CN1290875A - I2C test unit - Google Patents
I2C test unit Download PDFInfo
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- CN1290875A CN1290875A CN 99119760 CN99119760A CN1290875A CN 1290875 A CN1290875 A CN 1290875A CN 99119760 CN99119760 CN 99119760 CN 99119760 A CN99119760 A CN 99119760A CN 1290875 A CN1290875 A CN 1290875A
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Abstract
The 12C test unit is used in the test of product with I2C interface, and especially the test of wervo power supply with I2C interface. The monochip test unit is used directly in test of product or is combined with available test system to test the comprehensive performance of the product. The present invention makes it possible to test I2C interface with available test equipment and without increasing a test bench and has the advantages of low cost, high efficiency and multifunction.
Description
The present invention relates to a kind of I2C test unit, is in order to test a product with I2C interface.This test unit is to be finished by single-chip, can independent test, also can come in conjunction with other test macro product is done test.
In today that science and technology develops rapidly, electronic apparatus device miscellaneous is flooded with our daily life already; In order to reach higher efficient, these devices certainly will be wanted can link up, work in coordination, and therefore at different equipment, various communication interface constantly is developed.A kind of easy master-slave architecture communication modes is wherein arranged, be called I2C (Inter-IntegratedCircuit Bus), it only utilizes three lines of SDA (Serial Data Line), SCL (Serial Clock Line) and GND (ground connection) to constitute the tandem transmission communication, is generally used for linking up between the device of short distance (less than 1.5m) and transmission speed less demanding (Std:100Kbits/s).
Various interface aspect computer apparatus, as: GPIB (instrument control interface), CENTRONICS (PRINTER interface), RS-232 (computer peripheral interface), RS-485 (tandem communication interface), USB (computer general-purpose interface), SCSI, PCI ... or the like relatively under, I2C belongs to a kind of simple many communication interfaces, its communication architecture can be consulted Fig. 1, the framework of I2C BUS.
Each device on I2C BUS all is to be electrically connected mutually with SDA (11) and (12) two lines of SCL.In communication each time, all there is a device to play the part of the mainly role of (Master), the control communication process; Also have a device to play the part of the role of driven (Slave), accept control.And in above-mentioned two devices, have a role who plays the part of transmission (Transmitter) simultaneously again, to send data; The another one device then is the role who plays the part of reception (Receiver) simultaneously, with the reception data.In Fig. 1, there is a device playing the part of the main role who receives (Master-Receiver) (13), also having a device is driven transmission (Slave-Transmitter) (14), represent present communication situation, main (Master) that be the control communication needs data and serves as reception (Receiver), and controls driven (Slave) that serve as transmission (Transmitter) and send data.
At present on many servomechanism power supply units (SERVER POWER SUPPLY), all adopted the interface of I2C to do the communication of message, and day by day universal at computer, that function is become stronger day by day today, the demand of servomechanism is also relative, and when the river rises the boat goes up, and therefore the interface of this I2C is used also more and more general.In the product test of existing servomechanism power supply unit, can be divided into dual mode.
First kind is the product that is used to not have the I2C interface, sees also shown in Figure 2ly, and the servomechanism power supply unit has measuring technology one now.This test environment is simple electrical connection test macro 22 and servomechanism power supply unit (SERVER POWER SUPPLY) 21, is used for testing some simple I/O signals.Wherein this test macro 22 except AC power is provided, can also provide test signal miscellaneous as products such as existing C HROMA 6000 SYSTEM or POWER PRO, and for example load too high, short circuit, overheating conditions or the like are to simulate various test environments.
Second kind is the product that is used to have the I2C interface, sees also shown in Figure 3ly, and the servomechanism power supply unit has measuring technology two now.In this test environment, servomechanism power supply unit 21 has been electrically connected AC power (AC SOURCE) 31, electronic load 32, I2C tester table 33 respectively.AC power 31 required power supply when servomechanism power supply unit 21 work to be provided wherein, electronic load 32 provides the test signal as various simple I/O such as short circuit, load be overweight, and the test of I2C interface, then be to handle by I2C tester table 33, wherein this tester table is a computer, also have the I2C interface, inside has the test formula that a usefulness C language is write, and handles the test of I2C.
