CN118092813B - Reserved space adjusting method for NAND product - Google Patents
Reserved space adjusting method for NAND product Download PDFInfo
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Abstract
The invention provides a reserved space adjusting method for NAND products, which comprises the steps of establishing an OP database, storing OP values corresponding to different NAND products in different use scenes and user demands, and further rapidly acquiring the corresponding OP values by inquiring the OP database after determining the product demands, so as to finish the adjustment and optimization of the NAND; the OP database is also used for training the artificial neural network model to obtain an OP prediction model, so that when the corresponding OP value cannot be queried in the OP database, the training model can be used for obtaining the corresponding OP value, and further, the NAND is optimized and the OP database is updated, and the purposes of optimizing the performance, the service life, the cost and the system stability of the solid state disk are achieved.
Description
Technical Field
The invention relates to the technical field related to NAND firmware testing, in particular to a reserved space adjusting method for NAND products.
Background
The reserved space OP (Over-division) size has a significant impact on the performance and durability (lifetime) of the solid state disk NAND, with major impact aspects: 1. performance stability; 2. write amplification and endurance (lifetime); 3. space available to the user (cost); 4. wear balance and garbage recycling efficiency.
The OP of the NAND product is generally a fixed value and cannot be adjusted, and a proper OP value cannot be set according to different use scenes and user requirements, so that the performance, service life, cost and system stability of the solid state disk are all affected.
In view of the above-mentioned drawbacks, there is a need to design a headspace adjustment method for NAND products to overcome the above-mentioned drawbacks of the prior art.
Disclosure of Invention
In order to solve the problems mentioned in the above, the invention provides a method for adjusting the reserved space of a NAND product, so as to set a proper OP value according to different use scenes and user requirements, and achieve the purposes of optimizing the performance, service life, cost and system stability of the solid state disk.
A headspace adjustment method for a NAND product, characterized by: the method comprises the following steps:
Step 1, determining the NAND requirement;
Step 2, evaluating the current OP value of the NAND;
Step 3, according to the requirement in the step 1, inquiring a corresponding OP value in an OP database; if the OP value exists, the OP value of the NAND is adjusted to be the corresponding OP value, otherwise, the corresponding OP value is obtained through a prediction model, and then the OP value of the NAND is adjusted to be the corresponding OP value;
And step 4, testing and verifying whether the NAND meets the requirements in the step 1 through the OP test quantification tool set, if so, updating the OP database, otherwise, repeating the steps 3 to 4 until the requirements in the step 1 are met.
Further, in the step 1, the NAND requirements include: performance requirements, cost requirements, lifetime requirements, and system stability requirements.
Further, in the step 2, the evaluation is performed by an OP management tool.
Further, the OP management tool is configured to obtain the OP information of the NAND and adjust the OP value, where the OP information includes: current OP setting and OP adjustable range.
Further, the OP test quantization tool set is used for performance testing, wear balance testing, garbage collection and user model testing.
Further, the step of establishing the OP database is as follows:
a. Archiving test results, including: obtaining a trend graph of OP size to performance; obtaining a trend graph of OP size to NAND service life; obtaining a trend chart of OP size to garbage recovery efficiency; obtaining TBW (Total Bytes Written) data trend graphs of the OP size under a specific user model;
b. establishing a database of quantitative relations between OP and performance, WA (Write Amplification), EC (Erasure Coding), WL (Wear Leveling) efficiency, GC (Garbage Collection) efficiency and TBW under different use scenes;
c. Repeating steps a and b to refine the data for different NAND products.
Further, the prediction model is used for predicting the recommended OP setting value through the artificial neural network model; the OP database is used for training an artificial neural network model.
The beneficial effects of the invention are as follows:
1. according to the method, the OP database is established firstly, the OP values corresponding to different NAND products in different use scenes and user demands are stored, and then after the product demands are determined, the corresponding OP values can be obtained quickly by inquiring the OP database, the NAND is optimized, and the purposes of optimizing the performance, the service life, the cost and the system stability of the solid state disk are achieved.
