CN118202222A - System and method for installing grinder/polisher sample holders - Google Patents

Abstract

Example systems and methods for a system for installing a grinder/polisher sample holder are provided. The system includes a platform having one or more fasteners and one or more mounting clips disposed and mounted on the platform. One or more mounting fixtures are configured to secure the sample holder in place for testing of a sample, such as a hardness test. The one or more mounting fixtures may include a mounting bracket to support the sample holder and fix the orientation and/or position of the sample holder. In an example, the mounting fixture has an interface to contact and support the sample holder when the sample holder is disposed within the system.

Description

System and method for installing grinder/polisher sample holders

Cross Reference to Related Applications

The present application hereby claims priority and equity from U.S. provisional application Ser. No. 63/238,861, filed on 8/31 of 2021, entitled "SYSTEMS AND Methods For Mounting A Grinder/Polisher Sample Holder [ systems and methods for mounting grinder/polisher sample holders ]". The above-listed U.S. applications are incorporated herein by reference in their entirety for all purposes.

Background

Grinding and polishing operations are performed on samples for many purposes and in a wide variety of departments and industries. In some applications, surface preparation of the sample by a grinding/polishing operation is performed in a grinding/polishing apparatus capable of performing both grinding and polishing operations to process the sample contained in the sample holder. If additional testing is to be performed on the sample, the sample must be removed from the sample holder.

Disclosure of Invention

A system and method for installing a grinder/polisher sample holder is disclosed, substantially as shown in and described in connection with at least one of the figures, as set forth more completely in the claims.

Drawings

Fig. 1 illustrates an example system for installing a grinder/polisher sample holder according to aspects of the present disclosure.

Fig. 2A illustrates a side view of the example system of fig. 1.

Fig. 2B illustrates an exploded view of the example system of fig. 1.

Fig. 3A illustrates a top view of the example system of fig. 1.

FIG. 3B illustrates a cross-sectional view of an example mounting fixture of the example system of FIG. 1.

Fig. 4 is a perspective view of the example system of fig. 1.

Fig. 5A-5C illustrate various views of an example system for installing the grinder/polisher sample holder of fig. 1 for use with a hardness tester according to aspects of the present disclosure.

The figures are not necessarily drawn to scale. Wherever appropriate, like or identical reference numerals have been used to designate like or identical elements.

Detailed Description

Systems and methods for a system for installing a grinder/polisher sample holder are disclosed. In particular, the system includes a platform having one or more fasteners with one or more mounting clips disposed and mounted thereon. One or more mounting fixtures are configured to secure the sample holder in place for testing of a sample, such as a hardness test. The one or more mounting fixtures may include a mounting bracket to support the sample holder and fix the orientation and/or position of the sample holder. In an example, the mounting fixture has an interface (e.g., hardened pin, contact end, etc.) to contact and support the sample holder when the sample holder is disposed within the system.

As disclosed herein, the mounting system provides a sample holding fixture that can be used with an abrasive/polishing system as well as a hardness tester. For example, the sample holders are disk-shaped trays that hold a plurality of mounted samples or specimens (e.g., in a containment cassette secured within the sample holder) in place for simultaneous grinding and/or polishing operations. The grinding/polishing system involves the use of one or more motors or other actuators to grind and/or polish the sample. After polishing, the polished sample may then be used to test the manufacturing process or other process that ultimately results in the sample, such as by performing visual inspection, hardness or density testing, and/or other desired testing.

For example, traditionally, an operator would need to remove an individual sample from a sample holder and load the sample individually into another holding platform for hardness testing. The result is that additional time and resources are devoted, not for testing, but for separating and arranging the samples.

The disclosed sample holding fixture and system enable an operator to move the entire sample holder tray and mount it directly onto the hardness tester without unloading individual samples. This significantly reduces the amount of effort required to test multiple samples and reduces the likelihood of accidental scoring and/or other damage to the samples.

