CN116734903B - Test method and device - Google Patents
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- CN116734903B CN116734903B CN202211285078.3A CN202211285078A CN116734903B CN 116734903 B CN116734903 B CN 116734903B CN 202211285078 A CN202211285078 A CN 202211285078A CN 116734903 B CN116734903 B CN 116734903B
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- 238000010998 test method Methods 0.000 title claims description 34
- 238000012360 testing method Methods 0.000 claims abstract description 599
- 230000006870 function Effects 0.000 claims abstract description 145
- 238000000034 method Methods 0.000 claims abstract description 70
- 230000008569 process Effects 0.000 claims abstract description 26
- 230000003993 interaction Effects 0.000 claims abstract description 18
- 230000004044 response Effects 0.000 claims abstract description 9
- 238000007689 inspection Methods 0.000 claims description 33
- 230000015654 memory Effects 0.000 claims description 14
- 238000010521 absorption reaction Methods 0.000 claims description 10
- 238000013461 design Methods 0.000 claims description 10
- 238000003860 storage Methods 0.000 claims description 4
- 238000004590 computer program Methods 0.000 claims description 3
- 230000007613 environmental effect Effects 0.000 claims description 3
- 230000005484 gravity Effects 0.000 description 28
- 238000012545 processing Methods 0.000 description 23
- 238000010586 diagram Methods 0.000 description 17
- 238000004891 communication Methods 0.000 description 16
- 238000012544 monitoring process Methods 0.000 description 16
- 238000007726 management method Methods 0.000 description 13
- 230000009471 action Effects 0.000 description 12
- 238000010295 mobile communication Methods 0.000 description 12
- 238000003825 pressing Methods 0.000 description 11
- 238000013459 approach Methods 0.000 description 8
- 238000005286 illumination Methods 0.000 description 8
- 230000001133 acceleration Effects 0.000 description 7
- 238000004519 manufacturing process Methods 0.000 description 7
- 230000008859 change Effects 0.000 description 4
- 239000002184 metal Substances 0.000 description 4
- 238000004458 analytical method Methods 0.000 description 3
- 238000002955 isolation Methods 0.000 description 3
- 230000033001 locomotion Effects 0.000 description 3
- 229920001621 AMOLED Polymers 0.000 description 2
- 238000013528 artificial neural network Methods 0.000 description 2
- 230000003416 augmentation Effects 0.000 description 2
- 238000004364 calculation method Methods 0.000 description 2
- 239000003990 capacitor Substances 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 230000002452 interceptive effect Effects 0.000 description 2
- 230000001788 irregular Effects 0.000 description 2
- 239000004973 liquid crystal related substance Substances 0.000 description 2
- 230000007774 longterm Effects 0.000 description 2
- 230000002093 peripheral effect Effects 0.000 description 2
- 238000002360 preparation method Methods 0.000 description 2
- 230000002265 prevention Effects 0.000 description 2
- 238000012956 testing procedure Methods 0.000 description 2
- 230000001960 triggered effect Effects 0.000 description 2
- 208000019155 Radiation injury Diseases 0.000 description 1
- 230000002159 abnormal effect Effects 0.000 description 1
- 230000004888 barrier function Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 210000000988 bone and bone Anatomy 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000013500 data storage Methods 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 230000006698 induction Effects 0.000 description 1
- 239000002096 quantum dot Substances 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 238000009877 rendering Methods 0.000 description 1
- 230000005236 sound signal Effects 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
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- G—PHYSICS
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- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
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Abstract
The application provides a testing method and a testing device, wherein the testing method is applied to electronic equipment, the electronic equipment is provided with a man-machine interaction testing system, the man-machine interaction testing system stores at least one testing flow, the testing flow is used for testing functions of devices in the electronic equipment, and the testing method comprises the following steps: invoking a calibration flow in the test flow to calibrate the device to obtain a calibration result; in response to the calibration result indicating that the device is normal, each test sub-process in the test process is processed as follows: determining that the electronic equipment meets the test condition; and calling a testing sub-flow matched with the testing conditions in the testing flow, and testing the functions corresponding to the testing sub-flow in the device so as to complete the automatic testing of the device through the testing flow. And in the automatic test process of the device, a test sub-flow matched with the test condition is called, and the function executed when the test condition is met is tested, so that the test condition is matched with the function to be tested, and the test accuracy is improved.
Description
Technical Field
The present application relates to the field of device testing technologies, and in particular, to a testing method and apparatus.
Background
Currently, in order to ensure the quality of electronic devices, each device in the electronic device is tested before the electronic device leaves the factory. The test procedure may be: the device pointed by the device test instruction text is tested by the production line operator according to the device test instruction text, but the production line operator has the problem of irregular operation, so that the test result is wrong, and the test accuracy is reduced.
Disclosure of Invention
The application provides a testing method and a testing device, and aims to solve the problems that a testing result is wrong and testing accuracy is reduced due to non-standard operation of a production line operator. In order to achieve the above object, the present application provides the following technical solutions:
in a first aspect, the present application provides a testing method, applied to an electronic device, where the electronic device has a man-machine interaction testing system, and the man-machine interaction testing system stores at least one testing procedure, where the testing procedure is used for testing a function of a device in the electronic device, the method includes: invoking a calibration flow in the test flow to calibrate the device to obtain a calibration result; in response to the calibration result indicating that the device is normal, each test sub-process in the test process is processed as follows: determining that the electronic equipment meets the test condition; and calling a testing sub-flow matched with the testing conditions in the testing flow, and testing the functions corresponding to the testing sub-flow in the device so as to complete the automatic testing of the device through the testing flow. And in the automatic test process of the device, a test sub-flow matched with the test condition is called, and the function executed when the test condition is met is tested, so that the test condition is matched with the function to be tested, the test result is ensured to be correct, and the test accuracy is improved. The man-machine interaction test system can store test flows of different devices, so that the test flows are preset for the different devices, the test specifications of the devices are unified, the unified test specifications are utilized for testing, and the test accuracy is improved.
In some examples, the test flow includes a calibration flow and a plurality of test sub-flows, a test condition and a function to be tested are set for each test sub-flow, and when the electronic device meets the test condition corresponding to the test sub-flow, the test sub-flow is called to test the function to be tested. For example, the plurality of test sub-flows include a first test sub-flow and a second test sub-flow, the first test sub-flow corresponds to a first test condition and a first function of the device, the second test sub-flow corresponds to a second test condition and a second function of the device, and when it is determined that the electronic device meets the first test condition, the first test sub-flow matched with the first test condition in the test flow is called to test the first function of the device; and when the electronic equipment meets the second test condition, a second test sub-flow matched with the second test condition in the test flow is called to test the second function of the device, so that the test condition is matched with the function to be tested, the false test of the function is prevented, and the test accuracy is improved. For the calibration flow, the electronic device may also set a test condition of the calibration flow, and when the electronic device meets the test condition of the calibration flow, the calibration flow is invoked to calibrate the device, so as to determine whether the device can normally operate.
Optionally, in response to the calibration result indicating that the device is normal, determining that the electronic device satisfies the test condition includes: and responding to the calibration result to indicate that the device is normal, determining that a component in the electronic equipment is touched by the control equipment, wherein the control equipment is used for touching the component when the electronic equipment meets the preset condition. That is, in the process of testing the functions of the devices by the electronic equipment, the control equipment can control the electronic equipment so that the electronic equipment meets the test conditions. For example, the control device controls the electronic device to move, changes the distance between the electronic device and the test object, and the like, and for example, adjusts the gesture of the electronic device, adjusts the environment in which the electronic device is located, and the like, which are determined according to the test conditions corresponding to each test sub-flow in the test flow. After completing the control of the electronic device according to the test conditions corresponding to any test sub-flow (when the electronic device meets the test conditions), the control device can trigger components (such as a volume key and the like) in the electronic device, and the electronic device determines that the test conditions are met and invokes the test sub-flow matched with the test conditions for testing.
Optionally, the calling the test sub-process matched with the test condition in the test process includes: after determining that a component in the electronic device is touched by the control device, delaying the first preset duration to call a test sub-flow matched with the test condition in the test flow. The purpose of delaying the first preset duration is to wait for the control device to reset, and reduce the influence of the control device on the test, wherein the value of the first preset duration is not limited, for example, the first preset duration may be 0.2 seconds, and wait for 0.2 seconds to reset the cylinder of the control device.
