CN117912973A - Online characterization method and device for multi-junction solar cell - Google Patents
Online characterization method and device for multi-junction solar cell Download PDFInfo
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Abstract
The invention provides an online characterization method and device for a multi-junction solar cell, relates to the technical field of solar cells, and is capable of rapidly giving out the efficiency contribution of each sub-cell to the multi-junction cell, simple in structure, quick in test and suitable for application scenes of large-scale production. The online characterization method comprises the following steps: the method comprises the steps of obtaining first electrical information when each sub-cell of the multi-junction solar cell works by adopting at least one characteristic light corresponding to the sub-cell of the multi-junction solar cell to irradiate the multi-junction solar cell and exciting part of the sub-cells to work; based on the first electrical information of each sub-cell, characterization information of the multi-junction solar cell is generated, the characterization information comprising efficiency contributions of each sub-cell to the multi-junction solar cell.
Description
Technical Field
The invention relates to the technical field of solar cells, in particular to an online characterization method and device for a multi-junction solar cell.
Background
The single-junction battery comprises crystalline silicon and a thin film solar cell, and at present, a mature online high-speed characterization scheme is provided, so that the sorting of the battery and the tracking of the process problems on a production line can be realized. More common on-line high-speed characterization of single junction cells are e.g. PL (Photo luminescence, photoluminescence, PL for short), EL (Electro Luminescence ), IV in combination with SunsVoc (open circuit voltage at different light intensities), etc. For multi-junction cells, sorting of the cells can also be performed by a similar characterization method as single junction cells, but since a plurality of sub-cells are connected in series in a multi-junction cell, the above characterization method applied to single junction cells has difficulty in distinguishing the contribution of each sub-cell to the overall efficiency of the multi-junction cell, and also in tracking the process problem of a single sub-cell on the production line. The adjustment of the production line process depends on the deep analysis of the subcell characterization results, and thus, it is highly desirable to provide a method capable of characterizing subcell efficiency of a multi-junction solar cell on-line.
Disclosure of Invention
The invention provides an online characterization method and device for a multi-junction solar cell, which can give out the efficiency contribution of each sub-cell to the multi-junction cell, has a simple structure, is quick to test, and is suitable for application scenes of large-scale production.
A first aspect of the invention provides an on-line characterization method for a multi-junction solar cell, comprising: acquiring first electrical information of the multi-junction solar cell when each sub-cell of the multi-junction solar cell is excited independently; and generating characterization information of the multi-junction solar cell based on the first electrical information corresponding to each sub-cell, wherein the characterization information comprises efficiency contribution of each sub-cell to the multi-junction solar cell.
Optionally, the first electrical information corresponding to each subcell during operation is obtained by a direct test method or an indirect test method, wherein the multi-junction solar cell comprises n subcells, the n subcells are sequentially numbered 1 to n along the incidence direction of light, i and n are natural numbers, i is less than or equal to n, and for the ith subcell to be tested, the direct test method comprises:
Adopting characteristic light corresponding to an ith sub-cell in the multi-junction solar cell to irradiate the multi-junction solar cell so as to independently excite the ith sub-cell to work and obtain first electrical information of the multi-junction solar cell when the ith sub-cell works; the indirect test method comprises the following steps:
For the nth sub-cell at the bottommost layer, adopting characteristic light corresponding to the nth sub-cell to irradiate the multi-junction solar cell so as to excite the nth sub-cell to work, and acquiring first electrical information E n when the nth sub-cell is excited;
Illuminating the multi-junction solar cell with characteristic light corresponding to the nth sub-cell and characteristic light corresponding to the n-1 th sub-cell, obtaining first electrical information E n+(n-1) of the multi-junction solar cell when the nth sub-cell and the n-1 th sub-cell are excited simultaneously, and calculating first electrical information E n-1 of the multi-junction solar cell when the n-1 th sub-cell is excited independently according to the following formula:
En-1＝En+(n-1)-En；
Illuminating the multi-junction solar cell with characteristic light corresponding to the nth sub-cell, the n-1 th sub-cell and the n-2 th sub-cell respectively, obtaining first electrical information E n+(n-1)+(n-2) of the multi-junction solar cell when the nth, the n-1 th and the n-2 th sub-cells are excited together, and calculating first electrical information E n-2 of the multi-junction solar cell when the n-2 th sub-cell is excited alone according to the following formula:
En-2＝En+(n-1)+(n-2)-En+(n-1)；
And so on, until the first electrical information E i of the ith sub-cell to be tested when the ith sub-cell is independently excited is calculated.
Optionally, when the subcell to be tested is excited, fluorescence energy generated when the subcell to be tested is excited excites other subcells except the subcell to be tested in the multi-junction solar cell, an indirect test method is selected to test the subcell to be tested, otherwise, a direct test method is selected to test the subcell to be tested.
Optionally, if the fluorescence energy generated when the subcell to be tested is excited excites other subcells of the multi-junction solar cell except the subcell to be tested, after the first electrical information of the ith subcell is obtained by the direct test method, the method further includes:
acquiring first electrical information of the ith sub-battery through the indirect test method, and taking the first electrical information as real electrical information of the ith sub-battery which does not contain a fluorescence effect;
subtracting the real electrical information of the ith sub-cell from the first electrical information of the ith sub-cell obtained by the direct test method to obtain additional electrical information of the multi-junction solar cell due to the fluorescence effect of the ith sub-cell;
And calculating the fluorescence yield and the electrical characteristics of the ith sub-cell according to the additional electrical information.
Optionally, the online characterization method further includes: and calculating a correction value of the first electrical information of the ith sub-cell according to the fluorescence yield of each sub-cell and the relation between the additional electrical information and the fluorescence yield.
Optionally, the first electrical information includes: the open circuit voltage and current of the corresponding subcell, the second electrical information including: open circuit voltage and current of the multi-junction solar cell; the characterization information of the multi-junction solar cell further comprises a voltage-current curve fitted to each sub-cell in the solar cell.
Optionally, when the first electrical information of the sub-battery is acquired, the open-circuit voltage of the sub-battery is tested through an ammeter connected in series with a gigaohm-level resistor, so as to reduce test errors caused by reverse biasing of other sub-batteries by current, wherein the gigaohm-level resistor is not less than 1Gohm.
16. Optionally, the method for obtaining the first electrical information of each sub-battery during operation through a direct test method or an indirect test method includes:
Selecting characteristic light to irradiate the multi-junction solar cell according to a test method; calibrating the light intensity of the characteristic light until the photo-generated current density reaches the current density of the multi-junction solar cell under the standard solar spectrum; and adjusting the light intensity of the characteristic light, recording the voltages of the multi-junction solar cell under different light intensities, and fitting a voltage-current curve of the sub-cell to be tested according to the data of the light intensity and the voltage.
Optionally, the multi-junction solar cell is a two-terminal perovskite/crystalline silicon tandem cell; the wavelength of characteristic light corresponding to perovskite subcells in the perovskite/crystalline silicon stacked cell at both ends is less than 500 nm; the wavelength of the characteristic light corresponding to the crystalline silicon subcells in the perovskite/crystalline silicon tandem cell at both ends is greater than 850 nanometers.
In a second aspect, the present invention provides an on-line characterization device for a multi-junction solar cell, comprising: a first light source for providing at least one characteristic light corresponding to a subcell of the multi-junction solar cell; the device comprises an electrical information acquisition unit, a detection unit and a control unit, wherein the electrical information acquisition unit is used for acquiring first electrical information of the multi-junction solar cell when at least one characteristic light corresponding to a subcell of the multi-junction solar cell irradiates the multi-junction solar cell; and the data processing unit is used for generating characterization information of the multi-junction solar cell based on the first electrical information, wherein the characterization information comprises efficiency contribution of each sub-cell to the multi-junction solar cell.
Optionally, the online characterization device further comprises: a second light source for simultaneously exciting each subcell of the multi-junction solar cell; the electrical information acquisition unit is also used for acquiring first electrical information of at least n-1 sub-batteries which work independently, so as to acquire at least n-1 first electrical information; obtaining second electrical information of the multi-junction solar cell when the n sub-cells are excited simultaneously; and the data processing unit is used for generating characterization information of the multi-junction solar cell based on the n-1 first electrical information and the second electrical information.
Optionally, the electrical information acquisition unit includes: and the ammeter is connected with the Gemini resistor in series. Optionally, the ammeter is a picoampere meter.
