CN117368831A - Method, system, equipment and medium for measuring synchronous clock error of low-voltage transformer area - Google Patents
Method, system, equipment and medium for measuring synchronous clock error of low-voltage transformer area Download PDFInfo
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Abstract
The invention discloses a method, a system, equipment and a medium for measuring synchronous clock errors of a low-voltage area, wherein the method comprises the steps of constructing an error matrix of each intelligent electric meter after time scale data of a plurality of intelligent electric meters in the area are acquired in real time, processing each error matrix by using a clustering analysis method to obtain a potential abnormal intelligent electric meter number set corresponding to each error matrix, carrying out statistical analysis on all the potential abnormal intelligent electric meter number sets to obtain an abnormal intelligent electric meter number set, and finally calculating to obtain the synchronous clock errors based on the difference between the report time of a central device of the area and the report time of all the abnormal intelligent electric meters, thereby realizing the synchronous clock error measurement of the low-voltage area. The whole measurement process does not need to acquire communication delay information, eliminates the influence of uncertainty and asymmetry of equipment node communication delay, improves the measurement accuracy of the synchronous clock error of the low-voltage station area, and has the advantages of simplicity, practicability and strong operability.
Description
Technical Field
The present invention relates to the field of clock synchronization in power systems, and in particular, to a method and system for measuring a synchronization clock error in a low voltage transformer area, an electronic device, and a computer readable storage medium.
Background
Accurate time information is critical to improving the reliable operation level of the low-voltage distribution network and the user electricity service management level. In recent years, a power grid company establishes a time synchronization system among a power consumption information acquisition main station, an acquisition terminal and an electric energy meter, clock errors are limited to be less than a few seconds, and solid guarantee is provided for user power consumption information data analysis, time-of-use electricity price and step electricity price policy execution. However, the topology structure of the low-voltage distribution network is very complex, equipment is numerous when the distribution network is used, the problems of uncertainty, asymmetry and the like are easy to exist in the communication delay of each equipment node, and the synchronous clock error of the equipment node is difficult to accurately measure by the existing method.
Disclosure of Invention
The invention provides a method and a system for measuring synchronous clock errors of a low-voltage area, electronic equipment and a computer readable storage medium, which are used for solving the technical problem that the synchronous clock errors of equipment nodes are difficult to accurately measure due to uncertainty and asymmetry of communication delay of the equipment nodes in the prior art.
According to one aspect of the present invention, there is provided a method for measuring a synchronization clock error of a low-voltage station, including:
acquiring time scale data of a plurality of intelligent ammeter in a low-voltage station area;
constructing an error matrix of each intelligent ammeter based on the time scale data of the plurality of intelligent ammeter;
performing cluster analysis on the error matrix of each intelligent ammeter to obtain a potential abnormal intelligent ammeter number set corresponding to each error matrix;
carrying out statistical analysis on all the potential abnormal intelligent ammeter number sets to obtain abnormal intelligent ammeter number sets;
and calculating to obtain a synchronous clock error based on the difference between the report time of the station area concentrator and the report time of all abnormal intelligent electric meters.
Further, the process of constructing the error matrix of each smart meter based on the time scale data of the plurality of smart meters includes the following steps:
subtracting the time scale data of any intelligent ammeter from the time scale data of the rest intelligent ammeter one by one to obtain a clock data difference matrix of the current intelligent ammeter;
obtaining the distance between the station area concentrator and each intelligent ammeter, and constructing a weight matrix of the current intelligent ammeter;
calculating the Hadamard product of the clock data difference matrix and the weight matrix of the current intelligent ammeter to obtain an error matrix of the current intelligent ammeter;
and repeating the process to obtain an error matrix of each intelligent ammeter.
Further, the weight matrix of the current smart meter is expressed as:
wherein m represents the number of the current intelligent ammeter, k represents the number of the rest intelligent ammeter, W m Weight matrix representing current smart meter, d m And d k Respectively representing the distances between the district concentrator and the intelligent ammeter m and the intelligent ammeter k, d 1 The distance between the station area concentrator and the intelligent ammeter 1 is represented, and n represents the number of the intelligent ammeter in the low-voltage station area.
