CN117310453B - Automatic calibration method and device for chip tester - Google Patents
Automatic calibration method and device for chip tester Download PDFInfo
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- CN117310453B CN117310453B CN202311619213.8A CN202311619213A CN117310453B CN 117310453 B CN117310453 B CN 117310453B CN 202311619213 A CN202311619213 A CN 202311619213A CN 117310453 B CN117310453 B CN 117310453B
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- 238000012360 testing method Methods 0.000 claims abstract description 271
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- 238000010586 diagram Methods 0.000 description 6
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2289—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing by configuration test
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
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Abstract
The invention provides an automatic calibration method and device of a chip tester, which relate to the technical field of semiconductors, and the method comprises the following steps: receiving the test requirement of the to-be-tested piece, and determining whether class information meeting the test requirement exists according to the test requirement; the class information is stored in advance based on equipment information, switch information, port information corresponding to each switch and link information after the on-off state of the switch is controlled in the testing machine; and calling the class information under the condition that the class information meeting the test requirement exists, and automatically calibrating the internal equipment of the test machine according to the called class information. According to the invention, based on the test requirement, whether the corresponding class information is stored is judged, so that the corresponding class information is conveniently called under the condition that the corresponding class information is stored, the corresponding class information is automatically connected to the internal equipment of the corresponding required tester, the automatic calibration of the internal equipment of the tester is realized, the connected internal equipment of the tester is conveniently used for testing the to-be-tested piece, and the test efficiency of the to-be-tested piece is improved.
Description
Technical Field
The present invention relates to the field of semiconductor technologies, and in particular, to an automatic calibration method and apparatus for a chip tester.
Background
Due to the rapid introduction of increasingly complex integrated circuits, materials and processes, it is almost impossible to meet the specifications for every chip in today's silicon wafer fabrication. To correct the problems during fabrication and to ensure that defective chips are not sent to the customer, chip testing (CP) has been introduced during integrated Circuit fabrication. Chip test systems typically include a tester (Automatic Test Equipment, ATE), which is an automated device capable of rapidly, accurately, and repeatedly measuring sub-microampere currents and millivolt voltages on a device under test.
Specifically, the tester inputs a test signal into a device under test (DUT, device Under Test), and then receives a response of the device under test to the input signal.
However, when performing chip testing, the chip tester often needs to select a corresponding tester according to the type of the chip, where the types of the tester include a filter tester, a high-power tester, a radio-frequency front-end chip tester, an Analog-to-Digital Converter (ADC) tester, and the like, and each tester has different subdivisions, which results in that each time the chip is tested, the type in the corresponding tester needs to be modified, which is inconvenient to operate.
Disclosure of Invention
The invention provides an automatic calibration method and device of a chip tester, which are used for solving the defect that the chip tester in the prior art needs to frequently change an inner link according to the type of a chip, realizing the automatic calibration of the tester and avoiding the condition of complicated operation.
The invention provides an automatic calibration method of a chip tester, which comprises the following steps: receiving a test requirement of a piece to be tested, and determining whether class information meeting the test requirement exists according to the test requirement; the class information is stored in advance based on equipment information, switch information, port information corresponding to each switch and link information after the on-off state of the switch is controlled in the testing machine; and calling the class information under the condition that the class information meeting the test requirement is determined to exist, and automatically calibrating the internal equipment of the testing machine according to the called class information.
According to the automatic calibration method of the chip testing machine provided by the invention, the determining whether the class information meeting the testing requirement exists according to the testing requirement comprises the following steps: determining the corresponding type of the internal equipment of the required testing machine according to the testing requirement; judging whether class information with corresponding equipment information exists according to the type of the internal equipment of the required testing machine; if the class information with the corresponding equipment information can be found, determining that the class information meeting the test requirement exists.
According to the automatic calibration method of the chip testing machine provided by the invention, the judging whether the class information with the corresponding equipment information exists or not according to the internal equipment model of the testing machine comprises the following steps: determining a corresponding required testing machine according to the type of the internal equipment of the required testing machine; searching a class list which is created in advance according to the required testing machine, and determining whether a corresponding testing machine exists in the class list; the class list is constructed based on the previously stored class information, and comprises at least one class information, a tester corresponding to each class information and equipment information inside the tester; and under the condition that the corresponding testing machine exists in the class list, searching the equipment information of the corresponding testing machine in the class list according to the internal equipment model of the testing machine, and determining that the class information with the corresponding equipment information exists based on the fact that the corresponding equipment information can be searched.
