CN117932322A - Flour equipment fault diagnosis method and system - Google Patents
Flour equipment fault diagnosis method and system Download PDFInfo
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- 238000003745 diagnosis Methods 0.000 title claims abstract description 64
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- 238000012706 support-vector machine Methods 0.000 claims description 15
- 230000006870 function Effects 0.000 claims description 12
- 230000003068 static effect Effects 0.000 claims description 12
- 238000004140 cleaning Methods 0.000 claims description 11
- 239000000428 dust Substances 0.000 claims description 9
- 238000011161 development Methods 0.000 claims description 7
- 238000012300 Sequence Analysis Methods 0.000 claims description 6
- 230000005856 abnormality Effects 0.000 claims description 6
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- 238000000605 extraction Methods 0.000 claims description 6
- 238000000556 factor analysis Methods 0.000 claims description 6
- 238000010606 normalization Methods 0.000 claims description 6
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Abstract
The invention relates to the technical field of flour equipment, in particular to a flour equipment fault diagnosis method and system, which comprises the following steps: s1, collecting comprehensive environment and equipment operation data: collecting data related to the flour processing environment and the operation of the equipment in real time by using various sensors; s2, data preprocessing and anomaly detection: identifying an abnormal signal in the data; s3, device interaction analysis: identifying a device interaction pattern that results in a fault signal; s4, comprehensively analyzing the fault mode and the environmental factors: analyzing the fault cause; s5, fault diagnosis and prediction: diagnosing the current fault and predicting the future fault of the equipment; s6, feeding back and optimizing maintenance effects: and feeding back the maintained equipment performance data. The invention can effectively identify and solve the faults caused by the interaction among the equipment and the composite action of environmental factors, and remarkably improve the operation efficiency and stability of flour processing equipment.
Description
Technical Field
The invention relates to the technical field of flour equipment, in particular to a flour equipment fault diagnosis method and system.
Background
In the flour processing industry, timely diagnosis and prevention of equipment faults plays a vital role in guaranteeing production efficiency and product quality, traditional fault diagnosis methods often depend on experience of equipment operators or simple sensor monitoring, and when complex equipment interaction and changeable environmental factors are processed, the methods often look out of mind, and especially on modern flour processing production lines, the interdependence among equipment and the influence of environmental factors such as temperature and humidity, dust and the like on equipment performance make fault diagnosis a complex and changeable challenge.
With the development of information technology and automation technology, although it is easier to collect operation data of devices, how to accurately extract information related to faults from massive data, identify fault modes, predict future potential faults, and evaluate influence of environmental factors is still a problem to be solved urgently, and in addition, complex interactions between devices often cause rapid propagation of faults, which brings additional difficulty to accurate diagnosis and timely response.
Disclosure of Invention
Based on the above purpose, the invention provides a flour equipment fault diagnosis method and system.
A flour machine fault diagnosis method comprising the steps of:
s1, collecting comprehensive environment and equipment operation data: collecting data related to the flour processing environment and the operation of the equipment in real time by using various sensors;
s2, data preprocessing and anomaly detection: cleaning and preprocessing the collected data by a data processing technology, and identifying abnormal signals in the data;
s3, device interaction analysis: analyzing interaction and dependency relationship among devices, and identifying a device interaction mode causing a fault signal;
s4, comprehensively analyzing the fault mode and the environmental factors: using a dynamic PCA algorithm, comprehensively considering the influences of a fault mode, equipment interaction and environmental factors, and analyzing fault reasons;
S5, fault diagnosis and prediction: based on the comprehensive analysis result, diagnosing the current fault and predicting the future fault of the equipment;
S6, feeding back and optimizing maintenance effects: and feeding back the maintained equipment performance data, and optimizing the accuracy of fault diagnosis.
Further, the plurality of sensors specifically includes:
temperature sensor: the method is used for monitoring the temperatures of equipment and a processing environment and identifying overheat or temperature abnormality;
Humidity sensor: the device is used for monitoring the humidity level of the processing environment and preventing the quality of flour and the normal operation of equipment from being influenced by the excessively high or excessively low humidity;
vibration sensor: the method is used for monitoring the vibration frequency and amplitude of equipment and identifying abnormal operation states of the equipment, including unbalance, dislocation or bearing faults;
a current sensor: the method comprises the steps of monitoring the current use condition of equipment and identifying an electrical fault or equipment overload condition;
Dust particle size and concentration sensor: monitoring the granularity and concentration of dust in the air aiming at the flour processing environment, and evaluating the air quality and the equipment blockage risk;
a sound sensor: the method is used for capturing sounds generated during the running of the device and identifying the abnormal state of the device.
