CN117110836A - Overvoltage protection testing device and method - Google Patents
Overvoltage protection testing device and method Download PDFInfo
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2827—Testing of electronic protection circuits
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Abstract
The application provides an overvoltage protection testing device and method, comprising a power supply assembly, a voltage converting device and a voltage converting device, wherein the power supply assembly comprises an external power supply and a voltage converting device and is used for externally connecting test voltage and regulating the external test voltage; preliminary test processor: the device testing method comprises the steps of setting device testing items, and collecting first operation data of different devices in an overvoltage protection circuit; a matching test processor: the overvoltage protection circuit is used for setting an overvoltage detection item and collecting second operation data of a target circuit protected by the overvoltage protection circuit when the overvoltage protection circuit operates; overvoltage monitoring component: and the overvoltage protection testing device is used for monitoring and comparing the first operation data with the second operation data to obtain an overvoltage protection testing result.
Description
Technical Field
The application relates to the technical field of overvoltage testing, in particular to an overvoltage protection testing device and method.
Background
An overvoltage test is a test system that is applied to a voltage on a target circuit that is protected by an overvoltage protection circuit, thereby determining the protection capability of the overvoltage protection circuit and the protection voltage to check the protection capability of the overvoltage protection circuit.
In actual power devices, overvoltage protection circuits are often configured, and different power devices may be configured with the same or different dedicated overvoltage protection circuits of a dedicated design. The structures of the overvoltage protection circuits may be different, but all have the capability of overvoltage protection, the existing test software can judge whether the overvoltage protection circuits are abnormal in the process of circuit simulation, but when the overvoltage protection circuits are actually used, any problem can not occur because the overvoltage protection circuits are ideal environments in the process of simulation, but in the process of actual implementation, the overvoltage protection circuits can not judge whether the whole overvoltage protection circuits have faults through simulation operation because of the connection problem of electronic components or the quality problem of the electronic components.
Therefore, in the prior art, only the circuit is detected, and the overvoltage protection circuit for determining the performance of the circuit cannot detect the overvoltage protection capability when the circuit is operated;
therefore, how to determine whether there is a hardware quality defect and a circuit operation defect of the overvoltage protection circuit of the entity is the direction that needs to be further determined.
Disclosure of Invention
The application provides an overvoltage protection testing device and method, which are used for solving the problem that overvoltage protection capacity cannot be detected when an overvoltage protection circuit operates.
The application provides an overvoltage protection testing device, which comprises:
the power supply assembly comprises an external power supply and a transformation device, and is used for externally connecting test voltage and adjusting the externally connected test voltage;
preliminary test processor: the device testing method comprises the steps of setting device testing items, and collecting first operation data of different devices in an overvoltage protection circuit;
a matching test processor: the overvoltage protection circuit is used for setting an overvoltage detection item and collecting second operation data of a target circuit protected by the overvoltage protection circuit when the overvoltage protection circuit operates;
overvoltage monitoring component: and the overvoltage protection testing device is used for monitoring and comparing the first operation data with the second operation data to obtain an overvoltage protection testing result.
Preferably, the voltage transformation device comprises:
the first transformation microcontroller is used for acquiring the input quantity and output quantity of the external power supply and the running time of the target circuit; wherein,
the running time is determined according to the duty ratio control time of the voltage transformation microcontroller;
the second transformation microcontroller is used for calculating the feedback value of the target circuit according to the input quantity and output quantity of the external power supply and the running time of the target circuit; wherein,
the feedback value is related to the operational fluctuation of the target circuit;
the third transformation microcontroller is used for taking the feedback value and a preset feedback reference value as the input of a feedback regulation mechanism and performing period regulation of external test voltage; wherein,
the feedback adjustment mechanism corresponds to an adjustment mechanism of the duty cycle control time.
Preferably, the third voltage transformation microcontroller is connected with an interval control circuit; wherein,
the interval control circuit is used for controlling the external power supply to discharge according to a preset feedback reference value and a transformation interval, and stabilizing the transformation voltage of the transformation device within the transformation interval.
Preferably, the preliminary test processor includes:
a recording unit: the device data recording circuit is used for recording the device data of different devices in the overvoltage protection circuit; wherein,
the component data comprises component specification data and component operation data;
a connection unit: the device is used for setting connection interfaces to be respectively connected with different components in the overvoltage protection circuit and collecting component operation data; wherein,
a sense amplifier is configured on the connection interface;
and a storage unit: the topology structure diagram is used for storing the component data and generating the topology structure diagram of the component;
test unit: the device testing method comprises the steps of setting operation intervals of different components according to component specification data to form a component testing item;
a first data unit: and the first operation data of different components in the overvoltage protection circuit are respectively acquired according to the device test items.
