CN117148020B - Service life detection method of electronic product and terminal equipment - Google Patents
Service life detection method of electronic product and terminal equipment Download PDFInfo
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Abstract
The present disclosure relates to the field of detection, and in particular, to a lifetime detection method and terminal device for an electronic product. The method comprises the following steps: acquiring a life acceleration coefficient corresponding to the electronic product, wherein the life acceleration coefficient represents the relationship between the theoretical life of the electronic product and the test duration; calculating the test duration of the electronic product according to the theoretical service life of the electronic product and the service life acceleration coefficient; and detecting the electronic product according to the test duration of the electronic product. By the method, the detection period can be effectively shortened, and the detection efficiency is improved. In addition, the electronic product does not need to be used for a long time, so that the loss of the electronic product is reduced, and the detection cost is saved.
Description
Technical Field
The present disclosure relates to the field of detection, and in particular, to a lifetime detection method and terminal device for an electronic product.
Background
With the development of electronic technology, people have a higher and higher degree of dependence on electronic products. The service life of electronic products is also an important index for users to select electronic products. Generally, each electronic product has its theoretical lifetime, but in actual use, the actual lifetime is often different from the theoretical lifetime due to various factors.
In the related art, a manner of detecting the actual lifetime of an electronic product is generally to sample and select a plurality of electronic products, and use them for a long time. The detection period of the mode is longer, the efficiency is lower, and the loss of the electronic product is larger.
Disclosure of Invention
The application provides a service life detection method and terminal equipment for electronic products, and solves the problems of longer service life detection period and lower efficiency of the electronic products in the prior art.
In order to achieve the above purpose, the present application adopts the following technical scheme:
in a first aspect, a method for detecting lifetime of an electronic product is provided, the method comprising:
acquiring a life acceleration coefficient corresponding to the electronic product, wherein the life acceleration coefficient represents the relationship between the theoretical life of the electronic product and the test duration;
calculating the test duration of the electronic product according to the theoretical service life of the electronic product and the service life acceleration coefficient;
and detecting the electronic product according to the test duration of the electronic product.
According to the embodiment of the application, the test duration corresponding to the theoretical life is calculated through the life acceleration coefficient, and the actual life of the electronic product is detected according to the test duration, so that the detection period can be effectively shortened, and the detection efficiency is improved. In addition, the electronic product does not need to be used for a long time, so that the loss of the electronic product is reduced, and the detection cost is saved.
In an implementation manner of the first aspect, the acquiring a lifetime acceleration coefficient corresponding to the electronic product includes:
acquiring acceleration factors corresponding to various environmental stresses, wherein the environmental stresses represent environmental factors influencing the service life of the electronic product;
and calculating life acceleration coefficients of the electronic product under the action of various environmental stresses according to the acceleration factors.
In the embodiment of the application, various environmental stresses are considered, which is equivalent to calculating the service life acceleration coefficient under the combined action of the various environmental stresses, and the actual working condition environment can be reflected better due to the combined action of the various environmental stresses, so that the calculated service life acceleration coefficient can reflect the relation between the service time and the service life more accurately.
In an implementation manner of the first aspect, the calculating, according to the acceleration factor, a life acceleration coefficient of the electronic product under a plurality of environmental stresses includes:
constructing an overrun equation between the acceleration factor and the life acceleration coefficient;
and calculating the life acceleration coefficient of the electronic product under the action of various environmental stresses according to the overrun equation.
Compared with linear combination, the overrunning equation can more accurately represent the interrelationship among various variables, so that the real working condition environment can be reflected.
In one implementation manner of the first aspect, the constructing an overrun equation between the acceleration factor and the lifetime acceleration coefficient includes:
for the kth environmental stress, generating a first expression corresponding to the kth environmental stress according to an acceleration factor and a first service life corresponding to the kth environmental stress, wherein the first service life corresponding to the kth environmental stress represents the service life of the electronic product under the action of the previous k environmental stresses, k is a positive integer less than or equal to N, and N is the total number of the plurality of environmental stresses;
and constructing the overrun equation according to the life acceleration coefficient and the first expressions corresponding to the environmental stresses.
In this embodiment of the present application, the first lifetime corresponding to the kth environmental stress represents the lifetime of the electronic product under the action of the first k environmental stresses, which is equivalent to the first lifetime of each environmental stress considering the influence of other environmental stresses, so that the first lifetime of each environmental stress is more consistent with the lifetime of the electronic product under the actual working condition, which is beneficial to improving the reliability of the subsequent detection result.
In an implementation manner of the first aspect, the constructing the override equation according to the first expression corresponding to each of the lifetime acceleration coefficient and the environmental stresses includes:
Obtaining a second expression according to weighted product of first expressions corresponding to first stresses in the environmental stresses, wherein each two first stresses are mutually influenced;
according to the weighted summation of the first expressions corresponding to the second stresses in the plurality of environmental stresses, a third expression is obtained, wherein every two second stresses do not affect each other, and the second stresses do not affect each other with the first stresses;
and constructing the overrun equation according to the life acceleration coefficient, the second expression and the third expression.
In the embodiment of the application, the first expressions of the environmental stress with the coupling effect are multiplied, and the first expressions of the environmental stress without the coupling effect are added, so that the constructed overrun equation can reflect the actual working condition environment more accurately, and the detection reliability is improved.
In an implementation manner of the first aspect, the calculating, according to the override equation, a life acceleration coefficient of the electronic product under a plurality of environmental stresses includes:
acquiring a first numerical value of the test duration;
calculating a first ratio of the first value to the theoretical life of the electronic product;
Substituting the first value into the overrun equation, and calculating a second value of the life acceleration coefficient;
and if the difference between the first value and the second value meets a preset condition, determining that the service life acceleration coefficient is the second value.
