CN116880398A - Fault analysis method and system of instrument control equipment, electronic equipment and storage medium - Google Patents

Fault analysis method and system of instrument control equipment, electronic equipment and storage medium Download PDF

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Publication number
CN116880398A
CN116880398A CN202310922921.2A CN202310922921A CN116880398A CN 116880398 A CN116880398 A CN 116880398A CN 202310922921 A CN202310922921 A CN 202310922921A CN 116880398 A CN116880398 A CN 116880398A
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configuration
fault
data
analysis
instrument control
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林长青
韩桐
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Beijing Jialian Youkong Technology Co ltd
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Beijing Jialian Youkong Technology Co ltd
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Priority to CN202310922921.2A priority Critical patent/CN116880398A/en
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    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Programme-control systems
    • G05B19/02—Programme-control systems electric
    • G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
    • G05B19/41845—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM] characterised by system universality, reconfigurability, modularity
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/33—Director till display
    • G05B2219/33273—DCS distributed, decentralised controlsystem, multiprocessor

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Automation & Control Theory (AREA)
  • Testing And Monitoring For Control Systems (AREA)

Abstract

The application relates to the technical field of automatic control, and provides a fault analysis method and system of instrument control equipment, electronic equipment and a storage medium. The fault analysis method of the instrument control equipment comprises the following steps: acquiring analysis data of the instrument control equipment; inputting the analysis data into a fault diagnosis model to obtain a fault diagnosis result; under the condition that the fault diagnosis result indicates that the instrument control equipment has faults, analyzing the system configuration based on the configuration information to obtain a configuration analysis result; and outputting a fault analysis result, wherein the fault analysis result comprises a fault diagnosis result and a configuration analysis result. According to the technical scheme, under the condition that the fault of the instrument control equipment is determined based on the analysis data, the system configuration is further analyzed based on the configuration information to obtain the configuration analysis result, and the fault analysis result comprising the fault diagnosis result and the configuration analysis result is output, so that the method can be beneficial to staff in analyzing the cause of the fault, and further can be beneficial to improving the fault processing efficiency.

Description

Fault analysis method and system of instrument control equipment, electronic equipment and storage medium
Technical Field
The application relates to the technical field of automatic control, in particular to a fault analysis method and system of instrument control equipment, electronic equipment and a storage medium.
Background
DCS (Distributed Control System ) is applied to the industries of chemical industry, electric power, nuclear energy and the like. Since the distributed control system generally contains more instrument control devices, how to perform fault monitoring on the instrument control devices in the system is a problem to be solved at present.
In order to perform fault monitoring on the instrument control device, in the related art, an operation parameter of the instrument control device is analyzed and calculated through a fault monitoring system so as to judge whether the instrument control device has a fault or not based on the operation parameter, thereby realizing fault monitoring on the instrument control device.
However, the failure of the instrument control device may be caused by various factors, and the conventional failure monitoring system often cannot determine or remove the cause of the failure of the instrument control device, which makes it difficult to accurately locate the cause of the failure in the failure processing process, thereby causing a problem of low failure processing efficiency.
Disclosure of Invention
In order to help to improve fault processing efficiency, the application provides a fault analysis method, a fault analysis system, electronic equipment and a storage medium of instrument control equipment.
In a first aspect, a fault analysis method of a device for instrument control is provided, which is used in a fault analysis platform, and adopts the following technical scheme:
a fault analysis method of a meter control device, for use in a fault analysis platform, the method comprising:
acquiring analysis data of the instrument control equipment;
inputting the analysis data into a fault diagnosis model to obtain a fault diagnosis result;
under the condition that the fault diagnosis result indicates that the instrument control equipment has faults, analyzing the system configuration based on configuration information to obtain a configuration analysis result, wherein the configuration information is used for indicating the system configuration of the instrument control system to which the instrument control equipment belongs;
and outputting a fault analysis result, wherein the fault analysis result comprises the fault diagnosis result and the configuration analysis result.
By adopting the technical scheme, the fault processing efficiency can be improved, and under the condition that the fault of the instrument control equipment is determined based on the analysis data, the system configuration is further analyzed based on the configuration information to obtain the configuration analysis result, and the fault analysis result comprising the fault diagnosis result and the configuration analysis result is output, so that the fault processing method can be used for helping staff to analyze the cause of the fault by combining the fault diagnosis result and the configuration analysis result in the fault analysis result, and the corresponding fault processing mode can be determined, so that the fault processing efficiency can be improved.
Optionally, the analyzing the system configuration based on the configuration information to obtain a configuration analysis result includes:
determining causal control logic based on the configuration information;
and analyzing the system configuration based on the causal control logic to obtain the configuration analysis result.
In the above embodiment, since the system configuration is analyzed based on the causal control logic in the configuration information, it is helpful to determine whether the causal control logic in the system configuration is abnormal in the case of equipment failure, so that it is helpful to determine the cause of the equipment failure by combining the configuration analysis result, and further it is helpful to improve the failure processing efficiency.
Optionally, the analyzing the system configuration based on the causal control logic to obtain the configuration analysis result includes:
acquiring a logic control strategy;
and analyzing the system configuration based on the causal control logic and the logic control strategy to obtain a configuration analysis result.
