in Figure 2, the part of magnetic moment 2 is towards the direction of externally-applied magnetic field, remainder has different magnetic region structures towards reverse direction.Fig. 3 is a microphotograph of representing not implement the magnetic region structure of heat treated Faraday rotor 1.As shown in Figure 3, the magnetic region of Faraday rotor 1 structure is the diffraction trellis.Not applying the light incident on Faraday rotor 1 that makes rectilinearly polarized light under the state in magnetic field, observed output light by polariscope.Enlargement factor is 50 times.After having the light Ii of specific polarization face, then will become magnetic moment 2 has the different polarization face in forward and reverse zone light in incident on the Faraday rotor under this state 1.Therefore as shown in Figure 2, diffraction of light will take place, diffraction light Ir is used as scattered light output, and output light Io reduces, and light loss takes place.
Fig. 4 is the accompanying drawing of the relation of the explanation size (intensity) of having implemented the magnetic moment direction of heat treated Faraday rotor 1 and external magnetic field H.In addition, the crystal growth direction of the light entrance face of Faraday rotor 1 and garnet crystal quadrature almost.
Shown in Fig. 4 (a), constitute the garnet crystal carried out heat treated Faraday rotor 1 from easy magnetizing axis and crystal growth unidirectional<111〉orientation become with the approaching direction of the face direction of aufwuchsplate on other<111〉orientation, the part of the magnetic moment 2 in the Faraday rotor 1 under the no externally-applied magnetic field state is towards a direction of easy magnetizing axis, remainder forms different magnetic region structures towards reverse direction.
Shown in Fig. 4 (c), applying under the situation greater than the external magnetic field H of saturation magnetic field Hs having carried out heat treated Faraday rotor 1, same with the situation of the Faraday rotor of not heat-treating, magnetic moment 2 facing one direction, the magnetic region structure reaches identical, and light loss does not take place.
Relative therewith, shown in Fig. 4 (b), only applying under the situation than the external magnetic field H of the little ormal weight of saturation magnetic field Hs having carried out heat treated Faraday rotor 1, owing to lose the growing response magnetic anisotropy, thereby magnetic moment 2 does not produce clear and definite magnetic region structure all towards the direction of the direction that approaches external magnetic field H in Faraday rotor 1.Even therefore apply external magnetic field H less than saturation magnetic field Hs, a spot of optical diffraction also only takes place, light loss takes place hardly.Even but carried out heat treated Faraday rotor 1, if external magnetic field H less than setting, then the structure of magnetic region will reach clearly, and the light loss based on diffraction takes place.
According to the explanation that utilizes Fig. 8 to do, the size of saturation magnetic field Hs becomes big after the growing response magnetic anisotropy of Faraday rotor though remove by thermal treatment, but as mentioned above, even apply the external magnetic field H than the little ormal weight of saturation magnetic field Hs, light loss can not reach the such big value of characteristic that is enough to have influence on device yet.Like this, if apply external magnetic field H less than saturation magnetic field Hs, with control faraday rotation angle, the magnetic circuit that then is used to take place magnetic field can become small-sized, and the current sinking of electromagnet also can reduce.Consequently, can realize having adopted the miniaturization and the low consumption electrification of the light parts of Faraday rotor and magnetic circuit.
Fig. 5 is expression to the chart of the relation of having implemented external magnetic field H that heat treated Faraday rotor 1 applies and faraday's rotation angle, represents the curve identical with curve α shown in Figure 8.Transverse axis is represented external magnetic field H (Oe), and the longitudinal axis is represented faraday's rotation angle (deg.).The value Hs of transverse axis has represented to implement the size of the saturation magnetic field Hs of heat treated Faraday rotor.Value 0.4 * the Hs of transverse axis represents roughly 4 one-tenth the size of saturation magnetic field Hs in addition.In addition, in Fig. 5, the direction of growth as the garnet crystal that constitutes Faraday rotor applies external magnetic field H in light incident exit direction.
Experimental result as shown in Figure 5, roughly after 4 one-tenth of intensity of the saturation magnetic field Hs of heat treated Faraday rotor 1 have been implemented when external magnetic field H reduction, magnetic region structure in the Faraday rotor 1 becomes clear and definite, will increase based on the light loss of diffraction, thereby will have problems as the characteristic of light parts.Therefore, if the size of saturation magnetic field Hs when the light incident direction has applied external magnetic field H is made as | Hs| is made as the size of external magnetic field H | H|, then | and H| is preferably less than | Hs|, and is | the magnetic field intensitys more than 4 one-tenths of Hs|.That is, be preferably in the size that adopts external magnetic field H in the scope shown in two arrow d of Fig. 5 | H|.If to having implemented heat treated Faraday rotor 1 applies 4 one-tenth intensity of saturation magnetic field Hs on the incident direction of light external magnetic field H, magnetic moment 2 will be almost towards magnetic direction, and faraday's rotation angle will reach about 9 one-tenth value of the rotation angle that has applied saturation magnetic field Hs.Under this condition, can not form clear and definite magnetic region structure, light loss is also little.
The garnet crystal that constitutes Faraday rotor 1 is with Bi
aA
3-aFe
5-xM
xO
12(here, A is more than one the element of Y, Lu, Yb, Er, Ho, Dy, Tb, Gd, Eu, Sm, Nd, Pr, Ce, La, Pb, Ca, and a satisfies 0.6≤a≤2.0.M is more than one the element of Ga, Al, Sc, In, Si, Ge, Ti, Au, Ir, Pt, and x satisfies 0≤x≤1.5.) expression.
The garnet crystal that perhaps constitutes Faraday rotor 1 is with Bi
bA
cB
3-b-cFe
5-xM
xO
12(here, A is more than one the element of Y, Lu, Yb, Er, Ho, Eu, Sm, Nd, Pr, Ce, La, Pb, Ca, and B is more than one the element of Tb, Gd, Dy, and b and c satisfy 0.6≤b≤2.0,0.6<b+c≤3.0.M is more than one the element of Ga, Al, Sc, In, Si, Ge, Ti, Au, Ir, Pt, and x satisfies 0≤x≤1.5.) expression.
If in the main composition of magnetite garnet rare earth family, adopt Gd, Tb or Dy, then can reduce saturation magnetic field Hs, effective for the reduction of the miniaturization of magnetic circuit and power consumption.As its effect,, then effective especially like this if in chemical formula, be made as the amount of 0<3-b-c≤2.4.
If the amount of Bi becomes in chemical formula below 0.6, then faraday's coefficient of rotary (rotation angle/rotor thickness) will diminish, and for obtaining faraday's rotation angle of regulation, the thickness of Faraday rotor will thicken, and it is difficult that the generation of single crystal film will become.If the amount of Bi becomes in chemical formula more than 2.0 in addition, then formation condition can not obtain to have the single crystal film of good quality with instability when the epitaxial growth of single crystal film.Therefore, the Bi amount preferably is in 0.6≤a≤2.0 in above-mentioned chemical formula, or the scope of 0.6≤b≤2.0.
Though M is the element of replaceable Fe, adding these elements is effective for the saturation magnetic field Hs that reduces Faraday rotor.But, if in chemical formula these elements are replaced with Fe more than 1.5, then the Curie point of magnetite garnet will drop to below the operating temperature (such as room temperature (about 25 ℃)), no longer can play the effect of Faraday rotor.Therefore the amount of M is preferably 0≤x≤1.5.
In sum, if in the Faraday rotor 1 of the direction-agile of magnetic moment 2, make light incident, orientation and the intensity of the external magnetic field H that change applies on Faraday rotor 1, then faraday's rotation angle that plane of polarisation received of light can change, and can constitute rotation angle changeable type Faraday rotor 1.In this Faraday rotor 1 and magnetic circuit, if the saturation magnetic field Hs of Faraday rotor 1 is made as | Hs|, by satisfy 0.4 * | Hs|<| H|<| the external magnetic field H of the relation of Hs| is applied to Faraday rotor 1, can constitute the little magnetic circuit of small-sized power consumption, can be suppressed to the light loss of Faraday rotor 1 lower simultaneously.This effect is being synthesized the magnetic field in 2 magnetic fields not being but single magnetic field has been applied under the situation in orientation of the working direction that is different from light also effective.
Below utilize specific embodiment to be explained.
