CN117950924A

CN117950924A - Equipment testing method and device, electronic equipment and storage medium

Info

Publication number: CN117950924A
Application number: CN202410009002.0A
Authority: CN
Inventors: 国云庆
Original assignee: Suzhou Metabrain Intelligent Technology Co Ltd
Current assignee: Suzhou Metabrain Intelligent Technology Co Ltd
Priority date: 2024-01-03
Filing date: 2024-01-03
Publication date: 2024-04-30

Abstract

The application discloses a device testing method, a device, an electronic device and a storage medium, comprising the following steps: determining first residual power consumption of the equipment test platform, and determining first test items which are not operated in the test platform and first operation powers corresponding to the first test items respectively; determining a first operation duration corresponding to a target item to be tested with first residual power consumption, wherein the first operation power is smaller than or equal to first residual power consumption; determining a first duration when the first remaining power consumption is greater than or equal to a first operating power of the target item to be tested; determining a second operation duration less than or equal to the first duration from the first operation durations; determining a second test item and a first device to be tested corresponding to the second test item based on the second operation time length; and running a second test item on the first equipment to be tested based on the first duration to obtain a first test result, so that the utilization rate of the power consumption of the equipment test platform and the batch test efficiency of the equipment can be improved.

Description

Equipment testing method and device, electronic equipment and storage medium

Technical Field

The application belongs to the technical field of testing, and particularly relates to a device testing method, a device, electronic equipment and a storage medium.

Background

With the rapid development of computer technology and the internet, servers have become one of the indispensable infrastructures for modern enterprises. In order to ensure the performance, stability and reliability of the server, it is often necessary to test the server. Server testing includes stress testing, stability testing, security testing, reliability testing, functional testing, and the like.

In the related art, the servers are tested in batches by mainly relying on manual experience and expert knowledge and controlling the number of servers on shelves to be tested by calculating the maximum power consumption of the servers to be tested.

However, in the method, the power consumption resource utilization rate of the equipment test platform is low, so that the batch test efficiency of the server is low.

Disclosure of Invention

The embodiment of the application aims to provide a device testing method, a device, electronic equipment and a storage medium, which can solve the problem of low batch testing efficiency of servers in the related technology.

In a first aspect, an embodiment of the present application provides a device testing method, where the method includes:

a method of device testing, the method comprising:

Determining first residual power consumption of an equipment test platform, and determining first non-running test items corresponding to equipment to be tested in the equipment test platform and first running power corresponding to the first test items respectively;

determining a first operation duration corresponding to a target item to be tested with the first residual power consumption, wherein the first operation power is smaller than or equal to the first residual power consumption;

Determining a first duration when the first residual power consumption is greater than or equal to a first operating power of the target item to be tested;

determining a second operation duration less than or equal to the first duration from the first operation durations;

Determining a second test item and first equipment to be tested corresponding to the second test item based on the second operation time length;

and running the second test item on the first equipment to be tested based on the first duration to obtain a first test result.

Optionally, the method further comprises:

Under the condition that a third test item in the equipment test platform is tested, updating the first residual power consumption based on the test power corresponding to the third test item to obtain updated first residual power consumption;

and under the condition that a fourth test item is newly added to the equipment test platform, updating the first residual power consumption based on the test power corresponding to the fourth test item to obtain updated first residual power consumption.

Optionally, the method further comprises:

And under the condition that the equipment test platform newly adds a fifth test item, subtracting the operation time length corresponding to the fifth test item from the first duration to obtain an updated first duration.

Optionally, the determining the first duration when the first remaining power consumption is greater than or equal to the first operating power of the target to-be-tested item includes:

acquiring a test item queue corresponding to running equipment in the equipment test platform;

Determining a first corresponding relation between the residual test power consumption of the equipment test platform and the future time based on the test item queue;

And determining a first duration time when the first residual power consumption is greater than or equal to the first running power of the target item to be tested based on the first corresponding relation.

Optionally, the determining the first remaining power consumption of the device test platform includes:

determining a test state code corresponding to a first device running in a device test platform;

determining a first device operating power of the first device based on the test status code;

and determining first residual power consumption of the device test platform based on the first device running power.

Optionally, the determining the first device operating power of the first device based on the test status code includes:

Acquiring first test power corresponding to each test item of the first equipment;

A first device operating power of the first device is determined based on the first test power and the test status code.

