CN1804647A - Apparatus and method for testing organic electroluminescence display panel - Google Patents
Apparatus and method for testing organic electroluminescence display panel Download PDFInfo
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- CN1804647A CN1804647A CN 200610001124 CN200610001124A CN1804647A CN 1804647 A CN1804647 A CN 1804647A CN 200610001124 CN200610001124 CN 200610001124 CN 200610001124 A CN200610001124 A CN 200610001124A CN 1804647 A CN1804647 A CN 1804647A
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Abstract
The invention relates to a measurer of the organic illuminating display plate, wherein the organic illuminating display plate comprises a plurality of data lines and scan lines; the measurer comprises a detecting control circuit, a grid task device and a source task device. The detecting control circuit can separately generate the grid forecast signal and the source forecast signal to the grid task device and the source task device by an image circuit location coordinate of the organic illuminating display plate. The grid task device and the source task device can separately transmit a grid measuring voltage and a source measuring voltage to one of the scan line and data line by the grid measuring signal and the source measuring signal. The detecting control circuit can record the output voltage value of the image element circuit.
Description
Technical field
The invention relates to a kind of proving installation and method of display panel, and particularly relevant for a kind of proving installation and method that is used in organic electroluminescence display panel.
Background technology
Along with the prosperity of Information technology, of all kinds as information equipments such as computing machine, mobile phone, PDA(Personal Digital Assistant) and digital cameras, all constantly weed out the old and bring forth the new.In these information equipments, display is being played the part of critical role all the time, and flat-panel screens (Flat Panel Display) little by little receives an acclaim owing to have the characteristic of slimming, lightweight and power saving.
In various flat-panel screens, active-matrix Organic Light Emitting Diode (Active Matrix OrganicEmitting Diode, hereinafter to be referred as AMOLED) visual angle is wide, color contrast is effective because of having for display, frivolous, response speed reaches low cost and other advantages soon, so be very suitable for as carry-on audio and video products (mobile computer, PDA, mobile phone etc.), particularly large-scale display device such as TV, monitor etc.
With present technology, the production method of AMOLED panel forms a plurality of thin film transistor (TFT)s earlier, that is adopts active thin-film transistor array base-plate to make image element circuit, and then carries out the evaporation of luminous organic material on insulated substrate.Yet,, the yield of AMOLED panel is descended if defective had taken place before the evaporation luminous organic material image element circuit on the substrate.Because the cost of luminous organic material is very expensive, therefore before the evaporation luminous organic material, how to determine whether image element circuit is normal, to avoid the waste of luminous organic material, just becomes a very important problem.
Summary of the invention
The proving installation that the purpose of this invention is to provide a kind of organic electroluminescence display panel can be at organic electroluminescence display panel evaporation for example before the luminous organic material not also, detects whether defectiveness of image element circuit earlier.
A further object of the present invention provides a kind of method of testing of organic electroluminescence display panel, be suitable for before organic electroluminescence display panel does not also form luminous organic material, an image element circuit on the organic electroluminescence display panel is carried out pointwise to be detected, or carry out the specific pixel electric circuit inspection, to judge whether defectiveness of image element circuit.
The invention provides a kind of proving installation of organic electroluminescence display panel, wherein organic electroluminescence display panel comprises many data lines and sweep trace, and proving installation then comprises the detection control circuit, grid separates multiplexer and source electrode is separated multiplexer.Wherein, detecting control circuit can be according to the position coordinates of an image element circuit of organic electroluminescence display panel, and produces the grid test signal respectively and source electrode test signal to grid separates multiplexer and source electrode is separated multiplexer.Grid separates multiplexer and source electrode is separated multiplexer respectively according to grid test signal and source electrode test signal, and a grid test voltage and one source pole test voltage are delivered to wherein a sweep trace and data line respectively.In addition, detect the output voltage values of control circuit recording pixel circuit, with as image element circuit normal foundation whether.
In preferred embodiment of the present invention, the organic electroluminescence display panel proving installation also comprises a level shifting circuit, and it is used for receiving the output voltage of image element circuit.When the output voltage of image element circuit during less than a reference voltage, then level shifting circuit can produce a low level detection signal to detecting control circuit, otherwise level shifting circuit can produce the detection signal of a high level to detecting control circuit.