[embodiment 1-1]
Generate it by liquid phase epitaxial method and consist of Bi
1.2Gd
1.2Yb
0.5Pb
0.05Fe
4.15Ga
0.8Pt
0.01Ge
0.04O
12Magnetite garnet single crystal film, made sheet magnetite garnet monocrystalline after the processing.The limit changes big or small limit in vertical direction the substrate face of the single-chip produced is applied external magnetic field H, has measured faraday's rotation angle.Even also no longer the minimum external magnetic field H of increase is as saturation magnetic field Hs applying external magnetic field H faraday rotation angle, at room temperature the saturation magnetic field Hs of Ce Dinging is | Hs|=110Oe.
This monocrystal chip carried out 30 hours thermal treatment under 1100 ℃, the saturation magnetic field Hs so that same method is at room temperature measured is illustrated in figure 5 as | Hs|=240Oe.Garnet crystal after the thermal treatment end is further processed, at the plane of incidence and the exit facet evaporation antireflection film (AR coating) of light, as Faraday rotor 1.On the Faraday rotor of producing 1, apply the size of saturation magnetic field Hs in the incident exit direction of light | the external magnetic field H of Hs|=240Oe, when the insertion loss of assessment light, be that faraday's rotation angle is 30deg. (degree) (with reference to Fig. 5) under the 0.03dB inserting loss.The intensity of the external magnetic field H that is applied is made as 150Oe, and same mensuration inserted loss, is 29.8deg. (with reference to Fig. 5) in the insertion loss for faraday's rotation angle under the 0.05dB.In addition the intensity of the external magnetic field H that is applied is made as 96Oe, same mensuration inserted loss, is 27.2deg. (with reference to Fig. 5) in the insertion loss for faraday's rotation angle under the 0.20dB.Even it is under the insertion loss of this degree, no problem in the action of light parts.
Fig. 6 represents that the summary of the light parts that present embodiment is related constitutes.In addition, Fig. 7 represents the variable motion based on faraday's rotation angle of light parts shown in Figure 6.In Fig. 6, light parts 10 possess Faraday rotor 1 and magnetic circuit.Magnetic circuit has permanent magnet 12 and electromagnet 14.A group permanent-magnet 12 that has magnetic pole in the exiting side configuration of the light incident side of the incident light Ii of Faraday rotor 1 and emergent light Io.Shown in Fig. 7 (a),, apply fixed magnetic field H1 in the incident exit direction of light by these permanent magnets 12.In addition, relative with Faraday rotor 1, with the direction of fixed magnetic field H1 almost on the direction of quadrature configuration apply the electromagnet 14 of variable magnetic field H2.The intensity of variable magnetic field H2 can be by the flow through Current Control of coil (not shown) of electromagnet 14 of change.
Shown in Fig. 7 (a) and (b), external magnetic field H is provided by the resultant magnetic field of fixed magnetic field H1 and variable magnetic field H2.By changing the size of variable magnetic field H2, can change the direction of external magnetic field H, make the magnetization change on the light incident exit direction of Faraday rotor 1.
Faraday's rotation angle to the Faraday rotor in the light parts 10 1 is assessed.The intensity of the magnetic field on the incident exit direction of light (fixed magnetic field H1) is made as the 240Oe (with reference to Fig. 7 (a)) that equates with saturation magnetic field Hs, reach 15deg. according to faraday's rotation angle, promptly the reduction of rotation angle is that the principle of 15deg. has carried out regulating (with reference to Fig. 7 (b)) to the intensity of the variable magnetic field H2 that taken place by electromagnet 14.The electric current of coil of electromagnet 14 of flowing through when magnetic field intensity is regulated is 100mA.
Relative therewith, the intensity of fixed magnetic field H1 on the incident exit direction of light is made as 150Oe (with reference to Fig. 7 (a)), reach 14.8deg. according to faraday's rotation angle, promptly the reduction of rotation angle has carried out regulating (with reference to Fig. 7 (b)) near the principle of 15deg. to the intensity of the variable magnetic field H2 that taken place by electromagnet 14.The electric current of coil of electromagnet 14 of flowing through when magnetic field intensity is regulated is 63mA.
In addition, the intensity of fixed magnetic field H1 on the incident exit direction of light is made as 0.4 times the 96Oe (with reference to Fig. 7 (a)) that is equivalent to saturation magnetic field Hs, reach 13.2deg. according to faraday's rotation angle, promptly the reduction of rotation angle has carried out regulating (with reference to Fig. 7 (b)) near the principle of 15deg. to the intensity of the variable magnetic field H2 that taken place by electromagnet 14.The electric current of coil of electromagnet 14 of flowing through when magnetic field intensity is regulated is 41mA.
As mentioned above, the light parts 10 of present embodiment have the Faraday rotor 1 that formed by garnet crystal, the external magnetic field H less than the saturation magnetic field Hs of Faraday rotor 1 are applied to the magnetic circuit of Faraday rotor 1.In this formation, put on orientation and the intensity of the external magnetic field H of Faraday rotor 1 by change, the direction of magnetic moment 2 is changed, faraday's rotation angle is changed.
In Faraday rotor 1 and magnetic circuit based on the light parts 10 of present embodiment, if the size of the saturation magnetic field H s when having applied magnetic field on the light incident direction of Faraday rotor 1 is made as | Hs|, by its size | H| satisfies 0.4 * | Hs|<| H|<| the external magnetic field H of the relation of Hs| is applied to Faraday rotor 1, can constitute the less magnetic circuit of small-sized power consumption, also can suppress the light loss of Faraday rotor 1 to lower simultaneously.
[embodiment 2]
Utilize Fig. 9 to Figure 15 to based on the Faraday rotor of embodiment of the present invention 2 and utilized the light parts of this rotor to be explained.At first, utilize Fig. 9 that the operating principle based on the Faraday rotor of present embodiment is explained.The transverse axis of Fig. 9 is represented heat treatment time, the hypomere of the longitudinal axis is represented the intensity (Oe) of the saturation magnetic field Hs of the film direction of growth, faraday's rotation angle (deg.) is represented in the stage casing, the ratio F/Fs of the saturated rotation angle Fs when the faraday's rotation angle F when epimere has represented to apply the magnetic field of 0.9 dual intensity of saturation magnetic field Hs has applied saturation magnetic field Hs relatively.
The growing response magnetic anisotropy is by being that reason small periodicity component fluctuation takes place on the film direction of growth takes place with the temperature change that produces when the epitaxial growth and the change of melting the liquid convection current.If epitaxial film is heat-treated, owing to can cause the arrangement again of atom, the periodicity component fluctuation on the film direction of growth reduces, thereby the growing response magnetic anisotropy reduces.At high temperature carry out long thermal treatment more, the growing response magnetic anisotropy is more little.The easy magnetizing axis of magnetite garnet monocrystalline is<111 crystal orientation.Usually, the CaMgZr that uses in the generation of magnetite garnet single crystal film displacement GGG substrate with (111) face as generation face.
Therefore, the easy magnetizing axis of a plurality of existence<111 in garnet crystal〉in one towards the orientation vertical with the generation face of GGG substrate, consistent with the orientation of growing response magnetic anisotropy.By the unanimity in these orientation, the magnetic moment orientation of magnetite garnet single crystal film is fixed to the direction of growth.After reducing by thermal treatment growing response magnetic anisotropy, the magnetic moment orientation also is easy to beyond the film direction of growth<111 crystal orientation.Especially, because Faraday rotor is processed with the single crystal film that sheet generates, form as same platy optical element, if thereby were it not for the influence of growing response magnetic anisotropy, then according to shape effects, the orientation of magnetic moment will towards tilt from the film direction of growth<111〉orientation.
Shown in Fig. 9 hypomere, and compare before the thermal treatment, the saturation magnetic field Hs of the film direction of growth after the thermal treatment is bigger.In addition, heat treatment time is long more, and the saturation magnetic field Hs on the film direction of growth is big more.Therefore, as mentioned above, in the past in the thermal treatment that is used for weakening the growing response magnetic anisotropy, when can changing the magnetic moment orientation in any direction, as the condition that does not increase saturation magnetic field Hs as far as possible, select heat treatment time such as " conventional conditions " shown in Figure 9.
But, shown in Fig. 9 stage casing, just the faraday's rotation angle F that is obtained begin sharply to reduce from thermal treatment, if its heat treatment time is not much larger than the heat treatment time of " conventional conditions ", just then its variation is unstable.
