CN1731241A - Method for accurate positioning of blemish display point on liquid crystal substrate - Google Patents
Method for accurate positioning of blemish display point on liquid crystal substrate Download PDFInfo
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- CN1731241A CN1731241A CN 200410055964 CN200410055964A CN1731241A CN 1731241 A CN1731241 A CN 1731241A CN 200410055964 CN200410055964 CN 200410055964 CN 200410055964 A CN200410055964 A CN 200410055964A CN 1731241 A CN1731241 A CN 1731241A
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Abstract
The invention provides a flaw display point precision positing method of the liquid crystal base plate which comprises the following steps: A: establishing a comparing model which is formed by a normal display point and an around normal display point, choosing two normal display points of around the normal display points as comparing points, defying the differential distance between the center normal display and the two comparing points; B: using the flaw display point around of the liquid crystal and same location normal display point of the two comparing points as base points to compare the precise location of the flow display point; using the above steps and using the normal display point around the flow display point to posit the precise location of the flow display point.
Description
Technical field
The present invention is relevant with the flaw display dot location technology on the crystal liquid substrate, is meant the flaw display dot accurate positioning method of a kind of crystal liquid substrate of the repairing position that can precisely orient the flaw display dot especially.
Background technology
Crystal liquid substrate is in manufacture process; can produce flaw display dot (bad point, bright spot) unavoidably; and the flaw of flaw display dot; normally occur in the connecting portion generation problem between other positions of transistor AND gate that display dot itself had; the dealer usually can be again with a repair apparatus (technology such as laser, hot pressing) with it repairing; when repairing, be to repair near the position that the flaw display dot is close to the transistor.Under general situation, because flaw display dot itself is promptly improper, and flaw is of a great variety, therefore can't be that localization criteria comes the flaw display dot is positioned with the image of normal display points, cause can't accurate localization near the flaw location the transistor, thereby can't be with the running of computer automation location.At present, be to come the flaw location of visual flaw display dot in the artificial mode that sees through the photographic equipment amplification, with the machine location that lights a lamp,, not only take time and effort again conveniently to repair, more can't reduce cost.
Summary of the invention
Fundamental purpose of the present invention is promptly providing a kind of flaw display dot accurate positioning method of crystal liquid substrate, it positions applicable to automation equipment, has solved the problem that prior art can't robotization.
For reaching above-mentioned purpose, flaw display dot accurate positioning method according to a kind of crystal liquid substrate provided by the present invention, include the following step: A, set up one the comparison pattern, this comparison pattern be by a normal display points on the crystal liquid substrate with and on every side normal display points formed, select around this wherein two normal display points as the comparison point in the normal display points, on X-axis and Y-axis, have at least one to have range difference between this two comparisons point, and define normal display points and this two range difference of comparing between point that is positioned at central authorities; B, according to preceding defined comparison pattern, around the flaw display dot on crystal liquid substrate with this two comparisons point same position normal display points as benchmark, compare out the exact position of flaw display dot; By above-mentioned steps, the exact position that can utilize flaw display dot normal display points on every side to orient the flaw display dot.
In order to describe characteristics of the present invention place in detail, lift now with next preferred embodiment and cooperate graphic explanation as the back:
Description of drawings
Fig. 1 is the synoptic diagram of the present invention's first preferred embodiment, shows the ordered state of display dot on the crystal liquid substrate;
Fig. 2 is the comparison pattern synoptic diagram of the present invention's first preferred embodiment;
Fig. 3 is the flaw point comparison synoptic diagram of the present invention's first preferred embodiment;
Fig. 4 (A) to Fig. 4 (O) be the comparison pattern synoptic diagram of the present invention's first preferred embodiment, show various possible comparison patterns;
Fig. 5 is another comparison pattern synoptic diagram of the present invention's first preferred embodiment.
Embodiment
See also Fig. 1 to Fig. 3, the flaw display dot accurate positioning method of a kind of crystal liquid substrate that a preferred embodiment of the present invention provided consists predominantly of the following step:
A, set up one the comparison pattern 11, as shown in Figure 1, this comparison pattern 11 be by a normal display points 5 on the crystal liquid substrate with and the formed 3X3 trellis matrix of 8 normal display points (upper left 1, last 2, upper right 3 a, left side 4, right 6, lower-left 7, down 8, bottom right 9) on every side, wherein, respectively this normal display points 1-9 has the usefulness that a transistor T can supply the location; As shown in Figure 2, select around this wherein two normal display points 1,9 as comparison point C1, a C2 in the normal display points, be to be display dot 1 and display dot 9 in the present embodiment, on X-axis and Y-axis, all has range difference between this comparison point C1, the C2, and define the normal display points 5 that is positioned at central authorities and this two comparison and put range difference between C1, C2, the coordinate X5 of the transistor T of-this central authorities' normal display points 5, Y5 can be calculated by following formula:
X5=(X1+X9)/2 (formula 1)
Y5=(Y1+Y9)/2 (formula 2)
B, according to preceding defined comparison pattern 11, as shown in Figure 3, around the flaw display dot 25 on crystal liquid substrate with this two comparisons point C1, C2 same position normal display points 21,29 as benchmark, wherein, respectively this normal display points 21,29 and flaw display dot 25 all have the usefulness that a transistor T can supply the location, by respectively taking off the exact position that two formula (formula 1 and formula 2) are compared out flaw display dot 25 before this transistor T cooperation;
By above-mentioned steps as can be known, the present invention is the comparison pattern 11 that defines normal display points as shown in Figure 2 earlier, to compare pattern 11 comparison flaw display dot 25 normal display points 21-29 (not comprising 25) on every side again, with the exact position of the transistor T of orienting flaw display dot 25, and then conveniently carry out follow-up relevant repairing action.
