CN117452103A - EMI power supply filter reliability test system and method - Google Patents
EMI power supply filter reliability test system and method Download PDFInfo
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Abstract
The application discloses a reliability test system and method of an EMI power supply filter, wherein the system comprises a power supply modulation module, a power supply test interface, a tested interface, an electrical parameter analysis module and an industrial control module; the input end of the power supply modulation module is connected with a power supply device; the power supply modulation module modulates the electric energy of the power supply device into power supply test current and outputs the power supply test current to the power supply test interface; the EMI power supply filter to be tested is used for processing the power supply test current into an electric tested current and outputting the electric tested current to the electric parameter analysis module, and the electric parameter analysis module is used for analyzing the electric parameters of the electric tested current; the industrial control module is used for controlling working parameters of the power supply modulation module and the electric parameter analysis module; the industrial control module is also connected with a temperature control module for controlling the temperature of the EMI power supply filter and a temperature detector for detecting the temperature of the EMI power supply filter, and the temperature detector transmits temperature data to the industrial control module; the method has the effect of being capable of testing the reliability of the EMI power filter.
Description
Technical Field
The application relates to the technical field of testing of an EMI power supply filter, in particular to a system and a method for testing reliability of the EMI power supply filter.
Background
Filtering technology is an important technical means for implementing electromagnetic protection, and various filters are used for suppressing electromagnetic energy beyond the information frequency required by the system so that the electromagnetic energy cannot enter the system. An EMI power filter is a network of resistors, capacitors and inductors, and is usually a passive structure that allows certain frequencies to pass through while attenuating unwanted frequency components.
Before leaving the factory, the EMI power filter can be subjected to equipment test; however, in many test standards of the EMI power filter, there is no requirement for testing the reliability of the EMI power filter, and many production units do not test the reliability of the EMI power filter, so that the designed product is considered to be stable and reliable; but found in the actual load contrast test of the engineering site: most power filters have the phenomena of sharply reduced shielding effectiveness and increased temperature, which may be caused by defective design or improper selection of components, resulting in reduced equipment performance. Therefore, it is necessary to perform reliability check tests on the EMI power filter.
Disclosure of Invention
In order to perform reliability test on an EMI power filter, the application provides a system and a method for testing reliability of the EMI power filter.
The first technical scheme adopted by the invention of the application is as follows:
an EMI power filter reliability test system comprising: the power supply system comprises a power supply modulation module, a power supply test interface, a tested test interface, an electric parameter analysis module and an industrial control module;
the input end of the power supply modulation module is connected with a power supply device, the output end of the power supply modulation module is connected with the power supply test interface, the power supply test interface is connected with the input end of the EMI power supply filter to be tested, and the tested test interface is connected with the output end of the EMI power supply filter to be tested; the input end of the electrical parameter analysis module is connected with the tested interface, and the output end of the electrical parameter analysis module is electrically connected with electric equipment;
the power supply modulation module is used for modulating the electric energy of the power supply device into power supply test current and outputting the power supply test current to the power supply test interface; the EMI power supply filter to be tested is used for processing the power supply test current into an electric test current and outputting the electric test current to the electric parameter analysis module, and the electric parameter analysis module is used for analyzing electric parameters of the electric test current; the industrial control module is used for controlling working parameters of the power supply modulation module and the electric parameter analysis module;
the industrial control module is also connected with a temperature control module and a temperature detector, wherein the temperature control module is used for controlling the temperature of the EMI power supply filter to be tested, and the temperature detector is used for detecting the temperature of the EMI power supply filter and transmitting temperature data to the industrial control module.
By adopting the technical scheme, the power supply device is used for supplying electric energy in the test process for the whole test system and the EMI power supply filter to be tested, the power supply modulation module is used for modulating the power supply test current with stable power supply parameters and transmitting the power supply test current to the EMI power supply filter to be tested through the power supply test interface so as to facilitate the subsequent comparison and analysis of the filtering performance of the EMI power supply filter; the power supply filter of the EMI processes the received power supply test current into a power supply test current to be sent to the electric parameter analysis module, the electric parameter analysis module analyzes the electric parameter of the power supply test current, and the industrial control module is used for controlling the working parameters of the power supply modulation module and the electric parameter analysis module, and the temperature control module is used for simulating the temperature parameters of the power supply filter of the EMI under different temperature environments, so that the working parameters of the power supply filter of the EMI under different temperatures can be observed, the measurement result is more accurate, and the reliability test of the power supply filter of the EMI is facilitated.
In a preferred example, the present application: the electrical parameter analysis module comprises a spectrum analyzer, and the power supply module comprises a high-power distribution cabinet; the reliability test system further includes: the spectrum analyzer is arranged in the electromagnetic shielding chamber; the to-be-tested EMI power supply filter is arranged on the outer side wall of the electromagnetic shielding chamber, and the high-power distribution cabinet is connected with the input end of the to-be-tested EMI power supply filter; the output end of the EMI power supply filter to be tested is connected with the spectrum analyzer; and a signal interference module for outputting interference signals is arranged on the outer side of the electromagnetic shielding chamber.