Further, the data preprocessing and anomaly detection in S2 includes:
s21, data cleaning: cleaning the collected data, including removing invalid data, correcting erroneous data points and filling missing values;
S22, data standardization: carrying out standardization treatment on the cleaned data, wherein the standardization treatment comprises normalization, standard deviation standardization or minimum-maximum scaling;
s23, feature extraction: extracting features from the normalized data;
s24, abnormal signal identification: performing anomaly detection on the extracted features based on a preset threshold;
S25, recording and reporting abnormal events: recording the identified abnormal signals, and generating an abnormal event report including the time, the position, the intensity and the fault type of the abnormality.
Further, the device interaction analysis in S3 includes:
S31, constructing a device interaction graph model (DIG): constructing an equipment interaction graph model, wherein nodes represent flour processing equipment, edges represent interaction among the equipment, and each edge is endowed with a dynamic dependency index To quantify the degree of interaction between devices;
S32, calculating dynamic dependency index : For each pair of devices/>, in the modelAnd/>Calculating the time/>, by combining the static priority index and the dynamic performance influence indexTime of day device/>For devices/>Dynamic dependence index/>The calculation formula is as follows:
；
wherein, Is a static priority index,/>Is a dynamic performance impact index,/>Is an adjustment parameter;
S33, identifying a fault propagation path: based on calculated A value, identifying a fault propagation path by adopting a Dijkstra algorithm;
S34, analyzing the interaction mode of the equipment: comprehensively consider equipment to equipment Values and fault propagation paths, and specific device interaction patterns that result in fault signals are analyzed.
Further, the dynamic performance impact indexIs based on equipment/>Parameter/>And device/>Parameter/>The correlation coefficient and covariance of the inter-correlation operation parameters are calculated according to the following formula:
；
wherein, Representing device/>Parameter/>And device/>Parameter/>At time/>Related coefficient of/>Representation/>And/>At time/>For quantifying trend dependency between two parameters.
Further, the Dijkstra algorithm is used for searching the shortest path, for flour equipment fault diagnosis, the dependency relationship and the fault influence between the equipment are dynamically changed, and by introducing a time and state dependent weight adjustment mechanism, the Dijkstra algorithm reflects the dynamics and each side is dynamically reflected/>The value is dynamically adjusted, and the equipment state and the fault propagation probability are considered, wherein the calculation formula is as follows:
；
Wherein, Expressed in time/>And state/>Under the following, consider the dynamic/>, after the equipment state and the fault propagation probabilityValue/>Is the original DDI value calculated based on static and dynamic factors,/>Is shown in the stateSlave device/>To device/>Probability of failure propagation,/>Representing device/>For devices/>Is the influence delay of the fault slave/>Propagation to/>Time difference required,/>And/>Is a tuning parameter for balancing the fault propagation probability and the impact of impact delay in dynamic DDI values.
Further, the comprehensive analysis of the fault mode and the environmental factor in S4 includes:
S41, extracting data features: extracting data features by using a dynamic PCA algorithm to identify variables related to faults;
S42, fault mode identification: matching the extracted data characteristics with known fault modes, and identifying the fault type corresponding to the current equipment state;
S43, environmental factor analysis: the effect of the environmental data changes on the identified failure modes and device interactions is analyzed to determine the effect of environmental factors in the failure development.
Further, the dynamic PCA algorithm includes:
Data normalization: for devices In the time window/>Internal operation data/>And (3) carrying out standardization processing, wherein the calculation formula is as follows:
；
wherein, And/>Respectively the mean value and standard deviation of the data in the time window;
The nuclear method is transformed: mapping the standardized data to a high-dimensional space through a kernel method, wherein the calculation formula is as follows:
；
wherein, Is a Gaussian kernel function,/>Is the bandwidth parameter of the kernel function;
extracting main components: PCA is applied in a high-dimensional space, eigenvalues and eigenvectors of a covariance matrix are calculated, and the largest eigenvalue and eigenvector are selected The feature vectors corresponding to the feature values are used as main components, and the calculation formula is as follows:
；
select the largest/> And feature vectors corresponding to the feature values.
