CN117686868A - Fault recording method of IGBT driver and IGBT driver - Google Patents
Fault recording method of IGBT driver and IGBT driver Download PDFInfo
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- 238000005070 sampling Methods 0.000 claims abstract description 65
- 238000001514 detection method Methods 0.000 claims abstract description 51
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2608—Circuits therefor for testing bipolar transistors
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/16—Modifications for eliminating interference voltages or currents
- H03K17/168—Modifications for eliminating interference voltages or currents in composite switches
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
- H03K17/56—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
- H03K17/567—Circuits characterised by the use of more than one type of semiconductor device, e.g. BIMOS, composite devices such as IGBT
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Abstract
The application discloses a fault recording method of an IGBT driver and the IGBT driver, wherein the input end of an IGBT gate electrode sampling unit and the output end of a fault signal detection module are connected with the gate electrode of the IGBT; the output end of the IGBT gate electrode sampling unit is connected with the first input end of the data processing unit; the second input end of the data processing unit is connected with the other output end of the fault signal detection module; the third input end of the data processing unit is connected with the output end of the signal sampling module; the other output end of the signal sampling module is connected with the input end of the fault signal detection module; the fourth input end/output end of the data processing unit is connected with the input end/output end of the external memory; the other output end of the data processing unit is connected with the input end of the main control module through the fault output unit. Data can be collected no matter whether faults occur or not, and data before and after the faults are stored so as to perform fault location analysis according to the data.
Description
Technical Field
The application relates to the technical field of electronic devices, in particular to a fault recording method of an IGBT driver and the IGBT driver.
Background
In high voltage frequency converters, in order to protect electrical components or personnel from dangerous voltage and current surges, it is necessary to isolate the signals.
At present, an Insulated Gate Bipolar Transistor (IGBT) driver and a main control board are connected through an isolator to realize isolated transmission of signals, but fault information is transmitted to the main control board after a fault occurs, but the fault information does not contain information of the running state of the IGBT driver due to the existence of the isolator, so that the main control board cannot determine whether the IGBT driver has a fault or not, and fault location analysis cannot be performed.
Therefore, how to perform fault location analysis is a problem that needs to be solved in the art.
Disclosure of Invention
The application provides a fault recording method of an IGBT driver and the IGBT driver, and aims to perform fault positioning analysis.
In order to achieve the above object, the present application provides the following technical solutions:
an IGBT driver, the IGBT driver comprising: the IGBT gate electrode sampling unit, the external memory, the data processing unit, the signal sampling module, the fault output unit and the fault signal detection module;
the input end of the IGBT gate electrode sampling unit and the output end of the fault signal detection module are connected with the gate electrode of the IGBT; the IGBT gate electrode sampling unit is used for collecting output signals of the IGBT driver; the fault signal detection module is used for collecting the running state of the IGBT driver;
the output end of the IGBT gate electrode sampling unit is connected with the first input end of the data processing unit; the second input end of the data processing unit is connected with the other output end of the fault signal detection module; the data processing unit is used for receiving data output by the IGBT gate electrode sampling unit, the fault signal detection module and the signal sampling module;
the third input end of the data processing unit is connected with the output end of the signal sampling module; the other output end of the signal sampling module is connected with the input end of the fault signal detection module; the input end of the signal sampling module is connected with the output end of the main control module; the signal sampling module is used for collecting input signals of the IGBT driver;
the fourth input/output end of the data processing unit is connected with the input/output end of the external memory; the external memory is used for storing the data output by the data processing unit;
the other output end of the data processing unit is connected with the input end of the main control module through a fault output unit; the main control module is used for receiving fault information.
Optionally, the signal sampling module includes: a PWM signal input unit and a PWM signal sampling unit;
the input end of the PWM signal input unit is connected with the output end of the main control module; the PWM signal input unit is used for receiving PWM signals sent by the main control module;
the output end of the PWM signal input unit is connected with the input end of the PWM signal sampling unit; the PWM signal sampling unit is used for collecting input signals of the IGBT driver.
