CN1710480A - Test circuit of liquid crystal display and test method - Google Patents
Test circuit of liquid crystal display and test method Download PDFInfo
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- CN1710480A CN1710480A CN 200510082050 CN200510082050A CN1710480A CN 1710480 A CN1710480 A CN 1710480A CN 200510082050 CN200510082050 CN 200510082050 CN 200510082050 A CN200510082050 A CN 200510082050A CN 1710480 A CN1710480 A CN 1710480A
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Abstract
The testing circuit contains a base plate, where there are multiple pixel structures, multiple data lines and P pieces of shorting bars. Each pixel structure possesses n pieces of sub pixels connected corresponding multiple data lines. P pieces of shorting bars are connected to (p*m)+1, (p*m)+2, (p*m)+3 ...(p*m)+p pieces of data lines respectively; if n is odd number, then p=2*n; if n is even number, p=n, and m is zero or positive integer. Using the said testing circuit, the testing method groups P pieces of shorting bars based on n as radix. Inputting a test signal into each group of shorting bars carries out testing. Or, P pieces of shorting bars are arranged to two groups according to odd and even sequence; then, inputting a test signal into each group of shorting bars carries out testing. The invention raises efficiency of testing array section of liquid crystal display and section of crystal cell effectively.
Description
Technical field
The present invention relates to a kind of LCD TEST circuit, the LCD TEST circuit that particularly a kind of number that utilizes sub-pixel divides into groups.
Background technology
In the leading portion process of making LCD, generally be to use method of heap of stone brilliant to form millions of thin film transistor (TFT) as the control module of the sub-pixel of dot structure on a substrate, wherein this substrate can be a glass substrate, a bendable substrate or a silicon material substrate.If there is thin film transistor (TFT) quality when making of part to be not so good as expection, cause to show its switch control characteristic, then can produce defective as bright spot and dim spot, reducing the quality of LCD significantly, is very important problem when becoming the LCD making and how efficiently these millions of thin film transistor (TFT)s to be tested.
See also Fig. 1, it is existing LCD TEST conspectus, comprise many parallel data lines 11 and many parallel gate lines 12 are formed on the substrate, and data line 11 and gate line 12 cross-points more comprise a thin film transistor (TFT) and comprise three sub-pixels 131 usually for this dot structure 13 of control module as the sub-pixel 131 of dot structure 13, these sub-pixels 131 can be distinguished corresponding red (R), green (G), blue (B) three kinds of colors, intensity by three kinds of colors of allotment RGB can make dot structure 13 demonstrate shades of colour.Again, can connect a testing cushion 111 at an end of data line 11, and an end of gate line 12 also can connect a testing cushion 121, test for the end of probe contact of proving installation.
Test the property list now of a certain specific thin film transistor (TFT) when desire, the testing cushion 111 that the data line 11 that thin film transistor (TFT) that this is specific connects connects contact with one first end of probe of proving installation, and the testing cushion 121 of gate line 12 connections that will this specific thin film transistor (TFT) connection contacts with one second end of probe of proving installation.Proving installation can be sent into this thin film transistor (TFT) with test signal via the data line that is connected 11 and gate line 12 via first and second end of probe, judges whether conformance with standard of the characteristic of this thin film transistor (TFT) and quality by this.
But this test mode needs continuous mobile end of probe to contact with specific testing cushion 111,121 in test, and makes the test duration extend.Though it also can increase end of probe quantity on the proving installation to reduce the test duration, still is not a desirable method on cost consideration.