Optionally, the running the first test item on the first device to be tested includes:

acquiring test conditions of the second test item and test time length corresponding to the test conditions;

and testing the first equipment to be tested based on the test conditions and the test time length to obtain a first test result.

In a second aspect, an embodiment of the present application provides a device testing apparatus, the apparatus including:

The device comprises a first determining module, a second determining module and a first judging module, wherein the first determining module is used for determining first residual power consumption of a device testing platform, and determining first non-running test items corresponding to devices to be tested in the device testing platform and first running power corresponding to the first test items respectively;

the second determining module is used for determining a first operation duration corresponding to the target item to be tested with the first operation power being smaller than or equal to the first residual power consumption;

a third determining module, configured to determine a first duration when the first remaining power consumption is greater than or equal to a first operating power of the target to-be-tested item;

A fourth determining module, configured to determine a second operation duration that is less than or equal to the first duration from the first operation durations;

A fifth determining module, configured to determine a second test item and a first device to be tested corresponding to the second test item based on the second operation duration;

and the testing module is used for running the second test item on the first equipment to be tested based on the first duration time to obtain a first test result.

Optionally, the apparatus further comprises:

The first updating module is used for updating the first residual power consumption based on the test power corresponding to the third test item under the condition that the third test item in the equipment test platform is tested, so as to obtain updated first residual power consumption;

And the second updating module is used for updating the first residual power consumption based on the test power corresponding to the fourth test item under the condition that the equipment test platform is newly added with the fourth test item, so as to obtain updated first residual power consumption.

Optionally, the apparatus further comprises:

And the third updating module is used for subtracting the operation duration corresponding to the fifth test item from the first duration to obtain the updated first duration under the condition that the equipment test platform newly adds the fifth test item.

Optionally, the second determining module includes:

The first acquisition submodule is used for acquiring a test item queue corresponding to running equipment in the equipment test platform;

A first determining submodule, configured to determine a first correspondence between remaining test power consumption of the device test platform and a future time based on the test item queue;

And the second determining module is used for determining a first duration time when the first residual power consumption is larger than or equal to the first running power of the target item to be tested based on the first corresponding relation.

Optionally, the first determining module includes:

the third determining submodule is used for determining a test state code corresponding to the running first equipment in the equipment test platform;

a fourth determination submodule for determining a first device operating power of the first device based on the test status code;

and a fifth determining submodule, configured to determine a first remaining power consumption of the device testing platform based on the first device operating power.

Optionally, the fifth determining submodule includes:

the acquisition unit is used for acquiring first test power corresponding to each test item of the first equipment;

And the determining unit is used for determining the first equipment operation power of the first equipment based on the first test power and the test state code.

Optionally, the test module includes:

The second acquisition submodule is used for acquiring the test conditions of the second test item and the test duration corresponding to the test conditions;

And the testing sub-module is used for testing the first equipment to be tested based on the testing conditions and the testing time length to obtain a first testing result.

In a third aspect, an embodiment of the present application provides an electronic device, including a processor and a memory storing a program or instructions executable on the processor, the program or instructions implementing the device testing method as claimed in any one of the preceding claims when executed by the processor.

In a fourth aspect, embodiments of the present application provide a readable storage medium having stored thereon a program or instructions which, when executed by a processor, implement a device testing method as defined in any one of the preceding claims.

The device testing method provided by the embodiment of the application comprises the following steps: determining first residual power consumption of the equipment test platform, and determining first test items which are not operated in the test platform and first operation powers corresponding to the first test items respectively; determining a first operation duration corresponding to a target item to be tested with first residual power consumption, wherein the first operation power is smaller than or equal to first residual power consumption; determining a first duration when the first remaining power consumption is greater than or equal to a first operating power of the target item to be tested; determining a second operation duration less than or equal to the first duration from the first operation durations; determining a second test item and a first device to be tested corresponding to the second test item based on the second operation time length; based on the first duration, the second test item is operated on the first equipment to be tested, a first test result is obtained, the corresponding test item can be added according to the residual power consumption of the equipment test platform for testing, the power consumption utilization rate of the equipment test platform is improved, and the batch test efficiency of the equipment is further improved.