In one implementation manner of the first aspect, after substituting the first value into the override equation and calculating the second value of the life acceleration coefficient, the method further includes:
if the difference between the first value and the second value does not meet a preset condition, the first value is adjusted to obtain a third value;
and calculating the life acceleration coefficient of the electronic product according to the third numerical value.
According to the embodiment of the application, the overrun equation is solved through the optimization algorithm, so that the numerical value of the test duration for enabling the overrun equation to be established can be quickly searched, the success rate and the calculation efficiency of the overrun equation solving are improved, and the detection efficiency is improved.
In an implementation manner of the first aspect, the calculating the test duration of the electronic product according to the theoretical lifetime of the electronic product and the lifetime acceleration coefficient includes:
and calculating a second ratio between the theoretical life of the electronic product and the life acceleration coefficient, wherein the second ratio is the test duration.
In an implementation manner of the first aspect, the detecting the electronic product according to the test duration of the electronic product includes:
if the current using time of the electronic product reaches the testing time, judging that the electronic product is qualified;
and if the current using time of the electronic product does not reach the testing time, judging that the electronic product is unqualified.
In the embodiment of the application, the service life acceleration coefficient is used for 'accelerating' the test duration to obtain the theoretical service life, so that the actual service life of the electronic product is detected according to the test duration, which is equivalent to 'accelerating' the detection process, so that the detection period can be effectively shortened, and the detection efficiency is improved. In addition, the electronic product does not need to be used for a long time, so that the loss of the electronic product is reduced, and the detection cost is saved.
In an implementation manner of the first aspect, the acquiring acceleration factors corresponding to the environmental stresses respectively includes:
and under the condition that the environmental stress is temperature stress, constructing an acceleration factor corresponding to the temperature stress according to a first activation energy, an actual temperature and a test temperature, wherein the first activation energy represents a temperature range corresponding to the failure of the electronic product.
In an implementation manner of the first aspect, the acquiring acceleration factors corresponding to the environmental stresses respectively includes:
and under the condition that the environmental stress is temperature and humidity stress, constructing an acceleration factor corresponding to the temperature and humidity stress according to second activation energy, actual temperature and humidity and test temperature and humidity, wherein the second activation energy represents a temperature and humidity range corresponding to the failure of the electronic product.
In an implementation manner of the first aspect, the acquiring acceleration factors corresponding to the environmental stresses respectively includes:
under the condition that the environmental stress is temperature cycle stress, constructing an acceleration factor corresponding to the temperature cycle stress according to an actual cycle number, a test cycle number, a maximum temperature difference, an actual daily cycle frequency, a test daily cycle frequency and a maximum temperature, wherein the actual cycle number represents the cycle number actually occurring in a quality assurance period of the electronic product, and the test cycle number represents the cycle number occurring in a life detection process of the electronic product.
In an implementation manner of the first aspect, the acquiring acceleration factors corresponding to the environmental stresses respectively includes:
under the condition that the environmental stress is vibration stress, constructing an acceleration factor corresponding to the vibration stress according to the root mean square of the acceleration under the actual working condition and the root mean square of the acceleration under the test condition.
The obtaining acceleration factors corresponding to the environmental stresses respectively comprises the following steps:
under the condition that the environmental stress is vibration stress, constructing an acceleration factor corresponding to the vibration stress according to the root mean square of the acceleration under the actual working condition and the root mean square of the acceleration under the test condition.
In an implementation manner of the first aspect, the acquiring acceleration factors corresponding to the environmental stresses respectively includes:
under the condition that the environmental stress is electric stress, constructing an acceleration factor corresponding to the electric stress according to the electric stress value under the actual working condition and the electric stress value under the test condition.
In a second aspect, there is provided a lifetime detection device of an electronic product, including:
the electronic product testing device comprises an acquisition unit, a testing unit and a control unit, wherein the acquisition unit is used for acquiring a life acceleration coefficient corresponding to the electronic product, wherein the life acceleration coefficient represents the relationship between the theoretical life of the electronic product and the testing duration;
the calculating unit is used for calculating the test duration of the electronic product according to the theoretical service life of the electronic product and the service life acceleration coefficient;
and the detection unit is used for detecting the electronic product according to the test duration of the electronic product.
In a third aspect, an embodiment of the present application provides a terminal device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, where the processor implements the method for detecting lifetime of an electronic product according to any one of the first aspects when the processor executes the computer program.
In a fourth aspect, embodiments of the present application provide a computer-readable storage medium storing a computer program, which when executed by a processor implements the lifetime detection method of an electronic product as in any one of the first aspects above.
In a fifth aspect, embodiments of the present application provide a computer program product, which when run on a terminal device, causes the terminal device to perform the lifetime detection method of an electronic product according to any one of the first aspects above.
It will be appreciated that the advantages of the second to fifth aspects may be found in the relevant description of the first aspect, and are not described here again.
The foregoing description is only an overview of the technical solutions of the present application, and may be implemented according to the content of the specification in order to make the technical means of the present application more clearly understood, and in order to make the above-mentioned and other objects, features and advantages of the present application more clearly understood, the following detailed description of the present application will be given.
Drawings
Various other advantages and benefits will become apparent to those of ordinary skill in the art upon reading the following detailed description of the preferred embodiments. The drawings are only for purposes of illustrating the preferred embodiments and are not to be construed as limiting the application. Also, like reference numerals are used to designate like parts throughout the accompanying drawings. In the drawings:
Fig. 1 is a flow chart of a lifetime detection method of an electronic product according to an embodiment of the present application;
fig. 2 is a flowchart of a method for acquiring a lifetime acceleration coefficient according to an embodiment of the present application;
FIG. 3 is a flowchart illustrating a method for calculating a lifetime acceleration coefficient according to an embodiment of the present disclosure;
fig. 4 is a block diagram of a lifetime detection device of an electronic product according to an embodiment of the present application;
fig. 5 is a schematic structural diagram of a terminal device provided in an embodiment of the present application.
