CN116711048A - Method for managing a circuit breaker and controller for a circuit breaker - Google Patents
Method for managing a circuit breaker and controller for a circuit breaker Download PDFInfo
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- CN116711048A CN116711048A CN202180090424.XA CN202180090424A CN116711048A CN 116711048 A CN116711048 A CN 116711048A CN 202180090424 A CN202180090424 A CN 202180090424A CN 116711048 A CN116711048 A CN 116711048A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
- G01R31/3271—Testing of circuit interrupters, switches or circuit-breakers of high voltage or medium voltage devices
- G01R31/3275—Fault detection or status indication
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H71/00—Details of the protective switches or relays covered by groups H01H73/00 - H01H83/00
- H01H71/74—Means for adjusting the conditions under which the device will function to provide protection
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Abstract
Embodiments of the present disclosure relate to a method for managing a circuit breaker and a controller of the circuit breaker. In the method, at least one test time interval of at least one monitoring current caused by applying at least one monitoring voltage to a coil of the circuit breaker is acquired, the at least one test time interval being between at least one action point and at least one change point. The point of change of the actual current caused by the application of the actual voltage to the coil is monitored. An action point of the actual current is determined based at least on the change point of the actual current and the at least one test time interval. With these embodiments, the action point can be determined in a simple manner without the need to deploy a voltage sensor in the circuit breaker.
Description
Technical Field
Embodiments of the present disclosure relate generally to the field of circuit breakers, and more particularly, to a method for managing a circuit breaker and a controller for a circuit breaker.
Background
Circuit breakers generally do not contain a voltage monitoring unit inside, especially for those circuit breakers of simple construction. In these cases, the point in time when the operating voltage is applied to the coil of the circuit breaker to operate the circuit breaker cannot be obtained. As a result, the closing time and the opening time of the circuit breaker cannot be determined. To monitor the time at which the actuation voltage is applied to the coil, a dedicated sensor is provided to the circuit breaker, which may increase the complexity and volume of the circuit breaker.
Accordingly, there is a need for an improved method of determining the point in time at which an action voltage is applied to a circuit breaker. Accordingly, the closing time and the opening time of the circuit breaker may be determined based on the determined time point.
Disclosure of Invention
In view of the above, various example embodiments of the present disclosure provide a method for managing a circuit breaker and a controller of the circuit breaker for determining a point in time when an action voltage is applied to the circuit breaker in a highly accurate, low-complexity, and highly reliable manner.
In a first aspect of the present disclosure, example embodiments of the present disclosure provide a method for managing a circuit breaker. The method comprises the following steps: for at least one test current caused by applying at least one test voltage to a coil of the circuit breaker, obtaining at least one test time interval between at least one action point and at least one change point, the at least one action point representing at least one point in time at which the at least one test voltage is applied to the coil to act the circuit breaker, and the at least one change point representing at least one point in time at which the at least one test current in the coil begins to change; monitoring a change point of an actual current caused by applying an actual voltage to the coil, the change point of the actual current representing a point in time when the actual current in the coil starts to change; and determining an action point of the actual current based at least on the change point of the actual current and the at least one test time interval, the action point of the actual current representing a point in time when the actual voltage is applied to the coil. In these embodiments, the action point of the actual current can be determined in a simple manner without the need to deploy a voltage sensor in the circuit breaker, which results in a lower complexity and smaller circuit breaker.
In some embodiments, determining the action point of the actual current further comprises: acquiring at least one test waveform of at least one test current in the coil; selecting a closest test waveform from the at least one test waveform that is closest to an actual waveform of an actual current in the coil; and determining an action point of the actual current based on the closest test waveform. By means of these embodiments, the action point of the actual current at different actual voltages can be accurately determined, which increases the range of application of the method.
In some embodiments, determining the action point of the actual current based on the closest test waveform comprises: selecting a test time interval corresponding to the closest test waveform from the at least one test time interval; and determining an action point of the actual current based on the change point of the actual current and the selected test time interval. With these embodiments, the accuracy of the determination of the action point of the actual current can be improved.
In some embodiments, selecting the closest test waveform further comprises: determining at least one similarity between the actual waveform and at least one test waveform; and selecting a closest test waveform based on the at least one similarity. With these embodiments, the closest test waveform can be selected using a variety of similarities, and the accuracy of the selection of the closest test waveform can be improved.
