CN1558212A - High precision measuring device and method for angle of rotation - Google Patents
High precision measuring device and method for angle of rotation Download PDFInfo
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- CN1558212A CN1558212A CNA2004100160079A CN200410016007A CN1558212A CN 1558212 A CN1558212 A CN 1558212A CN A2004100160079 A CNA2004100160079 A CN A2004100160079A CN 200410016007 A CN200410016007 A CN 200410016007A CN 1558212 A CN1558212 A CN 1558212A
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Abstract
The high precision rotation angle measurer includes one light source to emit one parallel light beam, one chopper, one light splitter to split the light beam penetrating the chopper into one measuring light beam and one reference light beam, polarizer, sample box and polarization analyzer with a computer controlled rotating mechanism for the measuring light beam to pass through, the first photoelectronic detector to produce measuring signal, the second photoelectronic detector to produce reference signal, one divider to divide the measuring signal with the reference signal, one phase lock amplifier to process data from the divider, and computer to obtain the extinction point of the measuring signal via fitting process. By means of measuring the phase angle corresponding to the extinction point without sample and the phase angle of the sample, the rotation angle of the tested sample may be obtained easily.
Description
Technical field
The present invention relates to a kind of measurement mechanism, especially relate to a kind of high-precision angle of rotation measurement mechanism and measuring method.
Background technology
In the actual life, many materials have optical activity, as crystal, medicine etc. and many liquid substances.Therefore, the measurement of angle of rotation is widely used in the identification of some materials, the check of purity and the judgement of concentration.For example,, can judge, and further promote the inspection that is used for urine sugar value and urine protein value the sugar-containing concentration in the aqueous solution by measurement to angle of rotation.Measurement mechanism commonly used is to send one with a sodium vapor lamp to have the sodium light that wavelength is 589nm, and by the logical optical filtering of band, lens and slit make it become a branch of approximate directional light, in the both sides of sample box the polarizer and analyzer are set, behind analyzer, the light that sees through analyzer is measured with photo-detector, with rotating mechanism of a computer control analyzer is rotated in the plane perpendicular to the direction of propagation of light at the axis of homology, and the output signal of photo-detector carried out record analysis, measure the extinction point of the measured matter that does not have optical activity and the extinction point of active measured matter respectively, just can measure angle of rotation.But this traditional measurement mechanism one is that stability of light source is not high enough; The 2nd, the letter of output signal/make an uproar poor; The 3rd, the repeatable accuracy of analyzer rotation is not high enough, thereby makes the repeated not good enough of measurement.Above-mentioned defective effect the precision of measuring, especially for the measurement of less angle of rotation, because signal is less, its measuring-signal is subjected to the interference of extraneous spurious signal and the influence of ground unrest, it is lower to measure sensitivity, is difficult to measure accurately.Existing angle of rotation measurement mechanism is owing to adopt laser instrument as measurement light source, its stability is greatly improved, signal intensity also improves greatly, but owing to believe/make an uproar than still relatively poor, especially basic the solution failed in the influence of ground unrest, at signal hour, and especially at light signal during near zero-bit, the influence of ground unrest is particularly evident, and measuring accuracy and measurement sensitivity all can't be improved effectively.On June 18th, 2003 was introduced a kind of phase rotary angle test devices in the disclosed No. 01143888.6 Chinese invention patent ublic specification of application, utilize the velocity of propagation difference of different circle polarization components in optically-active solution can cause this principle of change of difference interference signal phase, by reference optical signal and difference interference signal by optically-active solution cross mutually, again output signal is measured immediately the amplitude of the phase signal after the amplification by low-pass filter, owing to adopted the double light path signal, reduced the influence of external environment factor effectively, improve measuring stability and measuring accuracy, increased substantially the sensitivity of measuring the optically-active angle simultaneously.But this apparatus structure is too complicated comparatively speaking, the characteristic that not only light source requirements is had bistable frequency, two polarizations as the laser instrument of light source, the signal processing apparatus that also needs a cover to be made of phase deviation device and multiplier in the back of photodetector makes reference signal be offset pi/2 with respect to measuring-signal, and the reference signal after will being offset and the measuring-signal optically-active angle that multiplies each other and obtain determinand; In addition, measuring element is many more, and the cumulative errors that is caused by element also can be big more.
