CN1311231C - Device for mounting and operating single linear nano material - Google Patents

Device for mounting and operating single linear nano material Download PDF

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Publication number
CN1311231C
CN1311231C CNB2004100693567A CN200410069356A CN1311231C CN 1311231 C CN1311231 C CN 1311231C CN B2004100693567 A CNB2004100693567 A CN B2004100693567A CN 200410069356 A CN200410069356 A CN 200410069356A CN 1311231 C CN1311231 C CN 1311231C
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CN
China
Prior art keywords
mounting disc
differential head
axial adjustment
single linear
needle electrode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CNB2004100693567A
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Chinese (zh)
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CN1587955A (en
Inventor
王恩哥
白雪冬
王中林
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Institute of Physics of CAS
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Institute of Physics of CAS
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Publication date
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Priority to CNB2004100693567A priority Critical patent/CN1311231C/en
Publication of CN1587955A publication Critical patent/CN1587955A/en
Application granted granted Critical
Publication of CN1311231C publication Critical patent/CN1311231C/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Abstract

The present invention discloses a device for installing and operating single linear nanometer materials, which comprises an installing disk, an axial regulating rod and a differential head, wherein a guiding pipe of the axial regulating rod is fixed to one side of the installing disk in an airtight mode, and the differential head is fixed to the other side of the installing disk; one end of the axial regulating rod is connected with the differential head, and the other end of the axial regulating rod is connected with a joint through an insulating bush; a needle electrode is installed on the joint, the end part of the guiding pipe is provided with another needle electrode for matching with the needle electrode on the joint, and the end parts of two needle electrodes are coaxially opposite; the spacing between the two needle electrodes can be regulated by the differential head and the axial regulating rod; the axial regulating rod is in airtight fit with the installing disk. In the device, the needle electrodes are used as fixing points of a sample of a single linear nanometer material, which is convenient for the transmission electron microscope to observe and measure the sample and provides convenience for researchers to apply various electric signals for experiment to samples to be tested. Simultaneously, all the parts are in airtight connection, which meets the installation conditions of the transmission electron microscope.

Description

The device of a kind of installation and operating single linear nano material
Technical field
The present invention relates to a kind ofly in transmission electron microscope, use, be used to install and the device of operating single linear nano material sample.
Background technology
Nano material is paid close attention to by common people with some magical characteristics that it was had, people drop into great amount of manpower and material resources it are studied, because nanometer material structure is fine, thereby people extensively adopt transmission electron microscope that its structure, characteristic are studied, but it is tiny just because of the nano material sample structure, in transmission electron microscope, how sample is fixed and handled, become the difficult problem of pendulum in face of the researchist.
Summary of the invention
Problem at the prior art existence, the purpose of this invention is to provide and a kind ofly in transmission electron microscope, use, be used to install the also device of operating single linear nano material, in research process, also can apply electric signal to single linear nano material sample two ends by this device.
For achieving the above object, the device of a kind of installation of the present invention and operating single linear nano material, comprise mounting disc, the axial adjustment bar, the differential head, the airtight conduit that is fixed with of mounting disc one end, this conduit play the guiding role to the axial adjustment bar, the differential head is fixed on the mounting disc other end, the axial adjustment bar is positioned at conduit, the one end passes mounting disc and links to each other with the differential head, its other end is connected with a joint by insulation sleeve, and a needle electrode is installed on the joint, and this needle electrode stretches out the end of conduit suitable length, match with it, end of conduit is fixed with another needle electrode by a ring-type termination, and two needle electrode ends are coaxial relatively, can regulate the spacing between two needle electrodes by differential head and axial adjustment bar, the terminals of two needle electrodes are arranged in the mounting disc, air-tight fit between axial adjustment bar and the mounting disc.
Further, described differential head is fixed in the described mounting disc by a stop sleeve, in this sleeve, the differential cephalic par can relatively rotate by bearing with described axial adjustment boom end and be connected, the corrugated tube that has been tightly connected between the adapter sleeve that is provided with in axial adjustment boom end and the mounting disc, described adapter sleeve and mounting disc are airtight fixing.
Further, described catheter outer surface is provided with at least one O RunddichtringO that matches with transmission electron microscope installation hole wall.
The device of installation of the present invention and operating single linear nano material is with the point of fixity of needle electrode as the single linear nano material sample, not only make things convenient for transmission electron microscope that sample is observed, measured, and apply various experiments to testing sample and provide convenience for the researchist with electric signal, simultaneously each position is tightly connected, satisfies the mounting condition of transmission electron microscope.
Description of drawings
Fig. 1 is the device cut-open view of installation of the present invention and operating single linear nano material;
Fig. 2 is an A portion partial enlarged drawing among Fig. 1;
Fig. 3 is a position shown in Figure 2 vertical view;
Fig. 4 is a B portion enlarged diagram among Fig. 3.
Embodiment
As shown in Figures 1 to 4, the device of installation of the present invention and operating single linear nano material comprises mounting disc 10, differential head 1, the axial adjustment bar, conduit 12, the axial adjustment bar is by bar 7, bar 13,15 3 sections formations of joint, link to each other by bearing pin 11 between its king-rod 7 and the bar 13, link to each other by cover 14 and bearing pin 20 between bar 13 and the joint 15, cover 14 is made by insulating material, differential head 1 fixes by support set 2 and mounting disc 10, differential head 1 end is by cover 3, bearing pin 4, crossover sub 5 and bearing and axial adjustment bar one end are rotatably connected, the axial adjustment boom end is by corrugated tube 6 and 21 airtight linking to each other of sleeve, conduit 12 airtight being fixed in the mounting disc 10, a ring-type termination 18 is installed by screw in conduit 12 ends, needle electrode 17 is fixed on the ring-type termination 18, needle electrode 16 is fixed in the mounting hole of joint 15 ends, two needle electrodes 16,17 connection terminals 8 that are provided with mounting disc 10 places respectively by electric wire, 9 link to each other.
During use, single linear nano material 19 to be measured is fixed on needle electrode 16 ends, then apparatus of the present invention is installed on the transmission electron microscope, utilize microscope that the characteristic dimension of detected materials is measured.When needs apply experiment when using electric signal to the detected materials two ends, can adjust by the gap between 1 pair of detected materials end of differential head and needle electrode 17 ends, so that electric signal produces optimum efficiency on detected materials.