In the disclosed example, a system for installing a grinder/polisher sample holder includes: a platform having one or more fasteners; and one or more mounting clips disposed on and mounted to the platform, the one or more mounting clips configured to secure a sample holder, each mounting clip comprising: one or more mounting brackets for securing the orientation or position of the sample holder; and one or more interfaces for contacting and supporting the sample holder when the sample holder is disposed within the system.

In some examples, the one or more mounting clips include three or more clips distributed about the platform at equal radial distances from the center point. In an example, each of the one or more clamps is separated by an equal distance between the axial positions.

In some examples, the placement of the one or more mounting clips on the platform can be adjusted based on the size or shape of the sample holder.

In some examples, a certain mounting bracket of the one or more mounting brackets is configured as an adjustable mounting bracket, and the system further includes a bracket lock for adjusting a position or orientation of the adjustable mounting bracket to release the sample holder from the system and secure the sample holder to the system.

In some examples, each mounting clip further includes a base portion for mating with the platform, and a post extending from the base portion to support the interface. In an example, one or more interfaces are mounted to an extension post extending from a post. In an example, the base portion is configured to be secured to the platform via one or more fasteners.

In some examples, the one or more mounting brackets are secured to the one or more mounting clamps via one or more bracket fasteners.

In some examples, the one or more interfaces are arranged to contact a first surface of the sample holder to limit movement of the sample holder in a first direction, and the bracket is configured to contact a second surface of the sample holder to limit movement of the sample holder in a second direction.

In some examples, the one or more mounting clips are formed of metal, such as stainless steel.

In some examples, one or more of the interfaces are formed of a hardened material, such as carbide or steel.

In some examples, the one or more mounting clips support the sample holder at a distance from the surface of the platform that is greater than the length of the sample holder drive adapter.

In some examples, the system is configured to be incorporated in a hardness tester.

In some disclosed examples, the hardness testing system includes a grinder/polisher sample holder and a system for mounting the grinder/polisher sample holder, the system for mounting the grinder/polisher sample holder comprising: a platform including one or more fasteners; one or more mounting clips disposed on and mounted to the platform, the one or more mounting clips configured to secure a sample holder, each mounting clip comprising: one or more mounting brackets for securing the orientation or position of the sample holder; and one or more interfaces for contacting and supporting the sample holder when the sample holder is disposed within the system.

In some examples, a platen is included that is configured to mount a system for mounting a grinder/polisher sample holder.

In an example, the system for installing the grinder/polisher sample holder further includes one or more alignment devices configured to mate with the one or more alignment devices at the platen.

In some examples, an indentation device is included for testing the hardness of a sample by impacting the sample within the sample holder.

In some examples, a movable stage is included, to which the platen is secured, the movable stage being configured to adjust the position or orientation of the sample relative to the indentation device.

In some examples, the platen further includes one or more alignment devices for mating with the platform.

As used herein, the word "exemplary" means "serving as an example, instance, or illustration. The embodiments described herein are not limiting, but merely exemplary. It should be appreciated that the described embodiments are not necessarily to be construed as preferred or advantageous over other embodiments. Moreover, the term "embodiments" does not require that all disclosed embodiments include the discussed feature, advantage or mode of operation.

As used herein, "and/or" refers to any one or more of a plurality of items in a list that are connected by "and/or". By way of example, "x and/or y" refers to any element in the triplet set { (x), (y), (x, y) }. In other words, "x and/or y" refers to "one or both of x and y". As another example, "x, y, and/or z" refers to any element in a seven-element set { (x), (y), (z), (x, y), (x, z), (y, z), (x, y, z) }. In other words, "x, y, and/or z" refers to "one or more of x, y, and z". As used herein, the term "exemplary" refers to serving as a non-limiting example, instance, or illustration. As used herein, the terms "such as (e.g.)" and "for example," refer to a list of one or more non-limiting examples, instances, or illustrations.

For the purposes of promoting an understanding of the principles of the claimed technology and presenting its best mode of operation, reference will now be made to the embodiments illustrated in the drawings and specific language will be used to describe the same. It will nevertheless be understood that no limitation of the scope of the claimed technology is thereby intended, such alterations and further modifications in the illustrated device, and such further applications of the principles of the claimed technology as illustrated herein being contemplated as would normally occur to one skilled in the art to which the claimed technology relates.

