CN118229373A - Defect photo shooting method, device, equipment and storage medium - Google Patents

Defect photo shooting method, device, equipment and storage medium Download PDF

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Publication number
CN118229373A
CN118229373A CN202310170282.9A CN202310170282A CN118229373A CN 118229373 A CN118229373 A CN 118229373A CN 202310170282 A CN202310170282 A CN 202310170282A CN 118229373 A CN118229373 A CN 118229373A
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China
Prior art keywords
flaw
shooting
information
quality inspection
equipment
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CN202310170282.9A
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Chinese (zh)
Inventor
路科恒
曲虎
单鹏赫
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Beijing Xia Kehui Information Technology Co ltd
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Beijing Xia Kehui Information Technology Co ltd
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Publication of CN118229373A publication Critical patent/CN118229373A/en
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Abstract

The embodiment of the specification relates to the technical field of second-hand commodity recovery, in particular to a flaw photo shooting method, a flaw photo shooting device, flaw photo shooting equipment and a storage medium. The flaw photo shooting method comprises the following steps: acquiring indication information and equipment information of equipment to be shot; the indication information is used for indicating whether shooting is performed in quality inspection or not; determining a shooting scheme based on the device information and the indication information; the shooting scheme comprises information for prompting a worker to shoot; based on the shooting scheme, a worker is prompted to shoot the flaw to obtain flaw illumination. So set up, the staff can shoot under the suggestion of generating based on shooting scheme, improves shooting efficiency, avoids the problem such as make a mistake or miss.

Description

Defect photo shooting method, device, equipment and storage medium
Technical Field
The embodiment of the specification relates to the technical field of second-hand commodity recovery, in particular to a flaw photo shooting method, a flaw photo shooting device, flaw photo shooting equipment and a storage medium.
Background
The second-hand e-commerce industry is used as a supplementary business state of a flashlight manufacturer, fills the blank of the second-hand transaction requirement of a user, further perfects the ecological construction of the comprehensive e-commerce platform, and is one of the layout key points of all large e-commerce platforms. In the existing transaction articles of the second-hand e-commerce platform, 3C products such as mobile phones, computers and televisions are relatively high in occupancy rate. When the second hand mobile phone is used for the transaction of the e-commerce platform, the platform side needs to carry out quality inspection on the mobile phone in order to ensure commodity quality, the mobile phone needs to take a picture of a flaw item, namely, the flaw photo is obtained, a quality inspection report is generated by combining the flaw photo and the quality inspection item, a purchaser conveniently has visual understanding on various information of the mobile phone through the quality inspection report, and the purchaser can know the equipment condition more comprehensively based on the flaw photo because the flaw photo can visually reflect specific flaws of the equipment, so the accuracy of the flaw photo is very important.
At present, a photographer shoots after quality inspection, and because the photographer does not know the place where a specific flaw is located, the situation of debugging the flaw or missing the flaw can occur.
Disclosure of Invention
Various embodiments in the present disclosure provide a method, apparatus, device and storage medium for capturing a flaw, so as to solve the problem that a photographer may find out a flaw or miss a flaw because he or she does not know where a specific flaw is.
One embodiment of the present disclosure provides a flaw photography method, including:
acquiring indication information and equipment information of equipment to be shot; the indication information is used for indicating whether shooting is performed in quality inspection or not;
Determining a shooting scheme based on the device information and the indication information; the shooting scheme comprises information for prompting a worker to shoot;
Based on the shooting scheme, a worker is prompted to shoot the flaw to obtain flaw illumination.
One embodiment of the present specification provides a flaw photography device, including:
the acquisition module is used for acquiring the indication information and the equipment information of the equipment to be shot; the indication information is used for indicating whether shooting is performed in quality inspection or not;
The determining module is used for determining a shooting scheme based on the equipment information and the indication information; the shooting scheme comprises information for prompting a worker to shoot;
and the prompt module is used for prompting staff to shoot the flaws based on the shooting scheme so as to obtain flaw illumination.
One embodiment of the present specification provides an electronic device including:
A processor;
a memory for storing processor-executable instructions;
and the processor is used for executing the flaw photo shooting method.