According to the automatic calibration method of the chip testing machine provided by the invention, after determining whether the class information meeting the testing requirement exists according to the testing requirement, the automatic calibration method further comprises the following steps: under the condition that the class information meeting the test requirement does not exist, determining class configuration information corresponding to the required test machine internal equipment according to the test requirement; determining whether class information corresponding to the required testing machine exists; if the class information corresponding to the required testing machine exists, updating the class information of the required testing machine by utilizing the class configuration information; otherwise, generating and storing new class information according to the class configuration information.
According to the automatic calibration method of the chip testing machine provided by the invention, the determining of the class configuration information corresponding to the required internal equipment of the testing machine according to the testing requirement comprises the following steps: determining the type of the internal equipment of the required testing machine according to the testing requirement; acquiring switch configuration information and port configuration information corresponding to the internal equipment of the required testing machine according to the type of the internal equipment of the required testing machine; generating link configuration information according to the switch configuration information and the port configuration information; and obtaining class configuration information corresponding to the required test machine internal equipment according to the switch configuration information, the port configuration information and the link configuration information.
According to the automatic calibration method of the chip testing machine provided by the invention, the internal equipment of the testing machine is automatically calibrated according to the called class information, and the automatic calibration method comprises the following steps: according to the link information, the switch information and the port information in the called class information, the on-off state of the corresponding switch is controlled so as to automatically connect the piece to be tested and the internal equipment of the testing machine; after the internal equipment of the testing machine is automatically calibrated according to the called class information, the method comprises the following steps: and based on the connection success, controlling the internal equipment of the testing machine to test the to-be-tested piece.
According to the automatic calibration method of the chip testing machine, the number of the internal devices of the testing machine is at least two, the number of the switches is at least two, each switch is correspondingly provided with a plurality of ports, the at least two switches are sequentially connected, the at least two testing machines are respectively connected with the same switch, and different testing machines are connected with different ports of the same switch; and controlling the on-off state of a corresponding switch according to the link information, the switch information and the port information in the called class information so as to automatically connect the piece to be tested and the internal equipment of the testing machine, wherein the method comprises the following steps: determining a target port according to the switch information and the port information in the called class information, wherein the target port comprises a port of a switch connected with the internal equipment of the required testing machine, a connection port between adjacent switches and a port of a switch connected with the to-be-tested piece; selecting a target link from link information in the called class information according to the target port, wherein the target link comprises the on-off state of each switch and the port connection state corresponding to the target port; according to the target link, controlling the on-off state of the corresponding switch to connect with the target port; or,
the testing machine is connected with the switches in a one-to-one correspondence manner; and controlling the on-off state of a corresponding switch according to the link information, the switch information and the port information in the called class information so as to automatically connect the piece to be tested and the internal equipment of the testing machine, wherein the method comprises the following steps: determining a target switch and a target port of the target switch according to the switch information and the port information in the called class information; the target port of the target switch comprises a port of the target switch connected with the internal equipment of the required testing machine and a port of the target switch connected with the to-be-tested piece; and selecting a target link from the link information in the called class information according to the target switch and the target port of the target switch, and controlling the on-off state of the target switch according to the target link so as to connect the to-be-tested piece and the testing machine by using the target port.
The invention also provides an automatic calibration device of the chip testing machine, which comprises: the information judging module receives the test requirement of the to-be-tested piece and determines whether class information meeting the test requirement exists according to the test requirement; the class information is stored in advance based on equipment information, switch information, port information corresponding to each switch and link information after the on-off state of the switch is controlled in the testing machine; and the automatic calibration module is used for calling the class information under the condition that the class information meeting the test requirement exists, and automatically calibrating the internal equipment of the testing machine according to the called class information.
The invention also provides an electronic device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, wherein the steps of the automatic calibration method of the chip tester are realized when the processor executes the program.
The present invention also provides a non-transitory computer readable storage medium having stored thereon a computer program which, when executed by a processor, performs the steps of the automatic calibration method of a chip tester as described in any one of the above.
