CN117369557B - Integrated circuit temperature control system and method - Google Patents

Integrated circuit temperature control system and method Download PDF

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CN117369557B
CN117369557B CN202311613942.2A CN202311613942A CN117369557B CN 117369557 B CN117369557 B CN 117369557B CN 202311613942 A CN202311613942 A CN 202311613942A CN 117369557 B CN117369557 B CN 117369557B
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integrated circuit
determining
complexity
line
image
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CN117369557A (en
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高乾
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Xuzhou Yingsheng Micro Semiconductor Co ltd
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Xuzhou Yingsheng Micro Semiconductor Co ltd
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    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
    • G05D23/00—Control of temperature
    • G05D23/19—Control of temperature characterised by the use of electric means
    • G05D23/20—Control of temperature characterised by the use of electric means with sensing elements having variation of electric or magnetic properties with change of temperature

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Abstract

The invention provides an integrated circuit temperature control system and method, and relates to the technical field of temperature control. The system comprises: binocular camera, exhaust fan and treater, the treater is used for: shooting an image to be processed; detecting an image to be processed to obtain a first position of a circuit and a second position of an electronic device; determining a line complexity score from the first location; determining a device complexity score based on the second location; shooting infrared images at a plurality of moments in the current test period; determining an average temperature trend function according to the infrared image; and determining a control strategy of the exhaust fan according to the line complexity score, the device complexity score and the average temperature trend function. According to the invention, the temperature control system can meet the actual heat dissipation requirement of the integrated circuit, so that the integrated circuit can work at normal temperature, and the working performance and the service life of the integrated circuit are improved.

Description

Integrated circuit temperature control system and method
Technical Field
The present invention relates to the field of temperature control technologies, and in particular, to a system and a method for controlling temperature of an integrated circuit.
Background
In the related art, the difference between different integrated circuits, especially the difference between the circuit layout of the integrated circuits and the electronic devices is large, so that the difference of heat generated by the integrated circuits is large, and the difference of heat dissipation demands is also large.
Disclosure of Invention
The embodiment of the invention provides an integrated circuit temperature control system and a method, which can enable the temperature control system to meet the actual heat dissipation requirement of an integrated circuit, enable the integrated circuit to work at normal temperature, and improve the working performance and the service life of the integrated circuit.
According to a first aspect of an embodiment of the present invention, there is provided an integrated circuit temperature control system, comprising:
The device comprises a binocular camera, an exhaust fan and a processor, wherein the binocular camera is arranged above the integrated circuit and comprises an infrared camera and a camera;
The processor is configured to:
Shooting an image to be processed of the integrated circuit through the camera;
Detecting the image to be processed to obtain a first position where a circuit on the integrated circuit is located and a second position where an electronic device is located;
Determining a line complexity score for the integrated circuit based on the first location;
Determining a device complexity score for the integrated circuit according to a second location where the electronic device is located;
Respectively shooting infrared images at a plurality of moments in the current test period through the infrared camera;
determining an average temperature trend function of the integrated circuit according to the infrared images at each moment;
And determining a control strategy of the exhaust fan according to the line complexity score, the device complexity score and the average temperature trend function, wherein the control strategy comprises the operation power of the exhaust fan in the next test period.
According to one embodiment of the invention, determining a line complexity score for the integrated circuit based on the first location comprises:
Determining a first background area except the first position in the image to be processed according to the first position;
setting the pixel value of the first background area to 0 to obtain a first image;
performing binarization processing on the first image to obtain a first binarized image;
a plurality of first test marks are vertically arranged on the first binarization image, the first test marks are a plurality of straight lines vertically arranged along the first binarization image, each straight line is parallel to each other, and the interval of each straight line is a first preset distance;
a plurality of second test marks are arranged in the transverse direction of the first binarized image, the second test marks are a plurality of straight lines arranged in the transverse direction of the first binarized image, each straight line is parallel to the other, and the interval of each straight line is a second preset distance;
determining the complexity of the vertical line according to the plurality of first test marks;
determining the complexity of the transverse line according to the second test marks;
And determining the line complexity according to the vertical line complexity and the horizontal line complexity.
According to one embodiment of the invention, determining the vertical line complexity from a plurality of the first test marks comprises:
According to the formula
Obtaining the vertical line complexityWherein/>For the number of times the ith first test mark crosses the boundary of said first position,/>For the number of pixel points between the jth crossing the boundary of the first position and the (j+1) th crossing the boundary of the first position of the ith first test mark,/>For the average value of pixel values of pixel points between the jth crossing of the boundary of the first position to the jth+1th crossing of the boundary of the first position of the ith first test mark,/>I is greater than or equal to 1 and less than or equal to/>, the total number of first test marksPositive integer of/>Is greater than or equal to 1 and less than or equal to/>Positive integer of/>Is a preset coefficient, if is a conditional function,/>
Representing ifThe conditional function takes on the value/>Otherwise, 0.
According to one embodiment of the invention, determining the lateral line complexity from a plurality of said second test marks comprises:
According to the formula
Obtaining the lateral line complexityWherein/>For the number of times the t second test mark crosses the boundary of the first position,/>For the number of pixels of the t second test mark between the t-th crossing of the boundary of the first position and the t+1th crossing of the boundary of the first position,/>The average value of pixel values of pixel points between the t-th crossing of the boundary of the first position and the t+1th crossing of the boundary of the first position of the t-th second test mark,/>K is greater than or equal to 1 and less than or equal to the total number of second test marksT is greater than or equal to 1 and less than or equal to/>Is a conditional function,
Representing ifThe conditional function takes on the value/>Otherwise, 0.
According to one embodiment of the invention, determining the line complexity from the vertical line complexity and the lateral line complexity comprises:
According to the formula
The line complexity C is determined, wherein,For the lateral line complexity,/>For the vertical line complexity,/>For the total number of second test marks,/>Is the total number of first test marks.
