CN117973037A - Combined measurement reference design method for large-scale complex optical-mechanical system assembly - Google Patents
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Abstract
The invention provides a combined measurement reference design method for assembling a large-scale complex optical-mechanical system, which belongs to the field of combined measurement of the large-scale complex optical-mechanical system, and comprises the following steps: establishing a primary reference coordinate system based on a design reference of large-scale complex optical-mechanical system assembly; establishing a secondary reference based on the primary reference coordinate system; the second-level reference is used for determining the relative position relation between the part to be assembled and different measuring substrates; determining a plurality of tertiary datum points on the small substrate to establish tertiary datum points on the small substrate; the three-level datum is used for registering when the local parts are assembled on the small substrate; determining the measurement weights of the secondary datum points and the tertiary datum points according to the total spatial direction deviation values of the secondary datum points and the tertiary datum points; and then, based on the primary reference coordinate system, the secondary reference and the tertiary reference, the assembly of the large-scale complex optical-mechanical system is measured. The invention improves the assembly precision of the large complex optical-mechanical system.
Description
Technical Field
The invention relates to the field of large-scale complex optical-mechanical system assembly combined measurement, in particular to a combined measurement reference design method for large-scale complex optical-mechanical system assembly.
Background
For the assembly of a large-scale complex optical machine system, as the product complexity is increasingly improved, the traditional single measurement mode is difficult to meet the measurement requirement of the large-scale complex optical machine product, the measurement mode of combining multiple systems such as a laser tracking system, a theodolite measurement system, a joint arm measurement system and the like is adopted in the large-scale complex assembly space, and the measurement advantages of different systems are combined, so that the measurement problems such as covering and shielding of a measured product area are effectively solved, and the measurement robustness is improved.
With the enlargement and the complication of the assembly of the optical-mechanical system, the multi-reference design problem exists in the combined measurement process. In modern digital measurement, a reference coordinate system is a common reference penetrating through product design, manufacture and assembly, is a program origin set by manufacturing and processing, is also a basis for accurately positioning the position and the posture of a component, and the reliability degree of the detection precision of the assembly period of a complex optical-mechanical system is determined by the suitability of the reference design, so that the design of the reference coordinate system is particularly important. In the assembly combined measurement process of the large-scale complex optical-mechanical system, the conditions of large influence of the standard measured characteristic size on the error of the measurement result, standard shielding of measurement, accumulation of single standard measurement error and the like exist, so that the measurement precision is reduced, and meanwhile, the assembly quality of the large-scale complex optical-mechanical system cannot be ensured.
Disclosure of Invention
The invention aims to provide a combined measurement reference design method for assembling a large-scale complex optical-mechanical system, which can improve the measurement precision of the assembly of the large-scale complex optical-mechanical system.
In order to achieve the above object, the present invention provides the following solutions:
A combined measurement benchmark design method for large complex optical-mechanical system assembly, comprising:
acquiring a design reference of large-scale complex optical-mechanical system assembly; the large complex optical-mechanical system is characterized in that measuring substrates with different sizes are arranged in the assembly process of the large complex optical-mechanical system and are divided into a large substrate and a small substrate, the size of the large substrate is Yu Xiaoji pieces larger, and the small substrate is positioned on the upper surface of the large substrate;
establishing a primary reference coordinate system based on the design reference of the assembly of the large complex optical-mechanical system;
Establishing a secondary reference based on the primary reference coordinate system; the secondary reference comprises a large substrate secondary reference and a small substrate secondary reference; the large substrate secondary reference comprises a plurality of secondary reference points of a large substrate, and the small substrate secondary reference comprises a plurality of secondary reference points of a small substrate and a cube mirror reference; the secondary reference is used for determining the relative position relation between the part to be assembled and different measuring substrates;
Determining a plurality of tertiary datum points on the small substrate to establish tertiary datum points on the small substrate; the three-level datum is used for registering when the local parts are assembled on the small substrate;
Respectively determining the total deviation value of the space directions of the two-level datum points and the three-level datum points;
determining the measurement weights of the secondary datum points and the tertiary datum points according to the total space direction deviation values of the secondary datum points and the tertiary datum points;
And measuring the assembly of the large complex optical-mechanical system based on the primary reference coordinate system, the secondary reference, the tertiary reference, the measurement weights of the secondary reference points and the measurement weights of the tertiary reference points.