The invention also provides a computer program product comprising a computer program which, when executed by a processor, implements the steps of the automatic calibration method of a chip tester as described in any one of the above.
According to the automatic calibration method and device for the chip tester, whether the corresponding type information is stored or not is judged based on the received test requirement of the to-be-tested piece, so that the corresponding type information is called under the condition that the corresponding type information is stored, the corresponding type information is automatically connected to the internal equipment of the to-be-tested piece, the automatic calibration of the internal equipment of the tester is realized, the connected internal equipment of the tester is conveniently used for testing the to-be-tested piece, and the test efficiency of the to-be-tested piece is improved.
Drawings
In order to more clearly illustrate the invention or the technical solutions of the prior art, the following description will briefly explain the drawings used in the embodiments or the description of the prior art, and it is obvious that the drawings in the following description are some embodiments of the invention, and other drawings can be obtained according to the drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic flow chart of an automatic calibration method of a chip tester according to the present invention;
FIG. 2 is a second flow chart of the automatic calibration method of the chip tester according to the present invention;
FIG. 3 is one of the target link schematics provided by the present invention;
FIG. 4 is a second schematic diagram of the target link provided by the present invention;
FIG. 5 is a third exemplary diagram of a target link provided by the present invention;
FIG. 6 is a schematic diagram of an automatic calibration device of a chip tester according to the present invention;
fig. 7 is a schematic structural diagram of an electronic device provided by the present invention.
Detailed Description
For the purpose of making the objects, technical solutions and advantages of the present invention more apparent, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings, and it is apparent that the described embodiments are some embodiments of the present invention, not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
FIG. 1 is a flow chart of an automatic calibration method of a chip tester according to the present invention, which includes:
s11, receiving the test requirement of the to-be-tested piece, and determining whether class information meeting the test requirement exists according to the test requirement; the class information is stored in advance based on equipment information, switch information, port information corresponding to each switch and link information after the on-off state of the switch is controlled in the testing machine;
s12, calling the class information under the condition that the class information meeting the test requirement exists, and automatically calibrating the internal equipment of the testing machine according to the called class information.
It should be noted that, step number "S1N" in the present specification does not represent the sequence of the automatic calibration method of the chip tester, and the automatic calibration method of the chip tester of the present invention is described below with reference to fig. 2-5.
Step S11, receiving the test requirement of the to-be-tested piece, and determining whether class information meeting the test requirement exists according to the test requirement; the class information is stored in advance based on equipment information, switch information, port information corresponding to each switch and link information after the on-off state of the switch is controlled in the testing machine.
In this embodiment, determining whether class information satisfying the test requirement exists according to the test requirement includes: determining the corresponding internal equipment model of the required testing machine according to the testing requirement; judging whether class information with corresponding equipment information exists according to the type of the internal equipment of the required testing machine; if the class information with the corresponding equipment information can be found, determining that the class information meeting the test requirement exists.
Further, according to the internal device model of the testing machine, judging whether the class information with the corresponding device information exists or not includes: determining a corresponding required tester according to the type of the internal equipment of the required tester; searching a class list which is created in advance according to a required tester, and determining whether a corresponding tester exists in the class list; the class list is constructed based on the previously stored class information, and comprises at least one class information, a tester corresponding to the class information and equipment information inside the tester; and under the condition that the corresponding testing machine exists in the class list, searching the equipment information of the corresponding testing machine in the class list according to the internal equipment model of the testing machine, and determining that the class information with the corresponding equipment information exists based on the fact that the corresponding equipment information can be searched.
In an alternative embodiment, referring to fig. 2, after determining whether there is class information satisfying the test requirement according to the test requirement, it further includes: under the condition that the class information meeting the test requirement does not exist, the class configuration information corresponding to the internal equipment of the required testing machine is determined according to the test requirement; determining whether class information corresponding to the required testing machine exists; if the class information corresponding to the required testing machine exists, updating the class information of the required testing machine by using the class configuration information; otherwise, generating and storing new class information according to the class configuration information. It should be noted that the test machines of the same model are correspondingly stored in the same type of information; and the testers with different models are respectively stored in different types of information.