Drawings

FIG. 1 is a flow chart of steps of a device testing method according to an embodiment of the present application;

FIG. 2 is a flow chart of steps of another device testing method provided by an embodiment of the present application;

FIG. 3 is a flowchart of a specific implementation of a device testing method according to an embodiment of the present application;

FIG. 4 is a logic block diagram of a device testing apparatus provided by an embodiment of the present application;

fig. 5 is a schematic structural diagram of an electronic device according to an embodiment of the present application.

Detailed Description

The technical solutions of the embodiments of the present application will be clearly described below with reference to the drawings in the embodiments of the present application, and it is apparent that the described embodiments are some embodiments of the present application, but not all embodiments. All other embodiments, which are obtained by a person skilled in the art based on the embodiments of the present application, fall within the scope of protection of the present application.

The terms first, second and the like in the description and in the claims, are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used may be interchanged, as appropriate, such that embodiments of the present application may be implemented in sequences other than those illustrated or described herein, and that the objects identified by "first," "second," etc. are generally of a type, and are not limited to the number of objects, such as the first object may be one or more. Furthermore, in the description and claims, "and/or" means at least one of the connected objects, and the character "/", generally means that the associated object is an "or" relationship.

The device testing method provided by the embodiment of the application is described in detail below through specific embodiments and application scenes thereof with reference to the accompanying drawings.

Referring to fig. 1, fig. 1 shows a step flowchart of a device testing method according to an embodiment of the present application, where the method specifically may include the following steps:

Step 101, determining first residual power consumption of a device testing platform, and determining first non-running test items corresponding to devices to be tested in the device testing platform and first running powers corresponding to the first test items respectively.

In the embodiment of the application, the device test platform can be connected with a plurality of hardware devices and is electrified for testing, the hardware devices comprise, but are not limited to, server devices, integrated devices, electronic components, automatic instruments and meters and the like, the device test platform can have upper limit output power consumption, and the actual output power consumption can be smaller than or equal to the upper limit output power consumption. The equipment test platform can be connected with a plurality of test equipment, and a part of the test equipment can be started to carry out a complete standardized test flow, wherein the standardized test flow is that all test items corresponding to the test equipment are tested according to a preset rule, and each test item has corresponding running power. When the part of the test equipment performs the standardized test flow, the actual operating power of the part of the test equipment can be smaller than the upper limit output power consumption of the equipment test platform, so that the first power consumption of the equipment test platform can be determined according to the actual operating power of the running test equipment and the upper limit output power consumption of the equipment test platform. The equipment test platform is also provided with a part of equipment to be tested, the part of equipment is in a standby state, and a first test item which is not operated by the equipment to be tested can be determined according to the test item and the test record corresponding to the equipment to be tested, so that the first operation power corresponding to each first test item can be determined according to the test content of the first test item.

For example, 100 test devices are connected to the device test platform, the numbers are 1 to 100, and the test devices from the number 1 to the number 60 are running, so that the test devices from the number 61 to the number 100 are the devices to be tested. The test equipment numbered 61 through 100 may have the same first test item that is not run. If the upper limit output power consumption of the equipment testing platform is 10KW, and the maximum operation power of each testing equipment is 166W, the minimum value of the first residual power consumption of the equipment testing platform is 40W; if the running power of the test equipment is 150W at a certain moment, the first residual power consumption of the equipment test platform is 1KW.

Step 102, determining a first operation duration corresponding to the target item to be tested with the first operation power smaller than or equal to the first residual power consumption.

In the embodiment of the application, the test items of the hardware equipment can have fixed operation time lengths, and different test items can have different operation time lengths, namely, the test items and the test time lengths can be in one-to-one correspondence. Because each first test item has the first operation power corresponding to the first test item, the first residual power consumption of the equipment test platform can be compared with each first operation power, and then the target item to be tested with the first operation power smaller than or equal to the first residual power consumption can be found out, so that the first operation duration of the target item to be tested can be determined.

For example, if the first operation power has two types of 500W and 700W, the first residual power consumption of the device testing platform is 600W, it may be determined that the item to be tested with the first operation power of 500W is the target item to be tested; if there are two target to-be-tested items, and the operation time lengths are 1h and 2h respectively, the first operation time length may include two time lengths of 1h and 2 h.

Step 103, determining a first duration when the first remaining power consumption is greater than or equal to a first operating power of the target item to be tested.