Further, the process of performing cluster analysis on the error matrix of each smart meter to obtain the number set of the potential abnormal smart meter corresponding to each error matrix includes the following steps:
and clustering each error matrix, dividing the error matrix into a set containing a plurality of clustering clusters, recording the number of the intelligent electric meter at the furthest point in each clustering cluster, and marking the number as a potential abnormal intelligent electric meter to obtain a potential abnormal intelligent electric meter number set corresponding to each error matrix.
Further, the process of statistically analyzing all the potentially abnormal smart meter number sets to obtain the abnormal smart meter number sets includes the following steps:
counting the number of each potential abnormal intelligent electric meter in all the potential abnormal intelligent electric meter number sets, and marking the potential abnormal intelligent electric meters as abnormal intelligent electric meters when the number of certain potential abnormal intelligent electric meters exceeds a preset threshold value to obtain the abnormal intelligent electric meter number sets.
Further, the preset threshold is determined based on the following equation: q=δ×n, q represents a preset threshold, n represents the number of smart meters in the low-voltage transformer area, δ represents a trusted value, and the range of the trusted value is [0,1].
Further, the synchronous clock error is calculated based on the following equation:
wherein p represents the number of abnormal smart metersThe amount of the product is calculated,represent abnormal smart meter number set, t 0 Indicating the time t of the report of the station area concentrator i Reporting time of the abnormal smart meter i, < ->Representing a synchronous clock error.
In addition, the invention also provides a system for measuring the synchronous clock error of the low-voltage station, which comprises the following steps:
the time scale data acquisition module is used for acquiring time scale data of a plurality of intelligent ammeter in the low-voltage transformer area;
the error matrix construction module is used for constructing an error matrix of each intelligent ammeter based on time scale data of the plurality of intelligent ammeters;
the cluster analysis module is used for carrying out cluster analysis on the error matrix of each intelligent ammeter to obtain a potential abnormal intelligent ammeter number set corresponding to each error matrix;
the statistical analysis module is used for carrying out statistical analysis on all the potential abnormal intelligent ammeter number sets to obtain the abnormal intelligent ammeter number sets;
and the error calculation module is used for calculating and obtaining the synchronous clock error based on the difference value between the report time of the station area concentrator and the report time of all abnormal intelligent electric meters.
In addition, the invention also provides an electronic device comprising a processor and a memory, wherein the memory stores a computer program, and the processor is used for executing the steps of the method by calling the computer program stored in the memory.
In addition, the present invention also provides a computer readable storage medium storing a computer program for measuring a low voltage zone synchronization clock error, which when run on a computer performs the steps of the method as described above.
The invention has the following effects:
according to the method for measuring the synchronous clock error of the low-voltage station area, after time scale data of a plurality of intelligent electric meters in the station area are obtained in real time, an error matrix of each intelligent electric meter is constructed, each error matrix is processed by a clustering analysis method to obtain a potential abnormal intelligent electric meter number set corresponding to each error matrix, then statistical analysis is carried out on all the potential abnormal intelligent electric meter number sets to obtain an abnormal intelligent electric meter number set, and finally, based on the difference between the reporting time of a station area concentrator and the reporting time of all the abnormal intelligent electric meters, the synchronous clock error is calculated, so that the synchronous clock error measurement of the low-voltage station area is realized. The whole measurement process does not need to acquire communication delay information, eliminates the influence of uncertainty and asymmetry of equipment node communication delay, improves the measurement accuracy of the synchronous clock error of the low-voltage station area, and has the advantages of simplicity, practicability and strong operability.
In addition, the system for measuring the synchronous clock error of the low-voltage station area has the advantages.
In addition to the objects, features and advantages described above, the present invention has other objects, features and advantages. The present invention will be described in further detail with reference to the drawings.
Drawings
The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the invention. In the drawings:
fig. 1 is a flow chart of a method for measuring a synchronization clock error of a low-voltage station according to a preferred embodiment of the present invention.
Fig. 2 is a schematic flow chart of step S2 in fig. 1.
Fig. 3 is a schematic block diagram of a system for measuring a synchronization clock error of a low-voltage transformer area according to another embodiment of the present invention.
Detailed Description
Embodiments of the invention are described in detail below with reference to the attached drawing figures, but the invention can be practiced in a number of different ways, as defined and covered below.