Fig. 1 illustrates an example fixture or system 100 for mounting a grinder/polisher sample holder 130. The system 100 includes one or more mounting fixtures 102 disposed on and mounted to a platform 120. As shown, the mounting fixture 102 is configured to secure the sample holder 130, thereby securing the orientation and/or position of the sample holder 130 in preparation for an operation such as a hardness test or the like.

Each mounting fixture may include one or more mounting brackets 112 that may be removably secured to the post 104 of the mounting fixture 102. For example, the mounting fixture 102 may include one or more sample mounting bracket fasteners 110, such as threaded holes for receiving bolts. In some examples, the mounting bracket 112 may be adjusted relative to the mounting fixture 102 and/or the sample, such as by raising, lowering, tilting, and/or sliding sideways (as a non-limiting example). The example adjustable mounting lock bracket 114 is shown with a sample mounting lock bracket 116, but any of a wide variety of fasteners or bolts may be used. As shown in fig. 1, the mounting bracket 112 is configured to contact a lateral surface of the sample holder to limit movement of the sample holder in a lateral direction. In some examples, the one or more mounting brackets 112 may be configured to contact one or more of the top and/or bottom surfaces of the sample holder 130 and may be shaped to match the (e.g., curved) profile of the sample holder 130.

In some examples, one or more interfaces 108 are formed on and/or secured to the post 118 to contact and support the sample holder 130 when the sample holder 130 is disposed within the system 100, thereby limiting movement of the sample holder 130 in a downward direction. In some examples, one or more interfaces 108 are integrally formed with the post 118. In some examples, one or more of the interfaces 108 are formed separately (e.g., formed of a hardened material such as carbide or steel) and secured directly to the post 118, while in some examples, the extension posts 106 are arranged to support the interfaces 108. In some examples, the extension post 106 and/or the interface 108 may be removably secured to the mounting fixture 102. For example, different extension posts 106 and/or interfaces 108 may have various characteristics (e.g., height, contact surface area, material composition, etc.) to accommodate different sample holders 130. In some examples, the extension posts 106 and/or the interface 108 may have fasteners or pins that cooperate with fasteners on the sample holder 130 to further assist in securing the sample holder 130 in the system 100.

The example mounting fixture 102 includes a base portion 103 with a post 118 extending from the base portion 103 to support the extension post 106, the interface 108, and the sample holder 130. In some examples, the base portion is configured to rest on a surface 122 of the platform 120. For example, one or more fasteners 124 are disposed on the platform 120 to receive posts, pins, bolts, etc., to secure the base portion 103 to the platform 120.

As shown in the example of fig. 1, the mounting fixture 102 is configured to support the sample holder 130 at a distance from the surface 122 of the platform 120 that is greater than the length of the sample holder drive adapter 134. This arrangement ensures that the sample holder 130 can be removed from the grinding/polishing system and placed directly on the mounting system 100 without requiring modification to the sample holder 130.

In some examples, one or more of the mounting clip 102, the platform 120, the fasteners, the mounting brackets 112, 114, the bracket locks 116, and/or the extension posts are formed of metal (e.g., stainless steel) and/or formed of a composite material suitable for withstanding impact from a hardness tester.

Although the mounting clip 102 is illustrated as having a particular geometry (e.g., a generally L-shape), any other suitable geometry may be used. Further, the mounting clip 102 is illustrated as a single portion comprising the post and the base, and in some examples, the mounting clip may be formed from two or more portions.

Fig. 2A illustrates a side view of the example system 100, with various features shown in cross-section. As shown, the mounting fixture 102 is mounted on the platform 120 and disposed on or near the fastener 124. To stabilize and/or secure the mounting clip 102 to the platform 120, one or more bolts 124B may secure the mounting clip 102 to the platform 120. Additionally or alternatively, one or more posts 124A may be disposed adjacent the base 103 to limit movement of the mounting clip 102.