According to one embodiment of the invention, determining an average temperature trend function of the integrated circuit from the infrared images at each instant in time comprises:
Determining the measurement temperature of a plurality of pixels of the infrared image at each moment according to the chromaticity of the plurality of pixels of the infrared image at each moment;
averaging the measured temperatures to obtain average temperatures at all moments;
and fitting the average temperature at each moment to obtain the average temperature trend function.
According to one embodiment of the invention, determining a control strategy for the exhaust fan according to the line complexity score, the device complexity score and the average temperature trend function comprises:
According to the formula
Determining the operating power of the exhaust fan in the next test periodWhere s is the current number of test cycles, s+1 is the next number of test cycles,/>For the running power of the exhaust fan in the current test period, C is the line complexity score, Q is the device complexity score,/>Is the average value of the average temperature trend function,/>As a function value of the average temperature trend function at the end of the current test period,/>Function value of the derivative function of the average temperature trend function at the end of the current test period,/>And/>Is a preset weight.
According to a second aspect of an embodiment of the present invention, there is provided an integrated circuit temperature control method including:
Shooting an image to be processed of the integrated circuit through a camera;
Detecting the image to be processed to obtain a first position where a circuit on the integrated circuit is located and a second position where an electronic device is located;
Determining a line complexity score for the integrated circuit based on the first location;
Determining a device complexity score for the integrated circuit according to a second location where the electronic device is located;
Respectively shooting infrared images at a plurality of moments in the current test period through an infrared camera;
determining an average temperature trend function of the integrated circuit according to the infrared images at each moment;
And determining a control strategy of the exhaust fan according to the line complexity score, the device complexity score and the average temperature trend function, wherein the control strategy comprises the operation power of the exhaust fan in the next test period.
According to one embodiment of the invention, determining a line complexity score for the integrated circuit based on the first location comprises:
Determining a first background area except the first position in the image to be processed according to the first position;
setting the pixel value of the first background area to 0 to obtain a first image;
performing binarization processing on the first image to obtain a first binarized image;
a plurality of first test marks are vertically arranged on the first binarization image, the first test marks are a plurality of straight lines vertically arranged along the first binarization image, each straight line is parallel to each other, and the interval of each straight line is a first preset distance;
a plurality of second test marks are arranged in the transverse direction of the first binarized image, the second test marks are a plurality of straight lines arranged in the transverse direction of the first binarized image, each straight line is parallel to the other, and the interval of each straight line is a second preset distance;
determining the complexity of the vertical line according to the plurality of first test marks;
determining the complexity of the transverse line according to the second test marks;
And determining the line complexity according to the vertical line complexity and the horizontal line complexity.
According to one embodiment of the invention, determining the vertical line complexity from a plurality of the first test marks comprises:
According to the formula
Obtaining the vertical line complexityWherein/>For the number of times the ith first test mark crosses the boundary of said first position,/>For the number of pixel points between the jth crossing the boundary of the first position and the (j+1) th crossing the boundary of the first position of the ith first test mark,/>For the average value of pixel values of pixel points between the jth crossing of the boundary of the first position to the jth+1th crossing of the boundary of the first position of the ith first test mark,/>I is greater than or equal to 1 and less than or equal to/>, the total number of first test marksJ is greater than or equal to 1 and less than or equal to/>Positive integer of/>Is a preset coefficient, if is a conditional function,/>
Representing ifThe conditional function takes on the value/>Otherwise, 0.
According to one embodiment of the invention, determining the lateral line complexity from a plurality of said second test marks comprises:
According to the formula
Obtaining the lateral line complexityWherein/>For the number of times the t second test mark crosses the boundary of the first position,/>For the number of pixels of the t second test mark between the t-th crossing of the boundary of the first position and the t+1th crossing of the boundary of the first position,/>The average value of pixel values of pixel points between the t-th crossing of the boundary of the first position and the t+1th crossing of the boundary of the first position of the t-th second test mark,/>K is greater than or equal to 1 and less than or equal to the total number of second test marksT is greater than or equal to 1 and less than or equal to/>Is a conditional function,
Representing ifThe conditional function takes on the value/>Otherwise, 0.
According to one embodiment of the invention, determining the line complexity from the vertical line complexity and the lateral line complexity comprises:
According to the formula
The line complexity C is determined, wherein,For the lateral line complexity,/>For the vertical line complexity,/>For the total number of second test marks,/>Is the total number of first test marks.
According to one embodiment of the invention, determining an average temperature trend function of the integrated circuit from the infrared images at each instant in time comprises:
Determining the measurement temperature of a plurality of pixels of the infrared image at each moment according to the chromaticity of the plurality of pixels of the infrared image at each moment;
averaging the measured temperatures to obtain average temperatures at all moments;
and fitting the average temperature at each moment to obtain the average temperature trend function.
According to one embodiment of the invention, determining a control strategy of the exhaust fan according to the line complexity score, the device complexity score and the average temperature trend function comprises:
According to the formula Determining the operating power/>, of the exhaust fan in the next test periodWhere s is the current number of test cycles, s+1 is the next number of test cycles,/>For the running power of the exhaust fan in the current test period, C is the line complexity score, Q is the device complexity score,/>Is the average value of the average temperature trend function,/>As a function value of the average temperature trend function at the end of the current test period,/>Function value of the derivative function of the average temperature trend function at the end of the current test period,/>And/>Is a preset weight.
According to a third aspect of embodiments of the present invention, there is provided an integrated circuit temperature control apparatus comprising: a processor; a memory for storing processor-executable instructions; wherein the processor is configured to invoke the instructions stored by the memory to perform the integrated circuit temperature control method.
According to a fourth aspect of embodiments of the present invention, there is provided a computer readable storage medium having stored thereon computer program instructions which, when executed by a processor, implement the integrated circuit temperature control method.