Summary of the invention
Technical matters to be solved by this invention is to provide a kind of simple in structure at above-mentioned prior art present situation, and it is little to be affected by the external environment, and measures sensitivity and measuring accuracy all than higher, high-precision angle of rotation measurement mechanism and measuring method that measuring repeatability is good.
The present invention solves the problems of the technologies described above the technical scheme that is adopted: a kind of high-precision angle of rotation measurement mechanism, comprise a light source, this light source sends a branch of incident beam, described incident beam is a parallel beam, described incident beam passes a chopper, the incident beam beam splitting that beam splitter will pass described chopper becomes measuring beam and reference beam, described measuring beam passes the polarizer successively, sample box, enter first optical detection device behind the analyzer, described analyzer is provided with rotating mechanism, described rotating mechanism drives described analyzer rotation by a computer control, described reference beam enters second optical detection device, the reference signal that measuring-signal that described first optical detection device produces and described second optical detection device produce is transfused to a divider and is divided by, the output signal of described divider links to each other with described computing machine by the RS232 interface after importing a lock-in amplifier, and obtains the extinction point of described measuring-signal with fitting process by described computing machine.
Described extinction point can be to choose the signal wave crest of measuring gained in the one-period to obtain with fitting process after the measurement data of the part between the trough.
Described extinction point is preferably chosen the signal wave crest of measuring gained in the one-period and is obtained with fitting process after the measurement data of the centre between the trough three/part.
Described rotating mechanism can be described computer-controlled round precise grating.
The described polarizer and described analyzer all can use Glan-thomson prism.
Described light source is preferably the He-Ne laser instrument, and also available semiconductor laser through collimation substitutes.
Described first optical detection device and described second optical detection device are silicon photocells.
The reference signal of described lock-in amplifier is provided by described chopper.
A kind of measuring method with the described high-precision angle of rotation measurement mechanism measurement angle of rotation of claim 1 may further comprise the steps: drive described analyzer with the described rotating mechanism of described computer control when 1. not putting into sample in described sample box and rotate a circle; 2. data of surveying with described computer recording; The phase angle value of first extinction point when 3. obtaining light intensity and be zero by fitting process with described computing machine; 4. testing sample is put into described sample box; 5. driving described analyzer with the described rotating mechanism of described computer control rotates a circle; 6. data of surveying with described computer recording; The phase angle value of second extinction point when 7. obtaining light intensity and be zero by fitting process with described computing machine; 8. the phase angle value that the phase angle value of second extinction point is deducted first extinction point with described computing machine promptly obtains the optically-active angle value of testing sample.
Compared with prior art, the advantage of measurement mechanism of the present invention is to adopt the method for double light path, is measuring beam and reference beam with the light beam beam splitting, eliminates the influence of the ground unrest of light source self with this; And adopt fitting process by choose measure gained in the one-period signal wave crest to the centre between the trough three/measurement data of a part obtains extinction point, can solve the defective that influences measuring accuracy and measurement sensitivity at minimum and maximum two end points because noise signal is excessive effectively; And the precision of computerizeing control circle grating drives the rotation of analyzer, can improve the precision of rotation greatly, makes to measure to have good repeatability; Use Glan-thomson prism can guarantee that then the polarizer and analyzer have good polarization property; In a word, measurement mechanism of the present invention is a kind of simple in structure with respect to prior art, and it is little to be affected by the external environment, and measures sensitivity and measuring accuracy all than higher, the high-precision angle of rotation measurement mechanism that measuring repeatability is good.And utilize measurement mechanism of the present invention, as long as measure the optically-active angle value that the pairing phase angle value of extinction point after not putting into the pairing phase angle value of extinction point before the testing sample and putting into testing sample need just can to obtain the testing sample of measurement easily, be a kind of simple and easy, accurate optically-active angle measurement method.
Description of drawings
Fig. 1 is the structural representation of the embodiment of the invention one;
Fig. 2 handles the curve that the back is obtained to measurement data.