In some embodiments, determining the at least one similarity comprises: with respect to a target test waveform of the at least one test waveform, determining at least one target slope for the target test waveform associated with the at least one target point after a point of change in the test current corresponding to the target test waveform; determining at least one slope for an actual waveform associated with at least one point in time corresponding to at least one target point after a point of change in the actual current; and determining a similarity between the actual waveform and the target test waveform based on a comparison of the at least one target slope and the at least one slope. With these embodiments, the closest waveform may be determined by comparing the slopes at corresponding points in the test waveform and the actual waveform. It provides a simple method for determining the closest waveform.
In some embodiments, determining at least one slope of the actual waveform comprises: generating a line associated with a point in time in the at least one point in time based on any one of: a tangent to the actual waveform at the point in time, a line defined by the point in time and another point in time in at least one point in time; and determining a slope of the actual waveform based on the slope of the line. With these embodiments, the closest waveform can be determined in various ways, and the accuracy of the determination of the closest waveform can be improved.
In some embodiments, the method further comprises: monitoring a rigid point of the circuit breaker, wherein the rigid point represents a time point when the action of the circuit breaker is completed; and acquiring the operation time of the circuit breaker based on the action point of the actual current and the rigid point of the actual current. With these embodiments, in the case where the point in time at which the actual voltage is applied to the coil cannot be acquired, the action time of the circuit breaker, that is, the closing time and the opening time of the circuit breaker can be determined. Thus, the method herein provides a wider range of applications than the common method of determining the closing and opening times of a circuit breaker.
In a second aspect of the present disclosure, example embodiments of the present disclosure provide a controller of a circuit breaker. The controller includes a storage module configured to store at least one test time interval of at least one test current between at least one action point and at least one change point caused by applying at least one test voltage to a coil of the circuit breaker, the at least one action point representing at least one point in time at which the at least one test voltage is applied to the coil to act the circuit breaker, and the at least one change point representing at least one point in time at which the at least one test current in the coil begins to change; a monitoring module configured to monitor a change point of an actual current caused by applying an actual voltage to the coil, the change point of the actual current representing a point in time at which the actual current in the coil starts to change; and a time determination module configured to determine an action point of the actual current, which represents a point in time at which the actual voltage is applied to the coil, based at least on the change point of the actual current and the at least one test time interval.
In some embodiments, the storage module is further configured to store at least one test waveform of at least one test current in the coil, the monitoring module is further configured to measure an actual waveform of an actual current in the coil, and the time determination module is further configured to: acquiring at least one test waveform; selecting a closest test waveform from the at least one test waveform that is closest to the actual waveform; and determining an action point of the actual current based on the closest test waveform.
In some embodiments, the time determination module is further configured to: selecting a test time interval corresponding to the closest test waveform from the at least one test time interval; and determining an action point of the actual current based on the change point of the actual current and the selected test time interval.
In some embodiments, the time determination module is further configured to: determining at least one similarity between the actual waveform and at least one test waveform; and selecting a closest test waveform based on the at least one similarity.
In some embodiments, the time determination module is further configured to: with respect to a target test waveform among the at least one test waveform: determining at least one target slope for a target test waveform associated with at least one target point following a point of change in test current corresponding to the target test waveform; determining at least one slope for an actual waveform associated with at least one point in time corresponding to at least one target point after a point of change in the actual current; and determining a similarity between the actual waveform and the target test waveform based on a comparison of the at least one target slope and the at least one slope.
In some embodiments, the time determination module is further configured to: generating a line associated with a point in time in the at least one point in time based on any one of: a tangent to the actual waveform at the point in time, a line defined by the point in time and another point in time of the at least one point in time; and determining the slope of the actual waveform based on the slope of the line.
In some embodiments, the monitoring module is further configured to monitor a rigid point of the actual current, the rigid point representing a point in time when the action of the circuit breaker is completed, wherein the time determination module is further configured to obtain the operating time of the circuit breaker based on the point in action of the actual current and the rigid point of the actual current.
It should be appreciated that the "summary of the invention" section is not intended to identify key or essential features of the embodiments of the disclosure, nor is it intended to limit the scope of the disclosure. Other features of the present disclosure will become apparent from the following description.
