CN1556436A - Testing device of plane display apparatus - Google Patents
Testing device of plane display apparatus Download PDFInfo
- Publication number
- CN1556436A CN1556436A CNA2004100003650A CN200410000365A CN1556436A CN 1556436 A CN1556436 A CN 1556436A CN A2004100003650 A CNA2004100003650 A CN A2004100003650A CN 200410000365 A CN200410000365 A CN 200410000365A CN 1556436 A CN1556436 A CN 1556436A
- Authority
- CN
- China
- Prior art keywords
- those
- testing device
- plane display
- switch
- short
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 99
- 239000010409 thin film Substances 0.000 claims abstract description 42
- 238000009826 distribution Methods 0.000 claims description 109
- 238000009434 installation Methods 0.000 claims description 37
- 230000008878 coupling Effects 0.000 abstract description 10
- 238000010168 coupling process Methods 0.000 abstract description 10
- 238000005859 coupling reaction Methods 0.000 abstract description 10
- 238000010586 diagram Methods 0.000 description 12
- 238000013461 design Methods 0.000 description 7
- 230000008901 benefit Effects 0.000 description 3
- 238000004891 communication Methods 0.000 description 3
- 230000002950 deficient Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 230000006872 improvement Effects 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 2
- 238000000608 laser ablation Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000000750 progressive effect Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
Images
Landscapes
- Liquid Crystal (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
Abstract
The invention relates to a plane display testing device. The plane display at least includes many driving circuits. These driving circuits drive electrode wirings and for example, distributed on the two opposite sides of the plane display. The testing device is composed of many switch components and at least a short-circuit bar. The short-circuit bar is coupled to the electrode wirings by these switch components. When these switch components are composed of a thin film transistor, the testing device at least includes a switch wiring coupled to the gates of the thin film transistor. For example, the electrode wirings are grouped and coupled to the short-circuit bar and the switch wiring. It is suitable to test the electrode wirings of the plane display in groups and after testing, it need not switch off the coupling between the electrode wiring and the test device and can reduce the plane display area, thus more practical.
Description
Technical field
The present invention relates to the proving installation of a kind of flat-panel screens (Flat-panel display), particularly relate to a kind of electrode distribution (Electrode line) that divides into groups to test flat-panel screens, and need not cut off the plane display testing device of electric property coupling between electrode distribution and proving installation (Electrically coupling) after the test.
Background technology
The information communication industry has become main flow industry now, and particularly portable various communication shows the emphasis that product develops especially, and flat-panel screens is behaved and the communication interface of information, and particular importance therefore seems.Existing flat-panel screens mainly contains following several: organic electro-luminescent display (OrganicElectro-Luminescent Display, OELD), plasma display panel (Plasma DisplayPanel, PDP), LCD (Liquid Crystal Display, LCD), light emitting diode (Light Emitting Diode, LED), vacuum fluorescent display (Vacuum FluorescentDisplay), field-emitter display (Field Emission Display, FED) and electrochromics display (Electro-chromic Display) etc.Which kind of, when making, all must test, to determine that the flat-panel screens that made comes out can normal operation to its electrode distribution no matter be above-mentioned flat-panel screens.
Below will add to have high image quality, space utilization efficient, the test of the Thin Film Transistor-LCD (Thin Film Transistor Liquid CrystalDisplay, TFT LCD) of low consumpting power, advantageous characteristic such as radiationless is that example is done introduction.Seeing also shown in Figure 1ly, is the proving installation circuit diagram of existing known a kind of Thin Film Transistor-LCD.This Thin Film Transistor-LCD 100 is to divide into a viewing area 110 and a periphery circuit region 120.Wherein, dispose many electrode wirings 130 on the viewing area 110.Dispose a plurality of driving circuits 140 on the periphery circuit region 120, in order to drive electrode distribution 130.Short-circuit rods (Shorting bar) the 150th is electrically coupled to electrode distribution 130, can test Thin Film Transistor-LCD 100 by short-circuit rods 150 input signals to electrode distribution 130.
Existing known Thin Film Transistor-LCD 100 is after finishing test, promptly can carry out an excision step, with with the be connected cut-out of short-circuit rods 150 with Thin Film Transistor-LCD 100, and short-circuit rods 150 can not stayed on the Thin Film Transistor-LCD 100.But the excision step can increase produces Thin Film Transistor-LCD 100 required time and cost.
