CN1584499A - Raster projecting three-dimensional outline measuring apparatus and method based on phase shift - Google Patents

Abstract

A method for measuring three-dimensional outline based on raster projection of phase shift includes projecting raster picture with sine distribution on measured object; finalizing phase shift procedure by controlling projective fring with computer; using CCD camera, image collecting card and computer to work out trans shaped raster pictures and three-dimensional face shape of the object. The device for realizing the method is also disclosed by the present invention.

Description

Optical grating projection formula three-dimensional contour outline measuring set and measuring method based on phase shift

Technical field

The invention belongs to three-dimensional sensing and fields of measurement, particularly a kind of optical grating projection formula three-dimensional contour outline measuring set and measuring method based on phase shift.

Background technology

The three-dimensional object surface profilometry is one of focus of at present domestic and international three-dimensional sensing and measurement Research, and it is widely used in fields such as Aero-Space, online detection and quality control, machine-building, medical diagnosis, computer-aided design (CAD)/manufacturing, robotic vision system.Mainly contain following several measuring method at present: 1, laser spot measurement method, because the method once can only be measured a point, though the measuring accuracy height, efficient is extremely low; 2, laser line scanning method (abbreviation light cross-section method), this method is one-line scanning, higher with the spot measurement relative efficiency, measuring accuracy is higher, Project Realization is easy, be present mature methods, but the method must can realize when testee is realized whole audience scanning survey by the motion of three coordinate measuring machine; 3, Moire fringe technique, the method are the reference grating stacks that the deformation gate picture is identical with the cycle, utilize observed drawing plotting to go out the level line of object, it belongs to measurement of full field, can measure dynamic object, but measuring accuracy is not high, device is complicated, from practical application one segment distance is arranged still; 4, optical grating projection method, it also is a kind of measurement of full field, generally requires the line of projection lens photocentre and camera lens photocentre to be parallel to reference planes, and this condition is difficult to satisfy when actual measurement, and phase shift function is finished by mechanical motion in addition, and precision is not high; The most important thing is traditional optical grating projection method after obtaining the object phase information, must carry out the demarcation of phase place to the respective coordinates of height to total system, this calibration process is very complicated, and stated accuracy directly influences measuring accuracy.

Summary of the invention

The object of the present invention is to provide a kind of efficiency of measurement height, measuring accuracy is reliable, optical grating projection formula three-dimensional contour outline measuring set and measuring method based on phase shift that Project Realization is easy.

For achieving the above object, the inventive system comprises support and be arranged on platform on the support, platform is provided with optical projection system one and imaging system two, be provided with reference surface in optical projection system one and imaging system two front ends, be characterized in, imaging system two comprises imaging lens and CCD camera, the CCD camera is connected with computing machine by image pick-up card, optical projection system one comprises illuminator and the spatial light modulator and the projection lens that are arranged in the illumination path, and spatial light modulator is connected with computing machine with image card by video distributor; Image card is the double end image card, and monitor is connected with computing machine by this double end image card; Imaging system two is connected with guide rail on the platform by fixture, and imaging system can and can be rotated around fixture along the guide rail translation; Support is the liftable support.

The measuring method that the present invention adopts is:

1) at first generating three calibration graph with computing machine is right-angled intersection, the horizontal line section of a certain-length s, and the vertical stripe of a random length is used for the parameter of labeling projection system one and imaging system two;

2) computerized control the specific calibration graph of optical projection system one projection be the right-angled intersection figure to reference surface, adjust optical projection system one and make it project to projection pattern symmetry on the reference surface, determine the position of right-angled intersection point;

3) computerized control the specific calibration graph of optical projection system one projection be certain-length be the line segment of s to reference surface, measure this line segment and project to length on the reference surface, be designated as A ₁B ₁,, can obtain equation by geometric relationship $\frac{d_p}{D_p}=\frac{s}{A_1{B}_1}----\left(1\right);$

Wherein: d _pBe the distance of projection lens photocentre to spatial light modulator; D _pBe the distance of projection lens photocentre to reference surface;

