CN117607273A - Ultrasonic phased array sector scanning defect reconstruction method - Google Patents
Ultrasonic phased array sector scanning defect reconstruction method Download PDFInfo
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- CN117607273A CN117607273A CN202311362881.7A CN202311362881A CN117607273A CN 117607273 A CN117607273 A CN 117607273A CN 202311362881 A CN202311362881 A CN 202311362881A CN 117607273 A CN117607273 A CN 117607273A
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- 230000007547 defect Effects 0.000 title claims abstract description 51
- 238000000034 method Methods 0.000 title claims abstract description 15
- 238000005070 sampling Methods 0.000 claims abstract description 14
- PXFBZOLANLWPMH-UHFFFAOYSA-N 16-Epiaffinine Natural products C1C(C2=CC=CC=C2N2)=C2C(=O)CC2C(=CC)CN(C)C1C2CO PXFBZOLANLWPMH-UHFFFAOYSA-N 0.000 claims description 3
- 230000002194 synthesizing effect Effects 0.000 claims description 3
- 230000009466 transformation Effects 0.000 claims description 3
- 238000001514 detection method Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 5
- 238000003384 imaging method Methods 0.000 description 5
- 239000000523 sample Substances 0.000 description 4
- 238000005516 engineering process Methods 0.000 description 3
- 238000012545 processing Methods 0.000 description 3
- 108010076504 Protein Sorting Signals Proteins 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 238000009659 non-destructive testing Methods 0.000 description 1
- 238000002604 ultrasonography Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/04—Analysing solids
- G01N29/06—Visualisation of the interior, e.g. acoustic microscopy
- G01N29/0654—Imaging
- G01N29/069—Defect imaging, localisation and sizing using, e.g. time of flight diffraction [TOFD], synthetic aperture focusing technique [SAFT], Amplituden-Laufzeit-Ortskurven [ALOK] technique
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Abstract
The invention discloses an ultrasonic phased array sector scanning defect reconstruction method, which comprises the steps of firstly setting the scanning interval of an encoder to be the same as the sampling interval of carried ultrasonic phased array equipment, then carrying out sector scanning on a tested piece along a stepping axis by using the encoder to carry the ultrasonic phased array equipment, obtaining multi-frame sector scanning signals and sequentially storing the multi-frame sector scanning signals as text files; and extracting A scanning signals of each wave beam in the text file, re-synthesizing the images, taking the first scanning image as a reference, translating the rest scanning images to the right, and finally carrying out weighted summation on all the images to obtain a reconstructed defect section profile.
Description
Technical Field
The invention belongs to the technical field of nondestructive testing, and particularly relates to an ultrasonic phased array sector scanning defect reconstruction method.
Background
Compared with the conventional ultrasonic probe, the ultrasonic phased array detection technology in the industrial nondestructive detection field is an advanced defect detection technology, and has the advantages that detection signals of multiple beams can be obtained through deflection and focusing of the sound beams without moving the probe, so that multi-angle scanning is realized, and real-time imaging can be realized. The subdivision direction of the technology comprises sector scanning imaging, full focusing imaging, linear scanning imaging and the like.
The invention relates to a fan-scan imaging, which comprises the following main principles: the array probe is used for controlling the excitation time of each array element according to the corresponding emission focusing law and the corresponding receiving focusing law, realizing the deflection and focusing of the sound beam, synthesizing the received data of each array element, acquiring echo detection signals, and processing the signals to obtain clear sound wave defect images.
The method comprises the steps of respectively calculating time and time difference of sound waves of each array element reaching a focusing point according to a designated focusing point when the array element is excited, and sequentially exciting each array element according to the time difference, so that the sound waves of each array element reach the focusing point at the same time, and focusing and deflecting sound beams are realized; the receiving focusing law is to synthesize the signals received by each array element according to the designated virtual focusing point and the propagation time difference of the sound wave when receiving the signals, so as to obtain the echo signals of the wave beam.
