CN117990159A - Method for controlling measuring device, measuring device and system - Google Patents
Method for controlling measuring device, measuring device and system Download PDFInfo
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- CN117990159A CN117990159A CN202410177393.7A CN202410177393A CN117990159A CN 117990159 A CN117990159 A CN 117990159A CN 202410177393 A CN202410177393 A CN 202410177393A CN 117990159 A CN117990159 A CN 117990159A
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- measuring device
- controlling
- controller
- measuring
- measurement
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- 238000000034 method Methods 0.000 title claims abstract description 37
- 238000012544 monitoring process Methods 0.000 claims abstract description 4
- 238000005259 measurement Methods 0.000 claims description 23
- 238000012423 maintenance Methods 0.000 claims description 3
- 230000005855 radiation Effects 0.000 claims description 3
- 230000000694 effects Effects 0.000 description 5
- 238000010586 diagram Methods 0.000 description 3
- 238000004458 analytical method Methods 0.000 description 2
- 238000004455 differential thermal analysis Methods 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 238000002076 thermal analysis method Methods 0.000 description 1
- 230000000930 thermomechanical effect Effects 0.000 description 1
Abstract
The invention relates to a method for controlling a measuring device (100), comprising monitoring an external influence on the measuring device (100) by means of a sensor device (110), and evaluating (M2) the monitored external influence by means of a controller (120) of the measuring device (100). The invention further relates to a measuring device (100) and a system comprising at least one measuring device (100).
Description
Technical Field
The invention relates to a method for controlling a measuring device, a measuring device and a system.
Background
The determination of the properties of different materials is of great significance for many applications in research and industry. For this purpose, various measuring devices are used, which sometimes provide very complex measuring processes, depending on the application.
The measuring devices used are sometimes sensitive to the external environment, such as temperature or vibration, among others. Such an effect may affect the measured value determined by the measuring device without being perceived by the user and thus compromising the accuracy of the measurements made.
Disclosure of Invention
Against this background, it is an object of the invention to minimize the influence of undesired external influences on the measurement results.
This object is achieved by a method having the features of patent claim 1, by a measuring device having the features of patent claim 9, or by a system having the features of patent claim 10.
Accordingly, a method for controlling a measuring device is provided. The method comprises monitoring external influences on the measuring device by means of the sensor device and evaluating the monitored external influences by means of a controller of the measuring device.
Furthermore, a measuring device and a system are provided, which are configured to perform the method according to the invention.
The basic idea of the invention is to automatically monitor and evaluate the external influences acting on the measuring device at all times. Thus, the user of the measuring device is advantageously supported and freed, which means that the influence of external influences on the measuring device or the measurement by the measuring device can be better taken into account or minimized.
According to an exemplary embodiment of the method, the sensor device is integrated in the measuring device. As a result, the influence directly acting on the measuring device can advantageously be monitored well.
According to an exemplary embodiment of the method, the sensor device is arranged outside or outside the measuring device. This configuration may be particularly advantageous in a laboratory environment with several measuring devices.
According to an exemplary embodiment of the method, the monitored external influence comprises an ambient temperature, an ambient humidity, solar radiation and/or vibration of the measuring device. These effects can have a particularly large influence on the measuring device and are therefore taken into account due to particular advantages.
According to an exemplary embodiment of the method, an alarm is output if the evaluated monitored external influence is outside a predetermined tolerance range. Thus, the accuracy of the measurements performed by the measuring device can be ensured in a particularly advantageous manner.
According to an exemplary embodiment of the method, the evaluated monitored external influence is taken into account in the measured value determined by the measuring device. The measured value determined by the measuring device is thus advantageously determined accurately.
According to an exemplary embodiment of the method, determining the measurement value is performed automatically by the controller. Thus, the user of the measuring device can be advantageously liberated.
According to an exemplary embodiment of the method, a notification is output if the evaluated monitored external influence indicates that maintenance or replacement of individual components of the measuring device is required in the near future. Thus, further indirect effects of external effects may be considered.
Drawings
The invention is explained below with reference to the figures of the drawings. In the drawings:
FIG. 1 is a schematic flow chart of a method according to an exemplary embodiment of the invention;
FIG. 2 is a schematic diagram of a measurement device according to an exemplary embodiment of the present invention; and
Fig. 3 is a schematic diagram of a system with multiple measurement devices according to an exemplary embodiment of the present invention.
In the drawings, like reference numerals refer to like or functionally identical parts unless otherwise specified.
DETAILED DESCRIPTION OF EMBODIMENT (S) OF INVENTION
Fig. 1 shows a schematic flow chart of a method M for controlling a measuring device according to an exemplary embodiment of the invention.
In a first step M1 of the method, the sensor device monitors the external influence on the measuring device. In a further step M2 of the method, the controller of the measuring device evaluates the monitored external influence.
The illustrated method M is described in detail below with reference to fig. 2 and 3.
Fig. 2 shows a schematic view of a measuring device 100 according to an exemplary embodiment of the invention.
The measurement device 100 comprises a sensor device 110, a controller 120, a database 130, an output device 140, an input device 150, and a sample receiving device 160.
In the exemplary embodiment shown here, sensor device 110 is integrated in measuring device 100 and is configured for monitoring external influences on measuring device 100. These external influences may include, for example, the ambient temperature, ambient humidity, solar radiation and/or vibration of the measuring device.
The controller 120 is configured to evaluate the external influence monitored by the sensor device 110. For this purpose, the controller 120 has access to a database 130, which in the present exemplary embodiment is configured in the form of an internal memory of the measuring device 100. Database 130 may include a plurality of information regarding material properties and measurement methods so that controller 120 can evaluate the extent to which the monitored external effects affect the measurements determined by measurement device 100.