Seeing also shown in Figure 2ly, is the proving installation circuit diagram of existing known another kind of Thin Film Transistor-LCD.In Fig. 2, short-circuit rods 152 is to be disposed on the periphery circuit region 122 of Thin Film Transistor-LCD 102, and is electrically coupled to electrode distribution 132.Can test Thin Film Transistor-LCD 102 by short-circuit rods 152 input signals to electrode distribution 132.Thin Film Transistor-LCD 102 promptly can carry out a laser ablation step after finishing test, cut off with the electric property coupling with short-circuit rods 152 and Thin Film Transistor-LCD 102, but short-circuit rods 152 is still stayed on the Thin Film Transistor-LCD 102.
This kind has the proving installation of known Thin Film Transistor-LCD 102 now, though its laser ablation step is comparatively simple, but short-circuit rods 152 and driving circuit 142 are disposed on the periphery circuit region 122 of the same side jointly, the entire area of Thin Film Transistor-LCD 102 can't be dwindled.
This shows that above-mentioned existing plane display testing device still has defective, and demands urgently further being improved.In order to solve the problem that plane display testing device exists, relevant manufacturer there's no one who doesn't or isn't seeks solution painstakingly, but do not see always that for a long time suitable design finished by development, and common product does not have appropriate structure to address the above problem, and this obviously is the problem that the anxious desire of relevant dealer solves.
Because the defective that above-mentioned existing plane display testing device exists, the inventor is based on being engaged in this type of product design manufacturing abundant for many years practical experience and professional knowledge, actively studied innovation, in the hope of founding a kind of novel plane display testing device, can improve general existing plane display testing device, make it have more practicality.Through constantly research, design, and after studying sample and improvement repeatedly, create the present invention who has practical value finally.
Summary of the invention
The objective of the invention is to, overcome the defective that above-mentioned existing plane display testing device exists, and provide a kind of new plane display testing device, technical matters to be solved is to make it be suitable for dividing into groups to test the electrode distribution of flat-panel screens, and need not cut off electric property coupling between electrode distribution and proving installation after the test, but and the reduced plan display area, thereby be suitable for practicality more, and have the value on the industry.
The object of the invention to solve the technical problems realizes by the following technical solutions.A kind of plane display testing device according to the present invention's proposition, this flat-panel screens comprises most electrode distributions and the plurality of drive circuit that drives those electrode distributions at least, this driving circuit is one first side that is disposed at this flat-panel screens, this proving installation comprises: most switch modules, be electrically coupled to those electrode distributions, this switch module is one second side that is disposed at this flat-panel screens; And at least one short-circuit rods, be electrically coupled to those switch modules; Wherein, this of this flat-panel screens first side be with this second side be opposite side.
The object of the invention to solve the technical problems also can be applied to the following technical measures to achieve further.
Aforesaid plane display testing device, wherein said each those switch module comprise a diode and at least one thin film transistor (TFT) one of them.
Aforesaid plane display testing device, wherein said those electrode distributions comprise the data distribution.
Aforesaid plane display testing device, wherein said those electrode distributions comprise scan wiring.
The object of the invention to solve the technical problems also adopts following technical scheme to realize.A kind of plane display testing device according to the present invention's proposition, this flat-panel screens comprises most electrode distributions and the plurality of drive circuit that drives those electrode distributions at least, this proving installation comprises: most switch modules, each those switch module has a gate, first source/drain and second source/drain respectively, and those first sources/drain is to be electrically coupled to those electrode distributions; One switch wiring group is electrically coupled to those gates of those switch modules; And most short-circuit rods, each those short-circuit rods is to be electrically coupled to partly those the second sources/drain of those switch modules.
The object of the invention to solve the technical problems also can be applied to the following technical measures to achieve further.
Aforesaid plane display testing device, wherein when this switch wiring group comprised most switch wiring, each those switch wiring was to be electrically coupled to partly those gates of those switch modules.
Aforesaid plane display testing device, wherein said each those switch module comprise at least one thin film transistor (TFT).
Aforesaid plane display testing device, wherein said those electrode distributions comprise the data distribution.
Aforesaid plane display testing device, wherein said those electrode distributions comprise scan wiring.
The object of the invention to solve the technical problems also adopts following technical scheme to realize.A kind of plane display testing device according to the present invention's proposition, this flat-panel screens comprises most electrode distributions and the plurality of drive circuit that drives those electrode distributions at least, this proving installation comprises: most switch modules, each those switch module has a gate, first source/drain and second source/drain respectively, and those first sources/drain is to be electrically coupled to those electrode distributions; Most switch wiring be electrically coupled to those gates of those switch modules, and each those switch wiring are to be electrically coupled to partly those gates of those switch modules; And a short-circuit rods, be electrically coupled to those two or two sources/drains of those switch modules.
The object of the invention to solve the technical problems also can be applied to the following technical measures to achieve further.