Optionally, the fluorescence energy generated when the subcell to be tested is excited excites other subcells in the multi-junction solar cell except the subcell to be tested, and the data processing unit further includes: and the fluorescence yield calculation module is used for calculating the fluorescence yield of the subcell to be tested according to the relationship between the fluorescence yield of the multijunction solar cell and the electrical parameters of the multijunction solar cell.
Optionally, the first light source is capable of emitting characteristic light corresponding to each subcell of the multi-junction solar cell, optionally, the first light source is any of: the LED light sources are adjustable in wave band, a plurality of monochromatic LED light sources or multichannel LED light sources corresponding to the characteristic light, or a plurality of monochromatic laser light sources.
Alternatively, the multi-junction solar cell is a two-terminal perovskite/crystalline silicon tandem cell; when the crystalline silicon subcell is excited, the first light source is adjusted to the output light wavelength longer than 850 nm, preferably, the output light channel is added with a long-pass filter of 800 nm; when the perovskite subcell is excited, the first light source is tuned to an exit wavelength of less than 500 nm, preferably the exit channel plus a 500 nm short pass filter.
Optionally, the online characterization device further includes: the test method acquisition unit is used for acquiring a test method input by a user before testing a sub-cell of the multi-junction solar cell, wherein the test method input by the user comprises one of a direct test method and an indirect test method; the test guiding unit is used for calling the corresponding test flow according to the test method acquired by the test method acquisition unit and guiding a user to perform test operation according to the test flow; and the data processing unit is also used for processing the tested data according to the test method acquired by the test method acquisition unit.
In a third aspect, the present invention provides a production line for multijunction solar cells comprising an on-line characterization device as described in any one of the preceding claims.
After the multi-junction cell is prepared, the multi-junction cell is used as a complete device, the efficiency of each sub-cell is difficult to test independently, and the contribution of each sub-cell to the overall efficiency of the multi-junction cell is measured. According to the characterization method provided by the embodiment of the invention, the first electrical information of the multi-junction solar cell when the sub-cells are excited independently is obtained, and then the characterization information comprising the contribution of each sub-cell to the overall efficiency of the multi-junction solar cell is generated based on the first electrical information.
The embodiment of the invention also provides online characterization equipment adopting the characterization method, which only needs to acquire electrical information, and has simpler structure and faster test speed compared with equipment needing to acquire optical data, and is suitable for mass production scenes of mass production.
Drawings
FIG. 1 is a flow chart of an online characterization method for a multi-junction solar cell provided by an embodiment of the invention;
FIG. 2 is a flow chart of another method for on-line characterization of a multi-junction solar cell according to an embodiment of the present invention
FIG. 3 is a schematic diagram of an indirect test method according to an embodiment of the present invention;
FIG. 4 is a schematic diagram of a voltage testing method for a multi-junction solar cell according to an embodiment of the present invention;
FIG. 5 is a plot of the correspondence of additional voltage contribution in a perovskite/crystalline silicon laminate cell and the fluorescence yield of a perovskite top cell;
FIG. 6 is a schematic diagram of test results of a titanium ore/crystalline silicon stacked cell and its subcells SunsVoc;
FIG. 7 is a block diagram of an on-line characterization device for a multi-junction solar cell according to an embodiment of the present invention;
fig. 8 is a block diagram of another on-line characterization device for multi-junction solar cells according to an embodiment of the present invention.
Detailed Description
For the purpose of making the objects, technical solutions and advantages of the embodiments of the present invention more apparent, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is apparent that the described embodiments are only some embodiments of the present invention, not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
After the multi-junction laminated cell is prepared, the multi-junction laminated cell is used as a complete device, and the efficiency of each sub-cell is difficult to test independently, so that the contribution of the multi-junction laminated cell to the laminated efficiency is measured. The technical scheme of the current production line is mainly aimed at single-junction batteries, is not suitable for multi-junction laminated solar batteries, and cannot well distinguish the efficiency contribution of each sub-battery to the whole laminated battery. In the research and development experiments related to multi-junction laminated batteries, EL (electroluminescence) and PLQY (Photo luminescence Quantum Yield ) are commonly used to calculate the efficiency of the sub-battery, but the methods have extremely high requirements on the precision of equipment, are complex in calculation and slow in test speed, cannot perform high-flux test, and are not suitable for mass production scenes.
The application uses the LED light source with specific wavelength, and is matched with the optical filter to test the photovoltage of the laminated battery under different light intensities (SunsVoc test). In addition, the conventional voltage test method is not suitable for SunsVoc test of the laminated battery, and improvement is required. The reason is that if one subcell is individually excited and measured, the test error is unacceptable due to the reverse bias of the current at the other subcells. In order to solve the problem, when the voltage of the sub-battery is tested, the internal resistance of the giga level is connected in series so as to reduce voltage testing errors caused by reverse bias of current to other sub-batteries. Based on the above, the IV characteristic curve of each sub-cell can be rapidly determined by using SunsVoc method and combining the LED light with specific wavelength and specific algorithm.
The technical scheme of the application is described in detail below with reference to the accompanying drawings.
Some embodiments of the present invention provide an online characterization method for a multi-junction solar cell, as shown in fig. 1, the method comprising:
Step S10, obtaining first electrical information when each sub-cell of the multi-junction solar cell works by illuminating the multi-junction solar cell with at least one characteristic light corresponding to the sub-cell of the multi-junction solar cell and exciting a part of the sub-cells to work;
Each sub-cell of the multi-junction solar cell is generally designed for different wave bands of the solar spectrum, so each sub-cell has a corresponding main absorption wave band, which is mainly determined by the forbidden bandwidth of the light absorption layer, and meanwhile, the specific value of the light absorption layer is affected by factors such as the material thickness, the reflectivity, the doping or not of the light absorption layer. Each sub-cell can absorb light energy in the corresponding absorption band and convert the light energy into electric energy with high efficiency, and the light energy outside the absorption band is little or no absorbed. The main absorption bands of each sub-cell are generally overlapped only at the edge part, based on which we can select characteristic light capable of exciting the sub-cell independently for a certain sub-cell, and at this time, the collected electrical information of the multi-junction cell includes information reflecting the power supply capability of the sub-cell (for example, information such as open circuit voltage, short circuit current, power generation efficiency, etc. can be obtained), and the sub-cell can be evaluated or the preparation process of the sub-cell can be adjusted according to the information. Of course, characteristic light capable of exciting the sub-cells alone may be selected for a part of the sub-cells, and the electrical information of the multi-junction cell collected at this time includes information reflecting the power supply capability of the part of the sub-cells.
In the present application, the characteristic light corresponding to a certain sub-cell should have the following characteristics: only the subcells corresponding to the characteristic light in the multi-junction solar cell can absorb the characteristic light, and other subcells can not absorb the characteristic light or can absorb the characteristic light but have smaller absorption rate to the negligible extent; or although capable of absorbing, can remove the influence of the data processing mode on the test result. The wavelength of the characteristic light is typically within the dominant absorption band corresponding to the subcell while corresponding to the low or non-absorption region of the other subcells.
Taking a perovskite/silicon laminated cell as an example, the main absorption wave band of the perovskite sub-cell is 300-750 nm nanometers, the main absorption wave band of the silicon sub-cell is 700-1200 nm, and the characteristic light corresponding to the perovskite sub-cell can select light with wavelength less than 500 nm; the characteristic light corresponding to the silicon subcell may be selected to be light having a wavelength greater than 850 nanometers.
In the step, light in a specific frequency range is selected to independently excite one or a part of sub-cells in the multi-junction solar cell to work, then the electrical information output by the multi-junction solar cell when the part of sub-cells work is collected, and the electrical information reflecting the working state of the part of sub-cells can be obtained through data processing.
The first electrical information of all or a part of the subcells of the multi-junction solar cell can be obtained by independently exciting each subcell to acquire the corresponding first electrical information or exciting a plurality of subcells to acquire the first electrical information of the subcells.
The fact that a certain sub-cell is excited alone means that the first electrical information measured at the moment is generated based on the fact that the sub-cell absorbs irradiation light energy, and other sub-cells do not work on the generation of the first electrical information, or the influence is small enough to be ignored, or the influence can be removed later through a data processing mode.
The step obtains first electrical information which is generated by one or a plurality of sub-batteries based on the photovoltaic effect alone, wherein the first electrical information can be voltage, current or other, so long as the photo-generated current capability of the corresponding sub-battery can be reflected.
And step S20, generating characterization information of the multi-junction solar cell based on the first electrical information corresponding to each sub-cell, wherein the characterization information comprises efficiency contribution of each sub-cell to the multi-junction solar cell.