In the embodiment of the present application, as the test flow advances continuously, the first remaining power consumption of the device test platform changes with time, so when the first remaining power consumption is greater than or equal to the first running power of the target item to be tested, the first duration of the above situation may be determined, specifically, the first remaining power consumption may be greater than or equal to the first running power, the timing may be performed from the starting time when the first remaining power consumption is greater than or equal to the first running power, the timing may be completed from the starting time when the first remaining power consumption closest to the starting time and located after the starting time is less than the first running power, and the duration between the two times is the first duration when the first remaining power consumption is greater than or equal to the first running power.

Step 104, determining a second operation duration less than or equal to the first operation duration from the first operation duration.

In the embodiment of the application, for a test item, to obtain the test result of the test item, the test item needs to be completely executed, that is, the actual test time length of the test item needs to be ensured to be greater than or equal to the preset operation time length of the test item. Thus, the first operation time period may be compared with the first duration time period, so that a second operation time period that is less than or equal to the first duration time period may be determined.

Along the above example, if the first duration is 1.5h, then 1h may be determined to be the second operating duration.

Step 105, determining a second test item and a first device to be tested corresponding to the second test item based on the second operation time length.

In the embodiment of the application, after determining the second operation time length smaller than or equal to the first operation time length, a second test item corresponding to the second operation time length can be determined, and further, a first device to be tested corresponding to the second test item can be determined from the devices to be tested. The first device to be tested is selected according to the number of the first device to be tested, and the second device to be tested with the smallest number in the second device to be tested is selected according to the number of the first device to be tested.

Along with the above example, if the second operation duration is 1h, it may be determined that the operation power corresponding to the second operation duration is 500W, and further it may be determined that the item to be tested with the operation power being 500W and the operation duration being 1h is the second test item. After the second test item is determined, a device to be tested which does not execute the test item can be randomly selected to run the second test item for testing.

And step 106, operating the second test item on the first equipment to be tested based on the first duration to obtain a first test result.

In the embodiment of the application, after the first equipment to be tested and the second test item are determined, the second test item can be operated on the first equipment to be tested in the time period corresponding to the first duration, so that the first test result of the second test item can be obtained when the execution of the second test item is finished. The relative position of the run time length corresponding to the second test item in the first duration may be randomly determined.

For example, for testing an electronic component, the second test item may be that the electronic component is operated for one hour at the maximum output power, if the electronic component is operated for one hour at the maximum output power, the electronic component is not damaged, and the temperature of the electronic component rises within the theoretical range, the first test result of the electronic component may be that the test is passed; if the electronic component is damaged or the temperature of the electronic component rises above the theoretical range, the first test result may be that the test fails.

In the embodiment of the application, a first test item which is not operated in the test platform and a first operation power corresponding to the first test item are determined by determining the first residual power consumption of the equipment test platform; determining a first operation duration corresponding to a target item to be tested with first residual power consumption, wherein the first operation power is smaller than or equal to first residual power consumption; determining a first duration when the first remaining power consumption is greater than or equal to a first operating power of the target item to be tested; determining a second operation duration less than or equal to the first duration from the first operation durations; determining a second test item and a first device to be tested corresponding to the second test item based on the second operation time length; based on the first duration, the second test item is operated on the first equipment to be tested, a first test result is obtained, the corresponding test item can be added according to the residual power consumption of the equipment test platform for testing, the power consumption utilization rate of the equipment test platform is improved, and the batch test efficiency of the equipment is further improved.

Referring to fig. 2, fig. 2 is a flowchart illustrating steps of another device testing method according to an embodiment of the present application, where the method specifically includes the following steps:

Step 201, determining a first residual power consumption of a device test platform, and determining a first non-running test item corresponding to a device to be tested in the device test platform and a first running power corresponding to the first test item respectively.

In the embodiment of the present application, the implementation content of this step may refer to the implementation content of step 101, which is not described herein.

Optionally, in step 201, the following sub-steps may be included:

in sub-step 2011, a test status code corresponding to the running first device in the device test platform is determined.

In an embodiment of the present application, 0 and 1 may be used to indicate whether a test item is executing, 0 indicating that the test item is not executing or is executing, and 1 indicating that the test item is executing. Thus, for a test item queue, consecutive 0 s and 1s may be used to represent execution progress of the test item queue, and consecutive 0 s and 1s may form a test status code. After the sixth test item and the first test item queue are obtained, the position of the sixth test item in the first test item queue can be obtained based on the sixth test item and the first test item queue, and then the test state code of the first device corresponding to the sixth test item can be obtained according to the position.