According to the integrated circuit temperature control system provided by the embodiment of the invention, the image to be processed of the integrated circuit can be shot through the camera, and the circuit complexity score and the device complexity score are determined based on the image to be processed, so that the actual heat dissipation requirement of the integrated circuit is determined through the complexity of a circuit and an electronic device generating heat in the integrated circuit, and the control strategy of the exhaust fan is timely adjusted based on the temperature information determined in the infrared image shot by the infrared camera, so that the temperature control system can meet the actual heat dissipation requirement of the integrated circuit, the integrated circuit can work at normal temperature, and the working performance and the service life of the integrated circuit are improved. When determining the line complexity score, the characteristic that the background area pixel value in the first binarized image is 0 can be utilized to judge whether the first test mark or the second test mark passes through the pixel point between the boundaries of two adjacent first positions or not so as to determine whether the first test mark or the second test mark is included in the summation range, thereby determining the average width of the line, improving the accuracy of the average width of the line, determining the line complexity based on the average width and the number of the lines, and improving the accuracy and objectivity of the line complexity. When the control strategy is determined, the average temperature trend function and the derivative function thereof can be used for determining the adjusting direction of the operation power, the accuracy of adjusting the operation power is improved, and the weighted sum value of the circuit complexity score and the device complexity score is used as an acceleration coefficient to accelerate the adjusting speed of the operation power of the exhaust fan, so that the heat dissipation requirement under the condition of accelerating the temperature rising speed can be met, the integrated circuit can work in a proper temperature range, and the performance and the service life of the integrated circuit are improved.
It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the invention as claimed. Other features and aspects of the present invention will become apparent from the following detailed description of exemplary embodiments, which proceeds with reference to the accompanying drawings.
Drawings
In order to more clearly illustrate the embodiments of the invention or the solutions of the prior art, the drawings which are necessary for the description of the embodiments or the prior art will be briefly described below, it being obvious that the drawings in the following description are only some embodiments of the invention, and that other embodiments may be obtained from these drawings without inventive effort to a person skilled in the art,
FIG. 1 schematically illustrates a schematic diagram of an integrated circuit temperature control system according to an embodiment of the invention;
fig. 2 schematically illustrates a flow chart of a method of integrated circuit temperature control according to an embodiment of the invention.
Detailed Description
For the purpose of making the objects, technical solutions and advantages of the embodiments of the present invention more apparent, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is apparent that the described embodiments are only some embodiments of the present invention, not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
The technical scheme of the invention is described in detail below by specific examples. The following embodiments may be combined with each other, and some embodiments may not be repeated for the same or similar concepts or processes.
Fig. 1 schematically illustrates a schematic diagram of an integrated circuit temperature control system according to an embodiment of the invention, as shown in fig. 1, the system comprising: the device comprises a binocular camera, an exhaust fan and a processor, wherein the binocular camera is arranged above the integrated circuit and comprises an infrared camera and a camera;
The processor is configured to:
Shooting an image to be processed of the integrated circuit through the camera;
Detecting the image to be processed to obtain a first position where a circuit on the integrated circuit is located and a second position where an electronic device is located;
Determining a line complexity score for the integrated circuit based on the first location;
Determining a device complexity score for the integrated circuit according to a second location where the electronic device is located;
Respectively shooting infrared images at a plurality of moments in the current test period through the infrared camera;
determining an average temperature trend function of the integrated circuit according to the infrared images at each moment;
And determining a control strategy of the exhaust fan according to the line complexity score, the device complexity score and the average temperature trend function, wherein the control strategy comprises the operation power of the exhaust fan in the next test period.
According to the integrated circuit temperature control system provided by the embodiment of the invention, the image to be processed of the integrated circuit can be shot through the camera, and the circuit complexity score and the device complexity score are determined based on the image to be processed, so that the actual heat dissipation requirement of the integrated circuit is determined through the complexity of a circuit and an electronic device generating heat in the integrated circuit, and the control strategy of the exhaust fan is timely adjusted based on the temperature information determined in the infrared image shot by the infrared camera, so that the temperature control system can meet the actual heat dissipation requirement of the integrated circuit, the integrated circuit can work at normal temperature, and the working performance and the service life of the integrated circuit are improved.
According to one embodiment of the invention, the integrated circuit may be disposed within a relatively enclosed space, e.g., the computer is internally provided with the integrated circuit and the integrated circuit is externally encased by the housing. Therefore, most of the heat generated by the integrated circuit can be remained in the shell, so that the temperature in the shell is higher, the performance and the service life of the integrated circuit are affected, and therefore, the temperature control system can be used for discharging the heat out of the shell, reducing the temperature in the shell, enabling the temperature in the shell to be in a proper range, and improving the performance and the service life of the integrated circuit.
According to one embodiment of the invention, a binocular camera, i.e. a binocular camera consisting of an infrared camera and a camera, may be arranged above the integrated circuit, RGB images, i.e. images to be processed of the integrated circuit, may be taken by the camera, and infrared images of the integrated circuit may be taken by the infrared camera. The processor can process the image to be processed so as to judge the heat dissipation speed of the circuit and the device of the integrated circuit, determine the current temperature through the infrared image, and further accurately determine the heat dissipation requirement so as to formulate an accurate control strategy to control the exhaust fan to conduct temperature control.
According to one embodiment of the invention, the processor may acquire a to-be-processed image of the integrated circuit captured by the camera, and analyze the heat dissipation requirement of the integrated circuit through the to-be-processed image. If the integrated circuit is placed in the housing with a darker light, the integrated circuit temperature control system may also include a lighting device, such as an LED lamp, which is turned on when the image to be processed needs to be captured, so that a clear image to be processed is captured.
According to an embodiment of the present invention, the image to be processed may include a picture of the integrated circuit, for example, the image to be processed is a picture of the integrated circuit from a top view, and the image to be processed may be detected, so as to obtain a first position where the circuit is located and a second position where the electronic device is located. In an example, the circuit may include a copper layer in a thin line shape, and may be used as a conductive circuit, where the conductive circuit connects various electronic devices, and the lengths and thicknesses of the different circuits are different from each other, when the circuit is powered on, heat is generated due to the effect of the resistor, the larger the resistor of the circuit, the higher the generated heat is, so that the generated heat of the circuit is associated with the complexity of the circuit, the higher the complexity of the circuit, the longer the total length of the circuit, the thinner the average width of the circuit, and the more heat is generated. On the other hand, the types of the electronic devices are various, and different amounts of heat can be generated, and the more the number of the electronic devices is, the more the generated heat is.