See also Fig. 2, it is existing another kind of LCD TEST conspectus, be the problem that measurement circuit faced of attempting to solve Fig. 1, wherein especially an end of all data lines 11 be connected to a short-circuit rods 21, an end of all gate lines 12 is connected to a gate short bar 22.And an end of short-circuit rods 21 more can connect a testing cushion 211, and an end of gate short bar 22 also can connect a testing cushion 221, tests for the end of probe contact of proving installation.When testing, one first end of probe of proving installation is contacted with the testing cushion 211 that is connected to short-circuit rods 21, and with one second end of probe of proving installation with after the testing cushion 221 that is connected to gate short bar 22 contacts, proving installation can be via first and second end of probe with test signal via short-circuit rods 21 to send in all thin film transistor (TFT)s to drive all thin film transistor (TFT)s with gate short bar 22, utilize liquid crystal board to transfer the test signal of sending into thin film transistor (TFT) to light signal again.When the part thin film transistor (TFT) can't be driven because of the flaw on making, the optical detection system of proving installation just can detect it, so just can reduce the time of test widely.And after finishing test, utilize existing cutting technique data line 11 to be separated with gate short bar 22 with short-circuit rods 21 with gate line 12 along dotted line 23, finish the making of LCD.
But if appoint adjacent two data lines 11 or gate line 12 just short circuit on making, then above-mentioned test mode is the problem that can't test out this circuit defect, for attempting to solve the problem of above-mentioned test mode, can in regular turn data line 11 and gate line 12 groupings be connected to corresponding short-circuit rods.
See also Fig. 3, it is existing another LCD TEST conspectus, be that the measurement circuit of attempting to solve Fig. 2 faces and can't test adjacent two signal line or the problem of gate line short circuit flaw on making taken the post as, the general measurement circuit that is called 2G2D on existing.Wherein comprising many data lines 11, many gate lines 12 and two short-circuit rods 31 is formed on the substrate, and these two short-circuit rods 31 are for being linked to the data line 32 of odd number bar and the data line 33 of even number bar respectively, comprising two gate short bars 34 again is formed on the substrate, and two gate short bars 34 are for being linked to the gate line 35 of odd number bar and the gate line 36 of even number bar respectively, at last short-circuit rods 31 is connected to corresponding testing cushion 311,341 more respectively with the end with gate short bar 34, tests for the end of probe contact of proving installation.When testing, proving installation can be by a plurality of end of probe with after corresponding testing cushion 311,341 contacts, with test signal via short-circuit rods 31 to send in specific a plurality of thin film transistor (TFT)s to test with the gate short bar.In this test mode, owing to appoint two adjacent data lines 11 or gate line 12 all is not connected to identical short-circuit rods, therefore when appointing adjacent two data lines 11 or gate line 12 making just short circuit, use this test mode this can be made flaw and tested out.
This measurement circuit design generally is useful in the array segment test process that LCD is made, because the flaw that on array is made, more often is short-circuited, so the defective that circuit is made of test mode energy full blast is tested out.But when the structure cell section that enters LCD is made, owing to colored filter has been fitted in substrate and has injected liquid crystal material, so the time thin film transistor (TFT) can see through liquid crystal material with test signal and transfer light signal to when driving after, see through colored filter again and transfer light signal to red, blue, green three kinds of colors, three sub-pixels of the corresponding dot structure of difference, can claim that generally red, blue, green three kinds of colors are basic primary colors, utilize the light intensity size colour mixture of these three basic primary colors of control to become required color (for example colors such as purple, Huang, green grass or young crops) and then set up image.So in the structure cell section test process that LCD is made, hope can be with basic primary colors, that is do classification with the sub-pixel numbers of dot structure and just can carry out the test of full blast, because the classification of basic primary colors can be corresponding with signal wire, is connected to corresponding short-circuit rods so can signal wire be divided into three groups in regular turn.
