CN1811462A - Electric circuit board tester - Google Patents
Electric circuit board tester Download PDFInfo
- Publication number
- CN1811462A CN1811462A CN 200510002837 CN200510002837A CN1811462A CN 1811462 A CN1811462 A CN 1811462A CN 200510002837 CN200510002837 CN 200510002837 CN 200510002837 A CN200510002837 A CN 200510002837A CN 1811462 A CN1811462 A CN 1811462A
- Authority
- CN
- China
- Prior art keywords
- circuit board
- substrate
- testing device
- hole
- board testing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Landscapes
- Tests Of Electronic Circuits (AREA)
Abstract
The present invention discloses a circuit board test device. It includes the following several portions: a base plate with several electric conduction holes and connector plug hole, a connector, it is plugged into the connector plug hole on the base plate, and a needle plate group, it is cross-placed on the base plate. Said invention also provides the concrete structure of the above-mentioned every portion, and provides the concrete operation method and steps of said electric circuit board test device.
Description
Technical field
The present invention relates to a kind of circuit board testing device, be meant that especially a kind of circuit board under test that utilizes replaces device pedestal for the basis makes a substrate in addition, by the connector on the substrate, connect winding displacement to tester table, reduce cost and time that testing apparatus is made greatly, further promote the circuit board testing device of testing efficiency and quality.
Background technology
See also shown in Figure 1, the device A of at present traditional circuit board testing is textural, be to go to carry out device A die sinking at particular circuit boards, on the device A of FRX material, hole, get out a plurality of through hole A1 that conform to circuit board, and test probe A2 is placed among these through holes A1, and the tail end of test probe A2 twines a wire rod A3, be connected to connector A4 on the device A by this wire rod A3, utilize connector A4 grafting winding displacement to tester table to test.
Because above-mentioned traditional test mode is after each piece circuit board output, carry out the action of specific device die sinking at this circuit board, though produced device can accord with the circuit board testing needs fully, but the cost height of device die sinking, and the mode of the corresponding device of a circuit board, except the molded time of making long outside, the cost of each die sinking also is an appreciable expense through accumulating over a long period, and every group of device is incompatible, circuit board can't be shared, and after test finishes, be deposited in the warehouse mostly or abandon, except that causing cost waste, also do not meet the environmental protection notion.
See also shown in Figure 2, therefore industry also has another kind of test mode at present, constituted by a board B and a C of dials portion that a general-purpose is tested, the board B of this general-purpose test is drilled with the suitable multi-hole position B1 of quantity (to decide according to the board size on board, quantity is variable), plant test probe B2 in the B1 of position, hole makes on the whole board B to be covered with test probe B2, and this test probe B2 bottom directly is connected with testing apparatus with wire rod.
The C of this dials portion is composited by a plurality of plate body C1 stacked on top again, fix with joint pin C2 between plate body C1, be drilled with a plurality of through hole C3 on this plate body C1, and probe C4 is plugged among the through hole C3 on demand, when desiring to test, plug probe C4 among the through hole C3 prior to the C of dials portion with the corresponding number of locations in position, circuit board under test D hole, again the C of dials portion is placed on the board B, probe C4 by the C of dials portion contacts with the last test probe B2 of board B, circuit board under test D is placed on the C of dials portion test.
And the C of this dials portion only must replace the probe C4 that plate body C1 goes up through hole C3 according to novel circuit plate hole position opposite position in the test recyclable repeated use in back, can test other new boards.
But its cost of manufacture of board B of this general-purpose test is quite expensive, position, the hole B1 that it is drilled with is many more, the wire rod quantity that interior test probe B2 that plants and bottom thereof are connected to testing apparatus also increases relatively, if position, hole B1 on the board B and test probe B2 quantity are for a long time, its cost of manufacture also improves relatively, non-general test manufacturer can bear, and usually is that This is what people generally disapprove of.
Summary of the invention
The technical problem to be solved in the present invention is: a kind of circuit board testing device is provided, with the circuit board under test is that the basis makes substrate replacement device pedestal in addition, and a plurality of jacks of an end install for connector on this substrate, to reduce cost and the time that device pedestal is made greatly.
Another technical matters that the present invention will solve is: a kind of circuit board testing device is provided, utilizes the jack on the substrate directly to plug connector, and lay the circuit that is connected with the hole that electrically conducts, to replace the laying that traditional wire rod connects.
Another technical matters that the present invention will solve is: a kind of circuit board testing device is provided, can repeat to reclaim use by dials portion, only must be during the test new boards according to the test probe of through hole on the circuit board apertures position opposite position displacement plate body, can test other circuit board, removing reduces cost also meets the environmental protection notion.