By adopting the technical scheme, the system configuration can be analyzed based on the causal control logic and the logic control strategy, so that unreasonable parts in the causal control logic can be found, the reference value of the configuration analysis result can be improved, and the fault processing efficiency can be improved.
Optionally, the analyzing the system configuration based on the configuration information to obtain a configuration analysis result includes:
determining whether the system configuration is abnormal based on the configuration information;
under the condition that the system configuration is determined to be abnormal, determining an abnormality processing suggestion corresponding to the system configuration;
and generating configuration analysis results containing the exception handling suggestions.
By adopting the technical scheme, under the condition that the system configuration is abnormal based on the configuration information, the abnormal processing suggestion corresponding to the system configuration can be determined, the configuration analysis result containing the abnormal processing suggestion is generated, and the fault analysis result contains the configuration analysis result, so that a worker can process the system configuration abnormality together with the abnormal processing suggestion in the fault processing process based on the fault analysis result, thereby being beneficial to improving the reliability of the instrument control system and improving the fault processing efficiency.
Optionally, the acquiring the analysis data of the instrument control device includes:
under the condition that the change of the configuration information of the instrument control system is monitored, determining configuration variable information, wherein the configuration variable information is used for indicating the change condition of the configuration data;
Determining target instrument control equipment based on the configuration variable information;
and acquiring analysis data corresponding to the target instrument control equipment so as to perform fault analysis on the target instrument control equipment.
By adopting the technical scheme, under the condition that the system configuration of the instrument control system is monitored to change, the configuration variable information is determined, the target instrument control equipment is determined based on the configuration variable information, and the target instrument control equipment is subjected to fault analysis, so that equipment faults caused by the system configuration change can be found in time, the equipment faults can be processed in time, and meanwhile, the stability of the instrument control system is improved.
Optionally, the analysis data includes equipment ledger information, and the obtaining analysis data includes:
acquiring original data of the instrument control equipment;
analyzing the original data to obtain equipment data of at least one data type;
and carrying out integrated processing on the equipment data corresponding to the instrument control equipment based on the data type to obtain the equipment ledger information.
In the above technical solution, since the analysis data includes the equipment ledger information, the equipment ledger information is obtained by analyzing the original data of the instrument control equipment according to the data type and performing integrated processing on the analyzed equipment data according to the data type, the original data can be processed according to the data type to obtain the ledger information, and thus fault analysis can be performed on the instrument control equipment based on the ledger information conveniently.
Optionally, the analysis data includes equipment ledger information and equipment status information, and the inputting the analysis data into a fault diagnosis model to obtain a fault diagnosis result includes:
inputting the equipment account information and the equipment state information into a fault diagnosis model to obtain the fault diagnosis result;
the fault diagnosis model is established based on model data, the model data comprises at least one group of sample data and fault diagnosis results corresponding to the sample data, and the sample data comprises sample ledger information and sample state information.
In the above technical solution, since the analysis data includes the equipment ledger information and the equipment status information, and the sample data used in the fault diagnosis model establishment process includes the sample ledger information and the sample status information, in the fault diagnosis process, the fault diagnosis model can combine the static information and the dynamic information of the instrument control equipment to perform fault analysis on the instrument control equipment, thereby being beneficial to improving the accuracy of fault judgment.
In a second aspect, a fault analysis system of a device is provided, and the following technical scheme is adopted:
the fault analysis system of the instrument control equipment comprises a data acquisition module, a fault analysis module and a data output module;
The data acquisition module is used for acquiring data information of the instrument control equipment in the instrument control system and sending the data information to the fault analysis module;
the fault analysis module is used for executing the fault analysis method of any instrument control equipment provided in the first aspect and sending a fault analysis result to the data output module;
and the data output module is used for outputting the fault analysis result.
In a third aspect, an electronic device is provided, which adopts the following technical scheme:
an electronic device, the electronic device comprising:
at least one processor;
a memory;
at least one application program, wherein the at least one application program is stored in the memory and configured to be executed by the at least one processor, the at least one application program configured to: and executing the fault analysis method of any one of the instrument control devices provided in the first aspect.
In a fourth aspect, a computer readable storage medium is provided, where the following technical solutions are adopted:
a computer-readable storage medium having stored thereon a computer program which, when executed in a computer, causes the computer to perform the fault analysis method of any one of the instrument control devices provided in the first aspect.
In summary, the present application includes at least one of the following beneficial technical effects:
1. the method can help to improve the fault processing efficiency, and can help staff to analyze the cause of the fault by combining the fault diagnosis result and the configuration analysis result in the fault analysis result because the configuration analysis result containing the fault diagnosis result and the configuration analysis result is output by further analyzing the system configuration based on the configuration information under the condition that the fault exists in the instrument control equipment based on the analysis data, so that the corresponding fault processing mode can be determined, and further the fault processing efficiency can be improved.
2. Under the condition that the system configuration is abnormal based on the configuration information, an abnormal processing suggestion corresponding to the system configuration is determined, and a configuration analysis result comprising the abnormal processing suggestion is generated, wherein the fault analysis result comprises the configuration analysis result, so that a worker can process the system configuration abnormality together with the abnormal processing suggestion in the fault processing process based on the fault analysis result, thereby being beneficial to improving the reliability of the instrument control system and improving the fault processing efficiency.
