CN1603928A

CN1603928A - Liquid crystal display panel and testing method therefor

Info

Publication number: CN1603928A
Application number: CN 200410094679
Authority: CN
Inventors: 曾圣嘉
Original assignee: AU Optronics Corp
Current assignee: AU Optronics Corp
Priority date: 2004-11-12
Filing date: 2004-11-12
Publication date: 2005-04-06
Anticipated expiration: 2024-11-12
Also published as: CN100346221C

Abstract

It is a LCD panel and its test method. The panel comprises a display area and an outer pressure wielding area located around the display area which comprises a first test pad, second test pad, third test pad which are connected with test picture element and a test picture element.

Description

Display panels and method of testing thereof

Technical field

The present invention relates to a kind of display panels and method of testing thereof, particularly relate to a kind of display panels that utilizes liquid crystal cell test pad (cell test pad) as thin film transistor (TFT) i-v curve test pad (TFT I-Vcurve test pad).

Background technology

With reference to figure 1a, 1b, the space of the panel configuration (panel layout) of display panels 10 major parts of known small-medium size is all very tight, do not put testing electrical property component groups (TEG mark) 11 owing to might there be the space in the panel, so testing electrical property component groups 11 is seated in the panel outer rim, use for array test (arraytest), but when cutting into pieces, testing electrical property component groups 11 can be removed in the lump, if the problem of electrical aspect takes place, when needing to measure i-v curve, owing to do not put the testing electrical property component groups in the panel, test probe needs directly to measure the pixel (pixel) of panel inside, but, can increase and measure degree of difficulty and reduce accuracy because the circuit of pixel is very thin.

In addition, after the liquid crystal cell test, the short circuit bonding jumper (shorting bar) 12 that is positioned at the panel left can be removed by edging or laser mode, and this will make that liquid crystal cell test pad 13 is ineffective.

Summary of the invention

In view of this, the object of the present invention is to provide a kind of display panels, it can utilize liquid crystal cell test pad as thin film transistor (TFT) i-v curve test pad.

According to the present invention, a kind of display panels is provided, it comprises a viewing area and an external pins pressing district, wherein external pins pressing district is positioned at the viewing area periphery, and have one first test pad, one second test pad, one the 3rd a test pad and a test pixel, and the first test pad, the second test pad and the 3rd test pad are electrically connected with test pixel respectively.

In a preferred embodiment, the first test pad is the control utmost point for test pixel, and the second test pad is first utmost point for test pixel, and the 3rd test pad is second utmost point for test pixel.

Will be appreciated that the first test pad can be the grid of test pixel, and the second test pad and the 3rd test pad can be respectively the source electrode or the source electrode of test pixel.

In another preferred embodiment, the viewing area has a plurality of display pixels, and the first test pad and the second test pad are the test pads for display pixel.

Again in the present invention, a kind of method of testing of display panels is provided, comprise the following steps: at first, one display panels and a plurality of test probe are provided, wherein display panels has one first test pad, one second test pad, one the 3rd a test pad and a test pixel, and the first test pad, the second test pad and the 3rd test pad are electrically connected with test pixel respectively; Then, test probe is contacted with the first test pad, the second test pad and the 3rd test pad respectively, and a test signal is conducted to test pixel, to obtain the i-v curve of test pixel.

In a preferred embodiment, method of testing also comprises provides an i-v curve to measure board, it is electrically connected with test probe respectively, to provide the test signal to test pixel via test probe, the first test pad, the second test pad and the 3rd test pad.

Again, test pixel conducts to i-v curve with a signal via the first test pad, the second test pad, the 3rd test pad and test probe and measures board, the signal that i-v curve is measured board self-test in the future pixel carries out operational analysis, to obtain the i-v curve of test pixel

For above and other objects of the present invention, feature and advantage can be become apparent, a preferred embodiment cited below particularly, and in conjunction with the accompanying drawings, be described in detail below.

Description of drawings

Fig. 1 a is the synoptic diagram for known display panels;

Fig. 1 b is the enlarged drawing partly of the A among Fig. 1 a;

Fig. 2 a is the synoptic diagram for display panels of the present invention;

Fig. 2 b is the enlarged drawing partly of the B among Fig. 2 a;

Fig. 2 c is the enlarged drawing partly of the C among Fig. 2 b; And

Fig. 3 is the process flow diagram for the i-v curve method of testing of display panels of the present invention.

The reference numeral explanation:

10 display panels

11 testing electrical property component groups

12 short circuit bonding jumpers

13 liquid crystal cells test pad

20 display panels

21 viewing areas

22 external pins pressing districts

The 22a first test pad

The 22b second test pad

22c the 3rd test pad

The 22d test pixel

22e, 22f, 22g circuit

Embodiment

With reference to figure 2a, 2b, 2c, display panels 20 of the present invention comprises a viewing area 21 and an external pins pressing district (OLB, outer lead bonding) 22, wherein has a plurality of display pixels (not shown) in the viewing area 21, to show required image.