And in preferred embodiment of the present invention, detect control circuit and comprised input processor and clock pulse generator.Wherein, input processor is used for receiving a user input data.In a preferred embodiment, user's input information comprises the position coordinates of an activation signal, image element circuit and the resolution information of organic electroluminescence display panel etc.When input processor had received user's input data, clock pulse generator can produce a clock pulse signal to one first counter according to the output of input processor.First counter can be counted clock signal and produce one first count value, and this first count value is row (Column) coordinate that is used for representing each image element circuit in the organic electroluminescence display panel.First counter can be delivered to first count value one comparer and a decision circuitry.Wherein, comparer can compare first count value and a reference value, and this reference value is the number of data line in the organic electroluminescence display panel.Then, comparer can be delivered to comparative result one second counter, so that second counter can produce one second count value according to the output of comparer.When first count value during greater than reference value, second counter can add 1 with second count value, and second count value is row (Row) coordinate of each image element circuit in the organic electroluminescence display panel.In addition, decision circuitry can receive first count value and second count value, to judge whether to meet the coordinate of the image element circuit that the user imported.Determine first count value and second count value when decision circuitry and meet the coordinate time of the image element circuit that the user imports, can control a test signal and produce circuit and produce source electrode test signal and grid test signal respectively, so that image element circuit is tested.
In addition, detect control circuit and can also comprise a record cell, be used for receiving the output of above-mentioned level shifting circuit.When the detection signal of level shifting circuit output low level, then record is carried out in the position of the image element circuit that will test at present of record cell.
From another viewpoint, the invention provides a kind of method of testing of organic electroluminescence display panel, comprise and produce earlier a grid test voltage wherein sweep trace to the organic electroluminescence display panel, produce one source pole test voltage wherein data line to the organic electroluminescence display panel then, a wherein image element circuit of organic electroluminescence display panel is tested.Then, detect the output voltage values of image element circuit.When the output voltage of image element circuit during less than a reference voltage, record is the coordinate position of the image element circuit of test at present.
In a preferred embodiment of the present invention, the organic electroluminescence display panel method of testing more comprises carries out initialization to organic electroluminescence display panel earlier, and detects the resolution of organic electroluminescence display panel.Simultaneously, the present invention also can determine a test pattern to test organic electroluminescence display panel.Wherein, test pattern can comprise a pointwise test pattern and a specific pixel test mode circuit.
Because the present invention sends into grid and source electrode test voltage by sweep trace that is coupled and data line from the test pixel circuit, and detects the output voltage values of image element circuit.Therefore the present invention just can be before organic electroluminescence display panel also form luminous organic material, just can learn in the organic electroluminescence display panel whether defectiveness of each image element circuit.
Description of drawings
Fig. 1 has illustrated the circuit block diagram preferred embodiment according to a kind of organic electroluminescence display panel pick-up unit of the present invention.
Shown in Figure 2ly illustrated a kind of image element circuit circuit diagram that does not also form luminous organic material.
Fig. 3 has illustrated according to a kind of circuit block diagram preferred embodiment that detects control circuit of the present invention.
Fig. 4 has illustrated according to a kind of workflow diagram preferred embodiment of control circuit under the pointwise test pattern that detect of the present invention.
Fig. 5 has illustrated according to a kind of workflow diagram preferred embodiment of control circuit under the specific pixel test pattern that detect of the present invention.
Fig. 6 has illustrated the flow chart of steps preferred embodiment according to the method for testing of a kind of organic electroluminescence display panel of the present invention.
