CN117114466A - Method and device for determining availability of electronic component - Google Patents
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Abstract
The application provides a method and a device for determining the use availability of an electronic component, which belong to the field of analysis of the use availability under the condition that the maintenance time consumption is not 0. The working time of spare part guarantee failure, the working time of timely completing maintenance and the working time of timely not completing maintenance are solved based on the working time of spare part guarantee failure, the working time of timely completing maintenance and the working time of timely not completing maintenance, and the availability of the electronic type parts is solved. Experiments prove that when the maintenance time consumption of the electronic unit is large, the current industry method for ignoring the influence of the maintenance time consumption can lead to the fact that the usability evaluation result is 'virtual high', the brought error is invisible, and the calculated usability is consistent with the actual situation and has referenceability.
Description
Technical Field
The application belongs to the field of usability analysis of electronic components, and particularly relates to a method and a device for determining usability of electronic components.
Background
Patent document CN110688759a discloses a spare part calculation method, a simulation method, a terminal and a storage medium of a voting part, which solve the problem of how to determine the spare part demand of an electronic voting part when repairing a faulty unit in a replacement repair manner. The important index to be referred in the calculation process of determining the spare part demand is the usage availability of the component, the usage availability is a ratio value of the actual accumulated working time of the equipment to the task time, reflects the working degree of the equipment in the task period, is an important index for evaluating the spare part guarantee effect, generally has negligible maintenance time consumption of the spare part when the spare part guarantee effect is evaluated by the usage availability in the current industry, and is not applicable any more when the maintenance time consumption of the spare part is not negligible.
The electronic components are distributed in various fields of daily life, when some electronic components are in fault, a great amount of time and manpower are required for component replacement and maintenance, the maintenance time is not negligible compared with the whole task device of the electronic components, a certain task time is occupied, but no in-depth study on using the usability index in the scene of consuming time for maintaining the electronic components is involved in the current study.
Disclosure of Invention
Aiming at the defects of the prior art, the application aims to provide a method and a device for determining the use availability of electronic components, and aims to solve the problem that the prior art does not relate to deep research on the use availability index in a scene of time consuming and non-negligible maintenance of the electronic components.
To achieve the above object, in a first aspect, the present application provides a method for determining availability of electronic components, comprising the steps of:
determining the unit composition of the electronic component, which consists of n similar electronic units, wherein the electronic component is provided with s electronic unit spare parts, so that when one electronic unit comprising the electronic component fails, the electronic unit spare parts are used for replacing and maintaining the electronic unit spare parts; the service life of each electronic unit is subjected to exponential distribution, and the maintenance time consumption of the electronic units is subjected to exponential distribution;
determining corresponding working time respectively from 0 to s of electronic spare parts consumed by the electronic parts according to the service life distribution, the maintenance time consumption distribution, the number of electronic units included in the electronic parts and the task time of the electronic parts, wherein the working time comprises working time for timely maintenance and working time for not timely maintenance;
calculating the working time when the electronic component consumes s electronic unit spare parts and the guarantee of the spare parts fails based on the service life distribution and the maintenance time consumption distribution of the electronic unit;
accumulating the working time of timely completing the maintenance when the electronic components consume different numbers of the electronic spare parts to obtain the total working time of timely completing the maintenance, and accumulating the working time of not timely completing the maintenance when the electronic components consume different numbers of the electronic spare parts to obtain the total working time of not timely completing the maintenance;
and accumulating the working time of the electronic component spare part when the guarantee of the electronic component spare part fails, the total working time of timely completing the maintenance and the total working time of not timely completing the maintenance, and dividing the accumulated working time by the task time of the electronic component to obtain the use availability of the electronic component.
In one possible implementation, let the task time be T, the lifetime of the electronic unit obey the exponential distribution E (a), the number of electronic unit spare parts be s, the maintenance time spent obey the exponential distribution E (b), a and b are parameters of the exponential distribution;
let the spare parts consume i, and the working time for timely finishing maintenance is Ts i The working time of not timely completing maintenance is Tf i Then:
if i=0, tf i ＝0，
In one possible implementation, if i=1, then:
in the method, in the process of the application,y is a maintenance time-consuming variable, u (y) is a life distribution probability of the electronic element and 1 spare part, t is a time variable, and x is a life variable.