Drawings
Fig. 1 is a schematic structural diagram of a fault analysis system of a meter control device according to an embodiment of the present application;
fig. 2 is a flow chart of a fault analysis method of the instrument control device provided by the embodiment of the application;
FIG. 3 is a flow chart illustrating a configuration information analysis method according to an embodiment of the present application;
FIG. 4 is a flow chart illustrating another configuration information analysis method according to an embodiment of the present application;
FIG. 5 is a schematic flow chart of a determining manner of a target instrument control device according to an embodiment of the present application;
fig. 6 is a schematic structural diagram of an electronic device according to an embodiment of the present application.
Reference numerals illustrate: 110. a data acquisition module; 120. a fault analysis module; 130. and a data output module.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the present application will be further described in detail with reference to the accompanying drawings 1 to 6 and examples. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the application.
An embodiment of the present application provides a fault analysis system of a device for controlling a meter, referring to fig. 1, the fault analysis system of the device for controlling a meter includes: a data acquisition module 110, a fault analysis module 120, and a data output module 130.
The data acquisition module 110 is configured to acquire data information of the instrument control device, and send the data information to the fault analysis module 120.
Wherein, the appearance accuse equipment has control function. In one example, the meter control device comprises a smart meter. In actual implementation, the device for controlling an instrument further includes other devices, such as: the type of the device is not limited in this embodiment.
Optionally, the data information of the instrument control device may be obtained from the instrument control device and/or a control device of an instrument control system to which the instrument control device belongs, where the instrument control system may use DCS.
In one example, the data acquisition module 110 may be implemented as a gateway, and accordingly, the data acquisition module 110 is in signal connection with a control device of the instrument control device and/or the instrument control system. In practical implementation, the data acquisition module 110 may be implemented as other modules that can perform data transmission, and the implementation of the data acquisition module 110 is not limited in this embodiment.
The fault analysis module 120 is configured to analyze the data information sent by the data acquisition module 110 based on a fault analysis method of the device under control, and feed back a fault analysis result to the data output module 130.
The failure analysis module 120 is a module having a calculation function and an information transmission function. Alternatively, the fault analysis module 120 may be a server, a personal computer, a microcontroller, or the like, and the implementation of the fault analysis module 120 is not limited in this embodiment.
The data output module 130 is configured to output the fault analysis result sent by the fault analysis module 120. In one example, the data output module 130 provides a display interface, at which point the data output module 130 may output the failure analysis results directly through the display interface. In another example, the data output module 130 includes a communication component, where the data output module 130 may send the failure analysis result to other devices through the communication component for presentation by the other devices, and the data output manner of the data output module 130 is not limited in this embodiment.
In actual implementation, the fault analysis system may further include other modules, such as: the fault database module for recording fault data is not limited to the type of module actually included in the fault analysis system in this embodiment.
The embodiment of the application provides a fault analysis method of a device for instrument control, which is used in a fault analysis platform, wherein the fault analysis platform can be operated in a fault analysis module in the fault analysis system shown in fig. 1, or can also be operated in a control device of the instrument control system, or can also be operated in other electronic devices, and the embodiment is not limited to the above.
Referring to fig. 2, the fault analysis method of the instrument control device includes the steps of:
in step 201, analysis data of the instrument is acquired.
The analysis data are used for carrying out fault analysis on the instrument control equipment. Specifically, the analysis data may be obtained from a device for controlling a meter, or may also be obtained from a system for controlling a meter (for example, DCS) to which the device for controlling a meter belongs, and the data source of the analysis data is not limited in this embodiment.
Optionally, the analysis data of the instrument control device includes device standing book information, where the device standing book information is used to reflect basic information, i.e. static information, of the instrument control device. In one example, the device ledger information includes information such as a name, model, version, installation time, home system, home controller, home IO card, health index, and/or configuration of the device under control. Further, the analysis data may further include a change condition of the equipment ledger information, for example: and changing the configuration information.
In one example, obtaining analysis data includes: acquiring original data of the instrument control equipment; analyzing the original data to obtain equipment data of at least one data type; and carrying out integrated processing on equipment data corresponding to the instrument control equipment based on the data type to obtain equipment account information.
Because the types and/or models of the instrument control devices may be different, the acquisition channels of the original data may also be different, so that the data formats of the original data may be various, and therefore, in the process of analyzing the original data, the analysis mode corresponding to the original data can be determined based on the device information of the instrument control devices and/or the acquisition channels of the original data, in the process of analyzing the data, the analysis mode corresponding to the original data can be used for analyzing the original data, and further, the accuracy of the device data obtained by analyzing the original data can be improved.
In addition, as the content contained in the original data corresponding to different instrument control devices may be different, the data types of the device data obtained by analyzing the original data of the different instrument control devices may be various, so that only the device data with the specified data types can be integrated according to the actual analysis requirement in the process of carrying out the integrated processing on the data corresponding to the instrument control devices, the content of the integrated device account information can be controlled, and the fault analysis on the device based on the device account information is facilitated. Furthermore, the designated data types corresponding to the different types of the instrument control devices can be independently set, so that the analysis data of the instrument control devices can be conveniently obtained by combining the actual conditions of the different types of the instrument control devices.