For example, assume that there are three different types of testers, namely tester a, tester B and tester C, respectively, for testing different types of chips, and equipment information, switch information, port information corresponding to each switch and link information after controlling the on-off state of the switch in tester a are recorded in class L A In the method, equipment information, switch information, port information corresponding to each switch and link information after controlling the on-off state of the switch in the test machine B are recorded in the class L B In the method, equipment information, switch information, port information corresponding to each switch and link information after controlling the on-off state of the switch in the tester C are recorded in class L C Is a kind of medium.
Correspondingly, when determining whether class information meeting the test requirement exists according to the test requirement, if the required equipment corresponding to the test requirement is information which is not stored in the test machine A, updating the class configuration information determined according to the mode to the class L A In (a) and (b); assuming that the required equipment corresponding to the test requirement is a newly added tester D, generating a new class L according to the class configuration information determined in the mode D And stored.
Further, determining class configuration information corresponding to the required test machine internal device according to the test requirement includes: determining the type of the internal equipment of the required testing machine according to the testing requirement; acquiring switch configuration information and port configuration information corresponding to the internal equipment of the required testing machine according to the type of the internal equipment of the required testing machine; generating link configuration information according to the switch configuration information and the port configuration information; and obtaining class configuration information corresponding to the required test machine internal equipment according to the switch configuration information, the port configuration information and the link configuration information.
In an alternative embodiment, after generating the new class information and storing it, it further includes: and calling the class information, and automatically calibrating the internal equipment of the testing machine according to the called class information. Specific steps are described below and will not be further described herein.
And step S12, calling the class information under the condition that the class information meeting the test requirement exists, and automatically calibrating the internal equipment of the testing machine according to the called class information.
In this embodiment, according to the invoked class information, automatically calibrating the internal device of the testing machine includes: and controlling the on-off state of the corresponding switch according to the link information, the switch information and the port information in the called class information so as to automatically connect the to-be-tested piece and the internal equipment of the testing machine.
In an alternative embodiment, the number of the internal devices of the testing machine is at least two, the number of the switches is at least two, each switch is correspondingly provided with a plurality of ports, at least two switches are connected in sequence, at least two devices are respectively connected with the same switch, and different testing machines are connected with different ports of the same switch.
Correspondingly, according to the link information, the switch information and the port information in the called class information, the on-off state of the corresponding switch is controlled to automatically connect the to-be-tested piece and the internal equipment of the testing machine, and the method comprises the following steps: determining a target port according to the switch information and the port information in the called class information, wherein the target port comprises a port of a switch connected with a required testing machine, a connection port between adjacent switches and a port of a switch connected with a piece to be tested; selecting a target link from link information in the called class information according to the target port, wherein the target link comprises the on-off state of each switch and the port connection state of the corresponding target port; and controlling the on-off state of the corresponding switch according to the target link so as to connect the target port.
For example, assuming that the number of the internal devices of the tester is two, namely a network analyzer and a vector signal transceiver, the number of the switches is two, and a matrix switch of 2×8 is selected, the network analyzer is connected to the port 1 and the port 2 of the first switch, the vector signal transceiver is connected to the port 7 and the port 8 of the first switch, the part to be tested is connected to the second switch (for example, the part to be tested is connected to the port 9 and the port 10 of the second switch), if the part to be tested needs to be connected to the network analyzer, the target ports are determined to be the ports 1 and 2 and the port A, B of the first switch, and the ports C, D and the ports 9 and 10 of the second switch, a target link as shown in fig. 3 is obtained according to the target ports, so that the network analyzer is automatically connected to realize the automatic calibration of the internal devices of the tester; the vector signal transceiver is the same and will not be repeated here.
Further, a power amplifier and an attenuator are also connected between at least one internal device of the tester and the switch. With continued reference to the above example, a target link is obtained as shown in fig. 4.
In another alternative embodiment, the tester is connected to the switches in a one-to-one correspondence. Correspondingly, according to the link information, the switch information and the port information in the called class information, the on-off state of the corresponding switch is controlled to automatically connect the to-be-tested piece and the internal equipment of the testing machine, and the method comprises the following steps: determining a target switch and a target port of the target switch according to the switch information and the port information in the called class information; the target port of the target switch comprises a port of the target switch connected with the internal equipment of the required testing machine and a port of the target switch connected with the to-be-tested piece; and selecting a target link from the link information in the called class information according to the target switch and the target port of the target switch, and controlling the on-off state of the target switch according to the target link so as to connect the to-be-tested piece and the testing machine by using the target port.