In one possible implementation, if i > 1:
wherein Γ () is a gamma function, g (x) is the probability of consuming i spare parts under the condition that maintenance is not completed in time, and h (y) is the probability of consuming i spare parts under the condition that maintenance is completed in time;
the calculation steps of g (x) are as follows:
(g.1) let j=1, calculate the probability array pg, wherein the array pg includes i elements, the value of each element
Calculating a probability array pd, wherein the array pd comprises i+1 elements, the values of each element are as follows:
wherein t is a time variable and x is a life variable;
(g.2) if j=1, then the array pj=pg, otherwise pj=pj×pd, where is a convolution operator;
(G.3) updating j=j+1, if j.ltoreq.n, executing (g.2), otherwise outputting g (x) =pj i ，pj i Is the ith element of the array pj;
the h (y) calculation steps are as follows:
(H.1) let j=1, calculate a probability array pdd, where array pdd includes i+1 elements, each element having the following values:
(h.2) if j=1, then let array pjj = pdd, otherwise pjj = pjj × pdd;
(H.3) updating j=j+1, if j.ltoreq.n, executing (h.2), otherwise outputting h (y) = pjj 1+i ，pjj 1+i Is the 1+i element of array pjj.
In one possible implementation, the working time when the equipment guarantee fails when s electronic unit equipment is consumed is tf:
m (x) is the probability of consuming s spare parts under the guarantee failure condition, and the calculation steps are as follows:
(m.1) let j=1, calculate the probability array pg, wherein the array pg includes s+1 elements, each element
Calculating a probability array pd, wherein the array pd comprises s+1 elements, the values of each element are as follows:
(m.2) if j=1, let pj=pg, otherwise pj=pj×pd;
(M.3) updating j=j+1, if j.ltoreq.n, executing (m.2), otherwise outputting m (x) =pj 1+s 。Pj 1+s Is the 1+s element of array pj.
In a second aspect, the present application provides an electronic component usage availability determination device, including: at least one memory for storing a program; at least one processor for executing a memory-stored program, which when executed is adapted to carry out the method described in the first aspect or any one of the possible implementations of the first aspect.
In a third aspect, the application provides a computer readable storage medium storing a computer program which, when run on a processor, causes the processor to perform the method described in the first aspect or any one of the possible implementations of the first aspect.
In a fourth aspect, the application provides a computer program product which, when run on a processor, causes the processor to perform the method described in the first aspect or any one of the possible implementations of the first aspect.
In general, the above technical solutions conceived by the present application have the following beneficial effects compared with the prior art:
the application provides a method and a device for determining the use availability of an electronic component, wherein the service life of an electronic unit in the electronic component is set to be in compliance with an exponential distribution, the maintenance time consumption of the electronic unit is set to be in compliance with the exponential distribution, and the working time when the electronic component consumes different spare parts is solved and divided into three types: the working time of spare part guarantee failure, the working time of timely completing maintenance and the working time of timely not completing maintenance are solved based on the working time of spare part guarantee failure, the working time of timely completing maintenance and the working time of timely not completing maintenance, and the availability of the electronic type parts is solved. Experiments prove that when the maintenance time consumption of the electronic unit is large, the current industry method for ignoring the influence of the maintenance time consumption can lead to the fact that the usability evaluation result is 'virtual high', the brought error is invisible, and the calculated usability is consistent with the actual situation and has referenceability.
Drawings
FIG. 1 is a flowchart of a method for determining availability of electronic components according to an embodiment of the present application;
fig. 2 is a comparison chart of usage availability of 1-13 parts calculated by three methods according to the embodiment of the present application.
Detailed Description
The present application will be described in further detail with reference to the drawings and examples, in order to make the objects, technical solutions and advantages of the present application more apparent. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the application.
The term "and/or" in the present application is an association relation describing an association object, and indicates that three relations may exist, for example, a and/or B may indicate: a exists alone, A and B exist together, and B exists alone. In the present application, the symbol "/" indicates that the associated object is or is a relationship, for example, A/B indicates A or B.
The terms first and second and the like in the description and in the claims, are used for distinguishing between different objects and not necessarily for describing a particular sequential or chronological order of the objects. For example, the first response message and the second response message, etc. are used to distinguish between different response messages, and are not used to describe a particular order of response messages.
In embodiments of the application, words such as "exemplary" or "such as" are used to mean serving as an example, instance, or illustration. Any embodiment or design described herein as "exemplary" or "e.g." in an embodiment should not be taken as preferred or advantageous over other embodiments or designs. Rather, the use of words such as "exemplary" or "such as" is intended to present related concepts in a concrete fashion.
In the description of the embodiments of the present application, unless otherwise specified, the meaning of "plurality" means two or more, for example, the meaning of a plurality of processing units means two or more, or the like; the plurality of elements means two or more elements and the like.