See also Fig. 4, it is existing another LCD TEST conspectus, mainly attempts to be lifted at the testing efficiency in the structure cell section test process that LCD makes, the general measurement circuit that is called 2G3D on existing.Wherein comprise many data lines 11 and many gate lines 12 are formed on the substrate, and more comprising three short-circuit rods 41 is formed on the substrate, and three short-circuit rods 41 are the data line 42,43,44 that is linked to 3m+1,3m+2,3m+3 bar respectively, and wherein m is zero or positive integer.Also being about to data line is to be connected to short-circuit rods 41 after radix is divided into three groups with three, wherein the 1st, 4,7... bar data line 42 is one group, and the 2nd, 5,8... bar data line 43 is another group, and the 3rd, 6,9... bar data line 44 is one group again.Comprising two gate short bars 34 again in addition is formed on the substrate, and two gate short bars 34 are linked to the gate line 35 of odd number bar and the gate line 36 of even number bar respectively, at last short-circuit rods 41 is connected to corresponding testing cushion 411,341 more respectively with the end with gate short bar 34, tests for the end of probe contact of proving installation.When testing, proving installation can be by a plurality of end of probe with after corresponding testing cushion 411,341 contacts, with test signal via short-circuit rods 41 to send in specific a plurality of thin film transistor (TFT)s to test with gate short bar 34.In this test mode, owing to data line 11 has been categorized into corresponding with basic primary colors, so can be via the specific basic primary colors of output behind specific short-circuit rods 41 input test signals, therefore can significantly promote the efficient on the test color representation, so the measurement circuit design generally is useful in the structure cell section test process that LCD is made.But if this measurement circuit design will test is appointed two adjacent signal line 11 whether short circuit on making, the then essential data line 42,43,44 of 3m+1,3m+2,3m+3 bar will the test respectively in twos, appoint whether short circuit of two adjacent data lines 11 to learn, significantly increase the test duration, and the array segment testing efficiency when causing reducing LCD and making.
By preceding described, no matter be to adopt as the figure three or the LCD TEST circuit of figure four signals, array segment and structure cell section testing efficiency in the time of all can't promoting the LCD making effectively simultaneously, also even adopt the panel line design of figure three, structure cell section testing efficiency in the time of will certainly reducing the LCD making, and if adopt the panel line design of figure four, array segment testing efficiency in the time of will certainly reducing the LCD making, change rapidly at this, time is just represented in the LCD industry of competitive power, if do not cause the test duration long because the Test Design method is good, and then have influence on the progress of shipment, being as good as is the competitive power of reduction industry.So, make the shipment progress can significantly promote the competitive power of LCD industry in response to the industry characteristic that changes fast if can attempt to address the above problem in today that the LCD industry develops rapidly.
By this, develop a kind of LCD TEST circuit, short-circuit rods by the multiple of the number that sub-pixel is set, the testing efficiency of array segment and structure cell section is carrying out the not good problem of testing time-effectiveness rate to solve above-mentioned existing LCD TEST circuit when making this LCD TEST circuit can promote simultaneously LCD effectively to make, eagerly look forward to and the inventor person of bearing in mind always for the LCD user in fact, and the inventor is based on engaging in LCD research and development and many practical experience for many years, it is the idea of thinking and improveing, poor its people's professional knowledge, and inquire into through research and design in many ways and special topic, the LCD TEST circuit that so far proposes a kind of number grouping that utilizes sub-pixel is with as the problems referred to above one settling mode and foundation.
Summary of the invention
A kind of LCD TEST circuit provided by the invention, comprise a substrate, a plurality of dot structures, many data lines and p short-circuit rods, wherein a plurality of dot structures are for being formed on the substrate, and each dot structure has n sub-pixel, and many data lines are for being formed on the substrate, and correspondence is connected in these sub-pixels, p short-circuit rods is for being formed on this substrate again, and p short-circuit rods is the (p * m)+1 that is linked to respectively, (p * m)+2, (p * m)+3..., (p * m)+p bar data line, wherein, when n is odd number, p=2 * n, when n is even number, p=n, and m is zero or positive integer.
The less important a kind of test method for liquid crystal display that provides of the present invention for utilizing aforesaid LCD TEST circuit, is that radix divides into groups with n with this p short-circuit rods again, and the difference input test signal is to the short-circuit rods of each group.P short-circuit rods can also be divided into 2 groups in proper order according to the odd even of arranging, and the difference input test signal is to the short-circuit rods of each group.