4) on reference surface, place and highly be the rectangle calibrating block that indicates millimeter scale of h, with optical projection system one projected length be the line segment of s on calibrating block, length is that the line segment of s projects to the length A on this calibrating block ₂B ₂, utilize geometric relationship, can obtain equation $\frac{d_p}{D_p-h}=\frac{s}{A_2{B}_2}----\left(2\right);$

5) simultaneous formula (1) and (2) obtain d _p, D _p, then obtain the coordinate that P is ordered;

6) placement highly is the rectangle calibrating block that indicates millimeter scale of h on reference surface, the Projection surveying figure is single striped, stripe direction is perpendicular to the photocentre of optical projection system one and the line of imaging system two photocentres, utilize CCD camera, image pick-up card and computer acquisition and recording image data, obtain the side-play amount e of striped, get by geometric relationship $\frac{h\sin \mathrm{\θ}}{e}=\frac{l-h\cos \mathrm{\θ}}{l^{\′}}----\left(3\right);$

Wherein l is the distance of reference surface center to the imaging lens photocentre; L ' is the distance of imaging lens photocentre to the CCD camera, and θ is the angle of optical projection system optical axis and imaging system optical axis;

7) on reference surface, place highly be the rectangle calibrating block that indicates millimeter scale of H, Projection surveying figure 3 be single striped on calibrating block 20, side-play amount is e ', is obtained by geometric relationship $\frac{H\sin \mathrm{\θ}}{e^{\′}}=\frac{l-H\cos \mathrm{\θ}}{l^{\′}}$ (4)；

8) focal length of imaging system is known, then has $l^{\′}=\frac{l\×f}{l-f}----\left(5\right),$ F is the focal length of imaging lens;

9) simultaneous formula (3), (4), (5) get l, l ', and θ promptly obtains the coordinate that C is ordered;

10) by computer control optical projection system one throw successively have Sine distribution four step phase shift bar graphs to testee, utilize ccd video camera, image pick-up card to obtain view data and store in the computing machine;

11) go on foot the phase (x that phase shift algorithm are obtained striped on the image planes with four, y), obtain the side-play amount of striped on the image planes by phase value, phase place corresponding relation according to imaging surface and projecting plane, also can obtain the position of corresponding projected fringe on spatial light modulator, therefore just can determine picture point Q ' and subpoint Q _pCoordinate;

12) some P, C, Q ' and Q have been arranged _pCoordinate, can obtain projection straight line and imaging straight line, their intersection point is exactly the coordinate of arbitrfary point on the object.

Because the present invention projects to the raster graphic with Sine distribution on the testee with controllable projector, finish the phase shift process by the computer control projected fringe, with the serial deformed grating picture that CCD gamma camera, image pick-up card and computer acquisition and processing obtain, obtain the 3 d shape of object.This system does not require that the line of projection light source camera lens photocentre and camera lens photocentre is parallel to reference surface, and do not need to demarcate the corresponding relation of phase place and object coordinates, directly obtain corresponding pixel points on the image planes and the position on the spatial light modulator by phase place, utilize geometric relationship, obtain the height of object.

Description of drawings

Fig. 1 is a measurement mechanism front elevation of the present invention;

Fig. 2 is the structure principle chart of measurement mechanism of the present invention;

Fig. 3 is the structural representation of calibrating block of the present invention, and wherein Fig. 3 (a) is the structural representation of calibrating block 18, and Fig. 3 (b) is the structural representation of calibrating block 19;

Fig. 4 is a measuring principle synoptic diagram of the present invention;

Fig. 5 is a system parameter calibration schematic diagram of the present invention; Wherein Fig. 2 a is imaging system parameter calibration figure; Fig. 2 b is optical projection system parameter calibration figure;

Fig. 6 is Digital Image Processing of the present invention and reconfiguration program process flow diagram;

Fig. 7 is the program flow diagram that the present invention changes from the phase place to the object height.

Embodiment

Below in conjunction with accompanying drawing the present invention is described in further detail.