Therefore, if do not heat-treating not increase in the heat treatment time of saturation magnetic field Hs as " conventional conditions " of the 1st condition as far as possible, then shown in Fig. 9 stage casing, heat treatment time has only a little fluctuation, and the more cataclysmal problem of faraday's rotation angle that is obtained takes place.Therefore, will the problem of correct abundant decay take place to obtain by magnetooptics type optical attenuator etc.
Next, utilize Figure 10 and Figure 11 that the orientation of magnetic moment 2 and the relation of external magnetic field H are explained.Figure 10 represents not implement heat treated Faraday rotor 1.In addition, the crystal growth direction of the light entrance face of Faraday rotor 1 and garnet crystal quadrature almost.
Shown in Figure 10 (a), at crystal growth direction easy magnetizing axis is arranged owing to constitute the garnet crystal of not implementing heat treated Faraday rotor 1, thereby in the Faraday rotor under not applying magnetic field state 1, form the part of magnetic moment 2 towards a direction of easy magnetizing axis, remaining constructs towards rightabout different magnetic region.
Shown in Figure 10 (b), if to the light entrance face of garnet crystal almost the composition of vertical direction be applied to Faraday rotor 1 obliquely greater than the external magnetic field H of saturation magnetic field Hs, then magnetic moment 2 at four corner facing one direction, the magnetic region structure reaches identical.Faraday's rotation angle of the Faraday rotor 1 that obtains under this state is made as saturated rotation angle Fs.
Figure 11 has represented to implement the orientation of magnetic moment 2 of heat treated Faraday rotor 1 and the relation of external magnetic field H.In addition, the crystal growth direction of the light entrance face of Faraday rotor 1 and garnet crystal quadrature almost.
Shown in Figure 11 (a), carried out in the garnet crystal of heat treated Faraday rotor 1 in formation, easy magnetizing axis becomes the orientation of edge (100) crystal plane from crystal growth direction, the part of the magnetic moment 2 in the Faraday rotor 1 under the no externally-applied magnetic field state is towards a direction of easy magnetizing axis, remainder forms different magnetic region structures towards reverse direction.
Shown in Figure 11 (b), if to light entrance face almost the composition of vertical direction be applied to obliquely greater than the external magnetic field H of saturation magnetic field Hs and implemented heat treated Faraday rotor 1, then identical with the situation of not implementing heat treated Faraday rotor 1, magnetic moment 2 in gamut facing one direction, magnetic region structure reaches identical.But owing to there is the easy magnetizing axis of inclination on the substrate face normal direction, the imitative direction with external magnetic field H in the orientation of magnetic moment 2 tilt from the substrate face normal direction, thereby resulting faraday's rotation angle F will be less than saturated rotation angle Fs.
If the heat treatment time of magnetite garnet single crystal film prolongs, the growing response magnetic anisotropy will reduce, and according to the influence of external magnetic field H, the orientation of magnetic moment 2 changes easily.If implement thermal treatment near the heat treatment time " conventional conditions " shown in Figure 9, because the changeability in magnetic moment orientation sharply increases, thereby shown in Fig. 9 stage casing, the rate of change of faraday's rotation angle F also increases.In addition, after heat treatment time prolongs, almost reach stable based on the changeability in the magnetic moment orientation of external magnetic field H.This is that the changeability in magnetic moment orientation is difficult to be subjected to the influence of growing response magnetic anisotropy because along with the growing response magnetic anisotropy dies down.Therefore shown in Fig. 9 stage casing, the rate of change of faraday's rotation angle F diminishes and is stable.
In addition, shown in Fig. 9 hypomere, heat treatment time increases back saturation magnetic field Hs and sharply increases.This shows that by thermal treatment the magnetic moment orientation is easy to beyond the film direction of growth, consequently, in order to make the magnetic moment orientation towards the film direction of growth conversely, needs stronger external magnetic field H.As mentioned above, if the magnetic field less than saturation magnetic field Hs is applied to Faraday rotor 1, will produce diffraction loss, it is bad that element characteristic becomes, thereby " conventional conditions " that do not increase at saturation magnetic field H s traditionally implements thermal treatment down as far as possible.Yet this heat-treat condition depends on the change of heat treatment time, and the changeability in magnetic moment orientation also is maximum change condition." conventional conditions " and near heat treatment time, the difference of the heat-treat conditions such as the trickle temperature difference of change of furnace temperature during based on thermal treatment and sample position has big influence to the variation in magnetic moment orientation.Therefore shown in Fig. 9 stage casing, the result who has caused the anglec of rotation deviation of faraday's rotation angle F also to increase.
But, shown in Fig. 9 " improvement condition ", be longer than the thermal treatment of " conventional conditions " by implementing its time, can reduce the change in magnetic moment orientation, reduction is based on the deviation of faraday's rotation angle F of heat treatment time, and change does not have dependent stable faraday's rotation angle F to heat treatment time in acquisition.
Figure 12 represents not implementing external magnetic field H that heat treated Faraday rotor 1 applies and the relation of faraday's rotation angle F.Transverse axis is represented external magnetic field H (Oe), and the longitudinal axis is represented faraday's rotation angle (deg.).The value Hs of transverse axis represents not implement the size of the saturation magnetic field Hs of heat treated Faraday rotor 1.In addition, the value 0.9 * Hs of transverse axis represents roughly 9 one-tenth the size of saturation magnetic field Hs.In addition, in Figure 12, the direction of growth as the garnet crystal that constitutes Faraday rotor 1 applies external magnetic field H in light incident exit direction.
Figure 13 represents having implemented the external magnetic field H that heat treated Faraday rotor 1 applies and the relation of faraday's rotation angle.Transverse axis is represented external magnetic field H (Oe), and the longitudinal axis is represented faraday's rotation angle (deg.).The value Hs of transverse axis has represented to implement the size of the saturation magnetic field Hs of heat treated Faraday rotor 1.In addition, the value 0.9 * Hs of transverse axis represents roughly 9 one-tenth the size of saturation magnetic field Hs.In addition, same in Figure 13, the direction of growth as the garnet crystal that constitutes Faraday rotor applies external magnetic field H in light incident exit direction.
If Figure 12 and Figure 13 are compared explanation, in the Faraday rotor 1 that has increased by thermal treatment saturation magnetic field Hs, applied faraday's rotation angle F that its intensity approaches the external magnetic field H of saturation magnetic field Hs and reached the value that is in close proximity to saturated rotation angle Fs.Such as, in not implementing heat treated Faraday rotor 1 shown in Figure 12, applied faraday's rotation angle F under the situation of saturation magnetic field Hs0.9 external magnetic field H doubly divided by the value F/Fs of saturated rotation angle Fs, shown in Fig. 9 epimere, reach 0.94.Relative therewith, in the heat treated Faraday rotor 1 of having implemented " conventional conditions ", applied the F/Fs under the situation of saturation magnetic field Hs0.9 external magnetic field H doubly, shown in Fig. 9 epimere, reach 0.95.This is external to have improved in the thermal treatment under " the improvement condition " of the change of depending on heat treatment time of faraday's rotation angle F, and F/Fs reaches more than 0.96 shown in Fig. 9 epimere.Shown in this Fig. 9 epimere, F/Fs is 0.94 when no thermal treatment, is 0.95 under the heat treatment period of " conventional conditions ".According to the heat treatment time based on " the improvement condition " of present embodiment, F/Fs is more than 0.96.
Implement long thermal treatment if depend on the change of the heat treatment time of faraday's rotation angle F for improvement, then saturation magnetic field Hs will increase, but by adopting the outside magnetic circuit that can apply bigger external magnetic field H can reduce diffraction loss.In addition, as shown in figure 13, found because in the Faraday rotor 1 of having implemented long heat treatment, except having applied significantly situation less than the external magnetic field H of saturation magnetic field Hs, even in the external magnetic field H below 0.9 times such as saturation magnetic field Hs, faraday's rotation angle F more than 0.96 times of saturated rotation angle Fs under the magnetic field H s that also can reach capacity, thereby diffraction loss takes place hardly, very anti-in practical application.