Further, the diagnosing and predicting of the fault in S5 includes:
s51, comprehensive analysis result evaluation: based on the data characteristics extracted by the dynamic PCA algorithm, the results of equipment interaction analysis, environmental factor evaluation and fault mode identification, a comprehensive analysis framework is constructed, and the comprehensive analysis framework provides comprehensive understanding of the current fault state, including the type, cause and affected equipment components of the fault;
s52, current fault diagnosis: the information in the comprehensive analysis framework is utilized, a support vector machine SVM is applied to accurately diagnose the current fault, and the calculation formula is as follows:
；
wherein, Representing a kernel function for handling nonlinear classification problems in SVM,/>And/>Is a model parameter;
S53, predicting the future faults of the equipment: based on the current fault diagnosis result and past fault history and trend analysis, a time sequence analysis prediction model is used for predicting the fault type and time point of the future occurrence of the equipment, and the model is expressed as:
；
wherein, Is a future failure index,/>Is a model parameter,/>Is the current fault index,/>Is an error term.
A flour equipment fault diagnosis system for realizing the flour equipment fault diagnosis method, which comprises the following modules:
And a data collection module: providing a plurality of sensors for monitoring and collecting data related to the flour processing environment and the operation of the equipment in real time;
The data preprocessing and anomaly detection module: the method has the advantages that the functions of data cleaning, standardization and feature extraction are realized, so that collected data are processed and optimized, the accuracy and the integrity of the data are ensured, the extracted features are subjected to anomaly detection, anomaly signals indicating equipment faults in the data are identified, anomaly events are recorded and reported, real-time fault early warning is provided, and quick decision and response are supported;
and the equipment interaction analysis module is used for: construction of a device interaction graph model (DIG) by calculation of a dynamic dependency index Analyzing interaction and dependency relationship among devices, identifying a fault propagation path by adopting Dijkstra algorithm, and revealing a device interaction mode causing a fault signal;
failure mode and environmental factor analysis module: comprehensively considering the influences of a fault mode, equipment interaction and environmental factors by using a dynamic PCA algorithm, analyzing data characteristics, analyzing fault reasons, analyzing the relation between environmental data change and the fault mode, and determining the effect of the environmental factors in fault development;
Fault diagnosis and prediction module: based on comprehensive analysis results, accurately diagnosing the current fault by using a Support Vector Machine (SVM), providing detailed information of fault type, influence degree and maintenance priority, applying a time sequence analysis prediction model, and based on fault history and trend analysis, predicting the future potential fault of the equipment and formulating a preventive maintenance strategy;
and a maintenance effect feedback and optimization module: and collecting the maintained equipment performance data, and feeding back and optimizing the fault diagnosis and prediction model.
The invention has the beneficial effects that:
According to the invention, through comprehensive environment and equipment operation data collection and combination of a dynamic PCA algorithm, the influence of a fault mode, equipment interaction and environmental factors can be comprehensively considered, so that the accuracy of fault diagnosis is improved, the root cause behind the fault including hidden problems possibly caused by complex interaction of equipment and specific environmental conditions can be revealed, and the method can effectively identify and solve the fault caused by complex interaction among equipment and complex interaction of environmental factors, thereby remarkably improving the operation efficiency and stability of flour processing equipment.
According to the invention, through the fault diagnosis method, not only the current equipment fault can be accurately diagnosed, but also the future potential fault of the equipment can be predicted based on the comprehensive analysis result, and the prediction capability enables a maintenance team to take preventive measures in advance to avoid or reduce the influence caused by the potential fault.
The invention provides powerful support for maintenance and operation management of flour processing equipment through accurate fault diagnosis and effective future fault prediction, which is not only helpful for reducing maintenance cost and production loss caused by faults, but also can significantly improve the stability and production efficiency of a production line, particularly in complex production environments, the influence of environmental factors such as dust and the like on the equipment performance is effectively monitored and managed, the continuity of the production process and the consistency of the product quality are ensured, and obvious economic benefit and social benefit are brought to the flour processing industry.
Drawings
In order to more clearly illustrate the invention or the technical solutions of the prior art, the drawings which are used in the description of the embodiments or the prior art will be briefly described, it being obvious that the drawings in the description below are only of the invention and that other drawings can be obtained from them without inventive effort for a person skilled in the art.
FIG. 1 is a schematic flow chart of a diagnostic method according to an embodiment of the invention;
fig. 2 is a schematic diagram of a system functional module according to an embodiment of the present invention.
Detailed Description
The present invention will be further described in detail with reference to specific embodiments in order to make the objects, technical solutions and advantages of the present invention more apparent.
It is to be noted that unless otherwise defined, technical or scientific terms used herein should be taken in a general sense as understood by one of ordinary skill in the art to which the present invention belongs. The terms "first," "second," and the like, as used herein, do not denote any order, quantity, or importance, but rather are used to distinguish one element from another. The word "comprising" or "comprises", and the like, means that elements or items preceding the word are included in the element or item listed after the word and equivalents thereof, but does not exclude other elements or items. The terms "connected" or "connected," and the like, are not limited to physical or mechanical connections, but may include electrical connections, whether direct or indirect. "upper", "lower", "left", "right", etc. are used merely to indicate relative positional relationships, which may also be changed when the absolute position of the object to be described is changed.