In the above technical solution, since the analysis data includes the equipment ledger information, the equipment ledger information is obtained by analyzing the original data of the instrument control equipment according to the data type and performing integrated processing on the analyzed equipment data according to the data type, the original data can be processed according to the data type to obtain the ledger information, and thus fault analysis can be performed on the instrument control equipment based on the ledger information conveniently.
In other examples, the device ledger information may also be directly obtained from the instrument control device or the instrument control system, and the method of obtaining the device ledger information is not limited in this embodiment.
Optionally, the analysis data includes device status information, which is used to indicate the operation status of the instrument control device, i.e. dynamic information. In one example, the device state information includes: communication state of the instrument control equipment, equipment diagnosis information, fault information, alarm information and/or other information.
In one example, the fault analysis platform can automatically obtain the analysis data of all or a designated part of the instrument control devices in the instrument control system at regular intervals, so that the automatic inspection of the instrument control devices can be facilitated, the actual conditions of the instrument control devices can be monitored, and the timely discovery of faults of the instrument control devices can be facilitated.
In one example, the fault analysis platform acquires the analysis data of all or a designated part of the instrument control devices in the instrument control system one by one, and sequentially analyzes the acquired analysis data, so that the calculation resources occupied by fault analysis can be reduced, the problem of excessive resources occupied when the analysis information of each instrument control device is uniformly acquired and analyzed can be avoided, and the requirement of the fault analysis method on the device performance can be further reduced.
And 202, inputting analysis data into a fault diagnosis model to obtain a fault diagnosis result.
Wherein the fault diagnosis model is pre-established.
The fault diagnosis result includes whether the instrument control device has a fault. Optionally, in the case that the fault of the instrument control device is diagnosed, the diagnosis result may further include a fault type of the instrument control device, for example: electromechanical faults, electrical faults, signal faults, computer faults and the like, so that equipment faults can be conveniently processed based on fault diagnosis results.
Alternatively, the fault diagnosis model may be constructed based on a mathematical model, such as: the method is constructed based on a parameter estimation method, a state estimation method or an equivalent space method, or can be constructed based on a neural network model, or can be constructed based on other modes, and the construction mode of the fault diagnosis model is not limited in this embodiment.
In one example, the analysis data includes equipment ledger information and equipment status information, and inputting the analysis data into a fault diagnosis model to obtain a fault diagnosis result includes: and inputting the equipment account information and the equipment state information into a fault diagnosis model to obtain a fault diagnosis result.
Accordingly, the fault diagnosis model is built based on model data, the model data comprises at least one group of sample data and fault diagnosis results corresponding to the sample data, and the sample data comprises sample ledger information and sample state information.
In one example, the fault diagnosis model is a diagnosis data set constructed based on a large amount of sample data, in the process of performing fault diagnosis, whether the instrument control device has faults or not can be determined based on the matching degree of analysis data and diagnosis data in the diagnosis data set, and meanwhile, the diagnosis data set can be continuously enriched in the use process, so that the reliability of the fault diagnosis model can be continuously improved.
In the above technical solution, since the analysis data includes the equipment ledger information and the equipment status information, and the sample data used in the fault diagnosis model establishment process includes the sample ledger information and the sample status information, in the fault diagnosis process, the fault diagnosis model can combine the static information and the dynamic information of the instrument control equipment to perform fault analysis on the instrument control equipment, thereby being beneficial to improving the accuracy of fault judgment.
Further, since the instrument control device may have a fault self-checking function, the analysis data may include fault information, and the fault diagnosis method based on the fault diagnosis model includes: determining whether fault information exists in the analysis data; in the case of fault information in the analysis data, determining a fault diagnosis result directly based on the fault information, or further verifying the fault information based on other data to determine a fault diagnosis result; and under the condition that no fault information exists in the analysis data, obtaining a fault diagnosis result based on the analysis of the analysis data.
Step 203, analyzing the system configuration based on the configuration information to obtain a configuration analysis result when the fault diagnosis result indicates that the instrument control device has a fault.
The configuration information is used for indicating the system configuration of the instrument control system to which the instrument control equipment belongs, and the instrument control system comprises at least one instrument control equipment.
The configuration analysis result is used for indicating whether the system configuration is abnormal or not. Further, in the case that it is determined that the system configuration is abnormal, the configuration analysis result may further include an abnormal position, for example: the abnormal point position can be convenient for processing the equipment faults based on the configuration analysis result.
In one example, an abnormal condition that may occur in the system configuration is preset. In one example, the abnormal condition of the system configuration is set based on causal control logic between different types of instrument control devices. Such as: under the condition that some instrument control equipment needing association control does not have association control, determining system configuration abnormality; and, for example: and under the condition that the association control relation between the instrument control devices is wrong, determining that the system configuration is abnormal.
In one example, the configuration information includes a configuration monolith, a configuration point number, and/or detailed information of each point of the configuration.