Like this, as what can find out, externally there is clear and definite correlativity in the relation of magnetic field H and faraday's rotation angle F, in addition from Figure 12 and Figure 13, as as can be seen from Figure 9, in the mobility of faraday's rotation angle F, there is clear and definite correlativity with heat treatment time.Therefore, by having utilized thermal treatment to make to apply its size to reach Faraday rotor 1 more than 0.96 divided by the value F/Fs of saturated rotation angle Fs for the faraday's rotation angle F under the situation of 0.9 times the external magnetic field H of saturation magnetic field Hs, the mobility that can suppress faraday's rotation angle F, reach stabilization, and the size of the variable anglec of rotation is maintained the state of the situation that has approached to apply saturation magnetic field Hs.
The feature of the garnet crystal of the Faraday rotor 1 under the present embodiment is with Bi
aA
3-aFe
5-xM
xO
12(here, A is more than one a element among Y, Lu, Yb, Er, Ho, Dy, Tb, Gd, Eu, Sm, Nd, Pr, Ce, La, Pb, the Ca, and a satisfies 0.6≤a≤2.0.M is more than one a element among Ga, Al, Sc, In, Si, Ge, Ti, Au, Ir, the Pt, and x satisfies 0≤x≤1.5.) expression.
The feature of the garnet crystal of the Faraday rotor under the present embodiment 1 is with Bi in addition
bA
cB
3-b-cFe
5-xM
xO
12(here, A is more than one a element among Y, Lu, Yb, Er, Ho, Eu, Sm, Nd, Pr, Ce, La, Pb, the Ca, and B is the element more than a kind among Tb, Gd, the Dy, and b and c satisfy 0.6<b≤2.0,0.6<b+c≤3.0.M is more than one a element among Ga, Al, Sc, In, Si, Ge, Ti, Au, Ir, the Pt, and x satisfies 0≤x≤1.5.) expression.
If in the main composition of the rare earths of magnetite garnet monocrystalline, adopt Gd, Tb and Dy, then can reduce saturation magnetic field Hs, effective to the reduction of the miniaturization of magnetic circuit and power consumption.Like this, if in chemical formula, its scope is made as from 0 to 2.4 then effective especially.
If the amount of Bi reaches below 0.6 in chemical formula, then faraday's coefficient of rotary (faraday's rotation angle F/ Faraday rotor thickness T) will diminish, for the faraday's rotation angle F that obtains regulation must thicken Faraday rotor 1, thereby the generation of single crystal film will become difficult.In addition, if the amount of Bi reaches in chemical formula more than 2.0, then formation condition can not obtain to have the single crystal film of good quality with instability when the epitaxial growth of single crystal film.Therefore, the Bi amount preferably is in from 0.6 to 2.0 scope.
Though M is the element of replaceable Fe, adding these elements is effective for the saturation magnetic field Hs that reduces Faraday rotor 1.But, if the amount more than 1.5 and the Fe of these elements replaces in chemical formula, then the Curie point of magnetite garnet monocrystalline will drop to below the operating temperature, no longer can play the effect of Faraday rotor 1.Therefore the amount of M preferably from 0 to 1.5.
Below utilize specific embodiment to explain.
[embodiment 2-1]
Generate it by liquid phase epitaxial method and consist of Bi
1.2Gd
1.2Yb
0.5Pb
0.05Fe
4.15Ga
0.8Pt
0.01Ge
0.04O
12Magnetite garnet single crystal film, made sheet magnetite garnet monocrystalline after the processing.By applying external magnetic field H on the unilateral vertical direction of this monocrystalline relatively, measure faraday's rotation angle F, at room temperature Ping Gu saturation magnetic field Hs is 110Oe, the saturated rotation angle Fs that has applied saturation magnetic field Hs is 30deg..Faraday's rotation angle F when having applied saturation magnetic field Hs0.9 times external magnetic field H=99Oe is 28.2deg..The saturated rotation angle Fs of faraday's rotation angle F/ is 0.94.
Under 1100 ℃ 10 this monocrystalline are carried out 15 hours thermal treatment, the saturation magnetic field Hs that at room temperature assesses with same method is 150Oe, and the saturated rotation angle Fs that has applied saturation magnetic field Hs is 30deg..Faraday's rotation angle F when having applied saturation magnetic field Hs0.9 times external magnetic field H=135Oe is 28.8deg..The saturated rotation angle Fs of faraday's rotation angle F/ is 0.96.On the direction vertical, applying the external magnetic field H1 of 135Oe on the Faraday rotor of forming by these monocrystalline 1, and applying the external magnetic field H2 of 300Oe in the horizontal, measuring faraday's rotation angle F with light incident exit facet.The variation that has obtained faraday's rotation angle F of 10 Faraday rotors 1 is 2.2~2.5deg., and variable rotation angle is stable faraday's rotation angle characteristic of 26.3~26.6deg..
[embodiment 2-2]
Generate it by liquid phase epitaxial method and consist of Bi
1.2Tb
0.8Ho
0.9Pb
0.05Fe
4.15Ga
0.8Pt
0.01Ge
0.04O
12Magnetite garnet single crystal film, made sheet magnetite garnet monocrystalline after the processing.By applying external magnetic field H on the unilateral vertical direction of this monocrystalline relatively, measure faraday's rotation angle F, at room temperature Ping Gu saturation magnetic field Hs is 110Oe, the saturated rotation angle Fs that has applied saturation magnetic field Hs is 30deg..Faraday's rotation angle F when having applied saturation magnetic field Hs0.9 times external magnetic field H=99Oe is 28.2deg..The saturated rotation angle Fs of faraday's rotation angle F/ is 0.94.
Under 1100 ℃ 10 this monocrystalline are carried out 30 hours thermal treatment, the saturation magnetic field Hs that at room temperature assesses with same method is 300Oe, and the saturated rotation angle Fs that has applied saturation magnetic field Hs is 30deg..Faraday's rotation angle F when having applied saturation magnetic field Hs0.9 times external magnetic field H=270Oe is 29.7deg..The saturated rotation angle Fs of faraday's rotation angle F/ is 0.99.On the direction vertical, applying the external magnetic field H1 of 150Oe on the Faraday rotor of forming by these monocrystalline 1, and applying the external magnetic field H2 of 350Oe in the horizontal, measuring faraday's rotation angle F with light incident exit facet.The variation that has obtained faraday's rotation angle F of 10 Faraday rotors 1 is 2.0~2.2deg., and variable rotation angle is stable faraday's rotation angle characteristic of 27.5~27.7deg..
[comparative example 2-1]
Generate it by liquid phase epitaxial method and consist of Bi
1.2Gd
1.2Yb
0.5Pb
0.05Fe
4.15Ga
0.8Pt
0.01Ge
0.04O
12Magnetite garnet single crystal film, made sheet magnetite garnet monocrystalline after the processing.By applying external magnetic field H on the unilateral vertical direction of this monocrystalline relatively, measure faraday's rotation angle F, at room temperature Ping Gu saturation magnetic field Hs is 110Oe, the saturated rotation angle Fs that has applied saturation magnetic field Hs is 30deg..Faraday's rotation angle F when having applied saturation magnetic field Hs0.9 times external magnetic field H=99Oe is 28.2deg..The saturated rotation angle Fs of faraday's rotation angle F/ is 0.94.
Under 1100 ℃ 10 this monocrystalline are carried out 10 hours thermal treatment, the saturation magnetic field Hs that at room temperature assesses with same method is 120Oe, and the saturated rotation angle Fs that has applied saturation magnetic field Hs is 30deg..Faraday's rotation angle F when having applied saturation magnetic field Hs0.9 times external magnetic field H=108Oe is 28.5deg..The saturated rotation angle Fs of faraday's rotation angle F/ is 0.95.On the direction vertical, applying the external magnetic field H1 of 120Oe on the Faraday rotor of forming by these monocrystalline 1, and applying the external magnetic field H2 of 300Oe in the horizontal, measuring faraday's rotation angle F with light incident exit facet.The variation that becomes faraday's rotation angle F of 10 Faraday rotors 1 is 4.8~11.0deg., and variable rotation angle is unsettled faraday's rotation angle characteristic of 19.0~25.2deg. deviation.
As mentioned above, according to present embodiment, by the Faraday rotor of being replaced rare earths iron garnet single crystal film production by Bi is heat-treated, the value F/Fs of faraday's rotation angle F under the situation in the 0.9 times of magnetic field that has applied saturation magnetic field Hs after divided by saturated rotation angle Fs is made as more than 0.96, can obtain to control the variation of faraday's rotation angle F and make it stable, and the bigger Faraday rotor 1 of variable-angle and adopted the light parts of this rotor.