For example, in some examples, the platform 120 may include one or more alignment devices 140 to ensure consistent orientation of the platform 120 and the system 100 in the stiffness testing system. In an example, the alignment device 140 is magnets configured to mate with magnets of opposite polarity on a surface or platen of the hardness testing system. In some examples, as a non-limiting list, one or more of magnets, posts, or openings may be employed to align the system 100.

Fig. 2B illustrates an exploded view of the example system of fig. 1. As shown, six mounting clips 102 are arranged around the platform center point 126 to receive sample holders 130. Each mounting clip 102 is paired with two posts 124A and a single bolt 124B to secure and/or stabilize the mounting clip to the platform 120. In the example of fig. 2B, two mounting brackets 112 are secured (via bolts 110A) to two mounting clips 102, which are separated by an adjacent mounting clip. The third mounting fixture 102 is separated from the two mounting fixtures by two mounting fixtures adjacent to the third mounting fixture to which the adjustable mounting bracket 114 is releasably secured by a bracket lock 116.

Although illustrated as having six mounting fixtures, the system may use as few as one mounting fixture and may use more than six mounting fixtures depending on the size, shape, and/or geometry of the sample holder, and/or the particular application or testing system. Although two mounting brackets and a single adjustable mounting bracket are shown, each mounting bracket used may or may not be adjustable. Although the mounting fixture is illustrated as surrounding a center point on the platform, in some examples, the mounting features may have an asymmetric arrangement on the platform.

Fig. 3A illustrates a top view of an example system 100. As shown, the mounting fixtures 102 are distributed around the platform at an equal radial distance 142 from the center point 126. For example, the interface 108 may be at an equal distance from the center point to balance the forces on the system 100 from the sample holder 130 during a testing operation (e.g., a hardness test). In some examples, the mounting fixtures are separated by an equal distance 144 between the axial locations.

FIG. 3B illustrates a cross-sectional view along section line A-A shown in FIG. 3A, providing a detailed view of the fasteners 110, 110A for securing the mounting bracket 112 to the post 118 and the fasteners 124 and 124B for securing the base 103 to the platform 120.

Fig. 4 is a perspective view of a block image of the example system 100 illustrated in fig. 1, with the sample holder 130 removed.

Fig. 5A-5C illustrate various views of a system 100 for installing a grinder/polisher sample holder for use with a hardness tester 150. For example, the hardness tester 150 may include a platen 154 upon which the system 100 may be placed. A hardness testing tool 152 (e.g., an indentation device) is disposed above the platen 154 and is configured to impact one or more samples 132 within the sample holder 130 to create an indentation in the sample.

In some examples, the platen 154 includes one or more alignment devices 158 for mating with the platform 120. When aligned, the position of the sample 132 is readily determined by the hardness tester so that the indentation apparatus can impact one or more of the samples 132.

In some examples, the platen 154 is operably connected to an actuator driven movable stage 156. The actuators may be controlled by a controller (e.g., computing platform, processor, etc.) to move (e.g., displace, rotate, vibrate, etc.) the stage 156 relative to the indentation device 152 so as to move between samples and/or within samples.

In some examples, the actuator is configured to move the stage 156 toward and/or away from the sample in order to adjust the load or force applied to the sample (e.g., a linear actuator controlled to move or drive the platen toward and away from the sample). Many types of actuators may be used to facilitate the testing operation.

In some examples, the sample holder 130 includes a plurality of sample receiving slots configured to hold samples 132 that may be removed from the sample holder 130.

The foregoing description and drawings illustrate the principles, preferred embodiments and modes of operation. However, the present disclosure should not be construed as limited to the particular embodiments discussed above. Those skilled in the art will appreciate additional variations of the embodiments discussed above.