As shown in fig. 1, a flour machine failure diagnosis method includes the steps of:
s1, collecting comprehensive environment and equipment operation data: collecting data related to the flour processing environment and the operation of the equipment in real time by using various sensors;
s2, data preprocessing and anomaly detection: cleaning and preprocessing the collected data by a data processing technology, and identifying abnormal signals in the data;
S3, device interaction analysis: analyzing interactions and dependencies among devices, identifying device interaction patterns that lead to failure signals, considering how devices interact (e.g., how a failure of one device affects another device), and how these interactions affect the overall operational state of the devices;
s4, comprehensively analyzing the fault mode and the environmental factors: using a dynamic PCA algorithm, comprehensively considering the influences of a fault mode, equipment interaction and environmental factors, and analyzing fault reasons;
S5, fault diagnosis and prediction: based on the comprehensive analysis result, diagnosing the current fault and predicting the future fault of the equipment, the specific type, the influence degree and the priority of emergency maintenance of the fault can be provided, and detailed maintenance and repair suggestions are provided for maintenance teams;
s6, feeding back and optimizing maintenance effects: the maintained equipment performance data is fed back, the fault diagnosis accuracy is optimized, and the fault diagnosis system can learn and improve from each maintenance activity and adapt to the change of equipment and environmental conditions;
The fault diagnosis method not only can accurately identify and solve faults caused by complex interaction of equipment and environmental factors, but also can improve the prediction capability of potential faults in the future through continuous learning and system optimization, thereby remarkably improving the running efficiency and stability of flour equipment.
The various sensors include in particular:
temperature sensor: the method is used for monitoring the temperatures of equipment and a processing environment and identifying overheat or temperature abnormality;
Humidity sensor: the device is used for monitoring the humidity level of the processing environment and preventing the quality of flour and the normal operation of equipment from being influenced by the excessively high or excessively low humidity;
vibration sensor: the method is used for monitoring the vibration frequency and amplitude of equipment and identifying abnormal operation states of the equipment, including unbalance, dislocation or bearing faults;
a current sensor: the method comprises the steps of monitoring the current use condition of equipment and identifying an electrical fault or equipment overload condition;
Dust particle size and concentration sensor: monitoring the granularity and concentration of dust in the air aiming at the flour processing environment, and evaluating the air quality and the equipment blockage risk;
A sound sensor: for capturing sounds generated by the device during operation, identifying abnormal conditions of the device, such as wear or internal chipping;
By utilizing the sensor, the running state of flour processing equipment and the environment thereof can be monitored and collected in real time, and support is provided for fault diagnosis and preventive maintenance.
The data preprocessing and anomaly detection in S2 includes:
S21, data cleaning: the collected data is cleaned, including invalid data removal, error data point correction and missing value filling, so that accuracy and integrity of the data are ensured, and a reliable basis is provided for subsequent analysis;
S22, data standardization: the cleaned data is subjected to standardization processing, including normalization, standard deviation standardization or minimum-maximum scaling, so as to ensure that the data of different sources and different magnitudes can be compared and analyzed on the same scale;
S23, feature extraction: extracting features from the standardized data, wherein the features aim to capture important information and modes in the data, and are important for subsequent abnormality detection and fault diagnosis;
S24, abnormal signal identification: performing anomaly detection on the data based on the extracted features by a preset threshold value, and identifying anomaly signals in the data, wherein the signals possibly indicate potential faults or abnormal operation of equipment;
S25, recording and reporting abnormal events: recording the identified abnormal signals to generate an abnormal event report, wherein the report comprises abnormal time, position, strength and fault type, and the report provides real-time fault early warning for a device operation team and supports quick decision-making and response;
The method effectively processes and analyzes a large amount of data collected from equipment and the environment, can accurately identify abnormal signals in the data, provides key information for fault prediction and maintenance of flour processing equipment, specifies how to clean and preprocess the collected data through a data processing technology, identifies the abnormal signals in the data, and provides important technical support for implementation of a flour processing equipment fault diagnosis method.