For example, assuming that the number of the internal devices of the tester is two, namely a network analyzer and a vector signal transceiver, the number of the switches is two, and a matrix switch of 2×8 is selected, the network analyzer is connected to a port a and a port B of the first switch, the vector signal transceiver is connected to a port C and a port D of the first switch, if the vector signal transceiver needs to be connected to the network analyzer, it is determined that the target switch is the first switch, the target ports of the target switch are a port a, a port B and a connection port of the to-be-tested piece, and the connection port of the to-be-tested piece can be selected from the spare ports in the first switch, for example, a port 1 and a port 2, so as to obtain a target link as shown in fig. 5 according to the target switch and the target port thereof, thereby automatically connecting the network analyzer to realize automatic calibration of the internal devices of the tester; the vector signal transceiver is the same and will not be repeated here.
In an alternative embodiment, after automatically calibrating the internal devices of the tester according to the invoked class information, it comprises: based on the connection success, the internal equipment of the testing machine is controlled to test the to-be-tested piece.
In summary, the embodiment of the invention judges whether the corresponding class information is stored based on the received test requirement of the to-be-tested piece, so that the corresponding class information is called to automatically connect to the corresponding required internal equipment of the tester under the condition that the corresponding class information is stored, the automatic calibration of the internal equipment of the tester is realized, the to-be-tested piece is conveniently tested by using the connected internal equipment of the tester, and the test efficiency of the to-be-tested piece is improved.
The automatic calibration device of the chip tester provided by the invention is described below, and the automatic calibration device of the chip tester described below and the automatic calibration method of the chip tester described above can be correspondingly referred to each other.
Fig. 6 shows a schematic structural diagram of an automatic calibration device of a chip tester, which includes:
the information judging module 61 receives the test requirement of the to-be-tested piece and determines whether class information meeting the test requirement exists according to the test requirement; the class information is stored in advance based on equipment information, switch information, port information corresponding to each switch and link information after the on-off state of the switch is controlled in the testing machine;
the automatic calibration module 62 invokes the class information if it is determined that the class information satisfying the test requirement exists, and automatically calibrates the internal device of the test machine according to the invoked class information.
In the present embodiment, the information judgment module 61 includes: the first model determining unit is used for determining the corresponding internal equipment model of the required testing machine according to the testing requirements; the class judging unit judges whether class information with corresponding equipment information exists according to the type of the internal equipment of the required testing machine; if the class information with the corresponding equipment information can be found, determining that the class information meeting the test requirement exists.
Further, the class judgment unit includes: the testing machine determining subunit is used for determining a corresponding required testing machine according to the type of the internal equipment of the required testing machine; the testing machine searching subunit searches a class list which is created in advance according to the required testing machine and determines whether a corresponding testing machine exists in the class list; the class list is constructed based on the previously stored class information, and comprises at least one class information, a tester corresponding to the class information and equipment information inside the tester; and the class judging subunit searches the equipment information of the corresponding testing machine in the class list according to the internal equipment model of the testing machine under the condition that the corresponding testing machine exists in the class list, and determines that the class information with the corresponding equipment information exists based on the fact that the corresponding equipment information can be found.
In an alternative embodiment, the apparatus further comprises: the configuration information determining module is used for determining whether class information meeting the test requirements exists according to the test requirements, and then determining class configuration information corresponding to the internal equipment of the required test machine according to the test requirements under the condition that the class information meeting the test requirements does not exist; the tester information determining module is used for determining whether class information corresponding to the required tester exists or not; the class updating module is used for updating the class information of the required testing machine by using the class configuration information if the class information corresponding to the required testing machine exists; otherwise, the class newly-added module generates and stores newly-added class information according to the class configuration information. It should be noted that the test machines of the same model are correspondingly stored in the same type of information; and the testers with different models are respectively stored in different types of information.
Further, the configuration information determining module includes: the second model determining unit is used for determining the model of the internal equipment of the required testing machine according to the testing requirements; the first information acquisition unit acquires switch configuration information and port configuration information corresponding to the internal equipment of the required testing machine according to the type of the internal equipment of the required testing machine; the second information acquisition unit generates link configuration information according to the switch configuration information and the port configuration information; and the information configuration unit is used for obtaining class configuration information corresponding to the required test machine internal equipment according to the switch configuration information, the port configuration information and the link configuration information.