Drawings
The foregoing and other objects, features and advantages of the example embodiments disclosed herein will become more readily apparent from the following detailed description, which proceeds with reference to the accompanying drawings. In the accompanying drawings, several exemplary embodiments disclosed herein will be shown by way of example and not limitation, in which:
FIG. 1 is a schematic diagram illustrating the principle of an action point for determining an actual current according to an embodiment of the present disclosure;
fig. 2 is a flowchart illustrating a method for managing a circuit breaker according to an embodiment of the present disclosure;
FIG. 3 is a schematic diagram illustrating a process of determining at least one slope of an actual waveform according to an embodiment of the present disclosure;
FIG. 4 is a schematic diagram illustrating a process of determining at least one slope of an actual waveform according to another embodiment of the present disclosure; and
fig. 5 is a schematic diagram illustrating a controller of a circuit breaker according to an embodiment of the present disclosure.
Throughout the drawings, the same or similar reference numerals are used to designate the same or similar elements.
Detailed Description
The principles of the present disclosure will now be described with reference to several example embodiments shown in the drawings. While example embodiments of the disclosure are illustrated in the drawings, it should be understood that these embodiments are merely provided to facilitate a better understanding by those skilled in the art and to thereby practice the disclosure and are not intended to limit the scope of the disclosure in any way.
The terms "include" or "comprise" and variations thereof are to be understood as open-ended terms, meaning "including, but not limited to. The term "or" should be understood as "and/or" unless the context clearly indicates otherwise. The term "based on" should be understood as "based at least in part on". The term "operable to" refers to a function, action, motion or state that can be achieved through an operation introduced by a user or an external mechanism. The terms "one embodiment" and "an embodiment" should be understood as "at least one embodiment". The term "another embodiment" should be read as "at least another embodiment". The terms "first," "second," and the like may refer to different or the same object. Other explicit and implicit definitions may be included below. Unless the context clearly indicates otherwise, the definition of terms is consistent throughout the description.
Some methods have been provided to determine the point in time at which the actuation voltage is applied to the coil. In some approaches, a specific voltage monitoring unit and a specific voltage monitoring interface are provided on the circuit board of the circuit breaker, thereby increasing the complexity and size of the circuit breaker. It is therefore desirable to provide an efficient solution for determining the point in time at which an action voltage is applied.
In view of the above-described drawbacks, embodiments of the present disclosure provide a method for managing a circuit breaker and a controller of the circuit breaker. For ease of description, the following paragraphs first provide a brief description of some terms used in this disclosure with reference to fig. 1. Fig. 1 is a schematic diagram 100 illustrating the principle of an action point for determining an actual current according to an embodiment of the present disclosure. In fig. 1, graphs 110 and 120 represent waveforms associated with actual current and test current, respectively. The action point (shown as T1 in fig. 1) represents a point of time when a test voltage is applied to the coil of the circuit breaker to act the circuit breaker. The point of change (shown as T2 in fig. 1) represents the point in time at which the test current in the coil begins to change. The test time interval (shown as T in fig. 1) represents the time interval between the action point T1 and the change point T2. Similarly, the action point of the actual current (as shown by T1' in fig. 1) represents the point in time when the actual voltage is applied to the coil. The point of change in the actual current (shown as T2' in fig. 1) represents the point in time at which the actual current in the coil begins to change.
According to an embodiment of the present disclosure, the action point T1 'of the actual current is determined based on the change point T2' of the actual current and the test time interval T. The above idea can be implemented in various ways, which will be described in detail in the following paragraphs.
Hereinafter, details of the present disclosure will be described with reference to fig. 1 to 4. As shown in fig. 1, graph 120 represents a test waveform of a test current in a coil of a circuit breaker caused by applying a test voltage to the coil during a test phase. The time points T1 and T2 may be measured during the test phase and the test time interval T may be acquired based on the time points T1, T2. That is, t=t2—t1. Here, the test phase may be implemented before the circuit breaker is actually put into use. For example, the test phase may be implemented during factory testing.
Further, graph 110 represents an actual waveform of an actual current in the coil caused by applying an actual voltage to the coil during the operational phase. Here, the operation phase is a phase in which the circuit breaker is actually put into use. During the operational phase, the actual voltage is applied to the coil. Here, the actual action point T1 'cannot be directly acquired, and the change point T2' of the actual current may be measured by the current monitoring device. Based on the test time interval T and the change point T2 'of the actual current, the action point T1' of the actual current can be determined as: t1 '=t2' -T.