Among Fig. 1, the 1st, light source here is a He-Ne laser instrument, it can send the incident beam 100 of a branch of parallel beam; The 2nd, chopper, it can produce the laser output signal of a modulation, and provides a modulating frequency; The 3rd, as the semi-transparent semi-reflecting lens of a beam splitter, incident beam 100 beam splitting that it will pass chopper 2 are measuring beam 110 and reference beam 120; 4 is polarizers, and it produces a light beam; 5 is sample boxs, can be used for placing sample to be measured; 6 is analyzers, and it can rotate in the plane vertical with incident beam; 7 is rotating mechanisms, and it can drive analyzer 6 rotations, is an accurate circle grating here; 8 is first optical detection devices, is used to receive the light signal through analyzer 6, produces a measuring-signal; 9 is second optical detection devices, is used to receive reference optical signal, produces a reference signal; 10 is dividers, and it is with the reference signal of the measuring-signal of first optical detection device 8 and second optical detection device 9 signal of back output that is divided by; 11 is lock-in amplifiers, and it receives the signal of divider 10 outputs, and the reference signal of lock-in amplifier 11 is provided by chopper 2; The 12nd, computing machine, it receives the output signal of lock-in amplifier 11, and the program by being provided with in advance, and the signal curve that writes down is carried out process of fitting treatment in suitable part sampling, can obtain the pairing phase angle value of extinction point, and and then obtain the optically-active angle value of testing sample; Simultaneously, the round precise grating also controlled as rotating mechanism 7 of computing machine 12 accurately drives analyzer 6 rotations.
Among Fig. 2, the longitudinal axis is the normalization light intensity of signal, and transverse axis is the phase angle value, and the curve I among the figure is before putting into testing sample, and the circle precise grating drives the analyzer 6 measured signal curve that rotates a circle; Curve II is after putting into testing sample, and the circle precise grating drives the analyzer 6 measured signal curve that rotates a circle; Be that minimum be divided into A, B, C three zones from light intensity for being up to light intensity with curve among the figure, the curve data that computing machine 12 is chosen the B zone carries out process of fitting treatment, calculates the phase angle value φ that obtains putting into before the sample
1And put into phase angle value φ behind the sample
2, θ=φ
2-φ
1It is exactly the optically-active angle value of testing sample.
Embodiment
Embodiment describes in further detail the present invention below in conjunction with accompanying drawing.
Embodiment one: as shown in Figure 1, a kind of high-precision angle of rotation measurement mechanism, comprise a light source 1, it here is a He-Ne laser instrument, light source 1 sends a branch of incident beam 100, incident beam 100 is a parallel beam, incident beam 100 passes a chopper 2, a semi-transparent semi-reflecting lens will pass incident beam 100 beam splitting the becoming measuring beam 110 and the reference beam 120 of chopper 2 as beam splitter 3, measuring beam 110 passes the polarizer 4 successively, sample box 5, enter first optical detection device 8 behind the analyzer 6, analyzer 6 is provided with rotating mechanism 7, it drives analyzer 6 rotations by 12 controls of a computing machine, reference beam 120 enters second optical detection device 9 and produces a reference signal, here, the polarizer 4 and analyzer 6 are Glan-thomson prisms, rotating mechanism 7 is circle precise gratings, and first optical detection device 8 and second optical detection device 9 are silicon photocells, measuring-signal and reference signal are transfused to a signal input of its output of the back lock-in amplifier 11 that is divided by in the divider 10, link to each other with computing machine 12 by the RS232 interface then, the reference signal of lock-in amplifier 11 is provided by chopper 2, the signal maximum of choosing measurement gained in the one-period after the computer recording measurement data obtains the pairing phase angle value of extinction point with fitting process after the measurement data of the centre between the minimum value three/a part of area B.He-Ne laser instrument as light source 1 in the present embodiment also can substitute with the semiconductor laser through collimation.