2. The OP database is also used for training the artificial neural network model to obtain the OP prediction model, so that when the corresponding OP value cannot be queried in the OP database, the training model can be used for acquiring the corresponding OP value, and further, the NAND is regulated and the OP database is updated.
Drawings
FIG. 1 is a flow chart of a method according to an embodiment of the invention.
Fig. 2 is a schematic diagram of a system architecture according to an embodiment of the invention.
Detailed Description
The invention is further described below with reference to examples.
The following examples are illustrative of the present invention but are not intended to limit the scope of the invention. The conditions in the examples can be further adjusted according to specific conditions, and simple modifications of the method of the invention under the premise of the conception of the invention are all within the scope of the invention as claimed.
As shown in fig. 1, an embodiment of a headspace adjustment method for a NAND product, the method comprising the steps of:
step 1, determining the NAND requirement; the requirements of NAND include: performance requirements, cost requirements, lifetime requirements, and system stability requirements.
Step 2, evaluating the current OP value of the NAND; the evaluation is performed by OP management tools.
Step 3, according to the requirement in the step 1, inquiring a corresponding OP value in an OP database; if the OP value exists, the OP value of the NAND is adjusted to be the corresponding OP value, otherwise, the corresponding OP value is obtained through a prediction model, and then the OP value of the NAND is adjusted to be the corresponding OP value;
And step 4, testing and verifying whether the NAND meets the requirements in the step 1 through the OP test quantification tool set, if so, updating the OP database, otherwise, repeating the steps 3 to 4 until the requirements in the step 1 are met.
Fig. 2 shows an embodiment of a system architecture according to the method of the present invention.
The OP management tool is configured to obtain OP information of NAND and adjust an OP value, where the OP information includes: current OP setting and OP adjustable range.
The OP test quantification tool set is used for performance test, wear balance test, garbage collection and user model test. (1) The performance test is used for obtaining the influence on performance after the OP adjustment, and the SNIA performance test specification can also define a performance test case; (2) The wear balance test is used for obtaining the influence on WL after OP adjustment, and generally checking the erase count dispersion and the total EC of all super blocks through a large number of reads and writes; (3) The garbage recovery is used for acquiring the influence on the GC efficiency after the OP adjustment, triggering the GC by randomly and repeatedly writing a large number of full disks, and the stability of the observation performance and the write amplification coefficient are used as main measurement indexes; (4) The user model test is used for obtaining performance and stability performance (TBW data is obtained, namely life prediction) of different user models after OP adjustment, and obtaining information such as command sequences, queue depth, configuration and the like used by a user in daily life through trace log and other means, so as to restore a user use scene.
The OP database is established by the following steps:
a. Archiving test results, including: obtaining a trend graph of OP size to performance; obtaining a trend graph of OP size to NAND service life; obtaining a trend chart of OP size to garbage recovery efficiency; obtaining TBW (Total Bytes Written) data trend graphs of the OP size under a specific user model;
b. Establishing a database of quantitative relations between OP and performance, WA (Write Amplification), EC (Erase Count), WL (Wear Leveling) efficiency, GC (Garbage Collection) efficiency and TBW under different use scenes; and perfecting all corresponding test data of the OP from the minimum value to the maximum value through a large number of tests.
C. Repeating steps a and b to refine the data for different NAND products.
The OP database is used for OP inquiry and training of a prediction model.
The prediction model, i.e. the OP recommendation algorithm in fig. 2, is used for predicting the recommended OP setting value through the artificial neural network model. For example, BP networks, complex mappings between inputs (e.g., OP size adjustments) and outputs (e.g., WA, performance, lifetime, and TBW changes) can be established by learning patterns in the historical data. The mapping relation can capture nonlinear characteristics in the data, so that prediction of future states is realized.