Aforesaid plane display testing device, wherein said each those switch module comprise at least one thin film transistor (TFT).
Aforesaid plane display testing device, wherein said those electrode distributions comprise the data distribution.
Aforesaid plane display testing device, wherein said those electrode distributions comprise scan wiring.
The object of the invention to solve the technical problems also adopts following technical scheme to realize.A kind of plane display testing device according to the present invention's proposition, this flat-panel screens comprises most electrode distributions and the plurality of drive circuit that drives those electrode distributions at least, this proving installation comprises: most switch modules are electrically coupled to those electrode distributions; And a short-circuit rods group, be electrically coupled to those switch modules.
The object of the invention to solve the technical problems also can be applied to the following technical measures to achieve further.
Aforesaid plane display testing device, wherein when this short-circuit rods group comprised most short-circuit rods, each those short-circuit rods was to be electrically coupled to partly those switch modules.
Aforesaid plane display testing device, wherein said each those switch module comprise a diode.
Aforesaid plane display testing device, wherein said those electrode distributions comprise the data distribution.
Aforesaid plane display testing device, wherein said those electrode distributions comprise scan wiring.
The present invention compared with prior art has tangible advantage and beneficial effect.By above technical scheme as can be known, in order to reach aforementioned goal of the invention, major technique of the present invention thes contents are as follows:
The present invention proposes a kind of plane display testing device, and the flat-panel screens of institute's desire test comprises a plurality of electrode distributions and a plurality of driving circuit at least.Wherein, this driving circuit is in order to the drive electrode distribution, is disposed at one first side of flat-panel screens.
This proving installation is made of a plurality of switch modules and at least one short-circuit rods.Wherein, switch module is to be electrically coupled to the electrode distribution, is disposed at one second side of flat-panel screens.Short-circuit rods is to be electrically coupled to switch module.And, first side of flat-panel screens be with second side be opposite side, that is short-circuit rods is the relative both sides that are disposed at flat-panel screens respectively with driving circuit.
In addition, each switch module is made of at least one diode, also or by at least one thin film transistor (TFT) is constituted.The electrode distribution for example is a data wiring, also or scan wiring.
Based on above-mentioned purpose, the present invention also proposes a kind of plane display testing device.The flat-panel screens of institute's desire test comprises a plurality of electrode distributions and a plurality of driving circuit at least.Wherein, driving circuit is in order to the drive electrode distribution.
This proving installation is made of a plurality of switch modules, a switch wiring and a plurality of short-circuit rods.Wherein, each switch module has a gate, first source/drain and second source/drain respectively, and first source/drain is to be electrically coupled to the electrode distribution.The switch wiring group is the gate that is electrically coupled to switch module.Each short-circuit rods is to be electrically coupled to the partly second source/drain of switch module.
In addition, when the switch wiring group for example is when being made of a plurality of switch wiring, each switch wiring is to be electrically coupled to the partly gate of switch module.Each switch module is made of at least one thin film transistor (TFT).The electrode distribution for example is a data wiring, also or scan wiring.
Based on above-mentioned purpose, the present invention proposes a kind of plane display testing device in addition.The flat-panel screens of institute's desire test comprises a plurality of electrode distributions and a plurality of driving circuit at least.Wherein, driving circuit is in order to the drive electrode distribution.
This proving installation is made of a plurality of switch modules, a plurality of switch wiring and a short-circuit rods.Wherein, each switch module has a gate, first source/drain and second source/drain respectively, and first source/drain is to be electrically coupled to the electrode distribution.Switch wiring is the gate that is electrically coupled to switch module, and each switch wiring is to be electrically coupled to the partly gate of switch module.Short-circuit rods is the second source/drain that is electrically coupled to switch module.
In addition, each switch module is made of at least one thin film transistor (TFT).The electrode distribution for example is a data wiring, also or scan wiring.
Based on above-mentioned purpose, the present invention more proposes a kind of plane display testing device.The flat-panel screens of institute's desire test comprises a plurality of electrode distributions and a plurality of driving circuit at least.Wherein, driving circuit is in order to the drive electrode distribution.
This proving installation is made of a plurality of switch modules and a short-circuit rods group.Wherein, switch module is to be electrically coupled to the electrode distribution.The short-circuit rods group is to be electrically coupled to switch module.
In addition, when the short-circuit rods group for example is when being made of a plurality of short-circuit rods, each short-circuit rods is to be electrically coupled to partly switch module.Each switch module is made of a diode.The electrode distribution for example is a data wiring, also or scan wiring.
