CN1357755A - Sample preparing apparatus for glancing emitted X-ray fluorescent sanalysis - Google Patents
Sample preparing apparatus for glancing emitted X-ray fluorescent sanalysis Download PDFInfo
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- CN1357755A CN1357755A CN 02109015 CN02109015A CN1357755A CN 1357755 A CN1357755 A CN 1357755A CN 02109015 CN02109015 CN 02109015 CN 02109015 A CN02109015 A CN 02109015A CN 1357755 A CN1357755 A CN 1357755A
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- determinand
- sample
- vacuum chamber
- screw thread
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- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Abstract
The present invention relates to X-ray fluorescent analysis applied technology and aims at making matter to be tested and analyzed produce high temperature plasma and deposit onto transparent carrier slide via high speed spray to form tested sample. The technological scheme incldues focusing laser energy with a spheric convergent lens, objective table adjustable in the optical axle direction, and vacuum chamber for the tested matter. The sample preparing apparatus consists of laser source, convergent lens, sample box, adjusting drum, screw pair, tested matter table, tested matter, transparent carrier slide, vacuum chamber, etc. and may be used to prepare pure, high quality sample suitable for X-ray fluorescent analysis simple and fast.
Description
Technical field
The invention belongs to the preparation facilities of a kind of florescence analysis usefulness sample in the X ray florescence analysis applied technical field.
Background technology
Plunderring emission X ray florescence analysis is that a kind of micro-example that can utilize is realized the multielement strong detection means of detection analysis simultaneously, is widely used in the research and production field, especially in fields such as film analysis, extreme trace analysis and rare earth elemental analysis.Plunder emission X ray florescence analysis requirement measured object and prepare sample with the form of film or microcell residue, and require thickness of sample to be no more than several micron thickness, the method for preparing sample is a lot, for example: direct compression process is arranged, the dilution pressed disc method is arranged, thin sample method of solution filter paper or the like is arranged, the prior art the most approaching with the present invention, it also is the most frequently used in the past method, be to prepare sample with dilution method, as (a) among Fig. 1, (b), (c) sample (U.S. Total-Reflection X-Ray Fluorescence Analysis P155 1996Awiley-Interscitnce publication) of process preparation, Fig. 1 (a) is the preparation sample solution, Fig. 1 (b) is that the sample solution sampling that will prepare is placed on the micro slide, and Fig. 1 (c) is dried the sample solution on the micro slide.
This preparation sample process complexity, the cycle is long, and sample is easily contaminated, grain size inequality, impact analysis effect.In order to overcome above-mentioned shortcoming, a kind of sample preparation apparatus of ad hoc meter.
Summary of the invention
The technical problem to be solved in the present invention is: make test analyte matter produce high-temperature plasma, the high speed eruptive deposit is on transparent micro slide, form testing sample, the technical scheme of technical solution problem is: adopt the enough narrow laser instrument of pulse width to make light source, select the aspherical condenser focused laser energy, the determinand microscope carrier can move along optical axis is upper and lower, and determinand place environment is a vacuum chamber.
Detailed content of the present invention is as shown in Figure 2: by LASER Light Source 1, aspherical condenser 2, sample box 3, view window 4, air intake opening 5, adjust drum 6, screw thread pair 7, vacuum interface 8, determinand microscope carrier 9, determinand 10, transparent micro slide 11, vacuum chamber 12 and form.
On the direction of propagation of the light of LASER Light Source 1, on optical axis, be arranged in order and place aspherical condenser 2, sample box 3, transparent micro slide 11, determinand 10, determinand microscope carrier 9, screw thread pair 7, adjust drum 6; Transparent micro slide 11 is placed in the sample box 3, the face of transparent micro slide 11 is parallel with the face of determinand 10 and perpendicular to optical axis, determinand microscope carrier 9 is connected with an end rigidity of screw thread pair 7, the bottom that the other end of screw thread pair 7 passes vacuum chamber 12 is connected with adjustment drum 6 rigidity, screw thread pair 7 is tightly connected with the contact site of vacuum chamber 12, rotate and adjust drum 6, be placed on determinand 10 on the determinand microscope carrier 9 along on the optical axis, move down, the upper surface of determinand 10 is on the position of focal plane of aspherical condenser 2, the two side sealing of the top cover of vacuum chamber 12 and sample box 3 is connected, and is provided with view window 4 on the right side wall of vacuum chamber 12, air intake opening 5, left side wall is provided with vacuum interface 8.
Principle of work explanation: aspherical condenser 2, the laser energy of the LASER Light Source 1 that pulse width is enough narrow, focus on the surface of determinand 10, the surface of determinand 10 is subjected to the irradiation bombardment of high energy laser beam, in the extremely short time, produce high-temperature plasma, the high speed eruptive deposit forms testing sample on transparent micro slide 11.