According to one embodiment of the invention, the first location is a location of a line in the integrated circuit, in an example, a location of an edge line that outlines the line. The second location is a location of an electronic device in the integrated circuit, in an example, an edge line that outlines the electronic device.
According to one embodiment of the invention, as described above, the amount of heat dissipated by an integrated circuit during operation is related to the complexity of the wiring and to the number of electronic devices. Therefore, to accurately determine the heat dissipation requirement of the integrated circuit, the circuit complexity score of the integrated circuit can be determined, the device complexity score of the integrated circuit can be determined, the heat dissipation requirement of the integrated circuit can be evaluated based on the two scores, and an accurate control strategy is formulated to control the exhaust fan to dissipate heat, so that the temperature of the integrated circuit is controlled within a proper range.
According to one embodiment of the present invention, firstly, the complexity score of the circuit is described, as described above, the higher the complexity of the circuit, the more the number of circuits, and the lower the average width of the circuit, so that the larger the resistance of the circuit, the more heat is generated, and thus, the complexity of the circuit in the above aspect can be determined, and thus, the complexity score of the circuit related to the dissipated heat can be determined.
According to one embodiment of the invention, determining a line complexity score for the integrated circuit based on the first location comprises: determining a first background area except the first position in the image to be processed according to the first position; setting the pixel value of the first background area to 0 to obtain a first image; performing binarization processing on the first image to obtain a first binarized image; a plurality of first test marks are vertically arranged on the first binarization image, the first test marks are a plurality of straight lines vertically arranged along the first binarization image, each straight line is parallel to each other, and the interval of each straight line is a first preset distance; a plurality of second test marks are arranged in the transverse direction of the first binarized image, the second test marks are a plurality of straight lines arranged in the transverse direction of the first binarized image, each straight line is parallel to the other, and the interval of each straight line is a second preset distance; determining the complexity of the vertical line according to the plurality of first test marks; determining the complexity of the transverse line according to the second test marks; and determining the line complexity according to the vertical line complexity and the horizontal line complexity.
According to the embodiment of the invention, in order to determine the complexity of the circuit, the area where the circuit is located can be screened out from the image to be processed, and other positions are ignored, so that analysis can be performed on the area where the circuit is located, and the operation amount of image processing is reduced. In an example, the first location and the first background region outside the first location may be distinguished in the image to be processed. Therefore, the pixel value of the first background area can be set to be 0, so that the first image is obtained, the first background area except the first position is ignored in subsequent processing, and the operation complexity is reduced.
According to an embodiment of the present invention, in order to further reduce the operand and improve the convenience of the subsequent operations, the first image may be binarized, that is, the pixel value in the first position is mapped to a value between 0 and 1, so as to obtain a first binarized image, where in the first binarized image, the pixel value of the pixel point of the background area outside the first position is 0, and the pixel value of the pixel point in the first position is a value between 0 and 1.
According to one embodiment of the invention, a plurality of first test marks can be arranged in the first binarized image, the first test marks are a plurality of straight lines vertically arranged along the first binarized image, each straight line is parallel to each other, the interval of each straight line is a first preset distance, the specific numerical value of the first preset distance is not limited, and each first test mark can vertically pass through the area where an integrated circuit is located in the first binarized image and can vertically pass through the first position where each line is located.
According to one embodiment of the present invention, a plurality of second test marks may be disposed in the first binarized image, the second test marks are a plurality of straight lines disposed along the first binarized image, each straight line is parallel to each other, and the interval between each straight line is a second preset distance.
According to one embodiment of the invention, the vertical line complexity may be determined from a first location of the first test mark and the line it traverses. For example, the greater the number of times the first test mark passes through the first location, the greater the number of lines and the more complex the lines. The above manner of determining the vertical line complexity is merely an example, and the vertical line complexity may also be determined in the following manner.
According to one embodiment of the invention, determining the vertical line complexity from a plurality of the first test marks comprises: obtaining the vertical line complexity according to equation (1)，
（1）
Wherein,For the number of times the ith first test mark crosses the boundary of the first location,For the number of pixel points between the jth crossing the boundary of the first position and the (j+1) th crossing the boundary of the first position of the ith first test mark,/>For the average value of pixel values of pixel points between the jth crossing of the boundary of the first position to the jth+1th crossing of the boundary of the first position of the ith first test mark,/>I is greater than or equal to 1 and less than or equal to/>, the total number of first test marksJ is greater than or equal to 1 and less than or equal to/>Positive integer of/>For a preset coefficient, if is a conditional function,
Representing ifThe conditional function takes on the value/>Otherwise, 0.
According to one embodiment of the invention, the vertical line complexity may be directly related to the number of lines and inversely related to the average width of the lines (i.e., the finer the lines are laid out in a limited area, the more complex the lines), and the heat generated by the lines is directly related to the vertical line complexity, and thus, the heat generated by the lines is also directly related to the number of lines and inversely related to the average width of the lines.
According to one embodiment of the present invention, in equation (1),The number of times the ith first test mark crosses the boundary of the first position is half of the number of times the first test mark crosses the boundary of the first position, and the first test mark crosses the boundary of the first position, namely, the first test mark crosses once when entering the first position and the first test mark crosses once when leaving the first position, so the half of the number of times the first test mark crosses the boundary of the first position can represent the number of times the first test mark crosses the boundary of the first position. Since the vertical line complexity can be positively correlated with the number of lines, the number can be set as the molecular position of equation (1).