While the present method and/or system has been described with reference to certain embodiments, it will be understood by those skilled in the art that various changes may be made and equivalents may be substituted without departing from the scope of the present method and/or system. In addition, many modifications may be made to adapt a particular situation or material to the teachings of the disclosure without departing from the scope thereof. For example, blocks and/or components of the disclosed examples may be combined, partitioned, rearranged, and/or otherwise modified. Therefore, the present methods and/or systems are not limited to the specific embodiments disclosed. Instead, the present method and/or system is intended to include all embodiments falling within the scope of the appended claims, either literally or under the doctrine of equivalents. Although the controller and method are described as being used in conjunction with an abrasive/polishing and/or hardness/density testing system, these teachings may be similarly applied to other systems and operations.

All documents cited herein, including journal articles or abstracts, published or corresponding U.S. or foreign patent applications, published or foreign patents, or any other documents, are each fully incorporated by reference herein, including all data, tables, figures, and text presented in the cited documents.

Claims (20)

1. A system for installing a grinder/polisher sample holder, comprising:

a platform comprising one or more fasteners; and

One or more mounting clips disposed on and mounted to the platform, the one or more mounting clips configured to secure a sample holder, each mounting clip comprising:

one or more mounting brackets for securing the orientation or position of the sample holder; and

One or more interfaces for contacting and supporting the sample holder when the sample holder is disposed within the system.

2. The system of claim 1, wherein the one or more mounting fixtures comprise three or more fixtures distributed about the platform at equal radial distances from a center point.

3. The system of claim 2, wherein each of the one or more clamps is separated by an equal distance between axial positions.

4. The system of claim 1, wherein an arrangement of the one or more mounting clips on the platform is adjustable based on a size or shape of the sample holder.

5. The system of claim 1, wherein a certain one of the one or more mounting brackets is configured as an adjustable mounting bracket, the system further comprising a bracket lock for adjusting a position or orientation of the adjustable mounting bracket to release the sample holder from the system and secure the sample holder to the system.

6. The system of claim 1, wherein each mounting fixture further comprises:

A base portion for mating with the platform; and

A post extending from the base portion to support the one or more interfaces.

7. The system of claim 6, wherein the one or more interfaces are mounted to an extension post extending from the post.

8. The system of claim 6, wherein the base portion is configured to be secured to the platform via the one or more fasteners.

9. The system of claim 1, wherein the one or more mounting brackets are secured to the one or more mounting clamps via one or more bracket fasteners.

10. The system of claim 1, wherein the one or more interfaces are arranged to contact a first surface of the sample holder to limit movement of the sample holder in a first direction, and the bracket is configured to contact a second surface of the sample holder to limit movement of the sample holder in a second direction.

11. The system of claim 1, wherein the one or more mounting fixtures are formed of metal, such as stainless steel.

12. The system of claim 1, wherein the one or more interfaces are formed of hardened material, such as carbide or steel.

13. The system of claim 1, wherein the one or more mounting clips support the sample holder at a distance from a surface of the platform that is greater than a length of a sample holder drive adapter.

14. The system of claim 1, wherein the system is configured to be incorporated in a hardness tester.

15. A hardness testing system, comprising:

grinder/polisher sample holder; and

A system for mounting a grinder/polisher sample holder comprising:

a platform comprising one or more fasteners;

one or more mounting clips disposed on and mounted to the platform, the one or more mounting clips configured to secure a sample holder, each mounting clip comprising:

one or more mounting brackets for securing the orientation or position of the sample holder; and

One or more interfaces for contacting and supporting the sample holder when the sample holder is disposed within the system.

16. The hardness testing system of claim 15, further comprising a platen configured to mount the system for mounting a grinder/polisher sample holder.

17. The hardness testing system of claim 16, wherein said system for mounting a grinder/polisher sample holder further comprises one or more alignment devices configured to mate with one or more alignment devices at said platen.

18. The hardness testing system of claim 15, further comprising an indentation device for testing the hardness of a sample by impacting the sample within the sample holder.

19. The hardness testing system of claim 18, further comprising a movable stage on which the platen is fixed, the movable stage configured to adjust a position or orientation of the sample relative to the indentation device.

20. The hardness testing system of claim 16, wherein said platen further comprises one or more alignment devices for mating with said platform.