In an alternative embodiment, the auto-calibration module 62 is further configured to: and after generating and storing the newly added class information, calling the class information, and automatically calibrating the internal equipment of the testing machine according to the called class information. The specific structure of the auto-calibration module 62 is described below and will not be further described herein.
In this embodiment, the auto-calibration module 62 is configured to: and controlling the on-off state of the corresponding switch according to the link information, the switch information and the port information in the called class information so as to automatically connect the to-be-tested piece and the internal equipment of the testing machine.
In an alternative embodiment, the number of the internal devices of the testing machine is at least two, the number of the switches is at least two, each switch is correspondingly provided with a plurality of ports, at least two switches are connected in sequence, at least two devices are respectively connected with the same switch, and different testing machines are connected with different ports of the same switch.
Accordingly, the auto-calibration module 62 includes: the first target determining unit determines a target port according to the switch information and the port information in the called class information, wherein the target port comprises a port of a switch connected with a required testing machine, a connection port between adjacent switches and a port of a switch connected with a to-be-tested piece; the first link determining unit is used for selecting a target link from link information in the called class information according to the target port, wherein the target link comprises the on-off state of each switch and the port connection state of the corresponding target port; and the first automatic calibration unit controls the on-off state of the corresponding switch according to the target link so as to be connected with the target port.
Further, a power amplifier and an attenuator are also connected between at least one internal device of the tester and the switch.
In another alternative embodiment, the tester is connected to the switches in a one-to-one correspondence. Accordingly, the auto-calibration module 62 includes: a second target determining unit for determining a target switch and a target port of the target switch according to the switch information and the port information in the called class information; the target port of the target switch comprises a port of the target switch connected with the internal equipment of the required testing machine and a port of the target switch connected with the to-be-tested piece; a second link determining unit for selecting a target link from the link information in the called class information according to the target switch and the target port of the target switch; and the second automatic calibration unit controls the on-off state of the target switch according to the target link so as to connect the to-be-tested piece and the testing machine by using the target port.
In an alternative embodiment, the apparatus further comprises: and the test control module is used for controlling the internal equipment of the testing machine to test the piece to be tested based on successful connection after automatically calibrating the internal equipment of the testing machine according to the called class information.
In summary, the information judging module in the embodiment of the invention judges whether the corresponding type information is stored based on the received test requirement of the to-be-tested piece, so that the automatic calibration module can call the corresponding type information to be automatically connected to the internal equipment of the corresponding required test machine under the condition that the corresponding type information is stored, thereby realizing the automatic calibration of the internal equipment of the test machine, facilitating the subsequent test of the to-be-tested piece by using the connected internal equipment of the test machine, and improving the test efficiency of the to-be-tested piece.
Fig. 7 illustrates a physical schematic diagram of an electronic device, as shown in fig. 7, which may include: a processor (processor) 71, a communication interface (Communications Interface) 72, a memory (memory) 73 and a communication bus 74, wherein the processor 71, the communication interface 72 and the memory 73 communicate with each other via the communication bus 74. Processor 71 may invoke logic instructions in memory 73 to perform an auto-calibration method of a chip tester, the method comprising: receiving the test requirement of the to-be-tested piece, and determining whether class information meeting the test requirement exists according to the test requirement; the class information is stored in advance based on equipment information, switch information, port information corresponding to each switch and link information after the on-off state of the switch is controlled in the testing machine; and calling the class information under the condition that the class information meeting the test requirement exists, and automatically calibrating the internal equipment of the test machine according to the called class information.
Further, the logic instructions in the memory 73 described above may be implemented in the form of software functional units and may be stored in a computer-readable storage medium when sold or used as a stand-alone product. Based on this understanding, the technical solution of the present invention may be embodied essentially or in a part contributing to the prior art or in a part of the technical solution, in the form of a software product stored in a storage medium, comprising several instructions for causing a computer device (which may be a personal computer, a server, a network device, etc.) to perform all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read-Only Memory (ROM), a random access Memory (RAM, random Access Memory), a magnetic disk, or an optical disk, or other various media capable of storing program codes.