The another technical matters that the present invention will solve is: a kind of circuit board testing device is provided, surveys constantly directly with substrate as testing base, and the test probe that conforms to position, determinand hole in the displacement dials portion, to shorten the time of test duration and making.
Technical solution of the present invention is: a kind of circuit board testing device, and it comprises: a substrate has a plurality of hole and connector plug jacks of electrically conducting; One needle plate group is cross-placed on the substrate, is composited by multilayer plate body stacked on top, have a plurality of through holes that communicate on this plate body, and test probe is plugged in the described through hole.
The present invention also proposes another kind of circuit board testing device, and it comprises: a substrate has a plurality of hole and a plurality of jacks of electrically conducting; A connector is inserted on the aforesaid substrate; One needle plate group is cross-placed on the substrate, and it is composited by most laminate body stacked on top, have a plurality of through holes that communicate on this plate body, and test probe is plugged in the described through hole.
Characteristics of the present invention and advantage are: circuit board testing device of the present invention, it comprises: a substrate, this substrate has and corresponding a plurality of holes that electrically conduct, circuit under test plate hole position, and this hole that electrically conducts connects upper and lower surface, and this substrate one side is provided with connector plug jack, and this connector plug jack is laid with the circuit that is connected with the hole that electrically conducts; A connector is inserted in the connector plug jack of substrate, and this connector can be connected with the winding displacement of tester table; One needle plate group is cross-placed on the substrate, has the plate body that the plural layer stacked on top is composited, and wears fixingly between plate body with joint pin, have a plurality of through holes that communicate on this plate body, and test probe is plugged in the described through hole.
As described above, must earlier this needle plate group be cross-placed on the substrate before the test, make the test probe of needle plate group corresponding with the hole that electrically conducts of substrate, when desire was tested, the tester placed circuit board under test on the needle plate group, and to the downward application of force of its circuit board under test, make test probe to bottom offset indirectly, the hole and contact electrically conducts can be sent to tester table by connector with signal, and reach aim of quick test.
Description of drawings
See also the detailed description and the accompanying drawing thereof of following relevant a preferred embodiment of the present invention, can further understand technology contents of the present invention and purpose effect thereof; The accompanying drawing of relevant this embodiment is:
Fig. 1 is the member synoptic diagram of known traditional test device;
Fig. 2 is the member synoptic diagram of known general-purpose proving installation;
Fig. 3 is a device synoptic diagram of the present invention;
Fig. 4 is the embodiments of the invention diagrammatic cross-section;
Fig. 5 is the embodiment synoptic diagram of test of the present invention;
Fig. 6 is the another embodiment of the present invention synoptic diagram.
The drawing reference numeral explanation:
A.. proving installation A1.. through hole
A2.. test probe A3.. wire rod
A4.. connector B.. board
B1.. position, hole B2.. test probe
C.. the C1.. of dials portion plate body
C2.. joint pin C3.. through hole
C4.. probe D.. circuit board under test
The hole 1.. substrate 11.. electrically conducts
13.. connector 12.. connector plug jack
14.. flexible member 2.. needle plate group
21.. plate body 22.. joint pin
23.. through hole 24.. test probe
3.. position, circuit board under test 31.. hole
Embodiment
Now for further structure of the present invention, use and feature thereof being had darker one deck, clear and definite, full and accurate understanding and understanding, the inventor enumerates preferred embodiment, and conjunction with figs. is described in detail as follows:
See also Fig. 3 and shown in Figure 4, the present invention is a kind of circuit board testing device, mainly comprises:
One substrate 1, it is a printed circuit board (PCB), this substrate 1 has and corresponding a plurality of holes 11 that electrically conduct, circuit under test plate hole position, and this hole 11 that electrically conducts connects upper and lower surface, and these substrate 1 one sides are provided with connector plug jack 13, and this connector plug jack 13 is laid with the circuit that is connected with the hole 11 that electrically conducts.
A connector 12 is inserted in the connector plug jack 13 of substrate 1, and this connector 12 can be connected with the winding displacement of tester table.
One needle plate group 2 is cross-placed on the substrate, is composited by multilayer plate body 21 stacked on top, and 21 of plate bodys wear fixing with joint pin 22, have a plurality of through holes that communicate 23 on this plate body 21, and test probe 24 is plugged in a plurality of through holes 23.
Wherein, this substrate 1 can be the single or multiple lift circuit board, and Copper Foil can be laid in the surface of this substrate 1.