According to one embodiment of the present invention, in equation (1),The number of pixel points between the jth crossing boundary of the first position and the jth+1th crossing boundary of the first position is the number of pixel points of the ith first test mark, however, the value is not completely the number of pixel values in the boundary of the first position, and may be the number of pixel values in a background area between the boundaries of two lines, so that it can be determined whether the position between the boundaries of the first test mark and the adjacent two crossing boundary of the first position is the position where the line is or the background area between the two lines. As described above, the pixel values of the background areas of the first binarized image are all set to 0, and therefore, if the position between the boundaries of the first positions where the first test mark passes through twice adjacently is the position where the line is located, the pixel value of the pixel point on the first test mark between the boundaries of the two first positions is not 0, that is, the average pixel value/>Greater than 0, whereas if the position between the boundaries of the first test mark passing through the first positions twice is the position of the background between the two lines, the pixel value of the pixel point between the boundaries of the two first positions on the first test mark is 0, i.e. the average pixel value/>Equal to 0. In calculating the average width of the line, the total number of pixel points with the above average pixel value not being 0 can be solved, i.e. inGreater than 0, will/>Incorporating a summation range, vice versa, ifEqual to 0, will not/>The summation range is included. The value obtained after summation is the total width of the lines traversed by the ith first test mark, and the ratio between the total width and the number of the lines traversed by the first test mark is the average width of the lines traversed by the ith first test mark. Also, since the vertical line complexity is inversely related to the average width of the line, the ratio can be set at the denominator position of equation (1), i.e., the ratio is obtained to the-1 th power.
According to an embodiment of the present invention, the vertical line complexity of the i-th first test mark is obtained, and the vertical line complexity of the integrated circuit may be an average value of the vertical line complexities of all the first test marks, and the average value is multiplied by a preset coefficient to obtain the vertical line complexity of the integrated circuit.
In this way, the characteristic that the pixel value of the background area in the first binarized image is 0 can be utilized to judge whether the first test mark passes through the pixel point between the boundaries of two adjacent first positions or not so as to determine whether the first test mark is included in the summation range, thereby determining the average width of the line, improving the accuracy of the average width of the line, determining the complexity of the vertical line based on the average width and the number of the lines, and improving the accuracy and objectivity of the complexity of the vertical line.
According to one embodiment of the present invention, the lateral line complexity may be determined based on the first location of the second test mark and the line it traverses. For example, the greater the number of times the second test mark crosses the first position, the greater the number of lines, and the more complex the lines. The above manner of determining the lateral line complexity is merely an example, and the lateral line complexity may also be determined in the following manner.
Determining a lateral line complexity based on a plurality of said second test marks,
Comprising the following steps: obtaining the lateral line complexity according to equation (2)，
（2）
Wherein,For the number of times the t second test mark crosses the boundary of the first location,For the number of pixels of the t second test mark between the t-th crossing of the boundary of the first position and the t+1th crossing of the boundary of the first position,/>
The average value of pixel values of pixel points between the t-th crossing of the boundary of the first position and the t+1th crossing of the boundary of the first position of the t-th second test mark,/>K is greater than or equal to 1 and less than or equal to/>, the total number of second test marksT is greater than or equal to 1 and less than or equal to/>Is a conditional function,/>Representing if/>，
The conditional function takes the value ofOtherwise, 0.
According to one embodiment of the invention, the lateral line complexity may be directly related to the number of lines and inversely related to the average width of the lines (i.e., the finer the lines are laid out in a limited area, the more complex the lines), and the heat generated by the lines is directly related to the lateral line complexity, and thus, the heat generated by the lines is also directly related to the number of lines and inversely related to the average width of the lines.
According to one embodiment of the present invention, in equation (2),The number of times the kth second test mark crosses the boundary of the first position is half of the number of times the second test mark crosses the boundary of the first position, and the number of times the second test mark crosses the boundary of the first position can be expressed as the number of times the second test mark crosses the boundary of the first position because the second test mark needs to cross the boundary of the first position twice when the second test mark enters the first position, i.e. the second test mark crosses once when the second test mark leaves the first position. Since the lateral line complexity can be positively correlated with the number of lines, this number can be set as the molecular position of equation (2).
According to one embodiment of the present invention, in equation (2),The number of pixel points between the boundary of the first position traversed by the kth second test mark at the t-th time and the boundary of the t+1th time traversed by the first position is not, however, the value is not completely the number of pixel values within the boundary of the first position, and may be the number of pixel values within a background area between the boundaries of two lines, so that it can be determined whether the position between the boundaries of the second test mark traversing the first position twice is the position where the line is located or the background area between the two lines. As described above, the pixel values of the background areas of the first binarized image are all set to 0, and therefore, if the position between the boundaries of the second test mark passing through the first positions two times adjacently is the position where the line is located, the pixel value of the pixel point on the second test mark between the boundaries of the two first positions is not 0, that is, the average pixel value/>Greater than 0, whereas if the position between the boundaries of the second test mark passing through the first positions twice is the position of the background between the two lines, the pixel value of the pixel point between the boundaries of the two first positions on the second test mark is 0, i.e. the average pixel valueEqual to 0. In calculating the average width of the line, the total number of pixel points for which the above average pixel value is not 0 can be solved, i.e., at/>Greater than 0, will/>Incorporating a summation range, otherwise, if/>Equal to 0, will not/>The summation range is included. The value obtained after summation is the total width of the lines traversed by the kth second test mark, and the ratio between the total width and the number of the lines traversed by the second test mark is the average width of the lines traversed by the kth second test mark. Also, since the lateral line complexity is inversely related to the average width of the line, the ratio can be set at the denominator position of equation (2), i.e., the ratio is obtained to the-1 th power. /(I)
According to one embodiment of the present invention, the lateral line complexity of the kth second test mark is obtained, and the lateral line complexity of the integrated circuit may be an average value of the lateral line complexity of all the second test marks, and the average value is multiplied by a preset coefficient to obtain the lateral line complexity of the integrated circuit.
In this way, the characteristic that the pixel value of the background area in the first binarized image is 0 can be utilized to judge whether the second test mark passes through the pixel point between the boundaries of two adjacent first positions or not so as to determine whether the second test mark is included in the summation range, thereby determining the average width of the line, improving the accuracy of the average width of the line, determining the complexity of the transverse line based on the average width and the number of the lines, and improving the accuracy and objectivity of the complexity of the transverse line.
According to one embodiment of the present invention, the above obtains the lateral line complexity and the vertical line complexity of the integrated circuit, which are both positively correlated with the heat generated by the line, so that the two can be weighted and summed to obtain the line complexity of the integrated circuit, which is positively correlated with the heat generated by the line.