Via as can be known above-mentioned, the invention relates to a kind of plane display testing device.This flat-panel screens comprises a plurality of electrode distributions and a plurality of driving circuit at least.Driving circuit is in order to the drive electrode distribution, and for example is disposed at the opposite side of flat-panel screens respectively with proving installation.Proving installation is made of a plurality of switch modules and at least one short-circuit rods.Short-circuit rods is to be electrically coupled to the electrode distribution via switch module.When switch module is when being made of thin film transistor (TFT), proving installation more comprises at least one switch wiring, is electrically coupled to the gate of thin film transistor (TFT).The electrode distribution for example is that grouping is electrically coupled to short-circuit rods and switch wiring.
By technique scheme, the present invention has the following advantages at least: plane display testing device of the present invention, its short-circuit rods and driving circuit are the both sides that are disposed at flat-panel screens respectively, are easy to the area of reduced plan display.And, because switch module is to be high impedance status (near off state) at ordinary times, therefore also can omit the step of the electric property coupling of test back cutting-off of short-circuit bar and electrode wiring closet.Simultaneously, more can do the grouping test to the electrode distribution of flat-panel screens.
In sum, the plane display testing device of special construction of the present invention is suitable for dividing into groups to test the electrode distribution of flat-panel screens, and need not cut off electric property coupling between electrode distribution and proving installation after the test, but and the reduced plan display area, thereby be suitable for practicality more.It has above-mentioned many advantages and practical value, and in like product, do not see have similar structural design to publish or use and really genus innovation, no matter it structurally or bigger improvement all arranged on the function, have large improvement technically, and produced handy and practical effect, and more existing plane display testing device has the multinomial effect of enhancement, thus be suitable for practicality more, and have the extensive value of industry, really be a new and innovative, progressive, practical new design.
Above-mentioned explanation only is the general introduction of technical solution of the present invention, for can clearer understanding technological means of the present invention, and can be implemented according to the content of instructions, below with preferred embodiment of the present invention and conjunction with figs. describe in detail as after.
Description of drawings
Fig. 1 is the proving installation circuit diagram that has known a kind of Thin Film Transistor-LCD now.
Fig. 2 is the proving installation circuit diagram that has known another kind of Thin Film Transistor-LCD now.
Fig. 3 A and Fig. 3 B are the plane display testing device circuit diagrams according to the present invention's first preferred embodiment.
Fig. 4 is the circuit diagram that the switch module of a preferred embodiment of the present invention is made of thin film transistor (TFT).
Fig. 5 A～Fig. 5 C is the plane display testing device circuit diagram according to the present invention's second preferred embodiment.
Fig. 6 is the plane display testing device circuit diagram according to the present invention's the 3rd preferred embodiment.
100,102: Thin Film Transistor-LCD 110: viewing area
120,122: periphery circuit region 130,132: electrode distribution
140,142: driving circuit 150,152: short-circuit rods
200: flat-panel screens 230,330,430: electrode distribution
240: driving circuit 250,350,352,354: proving installation
260,360,460: switch module 262: thin film transistor (TFT)
270,370,470a: short-circuit rods 280,380a: switch wiring
362: 364: the first source/drains of gate
Source/drain 380 in 366: the second: the switch wiring group
450: proving installation 470: the short-circuit rods group
S1: the first side S2: second side
Embodiment
Below in conjunction with accompanying drawing and preferred embodiment, to its embodiment of plane display testing device, structure, feature and the effect thereof that foundation the present invention proposes, describe in detail as after.
(first embodiment)
Seeing also shown in Fig. 3 A and Fig. 3 B, is the plane display testing device circuit diagram according to the present invention's first preferred embodiment.The plane display testing device of preferred embodiment of the present invention, its flat-panel screens 200 comprise a plurality of electrode distributions 230 and a plurality of driving circuits 240 at least.Wherein, driving circuit 240 is in order to drive electrode distribution 230, and is disposed at the first side S1 of flat-panel screens 200.
This proving installation 250 is made of with at least one short-circuit rods 270 a plurality of switch modules 260.Wherein, switch module 260 is to be electrically coupled to electrode distribution 230, and is disposed at the second side S2 of flat-panel screens 200.Short-circuit rods 270 is to be electrically coupled to switch module 260.And, the first side S1 of flat-panel screens 200 be with the second side S2 be opposite side, that is short-circuit rods 270 is the relative both sides that are disposed at flat-panel screens 200 respectively with driving circuit 240.