Optionally, in response to the calibration result indicating that the device is normal, determining that the electronic device satisfies the test condition includes: responding to the calibration result to indicate that the device is normal, and acquiring a parameter value of a test influence parameter of the electronic equipment, wherein the test influence parameter comprises at least one of the position of the electronic equipment, the gesture of the electronic equipment and the environmental parameter of the environment where the electronic equipment is positioned; if the parameter value of the test influence parameter of the electronic equipment is a preset parameter value, determining that the electronic equipment meets the test condition. The preset parameter values of the test influencing parameters may be specified in the test conditions, which preset parameter values differ for different types of test influencing parameters. For example, the test condition is used for indicating that the current position of the electronic device is at the preset position and indicating that the current gesture of the electronic device is the preset gesture, and when the electronic device is at the preset position and the electronic device is at the preset gesture, the test condition is determined to be met, so that the electronic device can determine whether the preset condition is met according to the test influence parameter.
Optionally, before invoking the calibration procedure in the test procedure, the method further comprises: performing fool-proof inspection on the electronic equipment to obtain a fool-proof inspection result, and calling a calibration flow when the fool-proof inspection result indicates that the fool-proof inspection is successful; and/or, before invoking the test sub-flow, the method further comprises: and (3) carrying out foolproof inspection on the electronic equipment to obtain a foolproof inspection result, and calling a testing sub-flow when the foolproof inspection result indicates that the foolproof inspection is successful so as to determine whether the electronic equipment is ready before calibration and/or before functional testing, thereby improving the testing accuracy. In some examples, fool-proofing inspection includes, but is not limited to, fool-proofing of two-dimensional codes, fool-proofing of gravity sensing, fool-proofing of ambient light, and the like, wherein the fool-proofing of two-dimensional codes is used for checking whether a two-dimensional code displayed by an electronic device is correct, fool-proofing of gravity sensing is used for determining whether the electronic device is fixed on a fixing device, and fool-proofing of ambient light is used for determining whether illumination of an environment where the electronic device is located meets preset illumination test requirements, such as determining whether brightness of light meets preset brightness requirements. After the electronic equipment passes the fool-proof inspection, the electronic equipment is indicated to complete testing preparation so as to improve testing accuracy.
Optionally, before invoking the calibration procedure in the test procedure to calibrate the device, the method further includes: the method comprises the steps that equipment information of electronic equipment is displayed in a first display mode, and after the equipment information is acquired, the control equipment is used for triggering a component of the electronic equipment pointed by the equipment information when the electronic equipment meets preset conditions; after testing the function of the device corresponding to the test sub-flow, the method further comprises: and displaying the test result of the electronic equipment in a first display mode. The electronic equipment information is displayed so that the control equipment can determine the currently controlled electronic equipment, and therefore when the electronic equipment is determined to meet the preset conditions, the control equipment can trigger the components of the currently controlled electronic equipment to indicate the electronic equipment to meet the test conditions, the possibility of the control equipment to trigger the components by mistake is reduced, and the accuracy is improved. The first display mode includes a two-dimensional code mode, for example, the first display mode may be a two-dimensional code mode, or may be a mode of combining a two-dimensional code and a character string, for example, the character string may be a description of a two-dimensional code, etc., and the first display mode is not limited.
Optionally, the method further comprises: after the equipment information and/or the test result are displayed for a second preset time, the equipment information and/or the test result are displayed in a second display mode, and the power consumption of the first display mode is larger than that of the second display mode. If the second display mode may be a character string, because the power consumption of the first display mode is greater than that of the second display mode, after the device information and/or the test result are displayed in the first display mode for a second preset period of time, the electronic device displays the device information and/or the test result in the second display mode, so as to reduce the power consumption. When the first display mode comprises a two-dimensional code mode, the electronic equipment displays the two-dimensional code for a long time, the screen burning phenomenon exists, the two-dimensional code is not displayed after the second preset time length, and therefore the screen burning phenomenon is solved, and the value of the second preset time length is not limited.
Optionally, the man-machine interaction test system is arranged on an application program layer of the electronic device, and comprises an inlet management module and a calibration test flow control module; the entrance management module is used for setting starting conditions of each flow in the test flows, and determining that the test conditions are met when the starting conditions are met; the calibration test flow control module is used for calibrating the device by calling a calibration flow in the test flow to obtain a calibration result; in response to the calibration result indicating that the device is normal, each test sub-process in the test process is processed as follows: determining that the electronic equipment meets the test condition; and calling a testing sub-flow matched with the testing conditions in the testing flow, and testing the functions corresponding to the testing sub-flow in the device.
Optionally, the human-computer interaction testing system further includes: a fool-proof function module; the fool-proof function module is used for selecting fool-proof inspection corresponding to the test flow from multiple fool-proof inspections, and carrying out fool-proof inspection when the test flow is called; the entrance management module is also used for providing a plurality of starting conditions and selecting the starting conditions of each flow in the test flows from the plurality of starting conditions.
Optionally, the human-computer interaction testing system further includes: testing the display module and the screen protection design module; the test display module is used for displaying equipment information and/or test results of the electronic equipment; and the screen protection design module is used for controlling the display mode of the equipment information and/or the test result.
Optionally, the test procedure is a test procedure of a specific absorption rate sensor (corresponding to the following Sar sensor test procedure) in the electronic device, where the test procedure of the specific absorption rate sensor includes a calibration procedure, a near function test sub-procedure and a far function test sub-procedure; after the electronic equipment is determined to be close to the test object, invoking a close function test sub-flow, and testing the close function of the absorption rate sensor; and after the electronic equipment is determined to be far away from the test object, calling a far-away function test sub-flow, and testing the far-away function of the contrast absorption rate sensor. The test object may be an object used for simulating a human body in the control device, for example, the electronic device is fixed on a fixture of the control device, the baffle of the control device is used for simulating the human body, the fixture controls the electronic device to be far away from the baffle or close to the baffle, the close function test sub-flow is called after the electronic device is close to the baffle, and the far away function test sub-flow is called after the electronic device is far away from the baffle, so that the correct test sub-flow is called for testing according to the position relationship between the electronic device and the baffle, and the test accuracy is improved.
In a second aspect, the present application provides an electronic device, including: one or more processors; one or more memories; the memory stores one or more programs that, when executed by the processor, cause the electronic device to perform the test methods described above.
In a third aspect, the present application provides a computer-readable storage medium in which a computer program is stored which, when executed by a processor, causes the processor to perform the above-described test method.
Drawings
FIG. 1 is a schematic diagram of a Sar sensor according to the present application;
FIG. 2 is a schematic diagram of CDC of the Sar sensor according to the present application as a function of distance;
FIG. 3 is a hardware configuration diagram of an electronic device according to the present application;
Fig. 4 is a software architecture diagram of an electronic device according to the present application;
FIG. 5 is a block diagram of the MMI test system and an interactive schematic diagram with the control device provided by the application;
FIG. 6 is a schematic diagram of display device information provided by the present application;
FIG. 7 is a schematic diagram showing a test result of successful test according to the present application;
FIG. 8 is a schematic diagram showing test results of test failure according to the present application;
FIG. 9 is a flow chart of a test method provided by the present application;
FIG. 10 is a schematic diagram of a parallel test of multiple electronic devices provided by the present application;
FIG. 11 is a schematic diagram of a stationary electronic device according to the present application;
fig. 12 is an interaction diagram of an electronic device and a control device in the test process provided by the application.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present application. The terminology used in the following examples is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. As used in the specification of the application and the appended claims, the singular forms "a," "an," "the," and "the" are intended to include, for example, "one or more" such forms of expression, unless the context clearly indicates to the contrary. It should also be understood that in embodiments of the present application, "one or more" means one, two, or more than two; "and/or", describes an association relationship of the association object, indicating that three relationships may exist; for example, a and/or B may represent: a alone, a and B together, and B alone, wherein A, B may be singular or plural. The character "/" generally indicates that the context-dependent object is an "or" relationship.
Reference in the specification to "one embodiment" or "some embodiments" or the like means that a particular feature, structure, or characteristic described in connection with the embodiment is included in one or more embodiments of the application. Thus, appearances of the phrases "in one embodiment," "in some embodiments," "in other embodiments," and the like in the specification are not necessarily all referring to the same embodiment, but mean "one or more but not all embodiments" unless expressly specified otherwise. The terms "comprising," "including," "having," and variations thereof mean "including but not limited to," unless expressly specified otherwise.