Next, utilize Figure 14, to being explained as having adopted summary based on the optoisolator 100 of the light parts of the Faraday rotor of present embodiment to constitute.Figure 14 represents that the summary of the optoisolator 100 that present embodiment relates to constitutes.In Figure 14, optoisolator 100 has the Faraday rotor 1 based on present embodiment.At the light incident side configuration polariscope 28 of Faraday rotor 1, at the light exit side configuration inspection light microscopic 29 of Faraday rotor 1.
For Faraday rotor 1 is applied saturation magnetic field, faraday's rotation angle of regulation is provided, be provided with magnetic circuit.Magnetic circuit has one group of ring-like permanent magnet 23,24.Ring-like permanent magnet 23,24 disposes magnetic pole at the light incident side of the incident light Ii of Faraday rotor 1 and the exiting side of emergent light Io.On the incident exit direction of light, apply saturation magnetic field by 23,24 pairs of Faraday rotors 1 of ring-like permanent magnet.
Next, utilize Figure 15, to being explained as having adopted summary based on the optical attenuator 110 of the light parts of the Faraday rotor of present embodiment to constitute.Figure 15 represents that the summary of the optical attenuator 110 that present embodiment relates to constitutes.In Figure 15, optical attenuator 110 has the Faraday rotor 1 based on present embodiment.Incident arranged in order polariscope 28 and the polariscope 27 that the light incident side of Faraday rotor 1 is pressed light, examine light microscopic 29 in the light exit side configuration of Faraday rotor 1.For Faraday rotor 1 is applied saturation magnetic field, faraday's rotation angle of regulation is provided, be provided with magnetic circuit.Magnetic circuit has 23,24, one groups of ring-like permanent magnets 23,24 of ring-like permanent magnet and disposes magnetic pole at the light incident side of the incident light Ii of Faraday rotor 1 and the exiting side of emergent light Io.On the incident exit direction of light, apply fixed magnetic field by these ring-like permanent magnets 23,24.
In addition, relatively with Faraday rotor 1 almost disposing the electromagnet 26 that applies variable magnetic field on the direction of quadrature with the fixed magnetic field direction.The intensity of variable magnetic field can be controlled by the flow through electric current of coil (not shown) of electromagnet 26 of change.By changing the controllable intensity system faraday rotation angle of variable magnetic field, the attenuation rate of control outgoing light quantity.
[embodiment 3]
Utilize Figure 16 to Figure 23 to based on antireflection film of embodiment of the present invention 3 and forming method thereof and adopted the light parts of antireflection film to be explained.At first, the summary to present embodiment is explained.If the centre wavelength of the light wavelength frequency band that utilizes in the optical communication systems such as WDM is made as λ, then by at least in the gamut of λ ± 70nm, form the reflection of light rate at the light entrance face of magnetite garnet monocrystalline and light-emitting face and reach antireflection film 0.1% below, can solve traditional big problem of reflection of light rate change under the wavelength beyond the specific wavelength.
Since in the wavelength multiplexing optical communication in S light belt (1460nm≤λ≤1530nm), C light belt (1530nm≤λ≤1565nm), L light belt (formation communication system in each specific wavelength bands of 1565nm≤λ≤1625nm) and so on, thereby, if in these specific whole frequency bands, the reflectivity of antireflection film is in below 0.1%, then can provide the Faraday rotor that is fit to each system.That is, though in the Faraday rotor of having implemented this antireflection film the different multiple light of incident wavelength, also can reduce the reflected light on Faraday rotor surface equally, be effective in the stable action of optical communication system.
In addition, for the antireflection film that constitutes by sull,,, the frequency band that prevents the light reflection is produced the phenomenon of change because film is rotten if implement the fail-test of communication with the light part requirement.In order to realize that even the wavelength band change also can obtain necessary reflectivity Characteristics, be necessary that the bigger wavelength band internal reflection rate of the long frequency band of the all-wave of using reaches below 0.1% in than optical communication, be necessary in 140nm wavelength band, reflectivity to be reached below 0.1% greater than the band amplitude separately of S, C, L light belt.
Antireflection film can be by increasing the different sull of refractive index the thickness of these films of the number of plies be set to suitable value, wavelength band and the reflectivity that prevents the light reflection carried out more accurate control.Therefore at the broadband antireflection film that forms on the magnetic garnet monocrystal more than the 140nm that is effective in optical WDM communication system, be necessary to form antireflection film with the sull more than 4 layers.The number of plies can obtain more wide band antireflection film after increasing, and is favourable for characteristic.But, if number of plies increase then film formation process will prolong, thereby unfavorable in cost.In addition, inserting loss based on the light of the Faraday rotor of the light absorption of the material that constitutes antireflection film can increase.Therefore, the number of plies of the sull of formation antireflection film is preferably below 20 layers.In addition, can be protected, not have the absorption of light etc., the most handy Ta if consider reliability
2O
5, SiO
2, TiO
2, ZrO
2, Y
2O
3, LaF
3, Al
2O
3, MgF
2Constitute antireflection film etc. material.
Light incident/outgoing two sides that Figure 16 is illustrated in magnetite garnet monocrystal chip 31 has formed the state based on the antireflection film 30 of present embodiment.As shown in figure 16, on magnetite garnet monocrystal chip 31 two sides the 1st layer forms the 1Ta that satisfies 0.17≤nd/ λ≤0.80
2O
5Layer forms the 1SiO that satisfies 0.02≤nd/ λ≤0.54 as the 2nd layer thereon
2Layer.The 3rd layer on the 2nd layer forms the 2Ta that satisfies 0.16≤nd/ λ≤0.38
2O
5Layer piles up the 2SiO that satisfies 0.20≤nd/ λ≤0.29 as the 4th layer thereon
2Layer.Here, λ sees through light wavelength, and n is the refractive index of each layer, and d is the thickness of each layer.
In addition, if the refractive index of air is made as 1, the 1st and 2Ta on 31 of the magnetite garnet monocrystal chips then
2O
5The refractive index n of layer is in the scope of 2.08≤n≤2.15, and the 1st and 2SiO
2The refractive index n of layer is in the scope of 1.45≤n≤1.47.
Be made of the magnetite garnet mostly though use the Faraday rotor of antireflection film 30, the Bi that is made by rare earths iron garnets such as YIG by liquid phase epitaxial method replaces the strong point that the rare earths iron garnet has a large amount of productivitys aspect.In addition, though is effective elements such as Tb for the temperature characterisitic of Faraday rotor or the improvement of wavelength characteristic, but owing in C light belt and L light belt, have the characteristic of light absorption, thereby under the situation about in the magnetite garnet, containing in a large number, exist as adopting multi-wavelength's C light belt and L light belt to insert the bigger problem of loss with rotor with broadband antireflection film combination back.For the same reason, if having the Er of light absorption in the wavelength band that in optical communication, uses, Dy, Tb, Sm, Nd, Pr contains in Faraday rotor in a large number, also can become problem.Yet if contain amount below 0.1 in the composition formula of magnetite garnet, inserting loss can be not excessive, can not constitute the problem on the characteristic.Therefore, the amount of these elements is useful in the inching for wavelength characteristic and all characteristics such as temperature characterisitic and saturation magnetic field below 0.1.Therefore, if with in these wavelength bands, not having the Y of light absorption, Lu, Yb, Ho, Gd, Ce, La, Pb, elements such as Ca are made Faraday rotor as the magnetite garnet of the major component of C side, implement wide band antireflection film thereon, then can obtain absorption and the considerably less broadband wavelengths Faraday rotor of volume reflection at Faraday rotor and antireflection film two Fang Zhongguang thereof.In addition, if owing to be used as the Ga of the less element of same light absorption, Al, Sc, In, Si, Ge, Ti, Au, Ir displacement magnetite garnet Fe element, the may command saturation magnetic field, thereby in optoisolator and so on Design of device, be useful.But, if replace more than 1.5, then Curie temperature will be reduced near the room temperature, can not be re-used as Faraday rotor and use, thereby replacement amount be preferably below 1.5.