Preferably, the test unit includes:
test setup subunit: the method comprises the steps of responding to input operation based on target operation parameters corresponding to the components to be tested, and obtaining test information of the components to be tested;
script setting subunit: the device testing method comprises the steps of generating device testing items corresponding to a to-be-tested device based on testing information;
interface subunit: the control identification method comprises the steps of carrying out control identification on a graphical user interface of a component to be tested, and carrying out testing on the component to be tested based on the position of a target control obtained by identification and the component to be tested, so as to obtain a testing result of the component to be tested; wherein,
the graphical user interface comprises a control image of the component to be tested;
the test information comprises test logic and execution parameters of each test step forming the test logic; when the execution parameters comprise the execution object, the execution object is a control corresponding to a control image contained in the graphical user interface;
the target control comprises a control corresponding to the execution object.
Preferably, the matching test processor includes:
a first curve unit: the method comprises the steps of obtaining an estimated working curve of a target circuit, inputting a comparison coordinate system and forming a first comparison curve;
a second curve unit: when the overvoltage protection circuit is operated, a real-time working curve of the target circuit is obtained, and a comparison coordinate system is input to form a second comparison curve;
fitting comparison unit: the method comprises the steps of performing linear fitting on a first contrast curve and a second contrast curve to determine a fitting difference;
second data unit: for generating second operational data based on the time axis based on the fitted difference.
Preferably, the linear fitting comprises the steps of:
establishing a data gain matrix and a data offset matrix based on the first contrast curve and the second contrast curve relative to a time axis;
according to the data gain matrix and the data offset matrix, a linear equation set for fitting comparison is established;
performing linear fitting based on a least square method to obtain a gain value of each time point of a data gain matrix and an offset value of each time point in a data offset matrix;
and calculating and obtaining a fitting difference value according to the data gain matrix, the data offset matrix and the linear equation set which are obtained by fitting.
Preferably, the overpressure monitoring assembly comprises:
and a component monitoring unit: the device fault judgment method comprises the steps of judging a component fault according to first operation data, and generating a first monitoring result;
target circuit test unit: the voltage stability judgment module is used for judging the voltage stability according to the second operation data to generate a second monitoring result;
a result output unit: the overvoltage protection testing device is used for carrying out overvoltage analysis on the target circuit according to the first monitoring result and the second monitoring result to determine an overvoltage protection testing result; wherein,
the overvoltage protection test result comprises a voltage division section and a voltage stabilizing coefficient of the overvoltage protection circuit.
Preferably, the overpressure analysis comprises:
determining at least one abnormal monitoring data in the first monitoring result and the second monitoring result;
performing cycle repeated detection on at least one piece of abnormal monitoring data to obtain N key cycle detection results corresponding to the at least one piece of abnormal monitoring data, wherein N is a natural number;
responding to N being larger than 1, respectively performing overvoltage analysis by taking N key period detection results as N alternative analysis scenes to determine an overvoltage analysis result corresponding to the target circuit;
the key period detection result comprises:
determining a plurality of repeated outliers included in the period repeated detection;
acquiring a plurality of circuit simulation waveforms corresponding to the repeated abnormal points respectively;
based on the multiple circuit simulation waveforms, extracting p key clock cycles corresponding to the abnormal monitoring data, and determining an average overvoltage value in the key clock cycles.
An overvoltage protection test method, comprising:
the preset voltage transformation device is connected with an external test voltage and used for adjusting the external test voltage;
setting a device test item, and collecting first operation data of different devices in an overvoltage protection circuit;
setting an overvoltage detection item, and collecting second operation data of a target circuit protected by the overvoltage protection circuit when the overvoltage protection circuit operates;
and monitoring and comparing the first operation data with the second operation data to obtain an overvoltage protection test result.
The beneficial effects of the application are as follows:
the application can detect the overvoltage protection circuit, determine whether the overvoltage protection circuit is abnormal in operation, and then judge specific operation results of the overvoltage protection circuit and specific performance parameters of the overvoltage protection circuit from the operation state of the protection end-specific protected target circuit.