In the preferred embodiment shown in Fig. 3 A, each switch module 260 is made of a thin film transistor (TFT).Proving installation 250 for example more comprises at least one switch wiring 280, is electrically coupled to switch module 260.Seeing also shown in Figure 4ly, is the circuit diagram that the switch module of a preferred embodiment is made of thin film transistor (TFT).As shown in Figure 4, the thin film transistor (TFT) 262 that constitutes switch module 260 is not limited to one, also can be combined by a plurality of thin film transistor (TFT)s 262, to reduce the leakage current (Current leakage) of switch module 260.
In the preferred embodiment shown in Fig. 3 B, switch module 260 for example is a diode.
From the above, short-circuit rods 270 is disposed at the opposite side of driving circuit 240, can reduces the width of the first side S1 of flat-panel screens 200, and be easier to design the little flat-panel screens of entire area 200.And, because between short-circuit rods 270 and the electrode distribution 230 is electric property coupling with switch module 260, therefore must could actuating switch assembly 260 from switch wiring 280 end input voltages (as shown in Figure 3A) or short-circuit rods 270 ends (shown in Fig. 3 B) input current, can't self-electrode distribution 230 end input currents and actuating switch assembly 260.So after testing by 250 pairs of flat-panel screens 200 of proving installation, even do not carry out the electric connection that extra step is cut off proving installation 250 and electrode distribution 230,230 of each electrode distributions can the conducting mutually by proving installation 250 yet.
Please continue to consult shown in Fig. 3 A and Fig. 3 B, electrode distribution 230 for example is data wiring (Dataline), also or scan wiring (Scan line).Wherein, data wiring for example is to be the electrode distribution 230 of configuration vertically, and scan wiring for example is to be the electrode distribution 230 of configuration abreast.Therefore, can be by short-circuit rods 270 that is electrically coupled to electrode distribution 230 and switch module 260, whether data distribution and the scan wiring of testing flat-panel screens 200 can normal operations.
(second embodiment)
Seeing also shown in Fig. 5 A～Fig. 5 C, is the plane display testing device circuit diagram according to the present invention's second preferred embodiment.The flat-panel screens of institute's desire test is identical with first preferred embodiment in the present invention's second preferred embodiment, so do not repeat them here.But the proving installation of the present invention's second preferred embodiment is not limited to be configured in as shown in Figure 3A the offside of driving circuit 240, also can be disposed at the same side with driving circuit 240.
At first see also shown in Fig. 5 A, proving installation 350 is made of a plurality of switch modules 360, many switch wiring 380a and a short-circuit rods 370.Wherein, each switch module 360 has a gate 362, first source/drain 364 and second source/drain 366 respectively, and first source/drain 364 is to be electrically coupled to electrode distribution 330.Each bar switch wiring 380a is electrically coupled to the partly gate 362 of switch module 360 respectively.Short-circuit rods 370 is the second source/drains 366 that are electrically coupled to all switch modules 360.Switch module 360 is made of at least one thin film transistor (TFT).
From the above, by actuating switch distribution 380a optionally, can test 330 groupings of electrode distribution.For example electrode distribution 330 is complied with the photochromic difference that the picture element zone passed through is fit to send, and grouping is electrically coupled to switch wiring 380a, can once test a kind of photochromic picture element zone.Certainly, the grouping of electrode distribution 330 is according to also other different considering being arranged.
Then see also shown in Fig. 5 B, proving installation 352 is made of with many short-circuit rods 370 a plurality of switch modules 360, a switch wiring group 380.Wherein, this each switch module 360 has a gate 362, first source/drain 364 and second source/drain 366 respectively, and first source/drain 364 is to be electrically coupled to electrode distribution 330.Switch wiring group 380 is made of many switch wiring 380a, and each bar switch wiring 380a is electrically coupled to the partly gate 362 of switch module 360 respectively.Each bar short-circuit rods 370 is to be electrically coupled to the partly second source/drain 366 of switch module 360 respectively.Switch module 360 is made of at least one thin film transistor (TFT).From the above, by optionally actuating switch distribution 380a and short-circuit rods 370, can test 330 groupings of electrode distribution.
Then see also shown in Fig. 5 C, proving installation 354 is made of a plurality of switch modules 360, a switch wiring 380a and many short-circuit rods 370.Wherein, each switch module 360 has a gate 362, first source/drain 364 and second source/drain 366 respectively, and first source/drain 364 is to be electrically coupled to electrode distribution 330.Switch wiring 380a is the gate 362 that is electrically coupled to all switch modules 360.Each bar short-circuit rods 370 is to be electrically coupled to the partly second source/drain 366 of switch module 360 respectively.Switch module 360 is made of at least one thin film transistor (TFT).From the above, by conducting short-circuit rods 370 optionally, can test 330 groupings of electrode distribution.