Accordingly, the configuration information may be obtained by analyzing raw data obtained from the control device and/or the control device of the control system, for example: the configuration information of the instrument control system is determined by combining the configuration conditions of the instrument control devices, or the configuration information can be directly obtained from the control device and/or the instrument control device of the instrument control system, for example: the control device of the instrument control system records configuration information, and the embodiment does not limit the acquisition mode of the configuration information.
In one example, the configuration information is dynamically updated. In one example, when the fault diagnosis result indicates that the instrument control device has a fault, the configuration information is obtained again, so that the accuracy of the configuration analysis result can be improved. In actual implementation, the configuration information may be updated periodically or otherwise, and the embodiment does not limit the updating manner of the configuration information.
The equipment fault is possibly caused by improper system configuration setting of the instrument control system, at the moment, if the failed instrument control equipment is simply maintained or replaced in the fault processing process, the reason for the equipment fault cannot be solved from the root, and the instrument control equipment is still easy to fail.
And 204, outputting a fault analysis result, wherein the fault analysis result comprises a fault diagnosis result and a configuration analysis result.
In one example, the fault analysis platform provides a user interaction interface, at which point the fault analysis results may be output directly through the user interaction interface.
In one example, the fault analysis platform may output an overall overview of the instrument control system and the instrument control devices in the instrument control system. Specifically, the fault analysis platform provides an information display interface for displaying the system configuration of the instrument control system, the service condition of the instrument control equipment, the fault diagnosis result and the configuration analysis result. Furthermore, the information display interface is also used for displaying data such as network communication states among devices inside the instrument control system, communication states between the instrument control system and third-party devices, power management of the instrument control system, temperature monitoring information and the like, so that the overall knowledge of the state information of the whole instrument control system can be facilitated. In actual implementation, the content displayed on the information display interface may be set according to actual needs, and the embodiment does not limit the content indicated on the information display interface.
In actual implementation, the information display interface can also display analysis data of the instrument control equipment and change conditions of the analysis data, so that the state of the instrument control equipment can be monitored conveniently.
In another example, outputting the failure analysis result includes: and sending a fault analysis result to the target equipment. The target device may be a device corresponding to an administrator and/or an operator of the device for controlling the device, so that a worker may be prompted to timely process a fault of the device for controlling the device.
The implementation principle of the fault analysis method of the instrument control equipment provided by the embodiment is as follows: acquiring analysis data of the instrument control equipment; inputting the analysis data into a fault diagnosis model to obtain a fault diagnosis result; under the condition that the fault diagnosis result indicates that the instrument control equipment has faults, analyzing the system configuration based on configuration information to obtain a configuration analysis result, wherein the configuration information is used for indicating the system configuration of the instrument control system to which the instrument control equipment belongs; and outputting a fault analysis result, wherein the fault analysis result comprises a fault diagnosis result and a configuration analysis result. By adopting the technical scheme, the fault processing efficiency can be improved, and under the condition that the fault of the instrument control equipment is determined based on the analysis data, the system configuration is further analyzed based on the configuration information to obtain the configuration analysis result, and the fault analysis result comprising the fault diagnosis result and the configuration analysis result is output, so that the fault processing method can be used for helping staff to analyze the cause of the fault by combining the fault diagnosis result and the configuration analysis result in the fault analysis result, and the corresponding fault processing mode can be determined, so that the fault processing efficiency can be improved.
In some embodiments, referring to fig. 3, in step 203, the system configuration is analyzed based on the configuration information to obtain a configuration analysis result, which includes the following steps:
step 301, determining causal control logic based on configuration information.
The cause and effect control logic is used for indicating the association relation of different instrument control devices in control, and the cause and effect control logic is recorded in the configuration information. In one example, the cause and effect control logic is determined based on interlock logic between the instrument control devices.
In one example, determining the cause and effect control logic based on the configuration information includes: causal control logic associated with the malfunctioning instrument is determined based on the configuration information. This may help reduce the amount of causal control logic used for analysis.
In one example, the cause and effect control logic associated with the control device is determined based on a configuration of the control device.
Further, determining causal control logic based on the configuration information, comprising: a causal logic strategy associated with the faulty instrument and causal control logic associated with the associated instrument of the faulty instrument are determined based on the configuration information.
The associated instrument control equipment refers to other instrument control equipment with an association relationship with the instrument control equipment. The association relationship between the instrument control devices can be determined based on factors such as the type and the deployment position of the instrument control devices, and can also be preset, and the embodiment does not limit the determination mode of the association relationship between the instrument control devices.
Because the causal control logic corresponding to other instrument control devices except the instrument control device can influence the working state of the instrument control device, the causal control logic related to the associated instrument control device of the instrument control device with the fault is analyzed together, and the accuracy of the configuration analysis result can be improved.
In practical implementation, all the cause and effect control logic in the instrument control system may be determined based on the configuration information, and the scope of the cause and effect control logic is not limited in this embodiment.
Step 302, analyzing the system configuration based on the causal control logic to obtain a configuration analysis result.
Optionally, analyzing the system configuration based on the causal control logic to obtain a configuration analysis result, including: acquiring a logic control strategy; and analyzing the system configuration based on the causal control logic and the logic control strategy to obtain a configuration analysis result.