Referring to Fig. 1,2, the present invention includes liftable support 17 and be arranged on platform 14 on the liftable support 17, platform 14 is provided with imaging system two and optical projection system one, imaging system one is installed on the platform 14 by guide rail 15, imaging system two comprises imaging lens 9 and CCD camera 8, CCD camera 8 is connected with computing machine 6 by image pick-up card 4, optical projection system one comprises illuminator 13 and the spatial light modulator 12 and the projection lens 7 that are arranged in the illumination path, spatial light modulator 12 is connected with computing machine 6 with double end image card 5 by video distributor 3, monitor 1 is connected with computing machine 6 by double end image card 4, monitor 2 links to each other with computing machine 6 with video distributor by double end image card, is provided with reference surface 10 at the front end of imaging system two and optical projection system one.The rayed spatial light modulator 12 that sends by illuminator two, its spatial light modulator 12 is by computing machine 6 controls, projection grating is produced and is shown on the spatial light modulator 12 by computing machine 6, pass through projection lens 7 then, projection pattern is projected on the testee 11, and wherein testee 11 is placed on the reference surface 10; By the optical grating projection pattern of testee 11 modulation through imaging lens 9 and 8 imagings of CCD camera, gather and store in the computing machine 6 through image pick-up card 4 and computing machine 6, wherein image pick-up card 4 and double end image card 5 is in computing machine 6, and gatherer process is by computing machine 6 controls; CCD camera 8 links to each other with computing machine 6 by signal wire; Computing machine 6 is by double end image card 5 control monitor 2 and spatial light modulators 12, and wherein monitor 2 is to link to each other with double end image card 5 by video distributor 3 with spatial light modulator 12.Optical projection system one and imaging system two are respectively an integral body, and imaging system two is by guide rail 15 and tighten up screw 18 and be fixed on the platform 14, adjust to tighten up the angle that screw 18 can change imaging system two and optical projection system one; Optical projection system one links together with platform 14 usefulness fixed screws 16, and platform 14 can up-down adjustment by liftable support 17.Annotate: fixed screw 16 and tighten up screw 18 and do not show in the drawings.

Referring to Fig. 3, calibrating block 19,20 is a rectangular rectangular block, and it highly is respectively h and H, and to indicate with the millimeter on its surface be the scale of unit.

Referring to Fig. 4, wherein X, Y, Z are three coordinate axis, and some P and some C are respectively the photocentre of projection lens 7 and pick-up lens 9, some O, A is respectively the intersection point of optical projection system one optical axis and reference surface 10 and testee 11, point O ', A ' is respectively an O, the imaging point of A on CCD camera 8, point Q is the arbitrfary point on the testee 11, claim the incident point, some Q ' is the imaging point of some Q at CCD camera 8, some Q _pBe corresponding point Q launching a little on spatial light modulator 12.

Referring to Fig. 5 (a), wherein X, Y, Z, point O is the intersection point of optical projection system one optical axis and imaging system two optical axises, θ is the angle of two optical axises, point C is the photocentre of imaging system two, and some A is the intersection point of optical projection system one optical axis and testee 11, and some O ' is the intersection point of imaging optical axis and CCD camera 8, point A ' is the imaging point of some A, and some B is the intersection point of some A to straight line OO '.

Referring to Fig. 5 (b) wherein X, Y, Z, some P is the photocentre of optical projection system one, and SOM is a spatial light modulator 12, and β is half angle of divergence of projected light beam.

Measuring method of the present invention is:

1) at first generates three calibration graph, be used for labeling projection system and imaging system parameter with computing machine 6;

2) with the specific calibration graph 1 of computing machine 6 control optical projection system one projections be the right-angled intersection figure to reference surface 10, adjust optical projection system one and make it project to projection pattern symmetry substantially on the reference surface 10, determine the position of right-angled intersection point;

3) with the specific calibration graph 2 of computing machine 6 control optical projection system one projections be the line segment of certain-length s to reference surface 10, measure this line segment and project to length on the reference surface 10, be designated as A ₁B ₁,, can obtain equation by the geometric relationship of Fig. 2 (b) $\frac{d_p}{D_p}=\frac{s}{A_1{B}_1}----\left(1\right);$