(the 3rd embodiment)
Seeing also shown in Figure 6ly, is the plane display testing device circuit diagram according to the present invention's the 3rd preferred embodiment.The flat-panel screens of institute's desire test is identical with first preferred embodiment in the present invention's the 3rd preferred embodiment, so do not repeat them here.But the proving installation of the present invention's the 3rd preferred embodiment is not limited to be configured in the offside of driving circuit 240 shown in Fig. 3 B, also can be disposed at the same side with driving circuit 240.
See also shown in Figure 6ly, proving installation 450 is made of a plurality of switch modules 460 and a short-circuit rods group 470.Wherein, short-circuit rods group 470 is made of many short-circuit rods 470a, and each bar short-circuit rods 470a is electrically coupled to partly switch module 460 respectively.This switch module 460 is made of at least one diode.By conducting short-circuit rods 470a optionally, can test 430 groupings of electrode distribution.For example electrode distribution 430 is complied with the photochromic difference that the picture element zone passed through is fit to send, and grouping is electrically coupled to short-circuit rods 470a, promptly can once test a kind of photochromic picture element zone.Certainly, the grouping of electrode distribution 430 is according to also other different considering being arranged.
In sum, the plane display testing device of preferred embodiment of the present invention, its short-circuit rods and driving circuit are the both sides that are disposed at flat-panel screens respectively, therefore are easier to design the flat-panel screens with small size.Even and. because short-circuit rods and electrode wiring closet are with switch module institute electric property coupling. therefore after test is finished not with the electric property coupling cut-out of short-circuit rods and electrode wiring closet, can be to be off state can not produce and electrically conduct also because of switch module.Simultaneously, by a plurality of short-circuit rods or the collocation of a plurality of switch wiring, more can divide into groups to test the electrode distribution of flat-panel screens.
The above, it only is preferred embodiment of the present invention, be not that the present invention is done any pro forma restriction, though the present invention discloses as above with preferred embodiment, yet be not in order to limit the present invention, any those skilled in the art, in not breaking away from the technical solution of the present invention scope, when the technology contents that can utilize above-mentioned announcement is made a little change or is modified to the equivalent embodiment of equivalent variations, in every case be the content that does not break away from technical solution of the present invention, according to technical spirit of the present invention to any simple modification that above embodiment did, equivalent variations and modification all still belong in the scope of technical solution of the present invention.
Claims (18)
1, a kind of plane display testing device, it is characterized in that this flat-panel screens comprises most electrode distributions and the plurality of drive circuit that drives those electrode distributions at least, this driving circuit is one first side that is disposed at this flat-panel screens, and this proving installation comprises:
A most switch module are electrically coupled to those electrode distributions, and this switch module is one second side that is disposed at this flat-panel screens; And
At least one short-circuit rods is electrically coupled to those switch modules;
Wherein, this of this flat-panel screens first side be with this second side be opposite side.
2, plane display testing device according to claim 1, it is characterized in that wherein said each those switch module comprise a diode and at least one thin film transistor (TFT) one of them.
3, plane display testing device according to claim 1 is characterized in that wherein said those electrode distributions comprise the data distribution.
4, plane display testing device according to claim 1 is characterized in that wherein said those electrode distributions comprise scan wiring.
5, a kind of plane display testing device is characterized in that this flat-panel screens comprises most electrode distributions and the plurality of drive circuit that drives those electrode distributions at least, and this proving installation comprises:
A most switch module, each those switch module has a gate, first source/drain and second source/drain respectively, and those first sources/drain is to be electrically coupled to those electrode distributions;
One switch wiring group is electrically coupled to those gates of those switch modules; And
A most short-circuit rods, each those short-circuit rods are to be electrically coupled to partly those the second sources/drain of those switch modules.
6, plane display testing device according to claim 5 is characterized in that wherein that when this switch wiring group comprises most switch wiring each those switch wiring is to be electrically coupled to partly those gates of those switch modules.
7, plane display testing device according to claim 5 is characterized in that wherein said each those switch module comprise at least one thin film transistor (TFT).
8, plane display testing device according to claim 5 is characterized in that wherein said those electrode distributions comprise the data distribution.
9, plane display testing device according to claim 5 is characterized in that wherein said those electrode distributions comprise scan wiring.
10, a kind of plane display testing device is characterized in that this flat-panel screens comprises most electrode distributions and the plurality of drive circuit that drives those electrode distributions at least, and this proving installation comprises:
A most switch module, each those switch module has a gate, first source/drain and second source/drain respectively, and those first sources/drain is to be electrically coupled to those electrode distributions;
Most switch wiring be electrically coupled to those gates of those switch modules, and each those switch wiring are to be electrically coupled to partly those gates of those switch modules; And
One short-circuit rods is electrically coupled to those the second sources/drain of those switch modules.