In contrast to existing solutions where the action point T1' of the actual current is directly measured by the voltage monitoring unit, the method herein does not require a voltage monitoring unit. Thus, the complexity and volume of the circuit breaker may be reduced.
Fig. 2 is a flowchart illustrating a method 200 for managing a circuit breaker according to an embodiment of the present disclosure. The method 200 in fig. 2 may be implemented by any circuit breaker controller of the present disclosure.
At 210, at least one test time interval T is acquired. Here, the above-described test time interval T, action point T1, and change point T2 are measured during the test phase. For example, one or more test voltages may be applied to the coil, and then a set of T, T and T2 may be obtained from measurements associated with each test voltage. The test time interval T may be determined by subtracting T1 from T2. The resulting test time interval T may be stored in the memory device during the test phase. In some embodiments, at least one test waveform of at least one test current in the coil at least one test voltage is measured and stored during the test phase, and at least one test time interval T may be obtained from the at least one test waveform. Here, the stored T, T, T2 and test waveforms may be read from the memory device during an operational phase.
In some embodiments, only one action point T1 and only one change point T2 are measured and stored during the test phase. In some embodiments, the test voltage is the rated voltage of the coil. In other embodiments, the test voltage may be set to another value, for example, 90% of the rated voltage, 110% of the rated voltage, and so on. It should be understood that the above values are merely examples, and the scope of the present disclosure is not limited thereto.
In some embodiments, only one test waveform at one test voltage is measured and stored during the test phase. In some embodiments, the test voltage is the rated voltage of the coil. In other embodiments, the test voltage may be set to another value, for example, 90% of the rated voltage, 110% of the rated voltage, and so on. It should be understood that the above values are merely examples, and the scope of the present disclosure is not limited thereto.
In some embodiments, more than one action point T1 and more than one change point T2 at different test voltages are measured and stored during the test phase. In some embodiments, the test voltage may be in the range of 80% to 110% of the coil rated voltage. In other embodiments, the range may be set to another value, such as 64% to 79% of rated voltage, or the like. It should be understood that the above values are merely examples, and the scope of the present disclosure is not limited thereto.
In some embodiments, more than one test waveform at different test voltages is measured and stored during the test phase. In some embodiments, the test voltage may be in the range of 80% to 110% of the rated voltage of the coil. In other embodiments, the range may be set to another value, such as 64% to 79% of rated voltage, or the like. It should be understood that the above values are merely examples, and the scope of the present disclosure is not limited thereto.
Still referring to fig. 2, at 220, the point of change T2' of the actual current is monitored. In some embodiments, the point of change T2' of the actual current is monitored by a current monitor (e.g., hall sensor) during the operational phase. In other embodiments, the current monitor may be implemented by another type of monitor. It should be understood that the above types are examples only, and the scope of the present disclosure is not limited thereto.
In some embodiments, the point of change T2' of the actual current is obtained from the actual waveform of the actual current in the coil. The actual waveform is measured by a current monitor (e.g., hall sensor) during the operational phase. Alternatively and/or additionally, the current monitor may be implemented by another type of monitor. It should be understood that the above types are examples only, and the scope of the present disclosure is not limited thereto.
Still referring to fig. 2, at 230, an action point T1 'of the actual current is determined based on the change point T2' of the actual current and the test time interval T. That is, the operation point T1 '=t2' -T of the actual current. During the operating phase, when the actual voltage is stabilized and set at or near a fixed value (e.g., the rated voltage of the coil), only one test time interval T below or near the fixed value is required to determine the action point T1' of the actual current.
When the actual voltage is unstable and varies in the range of, for example, 60% to 110% of the rated voltage, the actual time interval T 'between the actual operating point and the variation point T2' of the actual current varies according to the variation of the actual voltage. Thus, when determining the action point T1' of the actual current, more than one test time interval at different test voltages within this range is required. The closest test time interval to the actual time interval T 'closest to the actual current is selected to determine the action point T1'.