Embodiment with n=3 explains because 3 be odd number, so be provided with 6 short-circuit rods (p=2 * 3), and these 6 short-circuit rods for be linked to the respectively (6 * m)+1, (6 * m)+2, (6 * m)+3..., (data line 6 * m)+6.During structure cell section test when desiring to carry out LCD and make, can be that radix divides into groups with 3 with these 6 short-circuit rods, that is the 1st, 4 short-circuit rods be one group, the 2nd, 5 short-circuit rods be one group, and the 3rd, 6 short-circuit rods is one group.Then the difference input test signal is to the short-circuit rods of each group, because short-circuit rods divides into groups with the number 3 of son picture number again, therefore the interior on the same group equal corresponding same color sub-pixel of short-circuit rods, so on detecting, can independently produce basic primary colors, the test mode of the full blast of the structure cell section test when this is the LCD making in order to detection.When the array segment when desiring to carry out the LCD making is tested, can be with these 6 short-circuit rods for being divided into 2 groups in proper order according to the odd even of arranging, then input test signal so can detect the flaw of taking the post as adjacent two signal line short circuits, to carry out the test of full blast to the short-circuit rods of each group respectively.
Embodiment with n=4 explains, because 4 be even number, so be provided with 4 short-circuit rods (p=4), and these 4 short-circuit rods are for being linked to the respectively (4 * m)+1, (4 * m)+2, (4 * m)+3 and (data line 4 * m)+4.When the structure cell section when desiring to carry out the LCD making is tested, can be that radix divides into groups with 4 with these 4 short-circuit rods, that is each short-circuit rods have one group of one's own.Then the difference input test signal is to the short-circuit rods of each group, because short-circuit rods divides into groups with the number 4 of son picture number again, therefore the interior on the same group equal corresponding same color sub-pixel of short-circuit rods, so on detecting, can independently produce basic primary colors, the test mode of the full blast of the structure cell section test when this is the LCD making in order to detection.When the array segment when desiring to carry out the LCD making is tested, can be with these 4 short-circuit rods for being divided into 2 groups in proper order according to the odd even of arranging, then input test signal so can detect the flaw of taking the post as adjacent two signal line short circuits, to carry out the test of full blast to the short-circuit rods of each group respectively.
The above embodiments explanation is an illustrative only all, and non-limiting, when n=5,6,7..., also can apply mechanically above-mentioned rule, so that to carry out the test mode of full blast.
Another less important a kind of LCD TEST circuit that provides of the present invention again, comprise a substrate, a plurality of dot structure, many data lines and n short-circuit rods, wherein a plurality of dot structures are for being formed on the substrate, and each dot structure has n sub-pixel, n is an odd number, and many data lines are for being formed on the substrate, and correspondence is connected in these sub-pixels, n short-circuit rods is for being formed on this substrate again, (n * m)+1, (n * m)+2, (n * m)+3..., (n * m)+n bar data line, wherein m is zero or positive integer and n short-circuit rods is for being linked to the respectively.
Comprehensively above-mentioned, LCD TEST circuit provided by the invention and method, the testing efficiency of array segment and structure cell section in the time of can promoting simultaneously LCD effectively and make also can significantly increase the elasticity of shipment progress.Testing cost in the time of not only can directly reducing LCD and make, and can cooperate the high flexibility shipment progress of the display industry of quick change, more can promote the competitive power of LCD industry.
Further understand and understanding for allowing to technical characterictic of the present invention and the effect reached had, hereinafter sincerely provide preferred embodiment and relevant drawings to think the usefulness of assisting a ruler in governing a country, and with detailed comment cooperate explanation as after.