Additional features and advantages of the application will be set forth in the description which follows, and in part will be obvious from the description, or may be learned by practice of the application. The objectives and other advantages of the application may be realized and attained by the structure particularly pointed out in the written description and drawings.
The technical scheme of the application is further described in detail through the drawings and the embodiments.
Drawings
The accompanying drawings are included to provide a further understanding of the application and are incorporated in and constitute a part of this specification, illustrate the application and together with the embodiments of the application, serve to explain the application. In the drawings:
FIG. 1 is a schematic diagram of an overvoltage protection test apparatus according to an embodiment of the present application;
FIG. 2 is a flowchart illustrating an overvoltage protection test method according to an embodiment of the present application;
fig. 3 is an operation diagram of the transformer device according to the embodiment of the present application.
Detailed Description
The preferred embodiments of the present application will be described below with reference to the accompanying drawings, it being understood that the preferred embodiments described herein are for illustration and explanation of the present application only, and are not intended to limit the present application.
Therefore, the present application proposes an overvoltage protection test device comprising:
the power supply assembly comprises an external power supply and a transformation device, and is used for externally connecting test voltage and adjusting the externally connected test voltage;
preliminary test processor: the device testing method comprises the steps of setting device testing items, and collecting first operation data of different devices in an overvoltage protection circuit;
a matching test processor: the overvoltage protection circuit is used for setting an overvoltage detection item and collecting second operation data of a target circuit protected by the overvoltage protection circuit when the overvoltage protection circuit operates;
overvoltage monitoring component: and the overvoltage protection testing device is used for monitoring and comparing the first operation data with the second operation data to obtain an overvoltage protection testing result.
The working principle of the technical scheme is as follows:
as shown in fig. 1, the application provides a device for detecting an overvoltage protection circuit, firstly, a power supply component is used for providing voltage, the voltage is externally connected, so that the external voltage is regulated, and the voltage is continuously regulated within different voltage intervals, so that a specific test result of the overvoltage protection circuit is obtained.
The primary test processor can detect different components of the overvoltage protection circuit, so that whether each component has faults or not in operation is determined, and first operation data are generated;
the matching test processor is used for detecting overvoltage, and detecting the stability of the target circuit when the overvoltage protection circuit performs overvoltage protection on the target circuit, so as to determine a second detection result;
the overvoltage monitoring component can judge abnormal conditions in the operation process of the overvoltage protection circuit through the first operation data and the second operation data, and generate a detection result of the overvoltage protection circuit.
The beneficial effects of the technical scheme are as follows:
the application can detect the overvoltage protection circuit, determine whether the overvoltage protection circuit is abnormal in operation, and then judge specific operation results of the overvoltage protection circuit and specific performance parameters of the overvoltage protection circuit from the operation state of the protection end-specific protected target circuit.
Specifically, the transformation device comprises:
the first transformation microcontroller is used for acquiring the input quantity and output quantity of the external power supply and the running time of the target circuit; wherein,
the running time is determined according to the duty ratio control time of the voltage transformation microcontroller;
the second transformation microcontroller is used for calculating the feedback value of the target circuit according to the input quantity and output quantity of the external power supply and the running time of the target circuit; wherein,
the feedback value is related to the operational fluctuation of the target circuit;
the third transformation microcontroller is used for taking the feedback value and a preset feedback reference value as the input of a feedback regulation mechanism and performing period regulation of external test voltage; wherein,
the feedback adjustment mechanism corresponds to an adjustment mechanism of the duty cycle control time.
The working principle of the technical scheme is as follows:
as shown in fig. 3, in the present application, the first voltage transformation microcontroller is a sampling controller, and is used for inputting an input quantity of an external power supply, namely, an input electric quantity; output quantity, namely output electric quantity; the overvoltage protection testing device of the application collects input output quantity of the voltage transformation device, circuit loss can exist in the voltage transformation process, and the target circuit which can be protected is not limited to only one target circuit.
The second voltage transformation microcontroller is a calculation microprocessor and is used for calculating whether the overall operation fluctuation of the target circuit, namely, the target circuit protected by the overvoltage protection circuit generates fluctuation when the target circuit operates, wherein the fluctuation is fluctuation related to overvoltage. The feedback value is a calculated value used to characterize whether the target circuit is producing overvoltage fluctuations or the magnitude of the overvoltage value.