Because the first electrical information reflects the photo-generated current of each sub-cell when working independently in the lamination, the independent power generation efficiency of each sub-cell is calculated based on the photo-generated current, and the problem that the efficiency of each sub-cell is difficult to test independently after the preparation of the multi-junction cell is finished is solved. Some of the first electrical information may reflect the photo-generated current when a part of the sub-cells work in the stack, and the efficiency of each sub-cell may be calculated by combining the first electrical information corresponding to the single sub-cell.
In addition, the first electrical information can also be used for generating other characterization information alone or in combination with other information, for example, the first electrical information can be used for judging the voltage and the filling factor of each sub-battery; or can be used for judging whether the sub-battery has too small a resistance; and whether the series resistance is abnormal or not can be judged by comparing the series resistance with a normal I-V test curve.
According to the online characterization method provided by the embodiment, each sub-cell of the multi-junction laminated cell is characterized by acquiring the first electrical information corresponding to each sub-cell during operation, and therefore the process of the corresponding sub-cell can be regulated and controlled based on the characterization information of each sub-cell. The on-line characterization method only needs to measure the electrical parameters and does not need to measure the optical parameters, so that the operation is simple, the reaction is quick, the method is suitable for the rapid production rhythm of the production line, is a high-flux and convenient testing method, and is beneficial to timely adjusting the production line process. The characterization information of each subcell may be, for example, the efficiency contribution of each subcell to the multi-junction stacked solar cell.
In other embodiments of the present invention, providing an online characterization method may further include: generating control information for adjusting process parameters of the sub-cells based on efficiency contributions of the sub-cells to the multi-junction solar cell; and finishing the process adjustment of the production line based on the control information.
Further, based on the efficiency contribution of a certain subcell to the multi-junction solar cell and other process information of the subcell on the production line, such as materials, film thickness, film coating time, film quality characterization parameters of each layer of film, etc., or the variation of these process information, control information for adjusting the process parameters of the subcell is generated.
Some embodiments of the present invention also provide another method for on-line characterization of a multi-junction solar cell, comprising:
the method comprises the steps of obtaining first electrical information when each sub-cell of the multi-junction solar cell works by adopting at least one characteristic light corresponding to the sub-cell of the multi-junction solar cell to irradiate the multi-junction solar cell and excite a part of the sub-cells to work;
and generating an instruction for performing process adjustment on the corresponding sub-battery based on the first electrical information of each sub-battery.
Some embodiments of the present invention also provide another on-line characterization method for a multi-junction solar cell, assuming that the multi-junction solar cell includes n subcells, n being a natural number, as shown in fig. 2, the on-line characterization method includes:
step S101, acquiring first electrical information of the multi-junction solar cell when at least n-1 sub-cells are excited independently, so as to acquire at least n-1 first electrical information;
Step S102, obtaining second electrical information when the n sub-cells of the multi-junction solar cell are excited simultaneously.
The step obtains electrical information of the normal working state of the multi-junction solar cell (namely, when all solar spectrums are irradiated, each sub-cell absorbs light and generates electrical signals such as voltage and current), for example, electrical parameters such as voltage and current or an IV curve or open circuit voltage of the multi-junction solar cell when the multi-junction solar cell is in normal working.
And step S103, generating characterization information of the multi-junction solar cell based on the n-1 first electrical information and the second electrical information, wherein the characterization information comprises efficiency contribution of each sub-cell to the multi-junction solar cell.
The method comprises the steps of calculating contribution of each sub-cell to the overall efficiency of the multi-junction solar cell based on first electrical information obtained when each sub-cell is excited independently and second electrical information obtained when each sub-cell of the multi-junction solar cell is excited in a working state, tracking the process problem of the single sub-cell on a production line, and adjusting the production line process.
The second electrical information may be used to assist in acquiring the first electrical information described above or to correct the acquired first electrical information. For example, the second electrical information may be combined with n-1 first electrical information to calculate first electrical information of remaining sub-cells, where the remaining sub-cells refer to sub-cells for which the first electrical information was not obtained by separate excitation. The second electrical information may also be used to correct the first electrical information, such as to eliminate the effect of fluorescence on the first electrical information.
Alternatively, in the above-mentioned online characterization method, a subcell may be individually excited by irradiating the subcell with characteristic light corresponding to the subcell, so that step S10 and step 101 acquire first electrical information when the subcell is individually excited.
In some embodiments, the first electrical information of each sub-cell during operation may be obtained by a direct test method or an indirect test method.
Specifically, taking a multi-junction solar cell as an example, the multi-junction solar cell comprises n subcells, and the i subcells are tested, wherein i and n are natural numbers, i is less than or equal to n, and the direct test method comprises: and irradiating the multi-junction solar cell by adopting characteristic light corresponding to the ith sub-cell in the multi-junction solar cell so as to excite the ith sub-cell to work and obtain first electrical information when the ith sub-cell works.
The first electrical information when each subcell is individually excited can be obtained by illuminating the multi-junction solar cell with characteristic light corresponding to each subcell in the multi-junction solar cell one by one and testing its electrical parameters.
For example, for the perovskite/silicon stacked cell, firstly, infrared light larger than 850 nanometers is used for irradiating the perovskite/silicon stacked cell, at the moment, the silicon bottom cell is excited to start to work, and the perovskite top cell does not work because of not absorbing infrared light, the effect of the perovskite top cell in a circuit is equivalent to a diode connected with the silicon bottom cell in series, and at the moment, the electrical information of the perovskite/silicon stacked cell such as open circuit voltage and the like can be tested, so that the first electrical information E Silicon (Si) when the silicon bottom cell is excited singly can be obtained; and then, adopting blue light with the wavelength smaller than 500 nanometers to irradiate the perovskite/silicon laminated battery, and independently exciting the perovskite top battery, wherein the absorption rate of the silicon bottom battery to the blue light with the wavelength smaller than 500 nanometers is very small and can be ignored, and at the moment, testing the electrical information of the perovskite/silicon laminated battery, such as open circuit voltage and the like, namely, the electrical information can be regarded as first electrical information E Perovskite when the perovskite top battery is independently excited. Based on the first electrical information E Silicon (Si) and the first electrical information E Perovskite , the contribution of the perovskite top cell and the silicon bottom cell, respectively, to the overall efficiency of the stacked cell can be calculated.
Referring to fig. 3, if the subcells of the multi-junction solar cell are numbered 1 to n in sequence along the light incidence direction, the indirect test method includes, for example, testing the ith subcell:
Directly testing the lowest subcell (nth subcell): for the nth sub-cell at the bottommost layer, adopting characteristic light corresponding to the nth sub-cell to irradiate the multi-junction solar cell so as to excite the nth sub-cell to work, and acquiring first electrical information E n when the ith sub-cell is independently excited;
indirect test of n-1 st subcell: illuminating the multi-junction solar cell with characteristic light corresponding to the nth sub-cell and characteristic light corresponding to the n-1 th sub-cell, obtaining first electrical information E n+(n-1) of the multi-junction solar cell when the nth sub-cell and the n-1 th sub-cell are excited simultaneously, and calculating first electrical information E (n-1) of the multi-junction solar cell when the n-1 th sub-cell is excited independently according to the following formula:
En-1＝En+(n-1)-En；
Indirect testing of the n-2 th subcells: illuminating the multi-junction solar cell with characteristic light corresponding to the nth sub-cell, the (n-1) th sub-cell and the (n-2) th sub-cell respectively, obtaining first electrical information E n+(n-1)+(n-2) of the multi-junction solar cell when the nth, the (n-1) th and the (n-2) th sub-cells are excited together, and calculating first electrical information E n-2 of the multi-junction solar cell when the (n-2) th sub-cell is excited independently according to the following formula:
En-2＝En+(n-1)+(n-2)-En+(n-1)；
indirect testing of the n-3 th subcells: e n-3＝En+(n-1)+(n-2)+(n-3)-En+(n-1)+(n-2);
Indirect testing of the n-4 th subcells: e n-4＝En+(n-1)+(n-2)+(n-3)+(n-4)-En+(n-1)+(n-2)+(n-3);
And so on, until the first electrical information E i：Ei＝En+(n-1)+(n-2)+(n-3)+…(i-1)+i-En+(n-1)+(n-2)+(n-3)+…+(i-1) of the ith sub-cell to be tested when the ith sub-cell is independently excited is calculated.