Write this test formula, need to be familiar with computer interface control (as 8255 cards, Printer Port, Rs-232C ...), the GPIB interface, the instrument control command, the I2C interface, programming language is (as C++, VB), the functional requirement of servomechanism power supply unit to be measured and relevant software and hardware etc., therefore this test formula very inconvenience on writing, time-consuming, and easy care not, write as formula with high level language, also cause can't unifying of test macro, let alone in order to test a servomechanism power supply unit, will external power supply, equipment such as load and tester table numerous and diverse not.
In view of this, the present inventor overcomes the defective that prior art exists, and is through concentrated test and research, and a spirit of working with perseverance, and creates I2C test unit of the present invention finally.It below is brief description of the present invention.
Fundamental purpose of the present invention is, overcome the defective of existing existence, and provide a kind of I2C test unit of new structure, make it be electrically connected a test macro, this test macro provides the test environment of a power supply unit, and this power supply unit is to have an I2C interface, and this I2C test unit is in order to test this power supply unit.
The objective of the invention is to realize by following technical scheme.
This I2C test unit comprises one first interface, is to be an I2C interface, is to be electrically connected this power supply unit, to receive one first signal; One second interface is to be electrically connected this test macro, to receive a secondary signal; And a monomer body, be in response to this first signal and this secondary signal, do one and handle action, with auxiliary this power supply unit of this test system and test.
Purpose of the present invention also can further be realized by following technical measures.
Aforesaid I2C test unit, wherein this monomer body more comprises a control module, is in response to the corresponding rule of this first signal with this secondary signal, to finish this processing action; One mnemon is to be electrically connected this control module, in order to write down this rule of correspondence of this first signal and this secondary signal; And one respond the unit, is to be electrically connected this control module, and after this control module is finished this processings action, carries out one and respond and move.
Aforesaid I2C test unit, wherein this control module is to be a comparer or a microprocessor.
Aforesaid I2C test unit, wherein this processing action is in response to this rule of correspondence, determining a corresponding relation of this first signal and this secondary signal, and triggers this response and moves.
Aforesaid I2C test unit, wherein when this response unit is a display device, this response action is for exporting this corresponding relation to this display device, and this display device can be liquid crystal indicator (LCD).
Aforesaid I2C test unit, wherein when this response unit be for being electrically connected one of this test macro when responding circuit, it is for exporting this corresponding relation to this test macro that this responses is moved.
Aforesaid I2C test unit, wherein this mnemon is to be ROM (ROM).
Aforesaid I2C test unit, wherein this test macro is electrical connection and sends one the 3rd signal to this power supply unit, and sends this secondary signal to this test unit.
Aforesaid I2C test unit, wherein this power supply unit is in response to the 3rd signal, exports this first signal to this test unit.
The present invention compared with prior art has tangible advantage and effect thereof.
We can get following 3 conclusions: one, the present invention just can replace existing complicated apparatus with simple structure element.Two, the present invention has great elasticity in the application of different aspect.Three, used product of the present invention, can increase epochmaking function with extremely low cost.Therefore, the present invention one can extensively use, have the product that prospect can improve the market competitiveness again.
Concrete structure of the present invention is provided in detail by following examples and accompanying drawing thereof.
Fig. 1 is the framework of I2CBUS.
Fig. 2 is the existing measuring technology one of servomechanism power supply unit.
Fig. 3 servomechanism power supply unit has measuring technology two now.
Fig. 4 is the preferred embodiment of test environment framework of the present invention.
Fig. 5 is a monomer body construction calcspar.
Each symbol in the diagram:
11：SDA(Serial?Data?Line) 12：SCL(Serial?Clock?Line)
13：Master-Receiver?14：Slave-Transmitter
21: servomechanism power supply unit (SERVER POWER SUPPLY)
22: test macro 31: AC power (ACSOURCE)
32: electronic load 33:I2C tester table
42: the first interfaces of 41:I2C test unit
44: the first signals of 43: the second interfaces
45: 46: the three signals of secondary signal
51: control module 52: mnemon
53: respond the unit
Below in conjunction with accompanying drawing and preferred embodiment, to the I2C test unit that foundation the present invention proposes, its concrete structure, feature and effect thereof, describe in detail as after.
