CN117554037A - Polarization optical axis measuring device - Google Patents
Polarization optical axis measuring device Download PDFInfo
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- CN117554037A CN117554037A CN202311398314.7A CN202311398314A CN117554037A CN 117554037 A CN117554037 A CN 117554037A CN 202311398314 A CN202311398314 A CN 202311398314A CN 117554037 A CN117554037 A CN 117554037A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0207—Details of measuring devices
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0221—Testing optical properties by determining the optical axis or position of lenses
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Abstract
The application provides a polarized light axis measuring device, which comprises an automatic mobile carrier, a polarization state generator, a polarization state analyzer and an automatic position regulator. The automatic moving carrier is provided with a polarized lens, and a polarization state generator and a polarization state analyzer are respectively arranged above and below the automatic moving carrier. The polarization state generator generates an incident polarized light beam, and the automatic moving stage moves the polarized lens to coincide the optical path of the incident polarized light beam with the normal line of the point to be measured passing through the polarized lens. The polarization lens refracts the incident polarized light beam to form an emergent polarized light beam, and the automatic position regulator moves the light receiving inlet of the polarization state analyzer to the optical path of the emergent polarized light beam so as to receive the emergent polarized light beam and further measure the direction of the polarized light axis corresponding to the to-be-measured point.
Description
Technical Field
The present disclosure relates to measuring devices, and particularly to a polarized light axis measuring device.
Background
Polarization axis measurement is a method used to determine the direction of vibration in polarized light. Polarized light refers to light having a specific orientation in the vibration direction, and its light wave vibrates more strongly in a certain direction than ordinary light.
The core of the biscuit (Pancake) optics is the folded light path design, which needs to ensure that the polarized light passes through the 1/4 wave plate at 45 degrees to achieve the best folding effect, so that the angle between the whole-surface polarizer of the biscuit lens and the optical axis of the 1/4 wave plate needs to be monitored. Today's polarizer (polarizer) machines for measuring the polarization axis are designed mainly for thin films and lens vertices. When a plurality of points of the biscuit lens need to be measured, a plurality of different jigs need to be designed so as to meet the requirement of normal incidence of an incident light path. Furthermore, the incident light is refracted through the lens, so a manual adjustment of a Polarization State Analyzer (PSA) is required to capture the outgoing light. However, the jig has high processing cost and long time consumption, and the polarization axis of the whole surface of the automatic monitoring lens cannot be realized. When the polarization state analyzer is manually adjusted to capture the outgoing light, there may still be an outgoing spot beyond the analyzer, resulting in low measurement accuracy.
Disclosure of Invention
Accordingly, the present application addresses the above-described problems by providing a polarization axis measurement device.
The application provides a polarization optical axis measuring device, it monitors multiple spot polarization performance to promote measurement accuracy and efficiency.
In one embodiment of the present application, a polarization axis measuring device is used for measuring a polarization axis of a polarized lens. The polarization axis measuring device includes an automatic moving stage, a polarization-state generator (PSG), a polarization-state analyzer (PSA), and a first automatic position adjuster. The top surface of the automatic moving carrier is provided with a polarized lens, and the polarization state generator is positioned above the polarized lens. The polarization state generator is used for generating an incident polarized light beam. The automatic moving carrier is used for moving the polarized lens to coincide the optical path of the incident polarized light beam with the normal line of the point to be measured passing through the polarized lens. The polarization state analyzer is positioned below the polarization lens, and the first automatic position regulator is provided with the polarization state analyzer. The polarizing lens is used for refracting the incident polarized light beam to form an emergent polarized light beam. The first automatic position adjuster is for moving the light receiving entrance of the polarization state analyzer into the optical path of the outgoing polarized light beam. The polarization state analyzer is used for receiving the emergent polarized light beam so as to measure the direction of the polarized optical axis corresponding to the to-be-measured point.
In an embodiment of the present application, the position of the automatic moving stage corresponds to a first X axis, a first Y axis and a Z axis that are perpendicular to each other, and the polarization state generator and the polarization state analyzer are respectively located above and below a first XY plane formed by the first X axis and the first Y axis. The automatic movement stage is used to move the polarized lens in the first X-axis, the first Y-axis, or the Z-axis, or to rotate the polarized lens in the first XY-plane.