Description of drawings
Fig. 1 is existing a kind of LCD TEST conspectus;
Fig. 2 is existing another kind of LCD TEST conspectus;
Fig. 3 is existing another LCD TEST conspectus;
Fig. 4 is existing another LCD TEST conspectus;
Fig. 5 is according to a kind of LCD TEST conspectus of the present invention;
Fig. 6 is for revising the LCD TEST conspectus of Fig. 5;
Fig. 7 is according to another kind of LCD TEST conspectus of the present invention; And
Fig. 8 is according to another LCD TEST conspectus of the present invention.
The reference numeral explanation:
11: data line; 43: data line;
111: testing cushion; 44: data line;
12: gate line; 51: dot structure;
121: testing cushion; 511: sub-pixel;
13: dot structure; 52: data line;
131: sub-pixel; 521: data line;
21: short-circuit rods; 522: data line;
211: testing cushion; 523: data line;
22: the gate short bar; 524: data line;
221: testing cushion; 525: data line;
23: dotted line; 526: data line;
31: short-circuit rods; 53: short-circuit rods;
311: testing cushion; 531: testing cushion;
32: data line; 532: short-circuit rods;
33: data line; 533: short-circuit rods;
34: the gate short bar; 534: short-circuit rods;
341: testing cushion; 54: gate line;
35: gate line; 541: gate line;
36: gate line; 542: gate line;
41: short-circuit rods; 55: the gate short bar;
411: testing cushion; 551: testing cushion;
42: data line; Compile short-circuit rods at 61: the first;
611: testing cushion; 823: data line;
Compile short-circuit rods at 62: the second; 824: data line;
621: testing cushion; 825: data line;
63: dotted line; 83: short-circuit rods;
71: dot structure; 831: testing cushion;
711: sub-pixel; 84: gate line;
72: data line; 841: gate line;
721: data line; 842: gate line;
722: data line; 85: the gate short bar; And
723: data line; 851: testing cushion.
724: data line; 73: short-circuit rods;
731: testing cushion; 74: gate line;
741: gate line; 742: gate line;
75: the gate short bar; 751: testing cushion;
81: dot structure; 811: sub-pixel;
82: data line; 821: data line;
822: data line;
Embodiment
Because LCD TEST circuit of the present invention is for being the notion of foundation sub-pixel numbers in order to divide into groups, at this only as an illustration for the embodiment when sub-pixel numbers is 3 and 4, remaining sub-pixel numbers also can be able to concrete enforcement according to the notion of the present invention's grouping, so promptly will not give unnecessary details.
See also Fig. 5, it is according to a kind of LCD TEST conspectus of the present invention, it is in particular sub-pixel numbers is 3 embodiment, comprise a substrate, a plurality of dot structures 51, many data lines 52 and 6 short-circuit rods 53, wherein substrate can be a glass substrate or is a bendable substrate, and a plurality of dot structures 51 are formed on the substrate, and each dot structure 51 has 3 sub-pixels 511, many data lines 52 are for being formed on the substrate again, and correspondence is connected in these sub-pixels 511, and 6 short-circuit rods 53 are formed on this substrate, and these 6 short-circuit rods 53 are linked to the (6 * m)+1 respectively, (6 * m)+2, (6 * m)+3, (6 * m)+4, (6 * m)+5 and (6 * m)+6 data line 521,522,523,524,525,526, wherein m is zero or positive integer.Also being about to data line is to be connected to short-circuit rods 53 after radix is divided into six groups with 6, wherein the 1st, 7,13... bar data line 521 is one group, 2nd, 8,14... bar data line 522 is one group, 3rd, 9,15... bar data line 523 is one group, 4th, 10,16... bar data line 524 is one group, 5th, 11,17... bar data line 525 is one group, and the 6th, 12,18... bar data line 526 is one group.This LCD TEST circuit more can comprise many gate lines 54 and is formed on the substrate again, and correspondence is connected in these sub-pixels 511, and comprise two gate short bars 55 and be formed on this substrate, and these two gate short bars 55 are linked to the gate line 541 of odd number bar and the gate line 542 of even number bar respectively.End with short-circuit rods 53 and gate short bar 55 is connected to corresponding testing cushion 531,551 more respectively at last, tests for the end of probe contact of proving installation.When testing, proving installation can be by a plurality of end of probe with after corresponding testing cushion 531,551 contacts, input test signal to short-circuit rods 53 with gate short bar 55 to test.
