CN1244815C - 印刷电路板测试用接合器与测试针 - Google Patents
印刷电路板测试用接合器与测试针 Download PDFInfo
- Publication number
- CN1244815C CN1244815C CNB018045871A CN01804587A CN1244815C CN 1244815 C CN1244815 C CN 1244815C CN B018045871 A CNB018045871 A CN B018045871A CN 01804587 A CN01804587 A CN 01804587A CN 1244815 C CN1244815 C CN 1244815C
- Authority
- CN
- China
- Prior art keywords
- unit
- testing needle
- guide
- contact maker
- testing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
- G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
- G01R1/07371—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate card or back card with apertures through which the probes pass
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
- G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10004974.5 | 2000-02-04 | ||
DE10004974A DE10004974A1 (de) | 2000-02-04 | 2000-02-04 | Adapter zum Prüfen von Leiterplatten und Nadel für einen solchen Adapter |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1398351A CN1398351A (zh) | 2003-02-19 |
CN1244815C true CN1244815C (zh) | 2006-03-08 |
Family
ID=7629852
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB018045871A Expired - Fee Related CN1244815C (zh) | 2000-02-04 | 2001-02-02 | 印刷电路板测试用接合器与测试针 |
Country Status (4)
Country | Link |
---|---|
KR (1) | KR100663270B1 (de) |
CN (1) | CN1244815C (de) |
DE (1) | DE10004974A1 (de) |
WO (1) | WO2001057541A1 (de) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102005030551B3 (de) * | 2005-06-22 | 2007-01-04 | JHS Technik Josef Schäfer | Vorrichtung zum Übertragen von elektrischen Signalen zwischen einem Tester und einem Prüfadapter |
DE102007047269A1 (de) * | 2007-10-02 | 2009-04-09 | Atg Luther & Maelzer Gmbh | Vollrasterkassette für einen Paralleltester zum Testen einer unbestückten Leiterplatte, Federkontaktstift für eine solche Vollrasterkassette sowie Adapter für einen Paralleltester zum Testen einer unbestückten Leiterplatte |
KR101061593B1 (ko) | 2008-04-21 | 2011-09-01 | 윌테크놀러지(주) | 프로브 카드 |
CN103930142B (zh) | 2011-10-14 | 2016-12-14 | 安姆根有限公司 | 注射器和装配方法 |
KR101305380B1 (ko) * | 2012-05-30 | 2013-09-17 | 삼성전기주식회사 | 기판 검사 장치 및 그 위치 보정 방법 |
KR101582634B1 (ko) * | 2013-09-13 | 2016-01-08 | 한국기계연구원 | 프로브 모듈 및 프로브 모듈의 제조 방법 |
CN110568231A (zh) * | 2018-06-06 | 2019-12-13 | 中华精测科技股份有限公司 | 探针卡装置及其立体式信号转接结构 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3123627A1 (de) * | 1981-06-15 | 1982-12-30 | Siemens AG, 1000 Berlin und 8000 München | Vorrichtung zum gleichzeitigen kontaktieren mehrerer eng beisammenliegender pruefpunkte, insbesondere von rasterfeldern |
US4774462A (en) * | 1984-06-11 | 1988-09-27 | Black Thomas J | Automatic test system |
DE8515436U1 (de) * | 1985-05-24 | 1985-08-22 | MANIA Elektronik Automatisation Entwicklung und Gerätebau GmbH, 6384 Schmitten | Kontaktstift aus elektrisch leitendem Werkstoff zu Verwendung in einer elektrischen Prüfvorrichtung für Leiterplatten |
DE3564158D1 (en) * | 1985-09-16 | 1988-09-08 | Mania Gmbh | Device for electronic testing of printed boards or similar devices |
ATE75319T1 (de) * | 1987-11-09 | 1992-05-15 | Mania Gmbh | Adapter fuer eine vorrichtung zur elektronischen pruefung von leiterplatten. |
DE3917341A1 (de) * | 1988-06-01 | 1989-12-14 | Manfred Prokopp | Verfahren und pruefadapter zum kontaktieren von prueflingen |
DE4011434A1 (de) * | 1990-04-09 | 1991-10-10 | Atg Electronic Gmbh | Verfahren und vorrichtung zum bohren und/oder bestuecken der fuehrungsplatten eines pruefadapters |
US5532613A (en) * | 1993-04-16 | 1996-07-02 | Tokyo Electron Kabushiki Kaisha | Probe needle |
DE9416526U1 (de) * | 1994-05-20 | 1995-06-08 | Luther & Maelzer Gmbh, 31515 Wunstorf | Vorrichtung zum Prüfen von elektrischen Leiterplatten unter Verwendung eines Prüfadapters mit Prüfstiften |
DE29616272U1 (de) * | 1996-09-18 | 1998-01-29 | atg test systems GmbH, 97877 Wertheim | Adapter zum Prüfen von elektrischen Leiterplatten |
DE19847244B4 (de) * | 1997-11-05 | 2005-05-19 | Feinmetall Gmbh | Prüfkopf für Mikrostrukturen mit Schnittstelle |
-
2000
- 2000-02-04 DE DE10004974A patent/DE10004974A1/de not_active Withdrawn
-
2001
- 2001-02-02 KR KR1020027009976A patent/KR100663270B1/ko not_active IP Right Cessation
- 2001-02-02 CN CNB018045871A patent/CN1244815C/zh not_active Expired - Fee Related
- 2001-02-02 WO PCT/EP2001/001123 patent/WO2001057541A1/de not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
WO2001057541A1 (de) | 2001-08-09 |
DE10004974A1 (de) | 2001-08-09 |
CN1398351A (zh) | 2003-02-19 |
KR20030009350A (ko) | 2003-01-29 |
KR100663270B1 (ko) | 2007-01-02 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
C17 | Cessation of patent right | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20060308 Termination date: 20100202 |