Embodiment two: as shown in Figure 2, a kind of measuring method with the described high-precision angle of rotation measurement mechanism measurement angle of rotation of claim 1 may further comprise the steps: drive analyzers 6 with computing machine 12 control rotating mechanisms 7 when 1. putting into testing sample in sample box 5 and do not rotate a circle; 2. write down the data of being surveyed with computing machine 12; The phase angle value φ of first extinction point when 3. obtaining light intensity and be zero by fitting process with computing machine 12
14. testing sample is put into sample box 5; 5. driving analyzer 6 with computing machine 12 control rotating mechanisms 7 rotates a circle; 6. write down the data of being surveyed with computing machine 12; The phase angle value φ of second extinction point when 7. obtaining light intensity and be zero by fitting process with computing machine 12
28. use the phase angle value φ of computing machine 12 with second extinction point
2Deduct the phase angle φ of first extinction point
1Value promptly obtains optically-active angle value θ=φ of being surveyed
2-φ
1
Claims (10)
1, a kind of high-precision angle of rotation measurement mechanism, comprise a light source, this light source sends a branch of incident beam, described incident beam is a parallel beam, it is characterized in that described incident beam passes a chopper, the incident beam beam splitting that beam splitter will pass described chopper becomes measuring beam and reference beam, described measuring beam passes the polarizer successively, sample box, enter first optical detection device behind the analyzer, described analyzer is provided with rotating mechanism, described rotating mechanism drives described analyzer rotation by a computer control, described reference beam enters second optical detection device, the measuring-signal that described first optical detection device produces and the reference signal of described second optical detection device are transfused to a divider and are divided by, the output signal of described divider links to each other with described computing machine by the RS232 interface after importing a lock-in amplifier, and obtains the extinction point of measuring-signal with fitting process by described computing machine.
2, a kind of high-precision angle of rotation measurement mechanism as claimed in claim 1 is characterized in that described extinction point is to choose the signal wave crest of measuring gained in the one-period to obtain with fitting process after the measurement data of the center section between the trough.
3, a kind of high-precision angle of rotation measurement mechanism as claimed in claim 2 is characterized in that described luminous point is to choose the signal wave crest of measuring gained in the one-period to obtain with fitting process after the measurement data of the centre between the trough three/part.
4, a kind of high-precision angle of rotation measurement mechanism as claimed in claim 1 is characterized in that described rotating mechanism is computer-controlled round precise grating.
5, a kind of high-precision angle of rotation measurement mechanism as claimed in claim 1 is characterized in that the described polarizer and described analyzer are Glan-thomson prism.
6, a kind of high-precision angle of rotation measurement mechanism as claimed in claim 1 is characterized in that described light source is the He-Ne laser instrument.
7, a kind of high-precision angle of rotation measurement mechanism as claimed in claim 1 is characterized in that described light source is the semiconductor laser through collimation.
8, a kind of high-precision angle of rotation measurement mechanism as claimed in claim 1 is characterized in that described first optical detection device and described second optical detection device are silicon photocells.
9, as the described a kind of high-precision angle of rotation measurement mechanism of each claim in the claim 1～8, it is characterized in that the reference signal of described lock-in amplifier is provided by described chopper.
10, a kind of measuring method with the described high-precision angle of rotation measurement mechanism measurement angle of rotation of claim 1 may further comprise the steps: drive described analyzer with the described rotating mechanism of described computer control when 1. not putting into sample in described sample box and rotate a circle; 2. data of surveying with described computer recording; The phase angle value of first extinction point when 3. obtaining light intensity and be zero by fitting process with described computing machine; 4. testing sample is put into described sample box; 5. driving described analyzer with the described rotating mechanism of described computer control rotates a circle; 6. data of surveying with described computer recording; The phase angle value of second extinction point when 7. obtaining light intensity and be zero by fitting process with described computing machine; 8. the phase angle value that the phase angle value of second extinction point is deducted first extinction point with computing machine promptly obtains the optically-active angle value surveyed.