One embodiment of the present description provides a computer-readable storage medium having stored thereon computer program instructions that, when executed by a processor, cause the processor to perform a method as described above.
In the scheme provided by the invention, the indication information and the equipment information of the equipment to be shot are obtained; the indication information is used for indicating whether shooting is performed in quality inspection or not; determining a shooting scheme based on the device information and the indication information; the shooting scheme comprises the following steps: prompting a worker to shoot information; based on the shooting scheme, prompt information is sent out to prompt staff to shoot flaws, and flaw illumination is obtained. So set up, the staff can shoot under the suggestion of generating based on shooting scheme, improves shooting efficiency, avoids the problem such as make a mistake or miss.
Drawings
Fig. 1 is a flowchart of a flaw photo shooting method according to an embodiment of the present disclosure.
Fig. 2 is a schematic partial flow chart of a flaw photo shooting method according to an embodiment of the present disclosure.
Fig. 3 is a schematic flow chart of a portion of a flaw photo shooting method according to another embodiment of the present disclosure.
Fig. 4 is a schematic flow chart of a portion of a flaw photo shooting method according to another embodiment of the present disclosure.
Fig. 5 is a schematic partial flowchart of a flaw photo shooting method according to another embodiment of the present disclosure.
Fig. 6 is a schematic partial flowchart of a flaw photo shooting method according to another embodiment of the present disclosure.
Fig. 7 is a schematic structural diagram of a flaw photo shooting device according to an embodiment of the present disclosure.
Fig. 8 is a schematic structural diagram of an electronic device according to an embodiment of the present disclosure.
Detailed Description
SUMMARY
The second-hand e-commerce industry is used as a supplementary business state of a flashlight manufacturer, fills the blank of the second-hand transaction requirement of a user, further perfects the ecological construction of the comprehensive e-commerce platform, and is one of the layout key points of all large e-commerce platforms. In the existing transaction articles of the second-hand e-commerce platform, 3C products such as mobile phones, computers and televisions are relatively high in occupancy rate. When the second hand mobile phone is used for the transaction of the e-commerce platform, the platform side needs to carry out quality inspection on the mobile phone in order to ensure commodity quality, the mobile phone needs to take a picture of a flaw item, namely, the flaw photo is obtained, a quality inspection report is generated by combining the flaw photo and the quality inspection item, a purchaser conveniently has visual understanding on various information of the mobile phone through the quality inspection report, and the purchaser can know the equipment condition more comprehensively based on the flaw photo because the flaw photo can visually reflect specific flaws of the equipment, so the accuracy of the flaw photo is very important.
At present, a flaw photo is photographed by a photographer after quality inspection is completed, and because the photographer does not know the specific flaw, the situation of finding the flaw or missing the flaw may occur.
In order to solve the problems, the invention provides a flaw photo shooting method, which is used for acquiring indication information and equipment information of equipment to be shot; the indication information is used for indicating whether shooting is performed in quality inspection or not; determining a shooting scheme based on the device information and the indication information; the shooting scheme comprises the following steps: prompting a worker to shoot information; based on the shooting scheme, prompt information is sent out to prompt staff to shoot flaws, and flaw illumination is obtained. So set up, the staff can shoot under the suggestion of generating based on shooting scheme, improves shooting efficiency, avoids the problem such as make a mistake or miss.
Scene example
An example of an application scenario of a flaw photo shooting method is provided in the specification. The specific scene is as follows:
when the second-hand mobile phone is transacted on the e-commerce platform, the platform side needs to carry out quality inspection on the mobile phone in order to ensure commodity quality, photographs the flaw item, and generates a quality inspection report by combining the quality inspection item, so that a purchaser can conveniently know various information of the mobile phone through the quality inspection report, and the accuracy of flaw illumination influences after-sale cost. Currently, flaw shots are taken by a photographer after quality inspection is completed. Of course, the quality control may be performed by a quality control engineer during the quality control process. When the quality inspector performs photographing, the quality inspector is a photographer.
For a better explanation of the solution provided by the present invention, the terms appearing in the present invention are explained as follows:
HTTP (hypertext transfer protocol): the hypertext transfer protocol (Hyper Text Transfer Protocol, HTTP) is a simple request-response protocol that typically runs on top of TCP. It specifies what messages the client might send to the server and what responses it gets.