By adopting the technical scheme, in actual test, after the power filter to be tested is connected with a high-power load, the high-power distribution cabinet, the high-power load, the electromagnetic shielding chamber and the signal interference module jointly form a shielding effectiveness test system of the power filter under the condition of power-on loading; the electromagnetic shielding chamber is used for providing a performance test system for the EMI power supply filter in an actual working simulation state, so that the reliability test system not only can realize state simulation in various application environments, but also can truly obtain the frequency suppression range, the actual power, the stability and the like of the EMI power supply filter in the actual working state, and is beneficial to improving the accuracy of test results of the EMI power supply filter.
In a preferred example, the present application: the signal interference module comprises a signal source, a power amplifier and a coupling transformer, wherein the signal source is connected with the input end of the power amplifier, and the output end of the power amplifier is connected with the coupling transformer; the signal source is used for generating an interference signal, the interference signal is amplified by the power amplifier and then is input into the coupling transformer, and the coupling transformer is connected with the high-power distribution cabinet; the power amplifier is also connected with a transmitting antenna; the spectrum analyzer is connected with a receiving antenna.
By adopting the technical scheme, the signal source, the power amplifier, the transmitting antenna and the receiving antenna are used for simulating a real working environment for the EMI power supply filter; the coupling transformer is used for inputting a low-frequency interference signal to the input end of the EMI power filter to be tested.
In a preferred example, the present application: the system also comprises an input interference measuring pen and an output interference measuring pen; the spectrum analyzer is a double-channel spectrum analyzer; the input interference measuring pen is connected with the input end of the spectrum analyzer, and the output interference measuring pen is connected with the output end of the spectrum analyzer; the input end interference measuring pen and the output end interference measuring pen are respectively connected between any two phases of the live wire and the zero wire or the three-phase power wire; the output end of the input interference measuring pen and the output end of the output interference measuring pen are connected into the dual-channel spectrum analyzer to obtain insertion loss.
Or the input end interference measuring pen and the output end interference measuring pen are respectively connected between a live wire and a ground wire or between a phase wire and a ground wire of the three-phase power wire.
By adopting the technical scheme, when the input end interference measuring pen and the output end interference measuring pen are respectively connected between the live wire and the zero wire or any two phases of the three-phase power line, differential mode interference can be tested; when the input end interference measuring pen and the output end interference measuring pen are respectively connected between a live wire and a ground wire or between a phase wire and a ground wire of a three-phase power wire, common mode interference can be tested; the input interference measuring pen and the output interference measuring pen respectively measure signal interference data of the to-be-tested EMI power supply filter at the input end and the output end.
The second object of the present application is achieved by the following technical scheme:
an EMI power filter reliability test method for performing an EMI power filter reliability test system as described above, comprising:
responding to the acquired initial reliability test instruction of the test strategy, and acquiring whether initial measurement data of the power supply modulation module, the industrial control module and the temperature detector meet corresponding preset measurement requirements;
if yes, responding to a test strategy short-term reliability test instruction, acquiring various values of short-term test data, and comparing the values with test thresholds in a corresponding preset short-term test strategy to generate test result information;
if yes, responding to a test strategy long-term reliability test instruction, acquiring various data of long-term test data, and comparing the data with a test threshold value in a corresponding preset long-term test strategy to generate test result information.
By adopting the technical scheme, the measurement requirement is the data requirement of the measurement parameter of the reliability measurement system; when receiving a test strategy initial reliability test instruction, the test software acquires whether actual initial measurement data of a reliability measurement system meets corresponding measurement requirements, and if not, adjusts corresponding measurement parameters until the corresponding preset measurement requirements are met; then responding to a short-term reliability test instruction of the test strategy, and comparing each item of data of the short-term test data with a corresponding test threshold according to the test requirement of the short-term reliability test instruction to generate test result information with qualified test results or unqualified test results; or responding to the long-term reliability test instruction of the test strategy, and comparing each item of data of the long-term test data with a corresponding test threshold value according to the test requirement of the long-term reliability test instruction to generate test result information with qualified test result or unqualified test result; therefore, the reliability of the EMI power supply filter can be conveniently measured under the condition of different measurement strategies, and the accuracy of the measurement result of the EMI power supply filter can be improved.
In a preferred example, the present application: the initial measurement data of the power supply modulation module, the industrial control module and the temperature detector are obtained to judge whether the initial measurement data meet corresponding preset measurement requirements or not; the method specifically comprises the following steps:
acquiring design parameters of the industrial control module and an EMI power supply filter to be tested, and generating power supply test parameters;
acquiring an electrical parameter of a power supply test current of the power supply modulation module and judging whether the electrical parameter accords with the power supply test parameter;
if yes, executing the next step;
if not, adjusting the modulation parameters of the power supply modulation module, and repeatedly responding to the acquired test strategy initial reliability test instruction until the electrical parameters of the power supply test current accord with preset power supply test parameters;
acquiring temperature data of the temperature detector and judging whether the temperature data accords with a preset temperature threshold value or not;
if yes, executing the next step;
and if not, adjusting the control parameters of the temperature control module, and repeatedly responding to the acquired test strategy initial reliability test instruction until the temperature data of the temperature detector meets a preset temperature threshold.