101: detect control circuit
103: grid is separated multiplexer
105: source electrode is separated multiplexer
107: level shifting circuit
120: organic electroluminescence display panel
210: image element circuit
212: switching transistor
214: driving transistors
216: electric capacity
302: input processor
304: clock pulse generator
306: the first counters
308: the second counters
310: comparer
312: decision circuitry
314: test signal produces circuit
316: record cell
S401, S403, S405, S407, S409, S411, S413: detect the workflow of control circuit under the pointwise test pattern
S501,503, S 507, S509, S511, S515, S517, S513: detect the workflow of control circuit under the specific pixel test mode circuit
S601, S603, S605, S607, S609, S611, S613, S615, S617, S619: the steps flow chart of the method for testing of organic electroluminescence display panel
Embodiment
Figure 1 shows that a circuit block diagram of organic electroluminescence display panel pick-up unit 100 provided by the invention.Please refer to a preferred embodiment of the organic electroluminescence display panel pick-up unit 100 that Fig. 1 illustrates, organic electroluminescence display panel pick-up unit 100 comprises and detects control circuit 101, and its output has coupled that grid is separated multiplexer 103 and source electrode is separated multiplexer 105.Wherein, the output that grid is separated multiplexer 103 is coupled to the wherein sweep trace SLi in the organic electroluminescence display panel 120, and the output that source electrode is separated multiplexer 105 then is the wherein data line DLj that couples in the organic electroluminescence display panel 120.
Please continue with reference to Fig. 1, organic electroluminescence display panel pick-up unit 100 provided by the present invention can be tested the image element circuit that does not also form luminous organic material in the organic electroluminescence display panel.When organic electroluminescence display panel pick-up unit 100 of the present invention will be tested organic electroluminescence display panel 120, detection control circuit 101 can be sent grid test signal to the grid of m position earlier and separate multiplexer 103, so that grid is separated multiplexer 103 is delivered to a grid test voltage organic electroluminescence display panel 120 by sweep trace SLi image element circuit.And then source electrode test signal to the source electrode that produces a n position separates multiplexer 105, makes source electrode separate multiplexer 105 the one source pole test voltage is delivered to the image element circuit of organic electroluminescence display panel 120 from data line DLj.Detailed narration can be with reference to following explanation.
Please refer to Fig. 2, it illustrates a kind of circuit diagram that does not also form the organic electroluminescence display panel image element circuit of luminous organic material.Between data line DLj and sweep trace SLi, dispose image element circuit 210.In the present embodiment, image element circuit 210 comprises for example switching transistor 212 and the driving transistors 214 and the electric capacity 216 of thin film transistor (TFT).Wherein, the source terminal of switching transistor 212 has coupled data line DLj, and its gate terminal has coupled sweep trace SLi, and its drain end then is the gate terminal that couples driving transistors 214.In addition, the two ends of the source terminal of driving transistors 214 and gate terminal difference coupling capacitance 216.
Though Fig. 2 provides a kind of image element circuit structure with switching transistor, driving transistors and an electric capacity, yet only be to have the knack of this skill person and understand the present invention, rather than be used for limiting the present invention and leave no choice but use at this kind image element circuit structure for ensuing narration can allow really.Have the knack of this skill person when knowing that the design of the image element circuit structure of organic electroluminescence display panel does not influence the main spirit of the present invention.
Please merge and see figures.1.and.2, after detecting control circuit 101 and having received the activation signal that the user imported, can carry out initialized action organic electroluminescence display panel 120.In the present embodiment, the source terminal of driving transistors 214 is coupled to earth terminal Gnd, so that electric capacity 216 discharge off really, to avoid influencing last measurement result.
Then, detect the position coordinates that control circuit 101 receives the image element circuit to be tested that the user imported.Suppose that the user will test the image element circuit in the organic electroluminescence display panel 210, detect grid test signal to the grid that control circuit 101 will transmit the m position and separate multiplexer 103 this moment.And grid is separated multiplexer 103 and is selected according to the grid test signal from sweep trace SLi input grid test signal, so that switching transistor 212 conductings in the image element circuit 210.Next, source electrode test signal to the source electrode that detects control circuit 101 meeting generation m positions is separated multiplexer 105.At this moment, source electrode is separated multiplexer 105 and will be selected from data line DLj input source electrode test voltage.Thus, switching transistor 212 just can be with the gate terminal of source electrode test voltage conducting to driving transistors 214, and make driving transistors 214 conductings.In this time, the source terminal of driving transistors 214 is to be coupled on the DC voltage Vdd.