Acquiring more than one test time interval may provide a more accurate determination of the action point T1' of the actual current for more actual voltages than if only one test time interval was acquired. The more test time intervals that are measured and stored during the test phase, the higher the accuracy of the action point T1' that determines the actual current can be provided during the operational phase. In some embodiments, the number of test time intervals is ten. In other embodiments, another number is possible, e.g., 5, 15, etc. It should be understood that the above values are merely examples, and the scope of the present disclosure is not limited thereto.
To determine the closest test time interval, other information than the action point T1 and the change point T2 of the current in the coil may be acquired. In some embodiments, the closest test time interval is based on the closest test waveform. When the closest test waveform is determined, then a test time interval T corresponding to the closest test waveform is selected.
To select the closest test waveform, at least one similarity between the actual waveform and each test waveform may be determined. In some embodiments, the actual waveform is compared to the target test waveform. With respect to a target test waveform among the test waveforms, a target slope of the target test waveform associated with a target point Ta after a change point T2 of the test current corresponding to the target test waveform is determined. Then, the slope of the actual waveform associated with the time point Ta 'corresponding to the target point Ta after the change point T2' of the actual current is determined. Next, a similarity between the actual waveform and the target test waveform is determined based on the target slope and the comparison of the slopes. With these embodiments, the closest waveform may be determined by comparing the slopes of the corresponding points in the test waveform and the actual waveform. It provides a simple method for determining the closest waveform.
In some embodiments, more than one slope of the actual waveform and the target test waveform is determined for more accurate comparison between the actual waveform and the target test waveform. With these embodiments, the accuracy of the determination of the closest test waveform may be improved. Fig. 3 illustrates a process 300 of determining at least one slope of an actual waveform in accordance with an embodiment of the present disclosure. As shown in fig. 3, graph 310 represents a target test waveform and graph 320 represents an actual waveform. A tangent 330 to the actual waveform at a point in time Ta' is generated and the slope of the actual waveform is determined based on the slope of the tangent 330. Further, a tangent 340 of the target test waveform at the time point Ta is generated, and the slope of the target test waveform is determined based on the slope of the tangent 340. The time interval between Ta and T2 is the same as the time interval between Ta 'and T2'. The slope of each test waveform is determined in a similar manner, and the slope closest to the slope of the actual waveform is selected from the slopes of the test waveforms. Thus, the test waveform corresponding to the closest slope is determined.
Having described determining the slope based on a tangent line at one point, the slope will be determined based on a line defined by two points with reference to fig. 4. Fig. 4 illustrates a process 400 of determining at least one slope of an actual waveform according to another embodiment of the present disclosure. As shown in fig. 4, graph 410 represents a target test waveform and graph 420 represents an actual waveform. A line 430 of the actual waveform defined by the point in time Ta 'and the further point in time Tb' is generated, for example, spanning Ta 'and Tb'. The slope of the actual waveform is then determined based on the slope of line 430. Further, a line 440 of the target test waveform defined by the time point Ta and another time point Tb' is generated, and the slope of the target test waveform is determined based on the slope of the line 440. The time interval between Ta and T2 is the same as the time interval between Ta 'and T2', and the time interval between Ta and Tb is the same as the time interval between Ta 'and Tb'. The slope of each test waveform is determined and the slope closest to the slope of the actual waveform is selected from the slopes of the test waveforms. Thus, the test waveform corresponding to the closest slope is determined.
In some embodiments, multiple pairs of points may be used to determine multiple slopes of the actual waveform and multiple slopes of the target test waveform for further comparison. In these cases, the accuracy of the selection of the closest waveform can be improved.
After determining the action point T1 'of the actual current, the completion time point T3' at which the action of the circuit breaker is completed may be monitored. The actions of the circuit breaker include opening the circuit breaker and closing the circuit breaker. The opening time and closing time of the circuit breaker can be determined by using the action point T1 'and the completion time point T3' of the actual current.
In contrast to the solution in which the action point T1 'of the actual current is determined by the voltage monitoring unit, the method shown in fig. 1-4 does not require a voltage monitoring unit, while the accuracy of the determination of the action point T1' of the actual current is ensured. Thus, the closing time and opening time of the circuit breaker are determined in a highly accurate, low-complexity and highly reliable manner.