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Cited By (11)
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| CN101957310A (en) * | 2010-09-17 | 2011-01-26 | 山东大学 | Measuring device for ultraviolet visible near-infrared specific rotatory power and measuring method thereof |
| CN102109461A (en) * | 2010-11-30 | 2011-06-29 | 上海仪迈仪器科技有限公司 | Polarimeter for realizing quick measurement by stepping motor and measuring method thereof |
| CN102841056A (en) * | 2011-06-25 | 2012-12-26 | 四川大学 | Measurement of optical rotation by observing polarized light |
| CN103604751A (en) * | 2013-11-22 | 2014-02-26 | 宁波大学 | Device and corresponding method for measuring optical rotation of transparent film with periodic chiral structure |
| CN103837479A (en) * | 2014-03-27 | 2014-06-04 | 江西农业大学 | Portable automatic polarimeter with open solution bin and measurement method thereof |
| CN103845063A (en) * | 2012-11-30 | 2014-06-11 | 财团法人工业技术研究院 | Optical rotation angle measuring system and method thereof |
| CN104502281A (en) * | 2014-12-25 | 2015-04-08 | 中国科学院半导体研究所 | Photoelastic modulation measurement system |
| CN105300891A (en) * | 2015-11-17 | 2016-02-03 | 上海理工大学 | Laser frequency-modulation two-optical-path polarimeter based on central algorithm and measuring method |
| CN105716756A (en) * | 2016-01-26 | 2016-06-29 | 河北工业大学 | Accurate measuring device for microstress spatial distribution of optical material |
| CN106052594A (en) * | 2016-05-10 | 2016-10-26 | 河南师范大学 | Method of measuring magneto optic fiber rotation angle by utilizing fiber grating laser optical beat frequency |
| CN112710615A (en) * | 2020-12-16 | 2021-04-27 | 北京航空航天大学 | Common-mode differential detection device and method based on optical space reciprocity |
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- 2004-01-17 CN CN 200410016007 patent/CN1264006C/en not_active Expired - Fee Related
Cited By (16)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN101957310B (en) * | 2010-09-17 | 2012-05-09 | 山东大学 | Measuring device for ultraviolet visible near-infrared specific rotatory power and measuring method thereof |
| CN101957310A (en) * | 2010-09-17 | 2011-01-26 | 山东大学 | Measuring device for ultraviolet visible near-infrared specific rotatory power and measuring method thereof |
| CN102109461A (en) * | 2010-11-30 | 2011-06-29 | 上海仪迈仪器科技有限公司 | Polarimeter for realizing quick measurement by stepping motor and measuring method thereof |
| CN102841056A (en) * | 2011-06-25 | 2012-12-26 | 四川大学 | Measurement of optical rotation by observing polarized light |
| CN103845063A (en) * | 2012-11-30 | 2014-06-11 | 财团法人工业技术研究院 | Optical rotation angle measuring system and method thereof |
| CN103604751B (en) * | 2013-11-22 | 2015-12-02 | 宁波大学 | The device of property measuring period chiral structure transparent membrane optical activity and corresponding method |
| CN103604751A (en) * | 2013-11-22 | 2014-02-26 | 宁波大学 | Device and corresponding method for measuring optical rotation of transparent film with periodic chiral structure |
| CN103837479A (en) * | 2014-03-27 | 2014-06-04 | 江西农业大学 | Portable automatic polarimeter with open solution bin and measurement method thereof |
| CN103837479B (en) * | 2014-03-27 | 2016-09-07 | 江西农业大学 | A kind of Portable Automatic polarimeter with open type solution storehouse and measuring method |
| CN104502281A (en) * | 2014-12-25 | 2015-04-08 | 中国科学院半导体研究所 | Photoelastic modulation measurement system |
| CN105300891A (en) * | 2015-11-17 | 2016-02-03 | 上海理工大学 | Laser frequency-modulation two-optical-path polarimeter based on central algorithm and measuring method |
| CN105716756A (en) * | 2016-01-26 | 2016-06-29 | 河北工业大学 | Accurate measuring device for microstress spatial distribution of optical material |
| CN105716756B (en) * | 2016-01-26 | 2019-07-09 | 河北工业大学 | A kind of device for accurately measuring of optical material microstress spatial distribution |
| CN106052594A (en) * | 2016-05-10 | 2016-10-26 | 河南师范大学 | Method of measuring magneto optic fiber rotation angle by utilizing fiber grating laser optical beat frequency |
| CN112710615A (en) * | 2020-12-16 | 2021-04-27 | 北京航空航天大学 | Common-mode differential detection device and method based on optical space reciprocity |
| CN112710615B (en) * | 2020-12-16 | 2021-12-17 | 北京航空航天大学 | Common-mode differential detection device and method based on optical space reciprocity |
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