In an embodiment of the present application, an intersection point of the first X axis, the first Y axis and the Z axis is located at a center point of the polarizing lens, the polarization state analyzer corresponds to a second X axis and a second Y axis which are perpendicular to each other, a second XY plane formed by the second X axis and the second Y axis is parallel to the first XY plane, the second X axis and the second Y axis are respectively parallel to the first X axis and the first Y axis, and an intersection point of the second X axis and the second Y axis is located at a light receiving inlet of the polarization state analyzer. The first automatic position adjuster is used to move the polarization state analyzer on the second Y-axis or to drive the polarization state analyzer to rotate about the second X-axis, the second Y-axis, or the first Y-axis.
In an embodiment of the present application, the polarization axis measuring device further comprises a second automatic position adjuster, on which the polarization state generator is provided. The second automatic position adjuster is used for driving the polarization state generator to rotate around the first Y axis.
In an embodiment of the present application, the polarization axis measuring device further includes a light receiver disposed at a light receiving inlet of the polarization state analyzer. The light receiver is used for reducing the size of a light spot of the emergent polarized light beam to be smaller than the size of the light receiving inlet.
In an embodiment of the present application, the polarization axis measuring device further includes an optical tracker disposed between the polarization state analyzer and the polarization lens. The light tracker is used for tracking the position of the emergent polarized light beam.
In an embodiment of the present application, the optical tracker includes a first half mirror (half mirror), a convex lens, a second half mirror, a first image capturing device and a second image capturing device. The first half-through half-mirror is positioned between the polarizing lens and the polarization state analyzer and in the optical path of the outgoing polarized light beam. The first half-penetrating half mirror is used for reflecting the emergent polarized light beam to form a first polarized light beam to be tested. The convex lens and the second half-penetrating half mirror are positioned on the optical path of the first polarized light beam to be tested. When the first to-be-measured polarized light beam sequentially passes through the convex lens and the second half-penetrating half-reflecting mirror, the second half-penetrating half-reflecting mirror reflects the first to-be-measured polarized light beam to form a second to-be-measured polarized light beam. The first image capturing device and the second image capturing device are respectively positioned on the optical paths of the first to-be-detected polarized light beam and the second to-be-detected polarized light beam. The first image capturing device and the second image capturing device are used for respectively obtaining the light spots of the first to-be-detected polarized light beam and the second to-be-detected polarized light beam.
In an embodiment of the present application, the polarization axis measuring device further includes an auto-collimator disposed above the polarization lens, and the auto-collimator and the polarization state generator are disposed at different horizontal positions with respect to the polarization lens. When the auto-collimator generates the reference beam, the automatic moving stage moves the polarizing lens to the optical path of the reference beam to reflect the reference beam to form a beam to be measured, and transmits the beam to be measured back to the auto-collimator.
In one embodiment of the present application, an auto-collimator includes a light source, a polarizing beam splitter, and an image capturing device. The light source is used for generating a reference beam, and the polarization spectroscope is positioned on the optical path of the reference beam. After the reference beam is emitted to the polarizing lens through the polarizing spectroscope, the polarizing spectroscope reflects the beam to be measured to form the beam to be corrected. The image capturing element is located on the optical path of the light beam to be corrected, wherein the image capturing element is used for obtaining the light spot of the light beam to be corrected.
In an embodiment of the present application, the polarization axis measurement device further includes a host computer electrically connected to the automatic moving stage and the first automatic position adjuster, and configured to drive the automatic moving stage and the first automatic position adjuster.
Based on the above, the polarization optical axis measuring device adopts the automatic moving stage and the automatic position regulator to move the positions of the polarization state generator and the polarization state analyzer so as to coincide the optical path of the incident polarized light beam with the normal line of the point to be measured passing through the polarizing lens, accurately capture the emergent polarized light beam, measure the direction of the polarization optical axis corresponding to the point to be measured, and monitor the multi-point polarization performance so as to improve the measurement accuracy and efficiency.
Drawings
Fig. 1 is a schematic diagram of a polarization axis measurement device according to an embodiment of the present application.
Fig. 2 is a schematic diagram of a light tracker according to an embodiment of the present application.
Fig. 3 is a schematic view of an auto-collimator according to an embodiment of the present application.
Fig. 4 is a flowchart of a method for using a polarization axis measurement device according to an embodiment of the present application.