Hereinafter, a controller of the circuit breaker of the present disclosure will be described in detail with reference to fig. 5. Fig. 5 is a schematic diagram illustrating a controller of a circuit breaker according to an embodiment of the present disclosure. As shown in fig. 5, the controller 500 generally includes a storage module 510, a monitoring module 520, and a time determination module 530.
The storage module 510 may be configured to store the test time interval T. In some embodiments, the memory module 510 may also be configured to store a test waveform of the test current in the coil.
In some embodiments, the storage module 510 includes a machine-readable storage medium. More specific examples of a machine-readable storage medium would include an electrical connection having one or more wires, a portable computer diskette, a hard disk, a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing. In other embodiments, the storage module 510 may be implemented by other types of storage devices. It should be understood that the above types are examples only, and the scope of the present disclosure is not limited thereto.
The monitoring module 520 may be configured to monitor the point of change T2' of the actual current. That is, when the current in the coil begins to change after the operating voltage is applied to the coil, the point in time of the change is recorded by the monitoring module 520.
In some embodiments, the monitoring module 520 may also be configured to measure an actual waveform of an actual current in the coil. That is, the current value of the current in the coil and the time information are recorded by the monitoring module 520.
In some embodiments, the monitoring module 520 may also be configured to monitor the completion time point of the circuit breaker. That is, when the current or voltage of the circuit breaker changes, the point in time at which the change occurs is recorded by the monitoring module 520.
In some embodiments, the monitoring module 520 may include a current sensor, such as a hall sensor or the like. In other embodiments, the monitoring module 520 may include a voltage sensor. It should be understood that the above types are examples only, and the scope of the present disclosure is not limited thereto.
The time determination module 530 may be configured to obtain the change point T2' of the actual current from the monitoring module 520 and the test time interval T from the storage module 510, and may be configured to determine the action point T1' of the actual current based on T2' and T. For example, the time determination module 530 may determine T1 'by subtracting T from T2'. I.e., T1 '=t2' -T.
In some embodiments, the time determination module 530 may also be configured to obtain the test waveform from the storage module 510 and the actual waveform from the monitoring module 520. The time determination module 530 may also be configured to determine a point of change T2' of the actual current from the actual waveform and determine the test time interval T from the test waveform.
In some embodiments, the time determination module 530 may also be configured to obtain more than one test waveform from the storage module 510 and the actual waveform from the monitoring module 520. The time determination module 530 may be further configured to select a closest test waveform closest to the actual waveform from among the test waveforms, and to acquire the test time interval T according to the closest test waveform.
In some embodiments, the time determination module 530 may be further configured to determine at least one similarity between the actual waveform and each test waveform, and select a closest test waveform based on the at least one similarity.
In some embodiments, the time determination module 530 may be configured to determine a target slope of the target test waveform, the target slope being associated with the target point Ta after the change point T2 of the target test waveform. Next, the time determination module 530 may be configured to determine a slope of the actual waveform, the slope being associated with a point in time Ta ' after the point of change T2' of the actual current, the point in time Ta ' corresponding to the target point Ta. Next, the time determination module 530 may be configured to determine a similarity between the actual waveform and the target test waveform based on the target slope and a comparison of the slope.
In some embodiments, the time determination module 530 compares more than one slope of the actual waveform with more than one target slope of the target test waveform to make a more accurate comparison between the actual waveform and the target test waveform.
In some embodiments, the target slope is the slope of the tangent to the target point Ta and the slope of the actual waveform is the slope of the tangent to the point Ta'. In some embodiments, the target slope is the slope of a line across a pair of points on the target test waveform at points in time Ta 'and Tb', and the slope of the actual waveform is the slope of a line across a pair of points on the actual waveform at points in time Ta and Tb. The time interval between Ta and T2 is the same as the time interval between Ta 'and T2', and the time interval between Ta and Tb is the same as the time interval between Ta 'and Tb'. The slope of each test waveform is determined and the slope closest to the slope of the actual waveform is selected from the slopes of the test waveforms. Thus, the test waveform corresponding to the closest slope is determined.
In some embodiments, multiple pairs of points may be used to determine multiple slopes of the actual waveform and multiple slopes of the target test waveform for further comparison.
In some embodiments, the time determination module 530 is further configured to obtain a completion time point T3' of the circuit breaker from the monitoring module 520, and determine a break or a close time of the circuit breaker based on T3' and T1'. For example, the time determination module 530 may determine the opening or closing time of the circuit breaker by subtracting T1 'from T3', i.e., T3'-T1'.