For example, if the test device has five test items, a1, a2, a3, a4, a5, and the test queue thereof is a1a2a3a4a5, if the test device is running a3, the test status code of the test device is 00100; if the test equipment is running a4, the test status code of the test equipment is 00010.

A substep 2012 determines a first device operating power of the first device based on the test status code.

In the embodiment of the application, each test item can correspond to one test power, so that the test power corresponding to the test item in operation of the first device can be obtained according to the test state code of the first device, and further the first device operation power of the first device can be obtained according to the test power corresponding to the test item in operation.

Along the above example, if the test power of a1 is x1, the test power of a2 is x2, the test power of a3 is x3, the test power of a4 is x4, the test power corresponding to a5 is x5, if the test status code of the test device is 00100, the device operation power of the test device is x3, and if the test status code of the test device is 00010, the device operation power of the test device is x4.

Optionally, in the substep 2012, the following substeps may be included:

and a substep A1, obtaining first test power corresponding to each test item of the first equipment.

In the embodiment of the application, the first test power corresponding to each test item of the first equipment can be obtained according to the corresponding relation between the test item and the test power.

A substep A2 of determining a first device operating power of the first device based on the first test power and the test status code.

In the embodiment of the application, the test item which is being executed by the first equipment can be determined according to the test state code and the standardized test flow corresponding to the first equipment, and further, the first test power corresponding to the test item can be determined, so that the first equipment operation power of the first equipment can be determined according to the first test power.

In the embodiment of the application, the first equipment operation power of the first equipment is determined based on the first test power and the test state code by acquiring the first test power respectively corresponding to each test item of the first equipment, so that the operation power of the equipment can be determined according to the test power and the test state code of the equipment, and the accuracy and the reliability of the equipment operation power are improved.

Substep 2013, determining a first remaining power consumption of the device test platform based on the first device operating power.

In the embodiment of the application, the first device operation power of all the running first devices in the device test platform can be obtained, and then the first device operation power can be subtracted from the upper limit output power consumption of the device test platform, so that the first residual power consumption of the device test platform can be obtained.

Along with the above example, if the upper limit output power consumption of the device test platform is a, only one test device in the device test platform is running, and the device running power of the test device is x4, the first remaining power consumption of the device test platform is (a-x 4).

In the embodiment of the application, the first equipment operation power of the first equipment is determined based on the test state code by determining the test state code corresponding to the first equipment in operation in the equipment test platform, and the first residual power consumption of the equipment test platform is determined based on the first equipment operation power, so that the residual power consumption of the equipment test platform can be determined according to the test state code of the equipment, the method for acquiring the residual power consumption is simplified, and the efficiency for acquiring the residual power consumption is improved.

Step 202, determining a first operation duration corresponding to the target item to be tested with the first operation power smaller than or equal to the first residual power consumption.

In the embodiment of the present application, the implementation content of this step may refer to the implementation content of step 102, which is not described herein.

Step 203, determining a first duration when the first remaining power consumption is greater than or equal to a first operating power of the target item to be tested.

In the embodiment of the present application, the implementation content of this step may refer to the implementation content of step 103, which is not described herein.

Optionally, in step 203, the following sub-steps may be included:

in a substep 2031, a test item queue corresponding to the running device in the device test platform is obtained.

In the embodiment of the application, the test item queue corresponding to the running equipment in the equipment test platform can be obtained. The test item queue may be a test item queue corresponding to a standardized test flow, or may be a test item queue formed by rearranging test items.

A sub-step 2032 of determining a first correspondence of remaining test power consumption of the device test platform to future time based on the test item queue.

In the embodiment of the application, after the test item queue of the running device is obtained, the corresponding relation between the actual output power of the device test platform and the future time can be determined according to the test power of each test item in the test item queue, so that the first corresponding relation between the residual test power consumption of the device test platform and the future time can be determined according to the upper limit output power of the device test platform and the corresponding relation between the actual output power of the device test platform and the future time.

Sub-step 2033, determining, based on the first correspondence, a first duration when the first remaining power consumption is greater than or equal to a first operating power of the target item to be tested.