Reference numerals illustrate:
10: a polarizing lens;
12: automatically moving the carrier;
14: a polarization state generator;
16: a polarization state analyzer;
18: a first automatic position adjuster;
20: a light receiving inlet;
22: a second automatic position adjuster;
24: a case;
26: a light receiver;
28: a light tracker;
30: an autocollimator;
31: a computer host;
32: a first half-through half mirror;
34: a convex lens;
36: a second half-through half mirror;
38: a first image capturing device;
40: a second image capturing device;
42: a light source;
44: a polarizing beam splitter;
46: an image capturing element;
x1: a first X axis;
y1: a first Y axis;
z: a Z axis;
x2: a second X axis;
y2: a second Y axis;
s10, S12, S14, S16, S18, S20, S22, S24, S26, S28: and (3) step (c).
Detailed Description
Embodiments of the present application will be further illustrated below in conjunction with the associated drawings. Wherever possible, the same reference numbers will be used throughout the drawings and the description to refer to the same or like parts. In the drawings, the shape and thickness may be exaggerated for simplicity and convenience. It will be appreciated that elements not specifically shown in the drawings or described in the specification are forms known to those skilled in the art. Many variations and modifications may be made by one skilled in the art in light of the disclosure herein.
When an element is referred to as being "on" …, it can be broadly interpreted as referring to the element directly on the other element or intervening elements may be present. In contrast, when an element is referred to as being "directly on" another element, it can be without other elements present therebetween. As used herein, the term "and/or" includes any combination of one or more of the listed associated items.
The following description of "one embodiment" or "an embodiment" refers to a particular element, structure, or characteristic that is associated with at least one embodiment. Thus, the appearances of the phrase "one embodiment" or "an embodiment" in various places in the following are not necessarily all referring to the same embodiment. Furthermore, the particular features, structures, and characteristics of the embodiments may be combined in any suitable manner.
The present application is described with particular reference to the following examples, which are intended to be illustrative only, since various modifications and changes may be made by those skilled in the art without departing from the spirit and scope of the present application, and the scope of the present application is therefore to be determined only by the appended claims. Throughout the specification and claims, the meaning of "a" and "the" include such recitation as "one or at least one" of the element or component unless the context clearly dictates otherwise. Furthermore, as used herein, the singular articles also include a recitation of a plurality of elements or components unless it is apparent from the specific context that the plural is excluded. Moreover, when used in this description and throughout the claims that follow, the meaning of "in" may include "in" and "on" unless the context clearly dictates otherwise. The words used throughout the specification and claims unless otherwise indicated, each and every term used in this field is generally understood to mean both the context of the present application and the specific context. Some of the words used to describe the present application will be discussed below or elsewhere in this specification to provide additional guidance to those skilled in the art in the description of the present application. The use of examples anywhere throughout this specification including any examples of words discussed herein is for illustration only, and certainly not limiting of the scope and meaning of this application or any example words. As such, the present application is not limited to the various embodiments set forth in this specification.
It will be appreciated that the words "including", "having", "containing" and the like as used herein are open ended, meaning including, but not limited to. Furthermore, not all of the objects, advantages, or features disclosed in this application are required to be achieved in any one embodiment or scope of the claims. Furthermore, the Abstract is provided solely for the purposes of facilitating retrieval of patent documents and is not intended to limit the scope of the claims herein.
Unless specifically stated otherwise, some terms or words such as "may", "possible", "perhaps", or "may" are generally intended to express that the present embodiments have, but may also be construed as possibly unnecessary features, elements, or steps. In other embodiments, these features, elements, or steps may not be required.
The following describes a polarized light axis measuring device, which adopts an automatic moving stage and an automatic position regulator to move the positions of a polarized state generator and a polarized state analyzer so as to coincide the optical path of an incident polarized light beam with the normal line of a to-be-measured point passing through a polarized lens, accurately capture an emergent polarized light beam, measure the direction of a polarized light axis corresponding to the to-be-measured point, and monitor the multi-point polarization performance so as to improve the measurement accuracy and efficiency.