The controller 120 may also be configured to output an alarm if the assessed monitored external impact is outside of a predetermined tolerance range. For example, the output device 140 of the measuring device 100 may be used for this purpose. The output device 140 may include, for example, a display screen and/or speakers for this purpose. Alternatively or additionally, the individual components of the measuring device 100, such as the input device 150 and the sample receiving device 160, may also be highlighted (displayed), for example by illuminating a switching area or the like to be actuated. The input device 150 may include, for example, a keyboard, a touch display screen, and the like. For example, the output device 140 and the input device 150 may be incorporated in a touch display screen.
It may also be provided that the evaluated monitored external influences are taken into account in the measured values determined by the measuring device 100. For this purpose, the controller 120 may be configured in particular to automatically determine the respective measured value.
Using the external influence assessed by the controller 120 and monitored by the sensor device 110, it is also possible to estimate (in particular by the controller 120) whether the measuring device 100 or a component thereof alone may require maintenance or replacement in the foreseeable future. In this case, a corresponding notification may be output, for example, by the output device 140.
In particular, the controller 120 may also be configured to update the database 130. Thus, for example, findings obtained when using the measuring device may be recorded in database 130 and then available for future measurements. Such information required for the performed measurement may be transmitted to the controller 120 either by the user of the measurement device 100. Alternatively or additionally, the controller 120 may also receive relevant information directly from the measuring device 100 (in particular from the sensor device 110).
The measuring device 100 may in particular be configured as a device for thermal analysis of materials. In particular, the measurement device 100 may be configured to perform differential thermal analysis, dynamic differential thermal measurement, dynamic mechanical analysis, thermomechanical analysis, and the like. Support for the user by the controller 110 may be particularly advantageous during such a measurement process.
Fig. 3 shows a schematic diagram of a system 10 with a plurality of measuring devices 100 according to an exemplary embodiment of the invention.
In the exemplary embodiment shown, system 10 includes a total of two measurement devices 100 and sensor devices 200.
The individual components of the system 10 may in principle be configured in exactly the same way as the corresponding components described with reference to fig. 2. In the exemplary embodiment shown here, only the sensor device 200 is configured to be external to both measuring devices 100 as a stand-alone device.
Because the sensor device 200 is configured as a stand-alone device, it may be configured for use with any of the measurement devices 100. This means that external influences affecting both measuring devices 100, such as the ambient temperature, can be effectively and consistently monitored by only one sensor device 200. It is also conceivable to use an external sensor device 200 with a sensor device 110 integrated in the measuring device 100, as shown for example in fig. 2, wherein in this case the external integrated sensor devices 200 and 110 each advantageously monitor their particularly suitable external influences.
Fig. 3 shows two measuring devices 100. However, any number of measuring devices 100 may be provided. In particular, it is also contemplated to use a separate measuring device 100 together with the external sensor device 200.
The measuring device 100 may be configured to have the same function or to perform different measurements in each case. This allows corresponding measurement procedures to be performed simultaneously or sequentially, depending on the application.
List of reference numerals
10. System and method for controlling a system
100. Measuring device
110. Sensor device
120. Controller for controlling a power supply
130. Database for storing data
140. Output device
150. Input device
160. Sample receiving device
200. Sensor device
M method
M1 method step
M2 method step
Claims (10)
1. A method (M) for controlling a measuring device (100), comprising:
monitoring (M1) external influences on the measuring device (100) by means of a sensor device (110; 200); and
The monitored external influence is evaluated (M2) by a controller (120) of the measuring device (100).
2. Method (M) for controlling a measuring device (100) according to claim 1, wherein,
The sensor device (110) is integrated in the measuring device (100).
3. Method (M) for controlling a measuring device (100) according to claim 1, wherein,
The sensor device (200) is arranged outside the measuring device (100).
4. Method (M) for controlling a measuring device (100) according to any of the preceding claims, wherein,
The monitored external influences include ambient temperature, ambient humidity, solar radiation and/or vibration of the measuring device (100).
5. The method (M) for controlling a measurement device (100) according to any one of the preceding claims, further comprising: if the estimated, monitored external influence is outside a predetermined tolerance range, an alarm is output.
6. Method (M) for controlling a measuring device (100) according to any of the preceding claims, wherein,
The evaluated, monitored external influences are taken into account in the measured values determined by the measuring device (100).
7. The method (M) for controlling a measurement device (100) according to claim 6, wherein the determination of the measurement value is performed autonomously or automatically by the controller (120).
8. Method (M) for controlling a measuring device (100) according to one of the preceding claims, further comprising: if the evaluated, monitored external influence indicates that maintenance or replacement of the individual components of the measuring device (100) is required in the near future, a notification is output.
9. Measuring device (100) configured to perform a method (M) for controlling a measuring device (100) according to any one of claims 1-8.
10. System (10) configured to perform the method (M) for controlling a measuring device (100) according to any one of claims 1-8, wherein the system (10) comprises at least one measuring device (100) and a sensor device (200).
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US202363453481P | 2023-03-21 | 2023-03-21 | |
| US63/453,481 | 2023-03-21 | ||
| DE102023107027.4 | 2023-03-21 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN117990159A true CN117990159A (en) | 2024-05-07 |
Family
ID=90887133
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202410177393.7A Pending CN117990159A (en) | 2023-03-21 | 2024-02-08 | Method for controlling measuring device, measuring device and system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN117990159A (en) |
-
2024
- 2024-02-08 CN CN202410177393.7A patent/CN117990159A/en active Pending
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