FIG. 1 is a flowchart of a method for determining availability of electronic components according to an embodiment of the present application; as shown in fig. 1, the method comprises the following steps:
s101, determining the unit composition of the electronic component, wherein the electronic component consists of n similar electronic units, and the electronic component is provided with S electronic unit spare parts, so that the electronic unit spare parts are used for replacing and maintaining when one electronic unit of the electronic component fails; the service life of each electronic unit is subjected to exponential distribution, and the maintenance time consumption of the electronic units is subjected to exponential distribution;
s102, determining corresponding working time respectively from 0 to S according to service life distribution, maintenance time consumption distribution, the number of electronic units included in the electronic parts and task time of the electronic parts, wherein the working time comprises working time for timely maintenance and working time for not timely maintenance;
s103, calculating the working time when the electronic component consumes S electronic unit spare parts and the guarantee of the spare parts fails based on the service life distribution and the maintenance time consumption distribution of the electronic unit;
s104, accumulating the working time of timely completing the maintenance when the electronic components consume different numbers of the electronic spare parts to obtain the total working time of timely completing the maintenance, and accumulating the working time of not timely completing the maintenance when the electronic components consume different numbers of the electronic spare parts to obtain the total working time of not timely completing the maintenance;
s105, accumulating the working time when the electronic component spare part is failed to guarantee, the total working time when the maintenance is completed in time and the total working time when the maintenance is not completed in time, and dividing the working time by the task time of the electronic component to obtain the utilization availability of the electronic component.
The electronic component of the present application is an assembly composed of a plurality of similar electronic units, and when one of the units fails, the electronic component is considered to fail, and the maintenance of the electronic component is completed by replacing the failed unit. Electronic lifetime generally obeys an exponential distribution, such as: printed circuit board packages, electronic components, resistors, capacitors, integrated circuits, and the like. Random variable obeys an exponential distribution E (mu), mu is the variable mean value and the probability density function
In the application, given the task time T, a certain electronic component consists of n electronic units, the service lives of the units are subjected to an exponential distribution E (a), the number of spare parts of the units is s, and the maintenance time is subjected to an exponential distribution E (b).
In a more specific embodiment, the application provides a method for accurately evaluating the service availability under the comprehensive influence of maintenance time consumption and the number of spare parts, which comprises the following specific steps:
(1) Initializing, and enabling the spare part consumption quantity i=0.
(2) Calculating timely completion of maintenanceWorking time Tf for not timely completing maintenance i 。
(2.1) if i=0, let Tf i ＝0，
(2.2) if i=1, let
In the middle of
(2.3) if i>1, order
Where Γ () is a gamma function,
the g (x) calculation steps are as follows:
(g.1) let j=1, calculate probability array pg
Order the
Calculating probability array pd
Order the
(g.2) if j=1, let pj=pg, otherwise pj=pj×pd, where is a convolution operator.
(G.3) updating j=j+1, if j.ltoreq.n, executing (g.2), otherwise outputting g (x) =pj i 。
The h (y) calculation steps are as follows:
(H.1) let j=1, calculate probability array pdd
Order the
(h.2) if j=1, then let pjj = pdd, otherwise pjj = pjj × pdd, where×is a convolution operator.
(H.3) updating j=j+1, if j.ltoreq.n, executing (h.2), otherwise outputting h (x) = pjj 1+i 。
(3) Updating i=i+1, if i is less than or equal to s, executing (2), otherwise executing (4);
(4) Calculate the guarantee failure working time tf
The m (x) calculation steps are as follows:
(m.1) let j=1, calculate probability array pg
Order the
Calculating probability array pd
Order the
(m.2) if j=1, let pj=pg, otherwise pj=pj×pd, where is a convolution operator.
(M.3) updating j=j+1, if j.ltoreq.n, executing (m.2), otherwise outputting m (x) =pj 1+s 。
(5) Make the usability degreeAnd outputting Pa.
In addition, in order to better explain the scheme of the embodiment of the present application, the following provides a specific example: the service life of the electronic unit is subjected to the exponential distribution E (80), the task time is 100h, 6 spare parts are provided, the fault repairing time is subjected to the exponential distribution E (10), and the service availability of the electronic unit is calculated.
The solution process of the above example is as follows:
(1) Initializing, and enabling the spare part consumption quantity i=0.
Performing (2) - (3) calculation on Ts with maintenance completed in time for multiple times i Working time Tf of not timely completing maintenance i The calculation results are shown in Table 1.
TABLE 1
(4) Calculate a guarantee failure working time tf=2.51;
(5) Make the usability degreeAnd outputting Pa.
The availability of 1-13 parts of the above calculation example is calculated by adopting the current industry method for neglecting maintenance time and the evaluation method and simulation method for considering maintenance time, and the results are shown in fig. 2 and table 2.