Fig. 1 is a schematic diagram of a polarization axis measurement device according to an embodiment of the present application. Referring to fig. 1, a polarization axis measuring device is used to measure the polarization axis of a polarized lens 10. The polarizing lens 10 may be a curved lens or a planar lens, here illustrated as a cookie (Pancake). The polarization axis measuring device includes an automatic moving stage 12, a polarization-state generator (PSG) 14, a polarization-state analyzer (PSA) 16, and a first automatic position adjuster 18. The automatic moving carrier 12 and the first automatic position regulator 18 are both provided with motors, so that the external object can be driven to move. The automatic moving stage 12 may be a transparent stage, and the top surface of the automatic moving stage 12 is provided with a polarizing lens 10, and the polarization state generator 14 is located above the polarizing lens 10. The polarization state analyzer 16 is located below the polarization lens 10, and the first automatic position adjuster 18 is provided with the polarization state analyzer 16. The polarization state generator 14 is used for generating an incident polarized light beam. The automated motion stage 12 moves the polarized lens 10 to coincide the optical path of the incident polarized light beam with the normal to the point to be measured through the polarized lens 10. The polarizing lens 10 is used for refracting an incident polarized light beam to form an outgoing polarized light beam. The first automatic position adjuster 18 moves the light receiving inlet 20 of the polarization state analyzer 16 onto the optical path of the outgoing polarized light beam, and the polarization state analyzer 16 receives the outgoing polarized light beam to measure the direction of the polarized light axis corresponding to the point to be measured.
In some embodiments of the present application, the position of the automatic moving stage 12 corresponds to a first X-axis X1, a first Y-axis Y1, and a Z-axis Z that are perpendicular to each other, and the polarization state generator 14 and the polarization state analyzer 16 are respectively located above and below a first XY plane formed by the first X-axis X1 and the first Y-axis Y1, and the automatic moving stage 12 may move the polarization lens 10 on the first X-axis X1, the first Y-axis Y1, or the Z-axis Z, or rotate the polarization lens 10 on the first XY plane. For example, the intersection of the first X-axis X1, the first Y-axis Y1, and the Z-axis Z may be located at the center point of the polarized lens 10. The polarization state analyzer 16 corresponds to a second X axis X2 and a second Y axis Y2 that are perpendicular to each other, and a second XY plane formed by the second X axis X2 and the second Y axis Y2 is parallel to the first XY plane, and the second X axis X2 and the second Y axis Y2 are respectively parallel to the first X axis X1 and the first Y axis Y1. The intersection of the second X-axis X2 and the second Y-axis Y2 may be located at the light receiving entrance 20 of the polarization state analyzer 16, and the first automatic position adjuster 18 moves the polarization state analyzer 16 on the second Y-axis Y2 or drives the polarization state analyzer 16 to rotate about the second X-axis X2, the second Y-axis Y2, or the first Y-axis Y1. In addition, the polarization axis measuring device may further include a second automatic position adjuster 22 on which the polarization state generator 14 is provided. A motor is provided in the second automatic position adjuster 22. The second automatic position adjuster 22 is used to drive the polarization state generator 14 to rotate about the first Y-axis Y1. The polarization state analyzer 16 can measure a plurality of points to be measured by utilizing the position adjusting functions of the automatic moving stage 12, the first automatic position adjuster 18 and the second automatic position adjuster 22, so as to improve the measurement accuracy and efficiency. In order to be able to support the automatic moving stage 12, the first automatic position adjuster 18 and the second automatic position adjuster 22, the polarization axis measuring device may further include a case 24 having a partition therein, which can partition the case 24 into an upper space and a lower space. The automatic moving stage 12 is located on the partition and in the upper space, and the first automatic position adjuster 18 and the second automatic position adjuster 22 are located in the upper space and the lower space, respectively.