Detailed Description
Embodiments of the technical solutions of the present application will be described in detail below with reference to the accompanying drawings. The following examples are only for more clearly illustrating the technical solutions of the present application, and thus are only examples, and are not intended to limit the scope of protection of the present application.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs; the terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the application; the terms "comprising" and "having" and any variations thereof in the description and claims of the present application and in the description of the figures above are intended to cover non-exclusive inclusions.
In the description of the embodiments of the present application, the technical terms "first," "second," etc. are used merely to distinguish between different objects and are not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated, a particular order or a primary or secondary relationship. In the description of the embodiments of the present application, the meaning of "plurality" is two or more unless explicitly defined otherwise.
Reference herein to "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment may be included in at least one embodiment of the present application. The appearances of such phrases in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments. Those of skill in the art will explicitly and implicitly appreciate that the embodiments described herein may be combined with other embodiments.
In the description of the embodiments of the present application, the term "and/or" is merely an association relationship describing an association object, which means that three relationships may exist, for example, a and/or B may mean: a exists alone, A and B exist together, and B exists alone. In addition, the character "/" herein generally indicates that the front and rear associated objects are an "or" relationship.
In the description of the embodiments of the present application, the term "plurality" refers to two or more (including two), and similarly, "plural sets" refers to two or more (including two), and "plural sheets" refers to two or more (including two).
In the description of the embodiments of the present application, the orientation or positional relationship indicated by the technical terms "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", etc. are based on the orientation or positional relationship shown in the drawings, and are merely for convenience of describing the embodiments of the present application and for simplifying the description, rather than indicating or implying that the apparatus or element referred to must have a specific orientation, be configured and operated in a specific orientation, and therefore should not be construed as limiting the embodiments of the present application.
In the description of the embodiments of the present application, unless explicitly specified and limited otherwise, the terms "mounted," "connected," "secured" and the like are to be construed broadly and may be, for example, fixedly connected, detachably connected, or integrally formed; or may be mechanically or electrically connected; can be directly connected or indirectly connected through an intermediate medium, and can be communicated with the inside of two elements or the interaction relationship of the two elements. The specific meaning of the above terms in the embodiments of the present application will be understood by those of ordinary skill in the art according to the specific circumstances.
With the development of electronic technology, people have a higher and higher degree of dependence on electronic products. The service life of electronic products is also an important index for users to select electronic products. Generally, each electronic product has its theoretical lifetime, but in actual use, the actual lifetime is often different from the theoretical lifetime due to various factors.
In the related art, a manner of detecting the actual lifetime of an electronic product is generally to sample and select a plurality of electronic products, and use them for a long time. The detection period of the mode is longer, the efficiency is lower, and the loss of the electronic product is larger.
Based on the above, the embodiment of the application provides a life detection method of an electronic product. By the method in the embodiment of the application, the detection period can be shortened, and the detection efficiency can be improved. In addition, the electronic product does not need to be used for a long time, so that the loss of the electronic product is reduced, and the detection cost is saved.
Referring to fig. 1, a flow chart of a lifetime detection method of an electronic product according to an embodiment of the present application is shown. By way of example and not limitation, as shown in fig. 1, the method may include the steps of:
s101, acquiring a service life acceleration coefficient corresponding to the electronic product.
Wherein, the life acceleration coefficient represents the relationship between the theoretical life of the electronic product and the test duration. The life acceleration coefficient is obtained in the manner described in the embodiment of fig. 2 below.
In general, the theoretical lifetime is annotated on the factory scale of the electronic product. Before the electronic product leaves the factory, technicians perform life test on the electronic product under preset environmental conditions to obtain theoretical life. Since the use environment of the electronic product in actual application and the preset environmental condition corresponding to the theoretical lifetime are often different, the actual lifetime of the electronic product may be different from the theoretical lifetime.
In the embodiment of the application, the test duration represents the maximum duration for which the electronic product needs to be tested.
S102, calculating the test duration of the electronic product according to the theoretical service life of the electronic product and the service life acceleration coefficient.
From the above, the satisfaction formula among the life acceleration coefficient, the theoretical life and the test durationWherein->Indicating the life acceleration factor, +.>Indicating theoretical life time->Indicating the test duration.
In some embodiments, S102 may include: and calculating a second ratio between the theoretical life of the electronic product and the life acceleration coefficient, wherein the second ratio is the test duration.
S103, detecting the electronic product according to the test duration of the electronic product.
In some embodiments, S103 may include: if the current using time of the electronic product reaches the testing time, judging that the electronic product is qualified; and if the current using time of the electronic product does not reach the testing time, judging that the electronic product is unqualified.
For example, calculating a test duration corresponding to the theoretical life through a life acceleration coefficient to be 100h, and when the electronic product is used for 100h, indicating that the electronic product can reach the theoretical life, namely, is qualified; if the electronic product is used for not reaching 100 hours, if the electronic product is used for 90 hours, the electronic product fails, and the electronic product cannot reach the theoretical service life, namely is unqualified.
In other words, the life acceleration coefficient is equivalent to "acceleration" of the service time of the electronic product under the current test environment, so as to obtain the actual life of the electronic product under the current test environment, thereby achieving the purpose of shortening the test time.
In the embodiment shown in fig. 1, the test duration corresponding to the theoretical lifetime is calculated through the lifetime acceleration coefficient, and the actual lifetime of the electronic product is detected according to the test duration, so that the detection period can be effectively shortened, and the detection efficiency can be improved. In addition, the electronic product does not need to be used for a long time, so that the loss of the electronic product is reduced, and the detection cost is saved.