The device interaction analysis in S3 includes:
S31, constructing a device interaction graph model (DIG): constructing an equipment interaction graph model, wherein nodes represent flour processing equipment, edges represent interaction among the equipment, and each edge is endowed with a dynamic dependency index To quantify the degree of interaction between devices;
S32, calculating dynamic dependency index : For each pair of devices/>, in the modelAnd/>Calculating the time/>, by combining the static priority index and the dynamic performance influence indexTime of day device/>For devices/>Dynamic dependence index/>The calculation formula is as follows:
；
wherein, Is a static priority index based on device/>And device/>Fixed process flow or design parameters between, the values of which are determined at the time of installation of the equipment, are not changed with time,/>Is a dynamic performance impact index, according to the deviceThe current running state of (1) vs. device/>Dynamic assessment of the actual impact of (i) can be calculated by monitoring the data in real time,/>Is a regulating parameter used for balancing the weight of the static priority and the dynamic performance influence, and the value range is/>；
S33, identifying a fault propagation path: based on calculatedValues, identifying fault propagation paths by using Dijkstra algorithm, wherein the propagation paths are helpful for determining which equipment interaction modes possibly cause occurrence of fault signals;
S34, analyzing the interaction mode of the equipment: comprehensively consider equipment to equipment Values and fault propagation paths, analyzing specific equipment interaction patterns leading to fault signals, which analysis reveals how the stability and efficiency of the whole production line are affected by complex interactions between the equipment;
The method is specially designed for flour processing equipment, fully considers not only static physical or technological process connection among the equipment, but also dynamic interaction influence based on the current running state of the equipment, and calculates dynamic dependency index by constructing an equipment interaction graph model (DIG) The method can accurately analyze and identify the equipment interaction mode causing the fault signal, particularly in a complex production environment, not only enhances the understanding of interaction among equipment, but also provides important data support for the prediction, diagnosis and maintenance of equipment faults, and through the deep analysis, a maintenance team can more effectively identify potential fault sources and fault propagation paths, optimize maintenance plans, reduce unexpected shutdown and improve production efficiency.
Dynamic performance impact indexIs based on equipment/>Parameter/>And device/>Parameter/>The correlation coefficient and covariance of the inter-correlation operation parameters are calculated according to the following formula:
；
wherein, Representing device/>Parameter/>And device/>Parameter/>At time/>Related coefficient of/>Representation/>And/>At time/>For quantifying trend dependency between two parameters.
Dijkstra algorithm is used for searching shortest path, for flour equipment fault diagnosis, dependency relationship and fault influence among equipment are dynamically changed, and by introducing a time and state dependent weight adjustment mechanism, the Dijkstra algorithm reflects the dynamics, and for each side/>The value is dynamically adjusted, and the equipment state and the fault propagation probability are considered, wherein the calculation formula is as follows:
；
Wherein, Expressed in time/>And state/>Under the following, consider the dynamic/>, after the equipment state and the fault propagation probabilityValue/>Is the original DDI value calculated based on static and dynamic factors,/>Is shown in the stateSlave device/>To device/>Probability of failure propagation,/>Representing device/>For devices/>Is the influence delay of the fault slave/>Propagation to/>Time difference required,/>And/>Is a tuning parameter for balancing the fault propagation probability and the impact of impact delay in dynamic DDI values;
The Dijkstra algorithm enables the fault diagnosis method of the flour processing equipment to accurately identify and predict the propagation path of faults in an equipment network, and a maintenance team can better understand the dynamic property and potential influence of the faults by considering the probability and time delay of fault propagation, so that more targeted prevention and treatment measures are adopted, which has great significance for improving the flour processing efficiency and reducing unexpected shutdown, and the invention is more effective and practical in practical application.
The comprehensive analysis of the fault mode and the environmental factors in the S4 comprises the following steps:
S41, extracting data features: extracting data features by using a dynamic PCA algorithm to identify variables related to faults;
S42, fault mode identification: matching the extracted data characteristics with known fault modes, and identifying the fault type corresponding to the current equipment state;
s43, environmental factor analysis: analyzing the influence of the environmental data change on the identified fault mode and the interaction influence of equipment, and determining the effect of environmental factors in fault development;
by means of a dynamic PCA algorithm, key changes in running data of flour processing equipment can be captured, influences of environmental factors on equipment faults can be analyzed carefully, particularly dust is a very key factor in the flour processing environment, root causes of the faults can be identified more accurately by means of integrating the data and analysis results, and basis is provided for making effective maintenance strategies and preventive measures.
The application of the method makes the fault diagnosis of flour processing equipment not only depend on simple experience judgment or static data analysis, but also provides a more scientific and comprehensive diagnosis method by dynamically analyzing complex interaction of equipment data and environmental factors. Successful implementation of the method can obviously improve the equipment stability and production efficiency of the flour processing industry, and simultaneously reduce the cost loss caused by unexpected faults.