In the time of driving transistors 214 conductings, driving transistors 214 source electrodes should be the critical voltage Vth that Dc bias Vdd deducts driving transistors 214 to the voltage difference of grid.Therefore, the voltage at electric capacity 216 two ends can be expressed as Vdd-Vth.Suppose that Dc bias Vdd is 12V, and the critical voltage Vth of driving transistors 214 is 2V.Then when driving transistors 214 conductings, the voltage at electric capacity 216 two ends is normal should to be 10V.Therefore, if the pressure drop of source transistor best drain is 2V, then the output voltage values Vout of drain end should be 8V.That is to say, and if output voltage values Vout is too low, when being assumed to be 2V, then remarked pixel circuit 210 has defective.
In panel tester 100 another preferred embodiments of the present invention, panel tester 100 more comprises level shifting circuit 107, is the output voltage that is used for receiving each image element circuit 210 in the organic electroluminescence display panel 120.When the output voltage of one of them test pixel circuit 210 during less than a predeterminated voltage, level shifting circuit will be exported a low level detection signal and give detection control circuit 101, record will be carried out in the position of problematic test pixel circuit 210 and detect control circuit 101.And if the output voltage of test pixel circuit 210 is when being not less than reference voltage, then level shifting circuit 107 detection signal that will produce high level is given and is detected control circuit 101.And in the present embodiment, this reference voltage is assumed to be 8V.
Fig. 3 has illustrated according to a kind of circuit block diagram that detects control circuit 101 of the present invention.Please refer to a preferred embodiment of the detection control circuit 101 that Fig. 3 illustrates, detect control circuit 101 and can comprise input processor 302, it is used for receiving user's input data, the coordinate position of for example above-mentioned activation signal, image element circuit to be tested 210, and the information such as resolution of organic electroluminescence display panel 120.The output of input processor 302 is coupled to clock pulse generator 304, and clock pulse generator 304 then is that first counter 306 is delivered in output.First counter 306 can couple comparer 310 and decision circuitry 312, and wherein comparer 310 can receive the output and a reference value of first counter 306, and output is coupled to second counter 308.Decision circuitry 312 can receive the output of first counter 306 and second counter 308, and the control test signal produces above-mentioned grid test signal and the source electrode test signal of circuit 314 generations.
Detecting control circuit 101 can have two kinds of test patterns, is respectively pointwise test pattern and specific pixel circuit 210 test patterns.And followingly give a detailed account with regard to these two kinds of test patterns.
Fig. 4 has illustrated according to a kind of workflow diagram of control circuit 101 under the pointwise test pattern that detect of the present invention.Please merge with reference to Fig. 3 and Fig. 4, suppose to detect control circuit 101 and under the pointwise test pattern, the image element circuit in the organic electroluminescence display panel 210 is tested.Therefore, after input processor 302 has received user's input, can control clock pulse generator 304 and carry out step S401, just produce clock signal CLK to the first counter 306.At this moment, first counter 306 can be as described in the step S403, counting clock signal CLK and produce the first count value C1 to comparer 310 and decision circuitry 312.In this time, second counter 308 also can produce the second count value C2 to decision circuitry 312 according to the first count value C1, just as described in the step S405.
In the present embodiment, the first above-mentioned count value C1 is the row-coordinate value of image element circuit 210 in the expression organic electroluminescence display panel, and the second count value C2 then is the row coordinate figure of organic electroluminescence display panel image element circuit 210.Wherein, source electrode is separated multiplexer 105 and is determined the source electrode test voltage is delivered to corresponding data line according to the first count value C1, and it then is to decide according to the second count value C2 grid test voltage is delivered to corresponding scanning line that grid is separated multiplexer 103.
When first comparer 306 produces the first count value C1 to comparer 310, comparer 310 can judge that whether the first count value C1 is greater than reference value as described in the step S407.Wherein, reference value can be the sum of data line in the organic electroluminescence display panel 120.If the first count value C1 is not greater than reference value (just step S407 indicated "No"), then decision circuitry 312 will be controlled test signal generator 314 as described in the step S409, according to the first count value C1 and the second count value C2, and generation difference source electrode test signal and grid test signal are given source electrode multiplexer 105 and grid multiplexer 103, and then begin to repeat from step S403, to test next image element circuit in regular turn.