In another aspect, the present invention also provides a computer program product, where the computer program product includes a computer program, where the computer program can be stored on a non-transitory computer readable storage medium, and when the computer program is executed by a processor, the computer can execute the automatic calibration method of the chip tester provided by the methods above, and the method includes: receiving the test requirement of the to-be-tested piece, and determining whether class information meeting the test requirement exists according to the test requirement; the class information is stored in advance based on equipment information, switch information, port information corresponding to each switch and link information after the on-off state of the switch is controlled in the testing machine; and calling the class information under the condition that the class information meeting the test requirement exists, and automatically calibrating the internal equipment of the test machine according to the called class information.
In yet another aspect, the present invention also provides a non-transitory computer readable storage medium having stored thereon a computer program which, when executed by a processor, is implemented to perform the method for automatically calibrating a chip tester provided by the above methods, the method comprising: receiving the test requirement of the to-be-tested piece, and determining whether class information meeting the test requirement exists according to the test requirement; the class information is stored in advance based on equipment information, switch information, port information corresponding to each switch and link information after the on-off state of the switch is controlled in the testing machine; and calling the class information under the condition that the class information meeting the test requirement exists, and automatically calibrating the internal equipment of the test machine according to the called class information.
The apparatus embodiments described above are merely illustrative, wherein the elements illustrated as separate elements may or may not be physically separate, and the elements shown as elements may or may not be physical elements, may be located in one place, or may be distributed over a plurality of network elements. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of this embodiment. Those of ordinary skill in the art will understand and implement the present invention without undue burden.
From the above description of the embodiments, it will be apparent to those skilled in the art that the embodiments may be implemented by means of software plus necessary general hardware platforms, or of course may be implemented by means of hardware. Based on this understanding, the foregoing technical solution may be embodied essentially or in a part contributing to the prior art in the form of a software product, which may be stored in a computer readable storage medium, such as ROM/RAM, a magnetic disk, an optical disk, etc., including several instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) to execute the method described in the respective embodiments or some parts of the embodiments.
Finally, it should be noted that: the above embodiments are only for illustrating the technical solution of the present invention, and are not limiting; although the invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit and scope of the technical solutions of the embodiments of the present invention.
Claims (8)
1. An automatic calibration method for a chip tester, comprising:
receiving a test requirement of a piece to be tested, and determining whether class information meeting the test requirement exists according to the test requirement; the class information is stored in advance based on equipment information, switch information, port information corresponding to each switch and link information after the on-off state of the switch is controlled in the testing machine;
calling the class information under the condition that the class information meeting the test requirement is determined to exist, and automatically calibrating the internal equipment of the test machine according to the called class information;
after determining whether the class information meeting the test requirement exists according to the test requirement, the method further comprises the following steps:
under the condition that the class information meeting the test requirement does not exist, determining class configuration information corresponding to the required test machine internal equipment according to the test requirement;
determining whether class information corresponding to the required testing machine exists;
if the class information corresponding to the required testing machine exists, updating the class information of the required testing machine by utilizing the class configuration information;
otherwise, generating new class information according to the class configuration information and storing the new class information;
the determining class configuration information corresponding to the required test machine internal equipment according to the test requirement comprises the following steps:
determining the type of the internal equipment of the required testing machine according to the testing requirement;
acquiring switch configuration information and port configuration information corresponding to the internal equipment of the required testing machine according to the type of the internal equipment of the required testing machine;
generating link configuration information according to the switch configuration information and the port configuration information;
and obtaining class configuration information corresponding to the required test machine internal equipment according to the switch configuration information, the port configuration information and the link configuration information.
2. The method for automatically calibrating a chip tester according to claim 1, wherein determining whether class information satisfying the test requirement exists according to the test requirement comprises:
determining the corresponding type of the internal equipment of the required testing machine according to the testing requirement;
judging whether class information with corresponding equipment information exists according to the type of the internal equipment of the required testing machine;
if the class information with the corresponding equipment information can be found, determining that the class information meeting the test requirement exists.
3. The method for automatically calibrating a chip tester according to claim 2, wherein the determining whether class information having corresponding device information exists according to the internal device model of the tester comprises:
determining a corresponding required testing machine according to the type of the internal equipment of the required testing machine;
searching a class list which is created in advance according to the required testing machine, and determining whether a corresponding testing machine exists in the class list; the class list is constructed based on the previously stored class information, and comprises at least one class information, a tester corresponding to each class information and equipment information inside the tester;
and under the condition that the corresponding testing machine exists in the class list, searching the equipment information of the corresponding testing machine in the class list according to the internal equipment model of the testing machine, and determining that the class information with the corresponding equipment information exists based on the fact that the corresponding equipment information can be searched.