The dynamic PCA algorithm includes:
Data normalization: for devices In the time window/>Internal operation data/>And (3) carrying out standardization processing, wherein the calculation formula is as follows:
；
wherein, And/>Respectively the mean value and standard deviation of the data in the time window;
The nuclear method is transformed: mapping the standardized data to a high-dimensional space through a kernel method, wherein the calculation formula is as follows:
；
wherein, Is a Gaussian kernel function,/>Is the bandwidth parameter of the kernel function;
extracting main components: PCA is applied in a high-dimensional space, eigenvalues and eigenvectors of a covariance matrix are calculated, and the largest eigenvalue and eigenvector are selected The feature vectors corresponding to the feature values are used as main components, and the calculation formula is as follows:
；
select the largest/> Feature vectors corresponding to the feature values;
By integrating the dynamic PCA algorithm into the flour plant fault diagnosis process, complex plant operational data can be more effectively processed and analyzed, particularly in terms of capturing nonlinear relationships and dynamic changes between plants.
The fault diagnosis and prediction in S5 includes:
s51, comprehensive analysis result evaluation: based on the data characteristics extracted by the dynamic PCA algorithm, the results of equipment interaction analysis, environmental factor evaluation and fault mode identification, a comprehensive analysis framework is constructed, and the comprehensive analysis framework provides comprehensive understanding of the current fault state, including the type, cause and affected equipment components of the fault;
s52, current fault diagnosis: the information in the comprehensive analysis framework is utilized, a support vector machine SVM is applied to accurately diagnose the current fault, and the calculation formula is as follows:
；
wherein, Representing a kernel function for handling nonlinear classification problems in SVM,/>And/>Is a model parameter;
S53, predicting the future faults of the equipment: based on the current fault diagnosis result and past fault history and trend analysis, a time sequence analysis prediction model is used for predicting the fault type and time point of the future occurrence of the equipment, and the model is expressed as:
；
wherein, Is a future failure index,/>Is a model parameter,/>Is the current fault index,/>Is an error term;
The method can effectively realize fault diagnosis and future fault prediction of flour processing equipment, comprehensively considers the operation data, environmental factors and interaction among the equipment, can diagnose the current equipment fault, and can predict the future fault trend based on the history and real-time data, thereby providing strong support for equipment maintenance and operation management, being beneficial to improving the equipment reliability, reducing the maintenance cost and finally improving the production efficiency and the product quality.
As shown in fig. 2, a flour equipment failure diagnosis system is used for implementing the flour equipment failure diagnosis method, and comprises the following modules:
And a data collection module: providing a plurality of sensors for monitoring and collecting data related to the flour processing environment and the operation of the equipment in real time;
The data preprocessing and anomaly detection module: the method has the advantages that the functions of data cleaning, standardization and feature extraction are realized, so that collected data are processed and optimized, the accuracy and the integrity of the data are ensured, the extracted features are subjected to anomaly detection, anomaly signals indicating equipment faults in the data are identified, anomaly events are recorded and reported, real-time fault early warning is provided, and quick decision and response are supported;
and the equipment interaction analysis module is used for: construction of a device interaction graph model (DIG) by calculation of a dynamic dependency index Analyzing interaction and dependency relationship among devices, identifying a fault propagation path by adopting Dijkstra algorithm, and revealing a device interaction mode causing a fault signal;
failure mode and environmental factor analysis module: comprehensively considering the influences of a fault mode, equipment interaction and environmental factors by using a dynamic PCA algorithm, analyzing data characteristics, analyzing fault reasons, specifically analyzing the relation between environmental data change and the fault mode, and determining the effect of the environmental factors in fault development;
Fault diagnosis and prediction module: based on comprehensive analysis results, accurately diagnosing the current fault by using a Support Vector Machine (SVM), providing detailed information of fault type, influence degree and maintenance priority, applying a time sequence analysis prediction model, and based on fault history and trend analysis, predicting the future potential fault of the equipment and formulating a preventive maintenance strategy;
and a maintenance effect feedback and optimization module: and collecting the maintained equipment performance data, and feeding back and optimizing the fault diagnosis and prediction model.
Those of ordinary skill in the art will appreciate that: the discussion of any of the embodiments above is merely exemplary and is not intended to suggest that the scope of the invention is limited to these examples; the technical features of the above embodiments or in the different embodiments may also be combined within the idea of the invention, the steps may be implemented in any order and there are many other variations of the different aspects of the invention as described above, which are not provided in detail for the sake of brevity.
The present invention is intended to embrace all such alternatives, modifications and variances which fall within the broad scope of the appended claims. Therefore, any omission, modification, equivalent replacement, improvement, etc. of the present invention should be included in the scope of the present invention.
