CN1760634A - 二维坐标测量仪 - Google Patents
二维坐标测量仪 Download PDFInfo
- Publication number
- CN1760634A CN1760634A CNA2005100791776A CN200510079177A CN1760634A CN 1760634 A CN1760634 A CN 1760634A CN A2005100791776 A CNA2005100791776 A CN A2005100791776A CN 200510079177 A CN200510079177 A CN 200510079177A CN 1760634 A CN1760634 A CN 1760634A
- Authority
- CN
- China
- Prior art keywords
- mentioned
- determinand
- measuring head
- determination object
- axis
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/03—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring coordinates of points
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/8422—Investigating thin films, e.g. matrix isolation method
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8854—Grading and classifying of flaws
- G01N2021/8861—Determining coordinates of flaws
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Mathematical Physics (AREA)
Abstract
Description
Claims (4)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004301769A JP4431479B2 (ja) | 2004-10-15 | 2004-10-15 | 2次元座標測定機 |
JP301769/2004 | 2004-10-15 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1760634A true CN1760634A (zh) | 2006-04-19 |
CN100498215C CN100498215C (zh) | 2009-06-10 |
Family
ID=36381582
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB2005100791776A Expired - Fee Related CN100498215C (zh) | 2004-10-15 | 2005-06-28 | 二维坐标测量仪 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP4431479B2 (zh) |
KR (1) | KR101234954B1 (zh) |
CN (1) | CN100498215C (zh) |
TW (1) | TW200612078A (zh) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107560832A (zh) * | 2017-09-06 | 2018-01-09 | 长春国科精密光学技术有限公司 | 测量***及测量数字电影放映机光学参数的方法 |
CN109115129A (zh) * | 2018-11-12 | 2019-01-01 | 江西丝安本精密制版有限公司 | 一种网版拉网角度测试装置及其使用方法 |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101480327B1 (ko) | 2013-07-31 | 2015-01-08 | 한국해양과학기술원 | 해양 주상 시추 코어 시료 광학 촬영 자동화 시스템 및 촬영 방법 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2004044966A1 (ja) | 2002-11-13 | 2004-05-27 | Sumitomo Heavy Industries, Ltd. | 近接露光における位置合わせ方法と位置合わせ装置 |
JP4084653B2 (ja) | 2002-12-26 | 2008-04-30 | 株式会社ブイ・テクノロジー | 二次元測定機 |
-
2004
- 2004-10-15 JP JP2004301769A patent/JP4431479B2/ja not_active Expired - Fee Related
-
2005
- 2005-05-06 KR KR1020050037799A patent/KR101234954B1/ko active IP Right Grant
- 2005-05-13 TW TW094115584A patent/TW200612078A/zh not_active IP Right Cessation
- 2005-06-28 CN CNB2005100791776A patent/CN100498215C/zh not_active Expired - Fee Related
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107560832A (zh) * | 2017-09-06 | 2018-01-09 | 长春国科精密光学技术有限公司 | 测量***及测量数字电影放映机光学参数的方法 |
CN109115129A (zh) * | 2018-11-12 | 2019-01-01 | 江西丝安本精密制版有限公司 | 一种网版拉网角度测试装置及其使用方法 |
Also Published As
Publication number | Publication date |
---|---|
CN100498215C (zh) | 2009-06-10 |
KR101234954B1 (ko) | 2013-02-19 |
TW200612078A (en) | 2006-04-16 |
JP2006112961A (ja) | 2006-04-27 |
JP4431479B2 (ja) | 2010-03-17 |
KR20060047748A (ko) | 2006-05-18 |
TWI354094B (zh) | 2011-12-11 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Owner name: SOKKIA PRECISION SYSTEMS CO., LTD. Free format text: FORMER OWNER: SOKKIA TOPCON CO., LTD. Effective date: 20101201 |
|
C41 | Transfer of patent application or patent right or utility model | ||
C56 | Change in the name or address of the patentee |
Owner name: SOKKIA TOPCON CO., LTD. Free format text: FORMER NAME: SOKKIA CO., LTD. |
|
CP01 | Change in the name or title of a patent holder |
Address after: Kanagawa Patentee after: SOKKIA TOPCON Co.,Ltd. Address before: Kanagawa Patentee before: Sokkia Co.,Ltd. |
|
TR01 | Transfer of patent right |
Effective date of registration: 20101201 Address after: Kanagawa Patentee after: Sokkia Precision System Co.,Ltd. Address before: Kanagawa Patentee before: SOKKIA TOPCON Co.,Ltd. |
|
C56 | Change in the name or address of the patentee |
Owner name: SINTO S-PRECISION, LTD. Free format text: FORMER NAME: SOKKIA PRECISION SYSTEMS CO., LTD. |
|
CP01 | Change in the name or title of a patent holder |
Address after: Kanagawa Patentee after: SINTO S-PRECISION, Ltd. Address before: Kanagawa Patentee before: Sokkia Precision System Co.,Ltd. |
|
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20090610 Termination date: 20200628 |
|
CF01 | Termination of patent right due to non-payment of annual fee |