In an exemplary embodiment, a method for testing a three-junction stacked cell is provided, where if a light-directing surface of the stacked cell is a first subcell, an intermediate layer is a second subcell, and a third subcell is adjacent to a backlight surface, the method comprising:
(1) Firstly, testing a third sub-battery by adopting a direct test method, and obtaining first electrical information E 3 of the third sub-battery;
(2) Illuminating the three-junction laminated battery with second and third characteristic lights corresponding to the second and third sub-batteries respectively to obtain electrical information E 2+3 when the second and third sub-batteries are excited simultaneously; calculating first electrical information E 2,E2＝E2+3-E3 corresponding to the second sub-battery;
(3) The method comprises the steps of irradiating the three-junction laminated battery with first, second and third characteristic lights corresponding to the first, second and third sub-batteries respectively, or irradiating the three-junction laminated battery with solar simulation lights (comprising the first, second and third characteristic lights) to obtain electrical information E 1+2+3 when the first, second and third sub-batteries are excited simultaneously; and calculating first electrical information E 1,E1＝E1+2+3-E2+3 corresponding to the first sub-battery.
In some embodiments, when it is difficult to design a characteristic light that individually excites a sub-cell, an indirect test method is selected to test the sub-cell. If the characteristic light of a certain sub-cell is designed, the sub-cell is found to absorb light of a wave band mainly so that other sub-cells except the sub-cell can be excited jointly at the same time, and the joint excitation of other sub-cells cannot be ignored, an indirect test method can be selected to test the sub-cell to acquire the first electrical information of the sub-cell.
In some embodiments, when the subcell to be tested is excited, fluorescence energy generated when the subcell to be tested is excited excites other subcells in the multi-junction solar cell except for the subcell to be tested, an indirect test method may be selected to test the subcell to be tested, otherwise a direct test method is selected to test the subcell to be tested.
For example, for a perovskite/silicon stacked cell, since the perovskite top cell may generate fluorescence after being excited, and the voltage generated after the fluorescence is absorbed by the crystalline silicon bottom cell may interfere with the acquisition of the first electrical information of the perovskite top cell, an indirect test method is preferably selected to test the perovskite top cell, because the indirect test method may reduce the influence of fluorescence on the first electrical information of the perovskite top cell.
In some embodiments, if the fluorescence energy generated when the subcell to be tested is excited excites other subcells of the multi-junction solar cell having smaller forbidden bandwidths except for the subcell to be tested, when the direct test method is used to obtain the first electrical information of the multi-junction solar cell when the subcell to be tested is excited alone, the direct test method may further include:
and correcting the first electrical information, and eliminating the influence of fluorescence on the first electrical information.
In some embodiments, the fluorescence yield of a subcell of the multi-junction solar cell is related to its electrical parameter, such as an additional voltage, and the fluorescence yield of the subcell and its electrical parameter may be pre-measured, and based on this relationship, a correction value for correcting the first electrical information may be used to eliminate the effect of fluorescence on the first electrical information. The method is suitable for representing the structure of the multi-junction solar cell and the cell on the same mass production line with relatively fixed preparation materials, and for process adjustment.
In other embodiments, if the fluorescence energy generated when the subcell to be tested is excited excites other subcells of the multi-junction solar cell having smaller forbidden bandwidths except for the subcell to be tested, after the first electrical information of the ith subcell is obtained by the direct test method, the method further includes:
Obtaining first electrical information of an ith sub-battery according to an indirect test method, and taking the first electrical information as real electrical information of the ith sub-battery, which does not contain a fluorescence effect;
Subtracting the real electrical information of the ith sub-battery (namely the first electrical information of the ith sub-battery obtained by the indirect test method) from the first electrical information of the ith sub-battery obtained by the direct test method to obtain additional electrical information of the ith sub-battery generated by a fluorescence effect, wherein the additional electrical information can be, for example, additional voltage generated by the fluorescence effect;
And calculating the fluorescence yield and the electrical characteristics of the ith sub-cell according to the additional electrical information corresponding to the fluorescence effect of the ith sub-cell. Fluorescence yield is also an important parameter reflecting subcell performance. The electrical characteristics are for example the idealities of the subcells. More specifically, see embodiment one below.
Illustratively, the first electrical information may include: the open circuit voltage and current of the corresponding sub-cell, and the second electrical information may include: open circuit voltage and current of a multi-junction solar cell; the characterization information of the multi-junction solar cell may also include a voltage-current curve, i.e., a pseudo-IV curve, fitted to each subcell in the solar cell.
Alternatively, the open circuit voltage of the subcells and the multi-junction solar cells is measured using the light intensity check open circuit voltage method (method SunsVoc).
The obtained open circuit voltage of the sub-battery can be tested through an ammeter connected with a Gift-level resistor in series to reduce test errors caused by reverse bias of other sub-batteries, and the Gift-level resistor refers to a test auxiliary resistor with a resistance value not less than 1 Gohm.
Referring to fig. 3, taking perovskite/silicon stacked cell as an example, the in-line characterization method of the present application was implemented by finding that if the voltage of the crystalline silicon subcell of the stacked cell was measured using a conventional voltmeter, the resulting measured voltage would be significantly less than the voltage of the crystalline silicon subcell. Because the internal resistance of the voltmeter is small, typically less than 10Mohm, the current generated in the circuit is relatively large. This current would reverse bias the perovskite cell, causing distortion of the final test results. Here we use a series internal resistance of a giga-class resistor, e.g. 1Gohm, to suppress as much as possible the reverse current generated by the current at the perovskite top cell, so that the test result is infinitely close to the true voltage of the bottom cell.
In some embodiments, obtaining first electrical information of the multi-junction solar cell when each subcell is individually activated may include:
selecting characteristic light irradiation multi-junction solar cells according to a test method;
Calibrating the light intensity of the characteristic light until the photo-generated current density reaches the current density of the multi-junction solar cell under a standard solar spectrum, which can be AM1.5G commonly used in the field of solar cells, for example;
And adjusting the light intensity of the characteristic light, recording the voltages of the multi-junction solar cell under different light intensities, and fitting a voltage-current curve of the sub-cell to be tested, namely a pseudo-IV curve, according to the data of the light intensity and the voltage.
In some embodiments, the obtaining the second electrical information of the multi-junction solar cell when the n sub-cells are excited simultaneously in step S102 may specifically include:
Illuminating the multi-junction solar cell with a solar simulator;
calibrating a solar simulator to a standard solar spectrum, and testing the current density of the multi-junction solar cell at the moment;
And adjusting the light intensity of the solar simulator, recording the voltages of the multi-junction solar cells under different light intensities, and obtaining the voltage-current curve of the multi-junction solar cells.
In this way, step 101 and step 102 in the online characterization method both start testing based on the same light intensity, and the subsequent other test points also test under the corresponding same light intensity value, that is, as shown in fig. 6, the test points corresponding to each sub-cell or stacked cell have the same light intensity. The test result obtained in this way is convenient for subsequent calculation and comparison, and normalization is not needed.
For example, if 9 sets of data are measured for each sub-cell, 9 sets of light intensity data may be determined first, and then, during testing, the corresponding test light is respectively adjusted to the 9 sets of light intensity, and testing is performed for each sub-cell and multi-junction cell, and 9 sets of data are obtained for each sub-cell. Specific reference may be made to fig. 6 and either embodiment one or embodiment two.
Taking a perovskite/crystalline silicon laminated cell at two ends as an example, the online characterization method provided by the embodiment includes: respectively adopting a direct test method to test the voltage and current curves of the crystal silicon subcell and the perovskite subcell in the perovskite/crystal silicon laminated cell; testing the voltage-current curve of the perovskite/crystalline silicon laminated battery by adopting a direct test method; according to the voltage-current curve of the perovskite/crystalline silicon laminated battery subjected to indirect test, calculating extra voltage contribution of the crystalline silicon subcell due to fluorescence effect, further calculating fluorescence yield of the perovskite subcell, correcting the voltage-current curve of the perovskite subcell obtained by a direct test method, and removing fluorescence influence.
In order to make the objects, technical solutions and advantages of the embodiments of the present invention more apparent, the technical solutions of the present invention are further described below in conjunction with the embodiments of the present invention.
Example 1
Taking a two-junction perovskite/silicon stacked cell as an example, the bandgap of the perovskite subcell (first subcell) is 1.68eV and the bandgap of the crystalline silicon subcell (second subcell) is 1.12eV. The online characterization method provided by the embodiment comprises the following steps:
step one, testing method of second sub-cell (crystalline silicon sub-cell)
The method for directly measuring the pseudo-IV curve of the crystalline silicon subcell in the two-junction perovskite/crystalline silicon laminated cell comprises the following steps:
1. The excitation light source uses an LED light source with adjustable wave bands (> 850nm, obtained by adding an 800nm long-pass filter), or a monochromatic or multichannel infrared LED light source (> 850nm, added an 800nm long-pass filter), or a monochromatic infrared laser (> 850 nm) to excite the fermi level splitting of the crystalline silicon bottom cell individually.