HTTP is based on client/server model and connection oriented. Typical HTTP transactions have the following procedure: (1) the client establishes a connection with the server; (2) the client makes a request to the server; (3) The server receives the request and returns a corresponding file as a response according to the request; (4) the client and the server close the connection.
In the invention, the HTTP server setting up an intranet is equivalent to a server, and the specific shooting equipment is equivalent to a client. In this way, HTTP-based communication between the client and the server is established for information transfer.
Quality inspector: the quality inspector refers to a person who performs quality inspection on equipment to be inspected (second-hand equipment such as a mobile phone).
Photographing the photographer: the photographer refers to a person who photographs the device to be inspected.
Photographing App tool: app refers to Application, namely an Application program for short, and a photographing App tool is an Application program which is developed based on the system opening capability of photographing equipment and comprises the functions of photographing a module, uploading pictures, compressing pictures, building an HTTP service and the like. The photographing apparatus may, but includes: a mobile phone, a tablet computer and other devices.
Quality inspection item: the quality inspection item refers to an inspection item of the equipment to be inspected. Flaw item: the defect term refers to some defective detection terms of the equipment to be detected, and photographing is needed to inform a user of the definite defect severity. And leave evidence for after-sales.
The application flow of the flaw photo shooting method in the application scene is as follows:
firstly, a quality inspection mechanism acquires equipment needing flaw photo shooting, then equipment information of equipment to be inspected (namely equipment to be shot) is determined, and whether shooting in quality inspection is performed or not is determined;
If shooting is performed in quality inspection, firstly quality inspection is performed on quality inspection items by a quality inspection operator, then whether shooting is required or not is determined based on quality inspection results, if shooting is required, shooting related information is uploaded in a preset server, and a two-dimensional code is generated and displayed based on the shooting related information stored in the server. The photographer (the quality inspector and the photographer may be the same person) scans the two-dimensional code through a preset client. Specifically, the client can be connected with a preset server after scanning the two-dimension code, wake up a photographing APP of the client, acquire photographing prompt information (such as photographing angle, photographing part name and photographing flaw information) based on the two-dimension code, and the like, and then photograph a photo using the photographing APP by a photographer, so that the photo is uploaded after photographing is completed. The information to be used for uploading is also acquired while scanning the two-dimensional code. And the steps are repeated until the quality inspector completes the quality inspection task of all quality inspection items, and the photographer completes the photographing task of all flaw items.
If shooting is performed after quality inspection, annotating flaw items in the process of quality inspection by a quality inspector, generating a shooting list based on the annotation of each flaw item after the quality inspector completes the quality inspection tasks of all the quality inspection items, wherein the shooting list comprises flaw items to be shot, and then popping up a two-dimensional code by clicking each flaw item in the shooting list, wherein a photographer (the quality inspector and the photographer can be the same person) scans the two-dimensional code through a preset client. Specifically, the client can be connected with a preset server after scanning the two-dimension code, wake up a photographing APP of the client, acquire photographing prompt information (such as photographing angle, photographing part name and photographing flaw information) based on the two-dimension code, and the like, and then photograph a photo using the photographing APP by a photographer, so that the photo is uploaded after photographing is completed. The information to be used for uploading is also acquired while scanning the two-dimensional code. And the method is repeated until the photographer finishes the photographing task of all the flaw items.
In some embodiments, after the photographer completes the photographing task of all the flaw items, the photographer may click a button for photographing completion, at this time, the system detects whether all the photographing tasks have been completed, and if there are flaw items missed by the photographer, a prompt is sent to prompt the photographer to photograph the missed flaw items.
In some embodiments, after the photographer completes the task of photographing all defect entries, the defect shots photographed by the photographer may also be image identified. Specifically, the identification result of the flaw illumination includes: flaw of equipment parts and equipment photographed by flaw photographs; specifically, the device components include: equipment backboard, equipment panel, equipment camera, equipment bottom shell and the like. Flaws in the device include: the equipment in the picture has flaws, the sizes and the types of the flaws. And when the identification result is inconsistent with the quality inspection result, a prompt is sent to prompt a photographer to take a photograph again. Specifically, the case that the identification result is inconsistent with the quality inspection result includes: the equipment component identified in the identification result is an equipment bottom shell, but the item of quality inspection in the quality inspection result is an equipment camera, and the identification result is different from the quality inspection result. The flaws of the equipment identified in the identification result are no flaws, but the items of quality inspection in the quality inspection result are scratches, and the identification result is different from the quality inspection result.