Optionally, the fault signal detection module includes: the IGBT driving device comprises a fault signal processing unit, an IGBT driving controller, an IGBT state detection unit and an IGBT gate driving unit;
the input end of the fault signal processing unit is connected with the output end of the IGBT driving controller; the other output end of the IGBT driving controller is connected with the IGBT gate electrode driving unit; the fault signal processing unit is used for collecting the running state of the IGBT driving controller and the running state of the IGBT; the IGBT driving controller and the IGBT gate driving unit are used for controlling the switching of the IGBT;
the input end of the IGBT driving controller is connected with the output end of the IGBT state detection unit; the IGBT state detection unit is used for detecting the running state of the IGBT;
and the input end of the IGBT state detection unit is connected with the collector electrode of the IGBT.
Optionally, the data processing unit includes: a first memory and a second memory;
the first memory is used for storing data before the IGBT driver fails; and the second memory is used for storing data after the IGBT driver fails.
Optionally, the main control module includes: the device comprises a first isolator, a second isolator and a main control board;
the output end of the main control board is connected with the input end of the first isolator; the main control board is used for sending PWM signals; the first isolator is used for isolating and transmitting PWM signals;
the input end of the main control board is connected with the output end of the second isolator; the second isolator is used for isolating and transmitting fault signals.
Optionally, the first and second isolators are in particular optocouplers.
Optionally, the external memory is specifically a flash memory.
Optionally, the data processing unit is specifically a single chip microcomputer.
A fault recording method of an IGBT driver is applied to the IGBT driver, and comprises the following steps:
collecting the running state of the IGBT driver by using a fault signal detection module;
when the running state of the IGBT driver is an abnormal state, the data in the first memory is stored in the external memory by utilizing the data processing unit;
collecting an input signal of the IGBT driver, an output signal of the IGBT driver and an operation state of the IGBT driver by using the data processing unit, and storing the input signal of the IGBT driver, the output signal of the IGBT driver and the operation state of the IGBT driver in a second memory;
and when all the data in the first memory are stored in the external memory, the data in the second memory are stored in the external memory by utilizing the data processing unit.
Optionally, the method further comprises:
detecting the running state of the IGBT by using an IGBT state detection unit;
when the running state of the IGBT is the abnormal state, the IGBT driving controller is utilized to send the fault information of the IGBT to a fault signal processing unit;
when the fault signal processing unit receives the fault information, the fault information is sent to the data processing unit;
when the data processing unit receives the fault information, the fault information is sent to a fault output unit;
and when the fault output unit receives the fault information, the fault information is sent to the main control board through the second isolator.
According to the technical scheme, the input end of the IGBT gate electrode sampling unit and the output end of the fault signal detection module are connected with the gate electrode of the IGBT; the output end of the IGBT gate electrode sampling unit is connected with the first input end of the data processing unit; the second input end of the data processing unit is connected with the other output end of the fault signal detection module; the third input end of the data processing unit is connected with the output end of the signal sampling module; the other output end of the signal sampling module is connected with the input end of the fault signal detection module; the fourth input end/output end of the data processing unit is connected with the input end/output end of the external memory; the other output end of the data processing unit is connected with the input end of the main control module through the fault output unit. Data can be collected no matter whether faults occur or not, and data before and after the faults are stored so as to perform fault location analysis according to the data.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings that are required in the embodiments or the description of the prior art will be briefly described below, it being obvious that the drawings in the following description are only some embodiments of the present application, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
Fig. 1 is a schematic diagram of an architecture of an IGBT driver according to an embodiment of the present disclosure;
fig. 2 is a schematic architecture diagram of another IGBT driver according to an embodiment of the present disclosure;
fig. 3 is a schematic architecture diagram of yet another IGBT driver according to an embodiment of the present disclosure;
FIG. 4 is a schematic diagram of a data processing unit according to an embodiment of the present disclosure;
fig. 5 is a schematic architecture diagram of still another IGBT driver according to an embodiment of the present disclosure;
fig. 6 is a flowchart of a fault recording method of an IGBT driver according to an embodiment of the present application;
fig. 7 is a flowchart of a method for transmitting fault information according to an embodiment of the present application.
Detailed Description
The following description of the embodiments of the present application will be made clearly and fully with reference to the accompanying drawings, in which it is evident that the embodiments described are only some, but not all, of the embodiments of the present application. All other embodiments, which can be made by one of ordinary skill in the art without undue burden from the present disclosure, are within the scope of the present disclosure.