Through adopting above-mentioned technical scheme, predetermine power supply test parameter accessible power supply modulation module and adjust the electrical parameter of power supply test current to appointed data, the measurement demand includes based on power supply modulation module, industrial control module and temperature control module design parameter, the reliability test environment demand of power supply test current under appointed temperature environment condition of EMI power supply filter, through responding to with the initial reliability test instruction of test strategy repeatedly and adjust to satisfying the measurement demand, be favorable to measuring the reliability influence factor of EMI power supply filter.
In a preferred example, the present application: the responding to the test strategy short-term reliability test instruction obtains various values of short-term test data and compares the values with test thresholds in a corresponding preset short-term test strategy to generate test result information, and the method specifically comprises the following steps:
acquiring the total operation time length of the EMI power filter and judging whether the total operation time length is within a preset measurement time length;
if yes, executing the next step;
if not, generating a measurement result;
determining test items of the power filter to be tested based on the product parameters, and calculating corresponding test thresholds based on design parameters and power supply test parameters of the EMI power filter to be tested;
obtaining a power supply parameter of the tested current to obtain a tested parameter, comparing various numerical values of the tested parameter with a test threshold value corresponding to the test item, and generating test result information.
By adopting the technical scheme, the change process of the reliability measurement result of the EMI power supply filter in the service life period is measured based on the time dimension, and the aging tests of the EMI power supply filter in different test ranges such as voltage test, capacitance test and inductance test are tested by setting a plurality of test items, so that whether the capacitor components in the EMI power supply filter have the conditions of equipment performance reduction, heating and scalding caused by defective design or improper component selection or not can be judged, and the measurement method is scientific and has high reliability.
In a preferred example, the present application: the test items include: voltage testing, inductance testing, capacitance testing and temperature testing,
performing reliability test result display of a plurality of view ports on all the test items based on the time dimension;
when the test result of any one of the test items is unqualified, generating test result information based on the comparison result of each test item;
storing test result information in a test database, wherein the test result information comprises production batch information and product information of a corresponding tested EMI power filter;
and counting the test result information of each production batch and generating a reliability test report.
By adopting the technical scheme, the reliability results of the multiple view ports of all the test items are displayed on a time axis, so that the multiple view ports are displayed according to different test contents; when the test result of any test item is unqualified, corresponding test result information is output, and production batch information and product information of the product are determined, so that the unqualified reason of the test result can be determined conveniently according to the test result, and the production process of the EMI power filter can be optimized or the selection strategy of the optimized components can be changed conveniently.
In summary, the present application includes at least one of the following beneficial technical effects:
1. the power supply device is used for supplying electric energy in the test process for the whole test system and the EMI power supply filter to be tested, the power supply modulation module is used for modulating power supply test current with stable power supply parameters and transmitting the power supply test current to the EMI power supply filter to be tested through the power supply test interface so as to facilitate the subsequent comparison and analysis of the filtering performance of the EMI power supply filter; the power supply filter of the EMI processes the received power supply test current into a power-tested current to be sent to the electric parameter analysis module, the electric parameter analysis module analyzes the electric parameter of the power-tested current, and the industrial control module is used for controlling the working parameters of the power supply modulation module and the electric parameter analysis module, and the temperature control module is used for simulating the temperature parameters of the power supply filter of the EMI under different temperature environments, so that the working parameters of the power supply filter of the EMI under different temperatures can be observed, the measurement result is more accurate, and the reliability test of the power supply filter of the EMI is facilitated;
2. the measurement requirement is the data requirement of the measurement parameters of the reliability measurement system; when receiving a test strategy initial reliability test instruction, the test software acquires whether actual initial measurement data of a reliability measurement system meets corresponding measurement requirements, and if not, adjusts corresponding measurement parameters until the corresponding preset measurement requirements are met; then responding to a short-term reliability test instruction of the test strategy, and comparing each item of data of the short-term test data with a corresponding test threshold according to the test requirement of the short-term reliability test instruction to generate test result information with qualified test results or unqualified test results; or responding to the long-term reliability test instruction of the test strategy, and comparing each item of data of the long-term test data with a corresponding test threshold value according to the test requirement of the long-term reliability test instruction to generate test result information with qualified test result or unqualified test result; therefore, the reliability of the EMI power supply filter is conveniently measured under the condition of different measurement strategies, and the accuracy of the measurement result of the EMI power supply filter is improved;
3. displaying reliability results of multiple view ports of all the test items on a time axis so as to facilitate the display of the multiple view ports according to different test contents; when the test result of any test item is unqualified, corresponding test result information is output, and production batch information and product information of the product are determined, so that the unqualified reason of the test result can be determined conveniently according to the test result, and the production process of the EMI power filter can be optimized or the selection strategy of the optimized components can be changed conveniently.