4) referring to Fig. 3 (a), on reference surface 10, place and highly be the rectangle calibrating block 19 that indicates millimeter scale of h, with optical projection system one Projection surveying figure 2 be the line segment of certain-length s on calibrating block 19, length is that the line segment of s projects to the length A on this calibrating block 19 ₂B ₂, can obtain equation by geometric relationship $\frac{d_p}{D_P-h}=\frac{s}{A_2{B}_2}----\left(2\right),$

5) simultaneous formula (1) and (2) obtain d _p, D _p, then obtain the coordinate that P is ordered;

6) placement highly is the rectangle calibrating block 19 that indicates millimeter scale of h on reference surface 10, Projection surveying figure 3 is single striped, stripe direction is perpendicular to the line of optical projection system one photocentre and imaging system two photocentres, utilize CCD camera 8, image pick-up card 3 and computing machine 6 to gather and recording image data, obtain the side-play amount e of striped, geometric relationship by Fig. 2 (a) has relational expression $\frac{h\sin \mathrm{\θ}}{e}=\frac{l-h\cos \mathrm{\θ}}{l^{\′}}----\left(3\right);$

7) referring to Fig. 3 (b), placement highly is the rectangle calibrating block 20 that indicates millimeter scale of H on reference surface 10, and the single striped of Projection surveying figure is on calibrating block 20, and side-play amount is e ', is got by geometric relationship $\frac{H\sin \mathrm{\θ}}{e^{\′}}=\frac{l-H\cos \mathrm{\θ}}{l^{\′}}----\left(4\right);$

8) focal length of imaging system two is known, then has $l^{\′}=\frac{l\×f}{l-f}----\left(5\right),$ F is the focal length of imaging lens;

9) simultaneous formula (3), (4), (5) can obtain l, l ', and θ promptly obtains the coordinate that C is ordered;

10) as shown in Figure 6, at first input will produce the cycle and the feature size that will produce bar graph of striped, generates the bar graph with Sine distribution with sine function then, and this is that the initial phase of bar graph is 0.The initial phase branch that changes striped is clipped to pi/2, π, and 3 pi/2s obtain four width of cloth phase shift bar graphs altogether, and program run finishes.Throw successively by computing machine 6 control optical projection systems one and to have four of Sine distribution and go on foot the phase shift bar graphs to testee, utilize CCD camera 8, image pick-up card 4 to obtain view data and store in the computing machine 6;

11) referring to Fig. 7, at first read in four width of cloth bar graphs of four width of cloth phase shifts, find the solution the phase place of striped with four step phase-shift methods, do then and separate the parcel processing, to obtain real phase value.) go on foot the phase (x that phase shift algorithm are obtained striped on the image planes with four, y), obtain the side-play amount of striped on the image planes by phase value, phase place corresponding relation according to imaging surface and projecting plane (SOM), also can obtain the position of corresponding projected fringe on SOM, therefore just can determine picture point Q ' and subpoint Q _pCoordinate;

12) some P, C, Q ' and Q have been arranged _pCoordinate, can obtain projection straight line and imaging straight line, their intersection point is exactly the coordinate of arbitrfary point on the object.

The present invention has simplified measurement mechanism greatly, does not have mechanical motion in the measuring process, can realize accurate phase shift, and method of operating is simple.This system can realize the whole audience, change high-acruracy survey fast and automatically.

Claims (5)

1, optical grating projection formula three-dimensional contour outline measuring set based on phase shift, comprise support [17] and be arranged on platform [14] on the support [17], platform [14] is provided with optical projection system one and imaging system two, be provided with reference surface [10] in optical projection system one and imaging system two front ends, it is characterized in that: imaging system two comprises imaging lens [9] and CCD camera [8], CCD camera [8] is connected with computing machine [6] by image pick-up card [4], optical projection system one comprises illuminator [13] and is arranged on spatial light modulator [12] and projection lens [7] in the illumination path that spatial light modulator [12] is connected with computing machine [6] with image card [5] by video distributor [3].

2, the optical grating projection formula three-dimensional contour outline measuring set based on phase shift according to claim 1, it is characterized in that: said image card [5] is the double end image card, and monitor [2] is connected with computing machine [6] by this double end image card [5].