Table 2 results of availability of three methods
| Spare parts quantity | Method in industry | Simulation method | The method of the application |
| 1 | 0.317 | 0.312 | 0.315 |
| 2 | 0.469 | 0.457 | 0.452 |
| 3 | 0.608 | 0.551 | 0.550 |
| 4 | 0.728 | 0.606 | 0.605 |
| 5 | 0.823 | 0.627 | 0.629 |
| 6 | 0.892 | 0.636 | 0.637 |
| 7 | 0.939 | 0.637 | 0.639 |
| 8 | 0.968 | 0.638 | 0.639 |
| 9 | 0.984 | 0.640 | 0.639 |
| 10 | 0.993 | 0.642 | 0.639 |
| 11 | 0.997 | 0.642 | 0.639 |
| 12 | 0.999 | 0.635 | 0.639 |
| 13 | 0.999 | 0.638 | 0.639 |
Fig. 2 and table 2 show that the evaluation results and simulation results of the present application are very identical. It can also be seen from fig. 2 that when the maintenance time is relatively long, the current in-industry method of ignoring the effect of the maintenance time may result in using the availability evaluation result "virtual high", and the error caused by the virtual high is not visible.
Based on the method in the above embodiment, the embodiment of the present application provides an electronic component usage availability determining device, which may include: at least one memory for storing programs and at least one processor for executing the programs stored by the memory. Wherein the processor is adapted to perform the method described in the above embodiments when the program stored in the memory is executed.
Based on the method in the above embodiment, the embodiment of the present application provides a computer-readable storage medium storing a computer program, which when executed on a processor, causes the processor to perform the method in the above embodiment.
Based on the method in the above embodiments, an embodiment of the present application provides a computer program product, which when run on a processor causes the processor to perform the method in the above embodiments.
It is to be appreciated that the processor in embodiments of the application may be a central processing unit (centralprocessing unit, CPU), other general purpose processor, digital signal processor (digital signalprocessor, DSP), application specific integrated circuit (application specific integrated circuit, ASIC), field programmable gate array (field programmable gate array, FPGA) or other programmable logic device, transistor logic device, hardware components, or any combination thereof. The general purpose processor may be a microprocessor, but in the alternative, it may be any conventional processor.
The method steps in the embodiments of the present application may be implemented by hardware, or may be implemented by executing software instructions by a processor. The software instructions may be comprised of corresponding software modules that may be stored in random access memory (random access memory, RAM), flash memory, read-only memory (ROM), programmable ROM (PROM), erasable programmable PROM (EPROM), electrically erasable programmable EPROM (EEPROM), registers, hard disk, a removable disk, a CD-ROM, or any other form of storage medium known in the art. An exemplary storage medium is coupled to the processor such the processor can read information from, and write information to, the storage medium. In the alternative, the storage medium may be integral to the processor. The processor and the storage medium may reside in an ASIC.
In the above embodiments, it may be implemented in whole or in part by software, hardware, firmware, or any combination thereof. When implemented in software, may be implemented in whole or in part in the form of a computer program product. The computer program product includes one or more computer instructions. When loaded and executed on a computer, produces a flow or function in accordance with embodiments of the present application, in whole or in part. The computer may be a general purpose computer, a special purpose computer, a computer network, or other programmable apparatus. The computer instructions may be stored in or transmitted across a computer-readable storage medium. The computer instructions may be transmitted from one website, computer, server, or data center to another website, computer, server, or data center by a wired (e.g., coaxial cable, fiber optic, digital Subscriber Line (DSL)), or wireless (e.g., infrared, wireless, microwave, etc.). The computer readable storage medium may be any available medium that can be accessed by a computer or a data storage device such as a server, data center, etc. that contains an integration of one or more available media. The usable medium may be a magnetic medium (e.g., a floppy disk, a hard disk, a magnetic tape), an optical medium (e.g., a DVD), or a semiconductor medium (e.g., a Solid State Disk (SSD)), or the like.
It will be appreciated that the various numerical numbers referred to in the embodiments of the present application are merely for ease of description and are not intended to limit the scope of the embodiments of the present application.
It will be readily appreciated by those skilled in the art that the foregoing description is merely a preferred embodiment of the application and is not intended to limit the application, but any modifications, equivalents, improvements or alternatives falling within the spirit and principles of the application are intended to be included within the scope of the application.