According to one embodiment of the invention, determining the line complexity from the vertical line complexity and the lateral line complexity comprises:
determining the line complexity C according to equation (3),
（3）
Wherein,For the lateral line complexity,/>For the vertical line complexity,/>For the total number of second test marks,/>Is the total number of first test marks.
According to one embodiment of the invention, the weight of the lateral line complexity is the ratio between the total number of second test marks and the total number of all test marks (sum of the total number of first test marks and the total number of second test marks) and the weight of the vertical line complexity is the ratio between the total number of first test marks and the total number of all test marks (sum of the total number of first test marks and the total number of second test marks) when the summation is weighted.
In accordance with one embodiment of the present invention, a line complexity score that is positively correlated to heat generated by the line is obtained as well as a device complexity score that is positively correlated to heat generated by the electronic device. In an example, the electronic device complexity score may be directly related to the number and power of the electronic devices, e.g., the number and power of the electronic devices may be utilized to obtain a total power of all electronic devices on the integrated circuit, and the total power may be multiplied by a predetermined coefficient to obtain a device complexity score that is directly related to the heat generated by the electronic devices.
The above obtains a line complexity score and a device complexity score that are positively correlated to heat generated by an integrated circuit, according to one embodiment of the present invention. The temperature trend of the current test cycle around the integrated circuit can also be determined through the infrared image, so that the heat dissipation requirement of the integrated circuit in the next test cycle can be evaluated based on the circuit complexity score, the device complexity score and the temperature trend, and the control strategy of the exhaust fan in the next test cycle can be determined.
According to one embodiment of the invention, an infrared image may be taken at each time of the current test cycle, and the infrared image may acquire infrared light around the integrated circuit, and the temperature around the integrated circuit may be determined based on the infrared light.
According to one embodiment of the invention, determining an average temperature trend function of the integrated circuit from the infrared images at each instant in time comprises: determining the measurement temperature of a plurality of pixels of the infrared image at each moment according to the chromaticity of the plurality of pixels of the infrared image at each moment; averaging the measured temperatures to obtain average temperatures at all moments; and fitting the average temperature at each moment to obtain the average temperature trend function.
According to one embodiment of the invention, the average temperature obtained by averaging the corresponding measured temperatures of the pixel points has finer strength and higher accuracy, and can reflect the actual temperature around the integrated circuit. Based on the method, the average temperature of all the moments around the integrated circuit can be determined, the average temperature of all the moments is fitted, an average temperature trend function can be obtained, and the change trend of the temperature around the integrated circuit can be represented.
According to one embodiment of the invention, determining a control strategy for the exhaust fan according to the line complexity score, the device complexity score and the average temperature trend function comprises: determining the operating power of the exhaust fan in the next test period according to formula (4)，
（4）
Where s is the current number of test cycles, s+1 is the next number of test cycles,For the running power of the exhaust fan in the current test period, C is the line complexity score, Q is the device complexity score,/>Is the average value of the average temperature trend function,/>As a function value of the average temperature trend function at the end of the current test period,/>Function value of the derivative function of the average temperature trend function at the end of the current test period,/>And/>Is a preset weight.
According to one embodiment of the present invention, in equation (4), if the current test period is the 1 st test periodMay be set to a default operating power. And adjusts the operating power in a subsequent control period. /(I)If the ratio of the temperature at the end of the current test period to the average temperature in the current test period is greater than 1, the temperature at the end of the current test period is higher than the average temperature in the current test period, the temperature rises, accordingly, the power of the exhaust fan needs to be increased in the next test period, so that the heat dissipation efficiency is improved, and the temperature is lowered, otherwise, the temperature at the end of the current test period is lower than the average temperature in the current test period, the temperature is lowered, and accordingly, the power of the exhaust fan can be reduced in the next test period, so that the energy consumption is reduced. Further, the adjustment direction may also be determined by a function value of a derivative of the average temperature trend function at the end of the current test period, which is a positive number if the temperature increases, indicating that the power of the exhaust fan is increasing in the next test period, whereas is a negative number if the temperature decreases, indicating that the temperature is decreasing, and indicating that the power of the exhaust fan is decreasing in the next test period.
According to one embodiment of the invention, the amplitude of the next test period compared to the current test period may be adjusted byTo indicate that, after the adjustment direction is determined as above, the adjustment amplitude can also be determined by multiplying the running power of the exhaust fan for the current test period and the weighted sum of the line complexity score and the device complexity score. Because the heat generated by the integrated circuit is positively correlated with the circuit complexity score and the device complexity score, and the temperature rising speed around the integrated circuit is accelerated due to the heat preservation effect of the shell, the weighted sum value of the circuit complexity score and the device complexity score can be used as an acceleration coefficient to accelerate the adjusting speed of the running power of the exhaust fan, so that the heat dissipation requirement under the condition that the temperature rising speed is accelerated is met according to the temperature control requirement under the heat preservation effect of the shell. And summing the adjustment amplitude and the operation power of the current test period to obtain the operation power of the exhaust fan of the next test period, namely, the control strategy of the exhaust fan. And in the next test period, the exhaust fan is controlled to run by using the control strategy determined above, so as to radiate heat of the integrated circuit.
In this way, the average temperature trend function and the derivative function thereof can be used for determining the adjusting direction of the operating power, the accuracy of adjusting the operating power is improved, and the weighted sum value of the circuit complexity score and the device complexity score is used as an acceleration coefficient to accelerate the adjusting speed of the operating power of the exhaust fan, so that the heat dissipation requirement under the condition of accelerating the temperature rising speed can be met, the integrated circuit can work in a proper temperature range, and the performance and the service life of the integrated circuit are improved.