In optical WDM communication, through the optical fiber of being everlasting make light amplification by fiber amplifier midway, have very strong light in optical fiber, to pass through.Be inserted at this high-strength light under the situation of Faraday rotor, if having resin at the light transmission face of Faraday rotor, resin burns heat under based on the effect of the heat of this light, causes device bad.Therefore, the employed Faraday rotor of light passive component of interdependent isolator of polarization that midway uses at optical fiber and so on is necessary without resin bonding light transmission face, and contacts with air, is necessary to form antireflection film at air at the light transmission face.Therefore, if form antireflection film at the wide wavelength band of air at the light transmission face of Faraday rotor, then to light passive component in the optical WDM communication system that is inserted at high-intensity light bad prevent and the raising of characteristic very effective.
In addition, when rotation angle is as the Faraday rotor of 45deg. under making the various wavelength use such as the C light belt, if making gamut internal reflection rate at the C light belt is antireflection film film forming below 0.1%, then can in the film formation process of same batch, in the various Faraday rotors that the C light belt is used, implement antireflection film simultaneously.By in the multiple Faraday rotor that each wavelength is used, forming this broadband antireflection film simultaneously, under any wavelength, all can reduce the reflection of light rate, can be reduced at the complicated procedures of forming that becomes problem in traditional film forming, can improve productivity.
Below utilize embodiment to based on the antireflection film of present embodiment and adopted the light parts of this film to make more specific description.As the main points among each embodiment, at first, form 4 layer films on the light incident/outgoing two sides of the Faraday rotor of forming by Bi displacement rare earths iron garnet material, in the 140nm wavelength band reflection of light rate of having obtained reaches the antireflection film below 0.1%.This antireflection film can reduce the interior reflection of light of the long frequency band of all-wave separately of the S light belt, C light belt and the L light belt that use in the wavelength multiplexing optical communication, and is effective to the high performance of light passive component.Can in the multiple Faraday rotor that each wavelength is used, make the antireflection film film forming simultaneously in addition, improve productivity.
[embodiment 3-1]
Light incident/outgoing two sides that Figure 17 is illustrated in magnetite garnet monocrystal chip 31 has formed the state based on the antireflection film 30 of present embodiment.As shown in figure 17, on magnetite garnet monocrystal chip (Faraday rotor) 1 two sides the 1st layer forms the 1Ta of nd/ λ=0.19
2O
5Layer is thereon as the 2nd layer of 1SiO that forms nd/ λ=0.44
2Layer.Then, on the 2nd layer as the 3rd layer of 2Ta that forms nd/ λ=0.33
2O
5Layer is thereon as the 4th layer of 2SiO that forms nd/ λ=0.22
2Layer.
In addition, if the refractive index of air is made as 1, the 1st and 2Ta on 31 of the magnetite garnet monocrystal chips then
2O
5The refractive index n of layer is 2.10, the 1 and 2SiO
2The refractive index n of layer is 1.46.
Formation shown in Figure 17 forms by the following method.At first, replace at CaMgZr by liquid phase epitaxial method that to have generated its composition formula on Gd-Ga garnet (GGG) monocrystal chip be Bi
1.1Tb
1.4Y
0.2Yb
0.1Ho
0.15Pb
0.05Fe
4.85Ga
0.1Ge
0.03Pt
0.02O
12Magnetite garnet monocrystalline.Next the principle that becomes 45deg. according to the light rotation angle to wavelength X=1310nm is processed magnetite garnet monocrystalline, has formed Faraday rotor 1.On the two sides of the Faraday rotor 1 that has been processed into sheet, press Ta
2O
5, SiO
2, Ta
2O
5, SiO
2Order carry out film vapor deposition by the vacuum vapour deposition that has added ion accelerator, be 0.190 according to the nd/ λ value of each layer at the 1st layer, be 0.443 at the 2nd layer, at the 3rd layer is 0.325, at the 4th layer is that 0.217 principle is adjusted, and forms the antireflection film at air, as the light parts.
By spectrophotometer the light reflectivity of the antireflection film 30 of the single side face of these light parts is assessed.Figure 18 represents the characteristic based on the antireflection film 30 of present embodiment.The transverse axis of Figure 18 is illustrated in the light wavelength (nm) of the antireflection film incident of present embodiment, and the longitudinal axis is represented resulting reflectivity (%).As shown in figure 18, in light wavelength λ was in the four corner of 1240nm≤λ≤1370nm, obtaining reflectivity was 0.02%, the characteristic less than 0.1%.In addition, the insertion loss to resulting Faraday rotor in the four corner of 1240nm≤λ≤1370nm is assessed, and shows stable numerical value in loss for the 0.03dB following table.Therefore reflection of light rate and the lower Faraday rotor of insertion loss in the gamut of 1240nm≤λ≤1370nm have been obtained with excellent specific property.
[embodiment 3-2]
Having generated its composition formula by liquid phase epitaxial method on CaMgZr displacement Gd-Ga garnet crystal substrate is Bi
1.0Gd
1.5Yb
0.3Ho
0.15Pb
0.05Fe
4.85Al
0.1Ge
0.03Pt
0.02O
12Magnetite garnet monocrystalline.Next the principle that becomes 45deg. according to the light rotation angle to wavelength X=1495nm is processed magnetite garnet monocrystalline, has formed Faraday rotor.On the two sides of the Faraday rotor that has been processed into sheet, press Ta
2O
5, SiO
2, Ta
2O
5, SiO
2Order carry out film vapor deposition by the vacuum vapour deposition that has added ion accelerator, be 0.190 according to the nd/ λ value of each layer at the 1st layer, be 0.443 at the 2nd layer, at the 3rd layer is 0.325, at the 4th layer is that 0.217 principle is adjusted, and forms the antireflection film at air, as the light parts.
By spectrophotometer the light reflectivity of the antireflection film of the single side face of these light parts is assessed.Figure 19 represents the characteristic based on the antireflection film of present embodiment.The transverse axis of Figure 19 is illustrated in the light wavelength (nm) of the antireflection film incident of present embodiment, and the longitudinal axis is represented resulting reflectivity (%).As shown in figure 19, in light wavelength λ was in the four corner of the 1425nm≤λ≤1565nm that comprises S light belt and C light belt, obtaining reflectivity was 0.02%, the characteristic less than 0.1%.Insertion loss to resulting Faraday rotor in the gamut of this external 1425nm≤λ≤1565nm is assessed, and shows stable numerical value in loss for the 0.03dB following table.Therefore reflection of light rate and the lower Faraday rotor of insertion loss in the gamut of 1425nm≤λ≤1565nm have been obtained with excellent specific property.
[embodiment 3-3]
Having generated its composition formula by liquid phase epitaxial method on CaMgZr displacement Gd-Ga garnet crystal substrate is Bi
1.1Gd
1.45Yb
0.4Pb
0.05Fe
4.95Ge
0.03Pt
0.02O
12Magnetite garnet monocrystalline.Next the principle that becomes 45deg. according to the light rotation angle to wavelength X=1562nm is processed magnetite garnet monocrystalline, has formed Faraday rotor.On the two sides of the Faraday rotor that has been processed into sheet, press Ta
2O
5, SiO
2, Ta
2O
5, SiO
2Order carry out film vapor deposition by the vacuum vapour deposition that has added ion accelerator, be 0.190 according to the nd/ λ value of each layer at the 1st layer, be 0.443 at the 2nd layer, at the 3rd layer is 0.325, at the 4th layer is that 0.217 principle is adjusted, and forms the antireflection film at air, as the light parts.
By spectrophotometer the light reflectivity of the antireflection film of the single side face of these light parts is assessed.Figure 20 represents the characteristic based on the antireflection film of present embodiment.The transverse axis of Figure 20 is illustrated in the light wavelength (nm) of the antireflection film incident of present embodiment, and the longitudinal axis is represented resulting reflectivity (%).As shown in figure 20, in light wavelength λ was in the gamut of the 1492nm≤λ≤1632nm that comprises C light belt and L light belt, obtaining reflectivity was 0.02%, the characteristic less than 0.1%, (in the four corner of 1460nm≤λ≤1530nm), also obtained characteristic at the S light belt less than 0.1%.Insertion loss to resulting Faraday rotor in the gamut of this external 1492nm≤λ≤1632nm is assessed, and shows stable numerical value in loss for the 0.03dB following table.Therefore reflection of light rate and the lower Faraday rotor of insertion loss in the gamut of 1492nm≤λ≤1632nm have been obtained with excellent specific property.