The plurality of the embodiments of the present application is greater than or equal to two. It should be noted that, in the description of the embodiments of the present application, the terms "first," "second," and the like are used for distinguishing between the descriptions and not necessarily for indicating or implying a relative importance, or alternatively, for indicating or implying a sequential order.
In order to ensure the quality of the electronic equipment, it is necessary to test each device in the electronic equipment. In some examples, testing of the electronic device may be accomplished manually by a production line operator, who may test the device to which the device test guidance text points according to the device test guidance text for each device in the electronic device. However, there are differences between the device test instruction texts of different devices, and when a production line operator tests the devices according to the device test instruction texts, problems are likely to occur, such as irregular operation, so that test results are wrong, and test accuracy is reduced.
Taking a specific absorption rate (Specific Absorption Ratio, sar) sensor as an example, a structural diagram of the Sar sensor is shown in fig. 1, and the Sar sensor includes: metal Surface (Metal Surface), isolation Surface (Isolation), electrode (Shield Electrode), printed Circuit Board (PCB), sensor (Sensor). The Sensor is arranged on the PCB, and the Metal Surface is connected with a ground (Earth) line, and the Metal Surface is provided with a Isolation, a Shield Electrode and the PCB in sequence from top to bottom. The Sar sensor is a capacitive sensor for detecting whether a human body is approaching an electronic device. When the Sar sensor is arranged in the electronic equipment, the induction area of the Sar sensor and the radiation area of the antenna in the electronic equipment can be the same area, and when a human body approaches the antenna, each layer structure in the Sar sensor acts to form a capacitor, as shown by an arrow in fig. 1, and the principle that each layer structure acts to form a capacitor is not repeated here.
The closer the human body is to the electronic device, the larger the capacitance, as shown in fig. 2, the abscissa is the distance, the ordinate is the CDC (capacitance digital conversion) value, the capacitance change amount detected by the Sar sensor is represented by a digital value, and the unit of the distance may be set according to the requirement of the Sar sensor, which is not limited herein. Therefore, the Sar sensor can judge the distance between the human body and the electronic equipment through the capacitance variation. The power of the antenna can be determined according to the distance between the human body and the electronic equipment, and when the distance between the human body and the electronic equipment is relatively close, the power of the antenna can be reduced so as to reduce radiation injury to the human body.
For the Sar sensor, before the electronic equipment leaves the factory, a production line operator can test the Sar sensor according to the device test instruction text of the Sar sensor, and if the operation is not standard, the Sar calibration value can be wrong. For example, in testing the Sar sensor, the electronic device having the Sar sensor is fixed to a jig (a fixture), and the electronic device is controlled to move toward the barrier by the jig. Ideally, when the electronic device approaches the baffle, the Sar sensor performs a close range test for testing the proximity function of the Sar sensor; when the electronic equipment is far away from the baffle, the Sar sensor executes a remote test, and the remote test is used for testing the far-away function of the Sar sensor. However, if the operation of the production line operator is not standard, a problem may occur in the cooperation between the clamp and the electronic device, for example, when the clamp controls the electronic device to approach the baffle, the Sar sensor performs a remote test; when the clamp controls the electronic equipment to be far away from the baffle, the Sar sensor executes a close range test, namely, the Sar sensor is far away from the function test when the electronic equipment meets the close range test condition, and the Sar sensor is close to the function test when the electronic equipment meets the remote range test condition, so that the condition that the test condition is not matched with the function tested under the test condition occurs, the test of the close function and the far away function is wrong, and the test accuracy is reduced.
Therefore, the application provides a testing method, which is applied to electronic equipment, the electronic equipment is provided with a man-machine Interaction (MMI) testing system, the MMI testing system comprises at least one testing flow, the testing flow corresponds to a device in the electronic equipment and is used for testing the function of the device, that is to say, the electronic equipment operates the testing flow in the MMI testing system and automatically tests the function of the device corresponding to the testing flow.
Correspondingly, the test method can call a test flow in the MMI test system, and when the device corresponding to the test flow is determined to start to be tested, the device is calibrated, and the purpose of the calibration is to determine that the device is normal; when the electronic equipment is determined to meet the first test condition, a first test sub-flow matched with the first test condition in the test flow is called, and a first function of the device is tested; and when the electronic equipment meets the second test condition, a second test sub-flow matched with the second test condition in the test flow is called to test the second function of the device, so that the automatic test of the device is completed through the test flow. And in the automatic test process of the device, a test sub-flow matched with the test condition is called, and the function executed when the test condition is met is tested, so that the test condition is matched with the function to be tested, the test result is ensured to be correct, and the test accuracy is improved.
The test conditions are used for indicating that the current test influence parameters of the electronic device meet certain requirements, for example, the test conditions are used for indicating that the current position of the electronic device is at a preset position, indicating that the current gesture of the electronic device is a preset gesture, and the like. The position and the gesture of the electronic device may be controlled by the control device, and the test conditions of different devices in the electronic device may be different, which will not be described in detail herein. Whether the electronic equipment meets the test conditions can be judged by the electronic equipment or judged by the control equipment, when the control equipment judges that the electronic equipment meets the conditions, the control equipment can trigger a component (such as a volume key) in the electronic equipment, and after the electronic equipment component is triggered, the electronic equipment can call a test sub-flow to test the functions of the device. Under the scene that the control device controls the electronic device to call the test sub-flows, the control device and the electronic device can negotiate the execution sequence of the test sub-flows, control the electronic device to meet the test conditions corresponding to different test sub-flows according to the execution sequence of the test sub-flows, and then trigger the component, and select the matched test sub-flows according to the execution sequence of the test sub-flows.
In some examples, the manner in which the start of testing the device corresponding to the test flow is determined is: whether the preset starting operation is performed is determined, and if the preset starting operation is performed, the device corresponding to the testing flow is determined to start to be tested. The preset start operation is directed to a start type for starting the test procedure, for example, by pressing a key to start the test procedure, and then after determining that the key is pressed, it is determined to start the test. For example, the preset start operation is to press the volume down key, and when it is determined to press the volume down key, it is determined to start the test. For example, the preset starting operation may be that the angle change of the electronic device meets a preset starting condition, and the test is determined to start, and the angle change of the electronic device may be obtained through a compass in the electronic device. The preset starting operation can be configured by a user, and the test is started according to the preset starting operation configured by the user, so that the customization of the test starting inlet is realized.
In some examples, the test method may further comprise: before calibrating the device, the electronic device is checked for fool-proofing to determine if the electronic device is ready for testing. Optionally, the fool-proof inspection includes, but is not limited to, fool-proofing of a two-dimensional code, fool-proofing of gravity sensing, fool-proofing of ambient light, and the like, where the two-dimensional code is used for checking whether a two-dimensional code displayed by the electronic device is correct, fool-proofing of gravity sensing is used for determining whether the electronic device is fixed on the fixing device, and fool-proofing of ambient light is used for determining whether illumination of an environment where the electronic device is located meets a preset illumination test requirement, such as determining whether brightness of light meets a preset brightness requirement. After the electronic equipment passes the fool-proof inspection, the electronic equipment is proved to complete testing preparation, and at the moment, the device can be calibrated, so that the testing accuracy is improved.
In some examples, the test method may further comprise: device information and/or test results are displayed on the electronic device. For example, the device information is displayed in the form of a two-dimensional code, and after the test of any one function is completed, the test result of the function is displayed in the form of a two-dimensional code. The control device can scan the two-dimensional code, acquire device information and/or test results, and upload the device information and/or the test results to the monitor, and the monitor monitors the whole test flow according to the test results. After a test result of successful test is obtained, the test result can be displayed until the next function starts, so that at any time point when the next function starts, the control device can obtain the test result, and in this way, the successful completion of the test of one function can be determined. After the test result of the test failure is obtained, the electronic device prohibits the display of the test result in the form of the two-dimensional code, because the control device does not scan the two-dimensional code, the control device can determine the test failure through scanning timeout.
Optionally, the electronic device displays the two-dimensional code for a long time and has the screen burning phenomenon, so that after the electronic device displays the two-dimensional code for a certain period of time, the information carried by the two-dimensional code is converted into a character string for display. The screen burning phenomenon refers to that a display screen of the electronic equipment displays a two-dimensional code in a static state for a long time, and a ghost image of the two-dimensional code can be left on the display screen.
The above test method may be applied to an electronic device, which in some embodiments may be a mobile phone, tablet, desktop, laptop, notebook, ultra-mobile Personal Computer, UMPC, handheld computer, netbook, personal digital assistant (Personal DIGITAL ASSISTANT, PDA), wearable electronic device, smart watch, etc. The specific form of the electronic device is not particularly limited in the present application.