In this application, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.
As shown in fig. 1, an architecture schematic diagram of an IGBT driver according to an embodiment of the present application is provided, where the IGBT driver includes: the IGBT gate sampling unit 11, the external memory 12, the data processing unit 13, the signal sampling module 14, the fault signal detection module 15 and the fault output unit 17.
The input end of the IGBT gate sampling unit 11 and the output end of the fault signal detection module 15 are connected with the gate of the IGBT.
The IGBT gate electrode sampling unit 11 is used for collecting output signals of an IGBT driver; the fault signal detection module 15 is used for collecting the operation state of the IGBT driver.
Optionally, the operating states of the IGBT driver include, but are not limited to: normal state, abnormal state.
It can be understood that the IGBT gate sampling unit 11 collects the output signal of the IGBT driver, i.e., collects the gate signal of the IGBT.
The IGBT driver disclosed based on fig. 1, wherein the fault signal detection module 15 comprises a fault signal processing unit 21, an IGBT drive controller 22, an IGBT state detection unit 23, and an IGBT gate drive unit 24.
As shown in fig. 2, an input terminal of the fault signal processing unit 21 is connected to an output terminal of the IGBT drive controller 22; the other output of the IGBT drive controller 22 is connected to an IGBT gate drive unit 24.
The fault signal processing unit 21 is used for collecting the running state of the IGBT driving controller 22 and the running state of the IGBT; the IGBT drive controller 22 and the IGBT gate drive unit 24 are used to control switching of the IGBTs.
The fault signal processing unit 21 collects the operating state of the IGBT drive controller 22 and the operating state of the IGBT, that is, the data of the IGBT drive controller, so as to collect the data from the input to the output of the whole complete signal chain.
It will be appreciated that the IGBT drive controller 22 and the IGBT gate drive unit 24 control the switching of the IGBTs, that is, PWM signals are sent to the IGBT drive controller 22 via the signal sampling module 14, and the IGBT drive controller 22 and the IGBT gate drive unit 24 can implement the switching control of the IGBTs when the PWM signals are received by the IGBT drive controller 22.
An input terminal of the IGBT drive controller 22 is connected to an output terminal of the IGBT state detection unit 23.
Wherein the IGBT state detection unit 23 is configured to detect an operation state of the IGBT.
An input terminal of the IGBT state detection unit 23 is connected to a collector of the IGBT.
It can be understood that the IGBT operating state is monitored in real time by the IGBT state detection unit 23, and when an IGBT is abnormal, the IGBT drive controller 22 transmits the fault information to the data processing unit 13 by the fault signal processing unit 21, and the fault information is sent to the main control module by the data processing unit 13.
The output end of the IGBT gate electrode sampling unit 11 is connected with the first input end of the data processing unit 13; a second input of the data processing unit 13 is connected to another output of the fault signal detection module 15.
The data processing unit 13 is configured to receive data output by the IGBT gate sampling unit 11, the fault signal detection module 15, and the signal sampling module 14.
It will be appreciated that the data processing unit 13 receives the data output from the IGBT gate sampling unit 11, the fault signal detection module 15, and the signal sampling module 14, that is, the output signal of the IGBT driver transmitted from the IGBT gate sampling unit 11, the operating state of the IGBT driver transmitted from the fault signal detection module 15, and the input signal of the IGBT driver transmitted from the signal sampling module 14.
In one embodiment, the data processing unit 13 is a single-chip microcomputer.
The third input end of the data processing unit 13 is connected with the output end of the signal sampling module 14; the other output of the signal sampling module 14 is connected to the input of the fault signal detection module 15.
The input end of the signal sampling module 14 is connected with the output end of the main control module 16; the signal sampling module 14 is used for collecting input signals of the IGBT driver.
It will be appreciated that the signal sampling module 14 collects the input signals of the IGBT driver, i.e. receives the input signals (i.e. PWM signals) sent by the main control module 16.
The IGBT driver disclosed based on fig. 1 and 2, wherein the signal sampling module 14 includes: a PWM signal input unit 31 and a PWM signal sampling unit 32.
As shown in fig. 3, an input end of the PWM signal input unit 31 is connected to an output end of the main control module 16.