It will be appreciated that as shown in fig. 1, a preferred embodiment of the present invention provides a method for measuring a synchronization clock error of a low voltage station, which includes the following steps:
step S1: acquiring time scale data of a plurality of intelligent ammeter in a low-voltage station area;
step S2: constructing an error matrix of each intelligent ammeter based on the time scale data of the plurality of intelligent ammeter;
step S3: performing cluster analysis on the error matrix of each intelligent ammeter to obtain a potential abnormal intelligent ammeter number set corresponding to each error matrix;
step S4: carrying out statistical analysis on all the potential abnormal intelligent ammeter number sets to obtain abnormal intelligent ammeter number sets;
step S5: and calculating to obtain a synchronous clock error based on the difference between the report time of the station area concentrator and the report time of all abnormal intelligent electric meters.
It can be understood that in the method for measuring the synchronous clock error of the low-voltage area, after time scale data of a plurality of intelligent electric meters in the area are obtained in real time, an error matrix of each intelligent electric meter is constructed, then each error matrix is processed by using a cluster analysis method to obtain a potential abnormal intelligent electric meter number set corresponding to each error matrix, then statistical analysis is performed on all the potential abnormal intelligent electric meter number sets to obtain an abnormal intelligent electric meter number set, and finally, based on the difference between the sending time of the area concentrator and the reporting time of all the abnormal intelligent electric meters, the synchronous clock error is calculated, so that the synchronous clock error measurement of the low-voltage area is realized. The whole measurement process does not need to acquire communication delay information, eliminates the influence of uncertainty and asymmetry of equipment node communication delay, improves the measurement accuracy of the synchronous clock error of the low-voltage station area, and has the advantages of simplicity, practicability and strong operability.
It can be understood that in the step S1, the master clock of the zone concentrator acquires the accurate clock of the master station, and then broadcasts and forwards the accurate clock to all the smart meters in the zone, and acquires the time scale data of the smart meters with edge computing capability at all the user terminals in real time.
It will be understood that, as shown in fig. 2, in the step S2, the process of constructing the error matrix of each smart meter based on the time scale data of the plurality of smart meters includes the following:
step S21: subtracting the time scale data of any intelligent ammeter from the time scale data of the rest intelligent ammeter one by one to obtain a clock data difference matrix of the current intelligent ammeter;
step S22: obtaining the distance between the station area concentrator and each intelligent ammeter, and constructing a weight matrix of the current intelligent ammeter;
step S23: calculating the Hadamard product of the clock data difference matrix and the weight matrix of the current intelligent ammeter to obtain an error matrix of the current intelligent ammeter;
step S24: and repeating the process to obtain an error matrix of each intelligent ammeter.
Specifically, any intelligent ammeter is selected from the low-voltage transformer area to serve as a current intelligent ammeter, time scale data of the current intelligent ammeter and time scale data of the rest intelligent ammeter are subtracted one by one to obtain a clock data difference matrix of the current intelligent ammeter, wherein the clock data difference matrix can be expressed as:m represents the number of the current intelligent ammeter, k represents the number of the rest intelligent ammeter, t 1 、t m 、t k Time scale data respectively representing the intelligent ammeter 1, the current intelligent ammeter m and the intelligent ammeter k, T m And the clock data difference matrix of the current smart meter m is represented.
And then, according to the topological structure of the low-voltage station area, obtaining the distance d between the station area concentrator and each intelligent ammeter, and constructing a weight matrix of the current intelligent ammeter m. The weight matrix of the current smart meter may be expressed as:
wherein m represents the current intelligenceNumber of ammeter, k represents number of remaining smart meter, W m Weight matrix representing current smart meter, d m And d k Respectively representing the distances between the district concentrator and the intelligent ammeter m and the intelligent ammeter k, d 1 The distance between the station area concentrator and the intelligent ammeter 1 is represented, and n represents the number of the intelligent ammeter in the low-voltage station area.
Then, the Hadamard product of the clock data difference matrix and the weight matrix of the current intelligent ammeter m is calculated, and an error matrix R of the current intelligent ammeter m can be obtained m The calculation process can be expressed as Representing the multiplication symbols of the hadamard product.
And repeating the steps S21 to S23 to obtain the error matrixes of all the intelligent electric meters.
It can be understood that the method and the device construct the clock data difference matrix of the current intelligent electric meter based on the difference between the time scale data of the current intelligent electric meter and the time scale data of the rest intelligent electric meters, construct the weight matrix by combining the topological structure between the station area concentrator and the intelligent electric meters, utilize the weight matrix and the clock data difference matrix to carry out Hadamard product operation, correct the difference matrix, obtain the error matrix of each intelligent electric meter, and improve the accuracy of the calculation result.