This hole 11 that electrically conducts utilizes circuit to be connected with connector plug jack 13, makes the signal of circuit board under test 3 be passed to connector 12 by this circuit.
As mentioned above, when desire is tested, the tester is earlier with the test probe 24 in these needle plate group 2 through holes 23, position, hole 31 on the corresponding circuit board under test 3 is changed, and this needle plate group 2 is cross-placed on the substrate 1, the through hole 23 that makes needle plate group 2 and substrate 1 11 positions, hole that electrically conduct are corresponding, and the test probe 24 of needle plate group 2 then deeply electrically conducts in the hole 11.
See also shown in Figure 5, the tester places circuit board under test 3 on the needle plate group 2 during test, make test probe 24 pass position, hole 31 on the circuit board under test 3, downward to its circuit board under test 3 slight application of forces again, at this moment, stressed and the compressing test probe 24 in position, hole 31, make test probe 24 to bottom offset indirectly, mat is hole 11 and contact electrically conducts, signal can be passed to connector 12 by the circuit on the substrate, utilize winding displacement to be sent to testing apparatus,, and reach aim of quick test as the data of testing apparatus detecting.
See also shown in Figure 6, can a sheathed flexible member 14 in the above-mentioned hole 11 that electrically conducts (as spring etc.), make test probe 24 application of forces downward, the contact flexible member 14 in the hole 11 that electrically conducts is used the usefulness as buffering indirectly.
Utilize circuit board under test 3 to replace the proving installation base by the present invention for the basis makes a substrate 1 in addition; and an end has installed connector plug jack 14 and has plugged connector 12 on this substrate 1; can shorten the long defective of time of the making base of traditional test device; and the cost of reduction proving installation base making; and will electrically conduct hole 11 and connector plug jack 14 are connected with circuit; can reduce the laying that traditional wire rod connects; moreover; use the characteristic that this needle plate group 2 can repeat to reclaim; not only further reduce cost of manufacture; the notion that also meets the environmental protection recycling is a kind of time of proving installation making and proving installation of cost of shortening really.
Though the present invention discloses with specific embodiment; but it is not in order to limit the present invention; any those skilled in the art; the displacement of the equivalent assemblies of under the prerequisite that does not break away from design of the present invention and scope, having done; or, all should still belong to the category that this patent is contained according to equivalent variations and modification that scope of patent protection of the present invention is done.
Claims (15)
1. a circuit board testing device is characterized in that, comprises:
One substrate has a plurality of hole and connector plug jacks of electrically conducting;
One needle plate group is cross-placed on the substrate, is composited by multilayer plate body stacked on top, have a plurality of through holes that communicate on this plate body, and test probe is plugged in the described through hole.
2. circuit board testing device as claimed in claim 1 is characterized in that, this substrate is a single-layer printed circuit plate.
3. circuit board testing device as claimed in claim 1 is characterized in that, this substrate is a multilayer board.
4. circuit board testing device as claimed in claim 1 is characterized in that this substrate surface can be laid Copper Foil.
5. circuit board testing device as claimed in claim 1 is characterized in that, this hole that electrically conducts connects upper and lower surface.
6. circuit board testing device as claimed in claim 1 is characterized in that, wears fixing between this plate body with joint pin.
7. circuit board testing device as claimed in claim 1 is characterized in that, plugs a connector on this substrate.
8. circuit board testing device as claimed in claim 1 is characterized in that, the sheathed flexible member of this Kong Zhongke that electrically conducts.
9. a circuit board testing device is characterized in that, comprises:
One substrate has a plurality of hole and a plurality of jacks of electrically conducting;
A connector is inserted on the aforesaid substrate;
One needle plate group is cross-placed on the substrate, and it is composited by most laminate body stacked on top, have a plurality of through holes that communicate on this plate body, and test probe is plugged in the described through hole.
10. circuit board testing device as claimed in claim 9 is characterized in that, this substrate is a single-layer printed circuit plate.
11. circuit board testing device as claimed in claim 9 is characterized in that, this substrate is a multilayer board.
12. circuit board testing device as claimed in claim 9 is characterized in that, this substrate surface can be laid Copper Foil.
13. circuit board testing device as claimed in claim 9 is characterized in that, this hole that electrically conducts connects upper and lower surface.
14. circuit board testing device as claimed in claim 9 is characterized in that, wears fixing between this plate body with joint pin.