The third transformation microcontroller forms a PID regulating mechanism through the feedback value and a preset feedback reference value to realize the period regulation control of the external test voltage, and the test is continuously carried out according to the cycle period to determine the test result; the feedback regulation mechanism corresponds to the regulation mechanism of the control time of the duty ratio, and the feedback regulation mechanism corresponds to the corresponding time of the duty ratio fluctuation, so that when the duty ratio fluctuation exists, the test result of the overvoltage protection circuit is obtained through the voltage protection test device, and whether the overvoltage protection circuit has an overvoltage protection function is judged.
The beneficial effects of the technical scheme are that:
the voltage transformation device can realize the detection of the input and output of an external power supply and the running time of a target circuit, and the overvoltage protection circuit is periodically regulated when the overvoltage protection circuit is detected through the feedback value in the detection process, so that the feedback type continuous detection is realized.
Specifically, the third voltage transformation microcontroller is connected with an interval control circuit; wherein,
the interval control circuit is used for controlling the external power supply to discharge according to a preset feedback reference value and a transformation interval, and stabilizing the transformation voltage of the transformation device within the transformation interval.
The principle of the technical scheme is as follows:
in the application, the interval control circuit controls the external power supply to discharge by determining the transformation interval of the transformation device, and can control the change of different voltages in the period adjustment based on the transformation interval, judge whether the overvoltage protection circuit can protect the target circuit based on different voltages.
The beneficial effects of the technical scheme are that:
the application can provide a power supply for detecting the overvoltage protection circuit, and the target circuit is driven by the power supply.
Preferably, the preliminary test processor includes:
a recording unit: the device data recording circuit is used for recording the device data of different devices in the overvoltage protection circuit; wherein,
the component data comprises component specification data and component operation data;
a connection unit: the device is used for setting connection interfaces to be respectively connected with different components in the overvoltage protection circuit and collecting component operation data; wherein,
a sense amplifier is configured on the connection interface;
and a storage unit: the topology structure diagram is used for storing the component data and generating the topology structure diagram of the component;
test unit: the device testing method comprises the steps of setting operation intervals of different components according to component specification data to form a component testing item;
a first data unit: and the first operation data of different components in the overvoltage protection circuit are respectively acquired according to the device test items.
The working principle of the technical scheme is as follows:
the primary test processor can continuously record the component data in the overvoltage protection circuit, and further collect component operation data of component specification data collection through the component data; and then the induction detection of components is carried out through the connecting unit, the operation data of the components are stored through the storage unit, and then the protection detection of the overvoltage protection circuit is carried out through the device test item.
The beneficial effects of the technical scheme are that:
the application can carry out preliminary detection on the components of the overvoltage protection circuit when the overvoltage protection circuit is detected, and determines the test items to be detected and the initial operation data (first operation data) of the components in the overvoltage protection circuit.
Preferably, the test unit includes:
test setup subunit: the method comprises the steps of responding to input operation based on target operation parameters corresponding to the components to be tested, and obtaining test information of the components to be tested;
script setting subunit: the device testing method comprises the steps of generating device testing items corresponding to a to-be-tested device based on testing information;
interface subunit: the control identification method comprises the steps of carrying out control identification on a graphical user interface of a component to be tested, and carrying out testing on the component to be tested based on the position of a target control obtained by identification and the component to be tested, so as to obtain a testing result of the component to be tested; wherein,
the graphical user interface comprises a control image of the component to be tested;
the test information comprises test logic and execution parameters of each test step forming the test logic; when the execution parameters comprise the execution object, the execution object is a control corresponding to a control image contained in the graphical user interface;
the target control comprises a control corresponding to the execution object.
The working principle of the technical scheme is as follows:
when the method and the device are used for testing, the components are tested to different degrees through the target operation parameters, namely the specific test information of the components, further through the device test items, the specific test results of different components are respectively obtained, and the components can be supervised and tested through different controls of the graphical user interface.
The test setting subunit is used for determining the operation parameters of each component when overvoltage protection is carried out according to each component of the overvoltage protection circuit, determining the test information of each component according to the operation parameters, and further determining the corresponding test items for testing.
The interface subunit can determine different controls on the graphical user interface, control the testing of different components on the overvoltage protection circuit, further execute the testing, and have testing logic during the testing, namely the whole logic testing process.
The beneficial effects of the technical scheme are that:
the application can generate a test interface and test items for detecting the overvoltage protection circuit, and carry out integral logic test according to different specifications of circuit components.