[embodiment 3-4]
Having generated its composition formula by liquid phase epitaxial method on CaMgZr displacement Gd-Ga garnet crystal substrate is Bi
1.1Gd
1.45Yb
0.4Pb
0.05Fe
4.95Ge
0.03Pt
0.02O
12Magnetite garnet monocrystalline.Next the principle that becomes 45deg. according to the light rotation angle to wavelength X=1615nm is processed magnetite garnet monocrystalline, has formed Faraday rotor.On the two sides of the Faraday rotor that has been processed into sheet, press Ta
2O
5, SiO
2, Ta
2O
5, SiO
2Order carry out film vapor deposition by the vacuum vapour deposition that has added ion accelerator, be 0.190 according to the nd/ λ value of each layer at the 1st layer, be 0.443 at the 2nd layer, at the 3rd layer is 0.325, at the 4th layer is that 0.217 principle is adjusted, and forms the antireflection film at air, as the light parts.
By spectrophotometer the light reflectivity of the antireflection film of the single side face of these light parts is assessed.Figure 21 represents the characteristic based on the antireflection film of present embodiment.The transverse axis of Figure 21 is illustrated in the light wavelength (nm) of the antireflection film incident of present embodiment, and the longitudinal axis is represented resulting reflectivity (%).As shown in figure 21, in light wavelength λ was in the four corner of the 1545nm≤λ≤1685nm that comprises the L light belt, obtaining reflectivity was 0.02%, the characteristic less than 0.1%.Insertion loss to resulting Faraday rotor in the four corner of this external 1545nm≤λ≤1685nm is assessed, and shows stable numerical value in loss for the 0.03dB following table.Therefore, reflection of light rate and the lower Faraday rotor of insertion loss in the gamut of 1545nm≤λ≤1685nm have been obtained with excellent specific property.
[embodiment 3-5]
Having generated its composition formula by liquid phase epitaxial method on CaMgZr displacement Gd-Ga garnet crystal substrate is Bi
1.1Gd
1.45Yb
0.4Pb
0.05Fe
4.95Ge
0.03Pt
0.02O
12Magnetite garnet monocrystalline.Next the principle that becomes 45deg. according to the light rotation angle to wavelength X=1750nm is processed magnetite garnet monocrystalline, has formed Faraday rotor.On the two sides of the Faraday rotor that has been processed into sheet, press Ta
2O
5, SiO
2, Ta
2O
5, SiO
2Order carry out film vapor deposition by the vacuum vapour deposition that has added ion accelerator, be 0.190 according to the nd/ λ value of each layer at the 1st layer, be 0.443 at the 2nd layer, at the 3rd layer is 0.325, at the 4th layer is that 0.217 principle is adjusted, and forms the antireflection film at air, as the light parts.
By spectrophotometer the light reflectivity of the antireflection film of the single side face of these light parts is assessed.Figure 22 represents the characteristic based on the antireflection film of present embodiment.The transverse axis of Figure 22 is illustrated in the light wavelength (nm) of the antireflection film incident of present embodiment, and the longitudinal axis is represented resulting reflectivity (%).As shown in figure 22, in light wavelength λ was in the gamut of 1680nm≤λ≤1820nm, obtaining reflectivity was 0.02%, the characteristic less than 0.1%.In addition, the insertion loss to resulting Faraday rotor in the gamut of 1680nm≤λ≤1820nm is assessed, and shows stable numerical value in loss for the 0.03dB following table.Therefore, reflection of light rate and the lower Faraday rotor of insertion loss in the gamut of 1680nm≤λ≤1820nm have been obtained with excellent specific property.
[comparative example 3-1]
Having generated its composition formula by liquid phase epitaxial method on CaMgZr displacement Gd-Ga garnet crystal substrate is Bi
1.1Gd
1.45Yb
0.4Fb
0.05Fe
4.95Ge
0.03Pt
0.02O
12Magnetite garnet monocrystalline.Next the principle that becomes 45deg. according to the light rotation angle to wavelength X=1550nm is processed magnetite garnet monocrystalline, has formed Faraday rotor.On the two sides of the Faraday rotor that has been processed into sheet, press Ta
2O
5, SiO
2Order carry out film vapor deposition by the vacuum vapour deposition that has added ion accelerator, form antireflection film, as the light parts at air.
By spectrophotometer the light reflectivity of the antireflection film of the single side face of these light parts is assessed.Figure 23 represents the characteristic of the antireflection film of example based on the comparison.The transverse axis of Figure 23 is illustrated in the light wavelength (nm) of the antireflection film incident of this comparative example, and the longitudinal axis is represented resulting reflectivity (%).As shown in figure 23, become that reflectivity is 0.16% when light wavelength λ is 1480nm, reflectivity is the characteristic below 0.15% when λ=1620nm.In addition, the insertion loss to resulting Faraday rotor in the gamut of 1480nm≤λ≤1620nm is assessed, and shows stable numerical value in loss for the 0.03dB following table.Therefore, though think all right in the wavelength band internal loss of 1480nm≤λ≤1620nm, the reflection of light rate has the tendency of increase under the wavelength of frequency band boundary vicinity, returns light, thereby becomes the problem on the characteristic.
As mentioned above, according to present embodiment, in the broadband wavelengths of in optical WDM communication, using, obtain the Faraday rotor antireflection film of the antiradar reflectivity below 0.1%.In addition, owing to can form same antireflection film to the multiple Faraday rotor of making by every kind of wavelength, thereby can improve productivity.
As mentioned above,, can make the magnetic circuit miniaturization of light parts, adopt the little configuration of power consumption according to the present invention.Can be suppressed to the insertion of Faraday rotor loss lower in addition.
In addition,, can be implemented under the broadband and obtain antiradar reflectivity, antireflection film that can easily form with low cost and the light parts that adopted this film according to the present invention.
In addition, according to the present invention,, weaken the growing response magnetic anisotropy even Bi displacement rare earths iron garnet single crystal film is heat-treated, also can obtain suppressing the variation of faraday's rotation angle and making it stable, and the bigger Faraday rotor of variable-angle and adopted the light parts of this rotor.
Claims (18)
1. Faraday rotor is characterized in that:
Have garnet crystal,
If the saturated rotation angle when almost vertical direction has applied saturation magnetic field Hs at the light entrance face to above-mentioned garnet crystal is made as Fs, the faraday's rotation angle F when then having applied the external magnetic field H of 0.9 dual intensity of above-mentioned saturation magnetic field Hs satisfies the relation of 1>F/Fs 〉=0.96.
In the claim 1 record Faraday rotor, it is characterized in that:
Above-mentioned garnet crystal Bi
aA
3-aFe
5-xM
xO
12Expression, wherein, A is more than one a element among Y, Lu, Yb, Er, Ho, Dy, Tb, Gd, Eu, Sm, Nd, Pr, Ce, La, Pb, the Ca, a satisfies 0.6≤a≤2.0, M is more than one a element among Ga, Al, Sc, In, Si, Ge, Ti, Au, Ir, the Pt, and x satisfies 0≤x≤1.5.
In the claim 1 record Faraday rotor, it is characterized in that:
Above-mentioned garnet crystal Bi
bA
cB
3-b-cFe
5-xM
xO
12Expression, wherein, A is more than one a element among Y, Lu, Yb, Er, Ho, Eu, Sm, Nd, Pr, Ce, La, Pb, the Ca, B is the element more than a kind among Tb, Gd, the Dy, b and c satisfy 0.6<b≤2.0,0.6<b+c≤3.0, M is more than one a element among Ga, Al, Sc, In, Si, Ge, Ti, Au, Ir, the Pt, and x satisfies 0≤x≤1.5.
In the claim 1 record Faraday rotor, it is characterized in that:
The size of control said external magnetic field H changes above-mentioned faraday's rotation angle F.
5. light parts is characterized in that: have
The Faraday rotor of record in the claim 1;
The said external magnetic field H is applied to the magnetic circuit of above-mentioned Faraday rotor.
6. antireflection film is characterized in that:
On substrate face, satisfy the 1Ta of 0.17≤nd/ λ≤0.80
2O
5The 1SiO of layer, satisfied 0.02≤nd/ λ≤0.54
2The 2Ta of layer, satisfied 0.16≤nd/ λ≤0.38
2O
5The 2SiO of layer, satisfied 0.20≤nd/ λ≤0.29
2Layer is stacked by this order, and wherein, λ sees through light wavelength, and n is the refractive index of each layer, and d is the thickness of each layer.
In the claim 6 record antireflection film, it is characterized in that:
The opposite side of above-mentioned substrate face contacts with air.