According to the specific embodiment provided by the invention, the invention discloses the following technical effects: the method comprises the steps of establishing a primary reference coordinate system based on a design reference of large-scale complex optical-mechanical system assembly, establishing a secondary reference and a tertiary reference based on the primary reference coordinate system, wherein the secondary reference is used for determining the relative position relation between a part to be assembled and different measuring substrates, the tertiary reference is used for registering when local parts are assembled on small substrates, and measuring weight distribution is carried out on each secondary reference and each tertiary reference, so that reference point weight ratio distribution under the characteristic of mixed reference is realized, the reliability of the establishment of the primary reference coordinate system of the large-scale complex optical-mechanical system is ensured, the measuring precision in the assembly process of the large-scale complex optical-mechanical system is improved, and the assembly precision of the large-scale complex optical-mechanical system is further improved.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions of the prior art, the drawings that are needed in the embodiments will be briefly described below, it being obvious that the drawings in the following description are only some embodiments of the present invention, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a flow chart of a combined measurement benchmark design method for large complex optical-mechanical system assembly provided by the invention;
FIG. 2 is a schematic view of a reference surface and a mounting surface;
FIG. 3 is a schematic diagram of angle compensation;
FIG. 4 is a schematic view of five feature planes;
FIG. 5 is a schematic diagram of a reference point overall layout;
Fig. 6 is a schematic diagram of a combined measurement reference design system for large complex optical-mechanical system assembly according to the present invention.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
The invention aims to provide a combined measurement reference design method for assembling a large-scale complex optical-mechanical system, and aims to design a multi-reference transmission method according to different measurement characteristics and measurement requirements aiming at the assembled combined measurement of the large-scale complex optical-mechanical system, so as to solve the problems of measurement reference shielding, large accumulation of the same reference error in the assembled combined measurement process of the large-scale complex optical-mechanical system, and the like.
In order that the above-recited objects, features and advantages of the present invention will become more readily apparent, a more particular description of the invention will be rendered by reference to the appended drawings and appended detailed description.
In view of the characteristics of the large-scale complex optical machine assembly process and the combined measurement requirement, the invention designs a multi-level reference coordinate system.
Multistage reference establishment cause: in the process of assembling a large complex optical machine, there is generally a theoretical design coordinate system according to the assembling process, and the coordinate system can be defined as a primary reference coordinate system. However, the design reference measured characteristic has a larger influence on the measurement error, so that a typical measurement characteristic is required to be added, and the precision control of the first-level reference coordinate system establishment is realized. Because the primary reference coordinate system is complex to establish, and the condition of reference shielding exists in the large-scale complex optical machine assembly combined type measurement process, meanwhile, the error accumulation value is larger due to the fact that the primary reference coordinate system is measured for many times, and the secondary reference coordinate system is established for guaranteeing the overall measurement accuracy. In consideration of the situation that the measurement range of the secondary reference is unreachable in the assembly process of the large complex optical machine, the tertiary reference can be established as a temporary reference and used for local feature measurement.
Multilevel reference establishment principle: the multi-level reference establishment process should follow the corresponding establishment principle, for example, the measured reference features should be fixed, stable and deformation-free, the reference arrangement should be in accordance with the reference arrangement principle, and meanwhile, the measurement accessibility is ensured. The establishment of the reference establishment principle lays a foundation for ensuring the measurement precision.
Example 1
As shown in fig. 1, the present embodiment provides a combined measurement reference design method for assembling a large complex optical-mechanical system, including:
step 100: and obtaining the design reference of the assembly of the large complex optical-mechanical system.
The measuring substrates with different sizes in the assembly process of the large complex optical-mechanical system are divided into a large substrate and a small substrate, the size of the large substrate is Yu Xiaoji pieces larger, and the small substrate is positioned on the upper surface of the large substrate.
Step 200: and establishing a primary reference coordinate system based on the design reference of the assembly of the large complex optical-mechanical system. Specifically, a design coordinate system is established based on the design reference of the large complex optical-mechanical system assembly, and then a primary reference coordinate system is established based on the design coordinate system.