Drawings
FIG. 1 is a block diagram of a system for testing reliability of an EMI power filter in one embodiment of the present application;
FIG. 2 is a schematic diagram of an EMI power filter reliability test system according to an embodiment of the present application;
FIG. 3 is a flow chart of a method for testing reliability of an EMI power filter in an embodiment of the present application;
fig. 4 is another flowchart of a method for testing reliability of an EMI power filter in an embodiment of the application.
Reference numerals illustrate:
1. an EMI power filter; 2. a spectrum analyzer; 3. a high-power distribution cabinet; 4. an electromagnetic shielding chamber; 51. a signal source; 52. a power amplifier; 53. a coupling transformer; 6. a transmitting antenna; 7. and a receiving antenna.
Detailed Description
The present application is described in further detail below with reference to the accompanying drawings.
In one embodiment, referring to fig. 1, the application discloses an EMI power filter reliability test system, which includes a power modulation module, a power supply test interface, a tested test interface, an electrical parameter analysis module, and an industrial control module; the input end of the power supply modulation module is connected with a power supply device, the output end of the power supply modulation module is connected with a power supply test interface, the power supply test interface is connected with the input end of the EMI power supply filter 1 to be tested, and the tested test interface is connected with the output end of the EMI power supply filter 1 to be tested; the effective power range of the EMI power supply filter 1 to be tested is 500kW, and the effective suppression frequency range is 9 kHz-35 GHz; the input end of the electrical parameter analysis module is connected with the tested interface, and the output end of the electrical parameter analysis module is electrically connected with the electric equipment.
Referring to fig. 1, the power modulation module is configured to modulate electrical energy of the power supply device into a power supply test current and output the power supply test current to the power supply test interface; the EMI power filter to be tested 1 is used for processing the power supply test current into an electric tested current and outputting the electric tested current to the electric parameter analysis module, and the electric parameter analysis module is used for analyzing the electric parameters of the electric tested current; the industrial control module is used for controlling working parameters of the power supply modulation module and the electric parameter analysis module; the industrial control module is also connected with a temperature control module and a temperature detector, the temperature control module is used for controlling the temperature of the EMI power supply filter 1 to be tested, and the temperature detector is used for detecting the temperature of the EMI power supply filter 1 and transmitting temperature data to the industrial control module.
Referring to fig. 1, an emi power filter 1 processes a received power supply test current into an electrical test current to be transmitted to an electrical parameter analysis module, which analyzes an electrical parameter of the electrical test current; the industrial control module is used for controlling the working parameters of the power supply modulation module and the electrical parameter analysis module, and the temperature control module is used for simulating the temperature parameters of the EMI power supply filter 1 in different temperature environments, so that the working parameters of the EMI power supply filter 1 in different temperatures can be observed conveniently, the measurement result is more accurate, and the reliability test of the EMI power supply filter 1 can be conveniently carried out.
Referring to fig. 2, the electrical parameter analysis module includes a spectrum analyzer 2, and the spectrum analyzer 2 is a dual-channel spectrum analyzer 2; the power supply module comprises a high-power distribution cabinet 3; the reliability test system also comprises an electromagnetic shielding chamber 4, wherein the electromagnetic shielding chamber 4 is welded by a steel plate; the spectrum analyzer 2 is arranged in the electromagnetic shielding chamber 4; the to-be-tested EMI power filter 1 is arranged on the outer side wall of the electromagnetic shielding chamber 4, and the high-power distribution cabinet 3 is connected with the input end of the to-be-tested EMI power filter 1; the output end of the EMI power filter 1 to be tested is connected to a spectrum analyzer 2.
Referring to fig. 2, in actual testing, the EMI power filter 1 is connected to a high-power load, and the electromagnetic shielding chamber 4, the high-power distribution cabinet 3, and the high-power load are grounded through a ground wire; a signal interference module for outputting interference signals is arranged on the outer side of the electromagnetic shielding chamber 4; in actual test, after connecting the power filter to be tested with a high-power load, the high-power distribution cabinet 3, the high-power load, the electromagnetic shielding chamber 4 and the signal interference module together form a shielding effectiveness test system of the power filter under the condition of power-on loading; the reliability test system can realize state simulation under various application environments, and can truly obtain the frequency suppression range, actual power, stability and the like of the EMI power supply filter 1 in an actual working state.
Referring to fig. 2, the signal interference module includes a signal source 51, a power amplifier 52 and a coupling transformer 53, the signal source 51 is connected to an input terminal of the power amplifier 52, and an output terminal of the power amplifier 52 is connected to the coupling transformer 53; the signal source 51 is used for generating an interference signal, the interference signal is amplified by the power amplifier 52 and then is input into the coupling transformer 53, and the coupling transformer 53 is connected with the high-power distribution cabinet 3; the power amplifier 52 is also connected to the transmitting antenna 6; the spectrum analyzer 2 is connected with a receiving antenna 7, and the transmitting antenna 6 and the receiving antenna 7 are arranged at equal heights in actual installation; the signal source 51, the power amplifier 52, the transmitting antenna 6 and the receiving antenna 7 are used for simulating a real working environment for the EMI power filter 1; the coupling transformer 53 is used to input a low-frequency interference signal to the input terminal of the EMI power filter 1 to be tested.