2. The intensity of the excitation light source is calibrated to the current density of the laminate cell at standard solar spectrum AM1.5G (e.g., 20mA/cm 2).
3. And adjusting the light intensity and recording the voltage change of the laminated battery under different light intensities. Specifically, the voltage test uses a 1Gohm resistor series stacked cell, and uses a change in skin An Biaoji recording current, and then converts to an open circuit voltage V OC(c-Si)＝I1 R of the crystalline silicon bottom cell, and the circuit diagram is shown in fig. 4.
4. And fitting a pseudo-IV curve of the crystalline silicon bottom cell in the laminated cell through the data of the light intensity and the voltage.
Step two, testing method of first sub-battery (perovskite top battery)
The method for directly measuring the perovskite top cell pseudo-IV curve in the two-junction perovskite/crystalline silicon laminated cell comprises the following steps:
1. The excitation light source uses an adjustable band LED light source (< 650nm obtained by adding a 700nm short pass filter to the feature light source), or a monochromatic or multichannel infrared LED light source (< 650nm plus a 700nm short pass filter), or a monochromatic infrared laser (< 650 nm) to individually excite the fermi level splitting of the perovskite top cell.
2. The intensity of the excitation light source is calibrated to the current density of the laminate cell (e.g., 20mA/cm 2).
3. And adjusting the light intensity and recording the voltage change of the laminated battery under different light intensities. Voltage testing used a 1Gohm resistor series stack of cells and the skin An Biaoji was subjected to a change in current, which was then converted to the open circuit voltage V OC(perovskite)＝I2 R of the perovskite top cell.
4. The pseudo-IV curve of the perovskite top cell in the stacked cell was fitted with the data of light intensity and voltage.
Step three, voltage correction of first subcell (perovskite top cell)
Since the perovskite top cell will generate fluorescence after being excited, the voltage generated after the fluorescence is absorbed by the crystalline silicon bottom cell will interfere with the test of the perovskite top cell pseudo-IV curve. Therefore, the open circuit voltage V OC(perovskite) of the perovskite top cell obtained by the test method in the second step includes the voltage V OC(perovskite 0) (truly generated voltage) of the perovskite top cell and the voltage V OC(c-Si_pr) of the silicon bottom cell due to absorption of the fluorescence of the perovskite cell, namely: v OC(perovskite)＝VOC(perovskite 0)+VOC(c-Si_pr). While the fluorescence yield of the perovskite top cell affects the open circuit voltage of the perovskite top cell tested by the method, fig. 5 shows the correspondence between the additional voltage contribution and the fluorescence yield of the perovskite top cell in the perovskite/crystalline silicon stacked cell.
The fluorescence quantum yield PLQY is the ratio of the number of photons of the emitted fluorescence after absorption by the fluorescent substance to the number of photons of the absorbed excitation light. As shown in fig. 5, when the fluorescence yield is low, the extra voltage generated due to perovskite fluorescence in the stacked cell is small and negligible. The open circuit voltage of the perovskite subcell obtained by the indirect test method can be approximated as the actual voltage of the perovskite subcell (excluding the extra voltage due to fluorescence). Thus, correction can be made to the pseudo-IV curve of the perovskite top cell tested by the direct method from the pseudo-IV curve of the perovskite sub cell obtained by the indirect method test.
The method can directly measure the pseudo-IV curve of the two-junction perovskite/crystalline silicon laminated battery, and then correct the open-circuit voltage of the perovskite subcell according to the pseudo-IV curve of the laminated battery, and specifically comprises the following steps:
1. the excitation light source uses a sunlight simulator, and the light source can be an LED lamp, a xenon lamp and a xenon/halogen lamp;
2. calibrating the light intensity of the excitation light source to the current density of AM1.5G;
3. Adjusting the light intensity and recording the voltage V OC(tandem) of the laminated battery under different light intensities;
4. fitting a pseudo-IV curve of the laminated battery through data of light intensity and voltage;
5. corrected pseudo-IV curve for perovskite top cell, i.e. actual voltage of perovskite subcell is available
The modified pseudo-IV curve for a perovskite top cell can be derived by the following formula, V OC(perovskite)'＝VOC(tandem)-VOC(c-Si). The test results of the stacked cell and its subcells SunsVoc are shown in fig. 6.
Furthermore, we can also obtain the fluorescence yield of perovskite subcells:
According to formula (8) in the article "light emission and current Voltage characteristics of solar cells and photovoltaic devices" (Luminescence and current-voltage characteristics of solar cells and optoelectronic devices) described in solar Material and solar cells (solar ENERGY MATERIALS AND solar cells 25 (1992) 51-71, north-Holland), the following:
qVOC＝μ≈kT0ln(ISC/I0)+kT0lnΦ， (8)
Where q is the unit charge, voc is the open circuit voltage, I sc is the short circuit current, I 0 is the ideal or lowest reverse saturation current for a given material, and phi is the fluorescence efficiency.
Substituting the open-circuit voltage and current of the crystalline silicon under characteristic light (> 850 nm) and the open-circuit voltage and current of the crystalline silicon under the fluorescence of perovskite into the formula (8), and subtracting and eliminating kT 0 ln phi to obtain the following formula:
q(VOC(c-Si_pr)-VOC(c-Si))＝nkT0ln(PLQY/2)----------------------(1)
Where PLQY is the fluorescence yield of the laminated cell at AM1.5G, n is the ideal factor of the silicon cell (1 is assumed in equation (8) above), k is the Boltzmann constant, T 0 is the test temperature, q is the unit charge amount, and one constant. Wherein PLQY is fluorescence yield, i.e. the ratio of the number of photons of the emitted fluorescence after absorption by the fluorescent substance to the number of photons of the absorbed excitation light, i.e. PLQY=I emission/Iexcitation
Iemission＝2Iinjection,
Iexcitation＝ISC
I injection is a current generated by the silicon cell due to absorption of fluorescence generated by perovskite under the corresponding characteristic light (blue light), and I SC is a short-circuit current of the stacked cell under am1.5g.
According to formula (1) above, V OC(c-Si) is the open circuit voltage of crystalline silicon under characteristic light (> 850 nm), which has been measured in step one by the direct method; v OC(c-Si_pr) is an open circuit voltage generated by absorption of fluorescence generated by perovskite under corresponding characteristic light (blue light) in a silicon battery, and the fluorescence voltage of the silicon battery for short can be obtained according to a difference between the open circuit voltages of perovskite measured by a direct method and an indirect method, and is specifically as follows:
Referring to FIG. 5, the extra voltage gain of the fluorescence effect is only about 10mV even at PLQY of 100%. And PLQY of devices in the perovskite lamination field is generally lower than 1% at present, and at the moment, the extra gain of the fluorescence effect is more negligible. Thus, the open circuit voltage of the perovskite measured using the indirect method can be considered to be approximately equal to the true voltage V OC(perovskite 0) of the perovskite. And the open circuit voltage V OC(perovskite) measured by the direct method contains the real voltage V OC(perovskite 0) of the perovskite and the fluorescence voltage V OC(c-Si_pr) of the silicon cell. Therefore, the fluorescence voltage of the silicon cell can be calculated from the following expression (2):
V OC(c-Si_pr)＝VOC(perovskite)-VOC(perovskite 0) — (2) =v OC(perovskite)-(VOC(tandem)-VOC(c-Si)),
Since the left side of the above formula (1) is known, the fluorescence yield PLQY can be calculated from the formula (1). The fluorescence yield PLQY is also an important parameter affecting the stacked solar cell, and the process of each subcell can be subsequently adjusted according to the contribution of the subcell to the fluorescence yield and the fluorescence yield of the top cell. In addition, the modified pseudo-IV curve for perovskite top cells can be derived by the following formula, V OC(perovskite)＝VOC(tandem)-VOC(c-Si).
In addition, when the stacked device is irradiated with the am1.5g light source, the voltage of the perovskite subcell calculated by V OC(perovskite)＝VOC(tandem)-VOC(c-Si) actually also includes the contribution of fluorescence efficiency at am1.5g to the stacked cell. Since the contribution of fluorescence efficiency to the laminated cell was small, the contribution of fluorescence effect to voltage under am1.5g light was ignored in the above calculation.