See also shown in Figure 4, the preferred embodiment of test environment framework of the present invention.Can find under itself and Fig. 2 comparison, test environment framework of the present invention is under the framework of existing not test I 2C interface, increase an I2C test unit 41, wherein this monomer is electrically connected with one first interface 42 and servomechanism power supply unit 21, is electrically connected with one second interface 43 and test macro 22.
This monomer can be independent of beyond this test macro 22, with this test macro cooperation (as shown in Figure 4), also can merge in the circuit of this test macro, or only be electrically connected with servomechanism power supply unit 21 so that test to be provided, and be not electrically connected this test macro 22 with this monomer.Both similar in appearance Fig. 2 of structure of back, the function that just each square provided is also different.
The present invention is a kind of I2C test unit, be used for a test environment with servomechanism power supply unit of I2C interface, be the monomer that utilizes a single-chip to constitute, replace the existing tester table of finishing with computer, with the elasticity that increases test and reduce cost, simplification work.
Preferred embodiment of the present invention as shown in Figure 4, and the structure of monomer inside is then consulted monomer body construction calcspar shown in Figure 5.Body comprises three parts, is respectively control module 51, mnemon 52, response unit 53.Control module 51 is electrically connected by first interface 42, second interface 43 and servomechanism power supply unit, test macro respectively, receives various test signals, and deals with in response to these signals.
In this test environment, its test mode is: this servomechanism power supply unit, short circuit, load are overweight when receiving, during undertension or the like test signal, can send a signal of responding.Consult shown in Figure 4, the embodiment of the invention is to utilize test macro 22 to send the 3rd signal 46 of a test to the servomechanism power supply unit 21 that is electrically connected, this servomechanism power supply unit can be in response to different test condition contents such as the short circuit of the 3rd signal 46, overloads, see through the I2C interface and send first signal 44 of responding, arrive this test unit 41 via first interface 42.Simultaneously, this test macro also is electrically connected by second interface 43 and this I2C test unit 41, and when sending the 3rd signal, send a secondary signal 45 to this I2C test unit, inform that at present what this servomechanism power supply unit was carried out is the test of which kind of condition.
See also shown in Figure 5ly, in the I2C test unit, mnemon 52 logically is a form, is writing down the corresponding relation of first signal and secondary signal.After control module 51 receives first signal 44 and secondary signal 45 by first interface 42, second interface 43 respectively, will go to the form of mnemon 52, whether the inquiry comparison corresponding relation of these two signals at present is the correct corresponding relation that is write down in the form, respond unit 53 outputs afterwards with this control module 51 of result notification of comparing, and through this.
For example, suppose that secondary signal is the test of 01 representative overload, and under the normal conditions, the servomechanism power supply unit can be tested first signal that interface is exported a FF by I2C when overload, then in the form of mnemon 52, can write down the FF that 01 of secondary signal corresponds to first signal.When whether just often test macro 22 will test the reaction of servomechanism power supply unit under overload, the 3rd signal 46 that one overload is provided earlier is to servomechanism power supply unit 21, and export one 01 secondary signal 45 to I2C test unit 41, inform that what carry out at present is the test of overload.
Servomechanism power supply unit 21 can be exported one first signal 44 as responding after receiving the 3rd signal 46 of test.The control module of this I2C test unit, receive first signal and secondary signal after, will arrive in the form of mnemon 52 and inquire about.If this overload measurement is normal, servomechanism power supply unit 21 can be sent first signal of FF, this control module is correct with first signal of the FF that receives and 01 secondary signal and writing down such correspondence in mnemon, so just can determine to test errorless.If it is undesired to test, first signal of sending not is FF, for example is DE, and then inquiry just can determine that less than this kind correspondence this test is out of joint in mnemon.
Again, mnemon 52 can be a simple ROM (ROM), writing down aforesaid corresponding form, therefore when the product of test different size, as long as change mnemon 52, just can obtain the different signal rules of correspondence, do not need to write again formula, use, unusual quick facility all in the maintenance, saved many times and job costs.