Relatively, when the first count value C1 during (just step S407 indicated "Yes") greater than reference value, then second counter 308 can add 1 with the second count value C2, and decision circuitry 312 also can control first counter 306 with first counting value returns with counting again, just as described in the step S411.Then, decision circuitry 312 can be as described in the step S413, judges that the second count value C2 is whether greater than the sum of sweep trace in the organic electroluminescence display panel 120.
When the second count value C2 during also not greater than sweep trace total (just step S413 indicated "No"), representative also has and also has image element circuit not test in the organic electroluminescence display panel 120.Therefore detecting control circuit 101 will begin to repeat from step S403.Relatively,, represent all image element circuits all to test and finish, therefore just finish whole workflow when the second count value C2 during (just step S413 indicated "Yes") greater than sweep trace total.
Fig. 5 has illustrated according to a kind of workflow diagram of control circuit 101 under the specific pixel test mode circuit that detect of the present invention.Please merge with reference to Fig. 3 and Fig. 5, suppose that detecting control circuit 101 is to be operated under the specific pixel test mode circuit.At this moment, input processor 302 meetings are according to user's input data, and the coordinate position of decision test pixel circuit 210 in organic electroluminescence display panel 120, just step S501 is described.After input processor 302 has received the coordinate position of test pixel circuit 210 of user's decision, can deliver to decision circuitry 312, and control clock pulse generator 304 produces clock signal CLK to the first counter 306 as described in the step S503.
At this moment, first counter 306 can be as described in the step S507, counting clock signal CLK and produce the first count value C1 to comparer 310 and decision circuitry 312.Simultaneously, second counter 308 also can produce the second count value C2 to decision circuitry 312 according to the first count value C1 as described in the step S509.After decision circuitry 312 has received the first count value C1 and the second count value C2, will carry out step S511, judge exactly whether the first count value C1 and the second count value C2 meet the coordinate figure of the test pixel circuit 210 that the user imports.When if the first count value C1 and the second count value C2 meet the coordinate figure of the test pixel circuit 210 that the user imports (just step S511 indicated "Yes"), then test signal produce circuit 314 will be as described in the step S513, according to the first count value C1 and the second count value C2, and produce source electrode respectively and the grid test signal is given source electrode multiplexer 105 and grid multiplexer 103.
Relatively, when if the first count value C1 and the second count value C2 do not meet the coordinate figure of the test pixel circuit 210 that the user imports (just step S511 indicated "No"), then comparer 310 will carry out step S515, judges that exactly whether the first count value C1 is greater than reference value.If also not greater than reference value (just step S515 indicated "No"), then detecting control circuit 101 will begin to repeat the first count value C1 from step S507.Otherwise, if first count value is during greater than reference value C1 (just step S511 indicated "Yes"), then second counter 308 can add 1 with second count value, and decision circuitry 312 also can be controlled first counter 306 the first count value C1 is made zero, just step S517 is described, detects control circuit 101 then and begins to repeat from step S507 again.
Referring again to Fig. 3, detect control circuit 101 and can also comprise record cell 316.This record cell 316 can couple above-mentioned level shifting circuit 107.When the detection signal of level shifting circuit 107 output low levels, the representative image element circuit 210 of test at present has defective, so record cell 316 just can get off image element circuit 210 location records of testing at present, with as the defective reference frame.
An arrangement is done in above-mentioned explanation, and Fig. 6 has disclosed the flow chart of steps of the method for testing of a kind of organic electroluminescence display panel of the present invention.One preferred embodiment of the method for testing of organic electroluminescence display panel, and cooperate Fig. 6 by hereinafter explanation, at first the present invention can be as described in the step S601, carry out the action of some settings, for example carry out initialization (S603), detect the resolution (S605) of organic electroluminescence display panel to be tested, and determine test pattern (S607) etc.Wherein, test pattern has comprised above-mentioned pointwise test pattern and specific pixel circuit 210 test patterns.