The PWM signal input unit 31 is configured to receive a PWM signal sent by the main control module 16.
It will be appreciated that the PWM signal is a periodically varying square wave signal, the modulation of the output signal being achieved by varying the ratio of the high level time to the low level time of the square wave.
An output terminal of the PWM signal input unit 31 is connected to an input terminal of the PWM signal sampling unit 32.
The PWM signal sampling unit 32 is used for collecting input signals of the IGBT driver.
It will be appreciated that in order to monitor and control the state of the IGBT switches to ensure proper operation of the circuit and to prevent overload or fault conditions, PWM signal sampling unit 32 is required to collect the input signals of the IGBT drivers.
The fourth input/output of the data processing unit 13 is connected to an input/output of the external memory 12.
Wherein the external memory 12 is used for storing data output by the data processing unit 13.
It should be noted that, the external memory 12 will not lose data after power is lost (i.e., the state when the connected circuit or device loses power), and the data can still be read from the external memory 12.
In one embodiment, the external memory 12 is a flash memory.
In some embodiments, the data processing unit 13 comprises: the architecture of the external memory 12 is schematically shown in fig. 4, and the first memory A1 and the second memory A2 are schematically shown.
The first memory A1 is used for storing data before the failure of the IGBT driver; the second memory A2 is used for storing data after the IGBT driver fails.
Alternatively, the first memory A1 may hold the data amount of time length T1, and the second memory A2 may hold the data amount of time length T2.
It can be understood that a certain memory space is reserved in the internal memory space of the data processing unit 13 for storing data before failure, that is, the first memory A1 stores data before failure of the IGBT driver; a certain storage space is reserved for storing data after the failure of the IGBT driver, namely, the second memory A2 is used for storing the data after the failure of the IGBT driver, and when the failure occurs, the data processing unit 13 stores all the data in the first memory A1 into the external memory 12; and continuously collecting the data after the fault, storing the collected data into the second memory A2, and storing the data in the second memory A2 into the external memory 12 when the data in the first memory A1 are completely stored.
According to the process, whether the fault occurs or not, the data after the fault can be continuously collected before the fault occurs or in the period of time when the fault occurs, so that the data before and after the fault can be stored.
The other output end of the data processing unit 13 is connected with the input end of the main control module 16 through a fault output unit 17.
The main control module 16 is configured to receive fault information.
The IGBT driver disclosed based on fig. 1 and 2, wherein the main control module includes: a first isolator 51, a second isolator 52, and a main control board 53.
As shown in fig. 5, an output end of the main control board 53 is connected to an input end of the first isolator 51.
Wherein, the main control board 53 is used for sending PWM signals; the first isolator 51 is used for isolating and transmitting the PWM signal.
It will be appreciated that the main control board 53 sends PWM signals to the IGBT driver via the first isolator 51, and when the IGBT drive controller 22 receives the PWM signals, the IGBT drive controller 22 and the IGBT gate drive unit 24 can implement switching control of the IGBTs.
In one embodiment, the first and second isolators 51, 52 are embodied as optocouplers.
An input end of the main control board 53 is connected to an output end of the second isolator 52.
Wherein the second isolator 52 is used for isolating and transmitting the fault signal.
It will be appreciated that the IGBT operating state is detected in real time by the IGBT state detection unit 23, and when an IGBT is abnormal, the IGBT drive controller 22 will transmit the fault information to the data processing unit 13 through the fault signal processing unit 21, and the data processing unit 13, that is, the data processing unit 13, notifies the main control board 53 of the fault through the fault output unit 17 and the second isolator 52.
In summary, the data processing unit collects the data output by the IGBT gate sampling unit, the fault signal detection module, and the signal sampling module, and the data after the fault is continuously collected no matter whether the fault occurs or not, so that the data before and after the fault is stored, and the fault location analysis is performed according to the data.
Corresponding to the above-mentioned IGBT driver provided in the embodiment of the present application, referring to fig. 6, the embodiment of the present application further provides a flowchart of a fault recording method of an IGBT driver, where the recording method is applicable to the above-mentioned IGBT driver in the embodiment of the present application, and includes the following steps:
s601: and acquiring the running state of the IGBT driver by using the fault signal detection module.