If the contribution of the fluorescence effect of the stacked device to the voltage under am1.5g light (e.g. greater than 1%) is not ignored, then substituting the fluorescence yield PLQY obtained by the above equation (1), deriving from the equation, can yield an additional voltage contribution as:
The left term of V tandem＝Vtandem0+dVOC is the laminate cell voltage measured by the indirect method, in which V tandem0 represents the true voltage of the laminate after subtracting the voltage gain due to perovskite fluorescence, since dV OC is small, even plqy=100%, dV OC is less than 10Mv,
The contribution dV OC of the fluorescence effect under am1.5g light to the voltage can be calculated according to the above formula.
It will be appreciated by those skilled in the art that, although the pseudo-IV curve of the perovskite top cell obtained by the second test includes two parts of the effect of the real efficiency of the perovskite subcell and the fluorescence efficiency of the silicon subcell, the pseudo-IV curve of the perovskite subcell can be directly measured according to the second test method, and the process for producing the subcell of the multi-junction stacked solar cell can be adjusted. However, where we need to further obtain more detailed information about the fluorescence effect of the subcells, the fluorescence efficiency and the additional voltage contribution of the fluorescence of the perovskite subcells can be further calculated according to the method provided above.
The multi-junction laminated solar cell, such as the three-junction and four-junction laminated solar cell testing method, is similar to the two-junction laminated solar cell testing method, and the main difference is that the characteristic light sources corresponding to all the subcells in the laminated solar cell are adopted for carrying out SunsVoc testing. The method can rapidly test the performance of each subcell of the multi-junction laminated solar cell with high flux and guide the adjustment of the production process in real time.
Example two
In this embodiment, an indirect test method is used to obtain the characterization information of the stacked battery, and a two-junction perovskite/crystalline silicon stacked battery is taken as an example, which specifically includes:
Step one, the same steps as in the first embodiment are adopted to obtain the open circuit voltage V OC(c-Si)＝I1 ·r of the crystalline silicon bottom cell, and the pseudo-IV curve of the crystalline silicon bottom cell in the stacked cell is fitted, as shown in fig. 6.
And step two, testing the first sub-cell (perovskite top cell) by adopting an indirect method.
Since the perovskite top cell will generate fluorescence after being excited, the voltage generated after the fluorescence is absorbed by the crystalline silicon bottom cell will interfere with the test of the perovskite top cell pseudo-IV curve. Method for measuring perovskite top cell pseudo-IV curve this example uses the following method:
1. the excitation light source uses a solar simulator, and the light source can be an LED lamp, a xenon lamp or a xenon/halogen lamp.
2. The intensity of the excitation light source was calibrated to a current density of am1.5g.
3. And adjusting the light intensity and recording the voltage change of the laminated battery under different light intensities.
4. The pseudo-IV curve of the laminate cell was fitted by the data of the light intensity and the voltage.
The pseudo-IV curve of a perovskite top cell can be found by the following formula, V OC(perovskite)＝VOC(tandem)-VOC(c-Si). In the case of perovskite top cell fluorescence yields below 1%, the PLQY contribution was negligible in the SunsVoc test, as shown in fig. 5. But when the fluorescence yield of the perovskite top cell is higher than 1%, the pseudo-IV curve of the perovskite top cell needs to be corrected. The present embodiment may further include:
Step three, voltage correction of a first sub-cell (perovskite top cell), which comprises the following specific steps:
1. The excitation light source uses an adjustable band LED light source (< 500nm plus 600 short-pass filter), or a single-color or multi-channel visible LED light source (< 500nm plus 600 short-pass filter), or a single-color visible laser (< 500 nm) to individually excite the fermi level splitting of the perovskite top cell.
2. The intensity of the excitation light source is calibrated to the current density of the laminate cell (e.g., 20mA/cm 2).
3. And adjusting the light intensity and recording the voltage change of the laminated battery under different light intensities. The voltage obtained here is composed of two aspects, the voltage V OC(perovskite) of the perovskite top cell and the silicon cell voltage V OC(c-Si_pr), i.e. V OC(perovskite)+VOC(c-Si_pr).VOC(perovskite), due to absorption of the perovskite cell fluorescence, have been obtained in step two. In the test of the bottom cell in step one we obtain the bottom cell voltage V OC(c-Si). In this way the first and second light sources,We obtain the fluorescence efficiency PLQY of the perovskite top cell, where k is the boltzmann constant and T 0 is the test temperature. Then the top cell correction V OC(perovskite_rev) can be derived from this equation/>
Example III
The embodiment provides an online characterization method for testing a three-junction laminated solar cell. The sub-cell close to the light-facing surface in the three-junction laminated cell is a first sub-cell, the middle sub-cell is a second sub-cell, and the sub-cell close to the backlight surface is a third sub-cell. Taking the first subcell with a bandgap of 1.86eV, the second subcell with a bandgap of 1.4eV, and the third subcell with a bandgap of 0.65eV as an example.
Testing method of first and third sub-batteries
The third subcell pseudo-IV curve was measured:
1. the excitation light source uses an adjustable band LED light source (photon energy slightly greater than 0.65eV but less than 1.4eV and equipped with a long pass filter), or a monochromatic or multi-channel infrared LED light source (photon energy slightly greater than 0.65eV but less than 1.4eV and equipped with a long pass filter), or a monochromatic infrared laser (photon energy slightly greater than 0.65eV but less than 1.4 eV) to excite the fermi level splitting of the third subcell alone.
2. The intensity of the excitation light source is calibrated to the current density of the laminate cell (e.g., 14mA/cm 2) under standard solar spectrum (am1.5g).
3. And adjusting the light intensity and recording the voltage change of the laminated battery under different light intensities.
4. Voltage testing used a 1Gohm resistor series stack of cells and the skin An Biaoji was subjected to a change in current, then converted to an open circuit voltage V OC(subcell_3) = i1·r for the third subcell.
5. The pseudo-IV curve of the third subcell in the stacked cell was fitted by the data of the light intensity and voltage.
Second step, testing method of second sub-battery
The method for measuring the pseudo-IV curve of the second sub-battery comprises the following steps:
1. The first excitation light source uses an adjustable band LED light source (photon energy slightly greater than 0.65eV but less than 1.4eV and equipped with a long pass filter), or a monochromatic or multi-channel infrared LED light source (photon energy slightly greater than 0.65eV but less than 1.4eV and equipped with a long pass filter), or a monochromatic infrared laser (photon energy slightly greater than 0.65eV but less than 1.4 eV) to excite the fermi level splitting of the third subcell alone.
2. The intensity of the first excitation light source is calibrated to the current density of the laminate cell (e.g., 14mA/cm 2) under standard solar spectrum (am1.5g).
3. The second excitation light source uses an adjustable band LED light source (photon energy slightly greater than 1.4eV but less than 1.86eV and equipped with a bandpass filter corresponding to the light source), or a monochromatic or multi-channel LED light source (photon energy slightly greater than 1.4eV but less than 1.86eV and equipped with a bandpass filter corresponding to the light source), or a monochromatic laser (photon energy slightly greater than 1.4eV but less than 1.86 eV) to excite the fermi level splitting of the second subcell alone.
4. The intensity of the second excitation light source is calibrated to the current density of the laminate cell (e.g., 14mA/cm 2) under standard solar spectrum (am1.5g).
5. And simultaneously exciting the first sub-battery and the second sub-battery by using the calibrated first light source and the calibrated second light source, adjusting the light intensity, and recording the voltage change of the laminated battery under different light intensities.
6. Voltage testing uses a 1Gohm resistor series stack of cells and a skin An Biaoji is run to record the change in current, then converted to the open circuit voltage of the second and third cells V OC(subcell_2+3) =i2·r. The voltage of the second sub-cell is: v OC(subcell_2)＝VOC(subcell_2+3)-VOC(subcell_3)
8. The pseudo-IV curve of the second subcell in the stacked cell was fitted by the data of the light intensity and voltage.
Third step, testing method of first sub-battery
The method for measuring the pseudo-IV curve of the first sub-battery comprises the following steps:
1. a solar simulator using a xenon lamp, a xenon lamp/tungsten lamp, an LED, or the like as a light source as an excitation light source;
2. calibrating the light intensity of the excitation light source to a power of 1000W/m 2 (AM1.5G) below;
3. the light intensity is regulated, and the voltage change of the laminated battery under different light intensities is measured and recorded by a voltmeter.
4. The voltage V OC(subcell_3)＝VOC(tandem)-VOC(subcell_2+3) of the first sub-cell;
5. The pseudo-IV curve of the first subcell in the stacked cell was fitted by the data of the light intensity and voltage.