Good effect: this device preparation analytic sample process is simple, quick, owing in vacuum chamber, prepare sample, reduced the pollution of air plankton to sample, high-temperature plasma erupts at a high speed simultaneously, be deposited on the transparent micro slide, material grains is even, contains micro-determinand on the sample, just can satisfy the x-ray fluorescence spectrometry analysis.
Description of drawings
Fig. 1 (a) and (b), (c), be in the prior art, the schematic flow sheet of preparation analytic sample, Fig. 2 is a structural representation of the present invention, Figure of abstract also adopts Fig. 2.
Embodiment
The present invention implements by structural representation shown in Figure 2, LASER Light Source 1 adopts the YAG laser instrument, condenser 2 adopts aspherical condenser, transparent micro slide 11 adopts piezoid, determinand microscope carrier 9 is upper and lower adjustable along optical axis direction, the upper surface of determinand 10 is positioned on the focal plane of aspherical condenser 2, and during work, vacuum chamber 12 vacuumizes by vacuum interface 8.
Claims (1)
1, a kind of emission X ray florescence analysis of plunderring is with sample system device, form by determinand and determinand slide glass, it is characterized in that the present invention includes LASER Light Source (1), aspherical condenser (2), sample box (3), view window (4), air intake opening (5), adjust drum (6), screw thread pair (7), vacuum interface (8), determinand microscope carrier (9), determinand (10), transparent micro slide (11), vacuum chamber (12) form; On the direction of propagation of the light of LASER Light Source (1), on optical axis, be arranged in order and place aspherical condenser (2), sample box (3), transparent micro slide (11), determinand (10), determinand microscope carrier (9), screw thread pair (7), adjust drum (6); Transparent micro slide (11) is placed in the sample box (3), the face of transparent micro slide (11) is parallel with the face of determinand (10) and perpendicular to optical axis, determinand microscope carrier (9) is connected with an end rigidity of screw thread pair (7), the bottom that the other end of screw thread pair (7) passes vacuum chamber (12) is connected with adjustment drum (6) rigidity, screw thread pair (7) is tightly connected with the contact site of vacuum chamber (12), rotate and adjust drum (6), be placed on determinand (10) on the determinand microscope carrier (9) along on the optical axis, move down, the upper surface of determinand (10) is on the position of focal plane of aspherical condenser (2), the two side sealing of the top cover of vacuum chamber (12) and sample box (3) is connected, and is provided with view window (4) on the right side wall of vacuum chamber (12), air intake opening (5), left side wall is provided with vacuum interface (8).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB021090157A CN1166935C (en) | 2002-01-07 | 2002-01-07 | Sample preparing apparatus for glancing emitted X-ray fluorescent sanalysis |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB021090157A CN1166935C (en) | 2002-01-07 | 2002-01-07 | Sample preparing apparatus for glancing emitted X-ray fluorescent sanalysis |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1357755A true CN1357755A (en) | 2002-07-10 |
| CN1166935C CN1166935C (en) | 2004-09-15 |
Family
ID=4740446
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB021090157A Expired - Fee Related CN1166935C (en) | 2002-01-07 | 2002-01-07 | Sample preparing apparatus for glancing emitted X-ray fluorescent sanalysis |
Country Status (1)
| Country | Link |
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| CN (1) | CN1166935C (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100464182C (en) * | 2003-03-28 | 2009-02-25 | 理学电机工业株式会社 | Fluorescent x-ray analyzer |
| CN102323284A (en) * | 2011-09-05 | 2012-01-18 | 杭州电子科技大学 | A kind of device and method of X-ray fluorescence spectra quantitative test |
| CN102590253A (en) * | 2012-01-17 | 2012-07-18 | 中国科学院上海应用物理研究所 | High-temperature fused salt synchrotron radiation in-situ research device |
| CN105548015A (en) * | 2016-01-13 | 2016-05-04 | 中国科学院合肥物质科学研究院 | Small-pore-diameter long-distance optical compatible vacuum sample cavity |
-
2002
- 2002-01-07 CN CNB021090157A patent/CN1166935C/en not_active Expired - Fee Related
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100464182C (en) * | 2003-03-28 | 2009-02-25 | 理学电机工业株式会社 | Fluorescent x-ray analyzer |
| CN102323284A (en) * | 2011-09-05 | 2012-01-18 | 杭州电子科技大学 | A kind of device and method of X-ray fluorescence spectra quantitative test |
| CN102590253A (en) * | 2012-01-17 | 2012-07-18 | 中国科学院上海应用物理研究所 | High-temperature fused salt synchrotron radiation in-situ research device |
| CN102590253B (en) * | 2012-01-17 | 2013-08-14 | 中国科学院上海应用物理研究所 | High-temperature fused salt synchrotron radiation in-situ research device |
| CN105548015A (en) * | 2016-01-13 | 2016-05-04 | 中国科学院合肥物质科学研究院 | Small-pore-diameter long-distance optical compatible vacuum sample cavity |
Also Published As
| Publication number | Publication date |
|---|---|
| CN1166935C (en) | 2004-09-15 |
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