Wherein the operation state includes a normal state and an abnormal state.
S602: when the operating state of the IGBT driver is an abnormal state, the data in the first memory is stored in the external memory using the data processing unit.
It can be understood that when the operation state of the IGBT driver is an abnormal state, it is indicated that the IGBT driver is malfunctioning at this time, and the data in the first memory needs to be stored in the external memory in time.
S603: and acquiring an input signal of the IGBT driver, an output signal of the IGBT driver and an operation state of the IGBT driver by using the data processing unit, and storing the input signal of the IGBT driver, the output signal of the IGBT driver and the operation state of the IGBT driver in the second memory.
It will be appreciated that when the IGBT driver fails, for data integrity, it is also necessary to continuously collect the data after the failure, that is, collect the input signal of the IGBT driver, the output signal of the IGBT driver, and the operating state of the IGBT driver by using the data processing unit, and store the input signal of the IGBT driver, the output signal of the IGBT driver, and the operating state of the IGBT driver in the second memory.
S604: when all the data in the first memory are stored in the external memory, the data in the second memory are stored in the external memory by the data processing unit.
It will be appreciated that when all the data in the first memory is stored in the external memory, it is indicated that all the data before the failure has been transferred, and at this time, the data after the failure needs to be placed in the external memory, that is, the data in the second memory is stored in the external memory by using the data processing unit.
Optionally, the running state of the IGBT is obtained in real time, and if the IGBT fails, in order to timely transmit the failure information to the main control board, so as to perform failure diagnosis and take corresponding measures to ensure stability and reliability. Therefore, in another embodiment of the present application, a method for transmitting fault information, as shown in fig. 7, includes the following steps:
s701: the operating state of the IGBT is detected by an IGBT state detection unit.
S702: and when the running state of the IGBT is abnormal, the IGBT driving controller is utilized to send the fault information of the IGBT to the fault signal processing unit.
It is understood that the fault information of the IGBT is sent to the fault signal processing unit so that the data processing unit processes the fault information.
S703: when the fault signal processing unit receives the fault information, the fault information is sent to the data processing unit.
It is understood that when the received fault signal processing unit receives the fault information transmitted from the IGBT drive controller, the fault information is transmitted to the data processing unit.
S704: when the data processing unit receives the fault information, the fault information is sent to the fault output unit.
It is understood that when the data processing unit receives the fault information transmitted by the fault signal processing unit, the fault information is transmitted to the fault output unit.
S705: and when the fault output unit receives the fault information, the fault information is sent to the main control board through the second isolator.
It can be understood that when the fault output unit receives the fault information sent by the data processing unit, the fault information is sent to the main control board through the second isolator, so that the main control board processes the fault information.
In summary, the data processing unit collects the data output by the IGBT gate sampling unit, the fault signal detection module, and the signal sampling module, and the data after the fault is continuously collected no matter whether the fault occurs or not, so that the data before and after the fault is stored, and the fault location analysis is performed according to the data.
In this specification, each embodiment is described in a progressive manner, and each embodiment focuses on differences from other embodiments, and the same or similar parts of each embodiment are referred to each other. In particular, for a system or system embodiment, since it is substantially similar to a method embodiment, the description is relatively simple, with reference to the description of the method embodiment being made in part. The systems and system embodiments described above are merely illustrative, wherein the elements illustrated as separate elements may or may not be physically separate, and the elements shown as elements may or may not be physical elements, may be located in one place, or may be distributed over a plurality of network elements. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of this embodiment. Those of ordinary skill in the art will understand and implement the present invention without undue burden.
Those of skill would further appreciate that the various illustrative elements and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware, computer software, or combinations of both, and that the various illustrative elements and steps are described above generally in terms of functionality in order to clearly illustrate the interchangeability of hardware and software. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the solution. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present invention.