Preferably, the matching test processor includes:
a first curve unit: the method comprises the steps of obtaining an estimated working curve of a target circuit, inputting a comparison coordinate system and forming a first comparison curve;
a second curve unit: when the overvoltage protection circuit is operated, a real-time working curve of the target circuit is obtained, and a comparison coordinate system is input to form a second comparison curve;
fitting comparison unit: the method comprises the steps of performing linear fitting on a first contrast curve and a second contrast curve to determine a fitting difference;
second data unit: for generating second operational data based on the time axis based on the fitted difference.
The working principle of the technical scheme is as follows:
according to the application, the specific operation result of the circuit is determined by performing operation processing on the overvoltage protection circuit and calculating the fitting difference value in a linear fitting mode.
The first curve unit predicts a working curve, which is an operating curve of the target circuit in the process of protecting the target circuit by the overvoltage protection circuit in an ideal state;
the second curve unit is a specific operation curve of the target circuit when the target circuit actually works.
The fitting comparison unit is used for determining whether the overvoltage protection circuit has a protection effect or not when the overvoltage protection circuit is protected under the actual operation and the ideal state.
Preferably, the linear fitting comprises the steps of:
establishing a data gain matrix and a data offset matrix based on the first contrast curve and the second contrast curve relative to a time axis;
according to the data gain matrix and the data offset matrix, a linear equation set for fitting comparison is established;
performing linear fitting based on a least square method to obtain a gain value of each time point of a data gain matrix and an offset value of each time point in a data offset matrix;
and calculating and obtaining a fitting difference value according to the data gain matrix, the data offset matrix and the linear equation set which are obtained by fitting.
The principle of the technical scheme is as follows:
the linear fitting of the application can determine the relative gain and the relative offset between the data gain matrix and the data offset matrix, namely, when the target circuit operates in the actual operation and the ideal state, so that the fitting time difference between the actual state and the ideal state exists or not based on each time point and refined to each time point, and the fitting difference value is judged or not.
The beneficial effects of the technical scheme are that:
the application can determine the operation fitting difference value of the target circuit in the actual operation state and the ideal state, thereby judging whether the overvoltage protection circuit has operation fluctuation or abnormal operation.
Preferably, the overpressure monitoring assembly comprises:
and a component monitoring unit: the device fault judgment method comprises the steps of judging a component fault according to first operation data, and generating a first monitoring result;
target circuit test unit: the voltage stability judgment module is used for judging the voltage stability according to the second operation data to generate a second monitoring result;
a result output unit: the overvoltage protection testing device is used for carrying out overvoltage analysis on the target circuit according to the first monitoring result and the second monitoring result to determine an overvoltage protection testing result; wherein,
the overvoltage protection test result comprises a voltage division section and a voltage stabilizing coefficient of the overvoltage protection circuit.
The principle of the technical scheme is as follows:
the component monitoring unit can judge whether the component of the overvoltage protection circuit has faults or not, and the target circuit testing unit can judge whether the overvoltage protection circuit has voltage fluctuation or not when in operation;
the result output unit can judge the protection coefficient of the overvoltage protection circuit when the overvoltage protection circuit performs overvoltage protection on the target circuit (the voltage division section for performing voltage division protection when the overvoltage protection circuit performs voltage division protection and the voltage division capacity section for performing voltage division protection) and the voltage stabilizing coefficient.
Specifically, the overpressure analysis includes:
determining at least one abnormal monitoring data in the first monitoring result and the second monitoring result;
performing cycle repeated detection on at least one piece of abnormal monitoring data to obtain N key cycle detection results corresponding to the at least one piece of abnormal monitoring data, wherein N is a natural number;
responding to N being larger than 1, respectively performing overvoltage analysis by taking N key period detection results as N alternative analysis scenes to determine an overvoltage analysis result corresponding to the target circuit;
the key period detection result comprises:
determining a plurality of repeated outliers included in the period repeated detection;
acquiring a plurality of circuit simulation waveforms corresponding to the repeated abnormal points respectively;
based on the multiple circuit simulation waveforms, extracting p key clock cycles corresponding to the abnormal monitoring data, and determining an average overvoltage value in the key clock cycles.