External pins pressing district 22 is positioned at viewing area 21 peripheries, and have one first test pad 22a, one second test pad 22b, one the 3rd a test pad 22c and a test pixel 22d, wherein the first test pad 22a and the second test pad 22b are the test pads for the display pixel in the viewing area 21, also be, as the test pad 13 among the first test pad 22a and the second test pad 22b such as Fig. 1 b, be to be liquid crystal cell test pad (cell test pad).

Display panels 20 of the present invention and known display panels different be in: more be provided with the 3rd test pad 22c and test pixel 22d in the external pins pressing district 22, and by the first test pad 22a, the second test pad 22b and the 3rd test pad 22c are electrically connected with test pixel 22d via

circuit

22e, 22f, 22g respectively, can make known useless liquid crystal cell test pad (the first test pad 22a and the second test pad 22b), as thin film transistor (TFT) i-v curve test pad (TFT I-V curve test pad).

Generally speaking, when the thin film transistor (TFT) i-v curve is tested, the first test pad 22a can be used as the control utmost point (grid) of test pixel 22d, and the second test pad 22b is first utmost point (source electrode or source electrode) for test pixel 22d, and the 3rd test pad 22c is second utmost point (source electrode or source electrode) for test pixel 22d.

Will be appreciated that, all be coated with ITO (tin indium oxide) on the surface of the first test pad 22a, the second test pad 22b and the 3rd test pad 22c, and respectively by perforation in the external pins pressing district 22 and the metal level conducting that is positioned at the below, because this is that those skilled in the art are known, so omit its detailed description at this.

The formation of display panels of the present invention below illustrates its i-v curve method of testing as mentioned above.

With reference to figure 3, method of testing comprises the following steps: at first, shown in step s11, provide above-mentioned display panels 20, an i-v curve to measure board (not shown) and a plurality of test probe (not icon), wherein i-v curve measurement board is electrically connected with test probe respectively, to provide a test signal to test pixel 22d via test probe; Then, shown in step s12, test probe is contacted with the 3rd test pad 22c with the first test pad 22a, the second test pad 22b respectively, conduct to test pixel 22d via the first test pad 22a, the second test pad 22b and the 3rd test pad 22c will test signal; At last, shown in step s13, signal in the test pixel 22d conducts to i-v curve via the first test pad 22a, the second test pad 22b, the 3rd test pad 22c and test probe and measures board, the row operation analysis of going forward side by side can obtain the i-v curve of test pixel 22d.

As above-mentioned, owing to can make full use of known liquid crystal cell test pad useless in display panels, be converted into thin film transistor (TFT) i-v curve test pad, and only need place a test pad and a test pixel again, can measure i-v curve, need not in panel, to seek the space and place testing electrical property component groups (TEG mark) or place two test pads in addition, can make the space of glass reach best utilization factor.

Though the present invention discloses as above with preferred embodiment; yet it is not in order to limit the present invention; any those skilled in the art; without departing from the spirit and scope of the present invention; certainly can do some and change and retouching, so protection scope of the present invention should be with being as the criterion that claims scope is defined.

Claims

1. display panels comprises:

One viewing area; And

One external pins pressing district, this external pins pressing district is positioned at this viewing area periphery, and have one first test pad, one second test pad, one the 3rd a test pad and a test pixel, wherein this first test pad, this second test pad are connected with this test pixel respectively with the 3rd test pad.

2. display panels as claimed in claim 1, it is characterized in that: this first test pad is the control utmost point for this test pixel, and this second test pad is first utmost point for this test pixel, and the 3rd test pad is second utmost point for this test pixel.

3. display panels as claimed in claim 2 is characterized in that: this first test pad is the grid for this test pixel, and this second test pad is the source electrode for this test pixel, and the 3rd test pad is the source electrode for this test pixel.

4. display panels as claimed in claim 2 is characterized in that: this first test pad is the grid for this test pixel, and this second test pad is the source electrode for this test pixel, and the 3rd test pad is the source electrode for this test pixel.

5. display panels as claimed in claim 1 is characterized in that: this viewing area has a plurality of display pixels, and this first test pad and this second test pad are the test pads for these display pixels.

6. the method for testing of a display panels comprises:

One display panels and a plurality of test probe are provided, wherein this display panels has one first test pad, one second test pad, one the 3rd a test pad and a test pixel, and this first test pad, this second test pad and the 3rd test pad are electrically connected with this test pixel respectively; And

These test probes are contacted with the 3rd test pad with this first test pad, this second test pad respectively, and a test signal is conducted to this test pixel, to obtain the i-v curve of this test pixel.

7. the method for testing of display panels as claimed in claim 6 is characterized in that: also comprise:

Provide an i-v curve to measure board, it is electrically connected with these test probes respectively, to provide this test signal to this test pixel via these test probes, this first test pad, this second test pad and the 3rd test pad.

8. the method for testing of display panels as claimed in claim 7 is characterized in that: also comprise:

This test pixel conducts to this i-v curve with a signal via this first test pad, this second test pad, the 3rd test pad and these test probes and measures board, this i-v curve is measured board will carry out operational analysis from the signal of this test pixel, to obtain the i-v curve of this test pixel.