The primary reference coordinate system can be regarded as the basis of multi-stage reference transmission, and the multi-stage reference coordinate system can be unified to the primary reference through coordinate conversion. In the actual measurement process, the coordinate system is generally established based on the principle of 3-2-1, that is, when the coordinate system is established, six degrees of freedom must be defined for determining a unique coordinate system, wherein the six degrees of freedom are respectively used for limiting the movement in three directions of X/Y/Z and are also based on the rotation in the X/Y/Z axial direction. The six-degree-of-freedom direction limitation of the measuring substrate can be realized through a reference, the main reference prescribes a direction, and 3 points or surfaces are contacted, so that 3 degrees of freedom are eliminated; the secondary datum is used for positioning, 2 points or line contact, and 2 degrees of freedom are eliminated; the third datum is used for fixing, controlling the rotation of the part, and 1 degree of freedom is eliminated by 1 point. Therefore, the standard limits six degrees of freedom, and the 3-2-1 principle is established.
In this embodiment, there are two ways to establish the primary reference coordinate system. The first is that the primary reference coordinate system is the same as the design coordinate system. I.e. the first level reference is exactly identical to the design reference. The second is to build a primary reference coordinate system through design references, large substrate features and small substrate features.
The process for establishing the design coordinate system comprises the following steps:
(1) For any measuring substrate, a first reference surface A, a second reference surface B and a mounting surface D of the measuring substrate are determined. The first reference plane a and the second reference plane B are two side surfaces of the measurement substrate, the mounting surface D is an upper surface of the measurement substrate, and the first reference plane a, the second reference plane B and the mounting surface D intersect with each other in pairs, as shown in fig. 2. Specifically, a first reference plane a, a second reference plane B and a mounting plane D are selected in combination with actual measurement sites and measurement requirements.
(2) And taking an intersection point of the first reference surface A, the second reference surface B and the mounting surface D of the measuring substrate as an origin of a design coordinate system.
(3) And determining intersecting lines of the mounting surface D of the measuring substrate and the first reference surface A and the second reference surface B to obtain two intersecting lines M and N of the measuring substrate.
Because the areas of the first reference surface A and the second reference surface B are too small, in order to reduce the influence of manufacturing errors and measuring errors on a design coordinate system, the first reference surface A and the second reference surface B are intersected with the mounting surface D respectively, and two intersecting lines M and N are obtained.
(4) And carrying out average error distribution on the two intersecting lines M and N of the measuring substrate so that the two intersecting lines M and N are vertical. Two intersecting lines M and N perpendicular to each other are respectively used as an X axis and a Y axis of a design coordinate system, and a Z axis of the design coordinate system is determined according to a right-hand rule.
In actual production assembly, due to manufacturing deviation, two planes cannot be strictly perpendicular to each other, an included angle between two intersecting lines M and N is set to 90 degrees+alpha, and at this time, average error distribution is required to be performed on the two intersecting lines, namely, angle compensation is performed on each intersecting line, so that the two intersecting lines are ensured to be completely perpendicular, as shown in fig. 3. At this time, the intersecting line M is taken as the X axis of the design coordinate system, the intersecting line N is taken as the Y axis of the design coordinate system, and the Z axis is determined according to the right-hand rule, thus completing the establishment of the design coordinate system.
Because the space size range of the measurement substrate is larger, the problem of larger measurement error exists only by adopting the design reference as the first-level reference, and the measurement accuracy is reduced, so that a first-level reference coordinate system is established by combining the typical measurement characteristics of the introduced substrate with the design reference. The process of establishing a primary reference coordinate system through design references, large substrate typical features and small substrate typical features comprises the following steps:
(21) For any measuring substrate, a first feature surface A1, a second feature surface A2, a third feature surface B1, a fourth feature surface B2 and a fifth feature surface C1 of the measuring substrate are determined. The first feature surface A1, the second feature surface A2, the third feature surface B1 and the fourth feature surface B2 are four side surfaces of the measurement substrate, the first feature surface A1 is parallel to the second feature surface A2, the third feature surface B1 is parallel to the fourth feature surface B2, and the fifth feature surface C1 is an upper surface of the measurement substrate, as shown in fig. 4.