In some embodiments, referring to fig. 2, a flowchart of a method for obtaining a life acceleration coefficient according to an embodiment of the present application is shown. By way of example and not limitation, as shown in fig. 2, S101 may include:
s201, acquiring acceleration factors corresponding to various environmental stresses.
Wherein the environmental stress represents an environmental factor affecting the lifetime of the electronic product. For example, environmental stresses may include temperature stress, temperature humidity stress, temperature cycling stress, vibration stress, electrical stress, and the like.
In some implementations, acceleration models for various environmental stresses may be constructed from an Arrhenius model and an inverse power rate model.
As an example, in the case where the environmental stress is a temperature stress, S201 may include:
and calculating an acceleration factor corresponding to the temperature stress according to the first activation energy, the actual temperature and the test temperature, wherein the first activation energy represents a temperature range corresponding to the failure of the electronic product.
For example, the acceleration model of the temperature stress is constructed asWherein, the method comprises the steps of, wherein,is an acceleration factor of temperature stress->For the first activation energy, in electron volts, ">Is the boltzmann constant,and->Representing the actual temperature and the test temperature, respectively. And substituting the actual temperature and the test temperature into the acceleration model to calculate the acceleration factor of the temperature stress. The actual temperature belongs to actual working condition data of the electronic product, and the test temperature is the temperature in the test environment.
As an example, in the case where the environmental stress is a temperature and humidity stress, S201 may include:
and constructing an acceleration factor corresponding to the temperature and humidity stress according to the second activation energy, the actual temperature and humidity and the test temperature and humidity, wherein the second activation energy represents a temperature and humidity range corresponding to the failure of the electronic product.m
For example, the built acceleration model of the temperature and humidity stress isWherein->Is an acceleration factor of the temperature and humidity stress,for the second activation energy, in electron volts, ">Is Boltzmann constant, & gt>And->Representing the actual humidity and the test humidity, respectively, +.>Is constant (may be empirically set). The actual temperature and the actual humidity belong to actual working condition data of the electronic product, and the test humidity is humidity in a test environment.
As an example, in the case where the environmental stress is a temperature cycling stress, S201 may include:
and constructing an acceleration factor corresponding to the temperature cycle stress according to an actual cycle number, a test cycle number, a maximum temperature difference, an actual daily cycle frequency, a test daily cycle frequency and a maximum temperature, wherein the actual cycle number represents the cycle number actually occurring in a quality assurance period of the electronic product, and the test cycle number represents the cycle number occurring in a life detection process of the electronic product.
For example, the acceleration model of the temperature cycling stress is constructed as follows:
；
wherein,is an acceleration factor of the temperature cycling stress +.>And->Represents the actual cycle number and the test cycle number, respectively, < >>Represents the maximum temperature difference during the actual cycle, < >>Represents the maximum temperature difference during the test, +.>And->Represents the actual daily cycle frequency and the test daily cycle frequency, respectively, < >>Representing a real worldThe maximum temperature during the course of the inter-cycle,represents the maximum temperature during the test, +.>、/>、/>、/>、/>And->Is constant (may be empirically set). The actual cycle number, the maximum temperature difference in the actual cycle process, the actual daily average cycle frequency and the maximum temperature in the actual cycle process all belong to actual working condition data. The test cycle data is the cycle number in the test process, and the test daily average cycle frequency is the daily average cycle frequency in the test process.
As an example, in the case where the environmental stress is a vibration stress, S201 may include:
and constructing an acceleration factor corresponding to the vibration stress according to the root mean square of the acceleration under the actual working condition and the root mean square of the acceleration under the test condition.
For example, the acceleration model of the vibration stress is constructed asWherein- >Is the acceleration factor of the vibration stress +.>And->The acceleration root mean square value under the test environment and the acceleration root mean square value under the actual working condition are respectively +.>Is constant (may be empirically set).
As an example, in the case where the environmental stress is an electrical stress, S201 may include:
and constructing an acceleration factor corresponding to the electric stress according to the electric stress value under the actual working condition and the electric stress value under the test condition.
For example, the acceleration model of the constructed electrical stress isWherein->Is an acceleration factor of electrical stress->And->For testing the electric stress value used in the environment and the electric stress value under the actual working condition, +.>Is constant (may be empirically set).
As described in the above examples, the actual condition data (such as actual temperature, actual humidity, root mean square of acceleration under actual condition, and magnitude of electric stress) are used in calculating the acceleration factors of various environmental stresses. The actual working condition data are considered, so that the calculated acceleration factors of various environmental stresses can more accurately reflect the actual influence on the service life of the electronic product under the action of the corresponding environmental stresses, and the reliability of the subsequent service life detection is improved.
S202, calculating life acceleration coefficients of the electronic product under the action of various environmental stresses according to the acceleration factors.
In the embodiment of the application, various environmental stresses are considered, which is equivalent to calculating the service life acceleration coefficient under the combined action of the various environmental stresses, and the actual working condition environment can be reflected better due to the combined action of the various environmental stresses, so that the calculated service life acceleration coefficient can reflect the relation between the service time and the service life more accurately.
In some embodiments, the acceleration factors corresponding to the environmental stresses may be linearly combined, such as weighted summation, to obtain the lifetime acceleration coefficient of the electronic product.
The method is simple in calculation, but in actual engineering application, the failure of the electronic product is the result of the long-term combined action of various factors, various environmental stresses are applied to the electronic product in a linear combination mode, the actual working condition environment cannot be reflected, and therefore the reliability of the detection result is low.