Wherein, the logic control strategy is preset. In one example, the logic control strategy is extracted from system configuration design specifications and/or configuration information corresponding to the template instrumentation system. In actual implementation, the logic control strategy can be continuously updated and perfected in the actual use process, so that the reference value of the logic control strategy can be further improved.
In one example, analyzing the system configuration based on causal control logic and logic control strategy to obtain configuration analysis results includes: for each cause and effect control logic, determining whether the cause and effect control logic meets a logic control strategy; and generating a configuration analysis result corresponding to the configuration abnormality under the condition that the causal control logic which does not accord with the logic control strategy exists.
Optionally, in the case that there is a causal control logic that does not comply with the logical control strategy, the causal control logic that does not comply with the logical control strategy is recorded in the configuration analysis result, which may facilitate adjustment of the causal control logic that does not comply with the logical control strategy based on the configuration analysis result.
In the technical scheme, the system configuration can be analyzed based on the causal control logic and the logic control strategy, so that unreasonable parts in the causal control logic can be found, the reference value of the configuration analysis result can be improved, and the fault processing efficiency can be improved.
In practical implementation, the system configuration may be analyzed based on other methods, and the embodiment is not limited to the method of analyzing the system configuration based on the causal logic.
In the above embodiment, since the system configuration is analyzed based on the causal control logic in the configuration information, it is helpful to determine whether the causal control logic in the system configuration is abnormal in the case of equipment failure, so that it is helpful to determine the cause of the equipment failure by combining the configuration analysis result, and further it is helpful to improve the failure processing efficiency.
In some embodiments, referring to fig. 4, in step 203, the system configuration is analyzed based on the configuration information to obtain a configuration analysis result, which includes the following steps:
step 401, determining whether there is an abnormality in the system configuration based on the configuration information.
In an example, referring to the above steps 301 and 302, the method for determining whether the system configuration is abnormal based on the configuration information is not described herein.
In another example, determining whether an anomaly exists in the system configuration based on the configuration information includes: determining whether causal control logic is absent in the system configuration based on the logic control strategy and the configuration information; and under the condition that the system configuration is determined to lack causal control logic, determining that the system configuration is abnormal.
In actual implementation, whether the system configuration is abnormal may be determined based on other manners, which is not limited in this embodiment.
In step 402, if it is determined that the system configuration is abnormal, an abnormality processing suggestion corresponding to the system configuration is determined.
In one example, the system configuration exception is determined if the causal control logic and the logical control policy in the configuration information are not identical, and determining the exception handling suggestion corresponding to the system configuration includes: it is suggested to delete causal control logic that does not comply with the logical control strategy.
In another example, the system configuration exception is determined in the absence of causal control logic in the system configuration, at which point an exception handling recommendation corresponding to the system configuration is determined, comprising: it is suggested to add causal control logic between configuration points lacking causal control logic. Further, exception handling suggestions also include suggesting types of causal logic that are added.
In actual implementation, the exception handling suggestions corresponding to the system configuration may be determined based on other manners, and the determination manner of the exception handling suggestions is not limited in this embodiment.
In step 403, a configuration analysis result including the exception handling suggestion is generated.
In the technical scheme, whether the system configuration is abnormal or not is determined in the process of analyzing the system configuration based on the configuration information, and the abnormal processing suggestion corresponding to the system configuration is determined under the condition that the system configuration is abnormal, so that a configuration analysis result containing the abnormal processing suggestion is generated, and the fault analysis result contains the configuration analysis result, so that a worker can process the system configuration abnormality together with the abnormal processing suggestion in the process of processing the fault based on the fault analysis result, thereby being beneficial to improving the reliability of the instrument control system and improving the fault processing efficiency.
In some embodiments, optionally, referring to fig. 5, step 101, obtaining analysis data of the instrument control device includes the steps of:
in step 501, under the condition that the configuration information of the instrument control system is monitored to change, the configuration variable information is determined.
The configuration variable information is used for indicating the change condition of the system configuration. In one example, the configuration variable information is represented by configuration points.
Optionally, the fault analysis method of the instrument control device further includes: acquiring real-time configuration information; and comparing the real-time configuration information with the reference configuration information to obtain a monitoring result.
The monitoring result is used for indicating whether the configuration information of the instrument control system changes or not.
The reference configuration information is maintained by the fault analysis platform. In one example, the reference configuration information is determined for an initial configuration information of the instrument control system or a configuration information obtained by a last update.
In one example, comparing the real-time configuration information with the reference configuration information includes: and comparing the configuration point positions in the real-time configuration information with the configuration point positions in the reference configuration information.
In one example, comparing the configuration point locations in the real-time configuration information with the configuration point locations in the reference configuration information includes: determining whether the configuration points in the real-time configuration information are the same as the configuration points in the reference configuration information; and under the condition that the configuration points in the real-time configuration information are different from the configuration points in the reference configuration information, determining that the configuration information of the instrument control system is changed.