(22) A sagging surface between the first and second characteristic surfaces A1 and A2 of the measurement substrate is determined as a first sagging surface, and a sagging surface between the third and fourth characteristic surfaces B1 and B2 of the measurement substrate is determined as a second sagging surface.
Specifically, the first and second mid-saggita are determined based on the "3-2-1 principle". The invention obtains the center vertical plane to achieve the effect of averaging errors in different directions.
The origin of the design coordinate system is the origin of the primary reference coordinate system. The first middle vertical plane is the X-axis direction of the primary reference coordinate system, and the second middle vertical plane is the Y-axis direction of the primary reference coordinate system. The normal direction of the fifth characteristic plane C1 is the Z-axis direction of the primary reference coordinate system. Further ensuring the establishment precision of the primary reference coordinate system.
The invention establishes the secondary reference and the tertiary reference by measuring the space point coordinates of the reference points, can obtain a coordinate system based on subsequent data processing, and can be used in subsequent coordinate conversion.
Step 300: and establishing a secondary reference based on the primary reference coordinate system. The secondary reference is used for determining the relative position relation between the part to be assembled and different measuring substrates so as to ensure the measuring precision.
The secondary references include a large substrate secondary reference and a small substrate secondary reference. The large substrate secondary reference comprises a plurality of secondary reference points of the large substrate, and the small substrate secondary reference comprises a plurality of secondary reference points of the small substrate and a cube mirror reference.
Specifically, step 300 includes: and determining a plurality of secondary datum points of the large substrate based on the primary datum coordinate system. And determining a plurality of secondary datum points of the small substrate based on a predetermined datum point layout principle, and establishing a cube mirror datum.
In this embodiment, based on a priori experience, the spatial position of the secondary reference point in the secondary reference is calibrated based on the primary reference coordinate system under the condition that the reference point layout principle is satisfied. The number of the secondary datum points of the large substrate and the small substrate is 8. The second level reference points of the large substrates are Z1 to Z8, and the second level reference points of the small substrates are #1 to #8, as shown in fig. 5.
For the condition of high precision requirement of the measured angle, a cube mirror reference is established on the basis of the primary reference, and a cube mirror coordinate system is established through measuring the center point of the cube mirror and the planes of the cube mirror which are mutually perpendicular, so that the angles of parts such as the mirror surface of the large complex optical-mechanical system can be adjusted subsequently. The position of the cube mirror is determined by the assembly process requirement and the measurement requirement of a large complex optical-mechanical system.
Step 400: a plurality of tertiary fiducial points are defined on the small substrate to establish tertiary fiducials on the small substrate. The tertiary datum is used for registration when the local parts are assembled on the small substrate.
Because only the small substrate is involved in the assembly of the local parts in the large complex optical-mechanical system, three levels of references are established on the small substrate. Specifically, according to the technological process and the characteristics of the measuring instrument, three-level reference, namely a local reference, is required to be established for the assembly of the small substrate local parts. In this embodiment, the number of three-level fiducial points on the small substrate is 6. Three-level datum points P1-P6 on the small substrate are designed in a local range based on prior experience and following the datum point layout principle. The purpose of coordinate system unification is achieved by measuring the coordinates of the three-level datum points P1-P6 and converting the coordinates by a coordinate system.
The primary reference established by the invention is taken as a basis, and both the secondary reference and the tertiary reference are required to be converted into a primary reference coordinate system. The first-level reference is established through the characteristics of a measuring plane and the like, the coordinate system is in a known state in the measuring coordinate system of the current equipment in the follow-up actual measurement, and the spatial relation of the current measuring coordinate system relative to the first-level reference coordinate system can be obtained through calibrating the arranged reference points, so that the conversion of different reference coordinate systems is realized. At this time, the secondary reference coordinate system and the tertiary reference coordinate system can be obtained based on the coordinate conversion, and meanwhile, the accuracy of the conversion of the current coordinate system can be determined. Therefore, the reference point measurement has a great influence on the precision of the establishment of the coordinate system, and the establishment of the secondary reference coordinate system and the tertiary reference coordinate system can be realized after the data processing through the reference point calibration.