System architecture
The embodiment of the specification provides a flaw photo shooting system. The flaw photography system may include a client and a server. The client may be an electronic device with network access capabilities. Specifically, for example, the device used when the photographer takes a photograph may be used. The server may be a server of a second-hand merchandise platform. The server is used for executing the flaw photo shooting method provided by the invention.
In some embodiments, the client may be a tablet, notebook, smart phone, digital assistant, smart wearable device, shopping terminal, television, smart speaker, microphone, etc. Wherein, intelligent wearable equipment includes but is not limited to intelligent bracelet, intelligent wrist-watch, intelligent glasses, intelligent helmet, intelligent necklace etc.. Or the client may be software that is capable of running in the electronic device. The server may be an electronic device with some arithmetic processing capability. Which may have a network communication module, a processor, memory, and the like. Of course, a server may also refer to software running in an electronic device. The server may also be a distributed server, and may be a system having multiple processors, memories, network communication modules, etc. operating in concert. Or the server may also be a cluster of servers formed for several servers. Or with the development of science and technology, the server can also be a new technical means capable of realizing the corresponding functions of the embodiment of the specification. For example, a new form of "server" based on quantum computing implementation may be possible.
Example method
One embodiment of the present specification provides a flaw photography method. The flaw photography method can be applied to a server. Referring to fig. 1, the flaw photographing method may include the following steps.
Step S101: acquiring indication information and equipment information of equipment to be shot; the indication information is used for indicating whether shooting is performed in quality inspection or not;
In practical application, different personnel have different operation habits, take pictures in habit quality inspection of some personnel, take pictures after habit quality inspection of some personnel, meanwhile, different equipment processes of quality inspection and shooting are also different, and based on the scheme provided by the invention, the indication information and the equipment information of the equipment to be shot are firstly obtained; the indication information is used for indicating whether shooting is performed in quality inspection or not; the device information includes the brand of the device, the series of the device, and the model of the device. The specific manner of obtaining the indication information and the equipment information of the equipment to be shot may be: and acquiring indication information input by related staff and equipment information of equipment to be shot.
Step S102: determining a shooting scheme based on the device information and the indication information; the shooting scheme comprises information for prompting a worker to shoot;
under the prior art, in the process of photographing by a photographer, the photographer needs to search the item to be photographed, and in the scheme provided by the invention, the photographing scheme can be determined based on the equipment information and the indication information, namely: based on the quality inspector and the specific workflow of the photographer for the device, a photography plan is determined (i.e., information prompting the photographer to take a photograph is determined to prompt the photographer at an appropriate time).
Step S103: based on the shooting scheme, a worker is prompted to shoot the flaw to obtain flaw illumination.
Specifically, the staff here is the photographer, so sets up, and the photographer can shoot under the suggestion of generating based on shooting scheme, improves shooting efficiency, avoids the problem such as make a mistake or miss.
It should be noted that there are mainly two shooting schemes when shooting, one is shooting in quality inspection, and the other is shooting after quality inspection. Referring to fig. 2, determining a photographing scheme based on device information and instruction information includes:
Step S201, if the indication information indicates to shoot in quality inspection, after each quality inspection task is completed, generating a shooting scheme based on equipment information and quality inspection results of the quality inspection task;
The imaging method generated at this time is directed to the quality inspection task. If it is determined that photographing is not required based on the quality inspection result, a photographing scheme is not generated, or a 'quality inspection photographing scheme is not required for prompting the quality inspection item' is generated. If the shooting is required to be performed based on the quality inspection result, a shooting scheme is generated; the photographer is prompted to take a photograph based on the photographing scheme.
Step S202, if the instruction information instructs shooting after quality inspection, a shooting scheme is generated based on all quality inspection results and equipment information after all quality inspection tasks are completed.