Determined after the test pattern that the present invention can be as the wherein sweep trace in the organic electroluminescence display panel of a grid test voltage being sent into as described in the step S609 test, with all image element circuits 210 that couple on this sweep trace of activation.Then, as described in step S611, the one source pole test voltage is sent into wherein data line in the organic electroluminescence display panel,, can be referred to as test pixel circuit 210 at this with corresponding image element circuit 210 in the test organic electroluminescence display panel.At this moment, the present invention can detect the output voltage of test pixel circuit 210 as described in the step S613, carries out step S615 then, and whether the voltage of judging the test pixel circuit exactly is less than a reference voltage.
If the output voltage values of test pixel circuit 210 is during less than reference voltage (just step S615 indicated "Yes"), represent that then test pixel circuit 210 has defective, therefore the present invention will be as described in the step S617, the coordinate position of record test pixel circuit 210.Relatively, if when the output voltage values of test pixel circuit 210 is not less than reference voltage (just step S615 indicated "No"), represent that then this test pixel circuit 210 should be normal.
In the present embodiment, finish step S615 after, the present invention also can be according to two kinds of above-mentioned test patterns, and carry out step S619, judge whether exactly and will test another image element circuit 210.Suppose that the present invention is operated in the pointwise test pattern, if then also image element circuit all in the organic electroluminescence display panel 210 is not tested, the present invention will begin to repeat from step S609.If finished and in regular turn image element circuits all in the organic electroluminescence display panel has been tested, just finished whole flow process.Relatively, if the present invention works in specific pixel circuit 20 test patterns, then just according to user's input, the mode that decides step S619 to carry out.
In sum, by from sweep trace and data line input test voltage, so the present invention just can be before organic electroluminescence display panel also form luminous organic material, just can judge whether defectiveness of image element circuit 210 from the output voltage of image element circuit.Thus, not only can improve the process rate of organic electroluminescence display panel, and also can reduce the waste of luminous organic material.In addition, owing to the invention provides pointwise test pattern and specific pixel circuit 210 test patterns, therefore allow the present invention have bigger application.
Above-mentioned specific embodiment is only in order to explanation the present invention, but not in order to limit the present invention.
Claims (10)
1. organic electroluminescence display panel proving installation, be suitable for the image element circuit in organic electroluminescence display panel does not also form this organic electroluminescence display panel of luminous organic material Pretesting, this organic electroluminescence display panel comprise many data lines, multi-strip scanning line, and an image element circuit couple one of one of these many data lines and this multi-strip scanning line, wherein image element circuit includes a switching transistor, a driving transistors and a storage capacitors, it is characterized in that this proving installation comprises:
One grid is separated multiplexer, in order to determine that according to a grid test signal grid test voltage is delivered to described multi-strip scanning line one of them and image element circuit;
One source pole is separated multiplexer, determines in order to foundation one source pole test signal the one source pole test voltage is delivered to described many data lines one of them and image element circuit; And
One detects control circuit, it is position coordinates according to the image element circuit of organic electroluminescence display panel, and produce the grid test signal respectively and source electrode test signal to grid is separated multiplexer and source electrode is separated multiplexer, and the output voltage values of recording pixel circuit, as the whether normal foundation of image element circuit.
2. organic electroluminescence display panel proving installation as claimed in claim 1, it is characterized in that, more comprise a level shifting circuit, receive the output voltage of image element circuit, when the output voltage of image element circuit during less than a reference voltage, then this level shifting circuit produces a low level detection signal to detecting control circuit, and when the output voltage of image element circuit during greater than reference voltage, this level shifting circuit produces the detection signal of a high level to detecting control circuit.
3. organic electroluminescence display panel proving installation as claimed in claim 2, it is characterized in that, detect control circuit and comprise a record cell, the output of incoming level change-over circuit, when the detection signal of level shifting circuit output low level, then record cell carries out record with the position of image element circuit.