11, plane display testing device according to claim 10 is characterized in that wherein said wherein each those switch module comprise at least one thin film transistor (TFT).
12, plane display testing device according to claim 10 is characterized in that wherein said those electrode distributions comprise the data distribution.
13, plane display testing device according to claim 10 is characterized in that wherein said those electrode distributions comprise scan wiring.
14, a kind of plane display testing device is characterized in that this flat-panel screens comprises most electrode distributions and the plurality of drive circuit that drives those electrode distributions at least, and this proving installation comprises:
A most switch module are electrically coupled to those electrode distributions; And
One short-circuit rods group is electrically coupled to those switch modules.
15, plane display testing device according to claim 14 is characterized in that wherein that when this short-circuit rods group comprises most short-circuit rods each those short-circuit rods is to be electrically coupled to partly those switch modules.
16, plane display testing device according to claim 14 is characterized in that wherein said each those switch module comprise a diode.
17, plane display testing device according to claim 14 is characterized in that wherein said those electrode distributions comprise the data distribution.
18, plane display testing device according to claim 14 is characterized in that wherein said those electrode distributions comprise scan wiring.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2004100003650A CN100498479C (en) | 2004-01-09 | 2004-01-09 | Testing device of plane display apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2004100003650A CN100498479C (en) | 2004-01-09 | 2004-01-09 | Testing device of plane display apparatus |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1556436A true CN1556436A (en) | 2004-12-22 |
| CN100498479C CN100498479C (en) | 2009-06-10 |
Family
ID=34350420
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB2004100003650A Expired - Lifetime CN100498479C (en) | 2004-01-09 | 2004-01-09 | Testing device of plane display apparatus |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN100498479C (en) |
Cited By (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7336093B2 (en) | 2005-08-26 | 2008-02-26 | Au Optronics Corporation | Test circuit for flat panel display device |
| CN100460934C (en) * | 2007-01-11 | 2009-02-11 | 友达光电股份有限公司 | Test method for liquid crystal display panel |
| CN1731205B (en) * | 2005-08-31 | 2010-06-09 | 友达光电股份有限公司 | Test circuit for panel display device |
| CN101562185B (en) * | 2008-04-14 | 2010-10-13 | 中华映管股份有限公司 | Film transistor array base plate |
| CN101950109B (en) * | 2008-05-23 | 2011-11-02 | 友达光电股份有限公司 | Flat panel display device with test architecture |
| CN102306479A (en) * | 2011-07-04 | 2012-01-04 | 深圳市华星光电技术有限公司 | Testing circuit suitable for PSVA and array |
| CN102385828A (en) * | 2011-08-12 | 2012-03-21 | 友达光电股份有限公司 | Liquid crystal display panel with array test pad and source electrode drive circuit arranged at different sides |
| US8208084B2 (en) | 2008-07-16 | 2012-06-26 | Au Optronics Corporation | Array substrate with test shorting bar and display panel thereof |
| CN102621721A (en) * | 2012-04-10 | 2012-08-01 | 深圳市华星光电技术有限公司 | Liquid crystal panel, liquid crystal module and method for clarifying reasons resulting in poor screen images thereof |
| CN101292168B (en) * | 2005-11-15 | 2012-12-12 | 光子动力学公司 | Array test using the shorting bar and high frequency clock signal for the inspection of tft-lcd with integrated driver ic |
| WO2013155757A1 (en) * | 2012-04-16 | 2013-10-24 | 深圳市华星光电技术有限公司 | Circuit structure in line distribution area of liquid crystal display panel and liquid crystal display panel test method |
| WO2016058191A1 (en) * | 2014-10-16 | 2016-04-21 | 深圳市华星光电技术有限公司 | Wiring structure of display panel, and display panel |
| CN107065353A (en) * | 2017-04-26 | 2017-08-18 | 上海天马有机发光显示技术有限公司 | The method of testing of display panel and display panel |
| WO2019015056A1 (en) * | 2017-07-19 | 2019-01-24 | 深圳市华星光电半导体显示技术有限公司 | Testing circuit for display panel and display device |
| US10529271B2 (en) | 2017-04-24 | 2020-01-07 | Shanghai Tianma AM-OLED Co., Ltd. | Display panel, electronic device and test method |
-
2004
- 2004-01-09 CN CNB2004100003650A patent/CN100498479C/en not_active Expired - Lifetime