In order to solve the above problems, the embodiment of the present application provides a method for calculating a lifetime acceleration coefficient.
In some embodiments, referring to fig. 3, a flowchart of a method for calculating a life acceleration coefficient according to an embodiment of the present application is shown. By way of example and not limitation, as shown in fig. 3, S202 may include the steps of:
S301, constructing an overrun equation between the acceleration factor and the life acceleration coefficient.
The transcendental equation is a function which cannot be represented by a polynomial or an evolution of a self-variable, and is an algebraic equation as opposed to the transcendental equation. For example, when the left-end function ƒ (z) of the unitary equation ƒ (z) =0 is not a polynomial of z, it is called an overrunning equation.
Compared with linear combination, the overrunning equation can more accurately represent the interrelationship among various variables, so that the real working condition environment can be reflected.
Optionally, one implementation of constructing the override equation includes:
for the kth environmental stress, generating a first expression corresponding to the kth environmental stress according to an acceleration factor and a first service life corresponding to the kth environmental stress; and constructing the overrun equation according to the life acceleration coefficient and the first expressions corresponding to the environmental stresses.
The first service life corresponding to the kth environmental stress represents the service life of the electronic product under the action of the first k environmental stresses, k is a positive integer less than or equal to N, and N is the total number of the plurality of environmental stresses.
Exemplary, for environmental stress 1, the first lifetime is The corresponding acceleration factor is +.>The first expression generated is +.>. Wherein (1)>And->Is constant (I)>The service life of the electronic product under the single action of the 1 st environmental stress is shown.
For the 2 nd environmental stress, the first life isThe corresponding acceleration factor is +.>The first expression generated is +.>. Wherein (1)>The expression is that the 1 st and 2 nd environmental stresses are commonAnd the service life of the electronic product is prolonged under the same action.
For the nth environmental stress, the first life isThe corresponding acceleration factor is +.>The first expression generated is +.>. Wherein (1)>The service life of the electronic product under the combined action of n environmental stresses, namely the 1 st to the n environmental stresses, is shown.
In one implementation manner of constructing the override equation according to the life acceleration coefficient and the first expressions corresponding to the environmental stresses, the first expressions corresponding to the environmental stresses may be weighted and summed to obtain an expression equal to the life acceleration coefficient, so as to obtain the override equation. In another implementation manner, the expression obtained by weighting and integrating the first expressions corresponding to the environmental stresses can be equal to the life acceleration coefficient, so as to obtain the overrun equation.
However, in actual working conditions, there may be environmental stresses that affect each other, or environmental stresses that do not affect each other. If the first expressions corresponding to the environmental stresses are weighted and summed, the environmental stresses are not affected; and if the first expressions corresponding to the environmental stresses are weighted and integrated, the first expressions represent the influence of the environmental stresses. Both the two methods can not accurately reflect the actual working condition environment.
In order to solve the above problem, an embodiment of the present application provides an implementation manner of constructing the override equation according to the first expression corresponding to each of the lifetime acceleration coefficient and the environmental stresses, including:
obtaining a second expression according to the weighted product of the first expressions corresponding to the first stress in the plurality of environmental stresses; according to the weighted summation of the first expressions corresponding to the second stress in the plurality of environmental stresses, obtaining a third expression; and constructing the overrun equation according to the life acceleration coefficient, the second expression and the third expression.
Wherein each two first stresses are mutually influenced; every two second stresses do not affect each other, and the second stresses do not affect each other with the first stresses.
By way of example, it is assumed that k environmental stresses (first stress) that interact with each other exist among the N environmental stresses, i.e., there is a coupling effect between the k environmental stresses; the rest N-k environmental stresses (second stress) have no interaction with other environmental stresses, i.e. the N-k environmental stresses have no coupling effect with other environmental stresses. Accordingly, the transcendental equation is:
；
wherein,is the life acceleration coefficient of the electronic product under the combined action of N environmental stresses>Is constant.
By the method for constructing the overrun equation, the first expressions of the environmental stress with the coupling effect are multiplied, and the first expressions of the environmental stress without the coupling effect are added, so that the constructed overrun equation can reflect the actual working condition environment more accurately, and the detection reliability is improved.
S302, calculating the life acceleration coefficient of the electronic product under the action of various environmental stresses according to the overrun equation.
Solving the transcendental equations cannot be done using algebraic geometry. Most of the overrun equation solutions have no general formulas, and it is difficult to solve the analytic solutions.
In one implementation of S302, a random number of the test duration may be obtained and substituted into the override equation; if the overrun equation is not satisfied, another random number is obtained, or the current random number is added/subtracted by a preset step length to obtain a new value, and the new value is substituted into the overrun equation. And so on until the override equation is established.
The above method has strong randomness, may not obtain the solution of the transcendental equation, and may reduce the calculation efficiency.
To solve the above problem, in the embodiment of the present application, an optimization algorithm may be used to solve the transcendental equation. Specifically, one implementation of S302 includes:
acquiring a first numerical value of the test duration;
calculating a first ratio of the first value to the theoretical life of the electronic product;
substituting the first value into the overrun equation, and calculating a second value of the life acceleration coefficient;
if the difference between the first value and the second value meets a preset condition, determining that the service life acceleration coefficient is the second value;
if the difference between the first value and the second value does not meet a preset condition, the first value is adjusted to obtain a third value; and calculating the life acceleration coefficient of the electronic product according to the third numerical value.
The first value of the test duration may be a random value or a value preset according to experience.
In some implementations of adjusting the first value, algorithms such as gradient descent, steepest descent, etc. may be used to adjust the first value. The method for adjusting the first value in the embodiment of the present application is not specifically limited.
In this embodiment, the preset condition may be that the difference between the first ratio and the second value is within a preset range. The preset condition may be that the square of the difference between the first and second values is smaller than a preset threshold.
