CN1244815C - 印刷电路板测试用接合器与测试针 - Google Patents

印刷电路板测试用接合器与测试针 Download PDF

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Publication number
CN1244815C
CN1244815C CNB018045871A CN01804587A CN1244815C CN 1244815 C CN1244815 C CN 1244815C CN B018045871 A CNB018045871 A CN B018045871A CN 01804587 A CN01804587 A CN 01804587A CN 1244815 C CN1244815 C CN 1244815C
Authority
CN
China
Prior art keywords
unit
testing needle
guide
contact maker
testing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CNB018045871A
Other languages
English (en)
Chinese (zh)
Other versions
CN1398351A (zh
Inventor
M·普罗科普
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ATG Test Systems GmbH and Co KG
Original Assignee
ATG Test Systems GmbH and Co KG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ATG Test Systems GmbH and Co KG filed Critical ATG Test Systems GmbH and Co KG
Publication of CN1398351A publication Critical patent/CN1398351A/zh
Application granted granted Critical
Publication of CN1244815C publication Critical patent/CN1244815C/zh
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07371—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate card or back card with apertures through which the probes pass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416—Connectors, terminals

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)
CNB018045871A 2000-02-04 2001-02-02 印刷电路板测试用接合器与测试针 Expired - Fee Related CN1244815C (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE10004974.5 2000-02-04
DE10004974A DE10004974A1 (de) 2000-02-04 2000-02-04 Adapter zum Prüfen von Leiterplatten und Nadel für einen solchen Adapter

Publications (2)

Publication Number Publication Date
CN1398351A CN1398351A (zh) 2003-02-19
CN1244815C true CN1244815C (zh) 2006-03-08

Family

ID=7629852

Family Applications (1)

Application Number Title Priority Date Filing Date
CNB018045871A Expired - Fee Related CN1244815C (zh) 2000-02-04 2001-02-02 印刷电路板测试用接合器与测试针

Country Status (4)

Country Link
KR (1) KR100663270B1 (de)
CN (1) CN1244815C (de)
DE (1) DE10004974A1 (de)
WO (1) WO2001057541A1 (de)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102005030551B3 (de) * 2005-06-22 2007-01-04 JHS Technik Josef Schäfer Vorrichtung zum Übertragen von elektrischen Signalen zwischen einem Tester und einem Prüfadapter
DE102007047269A1 (de) * 2007-10-02 2009-04-09 Atg Luther & Maelzer Gmbh Vollrasterkassette für einen Paralleltester zum Testen einer unbestückten Leiterplatte, Federkontaktstift für eine solche Vollrasterkassette sowie Adapter für einen Paralleltester zum Testen einer unbestückten Leiterplatte
KR101061593B1 (ko) 2008-04-21 2011-09-01 윌테크놀러지(주) 프로브 카드
CN103930142B (zh) 2011-10-14 2016-12-14 安姆根有限公司 注射器和装配方法
KR101305380B1 (ko) * 2012-05-30 2013-09-17 삼성전기주식회사 기판 검사 장치 및 그 위치 보정 방법
KR101582634B1 (ko) * 2013-09-13 2016-01-08 한국기계연구원 프로브 모듈 및 프로브 모듈의 제조 방법
CN110568231A (zh) * 2018-06-06 2019-12-13 中华精测科技股份有限公司 探针卡装置及其立体式信号转接结构

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3123627A1 (de) * 1981-06-15 1982-12-30 Siemens AG, 1000 Berlin und 8000 München Vorrichtung zum gleichzeitigen kontaktieren mehrerer eng beisammenliegender pruefpunkte, insbesondere von rasterfeldern
US4774462A (en) * 1984-06-11 1988-09-27 Black Thomas J Automatic test system
DE8515436U1 (de) * 1985-05-24 1985-08-22 MANIA Elektronik Automatisation Entwicklung und Gerätebau GmbH, 6384 Schmitten Kontaktstift aus elektrisch leitendem Werkstoff zu Verwendung in einer elektrischen Prüfvorrichtung für Leiterplatten
DE3564158D1 (en) * 1985-09-16 1988-09-08 Mania Gmbh Device for electronic testing of printed boards or similar devices
ATE75319T1 (de) * 1987-11-09 1992-05-15 Mania Gmbh Adapter fuer eine vorrichtung zur elektronischen pruefung von leiterplatten.
DE3917341A1 (de) * 1988-06-01 1989-12-14 Manfred Prokopp Verfahren und pruefadapter zum kontaktieren von prueflingen
DE4011434A1 (de) * 1990-04-09 1991-10-10 Atg Electronic Gmbh Verfahren und vorrichtung zum bohren und/oder bestuecken der fuehrungsplatten eines pruefadapters
US5532613A (en) * 1993-04-16 1996-07-02 Tokyo Electron Kabushiki Kaisha Probe needle
DE9416526U1 (de) * 1994-05-20 1995-06-08 Luther & Maelzer Gmbh, 31515 Wunstorf Vorrichtung zum Prüfen von elektrischen Leiterplatten unter Verwendung eines Prüfadapters mit Prüfstiften
DE29616272U1 (de) * 1996-09-18 1998-01-29 atg test systems GmbH, 97877 Wertheim Adapter zum Prüfen von elektrischen Leiterplatten
DE19847244B4 (de) * 1997-11-05 2005-05-19 Feinmetall Gmbh Prüfkopf für Mikrostrukturen mit Schnittstelle

Also Published As

Publication number Publication date
WO2001057541A1 (de) 2001-08-09
DE10004974A1 (de) 2001-08-09
CN1398351A (zh) 2003-02-19
KR20030009350A (ko) 2003-01-29
KR100663270B1 (ko) 2007-01-02

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C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
C17 Cessation of patent right
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20060308

Termination date: 20100202