In some embodiments of the present application, the polarization axis measuring device may further include a light receiver 26, a light tracker 28, an auto-collimator 30, and a host computer 31. The light receiver 26 is provided at the light receiving inlet 20 of the polarization state analyzer 16. If the polarizing lens is a non-planar lens, the light receiver 26 may reduce the size of the light spot of the outgoing polarized light beam to be smaller than the size of the light receiving inlet 20, so that the polarization state analyzer 16 may easily receive the outgoing polarized light beam. The light tracker 28 is arranged between the polarization state analyzer 16 and the polarization lens 10. The light tracker 28 is used to track the position of the outgoing polarized light beam. After the light tracker 28 confirms the position of the outgoing polarized light beam, the light tracker 28 may be moved away from between the polarization state analyzer 16 and the polarization lens 10 such that the optical path of the outgoing polarized light is perpendicular to the light receiving entrance 20 of the polarization state analyzer 16 and the outgoing polarized light is collimated by the incoming polarization state analyzer 16. The auto-collimator 30 is disposed above the polarized lens 10, and the auto-collimator 30 and the polarization state generator 14 are disposed at different horizontal positions with respect to the polarized lens 10, i.e., the auto-collimator 30 and the polarization state generator 14 are disposed directly above different regions of the first XY plane. Autocollimator 30 may be located in the upper space of housing 24. When the autocollimator 30 generates a reference beam, the automated motion stage 12 moves the polarizing lens 10 to the optical path of the reference beam to reflect the reference beam to form a beam to be measured and transmit the beam to be measured back to the autocollimator 30. The autocollimator 30 is used to correct the level of the polarized lens 10. The computer 31 is electrically connected to the automatic moving stage 12, the first automatic position adjuster 18 and the second automatic position adjuster 22, and the computer 31 controls the automatic moving stage 12, the first automatic position adjuster 18 and the second automatic position adjuster 22.
Fig. 2 is a schematic diagram of a light tracker according to an embodiment of the present application. Referring to fig. 1 and 2, the optical tracker 28 includes a first half mirror (half mirror) 32, a convex lens 34, a second half mirror 36, a first image capturing device 38 and a second image capturing device 40. The first half mirror 32 is located between the polarizing lens 10 and the polarization state analyzer 16 and in the optical path of the outgoing polarized light beam. The first half mirror 32 reflects the outgoing polarized light beam to form a first polarized light beam to be measured. The convex lens 34 and the second half mirror 36 are located on the optical path of the first polarization beam to be measured. When the first to-be-measured polarized light beam sequentially passes through the convex lens 34 and the second half-penetrating half-reflecting mirror 36, the second half-penetrating half-reflecting mirror 36 reflects the first to-be-measured polarized light beam to form a second to-be-measured polarized light beam. The first image capturing device 38 and the second image capturing device 40 are respectively located on the optical paths of the first to-be-detected polarized light beam and the second to-be-detected polarized light beam. The first image capturing device 38 and the second image capturing device 40 respectively obtain the light spots of the first polarized light beam to be tested and the second polarized light beam to be tested. The first image capturing device 38 and the second image capturing device 40 are respectively provided with a schematic view of the positions of the light spots, wherein the light spots represented by the solid points are located at the central positions of the screen and correspond to the solid-line light beams, and the light spots represented by the cross-line points are located at the non-central positions of the screen and correspond to the dotted-line light beams. The horizontal axis of the display screen of the first image picker 38 represents the degree of movement of the polarization state analyzer 16 on the second Y axis, and the vertical axis of the display screen of the first image picker 38 represents the degree of rotation of the polarization state analyzer 16 about the first Y axis Y1, i.e., the skew (tilt). The horizontal axis of the display screen of the second image capturing device 40 represents the degree of rotation, i.e., the inclination (pitch), of the polarization state analyzer 16 about the second Y axis Y2. The horizontal axis of the display screen represented by the vertical axis of the display screen of the second image picker 40 represents the degree by which the polarization state analyzer 16 rotates about the second X axis X2, i.e., the yaw (yaw). When the automated motion stage 12 moves the polarized lens 10 such that the solid line point and the cross-sectional line point completely coincide, the light tracker 28 may be moved away from between the polarization state analyzer 16 and the polarized lens 10 such that the optical path of the outgoing polarized light is perpendicular to the light receiving entrance 20 of the polarization state analyzer 16 and the outgoing polarized light is collimated into the polarization state analyzer 16.
Fig. 3 is a schematic view of an auto-collimator according to an embodiment of the present application. Referring to fig. 3, the auto-collimator 30 includes a light source 42, a polarization beam splitter 44, and an image capturing device 46. The light source 42 produces a reference beam and the polarizing beamsplitter 44 is located in the optical path of the reference beam. After the reference beam is directed to the polarizing lens 10 through the polarizing beam splitter 44, the polarizing lens 10 reflects the reference beam to form a beam to be measured, and the polarizing beam splitter 44 reflects the beam to be measured to form a beam to be corrected. The image capturing element 46 is located on the optical path of the light beam to be corrected, wherein the image capturing element 46 captures the light spot of the light beam to be corrected. The image capturing element 46 has a schematic view of the spot position shown beside it, wherein the spot represented by the solid point is located at the central position of the screen and corresponds to the solid line beam, and the spot represented by the cross-hatched point is located at the non-central position of the screen and corresponds to the dashed line beam. The solid line beam represents the standard beam and the dotted line beam represents the beam reflected by the top and bottom surfaces of the polarization lens 10. When the automatic movement stage 12 moves the polarized lens 10 so that the solid line point and the cross-sectional line point completely coincide, it means that the polarized lens 10 is in a horizontal state.