15. circuit board testing device as claimed in claim 9 is characterized in that, the sheathed flexible member of this Kong Zhongke that electrically conducts.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200510002837 CN1811462A (en) | 2005-01-25 | 2005-01-25 | Electric circuit board tester |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200510002837 CN1811462A (en) | 2005-01-25 | 2005-01-25 | Electric circuit board tester |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN1811462A true CN1811462A (en) | 2006-08-02 |
Family
ID=36844501
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 200510002837 Pending CN1811462A (en) | 2005-01-25 | 2005-01-25 | Electric circuit board tester |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN1811462A (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102654559A (en) * | 2012-05-10 | 2012-09-05 | 致茂电子(苏州)有限公司 | Test system for testing semiconductor-encapsulated stacked wafer and semiconductor automatic test machine thereof |
| CN103219257A (en) * | 2012-05-10 | 2013-07-24 | 致茂电子(苏州)有限公司 | Testing device of stack type wafer |
| CN106018890A (en) * | 2016-08-10 | 2016-10-12 | 昆山兢美电子科技有限公司 | Rear connecting plate of flying probe test head |
| CN110098726A (en) * | 2018-01-29 | 2019-08-06 | 株洲中车时代电气股份有限公司 | A kind of switching device buffer circuit plate |
| CN112305464A (en) * | 2019-07-15 | 2021-02-02 | 环鸿电子（昆山）有限公司 | Assembly of detection device for detecting plug connector and object to be detected |
-
2005
- 2005-01-25 CN CN 200510002837 patent/CN1811462A/en active Pending
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102654559A (en) * | 2012-05-10 | 2012-09-05 | 致茂电子(苏州)有限公司 | Test system for testing semiconductor-encapsulated stacked wafer and semiconductor automatic test machine thereof |
| CN103219257A (en) * | 2012-05-10 | 2013-07-24 | 致茂电子(苏州)有限公司 | Testing device of stack type wafer |
| CN102654559B (en) * | 2012-05-10 | 2015-04-15 | 致茂电子(苏州)有限公司 | Test system for testing semiconductor-encapsulated stacked wafer and semiconductor automatic test machine thereof |
| CN103219257B (en) * | 2012-05-10 | 2015-10-21 | 致茂电子(苏州)有限公司 | The testing apparatus of stacked wafer |
| CN106018890A (en) * | 2016-08-10 | 2016-10-12 | 昆山兢美电子科技有限公司 | Rear connecting plate of flying probe test head |
| CN110098726A (en) * | 2018-01-29 | 2019-08-06 | 株洲中车时代电气股份有限公司 | A kind of switching device buffer circuit plate |
| CN110098726B (en) * | 2018-01-29 | 2020-08-14 | 株洲中车时代电气股份有限公司 | Switch device buffer circuit board |
| CN112305464A (en) * | 2019-07-15 | 2021-02-02 | 环鸿电子（昆山）有限公司 | Assembly of detection device for detecting plug connector and object to be detected |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN1811462A (en) | Electric circuit board tester | |
| CN1832070A (en) | Embedded multilayer chip capacitor and printed circuit board having the same | |
| CN1661376A (en) | Probe card | |
| CN1766649A (en) | Apparatus for detecting electronic element, circuit and circuit board | |
| CN1309525A (en) | Printed circuit board | |
| CN1044643C (en) | Testing apparatus | |
| CN2491846Y (en) | Test probe | |
| CN2804874Y (en) | Conductive measuring means | |
| CN1146730C (en) | Contact-making apparatus affording ease of servicing | |
| CN1826711A (en) | Compression mount and zero insertion force socket for ic devices | |
| CN1945340A (en) | Detecting apparatus for circuit board | |
| CN2493943Y (en) | Tester structure for printed circuit board | |
| CN1042673C (en) | Test equipment | |
| CN1222198C (en) | Printed circuit board with testing point formed at side | |
| CN200953030Y (en) | Wafer test card | |
| CN1530981A (en) | Apparatus and method for detecting electronic element | |
| CN2798095Y (en) | Probe structure for testing tool | |
| CN1601717A (en) | Probe card substrate | |
| CN1289934A (en) | Combined tester probe | |
| CN2566278Y (en) | Improved testing device structure | |
| CN1912632A (en) | Circuit board testing device | |
| CN1595184A (en) | Testing device for density variable printed circuit board | |
| CN2804875Y (en) | Novel measuring means | |
| CN1553205A (en) | Electrical property testing method of printing circuit board | |
| CN2496036Y (en) | Testing tool for printed circuit board |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
| WD01 | Invention patent application deemed withdrawn after publication |