Further, comparing the configuration point in the real-time configuration information with the configuration point in the reference configuration information, further includes: under the condition that the configuration points in the real-time configuration information are the same as the configuration points in the reference configuration information, determining whether the configuration points in the real-time configuration information correspond to the configuration points in the reference configuration information; and under the condition that the configuration point positions in the real-time configuration information do not correspond to the configuration point positions in the reference configuration information, determining that the configuration information of the instrument control system changes.
Correspondingly, determining the configuration variable information comprises: and determining newly added and/or deleted configuration points in the real-time configuration information.
In another example, comparing the real-time configuration information with the reference configuration information includes: and comparing the cause and effect control logic in the real-time configuration information with the cause and effect control logic in the reference configuration information. Optionally, the comparing method of the cause and effect control logic is the same as that of the configuration point, and this embodiment is not described herein again.
Correspondingly, determining the configuration variable information comprises: and determining configuration points corresponding to the newly added and/or deleted causal control logic in the real-time configuration information.
In actual implementation, the configuration change condition of the control system may also be monitored in other manners, for example: the configuration change condition of the instrument control system is monitored based on the configuration change information transmitted by the control equipment of the instrument control system, and the monitoring mode of the configuration information is not limited in the embodiment.
Step 502, determining a target instrument control device based on the configuration variable information.
In one example, determining a target instrument based on configuration information includes: and determining the instrument control equipment corresponding to the newly added configuration point in the real-time configuration information as target instrument control equipment, and/or determining the instrument control equipment corresponding to the configuration point associated with the configuration point deleted in the real-time configuration information as target instrument control equipment.
In another example, determining a target instrument based on configuration information includes: and determining the instrument control equipment corresponding to the configuration point position corresponding to the new and/or deleted causal control logic in the real-time configuration information as target instrument control equipment.
In actual implementation, other instruments related to the configuration variable information may be determined as the target instrument, and the determining manner of the target instrument is not limited in this embodiment.
Step 503, obtaining analysis data corresponding to the target device to perform fault analysis on the target device, i.e. executing steps 202 to 204.
In one example, obtaining analysis data corresponding to a target instrument includes: and acquiring analysis data corresponding to the target instrument control equipment for a plurality of times at preset time intervals, and performing fault analysis on the target instrument control equipment based on the analysis data after the analysis data are acquired each time. Because the influence of the system configuration change on the instrument control equipment may be accumulated along with time, the analysis data corresponding to the target instrument control equipment is acquired for multiple times at preset time intervals, which can help to accurately analyze the influence of the configuration change on the target instrument control equipment, and thus can help to discover equipment faults caused by the system configuration change in time.
Since the system configuration of the control system is usually designed in a standardized manner, a change in the system configuration of the control system may cause a change in the device state of the related control device in the control system, or even cause a failure of the control device. Based on this, in the above embodiment, under the condition that the system configuration of the instrument control system is monitored to change, the configuration variable information is determined, the target instrument control device is determined based on the configuration variable information, and the fault analysis is performed on the target instrument control device, so that the device fault caused by the system configuration change can be found in time, the device fault can be processed in time, and meanwhile, the stability of the instrument control system can be improved.
The embodiment of the present application further provides an electronic device, in an example, the electronic device is the fault analysis module 120 in the fault analysis system of the instrument control device shown in fig. 1, and in actual implementation, the electronic device may also be implemented as other devices, where the embodiment does not limit the type of the electronic device. As shown in fig. 6, the electronic device 600 shown in fig. 6 includes: a processor 601 and a memory 603. The processor 601 is coupled to a memory 603, such as via a bus 602. Optionally, the electronic device 600 may also include a transceiver 604. It should be noted that, in practical applications, the transceiver 604 is not limited to one, and the structure of the electronic device 600 is not limited to the embodiment of the present application.
The processor 601 may be a CPU (Central Processing Unit ), general purpose processor, DSP (Digital Signal Processor, data signal processor), ASIC (Application Specific Integrated Circuit ) or other programmable logic device, transistor logic device, hardware component, or any combination thereof. Which may implement or perform the various exemplary logic blocks, modules and circuits described in connection with this disclosure. The processor 601 may also be a combination that performs computing functions, such as including one or more microprocessors, a combination of a DSP and a microprocessor, and the like.
Bus 602 may include a path to transfer information between the components. Bus 602 may be a PCI (Peripheral Component Interconnect, peripheral component interconnect Standard) bus or an EISA (Extended Industry Standard Architecture ) bus, or the like. The bus 602 may be classified as an address bus, a data bus, or the like. For ease of illustration, only one thick line is shown in fig. 6, but not only one bus or one type of bus.
The Memory 603 may be, but is not limited to, ROM (Read Only Memory) or other type of static storage device that can store static information and instructions, RAM (Random Access Memory ) or other type of dynamic storage device that can store information and instructions, EEPROM (Electrically Erasable Programmable Read Only Memory ), magnetic disk storage or other magnetic storage device, or any other medium that can be used to carry or store desired program code in the form of instructions or data structures and that can be accessed by a computer.
The memory 603 is used for storing application program codes for executing the inventive arrangements and is controlled to be executed by the processor 601. The processor 601 is arranged to execute application code stored in the memory 603 for implementing what is shown in the foregoing method embodiments.