In some embodiments, the time determination module 530 includes a Single Chip Microcomputer (SCM). In other embodiments, the time determination module 530 may be other types of controllers, such as a DSP, etc. It should be understood that the above types are exemplary only, and the scope of the present disclosure is not limited in this respect.
Although several inventive embodiments have been described and illustrated herein, various other means and/or structures for performing the functions and/or obtaining the results and/or one or more advantages described herein will be apparent to those of ordinary skill in the art, and each of such variations and/or modifications is deemed to be within the scope of the inventive embodiments described herein. More generally, those skilled in the art will readily appreciate that all parameters, dimensions, materials, and configurations described herein are meant to be exemplary and that the actual parameters, dimensions, and/or configurations will depend upon the specific application or applications for which the teachings of the present invention are used. Those skilled in the art will recognize, or be able to ascertain using no more than routine experimentation, many equivalents to the specific inventive embodiments described herein. It is, therefore, to be understood that the foregoing embodiments are presented by way of example only and that, within the scope of the appended claims and equivalents thereto, inventive embodiments may be practiced otherwise than as specifically described and claimed. Inventive embodiments of the present disclosure relate to each individual feature, system, article, material, kit, and/or method described herein. Furthermore, if two or more such features, systems, articles, materials, kits, and/or methods are not mutually inconsistent, any combination of two or more such features, systems, articles, materials, kits, and/or methods is included within the scope of the present disclosure.
Claims (14)
1. A method (200) for managing a circuit breaker, comprising:
obtaining (210) at least one test time interval between at least one action point and at least one change point for at least one test current caused by applying at least one test voltage to a coil of the circuit breaker, the at least one action point representing at least one point in time when the at least one test voltage is applied to the coil to act the circuit breaker, and the at least one change point representing at least one point in time when at least one test current in the coil begins to change;
-monitoring (220) a point of change of an actual current caused by applying an actual voltage to the coil, the point of change of the actual current representing a point in time when the actual current in the coil starts to change; and
an action point of the actual current is determined (230) based at least on the change point of the actual current and the at least one test time interval, the action point of the actual current representing a point in time when the actual voltage is applied to the coil.
2. The method (200) of claim 1, wherein determining (230) the action point of the actual current further comprises:
acquiring at least one test waveform of the at least one test current in the coil;
selecting a closest test waveform from the at least one test waveform that is closest to an actual waveform of the actual current in the coil; and
the action point of the actual current is determined based on the closest test waveform.
3. The method (200) of claim 2, wherein determining (230) the action point of the actual current based on the closest test waveform comprises:
selecting a test time interval corresponding to the closest test waveform from the at least one test time interval; and
the action point of the actual current is determined based on the change point of the actual current and the selected test time interval.
4. The method (200) of claim 2, wherein selecting the closest test waveform further comprises:
determining at least one similarity between the actual waveform and the at least one test waveform; and
the closest test waveform is selected based on the at least one similarity.
5. The method (200) of claim 4, wherein determining the at least one similarity comprises: with respect to a target test waveform of the at least one test waveform,
determining at least one target slope for the target test waveform associated with at least one target point following a point of change in test current corresponding to the target test waveform;
determining at least one slope for the actual waveform associated with at least one point in time corresponding to the at least one target point after the point of change in the actual current; and
a similarity between the actual waveform and the target test waveform is determined based on a comparison of the at least one target slope and the at least one slope.
6. The method (200) of claim 5, wherein determining the at least one slope of the actual waveform comprises:
generating a line associated with a time point of the at least one time point based on any one of: a tangent to the actual waveform at the point in time, a line defined by the point in time and another point in time of the at least one point in time; and
the slope of the actual waveform is determined based on the slope of the line.
7. The method (200) of any one of claims 1 to 6, further comprising:
monitoring a rigid point of the circuit breaker, the rigid point representing a point in time when the action of the circuit breaker is completed; and
an operating time of the circuit breaker is obtained based on the action point of the actual current and the rigid point of the actual current.