Further, in other embodiments may further include: and thirdly, correcting the voltage of the top battery. When the fluorescence yield of the top cell (first subcell) is higher than 1%, the pseudo-IV curve of the top cell needs to be corrected.
The correction method may refer to the calculation procedure of the perovskite/crystal silicon correction in the first embodiment, and the thinking is about the same, first calculate the fluorescence yield of each subcell, and calculate the correction values of the first subcell voltage and the second subcell voltage according to the fluorescence yield of each subcell and the relationship between the extra voltage contribution and the fluorescence yield. Except that it is considered that both the second and third sub-cells may absorb fluorescence to create additional voltage contributions, the calculation process is more complex and the principle is substantially similar and will not be described in detail here.
In summary, embodiments of the present application propose a new characterization method for a stacked cell, using characteristic light of a specific wavelength band or wavelength corresponding to one or more subcells of the stacked cell, which can excite its fermi level, to illuminate the stacked cell, and then collecting its electrical characteristics to characterize the subcells; thus, the electrical properties of each sub-cell can be obtained by these electrical characteristics. The method has high test speed, can complete the characterization task with high flux, and can test the pseudo-IV curve of each subcell in the multi-junction laminated battery.
The embodiment of the application can rapidly judge the IV characteristic curves of the top battery and the bottom battery by using the SunsVoc method and combining the LED light with specific wavelength and a specific algorithm.
When the electrical characteristics of the sub-cells are collected, the device of fig. 4 is used, and the ammeter is connected in series with a resistor of 1Gohm to avoid reverse bias of the current to other sub-cells (the other sub-cells are equivalent to PN junctions at the moment), so that the test result is infinitely close to the real voltage of the sub-cell to be tested.
Furthermore, the characterization method can correct the test result to remove the fluorescence influence, and is close to the true value, so that the individual evaluation is facilitated.
Example IV
The embodiment of the application also provides an online characterization device corresponding to the online characterization method, which is suitable for rapid test of mass production, has a simple structure and does not need a high-sensitivity test sensor. The device is briefly described below.
The online characterization device provided by the embodiment of the application, referring to fig. 4 and fig. 7, includes:
A first light source 11 for providing at least one characteristic light corresponding to a subcell of the multi-junction solar cell; an electrical information acquisition unit 12, configured to acquire first electrical information of the multi-junction solar cell when at least one characteristic light corresponding to a subcell of the multi-junction solar cell irradiates the multi-junction solar cell; the data processing unit 13 is configured to generate, based on the first electrical information, characterization information of the multi-junction solar cell, the characterization information including efficiency contributions of the individual subcells to the multi-junction solar cell.
The first light source 11 can emit characteristic light corresponding to each subcell of the multi-junction solar cell, alternatively, the first light source is any one of the following: the LED light sources are adjustable in wave band, a plurality of monochromatic LED light sources or multichannel LED light sources corresponding to the characteristic light, or a plurality of monochromatic laser light sources. For perovskite/silicon stacked cells, the first light source was tuned to an output wavelength greater than 850 nanometers when the silicon subcell was excited. Preferably, a long-pass filter (O.D. 4.0) of 800 nanometers is added to the light-emitting channel, so that stray light can be filtered, and the silicon sub-cell can be excited independently; when the perovskite subcell is excited, the first light source is tuned to an exit wavelength of less than 500 nm, preferably the exit channel plus a 500 nm short pass filter (o.d. 4.0).
The first electrical information may be, for example, the open circuit voltage or current of the subcell. Alternatively, as shown in fig. 4, the electrical information collection unit 12 may include: the ammeter is connected with the giga-level resistor in series; the gigaohm resistance is not less than 0.8 megaohms, such as the resistance 1Gohm in fig. 4. Alternatively, the ammeter is a picoampere meter, and can measure a minute current. The ammeter is connected with the Gift-order resistor in series, so that the current in the test circuit can be reduced, and the test error caused by reverse biasing of other sub-batteries by the current is reduced.
In some embodiments, the online characterization device may further comprise: and a second light source for simultaneously exciting each subcell of the multi-junction solar cell. Alternatively, the second light source may be integrated with the first power source, or the second light source may comprise the first power source. The electrical information acquisition unit 12 is further configured to acquire first electrical information of the multi-junction solar cell when the at least n-1 subcells are operated individually, thereby acquiring at least n-1 first electrical information; obtaining second electrical information of the multi-junction solar cell when the n sub-cells are excited simultaneously; the data processing unit 13 is further configured to generate characterization information of the multi-junction solar cell based on the n-1 first electrical information and the second electrical information.
The fluorescence energy generated when the subcell to be tested is excited excites other subcells in the multi-junction solar cell except for the subcell to be tested, and the data processing unit 13 further includes: and the fluorescence yield calculation module is used for calculating the fluorescence yield of the subcell to be tested according to the relationship between the fluorescence yield of the multijunction solar cell and the electrical parameters of the multijunction solar cell.
Specifically, as described in the first embodiment, the open-circuit voltage of the sub-battery to be tested is tested by adopting an indirect test method and a direct test method, and the open-circuit voltage measured by the direct test method includes the real voltage of the sub-battery to be tested and the extra voltage generated by the sub-battery with smaller forbidden bandwidth due to the fluorescence effect; the open-circuit voltage measured by the indirect test method can be regarded as the real voltage of the sub-battery to be tested (the extra voltage due to fluorescence contribution in the indirect test method is small), then the extra voltage of the sub-battery with smaller forbidden bandwidth due to fluorescence is obtained according to the difference of the open-circuit voltages obtained by the two methods, and then the fluorescence yield of the sub-battery to be tested is calculated according to the relation (pre-measured) between the extra voltage and the fluorescence yield.
In some embodiments, as shown in fig. 8, the online characterization apparatus may further include: a test method obtaining unit 14, configured to obtain a test method input by a user before testing a subcell of the multi-junction solar cell, where the test method input by the user includes one of a direct test method and an indirect test method; a test guiding unit 15, configured to invoke a corresponding test procedure (for example, invoke a direct test procedure and an indirect test procedure) according to the test method acquired by the test method acquiring unit 14, and guide a user to perform a test operation according to the test procedure; the data processing unit 13 is further configured to process the tested data according to the test method acquired by the test method acquisition unit.
According to the online characterization device provided by the embodiment of the invention, one or a part of sub-cells in the multi-junction battery are independently excited through the first power supply 11, the first electrical information when the sub-cells are independently excited is acquired by adopting the electrical information acquisition unit 12, and then the characterization information comprising the contribution of each sub-cell to the overall efficiency of the multi-junction solar cell is generated based on each first electrical information, so that the problem that the current online characterization method cannot well distinguish the contribution of each sub-cell of the multi-junction laminated solar cell to the overall efficiency of the laminated battery is solved.
The on-line characterization device provided by the embodiment of the invention can complete the characterization task with high flux, and can rapidly judge the IV characteristic curves of the top battery and the bottom battery by using a SunsVoc method and combining specific wavelength characteristic light with a specific algorithm. SunsVoc when testing, a resistor of 1Gohm can be connected in series through the picoammeter to avoid that the current can reverse bias other sub-batteries, so that the test result is infinitely close to the real voltage of the tested sub-battery. And the test result can be corrected to remove the fluorescence influence, so that the test result is close to a true value, and the evaluation of individuals is facilitated. The online characterization device provided by the embodiment of the invention is suitable for rapid test of mass production, has a simple structure, and does not need a high-sensitivity test sensor.
The embodiment of the application also provides a production line of the multi-junction solar cell, which comprises the online characterization device of any one of the above.
The present invention is not limited to the above embodiments, and any changes or substitutions that can be easily understood by those skilled in the art within the technical scope of the present invention are intended to be included in the scope of the present invention. Therefore, the protection scope of the present invention should be subject to the protection scope of the claims.
Claims (16)
1. An on-line characterization method of a multi-junction solar cell, comprising:
The method comprises the steps of obtaining first electrical information corresponding to each sub-cell of the multi-junction solar cell when the sub-cell works by adopting at least one characteristic light corresponding to the sub-cell of the multi-junction solar cell to irradiate the multi-junction solar cell and exciting part of the sub-cells to work;
Based on the first electrical information of each subcell, characterization information of the multi-junction solar cell is generated, the characterization information including an efficiency contribution of each subcell to the multi-junction solar cell.