During structure cell section test when desiring to carry out LCD and make, can be that radix divides into groups with 3 with these 6 short-circuit rods 53, that is the 1st, 4 short-circuit rods 532 be one group, the 2nd, 5 short-circuit rods 533 be one group, and the 3rd, 6 short-circuit rods 534 is one group.Then the difference input test signal is to the short-circuit rods 53 of each group, because short-circuit rods 53 divides into groups with the number 3 of son picture number again, that is test signal is for inputing to the short-circuit rods 532,533,534 of each group binding same color sub-pixel simultaneously, so on detecting, can independently produce basic primary colors, the test mode of the full blast of the structure cell section test when this is the LCD making in order to detection.When the array segment when desiring to carry out the LCD making is tested, can be with these 6 short-circuit rods 53 for being divided into 2 groups in proper order according to the odd even of arranging, then the difference input test signal is to the short-circuit rods of each group, so can detect the flaw of taking the post as adjacent two signal line short circuits, to carry out the test of full blast.
See also Fig. 6, it is for revising the LCD TEST conspectus of Fig. 5, wherein more comprising one first compiles short-circuit rods 61 and one second and compiles short-circuit rods 62 and be formed on the substrate, and these 6 short-circuit rods 53 more are connected to first respectively according to the odd even order and compile short-circuit rods 61 and second and compile short-circuit rods 62, first compiles the end that short-circuit rods 61 and second compiles short-circuit rods 62 and more can be connected to corresponding testing cushion 611,621 respectively again, tests for the end of probe contact of proving installation.Because these 6 short-circuit rods 53 are divided into 2 groups in proper order according to the odd even of arranging, so when carrying out the array segment test, only input test signal to the first compiles short-circuit rods 61 and second and compiles short-circuit rods 62 respectively, can detect the flaw of taking the post as adjacent two signal line short circuits, to carry out the test of full blast.After test is finished, utilize existing cutting technique short-circuit rods 53 and first to be compiled short-circuit rods 61 and second and compile short-circuit rods 62 and separate along dotted line 63, then as the aforementioned method of testing to carry out the test of structure cell section.
See also Fig. 7, it is according to another kind of LCD TEST conspectus of the present invention, it is in particular sub-pixel numbers is 4 embodiment, comprise a substrate, a plurality of dot structures 71, many data lines 72 and 4 short-circuit rods 73, wherein substrate can be a glass substrate or is a bendable substrate, and a plurality of dot structures 71 are for being formed on the substrate, and each dot structure 71 has 4 sub-pixels 711, many data lines 72 are for being formed on the substrate again, and correspondence is connected in these sub-pixels 711, and 4 short-circuit rods 73 are for being formed on this substrate, and these 4 short-circuit rods 73 are for being linked to the (4 * m)+1 respectively, (4 * m)+2, (4 * m)+3 and (4 * m)+4 data line 721,722,723,724, wherein m is zero or positive integer.Also being about to data line is to be connected to short-circuit rods 73 after radix is divided into four groups with 4, wherein the 1st, 5,9... bar data line 721 is one group, 2nd, 6,10... bar data line 722 is one group, the 3rd, 7,11... bar data line 723 is one group, and the 4th, 8,12... bar data line 724 is one group.This LCD TEST circuit more can comprise many gate lines 74 and is formed on the substrate again, and correspondence is connected in these sub-pixels 711, and comprise two gate short bars 75 and be formed on this substrate, and these two gate short bars 75 are linked to the gate line 741 of odd number bar and the gate line 742 of even number bar respectively.End with short-circuit rods 73 and gate short bar 75 is connected to corresponding testing cushion 731,751 more respectively at last, tests for the end of probe contact of proving installation.When testing, proving installation can be by a plurality of end of probe with after corresponding testing cushion 731,751 contacts, input test signal to short-circuit rods 73 with gate short bar 75 to test.