According to the integrated circuit temperature control system provided by the embodiment of the invention, the image to be processed of the integrated circuit can be shot through the camera, and the circuit complexity score and the device complexity score are determined based on the image to be processed, so that the actual heat dissipation requirement of the integrated circuit is determined through the complexity of a circuit and an electronic device generating heat in the integrated circuit, and the control strategy of the exhaust fan is timely adjusted based on the temperature information determined in the infrared image shot by the infrared camera, so that the temperature control system can meet the actual heat dissipation requirement of the integrated circuit, the integrated circuit can work at normal temperature, and the working performance and the service life of the integrated circuit are improved. When determining the line complexity score, the characteristic that the background area pixel value in the first binarized image is 0 can be utilized to judge whether the first test mark or the second test mark passes through the pixel point between the boundaries of two adjacent first positions or not so as to determine whether the first test mark or the second test mark is included in the summation range, thereby determining the average width of the line, improving the accuracy of the average width of the line, determining the line complexity based on the average width and the number of the lines, and improving the accuracy and objectivity of the line complexity. When the control strategy is determined, the average temperature trend function and the derivative function thereof can be used for determining the adjusting direction of the operation power, the accuracy of adjusting the operation power is improved, and the weighted sum value of the circuit complexity score and the device complexity score is used as an acceleration coefficient to accelerate the adjusting speed of the operation power of the exhaust fan, so that the heat dissipation requirement under the condition of accelerating the temperature rising speed can be met, the integrated circuit can work in a proper temperature range, and the performance and the service life of the integrated circuit are improved.
Fig. 2 schematically illustrates a flow chart of a method of integrated circuit temperature control according to an embodiment of the invention, as shown in fig. 2, the method comprising:
step S101, shooting an image to be processed of the integrated circuit through a camera;
Step S102, detecting the image to be processed to obtain a first position of a circuit on the integrated circuit and a second position of an electronic device;
step S103, determining a circuit complexity score of the integrated circuit according to the first position;
Step S104, determining a device complexity score of the integrated circuit according to a second position of the electronic device;
step S105, respectively shooting infrared images at a plurality of moments in the current test period through an infrared camera;
step S106, determining an average temperature trend function of the integrated circuit according to the infrared images at all times;
step S107, determining a control strategy of the exhaust fan according to the line complexity score, the device complexity score and the average temperature trend function, wherein the control strategy comprises the operation power of the exhaust fan in the next test period.
According to one embodiment of the invention, determining a line complexity score for the integrated circuit based on the first location comprises:
Determining a first background area except the first position in the image to be processed according to the first position;
setting the pixel value of the first background area to 0 to obtain a first image;
performing binarization processing on the first image to obtain a first binarized image;
a plurality of first test marks are vertically arranged on the first binarization image, the first test marks are a plurality of straight lines vertically arranged along the first binarization image, each straight line is parallel to each other, and the interval of each straight line is a first preset distance;
a plurality of second test marks are arranged in the transverse direction of the first binarized image, the second test marks are a plurality of straight lines arranged in the transverse direction of the first binarized image, each straight line is parallel to the other, and the interval of each straight line is a second preset distance;
determining the complexity of the vertical line according to the plurality of first test marks;
determining the complexity of the transverse line according to the second test marks;
And determining the line complexity according to the vertical line complexity and the horizontal line complexity.
According to one embodiment of the invention, determining the vertical line complexity from a plurality of the first test marks comprises:
According to the formula
Obtaining the vertical line complexityWherein/>For the number of times the ith first test mark crosses the boundary of said first position,/>For the number of pixel points between the jth crossing the boundary of the first position and the (j+1) th crossing the boundary of the first position of the ith first test mark,/>For the average value of pixel values of pixel points between the jth crossing of the boundary of the first position to the jth+1th crossing of the boundary of the first position of the ith first test mark,/>I is greater than or equal to 1 and less than or equal to/>, the total number of first test marksJ is greater than or equal to 1 and less than or equal to/>Positive integer of/>Is a preset coefficient, if is a conditional function,/>
Representing ifThe conditional function takes on the value/>Otherwise, 0.
According to one embodiment of the invention, determining the lateral line complexity from a plurality of said second test marks comprises:
According to the formula
Obtaining the lateral line complexityWherein/>For the number of times the t second test mark crosses the boundary of the first position,/>For the number of pixels of the t second test mark between the t-th crossing of the boundary of the first position and the t+1th crossing of the boundary of the first position,/>The average value of pixel values of pixel points between the t-th crossing of the boundary of the first position and the t+1th crossing of the boundary of the first position of the t-th second test mark,/>K is greater than or equal to 1 and less than or equal to the total number of second test marksT is greater than or equal to 1 and less than or equal to/>Is a conditional function,Representing ifThe conditional function takes on the value/>Otherwise, 0.
According to one embodiment of the invention, determining the line complexity from the vertical line complexity and the lateral line complexity comprises:
According to the formula
The line complexity C is determined, wherein,For the lateral line complexity,/>For the vertical line complexity,/>For the total number of second test marks,/>Is the total number of first test marks.
According to one embodiment of the invention, determining an average temperature trend function of the integrated circuit from the infrared images at each instant in time comprises:
Determining the measurement temperature of a plurality of pixels of the infrared image at each moment according to the chromaticity of the plurality of pixels of the infrared image at each moment;
averaging the measured temperatures to obtain average temperatures at all moments;
and fitting the average temperature at each moment to obtain the average temperature trend function.
According to one embodiment of the invention, determining a control strategy of the exhaust fan according to the line complexity score, the device complexity score and the average temperature trend function comprises:
According to the formula
Determining the operating power of the exhaust fan in the next test periodWhere s is the current number of test cycles, s+1 is the next number of test cycles,/>For the running power of the exhaust fan in the current test period, C is the line complexity score, Q is the device complexity score,/>Is the average value of the average temperature trend function,/>As a function value of the average temperature trend function at the end of the current test period,/>Function value of the derivative function of the average temperature trend function at the end of the current test period,/>And/>Is a preset weight.
According to an embodiment of the present invention, there is provided an integrated circuit temperature control apparatus including: a processor; a memory for storing processor-executable instructions; wherein the processor is configured to invoke the instructions stored by the memory to perform the integrated circuit temperature control method.
According to one embodiment of the present invention, a computer-readable storage medium having stored thereon computer program instructions that, when executed by a processor, implement the integrated circuit temperature control method is provided.