Referring to FIG. 2, further comprising an input disturbance measurement stylus and an output disturbance measurement stylus (shown); the input interference measuring pen is connected with the input end of the spectrum analyzer 2, and the output interference measuring pen is connected with the output end of the spectrum analyzer 2; the input end interference measuring pen and the output end interference measuring pen are respectively connected between any two phases of the live wire and the zero wire or the three-phase power wire, and the connection mode can be used for testing differential mode interference; the output end of the input interference measuring pen and the output end of the output interference measuring pen are connected into the two-channel spectrum analyzer 2 to obtain insertion loss; specifically, a low-frequency signal is generated as a test object signal by the signal source 51, which is not itself filtered by the EMI power filter 1 to be tested, and insertion loss is just obtained by measuring attenuation of the test object signal before and after passing through the EMI power filter 1 to be tested.
In one embodiment, the input end interference measuring pen and the output end interference measuring pen are respectively connected between a live wire and a ground wire or between a phase wire of a three-phase power wire and the ground wire, and the connection mode can be used for testing common mode interference; the tester can select the connection mode of the input end interference measuring meter pen and the output end interference measuring meter pen according to the self-test requirement, so that the applicability of the reliability test system is improved.
According to the method, different working states of the EMI power supply filter 1 are controlled through the power supply modulation module, multiple important indexes of the EMI power supply filter 1 can be detected within the wide frequency band range of 9 kHz-35 GHz, the performance quality and the application range of the EMI power supply filter 1 are judged, the method is suitable for detection, calibration and type selection of various electromagnetic pulse prevention EMI power supply filters 1, the use requirements of various electromagnetic shielding bodies on the power supply filters are effectively met, and the reliability is high.
In an embodiment, the application discloses a method for testing reliability of an EMI power filter, referring to fig. 3, where the method for testing reliability of an EMI power filter is applied to the system for testing reliability of an EMI power filter in the above embodiment, and the method specifically includes the following steps:
s1: and responding to the acquired initial reliability test instruction of the test strategy, and acquiring whether initial measurement data of the power supply modulation module, the industrial control module and the temperature detector meet corresponding preset measurement requirements.
In this embodiment, the test policy initial reliability test instruction, the test policy short-term reliability test instruction, and the test policy long-term reliability test instruction in response to the test policy are input on the reliability test system through the intelligent terminal, where the intelligent terminal includes terminals such as a mobile phone and a Web page terminal.
Specifically, the measurement requirement is a data requirement of a measurement parameter of the reliability measurement system; when the test software receives a test strategy initial reliability test instruction, acquiring whether actual initial measurement data of a reliability measurement system meets corresponding measurement requirements, and if not, adjusting corresponding measurement parameters until the corresponding preset measurement requirements are met.
S2: if yes, responding to a test strategy short-term reliability test instruction, acquiring various values of short-term test data, comparing the values with test thresholds in a corresponding preset short-term test strategy, and generating test result information.
In the embodiment, the short-term reliability test instruction of the test strategy is a reliability test task for testing a high-power load in a short-term fixed duration, and the voltage input range, the current input range and the capacitor design requirement of the input EMI power filter are within a preset short-term temperature variation range; the test content of the reliability test instruction can be customized according to the actual test requirement.
Specifically, responding to a short-term reliability test instruction of a test strategy, and comparing each item of data of short-term test data with a corresponding test threshold according to the test requirement of the short-term reliability test instruction to generate test result information with qualified test results or unqualified test results; in actual testing, the test strategy short-term reliability test instructions may be: gradually loading with 5% stepping power according to rated power of the tested EMI power supply filter until the power is full; and at each test power point, the power-on loading state is kept, the continuous operation is not less than 2 days, and the continuous operation is not less than 10 days when the test power point is fully loaded.
S3: if yes, responding to a test strategy long-term reliability test instruction, acquiring various data of long-term test data, and comparing the data with a test threshold value in a corresponding preset long-term test strategy to generate test result information.
In this embodiment, the test strategy long-term reliability test instruction and the test strategy short-term reliability test instruction are different in time measurement length or at least one test item parameter, and the test items include a voltage input threshold, a current input threshold, a temperature change rate or a temperature change range, and the like.
Specifically, or responding to a long-term reliability test instruction of the test strategy, and comparing each item of data of the long-term test data with a corresponding test threshold value according to the test requirement of the long-term reliability test instruction to generate test result information with qualified test results or unqualified test results; therefore, the reliability of the EMI power supply filter can be conveniently measured under the condition of different measurement strategies, and the accuracy of the measurement result of the EMI power supply filter can be improved.
Further, the test strategy long-term reliability test instruction may be: the test is performed with power up loaded and full load: gradually loading with 5% stepping power according to rated power of the tested EMI power supply filter until the power is full; and on each test power point, the power-on loading state is kept, the continuous operation is not less than 3 days, the continuous operation is not less than 1 month when the test power point is fully loaded, and the measurement period is half a year.