It can be understood that, in the step S3, the process of performing cluster analysis on the error matrix of each smart meter to obtain the number set of the potentially abnormal smart meter corresponding to each error matrix includes the following steps:
and clustering each error matrix, dividing the error matrix into a set containing a plurality of clustering clusters, recording the number of the intelligent electric meter at the furthest point in each clustering cluster, and marking the number as a potential abnormal intelligent electric meter to obtain a potential abnormal intelligent electric meter number set corresponding to each error matrix.
Specifically, for the smart meter i, it employs conventional cluster calculationFor its error matrix data R i ＝{r 1 ,r 2 ,...,r n Clustering, dividing it into data sets containing Z clusters, which can be expressed as E i ＝{e 1 ,e 2 ,...,e Z }. Then, the number of the smart meter at the furthest point in each cluster e is recorded and marked as a potential abnormal smart meter, so that an error matrix R is obtained i The corresponding potentially anomalous smart meter number set may be represented as: x is X i ＝{x 1 ,x 2 ,...,x Z }，x Z The number of the potentially anomalous smart meter Z is represented. And repeating the process, and each intelligent ammeter can calculate and obtain the corresponding potential abnormal intelligent ammeter number set.
It can be understood that in the step S4, the process of performing statistical analysis on all the potentially abnormal smart meter number sets to obtain the abnormal smart meter number sets includes the following steps:
counting the number of each potential abnormal intelligent electric meter in all the potential abnormal intelligent electric meter number sets, and marking the potential abnormal intelligent electric meters as abnormal intelligent electric meters when the number of certain potential abnormal intelligent electric meters exceeds a preset threshold value to obtain the abnormal intelligent electric meter number sets.
Specifically, each smart meter calculates to obtain the corresponding potentially abnormal smart meter number set X i After reporting to the district concentrator, the district concentrator can count and obtain the quantity of each potential abnormal intelligent ammeter, if the quantity of a certain potential abnormal intelligent ammeter exceeds a preset threshold q, the ammeter is marked as an abnormal intelligent ammeter, so that an abnormal intelligent ammeter number set can be obtainedIt can be expressed as: />x′ p The number indicating the abnormal smart meter p, p indicating the number of abnormal smart meters. Wherein the preset threshold is determined specifically based on the following formula: q=δ×n, q represents a preset threshold value, and n represents a low-voltage station areaThe number of the internal intelligent ammeter, delta represents a trusted value, and the value range of the internal intelligent ammeter is [0,1]]For example, δ may take a value of 0.4, 0.5, 0.6, 0.7, or 0.8, and the specific value may be set according to the actual accuracy requirement.
It can be appreciated that in the step S5, an abnormal smart meter number set is obtainedAnd then, the district concentrator can calculate and obtain the synchronous clock error based on the difference value between the report time of the district concentrator and the report time of all abnormal intelligent electric meters. The synchronous clock error is calculated based on the following formula:
wherein p represents the number of abnormal smart meters,represent abnormal smart meter number set, t 0 Indicating the time t of the report of the station area concentrator i Reporting time of the abnormal smart meter i, < ->Representing a synchronous clock error.
In addition, as shown in fig. 3, another embodiment of the present invention further provides a system for measuring a synchronization clock error of a low voltage station, preferably using the measuring method as described above, which includes:
the time scale data acquisition module is used for acquiring time scale data of a plurality of intelligent ammeter in the low-voltage transformer area;
the error matrix construction module is used for constructing an error matrix of each intelligent ammeter based on time scale data of the plurality of intelligent ammeters;
the cluster analysis module is used for carrying out cluster analysis on the error matrix of each intelligent ammeter to obtain a potential abnormal intelligent ammeter number set corresponding to each error matrix;
the statistical analysis module is used for carrying out statistical analysis on all the potential abnormal intelligent ammeter number sets to obtain the abnormal intelligent ammeter number sets;
and the error calculation module is used for calculating and obtaining the synchronous clock error based on the difference value between the report time of the station area concentrator and the report time of all abnormal intelligent electric meters.