As shown in fig. 3, the electronic device may include: processor, external memory interface, internal memory, universal serial bus (Universal Serial Bus, USB) interface, charge management module, power management module, battery, antenna 1, antenna 2, mobile communication module, wireless communication module, sensor module, keys, motor, indicator, camera, display screen, and subscriber identity module (Subscriber Identification Module, SIM) card interface, etc. Wherein the audio module may include a speaker, a receiver, a microphone, an earphone interface, etc., and the sensor module may include a pressure sensor, a gyro sensor, a barometric sensor, a magnetic sensor, an acceleration sensor, a distance sensor, a proximity sensor, a fingerprint sensor, a temperature sensor, a touch sensor, an ambient light sensor, a bone conduction sensor, etc.
The processor may include one or more processing units, such as: the processors may include application processors (Application Processor, APs), modem processors, graphics processors (Graphics Processing Unit, GPU), image signal processors (IMAGE SIGNAL Processor, ISP), controllers, video codecs, digital signal processors (DIGITAL SIGNAL Processor, DSP), baseband processors, and/or neural network processors (Neural-network Processing Unit, NPU), etc. Wherein the different processing units may be separate devices or may be integrated in one or more processors. The processor is a nerve center and a command center of the electronic equipment, and the controller can generate operation control signals according to instruction operation codes and time sequence signals to finish instruction fetching and instruction execution control.
The external memory interface may be used to connect an external memory card, such as a Micro SD card, to enable expansion of the memory capabilities of the electronic device. The external memory card communicates with the processor through an external memory interface to realize the data storage function. For example, files such as music, video, etc. are stored in an external memory card. The internal memory may be used to store computer-executable program code that includes instructions. The processor executes the instructions stored in the internal memory to perform various functional applications of the electronic device and data processing. For example, in the present application, the processor causes the electronic device to execute the test method provided by the present application by executing the instructions stored in the internal memory.
The wireless communication function of the electronic device may be implemented by the antenna 1, the antenna 2, the mobile communication module, the wireless communication module, the modem processor, the baseband processor, and the like.
The antennas 1 and 2 are used for transmitting and receiving electromagnetic wave signals. Each antenna in the electronic device may be used to cover a single or multiple communication bands. Different antennas may also be multiplexed to improve the utilization of the antennas. For example: the antenna 1 may be multiplexed into a diversity antenna of a wireless local area network. In other embodiments, the antenna may be used in conjunction with a tuning switch.
The mobile communication module may provide a solution for wireless communication including 2G/3G/4G/5G etc. applied on an electronic device. The mobile communication module may include at least one filter, switch, power amplifier, low noise amplifier (low noise amplifier, LNA), etc. The mobile communication module may receive electromagnetic waves from the antenna 1, perform processes such as filtering, amplifying, and the like on the received electromagnetic waves, and transmit the electromagnetic waves to the modem processor for demodulation. The mobile communication module can amplify the signal modulated by the modulation and demodulation processor and convert the signal into electromagnetic waves to radiate through the antenna 1. In some embodiments, at least part of the functional modules of the mobile communication module may be provided in the processor. In some embodiments, at least part of the functional modules of the mobile communication module may be provided in the same device as at least part of the modules of the processor.
The modem processor may include a modulator and a demodulator. The modulator is used for modulating the low-frequency baseband signal to be transmitted into a medium-high frequency signal. The demodulator is used for demodulating the received electromagnetic wave signal into a low-frequency baseband signal. The demodulator then transmits the demodulated low frequency baseband signal to the baseband processor for processing. The low frequency baseband signal is processed by the baseband processor and then transferred to the application processor. The application processor outputs sound signals through an audio device (not limited to speakers, receivers, etc.), or displays images or video through a display screen. In some embodiments, the modem processor may be a stand-alone device. In other embodiments, the modem processor may be provided in the same device as the mobile communication module or other functional module, independent of the processor.
The wireless communication module may provide solutions for wireless communication including wireless local area network (wireless local area networks, WLAN) (e.g., wireless fidelity (WIRELESS FIDELITY, wi-Fi) network), bluetooth (BT), global navigation satellite system (global navigation SATELLITE SYSTEM, GNSS), frequency modulation (frequency modulation, FM), near field communication (NEAR FIELD communication, NFC), infrared (IR), etc. for application on an electronic device. The wireless communication module may be one or more devices that integrate at least one communication processing module. The wireless communication module receives electromagnetic waves via the antenna 2, modulates the electromagnetic wave signals, filters the electromagnetic wave signals, and transmits the processed signals to the processor. The wireless communication module can also receive the signal to be transmitted from the processor, frequency modulate and amplify the signal, and convert the signal into electromagnetic waves to radiate through the antenna 2.
In some embodiments, the antenna 1 and the mobile communication module of the electronic device are coupled, and the antenna 2 and the wireless communication module are coupled, so that the electronic device can communicate with the network and other devices through wireless communication technology. The wireless communication techniques can include the Global System for Mobile communications (global system for mobile communications, GSM), general packet radio service (GENERAL PACKET radio service, GPRS), code division multiple access (code division multiple access, CDMA), wideband code division multiple access (wideband code division multiple access, WCDMA), time division code division multiple access (time-division code division multiple access, TD-SCDMA), long term evolution (long term evolution, LTE), BT, GNSS, WLAN, NFC, FM, and/or IR techniques, among others. The GNSS may include a global satellite positioning system (global positioning system, GPS), a global navigation satellite system (global navigation SATELLITE SYSTEM, GLONASS), a beidou satellite navigation system (beidou navigation SATELLITE SYSTEM, BDS), a quasi zenith satellite system (quasi-zenith SATELLITE SYSTEM, QZSS) and/or a satellite based augmentation system (SATELLITE BASED AUGMENTATION SYSTEMS, SBAS).
The electronic device realizes the display function through the GPU, the display screen, the application processor and the like. The GPU is a microprocessor for image processing and is connected with the display screen and the application processor. The GPU is used to perform mathematical and geometric calculations for graphics rendering. The processor may include one or more GPUs that execute program instructions to generate or change display information.
The display screen is used for displaying images, videos, and the like. The display screen includes a display panel. The display panel may employ a Liquid Crystal Display (LCD) screen (liquid CRYSTAL DISPLAY), an organic light-emitting diode (OLED), an active-matrix organic LIGHT EMITTING diode (AMOLED), a flexible light-emitting diode (flex), miniled, microLed, micro-OLED, a quantum dot light-emitting diode (QLED), or the like. In some embodiments, the electronic device may include 1 or N displays, N being a positive integer greater than 1.
A series of graphical user interfaces (GRAPHICAL USER INTERFACE, GUIs) may be displayed on a display screen of an electronic device, all of which are home screens of the electronic device. Generally, the size of the display screen of an electronic device is fixed and only limited controls can be displayed in the display screen of the electronic device. A control is a GUI element that is a software component that is included in an application program, controls all data processed by the application program and interactive operations on the data, and a user can interact with the control by direct operations (direct manipulation) to read or edit information about the application program. In general, controls may include visual interface elements such as icons, buttons, menus, tabs, text boxes, dialog boxes, status bars, navigation bars, widgets, and the like. For example, in the embodiment of the application, the display screen may display the device information and/or the test result in the form of a two-dimensional code.
It is to be understood that the configuration illustrated in this embodiment does not constitute a specific limitation on the electronic apparatus. In other embodiments, the electronic device may include more or fewer components than shown, or certain components may be combined, or certain components may be split, or different arrangements of components. The illustrated components may be implemented in hardware, software, or a combination of software and hardware.
In addition, an operating system is run on the components. Such as the iOS operating system developed by apple corporation, the Android open source operating system developed by *** corporation, the Windows operating system developed by microsoft corporation, etc.
The operating system of the electronic device may employ a layered architecture, an event driven architecture, a microkernel architecture, a microservice architecture, or a cloud architecture. In the embodiment of the application, an Android system with a layered architecture is taken as an example, and the software structure of the electronic equipment is illustrated. Fig. 4 is a software architecture block diagram of an electronic device. The layered architecture divides the software into several layers, each with distinct roles and branches. The layers communicate with each other through a software interface. Taking an Android system as an example, in some embodiments, the Android system is divided into four layers, namely an application layer, an application Framework layer (Framework), a Hardware Abstraction Layer (HAL) and a system Kernel layer (Kernel) from top to bottom.