The result of test is to be responsible for externally output by responding unit 52.This responds the unit can be a LCD driver, can directly be come out by liquid crystal display displays directly with the correctness of test result; Also can be one group and respond circuit, send test result back to test macro 22, the I/O test result that merges other is exported together, for example directly show or print out or the like by printer, therefore, the present invention is on using, no matter be the independent test that is used for the I2C interface, or merge existing test macro to other functions, all very convenient, have elasticity.
The above, it only is preferred embodiment of the present invention, be not that the present invention is done any pro forma restriction, every foundation technical spirit of the present invention all still belongs in the scope of technical solution of the present invention any simple modification, equivalent variations and modification that above embodiment did.
Claims (12)
1. an I2C test unit is to be electrically connected a test macro, and this test macro provides the test environment of a power supply unit, and this power supply unit is to have an I2C interface, and it comprises:
One first interface is to be an I2C interface, is to be electrically connected this power supply unit, to receive one first signal;
One second interface is to be electrically connected this test macro, to receive a secondary signal; And
One monomer body is in response to this first signal and this secondary signal, does one and handles action, with auxiliary this power supply unit of this test system and test.
2. I2C test unit according to claim 1 is characterized in that described monomer body more comprises:
One control module is in response to the corresponding rule of this first signal with this secondary signal, to finish this processing action;
One mnemon is to be electrically connected this control to explain, in order to write down this rule of correspondence of this first signal and this secondary signal; And
One responds the unit, is to be electrically connected this control module, and after this control module is finished this processing action, carries out one and respond action.
3. I2C test unit according to claim 2 is characterized in that described control module is to be a comparer or a microprocessor.
4. I2C test unit according to claim 2 is characterized in that described processing action is in response to this rule of correspondence, determining a corresponding relation of this first signal and this secondary signal, and triggers this response and moves.
5. I2C test unit according to claim 2 is characterized in that described response is to be a display device.
6. I2C test unit according to claim 5 it is characterized in that described response action is to export this corresponding relation to this display device, and this display device is to be liquid crystal indicator (LCD).
7. I2C test unit according to claim 2 is characterized in that described response unit is to be a response circuit.
8. I2C test unit according to claim 7 is characterized in that described response circuit is to be electrically connected this test macro.
9. I2C test unit according to claim 7 is characterized in that described response action is that this corresponding relation of output is to this test macro.
10. I2C test unit according to claim 2 is characterized in that described mnemon is to be ROM (ROM).
11. I2C test unit according to claim 1 is characterized in that described test macro is electrical connection and sends one the 3rd signal to this power supply unit, and sends this secondary signal to this test unit.
12. I2C test unit according to claim 1 is characterized in that described power supply unit is in response to the 3rd signal, exports this first signal to this test unit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 99119760 CN1290875A (en) | 1999-09-30 | 1999-09-30 | I2C test unit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 99119760 CN1290875A (en) | 1999-09-30 | 1999-09-30 | I2C test unit |
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| Publication Number | Publication Date |
|---|---|
| CN1290875A true CN1290875A (en) | 2001-04-11 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 99119760 Pending CN1290875A (en) | 1999-09-30 | 1999-09-30 | I2C test unit |
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| Country | Link |
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| CN (1) | CN1290875A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6530048B1 (en) * | 1999-08-24 | 2003-03-04 | Delta Electronics Inc. | I2C test single chip |
| CN100458722C (en) * | 2005-12-12 | 2009-02-04 | 深圳艾科创新微电子有限公司 | System and method for debugging IC interface device by PC |
| CN101398467B (en) * | 2007-09-26 | 2011-01-05 | 鸿富锦精密工业（深圳）有限公司 | Internal integrate circuit bus interface test system and method |
-
1999
- 1999-09-30 CN CN 99119760 patent/CN1290875A/en active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6530048B1 (en) * | 1999-08-24 | 2003-03-04 | Delta Electronics Inc. | I2C test single chip |
| CN100458722C (en) * | 2005-12-12 | 2009-02-04 | 深圳艾科创新微电子有限公司 | System and method for debugging IC interface device by PC |
| CN101398467B (en) * | 2007-09-26 | 2011-01-05 | 鸿富锦精密工业（深圳）有限公司 | Internal integrate circuit bus interface test system and method |
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