In this embodiment, if the difference between the first ratio and the second value satisfies a preset condition, it may also be determined that the lifetime acceleration coefficient is the first ratio.
The life acceleration coefficient represents the relationship between the theoretical life of the electronic product and the test duration, namelyWherein->For theoretical life->Is the test duration.
For example, assume that the theoretical lifetime of the electronic product is 100000 hours and the first value of the test duration is 1000 hours. The first ratio is 100000/1000=100. Substituting 1000 into the above overrun equation, a second value is calculated. If the square of the difference between the second value and the first ratio is smaller than a preset threshold value, determining that the service life acceleration coefficient is the second value. If the square of the difference between the second value and the first ratio is not smaller than a preset threshold value, the first value is adjusted according to a gradient descent method, and a third value is obtained; calculating a third ratio of the third value to the theoretical life of the electronic product; substituting the third value into the overrun equation, and calculating a fourth value of the life acceleration coefficient; if the square of the difference between the third ratio and the fourth value is smaller than a preset threshold value, determining that the life acceleration coefficient is the fourth value; if the square of the difference between the third ratio and the fourth value is not smaller than the preset threshold value, continuing to adjust the fourth value. And so on until the value of the life acceleration factor is determined.
In the above examples, the unit of the test duration and the theoretical lifetime is taken as an hour, and the unit of the test duration and the theoretical lifetime may be taken as a day, a month, a year, or the like, which is not specifically limited in the embodiment of the present application.
According to the embodiment of the application, the overrun equation is solved through the optimization algorithm, so that the numerical value of the test duration for enabling the overrun equation to be established can be quickly searched, the success rate and the calculation efficiency of the overrun equation solving are improved, and the detection efficiency is improved.
It can be understood that, after the life acceleration coefficient is calculated, the test duration corresponding to the value of the current life acceleration coefficient is the test duration required by S102.
It should be understood that the sequence number of each step in the foregoing embodiment does not mean that the execution sequence of each process should be determined by the function and the internal logic of each process, and should not limit the implementation process of the embodiment of the present application in any way.
Fig. 4 is a block diagram of a lifetime detection device of an electronic product provided in an embodiment of the present application, corresponding to the lifetime detection method of an electronic product described in the above embodiment, and for convenience of explanation, only a portion related to the embodiment of the present application is shown.
Referring to fig. 4, the apparatus 4 includes:
and an obtaining unit 41, configured to obtain a lifetime acceleration coefficient corresponding to the electronic product, where the lifetime acceleration coefficient represents a relationship between a theoretical lifetime of the electronic product and a test duration.
And a calculating unit 42, configured to calculate a test duration of the electronic product according to the theoretical lifetime of the electronic product and the lifetime acceleration coefficient.
And the detection unit 43 is used for detecting the electronic product according to the test duration of the electronic product.
Optionally, the obtaining unit 41 is further configured to:
acquiring acceleration factors corresponding to various environmental stresses, wherein the environmental stresses represent environmental factors influencing the service life of the electronic product;
and calculating life acceleration coefficients of the electronic product under the action of various environmental stresses according to the acceleration factors.
Optionally, the obtaining unit 41 is further configured to:
constructing an overrun equation between the acceleration factor and the life acceleration coefficient;
and calculating the life acceleration coefficient of the electronic product under the action of various environmental stresses according to the overrun equation.
Optionally, the obtaining unit 41 is further configured to:
for the kth environmental stress, generating a first expression corresponding to the kth environmental stress according to an acceleration factor and a first service life corresponding to the kth environmental stress, wherein the first service life corresponding to the kth environmental stress represents the service life of the electronic product under the action of the previous k environmental stresses, k is a positive integer less than or equal to N, and N is the total number of the plurality of environmental stresses;
And constructing the overrun equation according to the life acceleration coefficient and the first expressions corresponding to the environmental stresses.
Optionally, the obtaining unit 41 is further configured to:
obtaining a second expression according to weighted product of first expressions corresponding to first stresses in the environmental stresses, wherein each two first stresses are mutually influenced;
according to the weighted summation of the first expressions corresponding to the second stresses in the plurality of environmental stresses, a third expression is obtained, wherein every two second stresses do not affect each other, and the second stresses do not affect each other with the first stresses;
and constructing the overrun equation according to the life acceleration coefficient, the second expression and the third expression.
Optionally, the obtaining unit 41 is further configured to:
acquiring a first numerical value of the test duration;
calculating a first ratio of the first value to the theoretical life of the electronic product;
substituting the first value into the overrun equation, and calculating a second value of the life acceleration coefficient;
and if the difference between the first value and the second value meets a preset condition, determining that the service life acceleration coefficient is the second value.
Optionally, the obtaining unit 41 is further configured to:
if the difference between the first value and the second value does not meet a preset condition, the first value is adjusted to obtain a third value;
and calculating the life acceleration coefficient of the electronic product according to the third numerical value.
Optionally, the computing unit 42 is further configured to:
and calculating a second ratio between the theoretical life of the electronic product and the life acceleration coefficient, wherein the second ratio is the test duration.
Optionally, the detecting unit 43 is further configured to:
if the current using time of the electronic product reaches the testing time, judging that the electronic product is qualified;
and if the current using time of the electronic product does not reach the testing time, judging that the electronic product is unqualified.
Optionally, the obtaining unit 41 is further configured to:
and under the condition that the environmental stress is temperature stress, constructing an acceleration factor corresponding to the temperature stress according to a first activation energy, an actual temperature and a test temperature, wherein the first activation energy represents a temperature range corresponding to the failure of the electronic product.