The application layer may include a series of application packages, and the application packages may include applications such as cameras, gallery, calendar, call, map, navigation, WLAN, music, short message, etc. The application layer may also include an MMI test system for testing devices in the electronic device. The application framework layer provides an application programming interface (Application Programming Interface, API) and programming framework for the application of the application layer. The application framework layer includes a number of predefined functions. As shown in fig. 4, the application framework layer may include a window manager, a content provider, a view system, a telephony manager, a resource manager, a notification manager, and the like. For example, the application framework layer may include MMI test service interfaces or the like through which various instructions issued by the application layer may be passed to the HAL layer, hardware data obtained by the HAL layer from the kernel layer may be passed to the application layer, and the like.
The HAL runs in a user space (userspace), encapsulates the kernel layer driver, and provides a call interface to an upper layer, such as an application layer and an application architecture layer, so that the application layer and the application architecture layer can acquire hardware data from the kernel layer. For example, the HAL layer may include a plurality of SO files, and the SO files may be encapsulated into a call interface, SO that the application layer and the application framework layer may call the compiled code in the SO files, and through these codes, the collection of hardware data in the kernel layer is implemented, and SO on. For example, HAL layer call SO files may read gravity sensor data, ambient light sensor data, sar sensor data, and the like from the kernel layer. The kernel layer at least comprises device drivers, such as display drivers, camera drivers, audio drivers, and sensor drivers.
Fig. 5 shows the structure of an MMI test system, as the MMI test system may include: the system comprises a fool-proof function module, an entry management module, a calibration test flow control module, a test display module and a screen protection design module. The fool-proof function module is used for providing multiple fool-proof checks to determine that the electronic equipment meets preset test environment conditions, wherein the preset test environment conditions are used for indicating that the electronic equipment is fixed on the control equipment and the current environment of the electronic equipment meets test requirements. In some examples, the fool-proofing functional module is configured to provide at least triple fool-proofing such as two-dimensional code fool-proofing, gravity sensing fool-proofing, and ambient light fool-proofing, where the two-dimensional code fool-proofing is configured to detect whether the electronic device can normally display the two-dimensional code, the gravity sensing fool-proofing is configured to detect whether the electronic device is fixed on the control device, and the ambient light fool-proofing is configured to detect whether illumination of an environment where the electronic device is located meets a preset illumination test requirement, for example, whether brightness of light meets a preset brightness requirement is determined, and after the triple fool-proofing test is passed, it is determined that a device pointed by a test procedure can be tested; if at least one fool-proof item in the triple fool-proof test fails, the test is forbidden, namely, the test is processed according to fool-proof failure.
At least one fool-proofing function module can increase fault tolerance treatment, such as gravity sensing fool-proofing, for example, one time gravity sensing fool-proofing is performed before a test is started (such as the test environment is ready), one time gravity sensing fool-proofing is performed before a calibration is performed after the test is started, and the like, and any one time gravity sensing fool-proofing is failed, and the test is failed. If the gravity sensing foolproof does not pass, a starting operation is consumed. For example, before each function in the test flow is tested, one time of gravity sensing foolproof is performed, such as testing for the Sar sensor, and before calibration, approaching function test and far function test, one time of gravity sensing foolproof is performed, any time of gravity sensing foolproof is failed, testing is failed, and any time of gravity sensing foolproof is failed, and testing is terminated.
The entry management module is used for setting starting conditions of the test flow, for example, the test flow is started by a key or compass mode, and the customization of the starting type is realized. The calibration test flow control module is used for controlling the test flow so as to realize automatic test through the calibration test flow control module. The test display module is used for displaying the two-dimensional code after entering the test and finishing the test, and the two-dimensional code carries equipment information and/or a test result. The screen protection design module is used for controlling the display of the screen, such as controlling the duration of the display of the two-dimension code by the screen, so as to prevent the screen from being burnt out due to the long-time existence of the two-dimension code, namely, the screen burning phenomenon occurs. After the two-dimensional code is displayed for a period of time, the electronic equipment can convert the two-dimensional code into a character string for display, and the corresponding screen protection design module is also used for the character string.
At least one of the fool-proof item in the fool-proof function module, the starting condition set by the entrance management module, the test flow corresponding to the calibration test flow control module, the format of the test display module when displaying data, the two-dimensional code display duration set by the screen protection design module and the converted character string can be recorded in a configuration file, and the configuration file can be in an extensible markup language (Extensible Markup Language, XML) format.
In fig. 5, the portal management module includes a portal mode customizing unit, a key processing unit and a compass data processing unit, where the portal mode customizing unit is used to instruct the test to start and control the test flow, for example, in a key and/or compass manner, the key start and the compass start can be configured through an MMI attribute configuration file, and different electronic devices can be configured with different start types, so as to implement personalized customization. The key processing unit is used for setting a start test by a key and controlling a test flow, and the compass data processing unit is used for setting a start test by a compass and controlling a test flow.
The fool-proof functional module can comprise a fool-proof mode customizing unit, a gravity sensing fool-proof unit, an ambient light fool-proof unit and a two-dimensional code fool-proof unit. The fool-proof mode customizing unit is used for setting fool-proof items, such as selecting at least one fool-proof item from gravity sensing fool-proof items, environment light fool-proof items and two-dimensional code fool-proof items. The gravity sensing fool-proof unit is used for carrying out gravity sensing fool-proof check so as to detect whether the electronic equipment is fixed on the control equipment. The ambient light fool-proofing is used for detecting whether illumination of the environment where the electronic device is located meets a preset illumination test requirement, such as determining whether brightness of light meets a preset brightness requirement. The two-dimension code fool-proofing unit is used for detecting whether the electronic equipment can normally display the two-dimension code. The two-dimensional code fool-proof unit can also be arranged in the test display module.
The switch of each unit in the fool-proof functional module can be transferred from MMI attribute configuration file configuration to bottom management control (such as driving management control corresponding to each unit), after the bottom management control is configured, the configuration result is reported to an MMI test system, reporting rules are as follows, and each data can be separated by a space:
threshold_gravity:0threshold_xyz:0threshold_light:8
The 1 st position reports the gravity fool-proof switch, 0 represents that the gravity fool-proof switch is opened, and 1 represents that the gravity fool-proof switch is closed;
the 2 nd bit reports which axis (xyz) data should be used for calculation in the gravity fool-proofing process;
and reporting a light sense fool-proof threshold at the 3 rd position, if the threshold is larger than 1, the ambient light fool-proof is indicated to be started, and if the threshold is 0, the ambient light fool-proof is indicated to be closed.
The test display module comprises a two-dimensional code information display unit, and the two-dimensional code information display unit is used for displaying equipment information and/or test results in a two-dimensional code mode. The content format of the two-dimensional code display can be: bsn|test results|diff|offset, e.g., AGEF 0126 a000143|1| -5|10304. Where BSN is an example of device information, the test results include 0 and 1,0 indicating that the test was successful, 1 indicating that the test failed, diff is a calibrated threshold, offset is a compensation value, indicating the difference between diff and the initial threshold. For example, in the Sar sensor test procedure, diff is a threshold for determining approaching or separating, and if the distance between the electronic device and the human body is greater than the threshold, it is regarded as approaching, and if it is smaller than the threshold, it is regarded as separating.
After entering a certain test flow, the test display module is called to display two-dimensional code information, the main function of the two-dimensional code information is to tell the control equipment of the equipment information, then a test result in the two-dimensional code information can be empty, and the two-dimensional code information can be displayed in the middle position of a screen. If the test fails in the test process, the test display module can display a failure interface (including error codes), and because the test display module does not display the two-dimensional code information carrying the BSN and the test result, the control equipment cannot scan the two-dimensional code information, and the control equipment determines that the scanning is overtime and judges that the test fails through the overtime. And displaying a success interface after the test is successful, wherein the success interface can display information indicating the test success, the information can be always displayed, and the test result of the next test is displayed when the next test is entered.
The test display module may further include a character string display unit, and after the two-dimensional code is displayed for a period of time, the two-dimensional code is converted into a character string, and the character string display unit may display the character string.