By the arrangement, different shooting schemes can be generated in a targeted mode based on different operation habits of a quality inspector and a photographer, so that the shooting schemes accord with different operation habits of the quality inspector and the photographer.
In some embodiments, in step S201, generating a photographing scheme based on the device information and the quality inspection result of the quality inspection task includes:
step S301, when the quality inspection result shows that the equipment to be shot has flaws, determining whether the flaws can be shot or not based on the equipment information;
It should be noted that if the equipment to be photographed has no flaw, photographing is not required, and if the equipment to be photographed has a flaw, photographing is generally required. However, some flaws may not be photographed or may not be displayed even if photographed, in which case photographing may not be performed. Specifically, for example, a circuit inside a device has been defective, but a defective portion of its circuit cannot be displayed in a manner based on the defective illumination. In this case, the actual device has a flaw and cannot be photographed.
Step S302, if shooting is possible, judging whether historical flaw illumination exists or not; the historical flaw illumination is the flaw illumination shot before the quality inspection;
It should be noted that, when the device performs quality inspection, it may be primary quality inspection or non-primary quality inspection, and for the non-primary quality inspection device, some historical flaw illumination may exist; the historical flaw illumination refers to flaw illumination shot in the quality inspection process before the quality inspection. In practical application, if a certain flaw of the equipment has a historical flaw photo, and the historical flaw photo is available, repeated shooting is not needed.
In step S303, if there is a history defect photo and the history defect photo is not available, or there is no history defect photo, a photographing scheme is generated.
Specifically, in practical application, if a flaw does not have a corresponding historical flaw, the flaw needs to be photographed. If the flaw has a corresponding historical flaw illumination, but the current state of the flaw cannot be well displayed by the historical flaw illumination, the flaw needs to be photographed. Specifically, the case where there is no corresponding historical flaw illumination includes: the quality inspection is the primary quality inspection, and the quality inspection result of the equipment for the secondary quality inspection cannot be obtained, or because some flaws of the equipment are newly appeared, the quality inspection result of the equipment for the secondary quality inspection does not comprise the photos of the flaws. The cases where the history flaw illumination is not available mainly include: the flaws of the equipment change, so that the flaws of the current equipment cannot be well reflected by the previous flaws.
When the shooting is performed after the quality inspection, namely, when a shooting scheme is generated based on all quality inspection results and equipment information, each quality inspection item is required to be subjected to the consideration of whether flaws exist, whether flaws can be shot or not, whether historical flaw illumination exists or not, whether the historical flaw illumination is available or not is determined item by item comprehensively considering all aspects, so that a shooting list for guiding a photographer to perform shooting is obtained, wherein the shooting list comprises flaw items needing to be shot, then the photographer can click each flaw item in the shooting list, and a shooting prompt is popped up after the flaw items are clicked, so that a user is prompted to perform shooting.
In some embodiments, referring to fig. 4, based on the photographing scheme, the specific flow of prompting the staff to photograph the flaw is as follows:
step S401, generating and displaying a two-dimensional code based on a shooting scheme;
the two-dimension code is used for waking up a shooting module of the preset terminal after a worker scans the preset terminal, and determining acquisition information of flaw illumination;
Step S402, obtaining flaw illumination acquired by staff based on acquisition information.
In practical application, after displaying the two-dimensional code, a photographer (a quality inspector and a photographer may be the same person) scans the two-dimensional code through a preset client. Specifically, the client can be connected with a preset server after scanning the two-dimension code, the preset server is used for waking up a photographing APP of the client, controlling the client to display photographing prompt information (such as photographing angle, photographing part name and photographing flaw information) and the like, and then photographing by using the photographing APP by a photographer, and uploading a photo after photographing is completed. The information to be used for uploading is also obtained by scanning the two-dimensional code.
In some embodiments, a photographer may make an error in the photographing process to obtain an error photograph, and in order to avoid adverse effects caused by such error, referring to fig. 5, the method for photographing a flaw photograph provided in the present invention further includes:
step S501, checking flaw illumination shot by a worker;
Specifically, the verification process includes: manual or machine automatic verification; manual inspection refers to the verification of flaw illumination by the relevant personnel, and machine automatic inspection refers to the verification of flaw illumination by the machine based on a preset algorithm.