In the claim 7 record antireflection film, it is characterized in that:
With the above-mentioned light wavelength λ that sees through is the center, is below 0.1% at the wavelength coverage reflectivity of λ ± 70nm.
In the claim 8 record antireflection film, it is characterized in that:
Above-mentioned wavelength X is 1310nm≤λ≤1750nm.
10. light parts that adopted garnet crystal is characterized in that:
Light λ at above-mentioned garnet crystal penetrates face and light-emitting face, is formed with the antireflection film of record in the claim 6.
11. the light parts of record in the claim 10 is characterized in that:
Above-mentioned garnet crystal Bi
aA
3-aFe
5-xM
xO
12Expression, wherein, A is more than one the element of Y, Lu, Yb, Er, Ho, Dy, Tb, Gd, Eu, Sm, Nd, Pr, Ce, La, Pb, Ca, and M is more than one the element of Ga, Al, Sc, In, Si, Ge, Ti, Au, Ir, and a and x satisfy 1.0≤a≤2.4,0<x≤1.5.
12. the light parts of record in the claim 10 is characterized in that:
Above-mentioned garnet crystal Bi
aA
bB
3-a-bFe
5-xM
xO
12Expression, wherein, A is more than one the element of Er, Dy, Tb, Sm, Nd, Pr, B is more than one the element of Y, Lu, Yb, Ho, Gd, Ce, La, Pb, Ca, M is more than one the element of Ga, Al, Sc, In, Si, Ge, Ti, Au, Ir, and a, b and x satisfy 1.0≤a≤2.4,0≤b≤0.1,0≤x≤1.5.
13. the light parts of record in the claim 10 is characterized in that:
At light wavelength λ is the gamut of 1460nm≤λ≤1530nm, and the reflection of light rate is below 0.1%.
14. the light parts of record in the claim 10 is characterized in that:
At light wavelength λ is the gamut of 1530nm≤λ≤1565nm, and the reflection of light rate is below 0.1%.
15. the light parts of record in the claim 10 is characterized in that:
At light wavelength λ is the gamut of 1565nm≤λ≤1625nm, and the reflection of light rate is below 0.1%.
16. the light parts of record in the claim 10 is characterized in that:
Above-mentioned garnet crystal is used as Faraday rotor and uses.
17. one kind has the optoisolator that is formed with the Faraday rotor of antireflection film at light incident/exit facet, it is characterized in that:
Above-mentioned antireflection film is the antireflection film of record in the claim 6.
18. one kind has the optical attenuator that is formed with the Faraday rotor of antireflection film at light incident/exit facet, it is characterized in that:
Above-mentioned antireflection film is the antireflection film of record in the claim 6.
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2002015109 | 2002-01-24 | ||
JP15109/2002 | 2002-01-24 | ||
JP70454/2002 | 2002-03-14 | ||
JP262297/2002 | 2002-09-09 | ||
JP353300/2002 | 2002-12-05 |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB031012841A Division CN1308739C (en) | 2002-01-24 | 2003-01-24 | Farady rotator and optical device comprising same, and antireflection film and optical device comprising same |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1818743A true CN1818743A (en) | 2006-08-16 |
CN100399111C CN100399111C (en) | 2008-07-02 |
Family
ID=36918817
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB200610019815XA Expired - Fee Related CN100399111C (en) | 2002-01-24 | 2003-01-24 | Farady rotator and optical device comprising same, and antireflection film and optical device comprising same |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN100399111C (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104145209A (en) * | 2011-12-08 | 2014-11-12 | 信越化学工业株式会社 | Optical isolator |
CN109286437A (en) * | 2018-10-25 | 2019-01-29 | 北京轩宇信息技术有限公司 | A kind of controllable light transmitting device and method based on optoisolator |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5589802B2 (en) * | 2010-11-29 | 2014-09-17 | 住友金属鉱山株式会社 | Bismuth-substituted rare earth iron garnet crystal film and optical isolator |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3037474B2 (en) * | 1991-07-23 | 2000-04-24 | ティーディーケイ株式会社 | Faraday rotator |
JPH04304418A (en) * | 1991-04-02 | 1992-10-27 | Tdk Corp | Faraday rotator |
US5640516A (en) * | 1991-04-02 | 1997-06-17 | Tdk Corporation | Faraday rotator |
JP2815509B2 (en) * | 1992-07-31 | 1998-10-27 | 富士通株式会社 | Optical attenuator |
JPH07104225A (en) * | 1993-10-05 | 1995-04-21 | Mitsubishi Gas Chem Co Inc | Faraday rotator |
US5801875A (en) * | 1995-07-05 | 1998-09-01 | Lucent Technologies Inc. | Article comprising a magneto-optic material having low magnetic moment |
JPH09197360A (en) * | 1996-01-17 | 1997-07-31 | Mitsubishi Gas Chem Co Inc | Faraday rotator for optical magnetic field sensor |
JPH111394A (en) * | 1997-06-13 | 1999-01-06 | Mitsubishi Gas Chem Co Inc | Unsaturated bismuth substituted rare-earth iron garnet monocrystal film |
JPH11100300A (en) * | 1997-09-26 | 1999-04-13 | Tokin Corp | Bismuth-substituted garnet material and its production |
JP4400959B2 (en) * | 1999-10-12 | 2010-01-20 | 信越化学工業株式会社 | Garnet crystal for Faraday rotator and optical isolator having the same |
-
2003
- 2003-01-24 CN CNB200610019815XA patent/CN100399111C/en not_active Expired - Fee Related
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104145209A (en) * | 2011-12-08 | 2014-11-12 | 信越化学工业株式会社 | Optical isolator |
CN109286437A (en) * | 2018-10-25 | 2019-01-29 | 北京轩宇信息技术有限公司 | A kind of controllable light transmitting device and method based on optoisolator |
Also Published As
Publication number | Publication date |
---|---|
CN100399111C (en) | 2008-07-02 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN1167970C (en) | Tunable optical filter | |
US6875270B2 (en) | Magnetic garnet single-crystal film and method of producing the same, and Faraday rotator comprising the same | |
CN1170187C (en) | Variable optical attenuator for providing Faraday element with magnet field to produce polarization rotation | |
CN1308739C (en) | Farady rotator and optical device comprising same, and antireflection film and optical device comprising same | |
CN1278152C (en) | Optical element and its manufacturing method | |
Wang et al. | Effect of Yb Codoping on the Phase Transition, and Electrical and Photoluminescence Properties in KNLN: Er/xY b Ceramics | |
CN1867705A (en) | Piezoelectric single crystal, piezoelectric single crystal element and method for producing the same | |
CN1320851C (en) | Substrate for printed circuitboard distributing | |
CN103228826B (en) | Bismuth displaced type rare earth, iron garnet crystal film and optoisolator | |
CN1273850C (en) | Method for manufacturing optical device and Faraday rotation, optical device and optical communication system | |
CN1818743A (en) | Farady rotator and optical device comprising same, and antireflection film and optical device comprising same | |
US9322111B2 (en) | Bismuth-substituted rare-earth iron garnet crystal film and optical isolator | |
CN1428629A (en) | Hard magnetic garnet material, method for mfg. single crystal film, Faraday rotator, its mfg. method and use | |
CN1203349C (en) | Magnetic garnet material and photomagnetic device using the same material | |
CN1066275C (en) | Magnetic head | |
CN1619722A (en) | Transformer core, transformer, and method of production thereof | |
CN1547627A (en) | Substrate for forming magnetic garnet single crystal film, optical device, and its production method | |
CN1329184A (en) | Bismuth-substituted garnets thick film material and producing method thereof | |
JP2715053B2 (en) | Magneto-optical element material | |
CN1815302A (en) | Method for manufacturing optical device and faraday rotation, optical device and optical communication system | |
JP5459245B2 (en) | Bismuth-substituted rare earth iron garnet crystal film and optical isolator | |
JP5459244B2 (en) | Bismuth-substituted rare earth iron garnet crystal film and optical isolator | |
JP4572810B2 (en) | Magnetic garnet single crystal film, manufacturing method thereof, and Faraday rotator using the same | |
JP5459243B2 (en) | Bismuth-substituted rare earth iron garnet crystal film and optical isolator | |
CN1481452A (en) | High-temp superconductor film having flat surface |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20080702 Termination date: 20220124 |
|
CF01 | Termination of patent right due to non-payment of annual fee |