The screen protection design module comprises a two-dimensional code screen burning processing unit and a popup window screen burning prevention processing unit, wherein the two-dimensional code screen burning processing unit is used for controlling the duration of displaying the two-dimensional code by the screen so as to prevent the screen from being burnt out when the two-dimensional code exists for a long time. The popup window burn-proof processing unit is used for starting the screen saver after the popup window information is displayed on the screen for a period of time. For example, if the test is in a successful test state all the time in the test process, the test display module can display the two-dimensional code information, for example, the two-dimensional code information is displayed in the middle position of the screen. However, the display time is long, a screen burn-in phenomenon may occur on the screen, and for this reason, the two-dimensional code information is displayed on the screen for 1 minute (for example, other time may be defined in practice), and a character string is displayed on the screen. If the test is abnormal during the test, a popup window is displayed on the screen, and after 5 minutes, the screen saver is started, and 5 minutes is also an example.
As shown in fig. 6, after the test flow is entered, two-dimensional code information carrying device information is displayed as shown in (1) in fig. 6, and a character string may be displayed at the same time as the two-dimensional code information. After the two-dimensional code information of (1) in fig. 6 is displayed for 1 minute, only the character string is displayed in the two-dimensional code information message, as shown in (2) in fig. 6.
After the test of one function in the test flow is completed and the test is successful, the two-dimensional code information carrying the equipment information and the test result is displayed as shown in (1) in fig. 7, and the character string can also be displayed. After the two-dimensional code information of (1) in fig. 7 is displayed for 1 minute, only the character string is displayed in the two-dimensional code information message, as shown in (2) in fig. 7. Fig. 8 shows an example of two-dimensional code information of test failure. The control equipment can realize information interaction with the electronic equipment through two-dimension code scanning.
The calibration test flow control module comprises a calibration unit, a first test function processing unit, a second test function processing unit and the like, the number of the test function processing units in the calibration test flow control module is the same as the number of functions to be tested in the test flow, and the calibration test flow control module can call each unit in the module according to the test flow. If the test flow is a Sar sensor test flow, the calibration test flow control module comprises a Sar sensor calibration unit, a Sar sensor approaching function test unit and a Sar sensor far away function test unit, wherein the Sar sensor calibration unit is used for calibrating the Sar sensor, the Sar sensor approaching function test unit is used for carrying out approaching function test on the Sar sensor, and the Sar sensor far away function test unit is used for carrying out far away function test on the Sar sensor.
When each module in the MMI test system is called for testing, each module in the MMI test system can acquire data from a kernel layer through an application program architecture layer (such as a sensor management module (SensorManager)), a HAL layer (such as a sensor HAL module (SensorHAL)), such as CDC detected by a Sar sensor and the like. In some cases, each module in the MMI test system may skip the application architecture layer, interact with the HAL layer directly, and acquire data from the HAL layer, and for how each module in the MMI test system acquires data, the embodiment does not further detail nor limit a data acquisition manner, a transmission path through which data passes, and the like, and in the test process of each test flow, the control device may control the electronic device to move according to the function to be tested in the test flow, so that the electronic device satisfies the test condition of the function to be tested in the test flow.
Wherein the control device comprises: the system comprises a flow control module, a two-dimensional code analysis module, a clamp action flow control module and a data uploading processing module, as shown in fig. 5. The flow control module is used for controlling the electronic equipment to run a test flow in the MMI test system, for example, when the control equipment presses a key (such as a volume key) of the electronic equipment, the electronic equipment can run a Sar sensor test flow in the MMI test system, so as to test the Sar sensor in the electronic equipment according to the Sar sensor test flow.
The clamp action flow control module is used for adjusting at least one of the gesture, the position and the like of the electronic equipment after the electronic equipment is fixed on the clamp, so that the electronic equipment can be under the test condition required by the device. For example, when testing the Sar sensor, the clamp motion control flow may control the electronic device to be far away from or near the baffle to simulate a human body to be far away from or near the electronic device, where the baffle is used to simulate a human body.
The control flow of the clamp action flow control module is matched with each sub-flow in the test flow, and the Sar sensor test flow is taken as an example, and is as follows: firstly calibrating the Sar sensor, then testing the approaching function, and finally testing the far-away function; the control flow of the clamp action flow control module is as follows: the electronic equipment is fixed on the clamp, then the electronic equipment is controlled to be close to the baffle under the action of the clamp, and finally the electronic equipment is controlled to be far away from the baffle under the action of the clamp.
The two-dimensional code analysis module can acquire the two-dimensional code displayed by the electronic equipment, and decode the two-dimensional code to obtain equipment information and/or a test result, wherein the equipment information and/or the test result can be uploaded to the cloud through the data uploading processing module. The monitoring equipment can be downloaded from the cloud, and monitoring personnel at the monitoring equipment monitor equipment information and/or test results. The data uploading processing module is also used for compressing and converting formats and the like of the equipment information and/or the test result, and uploading the processing result to the cloud.
Taking the test flow as an Sar sensor test flow as an example, the test method executed when the electronic device invokes each module in the test flow shown in fig. 5 is described, and the flow chart of the test method is shown in fig. 6, which may include the following steps:
S101, acquiring a start type of the Sar sensor test flow, wherein the start type can be obtained from an entry mode customizing unit.
S102, judging whether the starting type comprises compass starting, if yes, executing step S103, and if no, executing step S104.
S103, registering compass event monitoring, wherein the compass event monitoring is used for acquiring data from a compass so as to monitor the use of the compass.
S104, judging whether the initialization layout is successful, if yes, executing step S105, and if not, executing step S129.
The initialization layout may be to configure the display of the two-dimensional code information, for example, to configure the display position of the two-dimensional code information in the screen, and for example, to configure the duration of the display of the two-dimensional code information on the screen, and so on. The initialization layout can also set foolproof thresholds and switches of the thresholds in the foolproof functional module, and the content of the initialization layout design is not described one by one here.
S105, updating the interface information to display the two-dimensional code information carrying the equipment information on the interface, so that the control equipment can extract the equipment information from the two-dimensional code information in a scanning mode, and waiting for the scanning of the control equipment after displaying the two-dimensional code information.
S106, acquiring a test list of the Sar sensor and fool-proof thresholds in the fool-proof function module. The functions of the Sar sensor to be tested, such as calibration, approaching function test and remote function test, of the Sar sensor are recorded in the Sar sensor test list.
S107, judging whether gravity sensing foolproof is supported, if yes, executing step S108, and if no, executing step S109.
S108, registering acceleration event monitoring to acquire data acquired by an acceleration sensor through the acceleration event monitoring, and carrying out gravity sensing foolproof through the data acquired by the acceleration sensor.
S109, judging whether the ambient light foolproof is supported, if yes, executing step S110, and if not, executing step S111.
S110, registering ambient light event monitoring to acquire data acquired by an ambient light sensor through the ambient light event monitoring, and performing ambient light sensing foolproof through the data acquired by the ambient light sensor.
S111, acquiring a Sar sensor calibration list. The way the Sar sensor is calibrated, which calibrations are performed on the Sar sensor, and which Sar sensors are calibrated are recorded in the Sar sensor calibration list. As some examples, the antenna of the electronic device and the peripheral circuit of the Sar sensor are confirmed to be normal by detecting the capacitance value measured by the Sar sensor, and the calibrated threshold is obtained through the initial threshold of the current far-away state, where the calibrated threshold is used for judging whether to approach or be far away, and the peripheral circuit of the Sar sensor is a circuit for supporting the Sar sensor to work normally, such as a power supply circuit. The Sar sensor calibration list may record the number of Sar sensors, calibrate these Sar sensors, calibrate each Sar sensor serially, i.e., after one Sar sensor completes calibration, calibrate another Sar sensor, fail (i.e., fail) the calibration of any Sar sensor, terminate the calibration of other Sar sensors, and terminate the test.
The points to be described here are: when the electronic equipment performs the approaching function test and the separating function test on the Sar sensors, the test results of the Sar sensors are fused into one test result, and the fused test result is used as the test result of the electronic equipment.
S112, preparing to start testing the Sar sensor.
S113, judging whether the starting type is key starting, if yes, executing step S114, and if no, executing step S131. If the start type is button start, which indicates that the test on the Sar sensor can be started by pressing a certain button, step S114 is executed, and the control device presses a button corresponding to the Sar sensor test flow to start. If the start type is not the key start, the start type is the compass start, step S131 is executed, the compass is started, after the compass data is obtained, it is determined whether the compass data satisfies the start condition, and when the start condition is satisfied, S115 is executed. The starting of the compass can control the starting of the first function, but the subsequent function can be started by pressing a volume key, and the compass data can be continuously acquired, so that the subsequent function is triggered when the compass data meets the starting condition of the subsequent function.