In the assembly process, the reference measurement has the condition that the secondary reference and the tertiary reference are mixed, namely the actual measurement comprises secondary reference points Z1-Z8, # 1- #8 of a large substrate and a small substrate, and tertiary reference points P1-P6. Because the accuracy of the measurement points under different level coordinate systems is different, the weight distribution is needed to be carried out on the reference points of each reference coordinate system. The reference weight distribution proportion is based on the single-point measurement accuracy ratio of each reference characteristic. The weight distribution is divided into the reference weight ratio distribution under the same level and the weight ratio distribution under different levels according to whether the reference features are mixed or not, as in the steps 500 and 600.
Step 500: and respectively determining the total space direction deviation value of each secondary datum point and each tertiary datum point.
Step 600: and determining the measurement weights of the secondary datum points and the tertiary datum points according to the total space direction deviation values of the secondary datum points and the tertiary datum points.
Specifically, step 600 includes:
(61) And determining the deviation mean value of the secondary reference points according to the total deviation value of the spatial directions of the secondary reference points.
(62) And determining the deviation mean value of the three-level datum points according to the total deviation value of the spatial directions of the datum points of each three-level datum point.
(63) And determining the secondary weight of any secondary datum point according to the total spatial direction deviation value of the secondary datum point and the secondary datum point deviation mean value. Specifically, the formula is adoptedAnd determining the secondary weight of the ith secondary datum point.
(64) And for any three-level datum point, determining the three-level weight of the three-level datum point according to the total spatial direction deviation value of the three-level datum point and the three-level datum point deviation mean value. Specifically, the formula is adoptedAnd determining the three-level weight of the j-th level datum point.
(65) And determining a three-level datum point synthetic deviation according to the two-level datum point deviation average value and the three-level datum point deviation average value. Specifically, the formula is adoptedAnd determining the three-level datum point synthesis deviation.
(66) And determining the measurement weight of the secondary datum point according to the secondary weight of the secondary datum point and the secondary datum point deviation mean value. Specifically, the formula is adoptedAnd determining the measurement weight of the ith secondary datum point.
(67) And determining the measurement weight of the three-level datum point according to the three-level weight of the three-level datum point and the synthetic deviation of the three-level datum point. Specifically, the formula is adoptedAnd determining the measurement weight of the j-th level datum point.
Wherein,For three-level fiducial point synthetic bias,/>Is the deviation mean value of the secondary datum points,/>As the third level reference point deviation average value, ω 2,i is the second level weight of the ith second level reference point, dMag 2,i is the total spatial direction deviation value of the ith second level reference point, ω 3,j is the third level weight of the jth third level reference point, dMag 3,j is the total spatial direction deviation value of the jth third level reference point, W 2,i is the measurement weight of the ith second level reference point, and W 3,j is the measurement weight of the jth third level reference point.
According to different reference weight distribution principles, the invention ensures that the measurement reference coordinate system with high reliability occupies larger space in the measurement result and occupies smaller space with low reliability, thereby ensuring the establishment precision of the reference coordinate system. The measurement result related by the invention is the coordinates of the space points, and a specific numerical value of the coordinate system conversion precision, such as 0.02mm, can be obtained during coordinate conversion.
Step 700: and measuring the assembly of the large complex optical-mechanical system based on the primary reference coordinate system, the secondary reference, the tertiary reference, the measurement weights of the secondary reference points and the measurement weights of the tertiary reference points.
Further, the invention also analyzes uncertainty of reference transmission: the essence of reference transfer in large complex optical machine assembly combined measurement is coordinate system conversion, and based on the steps 100 to 700, the reference transfer uncertainty analysis is realized by adopting a numerical method-Monte Carlo simulation.