3, the optical grating projection formula three-dimensional contour outline measuring set based on phase shift according to claim 1, it is characterized in that: said imaging system two is connected with guide rail [15] on the platform [14] by fixture [18], and imaging system can and can be rotated around fixture [18] along the guide rail translation.

4, the optical grating projection formula three-dimensional contour outline measuring set based on phase shift according to claim 1, it is characterized in that: said support [17] is the liftable support.

5, a kind of based on the described optical grating projection formula measuring three-dimensional profile method of claim 1 based on phase shift, it is characterized in that:

1) at first using computing machine [6] to generate three calibration graph is right-angled intersection, the horizontal line section of a certain-length s, and the vertical stripe of a random length is used for the parameter of labeling projection system one and imaging system two;

2) with the specific calibration graph of computing machine [6] control optical projection system one projection be the right-angled intersection figure to reference surface [10], adjustment optical projection system one makes it project to projection pattern symmetry on the reference surface [10], determines the position of right-angled intersection point;

3) with the specific calibration graph of computing machine [6] control optical projection system one projection be certain-length be the line segment of s to reference surface [10], measure this line segment and project to length on the reference surface [10], be designated as A ₁B ₁,, can obtain equation by geometric relationship $\frac{d_p}{D_p}=\frac{s}{A_1{B}_1}\left(1\right);$

Wherein: d _pBe the distance of projection lens [7] photocentre to spatial light modulator [12]; D _pBe the distance of projection lens [7] photocentre to reference surface [10];

4) placement highly is the rectangle calibrating block [19] that indicates millimeter scale of h on reference surface, and the line segment that with optical projection system one projected length is s is on calibrating block [19], and length is that the line segment of s projects to the length A on this calibrating block ₂B ₂, utilize geometric relationship, can obtain equation $\frac{d_P}{D_p-h}=\frac{s}{A_2{B}_2}\left(2\right);$

5) simultaneous formula (1) and (2) obtain d _p, D _p, then obtain the coordinate that P is ordered;

6) go up placement at reference surface [10] and highly be the rectangle calibrating block [19] that indicates millimeter scale of h, the Projection surveying figure is single striped, stripe direction is perpendicular to the photocentre of optical projection system one and the line of imaging system two photocentres, utilize CCD camera [8], image pick-up card [4] and computing machine [6] to gather and recording image data, obtain the side-play amount e of striped, get by geometric relationship $\frac{h\sin \mathrm{\θ}}{e}=\frac{l-h\cos \mathrm{\θ}}{l^{\′}}\left(3\right);$

Wherein l is the distance of reference surface center to imaging lens [9] photocentre; L ' is the distance of imaging lens [9] photocentre to CCD camera [8], and θ is the angle of optical projection system optical axis and imaging system optical axis;

7) go up placement at reference surface [10] and be that highly the rectangle calibrating block [20] that indicates millimeter scale of H, Projection surveying figure [3] are that single striped arrives on the calibrating block [20], side-play amount is e ', is obtained by geometric relationship

$\frac{H\sin \mathrm{\θ}}{e^{\′}}=\frac{l-H\cos \mathrm{\θ}}{l^{\′}}\left(4\right);$

8) focal length of imaging system is known, then has $l^{\′}=\frac{l\×f}{l-f}\left(5\right),$ F is the focal length of imaging lens;

9) simultaneous formula (3), (4), (5) get l, l ', and θ promptly obtains the coordinate that C is ordered;

10) throw successively by computing machine [6] control optical projection system one and have four of Sine distribution and go on foot the phase shift bar graphs to testee [11], utilize ccd video camera [8], image pick-up card [4] to obtain view data and store in the computing machine [6];

11) go on foot the phase (x that phase shift algorithm are obtained striped on the image planes with four, y), obtain the side-play amount of striped on the image planes by phase value, phase place corresponding relation according to imaging surface and projecting plane, also can obtain the position of corresponding projected fringe on spatial light modulator [12], therefore just can determine picture point Q ' and subpoint Q _pCoordinate;

12) some P, C, Q ' and Q have been arranged _pCoordinate, can obtain projection straight line and imaging straight line, their intersection point is exactly the coordinate of arbitrfary point on the object.

Images