And S114, pressing a volume key by the control device to start a test, wherein the first pressing of the volume key indicates that the function in the Sar sensor is to be tested, and before the test, whether the electronic device meets the preset test environment condition is monitored, so that the Sar sensor is tested under a certain environment.
S115, starting fool-proof inspection of the electronic equipment, and if acceleration event monitoring and ambient light event monitoring are registered, carrying out gravity sensing fool-proof and ambient light sensing fool-proof on the electronic equipment. The process of the fool-proof check may be steps S116 to S121.
S116, judging whether the function in the Sar sensor test list does not finish the test yet, if yes, executing step S117, and if not, executing step S130.
S117, judging whether the electronic equipment is ready to start environment inspection, if so, executing step S119, and if not, executing step S118. The environmental check may include gravity-induced fool-proofing and ambient light-induced fool-proofing, depending on the function currently under test.
S118, starting environment inspection after waiting for a period of time, such as starting environment inspection after waiting for 2 seconds.
S119, judging whether environment checking is supported, if yes, executing step S120, and if no, executing step S122.
S120, executing environment inspection.
S121, judging whether the environment check is successful, if so, executing step S122, and if not, executing step S129.
S122, judging whether the number of the functions which are tested is larger than the number of the functions recorded in the Sar sensor test list, if not, executing step S123, and if so, executing step S130.
S123, determining a function to be tested, testing the function, and adding 1 to the number of the functions. The number of functions may be represented by a value of a field, e.g., the field is Index, and after a test of a function is completed, index++ is executed.
S124, judging whether the test is successful, if yes, executing step S125, and if not, executing step S129.
S125, judging whether all functions in the Sar sensor test list are tested, if not, executing step S126, and if so, executing step S127.
S126, waiting for the next function to be tested, and returning to the step S114 to start the next function to be tested by pressing the volume key again.
S127, updating interface information, wherein two-dimensional code information carrying a test result can be displayed on the interface.
And S128, after the two-dimensional code information is displayed for 1 minute, the two-dimensional code information is not displayed any more.
S129, displaying a test failure interface, and executing S130. In the environment inspection stage, the test failure interface displays the environment inspection failure, and in the function test stage, the test failure interface displays the test failure.
S130, displaying a test ending interface, wherein the test ending interface is used for indicating to stop the test, and also indicating state restoration, de-registration and the like, wherein the state restoration is to restore the state of each device in the electronic equipment, and the de-registration can be to remove acceleration event monitoring and ambient light event monitoring.
In some examples, multiple electronic devices may be fixed on the same control device, and each electronic device may respectively operate an MMI test system to test devices in the electronic device, so as to implement parallel testing of the multiple electronic devices, so as to complete parallel calibration of the multiple electronic devices. For example, each electronic device may run a Sar sensor test flow in an MMI test system, test Sar sensors in the electronic devices, and test Sar sensors mainly for testing near functions and far functions, and implement parallel calibration of Sar sensors in a plurality of electronic devices through functional testing.
Fig. 10 shows a schematic diagram of parallel testing of a plurality of electronic devices, where the plurality of electronic devices are fixed by a fixture of a control device, and after the fixing is completed, the control device presses a volume down key of each electronic device to start testing devices in the electronic devices, such as starting testing Sar sensors in the electronic devices. When the electronic equipment is fixed on the control equipment, the electronic equipment can display equipment information of the electronic equipment in a two-dimensional code form, and after the electronic equipment obtains a test result, the test result can also be displayed in a two-dimensional code form. The two-dimensional code analysis module in the control equipment can acquire the two-dimensional code displayed by the electronic equipment, decode the two-dimensional code to obtain equipment information and/or a test result, and upload the equipment information and/or the test result to the cloud. The monitoring equipment can be downloaded from the cloud, and monitoring personnel at the monitoring equipment monitor equipment information and/or test results.
The schematic diagram of fixing the electronic device through the clamp is shown in fig. 11, after the electronic device is fixed, the electronic device can test the Sar sensor, in the test process of the Sar sensor, the clamp can control the electronic device to approach or be far away from the baffle, and also can control the distance between the electronic device and the baffle to be unchanged, and the series of control is matched with the test flow of the Sar sensor. If the clamp action flow control module indicates that the clamp controls the electronic equipment to be far away from the baffle, if the clamp moves to a position with a distance of 70 mm from the baffle, the distance between the electronic equipment and the baffle is 70 mm, which indicates that the test condition corresponding to the calibration flow in the test flow of the Sar sensor is met, at this time, the control equipment firstly presses a volume down key of the electronic equipment to calibrate the Sar sensor, and the clamp action flow control module controls the clamp to be fixed, so that the distance between the electronic equipment and the baffle is unchanged, and under the condition, the Sar sensor is calibrated for a certain period of time (such as calibration for 5.5 seconds); when the control device presses the volume key of the electronic device for the second time, the Sar sensor is tested for the approaching function, before the control device presses the volume key of the electronic device for the second time, the clamp action flow control module can control the clamp to move, when the electronic device approaches the baffle under the movement of the clamp, if the electronic device moves to a position 5mm away from the baffle, the test condition corresponding to the approaching function test sub-flow in the Sar sensor test flow is met, the control device can press the volume key of the electronic device for the second time, and the electronic device calls the approaching function test sub-flow to test the approaching function of the Sar sensor; when the control device presses the volume key of the electronic device for the third time, the remote function test is performed on the Sar sensor, before the volume key of the electronic device is pressed for the third time, the clamp action flow control module can control the clamp to move, the electronic device is far away from the baffle plate when the clamp moves, if the electronic device moves to a position 7 mm away from the baffle plate, the test condition corresponding to the remote function test sub-flow in the Sar sensor test flow is met, the control device can press the volume key of the electronic device for the third time, and the electronic device calls the remote function test sub-flow to perform the remote function test on the Sar sensor. After the test of the Sar sensor is completed, the clamp is reset and is ready for the next test.
In the parallel test process of the plurality of electronic devices, the volume key is pressed for the first time, and the plurality of electronic devices can be calibrated in parallel, namely, one key operation triggers the plurality of electronic devices to calibrate. And the same second time of pressing the volume key triggers a plurality of electronic devices to perform the proximity function test of the Sar sensor, and the third time of pressing the volume key triggers a plurality of electronic devices to perform the remote function test of the Sar sensor. The test flow of any electronic device is as follows:
1) The electronic equipment is placed in the clamp, and the clamp is in a state of being far away from the baffle (a far away state for short), for example, the distance between the clamp and the baffle is 70 mm;
2) The control device presses a volume down key of the electronic device, such as the volume down key can be pressed by the clamp, and the electronic device starts fool-proof check and calibrates the Sar sensor;
3) The clamp firstly moves the electronic equipment to a close-range position, namely the clamp is switched from a state of being far away from the baffle plate to a state of being close to the baffle plate;
4) The clamp presses a volume key, and the electronic equipment starts an approach function test;
5) The clamp moves the electronic equipment to a remote position and returns to a state far away from the baffle;
6) The clamp presses a volume key, and the electronic equipment starts a remote function test;
7) The electronic equipment displays test results in a two-dimensional code form, wherein the test results comprise test results of calibration, approaching function test and far function test, and in practical application, one function test can be completed to display one test result;
8) And the electronic equipment performs screen burn prevention treatment.
Under this test flow, an interaction diagram between the electronic device and the control device is shown in fig. 12, and may include the following steps:
S201, the clamp moves to a position with a distance of 70mm from the baffle.
S202, fixing the electronic equipment by the clamp.
S203, the electronic equipment enters a Sar sensor testing flow to start testing the Sar sensor.
S204, the electronic equipment completes the initialization layout, and displays the two-dimensional code carrying the equipment information of the electronic equipment, such as the two-dimensional code carrying the product Serial Number (SN), after the initialization layout is successful.
S205, after the electronic equipment is fixed by the clamp, the scanning device starts scanning, and the scanning device can be a device in the control equipment or can be a device interacting with the control equipment.
S206, the control device acquires device information of the electronic device from the two-dimensional code, and controls the electronic device to enter a test space, and the process is called on-line control station.
S207, the clamp determines to calibrate the Sar sensor for 5.5 seconds, and in the calibration process, the clamp can control the position of the electronic equipment to be unchanged.
S208, pressing a volume down key of the electronic equipment by the clamp, and starting calibration by the Sar sensor.