8. A controller (500) of a circuit breaker, comprising:
a storage module (510) configured to store at least one test time interval between at least one action point and at least one change point for at least one test current caused by application of at least one test voltage to a coil of the circuit breaker, the at least one action point representing at least one point in time when the at least one test voltage is applied to the coil to act the circuit breaker, and the at least one change point representing at least one point in time when the at least one test current in the coil begins to change;
a monitoring module (520) configured to monitor a point of change in an actual current caused by application of an actual voltage to the coil, the point of change in the actual current representing a point in time at which the actual current in the coil begins to change; and
a time determination module (530) configured to determine an action point of the actual current based at least on the change point of the actual current and the at least one test time interval, the action point of the actual current representing a point in time when the actual voltage is applied to the coil.
9. The controller (500) of claim 8, wherein the memory module (510) is further configured to store at least one test waveform of the at least one test current in the coil,
the monitoring module (520) is further configured to measure an actual waveform of the actual current in the coil,
the time determination module (530) is further configured to:
acquiring the at least one test waveform;
selecting a closest test waveform from the at least one test waveform that is closest to the actual waveform; and
the action point of the actual current is determined based on the closest test waveform.
10. The controller (500) of claim 9, wherein the time determination module (530) is further configured to:
selecting a test time interval corresponding to the closest test waveform from the at least one test time interval; and
the action point of the actual current is determined based on the change point of the actual current and the selected test time interval.
11. The controller (500) of claim 9, wherein the time determination module (530) is further configured to:
determining at least one similarity between the actual waveform and the at least one test waveform; and
the closest test waveform is selected based on the at least one similarity.
12. The controller (500) of claim 11, wherein the time determination module (530) is further configured to: with respect to a target test waveform of the at least one test waveform:
determining at least one target slope for the target test waveform associated with at least one target point following a point of change in test current corresponding to the target test waveform;
determining at least one slope for the actual waveform associated with at least one point in time corresponding to the at least one target point after the point of change in the actual current; and
a similarity between the actual waveform and the target test waveform is determined based on a comparison of the at least one target slope and the at least one slope.
13. The controller (500) of claim 12, wherein the time determination module (530) is further configured to:
generating a line associated with a time point of the at least one time point based on any one of: a tangent to the actual waveform at the point in time, a line defined by the point in time and another point in time of the at least one point in time; and
the slope of the actual waveform is determined based on the slope of the line.
14. The controller (500) according to any one of claims 8 to 13, wherein the monitoring module (520) is further configured to monitor a rigid point of the circuit breaker, the rigid point representing a point in time when the action of the circuit breaker is completed,
wherein the time determination module (530) is further configured to obtain an operating time of the circuit breaker based on the action point of the actual current and the rigid point of the actual current.
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/CN2021/091641 WO2022227047A1 (en) | 2021-04-30 | 2021-04-30 | Method for managing a breaker and controller of a breaker |
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| Publication Number | Publication Date |
|---|---|
| CN116711048A true CN116711048A (en) | 2023-09-05 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN202180090424.XA Pending CN116711048A (en) | 2021-04-30 | 2021-04-30 | Method for managing a circuit breaker and controller for a circuit breaker |
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| Country | Link |
|---|---|
| EP (1) | EP4330693A1 (en) |
| CN (1) | CN116711048A (en) |
| WO (1) | WO2022227047A1 (en) |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9140757B2 (en) * | 2012-03-27 | 2015-09-22 | Essex Electronics, Inc. | Testing a circuit assembly that contains a piezoelectric switch |
| CN202512214U (en) * | 2012-04-19 | 2012-10-31 | 黄彦 | Breaker operation time detecting device |
| CN104764993A (en) * | 2014-01-07 | 2015-07-08 | 国家电网公司 | Detection method and device for high-voltage circuit breaker |
| CN103969576A (en) * | 2014-04-24 | 2014-08-06 | 国家电网公司 | Dynamic characteristic analyzer for dual-grounding circuit breaker |
| CN106249140A (en) * | 2016-09-29 | 2016-12-21 | 北京慧智神光科技有限公司 | A kind of method and device for detecting breaker actuation time and speed of action |
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- 2021-04-30 CN CN202180090424.XA patent/CN116711048A/en active Pending
- 2021-04-30 WO PCT/CN2021/091641 patent/WO2022227047A1/en active Application Filing
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| EP4330693A1 (en) | 2024-03-06 |
| WO2022227047A1 (en) | 2022-11-03 |
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