The principle of the technical scheme is as follows:
when the overvoltage analysis is carried out, if an overvoltage condition exists in a target circuit, at least one field of detection data is obtained, then the field of data is periodically detected, a scene corresponding to the abnormal detection data is determined, further in the heavy periodic detection process, repeated abnormal points (components with the repeated occurrence of the operation parameters of one field in the overvoltage protection circuit) are judged, so that simulation waveforms and period o of the abnormal detection are determined, an average overvoltage value is determined, the whole overvoltage process is analyzed, the average overvoltage parameter is determined, and the damage of the overvoltage and the overvoltage protection capability of the overvoltage protection circuit are judged.
The beneficial effects of the technical scheme are that:
an overvoltage protection test method, comprising:
the preset voltage transformation device is connected with an external test voltage and used for adjusting the external test voltage;
setting a device test item, and collecting first operation data of different devices in an overvoltage protection circuit;
setting an overvoltage detection item, and collecting second operation data of a target circuit protected by the overvoltage protection circuit when the overvoltage protection circuit operates;
and monitoring and comparing the first operation data with the second operation data to obtain an overvoltage protection test result.
The working principle of the technical scheme is as follows:
as shown in FIG. 2, the application provides a method for detecting an overvoltage protection circuit, which comprises the steps of firstly adjusting external voltage through external voltage and continuously adjusting the voltage in different voltage intervals, thereby obtaining a specific test result of the overvoltage protection circuit.
The primary test processor can detect different components of the overvoltage protection circuit, so that whether each component has faults or not in operation is determined, and first operation data are generated;
the matching test processor is used for detecting overvoltage, and detecting the stability of the target circuit when the overvoltage protection circuit performs overvoltage protection on the target circuit, so as to determine a second detection result;
the overvoltage monitoring component can judge abnormal conditions in the operation process of the overvoltage protection circuit through the first operation data and the second operation data, and generate a detection result of the overvoltage protection circuit.
The beneficial effects of the technical scheme are as follows:
the application can detect the overvoltage protection circuit, determine whether the overvoltage protection circuit is abnormal in operation, and then judge specific operation results of the overvoltage protection circuit and specific performance parameters of the overvoltage protection circuit from the operation state of the protection end-specific protected target circuit.
It will be apparent to those skilled in the art that various modifications and variations can be made to the present application without departing from the spirit or scope of the application. Thus, it is intended that the present application also include such modifications and alterations insofar as they come within the scope of the appended claims or the equivalents thereof.
Claims (10)
1. An overvoltage protection testing device, comprising:
the power supply assembly comprises an external power supply and a transformation device, and is used for externally connecting test voltage and adjusting the externally connected test voltage;
preliminary test processor: the device testing method comprises the steps of setting device testing items, and collecting first operation data of different devices in an overvoltage protection circuit;
a matching test processor: the overvoltage protection circuit is used for setting an overvoltage detection item and collecting second operation data of a target circuit protected by the overvoltage protection circuit when the overvoltage protection circuit operates;
overvoltage monitoring component: and the overvoltage protection testing device is used for monitoring and comparing the first operation data with the second operation data to obtain an overvoltage protection testing result.
2. The overvoltage protection testing device and method according to claim 1, wherein the voltage transformation device comprises:
the first transformation microcontroller is used for acquiring the input quantity and output quantity of an external power supply and the duty ratio of a target circuit;
the second transformation microcontroller is used for calculating a feedback value of the target circuit according to the input quantity and output quantity of the external power supply and the duty ratio of the target circuit; wherein,
the feedback value is related to the operational fluctuation of the target circuit;
the third transformation microcontroller is used for taking the feedback value and a preset feedback reference value as the input of a feedback regulation mechanism and performing period regulation of external test voltage; wherein,
the feedback adjustment mechanism corresponds to an adjustment mechanism of the control time of the duty cycle.
3. The overvoltage protection testing device and method according to claim 2, wherein the third voltage transformation microcontroller is connected with an interval control circuit; wherein,
the interval control circuit is used for controlling the external power supply to discharge according to a preset feedback reference value and a transformation interval of the transformation device, and stabilizing the transformation voltage of the transformation device within the transformation interval.
4. The overvoltage protection testing device and method according to claim 1, wherein said preliminary test handler includes:
a recording unit: the device data recording circuit is used for recording the device data of different devices in the overvoltage protection circuit; wherein,
the component data comprises component specification data and component operation data;
a connection unit: the device is used for setting connection interfaces to be respectively connected with different components in the overvoltage protection circuit and collecting component operation data; wherein,
a sense amplifier is configured on the connection interface;
and a storage unit: the topology structure diagram is used for storing the component data and generating the topology structure diagram of the component;
test unit: the device testing method comprises the steps of setting operation intervals of different components according to component specification data to form a component testing item;
a first data unit: and the first operation data of different components in the overvoltage protection circuit are respectively acquired according to the device test items.
