CN1231947C - 半导体器件 - Google Patents
半导体器件 Download PDFInfo
- Publication number
- CN1231947C CN1231947C CNB991062558A CN99106255A CN1231947C CN 1231947 C CN1231947 C CN 1231947C CN B991062558 A CNB991062558 A CN B991062558A CN 99106255 A CN99106255 A CN 99106255A CN 1231947 C CN1231947 C CN 1231947C
- Authority
- CN
- China
- Prior art keywords
- signal
- delay
- time
- output
- semiconductor device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 69
- 238000001514 detection method Methods 0.000 claims description 72
- 238000006243 chemical reaction Methods 0.000 claims description 30
- 230000004044 response Effects 0.000 claims description 11
- 238000013459 approach Methods 0.000 claims description 7
- 230000000052 comparative effect Effects 0.000 claims description 4
- 230000000630 rising effect Effects 0.000 description 41
- 238000005070 sampling Methods 0.000 description 29
- 230000003111 delayed effect Effects 0.000 description 17
- 230000001360 synchronised effect Effects 0.000 description 15
- 238000010586 diagram Methods 0.000 description 9
- 239000000047 product Substances 0.000 description 8
- 238000003860 storage Methods 0.000 description 8
- 238000000034 method Methods 0.000 description 7
- 238000013461 design Methods 0.000 description 6
- 238000004519 manufacturing process Methods 0.000 description 5
- 238000012360 testing method Methods 0.000 description 5
- 230000007704 transition Effects 0.000 description 4
- 230000005540 biological transmission Effects 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 239000004020 conductor Substances 0.000 description 2
- 239000012467 final product Substances 0.000 description 2
- 238000012423 maintenance Methods 0.000 description 2
- 230000003071 parasitic effect Effects 0.000 description 2
- 239000000523 sample Substances 0.000 description 2
- 210000001367 artery Anatomy 0.000 description 1
- 238000003556 assay Methods 0.000 description 1
- 230000003139 buffering effect Effects 0.000 description 1
- 229940075591 dalay Drugs 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 238000006386 neutralization reaction Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000005728 strengthening Methods 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- 210000003462 vein Anatomy 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/13—Arrangements having a single output and transforming input signals into pulses delivered at desired time intervals
- H03K5/133—Arrangements having a single output and transforming input signals into pulses delivered at desired time intervals using a chain of active delay devices
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/15—Arrangements in which pulses are delivered at different times at several outputs, i.e. pulse distributors
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
- H03L7/08—Details of the phase-locked loop
- H03L7/081—Details of the phase-locked loop provided with an additional controlled phase shifter
Landscapes
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Pulse Circuits (AREA)
- Dram (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
Description
Claims (12)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP61303/98 | 1998-03-12 | ||
JP06130398A JP3338776B2 (ja) | 1998-03-12 | 1998-03-12 | 半導体装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1236972A CN1236972A (zh) | 1999-12-01 |
CN1231947C true CN1231947C (zh) | 2005-12-14 |
Family
ID=13167289
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB991062558A Expired - Fee Related CN1231947C (zh) | 1998-03-12 | 1999-03-12 | 半导体器件 |
Country Status (6)
Country | Link |
---|---|
US (1) | US6246274B1 (zh) |
EP (1) | EP0942532A3 (zh) |
JP (1) | JP3338776B2 (zh) |
KR (1) | KR100391236B1 (zh) |
CN (1) | CN1231947C (zh) |
TW (1) | TW416185B (zh) |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6172544B1 (en) * | 1999-02-25 | 2001-01-09 | Advantest Corp. | Timing signal generation circuit for semiconductor test system |
US6236833B1 (en) | 1999-08-05 | 2001-05-22 | Hughes Electronics Corporation | Scalable switch matrix and demodulator bank architecture for a satellite uplink receiver |
JP3815209B2 (ja) * | 2000-11-20 | 2006-08-30 | セイコーエプソン株式会社 | クロック信号からのパルス信号の生成 |
JP2002162441A (ja) * | 2000-11-22 | 2002-06-07 | Nec Corp | 半導体装置 |
JP2003023343A (ja) | 2001-07-10 | 2003-01-24 | Mitsubishi Electric Corp | 遅延信号生成回路 |
JP4480341B2 (ja) * | 2003-04-10 | 2010-06-16 | 日立プラズマディスプレイ株式会社 | プラズマディスプレイ装置 |