It can be understood that in the system for measuring the synchronous clock error of the low-voltage area, after time scale data of a plurality of intelligent electric meters in the area are obtained in real time, an error matrix of each intelligent electric meter is constructed, then each error matrix is processed by using a cluster analysis method to obtain a potential abnormal intelligent electric meter number set corresponding to each error matrix, then statistical analysis is performed on all the potential abnormal intelligent electric meter number sets to obtain an abnormal intelligent electric meter number set, finally, based on the difference between the sending time of the area concentrator and the reporting time of all the abnormal intelligent electric meters, the synchronous clock error is calculated, and thus the synchronous clock error measurement of the low-voltage area is realized. The whole measurement process does not need to acquire communication delay information, eliminates the influence of uncertainty and asymmetry of equipment node communication delay, improves the measurement accuracy of the synchronous clock error of the low-voltage station area, and has the advantages of simplicity, practicability and strong operability.
It can be understood that each module in the embodiment of the present system corresponds to each step in the embodiment of the method, so that the specific working process of each module is not described herein, and reference should be made to each step in the embodiment of the method.
In addition, another embodiment of the present invention also provides an electronic device, including a processor and a memory, where the memory stores a computer program, and the processor is configured to execute the steps of the method described above by calling the computer program stored in the memory.
In addition, another embodiment of the present invention also provides a computer readable storage medium storing a computer program for measuring a low voltage station synchronization clock error, the computer program executing the steps of the method as described above when run on a computer.
Forms of general computer-readable storage media include: a floppy disk (floppy disk), a flexible disk (flexible disk), hard disk, magnetic tape, any other magnetic medium, a CD-ROM, any other optical medium, punch cards, paper tape, any other physical medium with patterns of holes, a Random Access Memory (RAM), a programmable read-only memory (PROM), an erasable programmable read-only memory (EPROM), a FLASH-erasable programmable read-only memory (FLASH-EPROM), any other memory chip or cartridge, or any other medium from which a computer can read. The instructions may further be transmitted or received over a transmission medium. The term transmission medium may include any tangible or intangible medium that may be used to store, encode, or carry instructions for execution by a machine, and includes digital or analog communications signals or their communications with intangible medium that facilitate communication of such instructions. Transmission media includes coaxial cables, copper wire and fiber optics, including the wires that comprise a bus for transmitting a computer data signal.
The above description is only of the preferred embodiments of the present invention and is not intended to limit the present invention, but various modifications and variations can be made to the present invention by those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
It will be appreciated by those skilled in the art that embodiments of the present application may be provided as a method, system, or computer program product. Accordingly, the present application may take the form of an entirely hardware embodiment, an entirely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, the present application may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein. The solutions in the embodiments of the present application may be implemented in various computer languages, for example, object-oriented programming language Java, and an transliterated scripting language JavaScript, etc.
The present application is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems) and computer program products according to embodiments of the application. It will be understood that each flow and/or block of the flowchart illustrations and/or block diagrams, and combinations of flows and/or blocks in the flowchart illustrations and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
While preferred embodiments of the present application have been described, additional variations and modifications in those embodiments may occur to those skilled in the art once they learn of the basic inventive concepts. It is therefore intended that the following claims be interpreted as including the preferred embodiments and all such alterations and modifications as fall within the scope of the application.
It will be apparent to those skilled in the art that various modifications and variations can be made in the present application without departing from the spirit or scope of the application. Thus, if such modifications and variations of the present application fall within the scope of the claims and the equivalents thereof, the present application is intended to cover such modifications and variations.
Claims (10)
1. The method for measuring the synchronous clock error of the low-voltage station area is characterized by comprising the following steps of:
acquiring time scale data of a plurality of intelligent ammeter in a low-voltage station area;
constructing an error matrix of each intelligent ammeter based on the time scale data of the plurality of intelligent ammeter;
performing cluster analysis on the error matrix of each intelligent ammeter to obtain a potential abnormal intelligent ammeter number set corresponding to each error matrix;
carrying out statistical analysis on all the potential abnormal intelligent ammeter number sets to obtain abnormal intelligent ammeter number sets;
and calculating to obtain a synchronous clock error based on the difference between the report time of the station area concentrator and the report time of all abnormal intelligent electric meters.