And in view of the influence of the reference feature points on the uncertainty established by the coordinate system, the reference transmission uncertainty analysis is completed through the number of the reference points and the uniformity of the reference point arrangement. The specific process is as follows: sampling is carried out based on the uncertainty of measurement of each datum point, and the uncertainty of measurement of the pose is carried into the pose parameter to solve the uncertainty of measurement of the pose, so that the evaluation of the uncertainty of measurement of the pose is realized. And arranging 12 datum points in a measuring field, and carrying out Monte Carlo simulation on the uncertainty of the pose measurement of the coordinate system from any of 3, 4 and 5 to 12, wherein the simulation times are 200 times, and the uncertainty of the position and the pose measurement established by the reference coordinate system is reduced along with the increase of the number of the datum points. When the number of the datum points is fixed, a certain datum point is selected as a datum point, the distance and the arrangement uniformity of the datum point are changed, the coordinate value of the datum point is reduced by 1-10 times based on the datum point, the position measurement uncertainty simulation is carried out, the position measurement uncertainty simulation is compared with the position measurement uncertainty of the original coordinate simulation, at the moment, the position measurement precision of the coordinate system is increased along with the reduction of the coordinate reduction multiple of the datum point, and when the coordinate value of the datum point is adjusted to the original coordinate value which is not scaled, the position measurement precision is highest.
The simulation analysis can obtain that the quantity of the datum points, the arrangement distance and the uniformity have influence on the establishment of the coordinate system. The wider and more uniform the distribution of the reference points distributed during the measurement of the large complex optical-mechanical system is, the smaller the uncertainty of the pose measurement of the established reference coordinate system is, and the higher the establishment precision of the reference of the coordinate system is.
Compared with the prior art, the invention solves the problems of low measurement coverage, low measurement precision and the like of a measured product in a single measurement mode through a combined measurement technology in the assembly of a large-scale complex optical-mechanical system. The method combines the analysis of the assembly process, establishes the design principle of coordinate systems at different levels, establishes a multi-level reference coordinate system, realizes multi-reference transmission, and solves the problems of reference shielding, single reference measurement error accumulation and the like in the assembly combined measurement process of the large complex optical-mechanical system. In addition, according to the weight ratio distribution principle under different levels, the problem of the weight ratio of the datum point under the mixed datum feature is solved, and the reliability of the establishment of the datum coordinate system is ensured. The reference transmission uncertainty analysis gives an optimal layout method of the reference points, reduces the influence of errors such as position distribution and quantity distribution of the reference points on the precision of the establishment of the reference coordinate system, and further ensures the precision and the assembly quality of the large-scale complex optical-mechanical system assembly.
Example two
In order to perform a corresponding method of the above embodiment to achieve the corresponding functions and technical effects, a combined measurement benchmark design system for large-scale complex optical-mechanical system assembly is provided below.
As shown in fig. 6, the combined measurement reference design system for assembling a large complex optical-mechanical system provided in this embodiment includes: the system comprises a design reference acquisition module 1, a primary reference establishment module 2, a secondary reference establishment module 3, a tertiary reference establishment module 4, a weight distribution module 5 and a measurement module 6.
The design reference acquisition module 1 is used for acquiring a design reference of large-scale complex optical-mechanical system assembly. The measuring substrates with different sizes are divided into a large substrate and a small substrate in the assembly process of the large complex optical-mechanical system, the size of the large substrate is Yu Xiaoji pieces larger, and the small substrate is positioned on the upper surface of the large substrate.
The primary reference establishing module 2 is used for establishing a primary reference coordinate system based on the design reference of the large complex optical-mechanical system assembly.
The secondary reference establishing module 3 is configured to establish a secondary reference based on the primary reference coordinate system. The secondary references include a large substrate secondary reference and a small substrate secondary reference. The large substrate secondary datum comprises a plurality of secondary datum points of a large substrate, and the small substrate secondary datum comprises a plurality of secondary datum points of a small substrate and a cube mirror datum. The secondary reference is used for determining the relative position relation between the component to be assembled and different measuring substrates.
The tertiary reference establishing module 4 is used for determining a plurality of tertiary reference points on the small substrate so as to establish tertiary reference points on the small substrate. The tertiary datum is used for registration when the local parts are assembled on the small substrate.
The weight distribution module 5 is configured to determine a total spatial direction deviation value of each secondary reference point and each tertiary reference point, and determine a measurement weight of each secondary reference point and each tertiary reference point according to the total spatial direction deviation value of each secondary reference point and each tertiary reference point.
The measurement module 6 is configured to measure the assembly of the large complex optical-mechanical system based on the primary reference coordinate system, the secondary reference, the tertiary reference, the measurement weights of the secondary reference points, and the measurement weights of the tertiary reference points.