A major problem with phased array sector scanning is that at the same time, only the surface normal of the defect will have a significant echo signal parallel to the direction of the sector beam, e.g. for a circular defect, phased array sector scanning always only can get the reflected signal of the arc area within a very small angle of the defect surface, no other area signal can be received, the effective reflection area is as shown in fig. 2, the signal cannot characterize the true shape and size of the defect, and circular defects of different sizes may have sector defect images of the same size, as shown in fig. 3. These problems present a significant challenge for defect assessment of sector scanned images.
Disclosure of Invention
The invention aims to overcome the defects of the prior art and provides an ultrasonic phased array sector scanning defect reconstruction method which can display the surface profile of a defect so as to reflect the size of the defect.
In order to achieve the aim, the invention provides an ultrasonic phased array sector scanning defect reconstruction method which is characterized by comprising the following steps:
(1) Scanning the tested piece to obtain a text file consisting of A scanning signals;
(1.1), the scanning interval of the set encoder is the same as the sampling interval of the carried ultrasonic phased array equipment, and the following conditions are satisfied:
wherein c is the propagation speed of sound waves in a tested piece, delta t is the sampling time interval of each wave beam, and d is the sampling interval;
(1.2) carrying an ultrasonic phased array device by using an encoder to conduct sector scanning on a tested piece along a stepping axis, obtaining n frames of sector scanning signals in total, wherein each frame of sector scanning signal consists of A scanning signals of each wave beam, and finally storing each frame of sector scanning signal into text files in sequence to obtain n text files in total;
sector scanning of ultrasonic phased array equipment is provided, which comprises N beams and has a scanning angle range of theta 1 ～θ p And there is a beam every one degree of interval, then each text file includes p rows, each row is an a-scan signal of a beam, and the a-scan signal of each beam includes m sampling points;
(2) Extracting A scanning signals of each wave beam in the text file and re-synthesizing the image;
taking out the A scanning signals of the same line in n text files, synthesizing p m x n two-dimensional images, and carrying out affine transformation on each two-dimensional image to obtain scanning images corresponding to all scanning angles, wherein p total scanning images are obtained;
(3) Translating the scanned image;
taking the first scanned image as a reference, translating the rest scanned images to the right by K i A pixel;
wherein OA is i Representing the point of incidence A of the origin to the ith beam i Is a distance of (2);
(4) And carrying out weighted summation on the first scanning image and the rest translated images to obtain a reconstructed defect cross-section profile.
The invention aims at realizing the following steps:
the invention relates to an ultrasonic phased array sector scanning defect reconstruction method, which comprises the steps of firstly setting the scanning interval of an encoder to be the same as the sampling interval of carried ultrasonic phased array equipment, then carrying out sector scanning on a tested piece along a stepping axis by using the encoder to carry the ultrasonic phased array equipment, obtaining multi-frame sector scanning signals and sequentially storing the multi-frame sector scanning signals as text files; and extracting A scanning signals of each wave beam in the text file, re-synthesizing the images, taking the first scanning image as a reference, translating the rest scanning images to the right, and finally carrying out weighted summation on all the images to obtain a reconstructed defect section profile.
The invention relates to an ultrasonic phased array sector scanning defect reconstruction method.
Meanwhile, the ultrasonic phased array sector scanning defect reconstruction method provided by the invention has the following beneficial effects:
(1) The invention can restore the partial outline of the defect section, although only a small part of the outline is needed, the outline of the other side can be obtained if the scanning is performed in the reverse direction, and the outlines of the two parts can basically reflect the upper surface condition of the defect.
(2) The invention can characterize the basic size of the defect, and the true size of the defect is difficult to distinguish by the fan-scan image of a single frame, because defects with different sizes can have defect images with the same size, as shown in fig. 3, and the invention can reflect the basic size of the defect due to the reconstruction of the contour surface.
(3) The present invention can also reflect the normal direction of the defect surface with an arrow diagram, and can be used as an auxiliary determination method for the profile shape of the defect surface as shown in fig. 11.