US7236034B2 (en) * | 2004-07-27 | 2007-06-26 | Texas Instruments Incorporated | Self correcting scheme to match pull up and pull down devices |
US6965520B1 (en) | 2004-08-03 | 2005-11-15 | Texas Instruments Incorporated | Delay system for generating control signals in ferroelectric memory devices |
KR101035581B1 (ko) | 2004-12-30 | 2011-05-19 | 매그나칩 반도체 유한회사 | 다중 위상 클럭 출력용 지연동기루프 |
DE102005007652A1 (de) * | 2005-02-19 | 2006-08-24 | Infineon Technologies Ag | DLL-Schaltung zum Bereitstellen eines Ausgangssignals mit einer gewünschten Phasenverschiebung |
JP2007195066A (ja) * | 2006-01-20 | 2007-08-02 | Sony Corp | 発振回路、電源回路、表示装置、および携帯端末 |
US20070210846A1 (en) * | 2006-03-10 | 2007-09-13 | Himax Technologies, Inc. | Inverter gate delay line with delay adjustment circuit |
CN101854161B (zh) * | 2009-04-03 | 2012-06-27 | 晨星软件研发(深圳)有限公司 | 内存控制器中数据选通信号的校正电路及其校正方法 |
KR102540232B1 (ko) * | 2017-12-21 | 2023-06-02 | 삼성전자주식회사 | 디지털 측정 회로 및 이를 이용한 메모리 시스템 |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60219675A (ja) * | 1984-04-13 | 1985-11-02 | Sony Corp | 時間軸変換回路 |
JPS60229521A (ja) * | 1984-04-27 | 1985-11-14 | Sony Tektronix Corp | デジタル信号遅延回路 |
US4637018A (en) * | 1984-08-29 | 1987-01-13 | Burroughs Corporation | Automatic signal delay adjustment method |
JPS61261918A (ja) * | 1985-05-16 | 1986-11-20 | Japanese National Railways<Jnr> | クロツクパルスの位相調整方法 |
US4755704A (en) * | 1987-06-30 | 1988-07-05 | Unisys Corporation | Automatic clock de-skewing apparatus |
JPH02296410A (ja) | 1989-05-11 | 1990-12-07 | Mitsubishi Electric Corp | 遅延回路 |
US5022056A (en) * | 1989-10-23 | 1991-06-04 | National Semiconductor Corporation | Method and structure for digital phase synchronization |
US5287025A (en) * | 1991-04-23 | 1994-02-15 | Matsushita Electric Industrial Co., Ltd. | Timing control circuit |
US5245231A (en) * | 1991-12-30 | 1993-09-14 | Dell Usa, L.P. | Integrated delay line |
US5459422A (en) * | 1993-06-02 | 1995-10-17 | Advanced Micro Devices, Inc. | Edge selective delay circuit |
US5570294A (en) * | 1994-03-11 | 1996-10-29 | Advanced Micro Devices | Circuit configuration employing a compare unit for testing variably controlled delay units |
JP2803596B2 (ja) * | 1995-05-15 | 1998-09-24 | 日本電気株式会社 | クロック位相調整回路 |
JP3169794B2 (ja) * | 1995-05-26 | 2001-05-28 | 日本電気株式会社 | 遅延クロック生成回路 |
JPH09181580A (ja) | 1995-12-25 | 1997-07-11 | Advantest Corp | 遅延回路 |
US5818890A (en) * | 1996-09-24 | 1998-10-06 | Motorola, Inc. | Method for synchronizing signals and structures therefor |
JP3319340B2 (ja) * | 1997-05-30 | 2002-08-26 | 日本電気株式会社 | 半導体回路装置 |
-
1998
- 1998-03-12 JP JP06130398A patent/JP3338776B2/ja not_active Expired - Fee Related
-
1999
- 1999-03-11 EP EP99104901A patent/EP0942532A3/en not_active Withdrawn
- 1999-03-12 KR KR10-1999-0008423A patent/KR100391236B1/ko not_active IP Right Cessation
- 1999-03-12 CN CNB991062558A patent/CN1231947C/zh not_active Expired - Fee Related
- 1999-03-12 US US09/267,196 patent/US6246274B1/en not_active Expired - Fee Related
- 1999-03-12 TW TW088103841A patent/TW416185B/zh active
Also Published As
Publication number | Publication date |
---|---|
US6246274B1 (en) | 2001-06-12 |
EP0942532A2 (en) | 1999-09-15 |
CN1236972A (zh) | 1999-12-01 |
EP0942532A3 (en) | 2004-06-30 |
KR19990077850A (ko) | 1999-10-25 |
JP3338776B2 (ja) | 2002-10-28 |
JPH11261389A (ja) | 1999-09-24 |
TW416185B (en) | 2000-12-21 |
KR100391236B1 (ko) | 2003-07-12 |
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Legal Events
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---|---|---|---|
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C06 | Publication | ||
PB01 | Publication | ||
ASS | Succession or assignment of patent right |
Owner name: NEC ELECTRONICS TAIWAN LTD. Free format text: FORMER OWNER: NIPPON ELECTRIC CO., LTD. Effective date: 20030410 |
|
C41 | Transfer of patent application or patent right or utility model | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20030410 Address after: Kawasaki, Kanagawa, Japan Applicant after: NEC Corp. Address before: Tokyo, Japan Applicant before: NEC Corp. |
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C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
REG | Reference to a national code |
Ref country code: HK Ref legal event code: GR Ref document number: 1062905 Country of ref document: HK |
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C19 | Lapse of patent right due to non-payment of the annual fee | ||
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