Please consult Fig. 4 again, the present invention is defined comparison pattern 11 in steps A, does not exceed with 1 pair of display dot 9 of display dot of diagonal position, comparison pattern 11 shown in Fig. 4 (A)-(O), also be applicable to method provided by the present invention, only must on formula, slightly adjust, for example:
With Fig. 4 (A), its only X-axis range difference is arranged, Y-axis does not then have:
X5＝(X4+X6)/2
Y5＝(Y4+Y6)/2
With Fig. 4 (D):
X5＝(X1+X6)/2
Y5＝Y6
By finding out among Fig. 4 (A)-(O), there is multiple collocation all can be applicable to method provided by the present invention.
Please consult Fig. 5 again, the present invention is defined comparison pattern 30 in steps A, central normal display points 35 8 the normal display points 31-39 on every side that also are not limited only to arrange in pairs or groups do not comprise 35), also can arrange in pairs or groups and use more peripheral display dot, can produce the effect that the flaw display dot is precisely located equally.
Via above-mentioned step, the producible advantage of the present invention is: utilize the position that the normal display points around the flaw display dot is accurately oriented the flaw display dot, and the form of normal display points is to belong to fixing, use the brain robotization that can be used to power location, solved in the prior art because the form of flaw point own is fixing can't the robotization location problem.
Claims (4)
1. the flaw display dot accurate positioning method of a crystal liquid substrate is characterized in that including the following step:
A, set up one the comparison pattern, this comparison pattern be by a normal display points on the crystal liquid substrate with and on every side normal display points formed, select around this wherein two normal display points as the comparison point in the normal display points, on X-axis and Y-axis, have at least one to have range difference between this two comparisons point, and define normal display points and this two range difference of comparing between point that is positioned at central authorities;
B, according to preceding defined comparison pattern, around the flaw display dot on crystal liquid substrate with this two comparisons point same position normal display points as benchmark, compare out the exact position of flaw display dot;
By above-mentioned steps, the exact position that can utilize flaw display dot normal display points on every side to orient the flaw display dot.
2. according to the flaw display dot accurate positioning method of the described crystal liquid substrate of claim 1, it is characterized in that: described each normal display points and flaw display dot all have a transistor can be for the usefulness of location.
3. according to the flaw display dot accurate positioning method of the described crystal liquid substrate of claim 1, it is characterized in that: described this comparison pattern is to be central normal display points and 8 normal display points on every side: upper left, last, upper right, left and right, lower-left, down, formed 3 * 3 trellis matrixes in bottom right.
4. according to the flaw display dot accurate positioning method of the described crystal liquid substrate of claim 1, it is characterized in that: between this two normal display points as the comparison point, on X-axis and Y-axis, all have range difference.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200410055964 CN1731241A (en) | 2004-08-04 | 2004-08-04 | Method for accurate positioning of blemish display point on liquid crystal substrate |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200410055964 CN1731241A (en) | 2004-08-04 | 2004-08-04 | Method for accurate positioning of blemish display point on liquid crystal substrate |
Publications (1)
| Publication Number | Publication Date |
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| CN1731241A true CN1731241A (en) | 2006-02-08 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN 200410055964 Pending CN1731241A (en) | 2004-08-04 | 2004-08-04 | Method for accurate positioning of blemish display point on liquid crystal substrate |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108508637A (en) * | 2018-03-08 | 2018-09-07 | 惠科股份有限公司 | A kind of detection method of display panel, device and automated optical detection equipment |
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2004
- 2004-08-04 CN CN 200410055964 patent/CN1731241A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108508637A (en) * | 2018-03-08 | 2018-09-07 | 惠科股份有限公司 | A kind of detection method of display panel, device and automated optical detection equipment |
| WO2019169822A1 (en) * | 2018-03-08 | 2019-09-12 | 惠科股份有限公司 | Display panel inspection method and device and automated optical detection apparatus |
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