Drawings
FIG. 1 is a flow chart of a method for reconstructing an ultrasonic phased array sector scanning defect;
FIG. 2 is a schematic view of the effective reflection area of a circular defect under sector scanning;
FIG. 3 is a contrast plot of sector images of different size defects;
FIG. 4 is a schematic view of a scanning along a walking axis;
FIG. 5 is a schematic diagram of phased array sampling intervals and scanning intervals;
FIG. 6 is an example of re-synthesized beam images;
FIG. 7 is a schematic diagram of coordinates for establishing an ultrasound phased array;
FIG. 8 is a schematic illustration of the point of incidence of each beam at an interface;
FIG. 9 is a schematic view of the circular cross-sectional area characterized by each beam image;
FIG. 10 is a scanning schematic of the beam images;
FIG. 11 is a graph of the result after fusing 36 beam images;
fig. 12 is an arrow diagram characterizing a defect surface normal.
Detailed Description
The following description of the embodiments of the invention is presented in conjunction with the accompanying drawings to provide a better understanding of the invention to those skilled in the art. It is to be expressly noted that in the description below, detailed descriptions of known functions and designs are omitted here as perhaps obscuring the present invention.
Examples
Fig. 1 is a flow chart of a method for reconstructing an ultrasonic phased array sector scanning defect.
In this embodiment, as shown in fig. 4, the encoder or the mechanical arm is used to carry the phased array probe to scan along the direction parallel to the scanning section, and then all the fan-shaped scanning signals are processed and fused, so that the outline shape of the defect surface can be obtained, and the size of the defect can be represented.
The following describes the method for reconstructing the ultrasonic phased array sector scanning defect in detail, as shown in fig. 1, and specifically comprises the following steps:
s1, scanning a tested piece to obtain a text file consisting of A scanning signals;
in the embodiment, the encoder generally comprises two scanning directions of a scanning shaft and a stepping shaft, and experimental verification shows that the encoder is used for carrying ultrasonic phased array equipment to scan a tested piece along the stepping shaft in a fan-shaped manner, so that information of more defect sections can be obtained;
in addition, before scanning, the scanning interval of the encoder is the same as the sampling interval d of the carried ultrasonic phased array equipment, and the following requirements are met:
wherein c is the propagation speed of sound waves in the tested piece, and deltat is the sampling time interval of each wave beam;
the scanning interval of the encoder is the same as the sampling interval of the phased array device, as shown in fig. 5, so that the same length-width ratio can be ensured during subsequent image processing.
In this embodiment, we store each frame of fan scan signal scanned along the walking axis as a text file in order, store each frame of fan scan signal as a text file in order, and obtain 1250 text files in total, where each frame of fan scan signal is composed of a scan signals of each beam, and in this embodiment, a scan angle range of 30 ° to 65 ° is defined by taking fan scan of 36 beams as an example, and there is one beam at each interval, then each text file contains 36 lines, each line is an a scan signal of one beam, for example, the first line corresponds to a beam a scan signal of 30 °, and the last line corresponds to a beam a scan signal of 65 °, and in this embodiment, the a scan signal of each beam is set to contain 900 sampling points.
S2, extracting the A scanning signals of each wave beam to re-synthesize an image;
in this embodiment, for the 1250 text files obtained, the a-scan signals of the same line are extracted, and 36 two-dimensional images 1250×900 are synthesized. For example, the a-scan signal sequence of the same line of each text file is sequentially taken out as each column of the two-dimensional image, a first two-dimensional image is obtained, and the like, and 36 two-dimensional images are obtained.
As shown in fig. 6, affine transformation is performed on each two-dimensional image to obtain 36 scan images corresponding to respective scan angles, which are equivalent to the result of scanning with a beam of a certain fixed angle, for example, the first scan image, which is equivalent to the result of simultaneously scanning with 1250 beams of 30 °, as shown in fig. 10.
S3, translating the scanned image;
because the incidence points of the beams with different angles at the interface of the wedge block and the tested piece are different, before the 36 scanning images are fused, each scanning image needs to be translated to a corresponding position.