4. organic electroluminescence display panel proving installation as claimed in claim 1 is characterized in that, detects control circuit and comprises:
One input processor, in order to receiving a user input data, and this user's input data comprises the position coordinates of an activation signal, image element circuit and the resolution information of display panel;
One clock pulse generator produces a clock pulse signal according to the output of input processor;
One first counter, in order to counting clock signal and produce one first count value, and this first count value is each the image element circuit row-coordinate in the expression display panel;
One comparer receives first count value, and in order to first count value and a reference value are compared, and this reference value is the number of described many data lines;
One second counter produces one second count value according to the output of comparer, when first count value during greater than reference value, second counter can add 1 with second count value, and second count value is each the image element circuit row coordinate in the display panel;
One decision circuitry receives first count value and second count value, to judge whether to meet the coordinate of the image element circuit that the user imported; And
One test signal produces circuit, couple decision circuitry, the coordinate time that meets the image element circuit that the user imports when first count value and second count value, this test signal produces circuit can produce source electrode test signal and grid test signal respectively according to first count value and second count value, so that image element circuit is tested.
5. organic electroluminescence display panel proving installation as claimed in claim 1 is characterized in that, detects control circuit and more comprises a record cell, and when image element circuit had defective, then this record cell carried out record with the coordinate position of image element circuit.
6. organic electroluminescence display panel method of testing, be suitable for the image element circuit in organic electroluminescence display panel does not also form this organic electroluminescence display panel of luminous organic material Pretesting, this organic electroluminescence display panel comprises that many data lines, multi-strip scanning line and an image element circuit couple one of one of these many data lines and this multi-strip scanning line, wherein this image element circuit includes a switching transistor, a driving transistors and a storage capacitors, it is characterized in that this method of testing comprises the following steps:
Produce a grid test voltage and send into described multi-strip scanning line one of them;
Produce the one source pole test voltage and send into described many data lines one of them, so that image element circuit is tested;
Detect the output voltage values of image element circuit; And
When the output voltage of image element circuit during less than a reference voltage, the coordinate position of recording pixel circuit.
7. organic electroluminescence display panel method of testing as claimed in claim 6 is characterized in that, more comprises the following steps:
Organic electroluminescence display panel is carried out initialization;
Detect the resolution of organic electroluminescence display panel; And
Determine a test pattern to test organic electroluminescence display panel, and this test pattern comprise a pointwise test pattern or a specific pixel test mode circuit.
8. organic electroluminescence display panel method of testing as claimed in claim 7, it is characterized in that, when the output voltage of image element circuit is not less than reference voltage when determining to use the pointwise test pattern, then repeat to produce the step of grid test voltage and source electrode test voltage, so that another image element circuit is tested, all image element circuit tests finish in organic electroluminescence display panel.
9. organic electroluminescence display panel method of testing as claimed in claim 7 is characterized in that, when the specific pixel test mode circuit was used in decision, then this method of testing more comprised the following steps:
The coordinate position of a specific pixel circuit in the decision organic electroluminescence display panel;
Produce a clock pulse signal;
The counting clock signal also produces one first count value;
Produce one second count value according to first count value;
Judge whether first count value and second count value meet the row-coordinate value and the row coordinate figure of specific pixel circuit respectively;
When first count value does not meet the row-coordinate value of specific pixel circuit, or second count value whether judge first count value greater than a reference value, and this reference value is the number of described many data lines when not meeting the row coordinate figure of specific pixel circuit;
When first count value during, then continue the counting clock signal less than reference value;
When first count value during greater than reference value, then second count value is added 1, and with first counting value returns to produce first count value again;
When first count value meets the row-coordinate value of specific pixel circuit and when second count value meets the row coordinate figure of specific pixel circuit, then according to first count value and second count value, and respectively source electrode test voltage and gate drive voltage are delivered to specific pixel circuit corresponding scanning beam and data line, so that the specific pixel circuit is tested;
When the output voltage of specific pixel circuit was not less than reference voltage, then whether decision will be tested another fc-specific test FC image element circuit; And
When needs are tested another fc-specific test FC image element circuit, then repeat to produce steps such as first count value and second count value.
10. organic electroluminescence display panel method of testing as claimed in claim 7 is characterized in that, organic electroluminescence display panel is carried out initialized step, comprises organic electroluminescence display panel is discharged completely.
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