Step S502, prompt the staff to re-shoot the flaw photo which does not pass the verification.
The device can timely remove the faulty flaw illumination and take the photos again, so that misleading of related personnel (especially purchasers of equipment) caused by carrying the faulty flaw illumination in the quality inspection report is avoided.
Specifically, referring to fig. 6, checking the flaw shot by the worker includes:
Step S601, identifying equipment components included in the flaw photograph taken by the worker;
namely: based on a preset recognition algorithm, the main content photographed in the flaw photo is recognized, for example: equipment backboard, equipment panel, equipment camera, equipment bottom shell and the like.
Step S602, if the equipment component is not matched with the component where the flaw is located, the flaw is not checked;
specifically, the equipment component identified in the identification result is the equipment bottom shell, but the quality inspection result shows that the component with the flaw is a camera, and the flaw illumination is not checked at the moment.
Step S603, performing image recognition on the flaw photo shot by the staff, and recognizing whether flaws exist in the flaw photo to obtain a recognition result;
namely, based on a preset recognition algorithm, recognizing whether a flaw exists in the flaw illumination, specifically, the situation that the flaw exists includes: scratches, unfilled corners, depressions, and the like.
Step S604, if the identification result is inconsistent with the quality inspection result, the flaw illumination fails to pass the inspection; the quality inspection result is information indicating whether flaws exist in the representation input by a quality inspector when the quality inspector inspects the equipment.
It should be noted that, in practical application, the type and size of the flaw may be further identified, and if the type and size of the flaw obtained by identification and the flaw description given by the quality inspector in the quality inspection result are not consistent, the flaw may be considered as not passing the inspection.
The above-mentioned "step S601 and step S602" and "step S603 and step S604" do not have a specific sequence relationship. In practical applications, "step S601 and step S602" may be performed first, or "step S603 and step S604" may be performed first. Further, in practical applications, "step S601 and step S602" may be performed alone, or "step S603 and step S604" may be performed alone. The core purpose of the setting of the steps is to find out the situation of the defect illumination error caused by errors when a photographer photographs, and ensure the accuracy of the defect illumination as much as possible.
Example apparatus, electronic device, storage Medium, and software
An embodiment of the present disclosure further provides a flaw photo taking device, referring to fig. 7, including:
an acquisition module 71, configured to acquire instruction information and device information of a device to be photographed; the indication information is used for indicating whether shooting is performed in quality inspection or not;
A determining module 72 for determining a photographing scheme based on the device information and the indication information; the shooting scheme comprises information for prompting a worker to shoot;
the prompt module 73 is configured to prompt a worker to photograph the flaw based on the photographing scheme, so as to obtain a flaw illumination.
An embodiment of the present disclosure further provides an electronic device, referring to fig. 8, where the electronic device provided by the embodiment of the present invention may include: at least one processor 810, at least one communication interface 820, at least one memory 830, and at least one communication bus 840.
In the embodiment of the present invention, the number of the processor 810, the communication interface 820, the memory 830 and the communication bus 840 is at least one, and the processor 810, the communication interface 820 and the memory 830 complete the communication between each other through the communication bus 840; it will be appreciated that the communication connection scheme shown in fig. 8 for processor 810, communication interface 820, memory 830, and communication bus 840 is merely optional.
The processor 810 may be a central processing unit CPU, or a specific integrated circuit a step SIC (Application step SpecificIntegratedCircuit), or one or more integrated circuits configured to implement embodiments of the present invention.
Memory 830, which stores application programs, may include high-speed RAM memory, and may also include non-volatile memory (non-volatilememory), such as at least one disk memory.
The processor 810 is specifically configured to execute an application program in the memory, so as to implement any embodiment of the above-mentioned inspection report processing method.
The present specification also provides a computer-readable storage medium having stored thereon a computer program which, when executed by a computer, causes the computer to execute the flaw illumination method in any one of the above embodiments.
The present disclosure also provides a computer program product comprising instructions that, when executed by a computer, cause the computer to perform the method for capturing a flaw in any one of the above embodiments.