5. The overvoltage protection testing device and method according to claim 4, wherein the testing unit comprises:
test setup subunit: the method comprises the steps of responding to input operation based on target operation parameters corresponding to the components to be tested, and obtaining test information of the components to be tested;
script setting subunit: the device testing method comprises the steps of generating device testing items corresponding to a to-be-tested device based on testing information;
interface subunit: the control identification method comprises the steps of carrying out control identification on a graphical user interface of a component to be tested, and carrying out testing on the component to be tested based on the position of a target control obtained by identification and the component to be tested, so as to obtain a testing result of the component to be tested; wherein,
the graphical user interface comprises a control image of the component to be tested;
the test information comprises test logic and execution parameters of each test step forming the test logic; when the execution parameters comprise the execution object, the execution object is a control corresponding to a control image contained in the graphical user interface;
the target control comprises a control corresponding to the execution object.
6. The overvoltage protection test apparatus and method of claim 1, wherein the match test processor comprises:
a first curve unit: the method comprises the steps of obtaining an estimated working curve of a target circuit, inputting a comparison coordinate system and forming a first comparison curve;
a second curve unit: when the overvoltage protection circuit is operated, a real-time working curve of the target circuit is obtained, and a comparison coordinate system is input to form a second comparison curve;
fitting comparison unit: the method comprises the steps of performing linear fitting on a first contrast curve and a second contrast curve to determine a fitting difference;
second data unit: for generating second operational data based on the time axis based on the fitted difference.
7. The overvoltage protection testing device and method according to claim 6, wherein said linear fitting includes the steps of:
establishing a data gain matrix and a data offset matrix based on the first contrast curve and the second contrast curve relative to a time axis;
according to the data gain matrix and the data offset matrix, a linear equation set for fitting comparison is established;
performing linear fitting based on a least square method to obtain a gain value of each time point of a data gain matrix and an offset value of each time point in a data offset matrix;
and calculating and obtaining a fitting difference value according to the data gain matrix, the data offset matrix and the linear equation set which are obtained by fitting.
8. The overvoltage protection testing device and method according to claim 1, wherein the overvoltage monitoring assembly comprises:
and a component monitoring unit: the device fault judgment method comprises the steps of judging a component fault according to first operation data, and generating a first monitoring result;
target circuit test unit: the voltage stability judgment module is used for judging the voltage stability according to the second operation data to generate a second monitoring result;
a result output unit: the overvoltage protection testing device is used for carrying out overvoltage analysis on the target circuit according to the first monitoring result and the second monitoring result to determine an overvoltage protection testing result; wherein,
the overvoltage protection test result comprises a voltage division section and a voltage stabilizing coefficient of the overvoltage protection circuit.
9. The overvoltage protection testing device and method according to claim 1, wherein the overvoltage analysis comprises:
determining at least one abnormal monitoring data in the first monitoring result and the second monitoring result;
performing cycle repeated detection on at least one piece of abnormal monitoring data to obtain N key cycle detection results corresponding to the at least one piece of abnormal monitoring data, wherein N is a natural number;
responding to N being larger than 1, respectively performing overvoltage analysis by taking N key period detection results as N alternative analysis scenes to determine an overvoltage analysis result corresponding to the target circuit;
the key period detection result comprises:
determining a plurality of repeated outliers included in the period repeated detection;
acquiring a plurality of circuit simulation waveforms corresponding to the repeated abnormal points respectively;
based on the multiple circuit simulation waveforms, extracting p key clock cycles corresponding to the abnormal monitoring data, and determining an average overvoltage value in the key clock cycles.
10. An overvoltage protection test method, comprising:
the preset voltage transformation device is connected with an external test voltage and used for adjusting the external test voltage;
setting a device test item, and collecting first operation data of different devices in an overvoltage protection circuit;
setting an overvoltage detection item, and collecting second operation data of a target circuit protected by the overvoltage protection circuit when the overvoltage protection circuit operates;
and monitoring and comparing the first operation data with the second operation data to obtain an overvoltage protection test result.
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