Fig. 4 is a flowchart of a method for using the polarizing axis measurement device according to an embodiment of the present application, please refer to fig. 4 and fig. 1. First, as shown in step S10, when the auto-collimator 30 generates the reference beam, the auto-moving stage 12 moves the polarizing lens 10 to the optical path of the reference beam to reflect the reference beam to form the beam to be measured, and transmits the beam to be measured back to the auto-collimator 30 until the polarizing lens 10 is in a horizontal state. In step S12, design parameters of the polarized lens 10, such as radius of curvature, conic coefficient, lens diameter and aspheric coefficient, are input into the computer 31 to obtain the surface profile of the polarized lens 10. In step S14, the distance and azimuth angle of the point to be measured of the polarizer 10 relative to the center of the polarizer 10 are input into the host computer 31. In step S16, the host computer 31 controls the automatic movement stage 12 to move the polarization lens 10 to the positions corresponding to the polarization state generator 14 and the polarization state analyzer 16 according to the input parameters. In step S18, the computer host 31 simulates a refraction angle corresponding to the normal passing through the point to be measured and the point to be measured according to the distance between the point to be measured and the center of the polarized lens 10. In step S20, the computer host 31 controls the second automatic position adjuster 22 to drive the polarization state generator 14 to rotate around the first Y-axis Y1, so that the emitting port of the polarization state generator 14 is aimed at the normal line passing through the point to be measured, and controls the first automatic position adjuster 18 to move the light receiving inlet 20 of the polarization state analyzer 16 onto the refractive optical path corresponding to the point to be measured. As shown in step S22, the refractive optical path is tracked by the light tracker 28, causing the refractive optical path to collimate the incident polarization state analyzer 16. As shown in step S24, the light tracker 28 is moved away from between the polarization state analyzer 16 and the polarization lens 10, and the polarization state generator 14 generates an incident polarized light beam, wherein the optical path of the incident polarized light beam coincides with the normal line passing through the point to be measured of the polarization lens 10. The polarizing lens 10 refracts an incident polarized light beam to form an outgoing polarized light beam. The polarization state analyzer 16 receives the outgoing polarized light beam to measure the direction of the polarized optical axis corresponding to the point to be measured. As shown in step S26, the host computer 31 determines whether all the measurement points have been measured, if yes, the process proceeds to step S28, and if not, the process returns to step S16 to measure the direction of the polarizing axis corresponding to the next measurement point.
According to the embodiment, the polarization axis measuring device adopts the automatic moving stage and the automatic position regulator to move the positions of the polarization state generator and the polarization state analyzer so as to coincide the optical path of the incident polarization beam with the normal line of the point to be measured passing through the polarization lens, accurately capture the emergent polarization beam, measure the direction of the polarization axis corresponding to the point to be measured, monitor the multi-point polarization performance and improve the measurement accuracy and efficiency.
The foregoing description of the preferred embodiment is merely exemplary and is not intended to limit the scope of the present application, but rather, all equivalent variations and modifications in shape, construction, characteristics and spirit according to the scope of the present application shall be included in the scope of the following claims.
Claims (10)
1. A polarization axis measuring device for measuring a polarization axis of a polarization lens, the polarization axis measuring device comprising:
the top surface of the automatic moving carrier is provided with the polarized lens;
a polarization state generator positioned above the polarization lens, wherein the polarization state generator is used for generating an incident polarized light beam, and the automatic moving stage is used for moving the polarization lens so as to coincide the optical path of the incident polarized light beam with the normal line of a to-be-measured point passing through the polarization lens;
a polarization state analyzer located below the polarization lens; and
the first automatic position regulator is used for moving a light receiving inlet of the polarization state analyzer to an optical path of the emergent polarization light beam, and the polarization state analyzer is used for receiving the emergent polarization light beam so as to measure the direction of a polarization optical axis corresponding to the to-be-measured point.