In one embodiment, in step S1, it is obtained whether initial measurement data of the power supply modulation module, the industrial control module and the temperature detector meet corresponding preset measurement requirements; the method specifically comprises the following steps:
s11: and acquiring design parameters of the industrial control module and the EMI power filter to be tested, and generating power supply test parameters.
In this embodiment, the power supply test parameter is an electrical parameter of a power supply test current, and the electrical parameter of the power supply test current is determined according to a rated voltage range, a maximum voltage, an inductance and a capacitance of a power supply filter to be tested; the power supply test parameters are selected based on design parameters of the EMI power filter to be tested.
S12: acquiring an electrical parameter of a power supply test current of the power supply modulation module and judging whether the electrical parameter accords with the power supply test parameter;
if yes, executing the next step;
and if not, adjusting the modulation parameters of the power supply modulation module, and repeatedly responding to the acquired test strategy initial reliability test instruction until the electrical parameters of the power supply test current accord with the preset power supply test parameters.
S13: acquiring temperature data of a temperature detector and judging whether the temperature data accords with a preset temperature threshold value;
if yes, executing the next step;
and if not, adjusting the control parameters of the temperature control module, and repeatedly responding to the acquired test strategy initial reliability test instruction until the temperature data of the temperature detector meets the preset temperature threshold.
In this embodiment, the measurement requirements include reliability test environment requirements based on design parameters of the power supply modulation module, the industrial control module and the temperature control module in the EMI power supply filter and the power supply test current under the specified temperature environment conditions, and the reliability influence factors of the EMI power supply filter are measured by repeatedly responding to the reliability test instructions initially with the test strategy and adjusting to meet the measurement requirements.
In one embodiment, in step S2, in response to a test policy short-term reliability test instruction, each value of short-term test data is obtained and compared with a test threshold value in a corresponding preset short-term test policy, so as to generate test result information, which specifically includes:
s21: acquiring the total operation time of the EMI power filter and judging whether the total operation time is within a preset measurement time;
if yes, executing the next step;
and if not, generating a measurement result.
Specifically, the total test duration of the reliability test system is set to output a measurement result after the set measurement duration; the test of the condition that the filtering effect is influenced due to temperature change and oxidation of components influenced by moisture in the air in the long-term use process of the EMI power supply filter is convenient
S22: and determining test items of the power filter to be tested based on the product parameters, and calculating corresponding test thresholds based on the design parameters and the power supply test parameters of the EMI power filter to be tested.
S23: obtaining a power supply parameter of the tested current to obtain a tested parameter, comparing each numerical value of the tested parameter with a test threshold value in a corresponding test item, and generating test result information.
Specifically, based on the time dimension, the change process of the reliability measurement result of the EMI power supply filter in the service life period is measured, and the aging tests of the EMI power supply filter in different test ranges such as voltage tests, capacitance tests, inductance tests and the like are tested by setting a plurality of test items, so that whether the capacitor components in the EMI power supply filter have the conditions of equipment performance reduction, heating and scalding caused by defective design or improper component selection or not can be judged, the measurement method is scientific, and the reliability is high.
In one embodiment, as shown in fig. 4, the EMI power filter reliability test method further includes:
s41: and displaying the reliability test results of the multiple view ports on the basis of the time dimension.
Specifically, a view port is set for displaying based on each test content, and a plurality of test contents are displayed on the same page in a multi-view port mode, so that reliability change conditions of different test parts can be compared.
S42: and when the test result of any one of the test items is unqualified, generating test result information based on the comparison result of each test item.
Specifically, if the comparison results of all the test items are qualified, the test result information is qualified, and if any one of the comparison results is unqualified, the test result information is unqualified.
S43: and storing the test result information in a test database, wherein the test result information comprises the production batch information and the product information of the corresponding tested EMI power filter.
S44: and counting the test result information of each production batch and generating a reliability test report.
Specifically, displaying reliability results of multiple view ports of all test items on a time axis so as to facilitate multi-content view port display according to different test contents; when the test result of any test item is unqualified, corresponding test result information is output, and production batch information and product information of the product are determined, so that the unqualified reason of the test result is determined according to the test result, and the production process of the EMI power filter is optimized or the selection of optimized components is changed.
It should be understood that the sequence number of each step in the foregoing embodiment does not mean that the execution sequence of each process should be determined by the function and the internal logic of each process, and should not limit the implementation process of the embodiment of the present application in any way.
The above embodiments are only for illustrating the technical solution of the present application, and are not limiting; although the present application has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art will understand; the technical scheme described in the foregoing embodiments can be modified or some of the features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit and scope of the technical solutions of the embodiments of the present application, and are intended to be included in the scope of the present application.