Cited By (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7336093B2 (en) | 2005-08-26 | 2008-02-26 | Au Optronics Corporation | Test circuit for flat panel display device |
| CN1731205B (en) * | 2005-08-31 | 2010-06-09 | 友达光电股份有限公司 | Test circuit for panel display device |
| CN101292168B (en) * | 2005-11-15 | 2012-12-12 | 光子动力学公司 | Array test using the shorting bar and high frequency clock signal for the inspection of tft-lcd with integrated driver ic |
| CN100460934C (en) * | 2007-01-11 | 2009-02-11 | 友达光电股份有限公司 | Test method for liquid crystal display panel |
| CN101562185B (en) * | 2008-04-14 | 2010-10-13 | 中华映管股份有限公司 | Film transistor array base plate |
| CN101950109B (en) * | 2008-05-23 | 2011-11-02 | 友达光电股份有限公司 | Flat panel display device with test architecture |
| US8208084B2 (en) | 2008-07-16 | 2012-06-26 | Au Optronics Corporation | Array substrate with test shorting bar and display panel thereof |
| CN102306479A (en) * | 2011-07-04 | 2012-01-04 | 深圳市华星光电技术有限公司 | Testing circuit suitable for PSVA and array |
| CN102385828B (en) * | 2011-08-12 | 2014-01-01 | 友达光电股份有限公司 | Liquid crystal display panel with array test pad and source electrode drive circuit arranged at different sides |
| CN102385828A (en) * | 2011-08-12 | 2012-03-21 | 友达光电股份有限公司 | Liquid crystal display panel with array test pad and source electrode drive circuit arranged at different sides |
| CN102621721A (en) * | 2012-04-10 | 2012-08-01 | 深圳市华星光电技术有限公司 | Liquid crystal panel, liquid crystal module and method for clarifying reasons resulting in poor screen images thereof |
| WO2013155757A1 (en) * | 2012-04-16 | 2013-10-24 | 深圳市华星光电技术有限公司 | Circuit structure in line distribution area of liquid crystal display panel and liquid crystal display panel test method |
| WO2016058191A1 (en) * | 2014-10-16 | 2016-04-21 | 深圳市华星光电技术有限公司 | Wiring structure of display panel, and display panel |
| US10529271B2 (en) | 2017-04-24 | 2020-01-07 | Shanghai Tianma AM-OLED Co., Ltd. | Display panel, electronic device and test method |
| CN107065353A (en) * | 2017-04-26 | 2017-08-18 | 上海天马有机发光显示技术有限公司 | The method of testing of display panel and display panel |
| WO2019015056A1 (en) * | 2017-07-19 | 2019-01-24 | 深圳市华星光电半导体显示技术有限公司 | Testing circuit for display panel and display device |
Also Published As
| Publication number | Publication date |
|---|---|
| CN100498479C (en) | 2009-06-10 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN1556436A (en) | Testing device of plane display apparatus | |
| CN1308906C (en) | Liquid crystal display device | |
| CN1293421C (en) | Electroluminescence display panel and method for operating it | |
| CN1286079C (en) | Panel display for small scale mode application | |
| CN1551076A (en) | Image display device | |
| CN101055360A (en) | Display device and method for driving the same | |
| CN1755780A (en) | Driving apparatus for organic electro-luminescence display device | |
| CN1858841A (en) | Grid driver, method for modifying same and display panel | |
| CN1501141A (en) | Inverter apparatus and liquid crystal display including inverter apparatus | |
| CN1761385A (en) | Display unit | |
| CN1293528C (en) | Display panel driving circuit and plasma display | |
| CN1620206A (en) | Pixel unit and its mending method, electroluminescence apparatus and its mending method | |
| CN1841478A (en) | Organic light emitting display and method of driving the same | |
| CN1940658A (en) | Liquid crystal display and method for manufacturing the same | |
| CN1893090A (en) | Display substrate, method of manufacturing the same and display apparatus having the same | |
| CN101055706A (en) | Display apparatus | |
| CN101067694A (en) | Container member, manufacturing method of container member and flat panel display using the same | |
| CN1892751A (en) | Light emitting display device and method for driving the same | |
| CN1496209A (en) | Inverter drive and liquid crystal display containing the same | |
| CN1880984A (en) | Light guiding plate, backlight assembly having the same, and display device having the same | |
| CN101034237A (en) | Thin film transistor array substrate and electronic ink display device | |
| CN100347736C (en) | Electrofluorescent plate | |
| CN1637559A (en) | Liquid crystal display device | |
| CN1892306A (en) | Image display device | |
| CN1486479A (en) | Electronic device and method of manufacturing the same, and electronic instrument |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CX01 | Expiry of patent term |
Granted publication date: 20090610 |
|
| CX01 | Expiry of patent term |