The present invention may be a method, apparatus, system, and/or computer program product. The computer program product may include a computer readable storage medium having computer readable program instructions embodied thereon for performing various aspects of the present invention.
It will be appreciated by persons skilled in the art that the embodiments of the invention described above and shown in the drawings are by way of example only and are not limiting. The objects of the present invention have been fully and effectively achieved. The functional and structural principles of the present invention have been shown and described in the examples and embodiments of the invention may be modified or practiced without departing from the principles described.
Finally, it should be noted that: the above embodiments are only for illustrating the technical solution of the present invention, and not for limiting the same; although the invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some or all of the technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit of the invention.

Claims (3)

1. An integrated circuit temperature control system, comprising:
The device comprises a binocular camera, an exhaust fan and a processor, wherein the binocular camera is arranged above the integrated circuit and comprises an infrared camera and a camera;
The processor is configured to:
Shooting an image to be processed of the integrated circuit through the camera;
Detecting the image to be processed to obtain a first position where a circuit on the integrated circuit is located and a second position where an electronic device is located;
Determining a line complexity score for the integrated circuit based on the first location;
Determining a device complexity score for the integrated circuit according to a second location where the electronic device is located;
Respectively shooting infrared images at a plurality of moments in the current test period through the infrared camera;
determining an average temperature trend function of the integrated circuit according to the infrared images at each moment;
Determining a control strategy of the exhaust fan according to the line complexity score, the device complexity score and the average temperature trend function, wherein the control strategy comprises the operation power of the exhaust fan in the next test period;
determining a line complexity score for the integrated circuit based on the first location, comprising:
Determining a first background area except the first position in the image to be processed according to the first position;
setting the pixel value of the first background area to 0 to obtain a first image;
performing binarization processing on the first image to obtain a first binarized image;
a plurality of first test marks are vertically arranged on the first binarization image, the first test marks are a plurality of straight lines vertically arranged along the first binarization image, each straight line is parallel to each other, and the interval of each straight line is a first preset distance;
a plurality of second test marks are arranged in the transverse direction of the first binarized image, the second test marks are a plurality of straight lines arranged in the transverse direction of the first binarized image, each straight line is parallel to the other, and the interval of each straight line is a second preset distance;
determining the complexity of the vertical line according to the plurality of first test marks;
determining the complexity of the transverse line according to the second test marks;
Determining the line complexity according to the vertical line complexity and the horizontal line complexity;
Determining the complexity of the vertical line according to the plurality of first test marks, including:
According to the formula
Obtaining the vertical line complexity C v, wherein N v,i is the number of times the ith first test mark crosses the boundary of the first position, N v,i,(j)-(j+1) is the number of pixel points between the jth crossing the boundary of the first position and the jth+1th crossing the boundary of the first position,For the average value of pixel values of pixel points between the jth crossing boundary of the first position and the jth+1th crossing boundary of the first position of the ith first test mark, M v is the total number of the first test marks, i is a positive integer greater than or equal to 1 and less than or equal to M v, j is a positive integer greater than or equal to 1 and less than or equal to N v,i -1, K 1 is a preset coefficient, if is a conditional function,Representing ifThe conditional function takes on the value n v,i,(j)-(j+1), otherwise, 0;
determining the complexity of the transverse line according to a plurality of the second test marks, including:
According to the formula
Obtaining the lateral line complexity C c, wherein N c,k is the number of times the t second test mark crosses the boundary of the first position, N c,k,(t)-(t+1) is the number of pixel points between the t-th crossing of the boundary of the first position and the t+1th crossing of the boundary of the first position,The t second test marks are the average value of pixel values of pixel points between the boundary of the first position crossing the t th time and the boundary of the t+1th time crossing the first position, M c is the total number of the second test marks, k is a positive integer greater than or equal to 1 and less than or equal to M c, t is a positive integer greater than or equal to 1 and less than or equal to N c,k -1, if is a conditional function,Representing ifThe conditional function takes the value of n c,k,(t)-(t+1), otherwise 0, K 2 is a preset coefficient;
determining the line complexity according to the vertical line complexity and the horizontal line complexity, including:
According to the formula
Determining the line complexity C, wherein C c is the lateral line complexity, C v is the vertical line complexity, M c is the total number of second test marks, and M v is the total number of first test marks;
determining a control strategy of the exhaust fan according to the line complexity score, the device complexity score and the average temperature trend function, wherein the control strategy comprises the following steps:
According to the formula
Determining the operating power P s+1 of the exhaust fan in the next test period, wherein s is the current test period number, s+1 is the next test period number, P s is the operating power of the exhaust fan in the current test period, C is the line complexity score, Q is the device complexity score,For the average value of the average temperature trend function, T f is the function value of the average temperature trend function at the end of the current test period, T' f is the function value of the derivative function of the average temperature trend function at the end of the current test period, and α and β are preset weights.
2. The integrated circuit temperature control system of claim 1, wherein determining an average temperature trend function for the integrated circuit from the infrared images at each time instant comprises:
Determining the measurement temperature of a plurality of pixels of the infrared image at each moment according to the chromaticity of the plurality of pixels of the infrared image at each moment;
averaging the measured temperatures to obtain average temperatures at all moments;
and fitting the average temperature at each moment to obtain the average temperature trend function.
3. An integrated circuit temperature control method for a processor of an integrated circuit temperature control system according to claim 1 or 2, comprising:
Shooting an image to be processed of the integrated circuit through a camera;
Detecting the image to be processed to obtain a first position where a circuit on the integrated circuit is located and a second position where an electronic device is located;
Determining a line complexity score for the integrated circuit based on the first location;
Determining a device complexity score for the integrated circuit according to a second location where the electronic device is located;
Respectively shooting infrared images at a plurality of moments in the current test period through an infrared camera;
determining an average temperature trend function of the integrated circuit according to the infrared images at each moment;
And determining a control strategy of the exhaust fan according to the line complexity score, the device complexity score and the average temperature trend function, wherein the control strategy comprises the operation power of the exhaust fan in the next test period.
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