Optionally, the obtaining unit 41 is further configured to:
and under the condition that the environmental stress is temperature and humidity stress, constructing an acceleration factor corresponding to the temperature and humidity stress according to second activation energy, actual temperature and humidity and test temperature and humidity, wherein the second activation energy represents a temperature and humidity range corresponding to the failure of the electronic product.
Optionally, the obtaining unit 41 is further configured to:
under the condition that the environmental stress is temperature cycle stress, constructing an acceleration factor corresponding to the temperature cycle stress according to an actual cycle number, a test cycle number, a maximum temperature difference, an actual daily cycle frequency, a test daily cycle frequency and a maximum temperature, wherein the actual cycle number represents the cycle number actually occurring in a quality assurance period of the electronic product, and the test cycle number represents the cycle number occurring in a life detection process of the electronic product.
Optionally, the obtaining unit 41 is further configured to:
under the condition that the environmental stress is vibration stress, constructing an acceleration factor corresponding to the vibration stress according to the root mean square of the acceleration under the actual working condition and the root mean square of the acceleration under the test condition.
Optionally, the obtaining unit 41 is further configured to:
under the condition that the environmental stress is electric stress, constructing an acceleration factor corresponding to the electric stress according to the electric stress value under the actual working condition and the electric stress value under the test condition.
It should be noted that, because the content of information interaction and execution process between the above devices/units is based on the same concept as the method embodiment of the present application, specific functions and technical effects thereof may be referred to in the method embodiment section, and will not be described herein again.
In addition, the lifetime detection device of the electronic product shown in fig. 4 may be a software unit, a hardware unit, or a unit combining both of them, which are built in an existing terminal device, or may be integrated into the terminal device as an independent pendant, or may exist as an independent terminal device.
It will be apparent to those skilled in the art that, for convenience and brevity of description, only the above-described division of the functional units and modules is illustrated, and in practical application, the above-described functional distribution may be performed by different functional units and modules according to needs, i.e. the internal structure of the apparatus is divided into different functional units or modules to perform all or part of the above-described functions. The functional units and modules in the embodiment may be integrated in one processing unit, or each unit may exist alone physically, or two or more units may be integrated in one unit, where the integrated units may be implemented in a form of hardware or a form of a software functional unit. In addition, specific names of the functional units and modules are only for convenience of distinguishing from each other, and are not used for limiting the protection scope of the present application. The specific working process of the units and modules in the above system may refer to the corresponding process in the foregoing method embodiment, which is not described herein again.
Fig. 5 is a schematic structural diagram of a terminal device provided in an embodiment of the present application. As shown in fig. 5, the terminal device 5 of this embodiment includes: at least one processor 50 (only one is shown in fig. 5), a memory 51 and a computer program 52 stored in the memory 51 and executable on the at least one processor 50, the processor 50 implementing the steps in any of the individual electronic product lifetime detection method embodiments described above when executing the computer program 52.
The terminal equipment can be computing equipment such as a desktop computer, a notebook computer, a palm computer, a cloud server and the like. The terminal device may include, but is not limited to, a processor, a memory. It will be appreciated by those skilled in the art that fig. 5 is merely an example of the terminal device 5 and is not meant to be limiting as the terminal device 5, and may include more or fewer components than shown, or may combine certain components, or different components, such as may also include input-output devices, network access devices, etc.
The processor 50 may be a central processing unit (Central Processing Unit, CPU), the processor 50 may also be other general purpose processors, digital signal processors (Digital Signal Processor, DSP), application specific integrated circuits (Application Specific Integrated Circuit, ASIC), off-the-shelf programmable gate arrays (Field-Programmable Gate Array, FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, or the like. A general purpose processor may be a microprocessor or the processor may be any conventional processor or the like.
The memory 51 may in some embodiments be an internal storage unit of the terminal device 5, such as a hard disk or a memory of the terminal device 5. The memory 51 may in other embodiments also be an external storage device of the terminal device 5, such as a plug-in hard disk, a Smart Media Card (SMC), a Secure Digital (SD) Card, a Flash memory Card (Flash Card) or the like, which are provided on the terminal device 5. Further, the memory 51 may also include both an internal storage unit and an external storage device of the terminal device 5. The memory 51 is used for storing an operating system, application programs, boot Loader (Boot Loader), data, other programs, etc., such as program codes of the computer program. The memory 51 may also be used to temporarily store data that has been output or is to be output.
Embodiments of the present application provide a computer-readable storage medium storing a computer program that when executed by a processor implements the lifetime detection method of the electronic product in the above embodiments.
The present embodiment also provides a computer program product, in which a program code is stored in a computer readable storage medium, which when executed on a computer causes the computer to perform the above-mentioned related steps to implement the lifetime detection method of an electronic product in the above-mentioned embodiments.
The integrated units, if implemented in the form of software functional units and sold or used as stand-alone products, may be stored in a computer readable storage medium. Based on such understanding, the present application implements all or part of the flow of the method of the above embodiments, and may be implemented by a computer program to instruct related hardware, where the computer program may be stored in a computer readable storage medium, where the computer program, when executed by a processor, may implement the steps of each of the method embodiments described above. Wherein the computer program comprises computer program code which may be in source code form, object code form, executable file or some intermediate form etc. The computer readable medium may include at least: any entity or device capable of carrying computer program code to an apparatus/terminal device, recording medium, computer Memory, read-Only Memory (ROM), random access Memory (RAM, random Access Memory), electrical carrier signals, telecommunications signals, and software distribution media. Such as a U-disk, removable hard disk, magnetic or optical disk, etc. In some jurisdictions, computer readable media may not be electrical carrier signals and telecommunications signals in accordance with legislation and patent practice.