In the embodiment of the application, the first correspondence relationship designates a change relationship of the remaining test power consumption of the device test platform with the future time, and therefore, it may be determined that the first remaining power consumption is greater than or equal to the first duration of the first operation power. If the function images are used to represent the first corresponding relation and the first running power, the first duration is a time period corresponding to the function images when the two function images intersect and the first residual power consumption is greater than the first running power.

In the embodiment of the application, the first corresponding relation between the residual test power consumption of the equipment test platform and the future time is determined based on the test item queue by acquiring the test item queue corresponding to the running equipment in the equipment test platform, and the first duration when the first residual power consumption is greater than or equal to the first running power of the target to-be-tested item is determined based on the first corresponding relation, so that the first duration of the target to-be-tested item and the conforming condition can be determined according to the corresponding relation between the residual test power consumption of the equipment test platform and the time, and the accuracy of the first duration is improved.

Step 204, determining a second operation duration less than or equal to the first operation duration from the first operation duration.

In the embodiment of the present application, the implementation content of this step may refer to the implementation content of step 104, which is not described herein.

Step 205, determining a second test item and a first device to be tested corresponding to the second test item based on the second operation duration.

In the embodiment of the present application, the implementation content of this step may refer to the implementation content of step 105, which is not described herein.

And step 206, updating the first residual power consumption based on the test power corresponding to the third test item under the condition that the third test item in the equipment test platform is tested, and obtaining the updated first residual power consumption.

In the embodiment of the application, if the third test item is tested in the device test platform, the current first residual power consumption can be added to the test power corresponding to the third test item to obtain the updated first residual power consumption.

Step 207, updating the first residual power consumption based on the test power corresponding to the fourth test item under the condition that the device test platform newly adds the fourth test item, to obtain the updated first residual power consumption.

In the embodiment of the application, if the fourth test item is newly added in the device test platform, the test power corresponding to the fourth test item can be subtracted from the first residual power consumption to obtain the updated first residual power consumption.

In the embodiment of the application, under the condition that the third test item in the equipment test platform is tested, the first residual power consumption is updated based on the test power corresponding to the third test item to obtain updated first residual power consumption, under the condition that the equipment test platform is newly added with the fourth test item, the first residual power consumption is updated based on the test power corresponding to the fourth test item to obtain updated first residual power consumption, and the first residual power consumption can be updated when the equipment test platform has the newly added test item or the test item is finished, so that the availability of the first residual power consumption and the safety of the equipment test platform are improved.

Step 208, subtracting the operation duration corresponding to the fifth test item from the first duration to obtain an updated first duration under the condition that the equipment test platform newly adds the fifth test item.

In the embodiment of the present application, if a fifth test item is newly added to the device test platform, the running duration corresponding to the fifth test item may be subtracted from the first duration to obtain an updated first duration.

In the embodiment of the application, under the condition that the equipment test platform newly adds the fifth test item, the running time corresponding to the fifth test item is subtracted from the first duration to obtain the updated first duration, so that the first duration can be updated when the equipment test platform newly adds the test item, and the accuracy of the first duration is improved.

Step 209, obtaining the test condition of the second test item and the test duration corresponding to the test condition.

In the embodiment of the application, in the hardware device test, the content of the test item may generally include the test condition and the test duration corresponding to the test condition. The test condition may be a condition of the hardware device when the hardware device is tested, for example, for some server devices, the parallel data processing capability is usually tested by giving the corresponding original data stream the maximum data processing capability. The test duration may be a duration of the test condition. After the second test item is determined, test content of the second test item including test conditions and test duration corresponding to the test conditions may be obtained.

And step 210, testing the first device to be tested based on the test conditions and the test duration to obtain a first test result.

In the embodiment of the application, after the test condition and the test duration of the second test item are obtained, the first equipment to be tested can be adjusted to the corresponding state according to the test condition, the first equipment to be tested is operated according to the test duration, and the first test result of the first test item can be obtained when the operation duration of the first equipment to be tested is equal to the test duration.

In the embodiment of the application, the first equipment to be tested is tested based on the test condition and the test time length by acquiring the test condition of the second test item and the test time length corresponding to the test condition, so that the first test result is obtained, the equipment to be tested can be tested according to the test condition and the test time length of the test item, and the usability of equipment test is improved.