S209, the clamp moves to a position with a distance of 5mm from the baffle. The clamp movement can be after calibration is completed, or the clamp can determine the time for approaching the baffle according to historical data. For another example, after the fixture presses the volume key of the electronic device, the fixture waits for a period of time, and then moves to a position 5mm away from the baffle, and the fixture considers that the Sar sensor is calibrated under the waiting period of time.
And S210, after the clamp moves to a position with a distance of 5mm from the baffle, determining that the Sar sensor can be subjected to proximity function test.
S211, the clamp presses the volume down key of the electronic equipment again, and the Sar sensor starts to approach the function test.
S212, the clamp moves to a position with a distance of 70 mm from the baffle. The clamp can move to a moment away from the baffle plate after the approaching function test is completed or the clamp can be used for determining the moment away from the baffle plate according to historical data. For another example, after the fixture presses the volume key of the electronic device, the fixture waits for a period of time, and then moves to a position 70 mm away from the baffle, and the fixture considers that the Sar sensor completes the proximity function test under the waiting time.
And S213, after the clamp moves to a position 70 mm away from the baffle, determining that the far-away function test can be performed on the Sar sensor.
S214, pressing the volume key of the electronic equipment again by the clamp, starting to keep away from the function test by the Sar sensor, updating the two-dimensional code information after the function test is finished, and displaying the test result in the updated two-dimensional code information.
And S215, the electronic equipment does not display the two-dimensional code information after displaying the two-dimensional code information for a period of time.
S216, resetting the clamp, and ending the test.
S217, the scanning device waits for a certain time according to the action flow of the clamp, and mainly waits for the clamp control electronic equipment to finish the function test of the Sar sensor.
And S218, after the scanning device determines that the clamp action is finished, scanning the two-dimensional code information displayed by the electronic equipment to obtain a test result.
S219, after the test is completed, the electronic device is removed from the test space, a process called on-line control out-of-line.
After the volume key of the electronic equipment is pressed by the clamp each time, the test is started after a period of time, and the purpose of the delay is to wait for the cylinder of the clamp to reset, for example, wait for 0.2 seconds to reset the cylinder, so that the possibility of regarding the cylinder as a baffle is reduced, the influence on the test of the Sar sensor is reduced, and the accuracy of the test is improved. In addition to starting the test by pressing a button of the electronic device, the electronic device and the control device may control the test in an information interaction manner, for example, after the electronic device is fixed by the fixture, an instruction indicating that the fixing is completed is sent to the electronic device, and the calibration test may be started. The electronic equipment starts to calibrate after receiving the instruction; for example, after the electronic device completes a function test, an instruction for completing the function test is sent to the control device, after the control device receives the instruction, the gesture and the position of the electronic device can be changed through the clamp, after the control device completes the function test, the instruction is sent to the electronic device, the electronic device can determine whether the test condition of the function to be tested is met through gesture data carried in the instruction, and if the test condition of the function to be tested is met, the test of the function can be started.
The present application provides an electronic device, including: one or more processors; one or more memories; the memory stores one or more programs that, when executed by the processor, cause the electronic device to perform the test methods described above.
The present application provides a computer-readable storage medium in which a computer program is stored which, when executed by a processor, causes the processor to perform the above-described test method.
Claims (13)
1. A method of testing, the method being applied to an electronic device having a human-machine interaction testing system storing at least one test procedure for testing a function of a device in the electronic device, the method comprising:
Invoking a calibration flow in the test flow to calibrate the device to obtain a calibration result;
in response to the calibration result indicating that the device is normal, each test sub-process in the test process is processed as follows:
Determining that the electronic equipment meets a test condition;
Invoking a testing sub-flow matched with the testing condition in the testing flow, and testing the function corresponding to the testing sub-flow in the device;
When the electronic equipment meets a first test condition, a first test sub-flow matched with the first test condition in the test flow is called to test a first function of the device; and when the electronic equipment meets the second test condition, invoking a second test sub-process matched with the second test condition in the test process to test a second function of the device so as to realize an automatic test process.
2. The method of claim 1, wherein the determining that the electronic device satisfies a test condition in response to the calibration result indicating that the device is normal comprises:
and responding to the calibration result to indicate that the device is normal, determining that a component in the electronic equipment is touched by control equipment, wherein the control equipment is used for touching the component when the electronic equipment meets preset conditions.
3. The method of claim 2, wherein said invoking a test sub-flow of the test flow that matches the test condition comprises: and after determining that the components in the electronic equipment are touched by the control equipment, delaying a first preset duration to call a test sub-flow matched with the test condition in the test flow.
4. The method of claim 1, wherein the determining that the electronic device satisfies a test condition in response to the calibration result indicating that the device is normal comprises:
Responding to the calibration result to indicate that the device is normal, and acquiring parameter values of test influence parameters of the electronic equipment, wherein the test influence parameters comprise at least one of the position of the electronic equipment, the gesture of the electronic equipment and the environmental parameters of the environment where the electronic equipment is located;
And if the parameter value of the test influence parameter of the electronic equipment is a preset parameter value, determining that the electronic equipment meets the test condition.
5. The method of any one of claims 1 to 4, wherein prior to said invoking the calibration procedure in the test procedure, the method further comprises: performing fool-proof inspection on the electronic equipment to obtain a fool-proof inspection result, and calling a calibration flow when the fool-proof inspection result indicates that the fool-proof inspection is successful;
And/or the number of the groups of groups,
Before the invoking the test sub-flow, the method further comprises: and carrying out fool-proof inspection on the electronic equipment to obtain a fool-proof inspection result, and calling a testing sub-flow when the fool-proof inspection result indicates that the fool-proof inspection is successful.
6. The method of claim 2, wherein prior to said invoking the calibration procedure of the test procedure to calibrate the device, the method further comprises: the method comprises the steps that equipment information of the electronic equipment is displayed in a first display mode, and the control equipment is used for triggering a component of the electronic equipment pointed by the equipment information after the equipment information is acquired and when the electronic equipment meets preset conditions;
After the testing of the function of the device corresponding to the test sub-flow, the method further includes: and displaying the test result of the electronic equipment in the first display mode.
7. The method of claim 6, wherein the method further comprises: and after the equipment information and/or the test result are displayed for a second preset time, displaying the equipment information and/or the test result in a second display mode, wherein the power consumption of the first display mode is larger than that of the second display mode.
8. The method according to any one of claims 1-4, 6 and 7, wherein the human-machine interaction test system is arranged on an application layer of the electronic device, and the human-machine interaction test system comprises an entrance management module and a calibration test flow control module;
The entrance management module is used for setting starting conditions of each flow in the test flows, and determining that the test conditions are met when the starting conditions are met;
The calibration test flow control module is used for calling a calibration flow in the test flow and calibrating the device to obtain a calibration result; in response to the calibration result indicating that the device is normal, each test sub-process in the test process is processed as follows:
Determining that the electronic equipment meets a test condition; and calling a testing sub-flow matched with the testing condition in the testing flow, and testing the function corresponding to the testing sub-flow in the device.
9. The method of claim 8, wherein the human-machine interaction testing system further comprises: a fool-proof function module;
The fool-proof function module is used for selecting fool-proof inspection corresponding to the test flow from multiple fool-proof inspections, and carrying out fool-proof inspection when the test flow is called;
The entrance management module is further configured to provide a plurality of starting conditions, and select a starting condition of each process in the test process from the plurality of starting conditions.
10. The method of claim 8, wherein the human-machine interaction testing system further comprises: testing the display module and the screen protection design module;
The test display module is used for displaying equipment information and/or test results of the electronic equipment;
and the screen protection design module is used for controlling the equipment information and/or the display mode of the test result.
11. The method of any one of claims 1-4, 6,7, 9, and 10, wherein the test procedure is a test procedure of a specific absorption rate sensor in the electronic device, the test procedure of the specific absorption rate sensor including a calibration procedure, a near function test sub-procedure, and a far function test sub-procedure;
After the electronic equipment is determined to be close to a test object, invoking the approaching function test sub-flow to test the approaching function of the specific absorption rate sensor;
and after the electronic equipment is determined to be far away from the test object, calling the far-away function test sub-flow to test the far-away function of the specific absorption rate sensor.
12. An electronic device, the electronic device comprising:
one or more processors;
one or more memories;
the memory stores one or more programs that, when executed by the processor, cause the electronic device to perform the test method of any of claims 1-11.
13. A computer readable storage medium, wherein a computer program is stored in the computer readable storage medium, which when executed by a processor causes the processor to perform the test method of any one of claims 1 to 11.
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