2. The method for measuring the synchronous clock error of the low-voltage transformer area according to claim 1, wherein the process of constructing the error matrix of each smart meter based on the time scale data of the plurality of smart meters comprises the following steps:
subtracting the time scale data of any intelligent ammeter from the time scale data of the rest intelligent ammeter one by one to obtain a clock data difference matrix of the current intelligent ammeter;
obtaining the distance between the station area concentrator and each intelligent ammeter, and constructing a weight matrix of the current intelligent ammeter;
calculating the Hadamard product of the clock data difference matrix and the weight matrix of the current intelligent ammeter to obtain an error matrix of the current intelligent ammeter;
and repeating the process to obtain an error matrix of each intelligent ammeter.
3. The method for measuring the synchronous clock error of the low-voltage transformer area according to claim 2, wherein the weight matrix of the current smart meter is expressed as:
wherein m represents the number of the current intelligent ammeter, k represents the number of the rest intelligent ammeter, W m Weight matrix representing current smart meter, d m And d k Respectively representing the distances between the district concentrator and the intelligent ammeter m and the intelligent ammeter k, d 1 The distance between the station area concentrator and the intelligent ammeter 1 is represented, and n represents the number of the intelligent ammeter in the low-voltage station area.
4. The method for measuring the synchronous clock error of the low-voltage transformer area according to claim 1, wherein the process of performing cluster analysis on the error matrix of each smart meter to obtain the potential abnormal smart meter number set corresponding to each error matrix comprises the following steps:
and clustering each error matrix, dividing the error matrix into a set containing a plurality of clustering clusters, recording the number of the intelligent electric meter at the furthest point in each clustering cluster, and marking the number as a potential abnormal intelligent electric meter to obtain a potential abnormal intelligent electric meter number set corresponding to each error matrix.
5. The method for measuring the synchronous clock error of the low-voltage transformer area according to claim 1, wherein the process of statistically analyzing all the potentially abnormal smart meter number sets to obtain the abnormal smart meter number sets comprises the following steps:
counting the number of each potential abnormal intelligent electric meter in all the potential abnormal intelligent electric meter number sets, and marking the potential abnormal intelligent electric meters as abnormal intelligent electric meters when the number of certain potential abnormal intelligent electric meters exceeds a preset threshold value to obtain the abnormal intelligent electric meter number sets.
6. The method for measuring synchronous clock errors of a low voltage station as recited in claim 5, wherein the predetermined threshold is determined based on the following equation: q=δ×n, q represents a preset threshold, n represents the number of smart meters in the low-voltage transformer area, δ represents a trusted value, and the range of the trusted value is [0,1].
7. The method for measuring synchronous clock errors of a low voltage transformer area according to claim 1, wherein the synchronous clock errors are calculated based on the following formula:
wherein p represents the number of abnormal smart meters,represent abnormal smart meter number set, t 0 Indicating the time t of the report of the station area concentrator i And the reporting time of the abnormal intelligent ammeter i is represented, and t represents the synchronous clock error.
8. A system for measuring synchronous clock errors in a low voltage station, comprising:
the time scale data acquisition module is used for acquiring time scale data of a plurality of intelligent ammeter in the low-voltage transformer area;
the error matrix construction module is used for constructing an error matrix of each intelligent ammeter based on time scale data of the plurality of intelligent ammeters;
the cluster analysis module is used for carrying out cluster analysis on the error matrix of each intelligent ammeter to obtain a potential abnormal intelligent ammeter number set corresponding to each error matrix;
the statistical analysis module is used for carrying out statistical analysis on all the potential abnormal intelligent ammeter number sets to obtain the abnormal intelligent ammeter number sets;
and the error calculation module is used for calculating and obtaining the synchronous clock error based on the difference value between the report time of the station area concentrator and the report time of all abnormal intelligent electric meters.
9. An electronic device comprising a processor and a memory, the memory having stored therein a computer program for executing the steps of the method according to any of claims 1-7 by invoking the computer program stored in the memory.
10. A computer readable storage medium storing a computer program for measuring low voltage zone synchronization clock errors, characterized in that the computer program when run on a computer performs the steps of the method according to any of claims 1-7.
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| Application Number | Priority Date | Filing Date | Title |
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| CN202311333380.6A CN117368831A (en) | 2023-10-16 | 2023-10-16 | Method, system, equipment and medium for measuring synchronous clock error of low-voltage transformer area |
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| CN202311333380.6A CN117368831A (en) | 2023-10-16 | 2023-10-16 | Method, system, equipment and medium for measuring synchronous clock error of low-voltage transformer area |
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