Compared with the prior art, the combined measurement reference design system for assembling the large-scale complex optical-mechanical system provided by the embodiment has the same beneficial effects as the combined measurement reference design method for assembling the large-scale complex optical-mechanical system provided by the embodiment one, and is not repeated here.
Example III
The present embodiment provides an electronic device including a memory and a processor, where the memory is configured to store a computer program, and the processor is configured to execute the computer program to cause the electronic device to execute the combined measurement benchmark design method for large-scale complex optical-mechanical system assembly of the first embodiment.
Alternatively, the electronic device may be a server.
In addition, the embodiment of the invention further provides a computer readable storage medium, which stores a computer program, and the computer program when executed by a processor realizes the combined measurement benchmark design method for large-scale complex optical-mechanical system assembly in the embodiment.
In the present specification, each embodiment is described in a progressive manner, and each embodiment is mainly described in a different point from other embodiments, and identical and similar parts between the embodiments are all enough to refer to each other.
The principles and embodiments of the present invention have been described herein with reference to specific examples, the description of which is intended only to assist in understanding the methods of the present invention and the core ideas thereof; also, it is within the scope of the present invention to be modified by those of ordinary skill in the art in light of the present teachings. In view of the foregoing, this description should not be construed as limiting the invention.
Claims (9)
1. The combined measurement reference design method for large-scale complex optical-mechanical system assembly is characterized by comprising the following steps of:
acquiring a design reference of large-scale complex optical-mechanical system assembly; the large complex optical-mechanical system is characterized in that measuring substrates with different sizes are arranged in the assembly process of the large complex optical-mechanical system and are divided into a large substrate and a small substrate, the size of the large substrate is Yu Xiaoji pieces larger, and the small substrate is positioned on the upper surface of the large substrate;
establishing a primary reference coordinate system based on the design reference of the assembly of the large complex optical-mechanical system;
Establishing a secondary reference based on the primary reference coordinate system; the secondary reference comprises a large substrate secondary reference and a small substrate secondary reference; the large substrate secondary reference comprises a plurality of secondary reference points of a large substrate, and the small substrate secondary reference comprises a plurality of secondary reference points of a small substrate and a cube mirror reference; the secondary reference is used for determining the relative position relation between the part to be assembled and different measuring substrates;
Determining a plurality of tertiary datum points on the small substrate to establish tertiary datum points on the small substrate; the three-level datum is used for registering when the local parts are assembled on the small substrate;
Respectively determining the total deviation value of the space directions of the two-level datum points and the three-level datum points;
determining the measurement weights of the secondary datum points and the tertiary datum points according to the total space direction deviation values of the secondary datum points and the tertiary datum points;
And measuring the assembly of the large complex optical-mechanical system based on the primary reference coordinate system, the secondary reference, the tertiary reference, the measurement weights of the secondary reference points and the measurement weights of the tertiary reference points.
2. The method for combined measurement reference design for large complex optical-mechanical system assembly of claim 1, wherein establishing a primary reference coordinate system based on the design reference for large complex optical-mechanical system assembly specifically comprises:
Establishing a design coordinate system based on the design reference of the assembly of the large complex optical-mechanical system; the primary reference coordinate system is the same as the design coordinate system.
3. The method for combined measurement reference design for large complex optical-mechanical system assembly of claim 1, wherein establishing a primary reference coordinate system based on the design reference for large complex optical-mechanical system assembly specifically comprises:
based on the design reference of the large complex optical-mechanical system assembly, combining typical measurement characteristics of a substrate to establish a design coordinate system;
Determining a first characteristic surface, a second characteristic surface, a third characteristic surface, a fourth characteristic surface and a fifth characteristic surface of any measuring substrate; the first feature surface, the second feature surface, the third feature surface and the fourth feature surface are four side surfaces of the measuring substrate, the first feature surface is parallel to the second feature surface, the third feature surface is parallel to the fourth feature surface, and the fifth feature surface is the upper surface of the measuring substrate;
determining a sagging surface between a first characteristic surface and a second characteristic surface of the measuring substrate as a first sagging surface, and determining a sagging surface between a third characteristic surface and a fourth characteristic surface of the measuring substrate as a second sagging surface;
The origin of the design coordinate system is the origin of the primary reference coordinate system; the first middle vertical surface is in the X-axis direction of the primary reference coordinate system, and the second middle vertical surface is in the Y-axis direction of the primary reference coordinate system; and the normal direction of the fifth characteristic surface is the Z-axis direction of the primary reference coordinate system.