In the foregoing embodiments, the descriptions of the embodiments are emphasized, and in part, not described or illustrated in any particular embodiment, reference is made to the related descriptions of other embodiments.
Finally, it should be noted that: the above embodiments are only for illustrating the technical solution of the present application, and not for limiting the same; although the present application has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some or all of the technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit of the embodiments, and are intended to be included within the scope of the claims and description. In particular, the technical features mentioned in the respective embodiments may be combined in any manner as long as there is no structural conflict. The present application is not limited to the specific embodiments disclosed herein, but encompasses all technical solutions falling within the scope of the claims.
Claims (13)
1. A lifetime detection method of an electronic product, comprising:
Acquiring acceleration factors corresponding to various environmental stresses, wherein the environmental stresses represent environmental factors influencing the service life of the electronic product;
constructing an overrun equation between the acceleration factor and a life acceleration coefficient, wherein the life acceleration coefficient represents the relationship between the theoretical life of the electronic product and the test duration;
calculating life acceleration coefficients of the electronic product under the action of various environmental stresses according to the overrun equation;
calculating the test duration of the electronic product according to the theoretical service life of the electronic product and the service life acceleration coefficient;
detecting the electronic product according to the test duration of the electronic product;
said constructing an overrun equation between said acceleration factor and said life acceleration factor comprising:
for the kth environmental stress, generating a first expression corresponding to the kth environmental stress according to an acceleration factor and a first service life corresponding to the kth environmental stress, wherein the first service life corresponding to the kth environmental stress represents the service life of the electronic product under the action of the previous k environmental stresses, k is a positive integer less than or equal to N, and N is the total number of the plurality of environmental stresses;
And constructing the overrun equation according to the life acceleration coefficient and the first expressions corresponding to the environmental stresses.
2. The method of claim 1, wherein said constructing said override equation from said life acceleration factor and a first expression corresponding to each of a plurality of said environmental stresses comprises:
obtaining a second expression according to weighted product of first expressions corresponding to first stresses in the environmental stresses, wherein each two first stresses are mutually influenced;
according to the weighted summation of the first expressions corresponding to the second stresses in the plurality of environmental stresses, a third expression is obtained, wherein every two second stresses do not affect each other, and the second stresses do not affect each other with the first stresses;
and constructing the overrun equation according to the life acceleration coefficient, the second expression and the third expression.
3. The method of claim 1, wherein said calculating life acceleration coefficients for said electronic product under a plurality of environmental stresses according to said override equation comprises:
acquiring a first numerical value of the test duration;
calculating a first ratio of the first value to the theoretical life of the electronic product;
Substituting the first value into the overrun equation, and calculating a second value of the life acceleration coefficient;
and if the difference between the first value and the second value meets a preset condition, determining that the service life acceleration coefficient is the second value.
4. The method of claim 3, wherein after substituting the first value into the override equation and calculating the second value for the life acceleration coefficient, the method further comprises:
if the difference between the first value and the second value does not meet a preset condition, the first value is adjusted to obtain a third value;
and calculating the life acceleration coefficient of the electronic product according to the third numerical value.
5. The method of any one of claims 1 to 4, wherein said calculating a test duration of said electronic product based on a theoretical lifetime of said electronic product and said lifetime acceleration factor comprises:
and calculating a second ratio between the theoretical life of the electronic product and the life acceleration coefficient, wherein the second ratio is the test duration.
6. The method of claim 5, wherein the detecting the electronic product based on the test duration of the electronic product comprises:
If the current using time of the electronic product reaches the testing time, judging that the electronic product is qualified;
and if the current using time of the electronic product does not reach the testing time, judging that the electronic product is unqualified.
7. The method of claim 1, wherein the obtaining acceleration factors for each of the plurality of environmental stresses comprises:
and under the condition that the environmental stress is temperature stress, constructing an acceleration factor corresponding to the temperature stress according to a first activation energy, an actual temperature and a test temperature, wherein the first activation energy represents a temperature range corresponding to the failure of the electronic product.
8. The method of claim 1, wherein the obtaining acceleration factors for each of the plurality of environmental stresses comprises:
and under the condition that the environmental stress is temperature and humidity stress, constructing an acceleration factor corresponding to the temperature and humidity stress according to second activation energy, actual temperature and humidity and test temperature and humidity, wherein the second activation energy represents a temperature and humidity range corresponding to the failure of the electronic product.
9. The method of claim 1, wherein the obtaining acceleration factors for each of the plurality of environmental stresses comprises:
Under the condition that the environmental stress is temperature cycle stress, constructing an acceleration factor corresponding to the temperature cycle stress according to an actual cycle number, a test cycle number, a maximum temperature difference, an actual daily cycle frequency, a test daily cycle frequency and a maximum temperature, wherein the actual cycle number represents the cycle number actually occurring in a quality assurance period of the electronic product, and the test cycle number represents the cycle number occurring in a life detection process of the electronic product.
10. The method of claim 1, wherein the obtaining acceleration factors for each of the plurality of environmental stresses comprises:
under the condition that the environmental stress is vibration stress, constructing an acceleration factor corresponding to the vibration stress according to the root mean square of the acceleration under the actual working condition and the root mean square of the acceleration under the test condition.
11. The method of claim 1, wherein the obtaining acceleration factors for each of the plurality of environmental stresses comprises:
under the condition that the environmental stress is electric stress, constructing an acceleration factor corresponding to the electric stress according to the electric stress value under the actual working condition and the electric stress value under the test condition.
12. A terminal device comprising a memory, a processor and a computer program stored in the memory and executable on the processor, characterized in that the processor implements the method according to any of claims 1 to 11 when executing the computer program.
13. A computer readable storage medium storing a computer program, characterized in that the computer program when executed by a processor implements the method according to any one of claims 1 to 11.
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