In this embodiment, as shown in fig. 7, we record the array element center of the ultrasonic phased array as H, take the intersection point of the interface of the tested piece and the directly lower part of the array element center as the origin of coordinates O, take the vertical downward direction as the Z axis, and take the horizontal direction as the X axis, and construct the coordinate system;
the incident point of each beam is shown in FIG. 8, the first scanned image is taken as a reference, and the rest scanned images are shifted to the right by K i A pixel;
wherein OA is i Representing the point of incidence A of the origin to the ith beam i Is a distance of (2);
s4, reconstructing a defect section;
and carrying out weighted summation on the first scanning image and the rest translated images to obtain a reconstructed defect section profile.
In this embodiment, after the processing in step S3, the 36 images may respectively represent different areas of the circular defect cross section, as shown in fig. 9.
It is apparent that the most intense reflected signal will be present only when the normal angle of the cross-section is the same as the beam angle, and therefore, the 36 pictures represent the arc area of the defect cross-section in the range of 30 ° to 65 °, and the 36 pictures are directly superimposed and divided by 36, and the cross-section profile will be outlined as shown in fig. 11.
As can be seen by comparing the figures, the profile of the defect cross section substantially corresponds to the shape of the image, except that the arcuate nature of the image is not particularly pronounced since the fan angle is only 30 ° to 65 °. Since there is the strongest reflected signal only when the normal angle of the cross-section is the same as the beam angle, and the 36 pictures represent 36 scan directions, respectively, the direction represented by the picture with the largest pixel value at that position is essentially the normal direction of the defective cross-section at that point for the same pixel position.
The normal direction of each point is indicated by an arrow diagram, and the size of the arrow indicates the pixel value of the point, as shown in fig. 12. This gives an arrow map characterizing the normal to the defect cross-section.
Further, the approximate size of the defect can be directly determined from the composite image, which is not possible with the single Zhang Saomiao image.
While the foregoing describes illustrative embodiments of the present invention to facilitate an understanding of the present invention by those skilled in the art, it should be understood that the present invention is not limited to the scope of the embodiments, but is to be construed as protected by the accompanying claims insofar as various changes are within the spirit and scope of the present invention as defined and defined by the appended claims.
Claims (1)
1. The ultrasonic phased array sector scanning defect reconstruction method is characterized by comprising the following steps of:
(1) Scanning the tested piece to obtain a text file consisting of A scanning signals;
(1.1), the scanning interval of the set encoder is the same as the sampling interval d of the carried ultrasonic phased array equipment, and the following conditions are satisfied:
wherein c is the propagation speed of sound waves in the tested piece, and deltat is the sampling time interval of each wave beam;
(1.2) carrying out sector scanning on a tested piece along a stepping axis by using an encoder carrying ultrasonic phased array equipment, obtaining n frames of sector scanning signals in total, wherein each frame of sector scanning signal consists of A scanning signals of each wave beam, and finally storing each frame of sector scanning signal into a text file in sequence to obtain n text files in total;
sector scanning of ultrasonic phased array equipment is provided, which comprises N beams and has a scanning angle range of theta 1 ～θ p And there is a beam every one degree of interval, then each text file includes p rows, each row is an a-scan signal of a beam, and the a-scan signal of each beam includes m sampling points;
(2) Extracting A scanning signals of each wave beam in the text file and re-synthesizing the image;
taking out the A scanning signals of the same line in n text files, synthesizing p m x n two-dimensional images, and carrying out affine transformation on each two-dimensional image to obtain scanning images corresponding to all scanning angles, wherein p total scanning images are obtained;
(3) Translating the scanned image;
taking the first scanned image as a reference, translating the rest scanned images to the right by K i A pixel;
wherein OA is i Representing the point of incidence A of the origin to the ith beam i Is a distance of (2);
(4) And carrying out weighted summation on the first scanning image and the rest translated images to obtain a reconstructed defect cross-section profile.
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| CN202311362881.7A CN117607273A (en) | 2023-10-19 | 2023-10-19 | Ultrasonic phased array sector scanning defect reconstruction method |
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| CN202311362881.7A CN117607273A (en) | 2023-10-19 | 2023-10-19 | Ultrasonic phased array sector scanning defect reconstruction method |
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