In an embodiment of the present application, there may be another device testing method including the steps of: the method comprises the steps of firstly determining the maximum operation power of the test equipment when the standardized test flow is executed, then determining the number of the test equipment for simultaneously executing the standardized test flow in the equipment test platform according to the upper limit output power of the equipment test platform and the maximum operation power of the test equipment, then determining the second corresponding relation between the residual power consumption of the equipment test platform and the time according to the first corresponding relation between the operation power of the test equipment and the time when the standardized test flow is executed, then determining the test items which can be inserted and tested according to the third corresponding relation between each test item of the test equipment and the test time and the second corresponding relation, finally determining the corresponding test equipment according to the test items which are inserted and tested, and starting the corresponding test. The method can improve the utilization rate of the equipment test platform while ensuring the maximization of the number of the test equipment for executing the standardized test flow.

Referring to fig. 3, fig. 3 is a flowchart of a specific implementation of a device testing method according to an embodiment of the present application. In the figure, a test power reference data maintenance database table of each test device can be established in advance, and then a server production test power record database table is established. The test power reference data maintenance database table is generated in real time according to actual test conditions when the equipment is tested, and can correspond to a standardized test flow. Then, the test items to be tested at this time, namely, the test items which can be added in the equipment test platform, can be calculated and determined by referring to the two database tables. The operation state of the equipment test platform can be monitored after the test items are added, including the actual output power, the test conditions of the test items, the operation conditions of the equipment and the like. And finally, updating the reference data of the test power, wherein the updating method can be to replace the reference data with the actual test power if the actual test power is larger than the calculated reference data, or not to replace the reference data.

Referring to fig. 4, fig. 4 is a logic block diagram of a device testing apparatus provided in an embodiment of the present application, and the device testing apparatus 400 includes:

A first determining module 401, configured to determine a first remaining power consumption of an equipment testing platform, determine a first test item corresponding to an equipment to be tested in the equipment testing platform that is not running and a first running power corresponding to the first test item respectively;

a second determining module 402, configured to determine a first operation duration corresponding to the target item to be tested with the first operation power being less than or equal to the first remaining power consumption;

a third determining module 403, configured to determine a first duration when the first remaining power consumption is greater than or equal to a first operating power of the target to-be-tested item;

a fourth determining module 404, configured to determine a second operation duration that is less than or equal to the first operation duration from the first operation durations;

A fifth determining module 405, configured to determine a second test item and a first device to be tested corresponding to the second test item based on the second operation duration;

And the testing module 406 is configured to run the second test item on the first device to be tested based on the first duration, so as to obtain a first test result.

Optionally, the apparatus 400 further includes:

Optionally, the second determining module 402 includes:

Optionally, the first determining module 401 includes:

Optionally, the fifth determining submodule includes:

Optionally, the test module 406 includes:

In summary, an embodiment of the present application provides an apparatus testing device, including: the first determining module is used for determining first residual power consumption of the equipment testing platform, and determining first non-running test items corresponding to equipment to be tested in the equipment testing platform and first running power corresponding to the first test items respectively; the second determining module is used for determining a first operation duration corresponding to a target item to be tested with first residual power consumption, wherein the first operation power is smaller than or equal to the first residual power consumption; a third determining module, configured to determine a first duration when the first remaining power consumption is greater than or equal to a first operating power of the target item to be tested; a fourth determining module, configured to determine a second operation duration that is less than or equal to the first duration from the first operation durations; a fifth determining module, configured to determine a second test item and a first device to be tested corresponding to the second test item based on the second operation duration; the testing module is used for running a second testing item on the first equipment to be tested based on the first duration to obtain a first testing result, and the corresponding testing item can be added for testing according to the residual power consumption of the equipment testing platform, so that the power consumption utilization rate of the equipment testing platform is improved, and the batch testing efficiency of the equipment is further improved.

The device testing apparatus in the embodiment of the application may be an electronic device, or may be a component in an electronic device, for example, an integrated circuit or a chip. The electronic device may be a terminal, or may be other devices than a terminal. The electronic device may be a GPU BOX, a Mobile phone, a tablet computer, a notebook computer, a palm computer, a vehicle-mounted electronic device, a Mobile internet appliance (Mobile INTERNET DEVICE, MID), an augmented reality (augmented reality, AR)/Virtual Reality (VR) device, a robot, a wearable device, an ultra-Mobile personal computer (UMPC), a netbook or a Personal Digital Assistant (PDA), etc., and may also be a server, a network attached storage (Network Attached Storage, NAS), a personal computer (personal computer, PC), a Television (TV), a teller machine, a self-service machine, etc., which are not limited in the embodiments of the present application.