It will be appreciated that the specific examples herein are intended only to assist those skilled in the art in better understanding the embodiments of the present disclosure and are not intended to limit the scope of the present invention.
It should be understood that, in various embodiments of the present disclosure, the sequence number of each process does not mean that the execution sequence of each process should be determined by the function and the internal logic, and should not constitute any limitation on the implementation process of the embodiments of the present disclosure.
It will be appreciated that the various embodiments described in this specification may be implemented either alone or in combination, and are not limited in this regard.
Unless defined otherwise, all technical and scientific terms used in the embodiments of this specification have the same meaning as commonly understood by one of ordinary skill in the art to which this specification belongs. The terminology used in the description is for the purpose of describing particular embodiments only and is not intended to limit the scope of the description. The term "and/or" as used in this specification includes any and all combinations of one or more of the associated listed items. As used in this specification and the appended claims, the singular forms "a," "an," and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise.
It will be appreciated that the processor of the embodiments of the present description may be an integrated circuit chip having signal processing capabilities. In implementation, the steps of the above method embodiments may be implemented by integrated logic circuits of hardware in a processor or instructions in software form. The processor may be a general purpose processor, a Digital signal processor (Digital SignalProcessor, DSP), an Application SPECIFIC INTEGRATED Circuit (ASIC), an off-the-shelf programmable gate array (Field Programmable GATE ARRAY, FPGA) or other programmable logic device, a discrete gate or transistor logic device, a discrete hardware component. The methods, steps and logic blocks disclosed in the embodiments of the present specification may be implemented or performed. A general purpose processor may be a microprocessor or the processor may be any conventional processor or the like. The steps of a method disclosed in connection with the embodiments of the present specification may be embodied directly in hardware, in a decoded processor, or in a combination of hardware and software modules in a decoded processor. The software modules may be located in a random access memory, flash memory, read only memory, programmable read only memory, or electrically erasable programmable memory, registers, etc. as well known in the art. The storage medium is located in a memory, and the processor reads the information in the memory and, in combination with its hardware, performs the steps of the above method.
It will be appreciated that the memory in the embodiments of this specification may be either volatile memory or nonvolatile memory, or may include both volatile and nonvolatile memory. The nonvolatile memory may be a read-only memory (ROM), a Programmable ROM (PROM), an erasable programmable ROM (erasable PROM, EPROM), an Electrically Erasable Programmable ROM (EEPROM), or a flash memory, among others. The volatile memory may be Random Access Memory (RAM). It should be noted that the memory of the systems and methods described herein is intended to comprise, without being limited to, these and any other suitable types of memory.
Those of ordinary skill in the art will appreciate that the elements and algorithm steps described in connection with the embodiments disclosed herein can be implemented as electronic hardware, or combinations of computer software and electronic hardware. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the solution. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present specification.
It will be clear to those skilled in the art that, for convenience and brevity of description, specific working procedures of the above-described system, apparatus and unit may refer to corresponding procedures in the foregoing method embodiments, and are not repeated herein.
In the several embodiments provided in this specification, it should be understood that the disclosed systems, apparatuses, and methods may be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative, e.g., the division of elements is merely a logical function division, and there may be additional divisions of actual implementation, e.g., multiple elements or components may be combined or integrated into another system, or some features may be omitted, or not performed. Alternatively, the coupling or direct coupling or communication connection shown or discussed with each other may be an indirect coupling or communication connection via some interfaces, devices or units, which may be in electrical, mechanical or other form.
The units described as separate units may or may not be physically separate, and units shown as units may or may not be physical units, may be located in one place, or may be distributed over a plurality of network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the embodiment.
In addition, each functional unit in each embodiment of the present specification may be integrated into one processing unit, each unit may exist alone physically, or two or more units may be integrated into one unit.
The functions, if implemented in the form of software functional units and sold or used as a stand-alone product, may be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present specification may be essentially or, what contributes to the prior art, or a part of the technical solution may be embodied in the form of a software product, which is stored in a storage medium, and includes several instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the method of the embodiments of the present specification. And the aforementioned storage medium includes: a usb disk, a removable hard disk, a read-only memory (ROM), a random-access memory (RAM), a magnetic disk, or an optical disk, etc.