When the structure cell section when desiring to carry out the LCD making is tested, can be that radix divides into groups with 4 with these 4 short-circuit rods 73, that is each short-circuit rods 73 have one group of one's own.Then the difference input test signal is to the short-circuit rods 73 of each group, because short-circuit rods 73 divides into groups with the number 4 of son picture number again, that is test signal is for inputing to the short-circuit rods of each group binding same color sub-pixel simultaneously, so on detecting, can independently produce basic primary colors, the test mode of the full blast of the structure cell section test when this is the LCD making in order to detection.When the array segment when desiring to carry out the LCD making is tested, can be with these 4 short-circuit rods 73 for being divided into 2 groups in proper order according to the odd even of arranging, then the difference input test signal is to the short-circuit rods of each group, so can detect the flaw of taking the post as adjacent two signal line short circuits, to carry out the test of full blast.
This LCD TEST circuit also can be revised a little with aforesaid again, these 4 short-circuit rods 73 is connected to first respectively according to the odd even order again compiles short-circuit rods and second and compile short-circuit rods, gives unnecessary details so promptly no longer give.
At last, again for an embodiment so that the convenient explanation of another less important LCD TEST circuit of providing of the present invention because the number n of sub-pixel is an odd number, only is example with n=5 at this, when n=7,9,11..., also can apply mechanically this rule.See also Fig. 8, it is for being foundation another LCD TEST conspectus of the present invention, it is in particular sub-pixel numbers is 5 embodiment, comprise a substrate, a plurality of dot structures 81, many data lines 82 and 5 short-circuit rods 83, wherein substrate can be a glass substrate or is a bendable substrate, and a plurality of dot structures 81 are for being formed on the substrate, and each dot structure 81 has 5 sub-pixels 811, many data lines 82 are formed on the substrate again, and correspondence is connected in these sub-pixels 811, and 5 short-circuit rods 83 are formed on this substrate, and these 8 short-circuit rods 83 are linked to the (5 * m)+1 respectively, (5 * m)+2, (5 * m)+3, (5 * m)+4 and (5 * m)+5 data line 821,822,823,824,825, wherein m is zero or positive integer.Also being about to data line is to be connected to short-circuit rods 83 after radix is divided into five groups with 5, wherein the 1st, 6,11... bar data line 821 is one group, 2nd, 7,12... bar data line 822 is one group, 3rd, 8,13... bar data line 823 is one group, 4th, 9,14... bar data line 824 is one group, and the 5th, 10,15... bar data line 525 is one group.This LCD TEST circuit more can comprise many gate lines 84 and is formed on the substrate again, and correspondence is connected in these sub-pixels 811, and comprise two gate short bars 85 and be formed on this substrate, and these two gate short bars 85 are for being linked to the gate line 841 of odd number bar and the gate line 842 of even number bar respectively.End with short-circuit rods 83 and gate short bar 85 is connected to corresponding testing cushion 831,851 more respectively at last, tests for the end of probe contact of proving installation.When testing, proving installation can be by a plurality of end of probe with after corresponding testing cushion 831,851 contacts, input test signal to short-circuit rods 83 with gate short bar 85 to test.
By the above embodiments explanation, utilize a kind of LCD TEST circuit provided by the invention, the testing efficiency of array segment and structure cell section in the time of can promoting the LCD making simultaneously effectively.Though the above embodiments only disclose with specific sub-pixel numbers, the present invention also can extensively overlap the LCD TEST circuit that is used for the anyon number of pixels.