Claims (10)
1. A flour machine fault diagnosis method, characterized by comprising the following steps:
s1, collecting comprehensive environment and equipment operation data: collecting data related to the flour processing environment and the operation of the equipment in real time by using various sensors;
s2, data preprocessing and anomaly detection: cleaning and preprocessing the collected data by a data processing technology, and identifying abnormal signals in the data;
s3, device interaction analysis: analyzing interaction and dependency relationship among devices, and identifying a device interaction mode causing a fault signal;
s4, comprehensively analyzing the fault mode and the environmental factors: using a dynamic PCA algorithm, comprehensively considering the influences of a fault mode, equipment interaction and environmental factors, and analyzing fault reasons;
S5, fault diagnosis and prediction: based on the comprehensive analysis result, diagnosing the current fault and predicting the future fault of the equipment;
S6, feeding back and optimizing maintenance effects: and feeding back the maintained equipment performance data, and optimizing the accuracy of fault diagnosis.
2. A flour mill malfunction diagnosis method according to claim 1, wherein said plurality of sensors comprises in particular:
temperature sensor: the method is used for monitoring the temperatures of equipment and a processing environment and identifying overheat or temperature abnormality;
Humidity sensor: the device is used for monitoring the humidity level of the processing environment and preventing the quality of flour and the normal operation of equipment from being influenced by the excessively high or excessively low humidity;
vibration sensor: the method is used for monitoring the vibration frequency and amplitude of equipment and identifying abnormal operation states of the equipment, including unbalance, dislocation or bearing faults;
a current sensor: the method comprises the steps of monitoring the current use condition of equipment and identifying an electrical fault or equipment overload condition;
Dust particle size and concentration sensor: monitoring the granularity and concentration of dust in the air aiming at the flour processing environment, and evaluating the air quality and the equipment blockage risk;
a sound sensor: the method is used for capturing sounds generated during the running of the device and identifying the abnormal state of the device.
3. A flour mill malfunction diagnosis method according to claim 2, wherein the data preprocessing and anomaly detection in S2 includes:
s21, data cleaning: cleaning the collected data, including removing invalid data, correcting erroneous data points and filling missing values;
S22, data standardization: carrying out standardization treatment on the cleaned data, wherein the standardization treatment comprises normalization, standard deviation standardization or minimum-maximum scaling;
s23, feature extraction: extracting features from the normalized data;
s24, abnormal signal identification: performing anomaly detection on the extracted features based on a preset threshold;
S25, recording and reporting abnormal events: recording the identified abnormal signals, and generating an abnormal event report including the time, the position, the intensity and the fault type of the abnormality.
4. A flour mill malfunction diagnosis method according to claim 3, wherein the equipment interaction analysis in S3 includes:
S31, constructing a device interaction graph model: constructing an equipment interaction graph model, wherein nodes represent flour processing equipment, edges represent interaction among the equipment, and each edge is endowed with a dynamic dependency index To quantify the degree of interaction between devices;
S32, calculating dynamic dependency index : For each pair of devices/>, in the modelAnd/>Calculating the time/>, by combining the static priority index and the dynamic performance influence indexTime of day device/>For devices/>Dynamic dependence index/>The calculation formula is as follows:
；
wherein, Is a static priority index,/>Is a dynamic performance impact index,/>Is an adjustment parameter;
S33, identifying a fault propagation path: based on calculated A value, identifying a fault propagation path by adopting a Dijkstra algorithm;
S34, analyzing the interaction mode of the equipment: comprehensively consider equipment to equipment Values and fault propagation paths, and specific device interaction patterns that result in fault signals are analyzed.
5. A flour mill malfunction diagnosis method according to claim 4, wherein the dynamic performance impact indexIs based on equipment/>Parameter/>And device/>Parameter/>The correlation coefficient and covariance of the inter-correlation operation parameters are calculated according to the following formula:
；
wherein, Representing device/>Parameter/>And device/>Parameter/>At time/>Is used for the correlation coefficient of (a),Representation/>And/>At time/>For quantifying trend dependency between two parameters.
6. The flour mill fault diagnosis method according to claim 5, wherein the Dijkstra algorithm is used for finding the shortest path, for flour mill fault diagnosis, dependency relationship between the equipment and fault influence are dynamically changed, and by introducing a time and state dependent weight adjustment mechanism, the Dijkstra algorithm reflects the dynamics, for each sideThe value is dynamically adjusted, and the equipment state and the fault propagation probability are considered, wherein the calculation formula is as follows:
；
Wherein, Expressed in time/>And state/>Under the following, consider the dynamic/>, after the equipment state and the fault propagation probabilityValue/>Is the original DDI value calculated based on static and dynamic factors,/>Expressed in state/>Slave device/>To device/>Probability of failure propagation,/>Representing device/>For devices/>Is the influence delay of the fault slave/>Propagation to/>Time difference required,/>And/>Is a tuning parameter for balancing the fault propagation probability and the impact of impact delay in dynamic DDI values.