The above description is merely specific embodiments of the present invention, but the scope of the present invention is not limited thereto, and any person skilled in the art can easily think about changes or substitutions within the technical scope disclosed in the present specification, and should be covered in the scope of the present invention. Therefore, the protection scope of the invention is subject to the protection scope of the claims.

Claims (10)

1. A flaw illumination shooting method, characterized by comprising:
acquiring indication information and equipment information of equipment to be shot; the indication information is used for indicating whether shooting is performed in quality inspection or not;
Determining a photographing scheme based on the device information and the indication information; the shooting scheme comprises information for prompting a worker to shoot;
based on the shooting scheme, a worker is prompted to shoot the flaw so as to obtain flaw illumination.
2. The flaw photography method according to claim 1, wherein determining a photography scenario based on the device information and the indication information, comprises:
If the indication information indicates that shooting is performed in quality inspection, generating a shooting scheme based on the equipment information and quality inspection results of the quality inspection tasks after each quality inspection task is completed;
and if the indication information indicates that the shooting is performed after the quality inspection, generating a shooting scheme based on all quality inspection results and the equipment information after all quality inspection tasks are completed.
3. The flaw photography method according to claim 2, wherein generating a photography plan based on the device information and the quality inspection result of the quality inspection task includes:
when the quality inspection result shows that the equipment to be shot has flaws, determining whether the flaws can be shot or not based on the equipment information;
If the shot images can be shot, judging whether historical flaw illumination exists or not; the historical flaw illumination is the flaw illumination shot before the quality inspection;
if there is a historical flaw photo and the historical flaw photo is not available or there is no historical flaw photo, generating a shooting scheme.
4. The method of claim 1, wherein prompting a worker to photograph a flaw based on the photographing scheme to obtain a flaw photograph, comprises:
generating and displaying a two-dimensional code based on the shooting scheme;
The two-dimensional code is used for waking up a shooting module of the preset terminal after a worker scans the preset terminal, and determining acquisition information of flaw illumination;
And obtaining flaw illumination acquired by the staff based on the acquired information.
5. The flaw photography method according to claim 1, further comprising:
Checking the flaw photo shot by the staff;
and prompting a worker to re-shoot the flaw photo which does not pass the verification.
6. The method of claim 5, wherein verifying the flaw shot by the staff member comprises:
Identifying equipment parts included in the flaw photo shot by the staff;
if the equipment component is not matched with the component where the flaw is located, the flaw is not checked; and/or the number of the groups of groups,
Performing image recognition on the flaw photo shot by the staff, and recognizing whether flaws exist in the flaw photo or not to obtain a recognition result;
If the identification result is inconsistent with the quality inspection result, the flaw illumination fails to pass the verification; the quality inspection result is information indicating whether flaws exist in the representation input by a quality inspector when the quality inspector performs quality inspection on equipment.
7. The flaw photography method according to claim 1, wherein the information prompting the worker to photograph comprises: at least one of the quantity information of the flaw photo to be shot, the shooting angle information corresponding to the flaw photo to be shot and the part information of the flaw.
8. A flaw illumination shooting device, comprising:
The acquisition module is used for acquiring the indication information and the equipment information of the equipment to be shot; the indication information is used for indicating whether shooting is performed in quality inspection or not;
A determining module, configured to determine a shooting scheme based on the device information and the indication information; the shooting scheme comprises information for prompting a worker to shoot;
and the prompt module is used for prompting staff to shoot flaws based on the shooting scheme so as to obtain flaw illumination.
9. An electronic device, comprising:
A processor;
A memory for storing the processor-executable instructions;
The processor is configured to perform the flaw illumination method according to any one of claims 1 to 7.
10. A computer readable storage medium having stored thereon computer program instructions which, when executed by a processor, cause the processor to perform the method of any of claims 1 to 7.
CN202310170282.9A 2022-12-20 2023-02-14 Defect photo shooting method, device, equipment and storage medium Pending CN118229373A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN2022116490753 2022-12-20

Publications (1)

Publication Number Publication Date
CN118229373A true CN118229373A (en) 2024-06-21

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