2. The polarization axis measurement device according to claim 1, wherein the position of the automatic moving stage corresponds to a first X-axis, a first Y-axis, and a Z-axis that are perpendicular to each other, the polarization state generator and the polarization state analyzer are located above and below a first XY plane formed by the first X-axis and the first Y-axis, respectively, and the automatic moving stage is configured to move the polarization lens on the first X-axis, the first Y-axis, or the Z-axis, or to rotate the polarization lens on the first XY plane.
3. The polarization axis measurement device according to claim 2, wherein an intersection point of the first X axis, the first Y axis and the Z axis is located at a center point of the polarization lens, the polarization state analyzer corresponds to a second X axis and a second Y axis perpendicular to each other, a second XY plane formed by the second X axis and the second Y axis is parallel to the first XY plane, the second X axis and the second Y axis are respectively parallel to the first X axis and the first Y axis, an intersection point of the second X axis and the second Y axis is located at the light receiving inlet of the polarization state analyzer, and the first automatic position adjuster is configured to move the polarization state analyzer on the second Y axis or drive the polarization state analyzer to rotate around the second X axis, the second Y axis or the first Y axis.
4. A polarization axis measuring device according to claim 3, further comprising a second automatic position adjuster on which the polarization state generator is provided, the second automatic position adjuster being for driving the polarization state generator to rotate about the first Y-axis.
5. The polarization axis measurement device according to claim 1, further comprising a light receiver provided at the light receiving entrance of the polarization state analyzer, the light receiver for reducing a size of a spot of the outgoing polarized light beam to be smaller than a size of the light receiving entrance.
6. The polarized optical axis measurement device of claim 1, further comprising a light tracker disposed between the polarization state analyzer and the polarizing lens, the light tracker configured to track the position of the outgoing polarized light beam.
7. The polarization optical axis measurement device according to claim 6, wherein the light tracker comprises:
the first half-penetrating half-reflecting mirror is positioned between the polarizing lens and the polarization state analyzer and is positioned on the optical path of the emergent polarized light beam, and the first half-penetrating half-reflecting mirror is used for reflecting the emergent polarized light beam to form a first polarized light beam to be tested;
the convex lens and the second half-penetrating half mirror are positioned on the optical path of the first to-be-detected polarized light beam, and when the first to-be-detected polarized light beam sequentially passes through the convex lens and the second half-penetrating half mirror, the second half-penetrating half mirror reflects the first to-be-detected polarized light beam to form a second to-be-detected polarized light beam; and
the first image capturing device and the second image capturing device are respectively positioned on the optical paths of the first to-be-detected polarized light beam and the second to-be-detected polarized light beam, and the first image capturing device and the second image capturing device are used for respectively acquiring the light spots of the first to-be-detected polarized light beam and the second to-be-detected polarized light beam.
8. The polarized light axis measurement device of claim 1, further comprising an autocollimator disposed above the polarizing lens, the autocollimator and the polarization state generator being positioned at different horizontal positions relative to the polarizing lens, the autocollimator moving the polarizing lens to an optical path of the reference beam to reflect the reference beam to form a beam to be measured and transmitting the beam to be measured back to the autocollimator when the autocollimator generates the reference beam.
9. The polarization axis measurement device according to claim 8, wherein the auto-collimator comprises:
a light source for generating the reference beam;
the polarization spectroscope is positioned on the optical path of the reference beam, and after the reference beam passes through the polarization spectroscope and is emitted to the polarization lens, the polarization spectroscope reflects the beam to be detected to form a beam to be corrected; and
the image capturing element is positioned on the optical path of the light beam to be corrected and is used for acquiring the light spot of the light beam to be corrected.
10. The polarized light axis measurement device of claim 1, further comprising a host computer electrically connected to the automated mobile carrier and the first automated position adjuster and configured to control the automated mobile carrier and the first automated position adjuster.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202311398314.7A CN117554037A (en) | 2023-10-25 | 2023-10-25 | Polarization optical axis measuring device |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202311398314.7A CN117554037A (en) | 2023-10-25 | 2023-10-25 | Polarization optical axis measuring device |
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| CN117554037A true CN117554037A (en) | 2024-02-13 |
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| CN202311398314.7A Pending CN117554037A (en) | 2023-10-25 | 2023-10-25 | Polarization optical axis measuring device |
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