7. The flour mill malfunction diagnosis method according to claim 6, wherein the comprehensive analysis of the malfunction mode and the environmental factor in S4 includes:
S41, extracting data features: extracting data features by using a dynamic PCA algorithm to identify variables related to faults;
S42, fault mode identification: matching the extracted data characteristics with known fault modes, and identifying the fault type corresponding to the current equipment state;
S43, environmental factor analysis: the effect of the environmental data changes on the identified failure modes and device interactions is analyzed to determine the effect of environmental factors in the failure development.
8. A flour machine fault diagnosis method according to claim 7, wherein the dynamic PCA algorithm comprises:
Data normalization: for devices In the time window/>Internal operation data/>And (3) carrying out standardization processing, wherein the calculation formula is as follows:
；
wherein, And/>Respectively the mean value and standard deviation of the data in the time window;
The nuclear method is transformed: mapping the standardized data to a high-dimensional space through a kernel method, wherein the calculation formula is as follows:
；
wherein, Is a Gaussian kernel function,/>Is the bandwidth parameter of the kernel function;
extracting main components: PCA is applied in a high-dimensional space, eigenvalues and eigenvectors of a covariance matrix are calculated, and the largest eigenvalue and eigenvector are selected The feature vectors corresponding to the feature values are used as main components, and the calculation formula is as follows:
；
select the largest/> And feature vectors corresponding to the feature values.
9. A flour mill malfunction diagnosis method according to claim 8, wherein the malfunction diagnosis and prediction in S5 includes:
s51, comprehensive analysis result evaluation: based on the data characteristics extracted by the dynamic PCA algorithm, the results of equipment interaction analysis, environmental factor evaluation and fault mode identification, a comprehensive analysis framework is constructed, and the comprehensive analysis framework provides comprehensive understanding of the current fault state, including the type, cause and affected equipment components of the fault;
s52, current fault diagnosis: the information in the comprehensive analysis framework is utilized, a support vector machine SVM is applied to accurately diagnose the current fault, and the calculation formula is as follows:
；
wherein, Representing a kernel function for handling nonlinear classification problems in SVM,/>And/>Is a model parameter;
S53, predicting the future faults of the equipment: based on the current fault diagnosis result and past fault history and trend analysis, a time sequence analysis prediction model is used for predicting the fault type and time point of the future occurrence of the equipment, and the model is expressed as:
；
wherein, Is a future failure index,/>Is a model parameter,/>Is the current fault index,/>Is an error term.
10. A flour mill malfunction diagnosis system for implementing a flour mill malfunction diagnosis method according to any one of claims 1 to 9, comprising the following modules:
And a data collection module: providing a plurality of sensors for monitoring and collecting data related to the flour processing environment and the operation of the equipment in real time;
The data preprocessing and anomaly detection module: the method has the advantages that the functions of data cleaning, standardization and feature extraction are realized, so that collected data are processed and optimized, the accuracy and the integrity of the data are ensured, the extracted features are subjected to anomaly detection, anomaly signals indicating equipment faults in the data are identified, anomaly events are recorded and reported, real-time fault early warning is provided, and quick decision and response are supported;
and the equipment interaction analysis module is used for: constructing a device interaction graph model by calculating dynamic dependency indexes Analyzing interaction and dependency relationship among devices, identifying a fault propagation path by adopting Dijkstra algorithm, and revealing a device interaction mode causing a fault signal;
failure mode and environmental factor analysis module: comprehensively considering the influences of a fault mode, equipment interaction and environmental factors by using a dynamic PCA algorithm, analyzing data characteristics, analyzing fault reasons, analyzing the relation between environmental data change and the fault mode, and determining the effect of the environmental factors in fault development;
Fault diagnosis and prediction module: based on comprehensive analysis results, accurately diagnosing the current fault by using a Support Vector Machine (SVM), providing detailed information of fault type, influence degree and maintenance priority, applying a time sequence analysis prediction model, and based on fault history and trend analysis, predicting the future potential fault of the equipment and formulating a preventive maintenance strategy;
and a maintenance effect feedback and optimization module: and collecting the maintained equipment performance data, and feeding back and optimizing the fault diagnosis and prediction model.
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