Claims (3)

1. the device of installation and operating single linear nano material, it is characterized in that, comprise mounting disc, the axial adjustment bar, the differential head, the airtight conduit that is fixed with of mounting disc one end, this conduit play the guiding role to the axial adjustment bar, the differential head is fixed on the mounting disc other end, the axial adjustment bar is positioned at conduit, the one end passes mounting disc and links to each other with the differential head, its other end is connected with a joint by insulation sleeve, and a needle electrode is installed on the joint, and this needle electrode stretches out the end of conduit suitable length, match with it, end of conduit is fixed with another needle electrode by a ring-type termination, and two needle electrode ends are coaxial relatively, can regulate the spacing between two needle electrodes by differential head and axial adjustment bar, the terminals of two needle electrodes are arranged in the mounting disc, air-tight fit between axial adjustment bar and the mounting disc.
2. the device of a kind of installation according to claim 1 and operating single linear nano material, it is characterized in that, described differential head is fixed in the described mounting disc by a stop sleeve, in this sleeve, the differential cephalic par can relatively rotate by bearing with described axial adjustment boom end and be connected, the corrugated tube that has been tightly connected between the adapter sleeve that is provided with in axial adjustment boom end and the mounting disc, described adapter sleeve and mounting disc are airtight fixing.
3. the device of a kind of installation according to claim 1 and operating single linear nano material is characterized in that, described catheter outer surface is provided with at least one O RunddichtringO that matches with transmission electron microscope installation hole wall.
CNB2004100693567A 2004-07-19 2004-07-19 Device for mounting and operating single linear nano material Expired - Fee Related CN1311231C (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CNB2004100693567A CN1311231C (en) 2004-07-19 2004-07-19 Device for mounting and operating single linear nano material

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CNB2004100693567A CN1311231C (en) 2004-07-19 2004-07-19 Device for mounting and operating single linear nano material

Publications (2)

Publication Number Publication Date
CN1587955A CN1587955A (en) 2005-03-02
CN1311231C true CN1311231C (en) 2007-04-18

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Family Applications (1)

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CNB2004100693567A Expired - Fee Related CN1311231C (en) 2004-07-19 2004-07-19 Device for mounting and operating single linear nano material

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CN (1) CN1311231C (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110161393A (en) * 2019-07-01 2019-08-23 云南电力技术有限责任公司 Intermittent electric arc test macro

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6230572B1 (en) * 1998-02-13 2001-05-15 Tsi Incorporated Instrument for measuring and classifying nanometer aerosols
CN1111279C (en) * 2000-12-01 2003-06-11 清华大学 Nanometer near-field optical clamping method
US20030194940A1 (en) * 2002-04-16 2003-10-16 Nagahara Larry A. Method of selectively aligning and positioning nanometer-scale components using AC fields

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6230572B1 (en) * 1998-02-13 2001-05-15 Tsi Incorporated Instrument for measuring and classifying nanometer aerosols
CN1111279C (en) * 2000-12-01 2003-06-11 清华大学 Nanometer near-field optical clamping method
US20030194940A1 (en) * 2002-04-16 2003-10-16 Nagahara Larry A. Method of selectively aligning and positioning nanometer-scale components using AC fields

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
单个纳米结构性能测量 王中林,自然科学进展,第10卷第7期 2000 *

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