The previous description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present application. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the application. Thus, the present application is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims (10)
1. An IGBT driver, the IGBT driver comprising: the IGBT gate electrode sampling unit, the external memory, the data processing unit, the signal sampling module, the fault output unit and the fault signal detection module;
the input end of the IGBT gate electrode sampling unit and the output end of the fault signal detection module are connected with the gate electrode of the IGBT; the IGBT gate electrode sampling unit is used for collecting output signals of the IGBT driver; the fault signal detection module is used for collecting the running state of the IGBT driver;
the output end of the IGBT gate electrode sampling unit is connected with the first input end of the data processing unit; the second input end of the data processing unit is connected with the other output end of the fault signal detection module; the data processing unit is used for receiving data output by the IGBT gate electrode sampling unit, the fault signal detection module and the signal sampling module;
the third input end of the data processing unit is connected with the output end of the signal sampling module; the other output end of the signal sampling module is connected with the input end of the fault signal detection module; the input end of the signal sampling module is connected with the output end of the main control module; the signal sampling module is used for collecting input signals of the IGBT driver;
the fourth input/output end of the data processing unit is connected with the input/output end of the external memory; the external memory is used for storing the data output by the data processing unit;
the other output end of the data processing unit is connected with the input end of the main control module through the fault output unit; the main control module is used for receiving fault information.
2. The IGBT driver of claim 1 wherein the signal sampling module comprises: a PWM signal input unit and a PWM signal sampling unit;
the input end of the PWM signal input unit is connected with the output end of the main control module; the PWM signal input unit is used for receiving PWM signals sent by the main control module;
the output end of the PWM signal input unit is connected with the input end of the PWM signal sampling unit; the PWM signal sampling unit is used for collecting input signals of the IGBT driver.
3. The IGBT driver of claim 1 wherein the fault signal detection module comprises: the IGBT driving device comprises a fault signal processing unit, an IGBT driving controller, an IGBT state detection unit and an IGBT gate driving unit;
the input end of the fault signal processing unit is connected with the output end of the IGBT driving controller; the other output end of the IGBT driving controller is connected with the IGBT gate electrode driving unit; the fault signal processing unit is used for collecting the running state of the IGBT driving controller and the running state of the IGBT; the IGBT driving controller and the IGBT gate driving unit are used for controlling the switching of the IGBT;
the input end of the IGBT driving controller is connected with the output end of the IGBT state detection unit; the IGBT state detection unit is used for detecting the running state of the IGBT;
and the input end of the IGBT state detection unit is connected with the collector electrode of the IGBT.
4. The IGBT driver of claim 1 wherein the data processing unit comprises: a first memory and a second memory;
the first memory is used for storing data before the IGBT driver fails; and the second memory is used for storing data after the IGBT driver fails.
5. The IGBT driver of claim 1 wherein the master control module comprises: the device comprises a first isolator, a second isolator and a main control board;
the output end of the main control board is connected with the input end of the first isolator; the main control board is used for sending PWM signals; the first isolator is used for isolating and transmitting PWM signals;
the input end of the main control board is connected with the output end of the second isolator; the second isolator is used for isolating and transmitting fault signals.
6. The IGBT driver according to claim 5, wherein the first and second isolators are in particular optocouplers.
7. IGBT driver according to claim 1, characterized in that the external memory is in particular a flash memory.
8. The IGBT driver according to claim 1, wherein the data processing unit is in particular a single chip microcomputer.
9. A fault recording method for an IGBT driver, applied to the IGBT driver according to any one of claims 1 to 8, comprising:
collecting the running state of the IGBT driver by using a fault signal detection module;
when the running state of the IGBT driver is an abnormal state, the data in the first memory is stored in the external memory by utilizing the data processing unit;
collecting an input signal of the IGBT driver, an output signal of the IGBT driver and an operation state of the IGBT driver by using the data processing unit, and storing the input signal of the IGBT driver, the output signal of the IGBT driver and the operation state of the IGBT driver in a second memory;
and when all the data in the first memory are stored in the external memory, the data in the second memory are stored in the external memory by utilizing the data processing unit.
10. The method as recited in claim 9, further comprising:
detecting the running state of the IGBT by using an IGBT state detection unit;
when the running state of the IGBT is the abnormal state, the IGBT driving controller is utilized to send the fault information of the IGBT to a fault signal processing unit;
when the fault signal processing unit receives the fault information, the fault information is sent to the data processing unit;
when the data processing unit receives the fault information, the fault information is sent to a fault output unit;
and when the fault output unit receives the fault information, the fault information is sent to the main control board through the second isolator.
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