Claims (8)
1. An EMI power filter reliability test system, comprising: the power supply system comprises a power supply modulation module, a power supply test interface, a tested test interface, an electric parameter analysis module and an industrial control module;
the input end of the power supply modulation module is connected with a power supply device, the output end of the power supply modulation module is connected with the power supply test interface, the power supply test interface is connected with the input end of the EMI power supply filter (1) to be tested, and the tested test interface is connected with the output end of the EMI power supply filter (1) to be tested; the input end of the electrical parameter analysis module is connected with the tested interface, and the output end of the electrical parameter analysis module is electrically connected with electric equipment;
the power supply modulation module is used for modulating the electric energy of the power supply device into power supply test current and outputting the power supply test current to the power supply test interface; the EMI power filter (1) to be tested is used for processing the power supply test current into an electric tested current and outputting the electric tested current to the electric parameter analysis module, and the electric parameter analysis module is used for analyzing electric parameters of the electric tested current; the industrial control module is used for controlling working parameters of the power supply modulation module and the electric parameter analysis module;
the industrial control module is also connected with a temperature control module and a temperature detector, wherein the temperature control module is used for controlling the temperature of the EMI power supply filter (1) to be tested, and the temperature detector is used for detecting the temperature of the EMI power supply filter (1) and transmitting temperature data to the industrial control module.
2. The EMI power filter reliability test system of claim 1, wherein the electrical parameter analysis module comprises a spectrum analyzer (2), and the power module comprises a high-power distribution cabinet (3); the reliability test system further includes: an electromagnetic shielding chamber (4), wherein the spectrum analyzer (2) is arranged in the electromagnetic shielding chamber (4); the to-be-tested EMI power supply filter (1) is arranged on the outer side wall of the electromagnetic shielding chamber (4), and the high-power distribution cabinet (3) is connected with the input end of the to-be-tested EMI power supply filter (1); the output end of the EMI power supply filter (1) to be tested is connected with the spectrum analyzer (2); and a signal interference module for outputting interference signals is arranged on the outer side of the electromagnetic shielding chamber (4).
3. The system for testing the reliability of an EMI power filter of claim 2,
the signal interference module comprises a signal source (51), a power amplifier (52) and a coupling transformer (53), wherein the signal source (51) is connected with the input end of the power amplifier (52), and the output end of the power amplifier (52) is connected with the coupling transformer (53); the signal source (51) is used for generating an interference signal, the interference signal is amplified by the power amplifier (52) and then is input into the coupling transformer (53), and the coupling transformer (53) is connected with the high-power distribution cabinet (3); the power amplifier (52) is also connected with a transmitting antenna (6); the spectrum analyzer (2) is connected with a receiving antenna (7).
4. The EMI power filter reliability test system of claim 3, further comprising an input interference meter and an output interference meter; the spectrum analyzer (2) is a dual-channel spectrum analyzer (2); the input interference measuring pen is connected with the input end of the spectrum analyzer (2), and the output interference measuring pen is connected with the output end of the spectrum analyzer (2); the input end interference measuring pen and the output end interference measuring pen are respectively connected between any two phases of the live wire and the zero wire or the three-phase power wire; the output end of the input interference measuring pen and the output end of the output interference measuring pen are connected into the dual-channel spectrum analyzer (2) to obtain insertion loss;
or the input end interference measuring pen and the output end interference measuring pen are respectively connected between a live wire and a ground wire or between a phase wire and a ground wire of the three-phase power wire.
5. An EMI power filter reliability test method for performing an EMI power filter reliability test system as set forth in any one of claims 1-4, comprising:
responding to the acquired initial reliability test instruction of the test strategy, and acquiring whether initial measurement data of the power supply modulation module, the industrial control module and the temperature detector meet corresponding preset measurement requirements;
if yes, responding to a test strategy short-term reliability test instruction, acquiring various values of short-term test data, and comparing the values with test thresholds in a corresponding preset short-term test strategy to generate test result information;
if yes, responding to a test strategy long-term reliability test instruction, acquiring various data of long-term test data, and comparing the data with a test threshold value in a corresponding preset long-term test strategy to generate test result information.
6. The method for testing reliability of an EMI power filter according to claim 5, wherein said obtaining initial measurement data of said power modulation module, said industrial control module, and said temperature detector meets corresponding preset measurement requirements; the method specifically comprises the following steps:
acquiring design parameters of the industrial control module and an EMI power supply filter to be tested, and generating power supply test parameters;
acquiring an electrical parameter of a power supply test current of the power supply modulation module and judging whether the electrical parameter accords with the power supply test parameter;
if yes, executing the next step;
if not, adjusting the modulation parameters of the power supply modulation module, and repeatedly responding to the acquired test strategy initial reliability test instruction until the electrical parameters of the power supply test current accord with preset power supply test parameters;
acquiring temperature data of the temperature detector and judging whether the temperature data accords with a preset temperature threshold value or not;
if yes, executing the next step;
and if not, adjusting the control parameters of the temperature control module, and repeatedly responding to the acquired test strategy initial reliability test instruction until the temperature data of the temperature detector meets a preset temperature threshold.
7. The method for testing reliability of an EMI power filter according to claim 6, wherein the obtaining, in response to the test policy short-term reliability test instruction, each value of short-term test data and comparing with a test threshold value in a corresponding preset short-term test policy, and generating test result information specifically includes:
acquiring the total operation time length of the EMI power filter and judging whether the total operation time length is within a preset measurement time length;
if yes, executing the next step;
if not, generating a measurement result;
determining test items of the power filter to be tested based on the product parameters, and calculating corresponding test thresholds based on design parameters and power supply test parameters of the EMI power filter to be tested;
obtaining a power supply parameter of the tested current to obtain a tested parameter, comparing various numerical values of the tested parameter with a test threshold value corresponding to the test item, and generating test result information.