4. The method for combined measurement reference design for large complex optical-mechanical system assembly of claim 2, wherein the establishing of the design coordinate system based on the design reference for large complex optical-mechanical system assembly specifically comprises:
Determining a first reference surface, a second reference surface and a mounting surface of any measuring substrate; the first reference surface and the second reference surface are two side surfaces of the measuring substrate, the mounting surface is the upper surface of the measuring substrate, and the first reference surface, the second reference surface and the mounting surface are intersected in pairs;
taking an intersection point of a first reference surface, a second reference surface and a mounting surface of the measuring substrate as an origin of a design coordinate system;
determining intersecting lines of the mounting surface of the measuring substrate, the first reference surface and the second reference surface to obtain two intersecting lines of the measuring substrate;
Average error distribution is carried out on two intersecting lines of the measuring substrate, so that the two intersecting lines are vertical; two intersecting lines perpendicular to each other are respectively used as an X axis and a Y axis of a design coordinate system, and a Z axis of the design coordinate system is determined according to a right-hand rule.
5. The method for combined measurement reference design for large complex optical-mechanical system assembly of claim 1, wherein establishing a secondary reference based on the primary reference coordinate system specifically comprises:
determining a plurality of secondary reference points of the large substrate based on the primary reference coordinate system;
And determining a plurality of secondary datum points of the small substrate based on a predetermined datum point layout principle, and establishing a cube mirror datum.
6. The method of claim 1, wherein the number of secondary fiducial points for the large substrate and the number of secondary fiducial points for the small substrate are 8.
7. The method of claim 1, wherein the number of three levels of fiducial points on the small substrate is 6.
8. The method for designing combined measurement references for large complex optical-mechanical system assembly according to claim 1, wherein determining measurement weights of each secondary reference point and each tertiary reference point according to a total spatial direction deviation value of each secondary reference point and each tertiary reference point comprises:
Determining a secondary reference point deviation mean value according to the total deviation value of the spatial direction of each secondary reference point;
determining a three-level datum point deviation mean value according to the total deviation value of the spatial directions of all the three-level datum points;
For any secondary datum point, determining a secondary weight of the secondary datum point according to the total spatial direction deviation value of the secondary datum point and the secondary datum point deviation mean value;
for any three-level datum point, determining three-level weights of the three-level datum points according to the total spatial direction deviation value of the three-level datum points and the three-level datum point deviation mean value;
When the secondary datum point is mixed with the tertiary datum point, determining a tertiary datum point synthetic deviation according to the secondary datum point deviation mean value and the tertiary datum point deviation mean value; for any secondary datum point, determining the measurement weight of the secondary datum point according to the secondary weight of the secondary datum point and the secondary datum point deviation mean value; for any three-level datum point, determining the measurement weight of the three-level datum point according to the three-level weight of the three-level datum point and the synthetic deviation of the three-level datum point.
9. The method for combined measurement benchmarking for large complex optical-mechanical system assembly of claim 8, wherein the formula is employedDetermining the second-level weight of the ith second-level datum point; using the formulaDetermining the third-level weight of the j-th-level datum point;
using the formula Determining a three-level datum point synthesis deviation; using the formulaDetermining the measurement weight of an ith secondary datum point; using the formula/>Determining the measurement weight of a j-th level datum point;
Wherein, For three-level fiducial point synthetic bias,/>Is the sum of squares of deviation mean values of secondary datum points,/>For the sum of squares of the deviation means of the three-level datum points, ω 2,i is the second-level weight of the ith second-level datum point, dMag 2,i is the total deviation value of the spatial direction of the ith second-level datum point, ω 3,j is the third-level weight of the jth third-level datum point, dMag 3,j is the total deviation value of the spatial direction of the jth third-level datum point, W 2,i is the measurement weight of the ith second-level datum point, and W 3,j is the measurement weight of the jth third-level datum point.
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