Though the present invention discloses as above with preferred embodiment; right its is not in order to limit the present invention; anyly have the knack of this skill person; without departing from the spirit and scope of the present invention; when can being used for a variety of modifications and variations, so protection scope of the present invention is as the criterion when looking accompanying the claim person of defining.
Claims (15)
1. LCD TEST circuit, wherein, this circuit comprises:
One substrate;
A plurality of dot structures are for being formed on this substrate, and each dot structure has n sub-pixel;
Many data lines are formed on this substrate, and correspondence is connected in these sub-pixels; And
P short-circuit rods be for being formed on this substrate, and this p short-circuit rods for be linked to respectively (p * m)+1, (p * m)+2, (p * m)+3..., (p * m)+p bar data line, wherein,
When n is odd number, p=2 * n,
When n is even number, p=n,
And m is zero or positive integer.
2. LCD TEST circuit as claimed in claim 1 wherein, more comprises a plurality of testing cushion and be formed on this substrate, and these testing cushion correspondences is linked to these short-circuit rods.
3. LCD TEST circuit as claimed in claim 1 wherein, more comprises many gate lines and be formed on this substrate, and correspondence is connected in these sub-pixels.
4. LCD TEST circuit as claimed in claim 3 wherein, more comprises two gate short rods and is formed on this substrate, and these two gate short bars are for being linked to the gate line of this odd number bar and the gate line of this even number bar respectively.
5. LCD TEST circuit as claimed in claim 1 wherein, more comprises one first and compiles short-circuit rods and one second and compile short-circuit rods and be formed on this substrate.
6. LCD TEST circuit as claimed in claim 5, wherein, p short-circuit rods is connected to this respectively according to the odd even order and first compiles short-circuit rods and this second and compile short-circuit rods.
7. LCD TEST circuit comprises at least:
One substrate;
A plurality of dot structures are formed on this substrate, and each dot structure has n sub-pixel, and n is an odd number;
Many data lines are formed on this substrate, and correspondence is connected in these sub-pixels; And
N short-circuit rods is formed on this substrate, and this n short-circuit rods (n * m)+1, (n * m)+2, (n * m)+3..., (n * m)+n bar data line, wherein, m is zero or positive integer in order to be linked to the respectively.
8. LCD TEST circuit as claimed in claim 7 wherein, more comprises a plurality of testing cushion and is formed on this substrate, and these testing cushion are that correspondence is linked to these short-circuit rods.
9. LCD TEST circuit as claimed in claim 7 wherein, more comprises many gate lines and be formed on this substrate, and correspondence is connected in these sub-pixels.
10. LCD TEST circuit as claimed in claim 9 wherein, more comprises two gate short rods and is formed on this substrate, and these two gate short bars are for being linked to the gate line of this odd number bar and the gate line of this even number bar respectively.
11. test method for liquid crystal display, be applicable to a LCD, this LCD has a plurality of dot structures of n sub-pixel, many data lines are that correspondence is connected in these sub-pixels and grouping is connected to p short-circuit rods, when n is odd number, and p=2 * n, when n is even number, p=n, wherein, this test method for liquid crystal display comprises at least:
With this p short-circuit rods, be that radix divides into groups with n; And
Input test signal is to the short-circuit rods of each group respectively.
12. test method for liquid crystal display as claimed in claim 11, wherein this test signal is for inputing to the short-circuit rods of each group binding same color sub-pixel simultaneously.
13. test method for liquid crystal display as claimed in claim 11 more comprises:
This p short-circuit rods is divided into 2 groups in proper order for the odd even according to arrangement; And
Input test signal is to the short-circuit rods of each group respectively.
14. test method for liquid crystal display as claimed in claim 11, wherein, this p short-circuit rods more is connected to one first according to the odd even sequential packet of arranging and compiles short-circuit rods and one second and compile short-circuit rods.
15. test method for liquid crystal display as claimed in claim 14 wherein, more comprises respectively input test signal and first compiles short-circuit rods and this second and compile short-circuit rods to this.
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