Second, to make the predictions described above, a large amount of relevant data about OP sizing and its effects (i.e., data in the OP database) needs to be collected and used to train the artificial neural network model. Through continuous iteration and optimization, the model can gradually learn the internal rules and trends in the data, so that the prediction accuracy is improved.
Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made therein without departing from the spirit and scope of the invention as defined by the appended claims and their equivalents.
Claims (5)
1. A headspace adjustment method for a NAND product, characterized by: the method comprises the following steps:
Step 1, determining the NAND requirement;
Step 2, evaluating the current OP value of the NAND;
Step 3, according to the requirement in the step 1, inquiring a corresponding OP value in an OP database; if the OP value exists, the OP value of the NAND is adjusted to be the corresponding OP value, otherwise, the corresponding OP value is obtained through a prediction model, and then the OP value of the NAND is adjusted to be the corresponding OP value;
step 4, testing and verifying whether NAND meets the requirement in the step 1 through an OP test quantization tool set, if so, updating an OP database, otherwise, repeating the steps 3 to 4 until the requirement in the step 1 is met;
In the step 1, the NAND requirements include: performance requirements, cost requirements, lifetime requirements, and system stability requirements;
The OP test quantization tool set is used for performance test, wear balance test, garbage collection and user model test;
The OP database is established by the following steps:
archiving test results, including: obtaining a trend graph of OP size to performance; obtaining a trend graph of OP size to NAND service life; obtaining a trend chart of OP size to garbage recovery efficiency; obtaining TBW (Total Bytes Written) data trend graphs of the OP size under a specific user model;
Establishing a database of quantitative relations between OP and performance, WA (Write Amplification), EC (Erase Count of blocks), WL (Wear Leveling) efficiency, GC (Garbage Collection) efficiency and TBW under different use scenes;
C. repeating steps a and b to refine the data for different NAND products.
2. The headspace adjustment method for a NAND product according to claim 1, wherein: in the step 2, the evaluation is performed by an OP management tool.
3. The headspace adjustment method for a NAND product according to claim 2, wherein: the OP management tool is configured to obtain OP information of the NAND and adjust an OP value, where the OP information includes: current OP setting and OP adjustable range.
4. The headspace adjustment method for a NAND product according to claim 1, wherein: the prediction model is used for predicting the recommended OP setting value through the artificial neural network model.
5. The headspace adjustment method for a NAND product of claim 4, wherein: the OP database is used for training an artificial neural network model.
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN103853786A (en) * | 2012-12-06 | 2014-06-11 | 中国电信股份有限公司 | Method and system for optimizing database parameters |
| CN112034947A (en) * | 2020-09-02 | 2020-12-04 | 苏州浪潮智能科技有限公司 | Backboard design system for enhancing server hard disk compatibility and parameter tuning method |
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| US12008456B2 (en) * | 2019-06-28 | 2024-06-11 | Intel Corporation | Methods, apparatus, systems and articles of manufacture for providing query selection systems |
| CN115858660A (en) * | 2021-09-23 | 2023-03-28 | 中移(苏州)软件技术有限公司 | Parameter recommendation method and device and computer storage medium |
| CN114564460B (en) * | 2022-02-25 | 2024-01-19 | 苏州浪潮智能科技有限公司 | Parameter tuning method, device, equipment and medium based on distributed storage system |
| CN115509844A (en) * | 2022-09-28 | 2022-12-23 | 苏州浪潮智能科技有限公司 | Method, system, device and medium for optimizing performance of NVMe hard disk based on AMD platform |
| CN116795799A (en) * | 2023-08-02 | 2023-09-22 | 深圳玖合精工科技有限公司 | Automatic defragmentation method for hard disk files, computer equipment and storage medium |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN103853786A (en) * | 2012-12-06 | 2014-06-11 | 中国电信股份有限公司 | Method and system for optimizing database parameters |
| CN112034947A (en) * | 2020-09-02 | 2020-12-04 | 苏州浪潮智能科技有限公司 | Backboard design system for enhancing server hard disk compatibility and parameter tuning method |
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