Among them, electronic devices include, but are not limited to: mobile terminals such as mobile phones, notebook computers, PDAs (personal digital assistants), PADs (tablet computers), and the like, and fixed terminals such as digital TVs, desktop computers, and the like. And may also be a server, etc. The electronic device shown in fig. 6 is only an example and should not be construed as limiting the functionality and scope of use of the embodiments of the application.
The embodiment of the application also provides a computer readable storage medium, on which a computer program is stored, which when executed in a computer, causes the computer to execute the fault analysis method of the instrument control device provided in the above embodiment.
It should be understood that, although the steps in the flowcharts of the figures are shown in order as indicated by the arrows, these steps are not necessarily performed in order as indicated by the arrows. The steps are not strictly limited in order and may be performed in other orders, unless explicitly stated herein.
The foregoing is only a partial embodiment of the present application, and it should be noted that it will be apparent to those skilled in the art that modifications and adaptations can be made without departing from the principles of the present application, and such modifications and adaptations should and are intended to be comprehended within the scope of the present application.

Claims (10)

1. A fault analysis method for a device controlled by a meter, the method being used in a fault analysis platform and comprising:
acquiring analysis data of the instrument control equipment;
inputting the analysis data into a fault diagnosis model to obtain a fault diagnosis result;
under the condition that the fault diagnosis result indicates that the instrument control equipment has faults, analyzing the system configuration based on configuration information to obtain a configuration analysis result, wherein the configuration information is used for indicating the system configuration of the instrument control system to which the instrument control equipment belongs;
and outputting a fault analysis result, wherein the fault analysis result comprises the fault diagnosis result and the configuration analysis result.
2. The method of claim 1, wherein analyzing the system configuration based on the configuration information to obtain a configuration analysis result comprises:
determining causal control logic based on the configuration information;
and analyzing the system configuration based on the causal control logic to obtain the configuration analysis result.
3. The method of claim 2, wherein the analyzing the system configuration based on the cause and effect control logic to obtain the configuration analysis result comprises:
Acquiring a logic control strategy;
and analyzing the system configuration based on the causal control logic and the logic control strategy to obtain a configuration analysis result.
4. The method of claim 1, wherein analyzing the system configuration based on the configuration information to obtain a configuration analysis result comprises:
determining whether the system configuration is abnormal based on the configuration information;
under the condition that the system configuration is determined to be abnormal, determining an abnormality processing suggestion corresponding to the system configuration;
and generating configuration analysis results containing the exception handling suggestions.
5. The method of claim 1, wherein the obtaining analysis data for the controlled device comprises:
under the condition that the change of the configuration information of the instrument control system is monitored, determining configuration variable information, wherein the configuration variable information is used for indicating the change condition of the configuration data;
determining target instrument control equipment based on the configuration variable information;
and acquiring analysis data corresponding to the target instrument control equipment so as to perform fault analysis on the target instrument control equipment.
6. The method of claim 1, wherein the analysis data comprises device ledger information, and the obtaining analysis data comprises:
Acquiring original data of the instrument control equipment;
analyzing the original data to obtain equipment data of at least one data type;
and carrying out integrated processing on the equipment data corresponding to the instrument control equipment based on the data type to obtain the equipment ledger information.
7. The method of claim 1, wherein the analysis data includes equipment ledger information and equipment status information, and wherein the inputting the analysis data into the fault diagnosis model to obtain the fault diagnosis result includes:
inputting the equipment account information and the equipment state information into a fault diagnosis model to obtain the fault diagnosis result;
the fault diagnosis model is established based on model data, the model data comprises at least one group of sample data and fault diagnosis results corresponding to the sample data, and the sample data comprises sample ledger information and sample state information.
8. A fault analysis system of a meter control device, wherein the fault analysis system comprises a data acquisition module (110), a fault analysis module (120) and a data output module (130);
the data acquisition module (110) is used for acquiring data information of the instrument control equipment in the instrument control system and sending the data information to the fault analysis module (120);
The fault analysis module (120) is configured to perform the fault analysis method of the instrument control device according to any one of claims 1 to 7, and send a fault analysis result to the data output module (130);
the data output module (130) is used for outputting the fault analysis result.
9. An electronic device, the electronic device comprising:
at least one processor;
a memory;
at least one application program, wherein the at least one application program is stored in the memory and configured to be executed by the at least one processor, the at least one application program configured to: a fault analysis method of the instrument control device according to any one of claims 1 to 7 is performed.
10. A computer-readable storage medium having stored thereon a computer program, characterized in that the computer program, when executed in a computer, causes the computer to execute the fault analysis method of the instrument control device according to any one of claims 1 to 7.
CN202310922921.2A 2023-07-25 2023-07-25 Fault analysis method and system of instrument control equipment, electronic equipment and storage medium Pending CN116880398A (en)

Priority Applications (1)

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CN202310922921.2A CN116880398A (en) 2023-07-25 2023-07-25 Fault analysis method and system of instrument control equipment, electronic equipment and storage medium

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202310922921.2A CN116880398A (en) 2023-07-25 2023-07-25 Fault analysis method and system of instrument control equipment, electronic equipment and storage medium

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CN116880398A true CN116880398A (en) 2023-10-13

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