4. The automatic calibration method of a chip tester according to claim 1, wherein the automatically calibrating the internal devices of the tester according to the called class information comprises:
according to the link information, the switch information and the port information in the called class information, the on-off state of the corresponding switch is controlled so as to automatically connect the piece to be tested and the internal equipment of the testing machine;
after the internal equipment of the testing machine is automatically calibrated according to the called class information, the method comprises the following steps:
and based on the connection success, controlling the internal equipment of the testing machine to test the to-be-tested piece.
5. The automatic calibration method of a chip tester according to claim 4, wherein the number of internal devices of the tester is at least two, the number of switches is at least two, each switch is correspondingly provided with a plurality of ports, the at least two switches are sequentially connected, the at least two testers are respectively connected with the same switch, and different testers are connected with different ports of the same switch;
and controlling the on-off state of a corresponding switch according to the link information, the switch information and the port information in the called class information so as to automatically connect the piece to be tested and the internal equipment of the testing machine, wherein the method comprises the following steps:
determining a target port according to the switch information and the port information in the called class information, wherein the target port comprises a port of a switch connected with the internal equipment of the required testing machine, a connection port between adjacent switches and a port of a switch connected with the to-be-tested piece;
selecting a target link from link information in the called class information according to the target port, wherein the target link comprises the on-off state of each switch and the port connection state corresponding to the target port;
according to the target link, controlling the on-off state of the corresponding switch to connect with the target port; or,
the testing machine is connected with the switches in a one-to-one correspondence manner;
and controlling the on-off state of a corresponding switch according to the link information, the switch information and the port information in the called class information so as to automatically connect the piece to be tested and the internal equipment of the testing machine, wherein the method comprises the following steps:
determining a target switch and a target port of the target switch according to the switch information and the port information in the called class information; the target port of the target switch comprises a port of the target switch connected with the internal equipment of the required testing machine and a port of the target switch connected with the to-be-tested piece;
and selecting a target link from the link information in the called class information according to the target switch and the target port of the target switch, and controlling the on-off state of the target switch according to the target link so as to connect the to-be-tested piece and the testing machine by using the target port.
6. An automatic calibration device for a chip tester, comprising:
the information judging module receives the test requirement of the to-be-tested piece and determines whether class information meeting the test requirement exists according to the test requirement; the class information is stored in advance based on equipment information, switch information, port information corresponding to each switch and link information after the on-off state of the switch is controlled in the testing machine;
the automatic calibration module is used for calling the class information under the condition that the class information meeting the test requirement exists, and automatically calibrating the internal equipment of the testing machine according to the called class information;
the device further comprises:
the configuration information determining module is used for determining whether class information meeting the test requirement exists according to the test requirement, and then determining class configuration information corresponding to the required test machine internal equipment according to the test requirement under the condition that the class information meeting the test requirement does not exist;
the tester information determining module is used for determining whether class information corresponding to the required tester exists or not;
the class updating module is used for updating the class information of the required testing machine by utilizing the class configuration information if the class information corresponding to the required testing machine exists;
otherwise, the class newly-added module generates and stores newly-added class information according to the class configuration information;
the configuration information determining module includes:
the second model determining unit is used for determining the model of the internal equipment of the required testing machine according to the testing requirement;
the first information acquisition unit acquires switch configuration information and port configuration information corresponding to the internal equipment of the required testing machine according to the type of the internal equipment of the required testing machine;
a second information acquisition unit for generating link configuration information according to the switch configuration information and the port configuration information;
and the information configuration unit is used for obtaining class configuration information corresponding to the required test machine internal equipment according to the switch configuration information, the port configuration information and the link configuration information.
7. An electronic device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, characterized in that the processor implements the steps of the method for automatically calibrating a chip tester according to any of claims 1 to 5 when the program is executed by the processor.
8. A non-transitory computer readable storage medium having stored thereon a computer program, characterized in that the computer program when executed by a processor implements the steps of the automatic calibration method of a chip tester according to any of claims 1 to 5.
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