The device testing apparatus in the embodiment of the present application may be an apparatus having an operating system. The operating system may be an Android operating system, a Linux, windows operating system or the like, or may be other possible operating systems, and the embodiment of the present application is not limited specifically.

The device testing apparatus provided in the embodiment of the present application can implement each process implemented by the embodiments of the methods of fig. 1 to 3, and in order to avoid repetition, a description is omitted here.

Optionally, as shown in fig. 5, the embodiment of the present application further provides an electronic device M00, which includes a processor M01 and a memory M02, where a program or an instruction that can be executed on the processor M01 is stored in the memory M02, and the program or the instruction when executed by the processor M01 implements each step of the above embodiment of the device testing method, and can achieve the same technical effect, so that repetition is avoided and no further description is given here.

The electronic device in the embodiment of the application includes the mobile electronic device and the non-mobile electronic device.

The embodiment of the application also provides a readable storage medium, on which a program or an instruction is stored, which when executed by a processor, implements each process of the above-mentioned device testing method embodiment, and can achieve the same technical effects, and in order to avoid repetition, the description is omitted here.

Wherein the processor is a processor in the electronic device described in the above embodiment. The readable storage medium includes computer readable storage medium such as computer readable memory ROM, random access memory RAM, magnetic or optical disk, etc.

The embodiment of the application further provides a chip, which comprises a processor and a communication interface, wherein the communication interface is coupled with the processor, and the processor is used for running programs or instructions to realize the processes of the device testing method embodiment, and the same technical effects can be achieved, so that repetition is avoided, and the description is omitted here.

It should be understood that the chips referred to in the embodiments of the present application may also be referred to as system-on-chip chips, chip systems, or system-on-chip chips, etc.

Embodiments of the present application provide a computer program product stored in a storage medium, where the program product is executed by at least one processor to implement the respective processes of the above-described device testing method embodiments, and achieve the same technical effects, and for avoiding repetition, a detailed description is omitted herein.

It should be noted that, in this document, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element. Furthermore, it should be noted that the scope of the methods and apparatus in the embodiments of the present application is not limited to performing the functions in the order shown or discussed, but may also include performing the functions in a substantially simultaneous manner or in an opposite order depending on the functions involved, e.g., the described methods may be performed in an order different from that described, and various steps may be added, omitted, or combined. Additionally, features described with reference to certain examples may be combined in other examples.

From the above description of the embodiments, it will be clear to those skilled in the art that the above-described embodiment method may be implemented by means of software plus a necessary general hardware platform, but of course may also be implemented by means of hardware, but in many cases the former is a preferred embodiment. Based on such understanding, the technical solution of the present application may be embodied essentially or in a part contributing to the related art in the form of a computer software product stored in a storage medium (such as ROM/RAM, magnetic disk, optical disk), including several instructions for causing a terminal (which may be a mobile phone, a computer, a server, or a network device, etc.) to perform the method according to the embodiments of the present application.

The embodiments of the present application have been described above with reference to the accompanying drawings, but the present application is not limited to the above-described embodiments, which are merely illustrative and not restrictive, and many forms may be made by those having ordinary skill in the art without departing from the spirit of the present application and the scope of the claims, which are to be protected by the present application.

Claims

1. A method of device testing, the method comprising:

2. The method according to claim 1, wherein the method further comprises:

3. The method according to claim 1, wherein the method further comprises:

4. The method of claim 1, wherein the determining the first duration when the first remaining power consumption is greater than or equal to a first operating power of the target item to be tested comprises:

5. The method of claim 1, wherein determining the first remaining power consumption of the device test platform comprises:

6. The method of claim 5, wherein the determining the first device operating power of the first device based on the test status code comprises:

7. The method of claim 1, wherein the running the first test item on the first device under test comprises:

8. A device testing apparatus, the apparatus comprising:

9. An electronic device comprising a processor and a memory storing a program or instructions executable on the processor, which when executed by the processor, implements the device testing method of any of claims 1 to 7.

10. A readable storage medium, characterized in that the readable storage medium has stored thereon a program or instructions which, when executed by a processor, implement the device testing method of any one of claims 1 to 7.