Claims (8)
1. The method for determining the availability of the electronic component is characterized by comprising the following steps:
determining the unit composition of the electronic component, which consists of n similar electronic units, wherein the electronic component is provided with s electronic unit spare parts, so that when one electronic unit comprising the electronic component fails, the electronic unit spare parts are used for replacing and maintaining the electronic unit spare parts; the service life of each electronic unit is subjected to exponential distribution, and the maintenance time consumption of the electronic units is subjected to exponential distribution;
determining corresponding working time respectively from 0 to s of electronic spare parts consumed by the electronic parts according to the service life distribution, the maintenance time consumption distribution, the number of electronic units included in the electronic parts and the task time of the electronic parts, wherein the working time comprises working time for timely maintenance and working time for not timely maintenance;
calculating the working time when the electronic component consumes s electronic unit spare parts and the guarantee of the spare parts fails based on the service life distribution and the maintenance time consumption distribution of the electronic unit;
accumulating the working time of timely completing the maintenance when the electronic components consume different numbers of the electronic spare parts to obtain the total working time of timely completing the maintenance, and accumulating the working time of not timely completing the maintenance when the electronic components consume different numbers of the electronic spare parts to obtain the total working time of not timely completing the maintenance;
and accumulating the working time of the electronic component spare part when the guarantee of the electronic component spare part fails, the total working time of timely completing the maintenance and the total working time of not timely completing the maintenance, and dividing the accumulated working time by the task time of the electronic component to obtain the use availability of the electronic component.
2. The method according to claim 1, wherein the mission time is set to T, the lifetime of the electronic unit follows an exponential distribution E (a), the number of spare parts of the electronic unit is s, the maintenance time follows an exponential distribution E (b), and a and b are parameters of the exponential distribution;
let the spare parts consume i, and the working time for timely finishing maintenance is Ts i The working time of not timely completing maintenance is Tf i Then:
if i=0, tf i ＝0，
3. The method according to claim 2, wherein if i = 1:
in the method, in the process of the application,y is a maintenance time-consuming variable, u (y) is a life distribution probability of the electronic element and 1 spare part, t is a time variable, and x is a life variable.
4. The method according to claim 2, wherein if i > 1:
wherein Γ () is a gamma function, g (x) is the probability of consuming i spare parts under the condition that maintenance is not completed in time, and h (y) is the probability of consuming i spare parts under the condition that maintenance is completed in time;
the calculation steps of g (x) are as follows:
(g.1) let j=1, calculate the probability array pg, wherein the array pg includes i elements, the value of each element
Calculating a probability array pd, wherein the array pd comprises i+1 elements, the values of each element are as follows:
wherein t is a time variable and x is a life variable;
(g.2) if j=1, then the array pj=pg, otherwise pj=pj×pd, where is a convolution operator;
(G.3) updating j=j+1, if j.ltoreq.n, executing (g.2), otherwise outputting g (x) =pj i ，pj i Is the ith element of the array pj;
the h (y) calculation steps are as follows:
(H.1) let j=1, calculate a probability array pdd, where array pdd includes i+1 elements, each element having the following values:
(h.2) if j=1, then let array pjj = pdd, otherwise pjj = pjj × pdd;
(H.3) updating j=j+1, if j.ltoreq.n, executing (h.2), otherwise outputting h (y) = pjj 1+i ，pjj 1+i Is the 1+i element of array pjj.
5. The method according to claim 2, wherein the operating time when the equipment guarantee fails for s electronic unit equipment is set to tf:
m (x) is the probability of consuming s spare parts under the guarantee failure condition, and the calculation steps are as follows:
(m.1) let j=1, calculate the probability array pg, wherein the array pg includes s+1 elements, each element
Calculating a probability array pd, wherein the array pd comprises s+1 elements, the values of each element are as follows:
(m.2) if j=1, let pj=pg, otherwise pj=pj×pd;
(M.3) updating j=j+1, if j.ltoreq.n, executing (m.2), otherwise outputting m (x) =pj 1+s 。Pj 1+s Is the 1+s element of array pj.
6. An electronic component use availability determination device, comprising:
at least one memory for storing a program;
at least one processor for executing the memory-stored program, which processor is adapted to perform the method according to any of claims 1-5, when the memory-stored program is executed.
7. A computer readable storage medium storing a computer program, characterized in that the computer program, when run on a processor, causes the processor to perform the method according to any one of claims 1-5.
8. A computer program product, characterized in that the computer program product, when run on a processor, causes the processor to perform the method according to any of claims 1-5.
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| CN202310900711.3A CN117114466A (en) | 2023-07-20 | 2023-07-20 | Method and device for determining availability of electronic component |
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| CN202310900711.3A Pending CN117114466A (en) | 2023-07-20 | 2023-07-20 | Method and device for determining availability of electronic component |
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