8. The method of claim 7, wherein the test items comprise: voltage testing, inductance testing, capacitance testing and temperature testing,
performing reliability test result display of a plurality of view ports on all the test items based on the time dimension;
when the test result of any one of the test items is unqualified, generating test result information based on the comparison result of each test item;
storing test result information in a test database, wherein the test result information comprises production batch information and product information of a corresponding tested EMI power filter;
and counting the test result information of each production batch and generating a reliability test report.
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117890715A (en) * | 2024-03-14 | 2024-04-16 | 大连海事大学 | Filter electrical performance test system based on big data information analysis |
Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103926470A (en) * | 2014-04-24 | 2014-07-16 | 成都工业学院 | Emi filter loading insertion loss automatic test system |
| CN104198090A (en) * | 2014-09-17 | 2014-12-10 | 江西洪都航空工业集团有限责任公司 | Operational reliability testing instrument for temperature indicating and recording meters |
| US20140375352A1 (en) * | 2011-09-15 | 2014-12-25 | University Of Washington Through Its Center For Commercialization | Systems and methods for sensing environmental changes using light sources as sensors |
| WO2017178878A1 (en) * | 2016-04-13 | 2017-10-19 | Universitat Politecnica De Catalunya | A full time-domain method for analyzing two or more signals for assessing them as electromagnetic interference (emi) |
| CN108375706A (en) * | 2018-02-09 | 2018-08-07 | 广州视源电子科技股份有限公司 | The method that temperature rises Auto-Test System and tests Wen Sheng |
| CN110596501A (en) * | 2019-10-17 | 2019-12-20 | 中国人民解放军军事科学院国防工程研究院 | Performance test system of power filter under simulated actual working state |
| CN113917273A (en) * | 2021-12-14 | 2022-01-11 | 海拓仪器(江苏)有限公司 | Electrified reliability test system for electronic component |
| CN114252388A (en) * | 2021-11-23 | 2022-03-29 | 国高材高分子材料产业创新中心有限公司 | Multi-factor coupling reliability test device |
| CN115267544A (en) * | 2022-05-30 | 2022-11-01 | 中国第一汽车股份有限公司 | Method, device, terminal and storage medium for testing reliability of battery charging strategy |
| CN116008704A (en) * | 2023-01-03 | 2023-04-25 | 广州市德珑电子器件有限公司 | Safety regulation testing equipment and method for EMI power filter |
| CN116047172A (en) * | 2022-10-26 | 2023-05-02 | 中国船舶重工集团公司第七一九研究所 | Power filter insertion loss on-line test computing system |
-
2023
- 2023-10-18 CN CN202311357323.1A patent/CN117452103A/en active Pending
Patent Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20140375352A1 (en) * | 2011-09-15 | 2014-12-25 | University Of Washington Through Its Center For Commercialization | Systems and methods for sensing environmental changes using light sources as sensors |
| CN103926470A (en) * | 2014-04-24 | 2014-07-16 | 成都工业学院 | Emi filter loading insertion loss automatic test system |
| CN104198090A (en) * | 2014-09-17 | 2014-12-10 | 江西洪都航空工业集团有限责任公司 | Operational reliability testing instrument for temperature indicating and recording meters |
| WO2017178878A1 (en) * | 2016-04-13 | 2017-10-19 | Universitat Politecnica De Catalunya | A full time-domain method for analyzing two or more signals for assessing them as electromagnetic interference (emi) |
| CN108375706A (en) * | 2018-02-09 | 2018-08-07 | 广州视源电子科技股份有限公司 | The method that temperature rises Auto-Test System and tests Wen Sheng |
| CN110596501A (en) * | 2019-10-17 | 2019-12-20 | 中国人民解放军军事科学院国防工程研究院 | Performance test system of power filter under simulated actual working state |
| CN114252388A (en) * | 2021-11-23 | 2022-03-29 | 国高材高分子材料产业创新中心有限公司 | Multi-factor coupling reliability test device |
| CN113917273A (en) * | 2021-12-14 | 2022-01-11 | 海拓仪器(江苏)有限公司 | Electrified reliability test system for electronic component |
| CN115267544A (en) * | 2022-05-30 | 2022-11-01 | 中国第一汽车股份有限公司 | Method, device, terminal and storage medium for testing reliability of battery charging strategy |
| CN116047172A (en) * | 2022-10-26 | 2023-05-02 | 中国船舶重工集团公司第七一九研究所 | Power filter insertion loss on-line test computing system |
| CN116008704A (en) * | 2023-01-03 | 2023-04-25 | 广州市德珑电子器件有限公司 | Safety regulation testing equipment and method for EMI power filter |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117890715A (en) * | 2024-03-14 | 2024-04-16 | 大连海事大学 | Filter electrical performance test system based on big data information analysis |
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