2. The online characterization method according to claim 1, wherein the first electrical information corresponding to each subcell in operation is obtained by a direct test method or an indirect test method, wherein the multi-junction solar cell includes n subcells, the n subcells are sequentially numbered 1 to n in the incident direction of light, i and n are natural numbers, i is less than or equal to n, and for the ith subcell to be tested, the direct test method includes: adopting characteristic light corresponding to an ith sub-cell in the multi-junction solar cell to irradiate the multi-junction solar cell so as to independently excite the ith sub-cell to work and obtain first electrical information of the multi-junction solar cell when the ith sub-cell works; the indirect test method comprises the following steps:
For the nth sub-cell at the bottommost layer, adopting characteristic light corresponding to the nth sub-cell to irradiate the multi-junction solar cell so as to excite the nth sub-cell to work, and acquiring first electrical information E n when the nth sub-cell is excited;
Illuminating the multi-junction solar cell with characteristic light corresponding to the nth sub-cell and characteristic light corresponding to the n-1 th sub-cell, obtaining first electrical information E n+(n-1) of the multi-junction solar cell when the nth sub-cell and the n-1 th sub-cell are excited simultaneously, and calculating first electrical information E n-1 of the multi-junction solar cell when the n-1 th sub-cell is excited independently according to the following formula:
En-1＝En+(n-1)-En；
Illuminating the multi-junction solar cell with characteristic light corresponding to the nth sub-cell, the n-1 th sub-cell and the n-2 th sub-cell respectively, obtaining first electrical information E n+(n-1)+(n-2) of the multi-junction solar cell when the nth, the n-1 th and the n-2 th sub-cells are excited together, and calculating first electrical information E n-2 of the multi-junction solar cell when the n-2 th sub-cell is excited alone according to the following formula:
En-2＝En+(n-1)+(n-2)-En+(n-1)；
And so on, until the first electrical information E i of the ith sub-cell to be tested when the ith sub-cell is independently excited is calculated.
3. The online characterization method according to claim 2, wherein when the subcells to be tested are excited, fluorescence energy generated when the subcells to be tested are excited excites other subcells of the multi-junction solar cell except the subcells to be tested, an indirect test method is selected to test the subcells to be tested, otherwise a direct test method is selected to test the subcells to be tested.
4. The online characterization method according to claim 2, wherein if fluorescence energy generated when the subcell to be tested is excited excites other subcells of the multi-junction solar cell except the subcell to be tested, after the first electrical information of the ith subcell is obtained by the direct test method, the method further comprises:
acquiring first electrical information of the ith sub-battery through the indirect test method, and taking the first electrical information as real electrical information of the ith sub-battery which does not contain a fluorescence effect;
subtracting the real electrical information of the ith sub-cell from the first electrical information of the ith sub-cell obtained by the direct test method to obtain additional electrical information of the multi-junction solar cell due to the fluorescence effect of the ith sub-cell;
And calculating the fluorescence yield and the electrical characteristics of the ith sub-cell according to the additional electrical information.
5. The online characterization method of claim 4, wherein the online characterization method further comprises: and calculating a correction value of the first electrical information of the ith sub-cell according to the fluorescence yield of each sub-cell and the relation between the additional electrical information and the fluorescence yield.
6. The online characterization method of claims 1-5 wherein the first electrical information includes: the open circuit voltage and current of the corresponding subcell, the second electrical information including: open circuit voltage and current of the multi-junction solar cell;
the characterization information of the multi-junction solar cell further comprises a voltage-current curve fitted to each sub-cell in the solar cell.
7. The on-line characterization method of claim 6, wherein the open circuit voltage of the sub-cell is tested by an ammeter connected in series with a gigaohm-level resistor to reduce test errors caused by reverse biasing other sub-cells when the first electrical information of the sub-cell is obtained, wherein the gigaohm-level resistor is not less than 1Gohm.
8. The online characterization method of claim 2, wherein obtaining the first electrical information of each sub-cell during operation by a direct test method or an indirect test method comprises:
Selecting characteristic light to irradiate the multi-junction solar cell according to a test method;
Calibrating the light intensity of the characteristic light until the photo-generated current density reaches the current density of the multi-junction solar cell under the standard solar spectrum;
and adjusting the light intensity of the characteristic light, recording the voltages of the multi-junction solar cell under different light intensities, and fitting a voltage-current curve of the sub-cell to be tested according to the data of the light intensity and the voltage.
9. The on-line characterization method of any one of claims 1 to 8, wherein the multi-junction solar cell is a two-terminal perovskite/crystalline silicon tandem cell; the wavelength of characteristic light corresponding to perovskite subcells in the perovskite/crystalline silicon stacked cell at both ends is less than 500 nm; the wavelength of the characteristic light corresponding to the crystalline silicon subcells in the perovskite/crystalline silicon tandem cell at both ends is greater than 850 nanometers.
10. An on-line characterization device for a multi-junction solar cell, comprising:
a first light source for providing at least one characteristic light corresponding to a subcell of the multi-junction solar cell;
The device comprises an electrical information acquisition unit, a detection unit and a control unit, wherein the electrical information acquisition unit is used for acquiring first electrical information of the multi-junction solar cell when at least one characteristic light corresponding to a subcell of the multi-junction solar cell irradiates the multi-junction solar cell;
And the data processing unit is used for generating characterization information of the multi-junction solar cell based on the first electrical information, wherein the characterization information comprises efficiency contribution of each sub-cell to the multi-junction solar cell.
11. The online characterization device of claim 10, wherein the online characterization device further comprises: a second light source for simultaneously exciting each subcell of the multi-junction solar cell;
The electrical information acquisition unit is also used for acquiring first electrical information of at least n-1 sub-batteries which work independently, so as to acquire at least n-1 first electrical information; obtaining second electrical information of the multi-junction solar cell when the n sub-cells are excited simultaneously;
and the data processing unit is used for generating characterization information of the multi-junction solar cell based on the n-1 first electrical information and the second electrical information.
12. The on-line characterization device of claim 10, wherein the electrical information acquisition unit comprises: the ammeter is connected with the Gemini resistor in series; optionally, the ammeter is a picoampere meter.
13. The on-line characterization device according to claim 10, wherein the fluorescent energy generated when the subcell to be tested is excited excites other subcells of the multi-junction solar cell except for the subcell to be tested, the data processing unit further comprising:
And the fluorescence yield calculation module is used for calculating the fluorescence yield of the subcell to be tested according to the relationship between the fluorescence yield of the multijunction solar cell and the electrical parameters of the multijunction solar cell.
14. The on-line characterization device of claim 10, wherein the first light source is capable of emitting characteristic light corresponding to each subcell of the multi-junction solar cell, optionally, the first light source is any of:
the LED light sources are adjustable in wave band, a plurality of monochromatic LED light sources or multichannel LED light sources corresponding to the characteristic light, or a plurality of monochromatic laser light sources.
15. The on-line characterization device of claim 10, wherein the multi-junction solar cell is a two-terminal perovskite/crystalline silicon tandem cell; when the crystalline silicon subcell is excited, the first light source is adjusted to the output light wavelength longer than 850 nm, preferably, the output light channel is added with a long-pass filter of 800 nm;
When the perovskite subcell is excited, the first light source is tuned to an exit wavelength of less than 500 nm, preferably the exit channel plus a 500 nm short pass filter.
16. The online characterization device of claim 10, further comprising:
the test method acquisition unit is used for acquiring a test method input by a user before testing a sub-cell of the multi-junction solar cell, wherein the test method input by the user comprises one of a direct test method and an indirect test method;
The test guiding unit is used for calling the corresponding test flow according to the test method acquired by the test method acquisition unit and guiding a user to perform test operation according to the test flow;
And the data processing unit is also used for processing the tested data according to the test method acquired by the test method acquisition unit.
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| PCT/CN2023/113973 WO2024078142A1 (en) | 2022-10-09 | 2023-08-21 | Online characterization method and apparatus for multi-junction solar cell |
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| JP2002057359A (en) * | 2000-06-01 | 2002-02-22 | Sharp Corp | Laminated solar battery |
| CN101241943A (en) * | 2008-02-27 | 2008-08-13 | 苏州纳米技术与纳米仿生研究所 | Focused/light distribution efficient four-node solar battery |
| CN101696942B (en) * | 2009-10-16 | 2011-03-30 | 厦门大学 | Multi-junction solar cell and AC electroluminescence testing method and device of each sub cell |
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| CN106877818B (en) * | 2017-03-14 | 2019-03-01 | 华东师范大学 | Shine the detection device and method of coupling efficiency between a kind of multijunction solar cell knot |
| CN110324003A (en) * | 2019-04-30 | 2019-10-11 | 上海道口材料科技有限公司 | A kind of multijunction solar cell recessiveness defect non-destructive testing method and system |
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