CN116614087A - Photovoltaic array fault diagnosis method and system - Google Patents

Photovoltaic array fault diagnosis method and system Download PDF

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Publication number
CN116614087A
CN116614087A CN202310443850.8A CN202310443850A CN116614087A CN 116614087 A CN116614087 A CN 116614087A CN 202310443850 A CN202310443850 A CN 202310443850A CN 116614087 A CN116614087 A CN 116614087A
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China
Prior art keywords
curve
photovoltaic cell
inverter
photovoltaic
abnormal
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CN202310443850.8A
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Inventor
沈贝凌
冒晓龙
叶浚石
吴倩
薛红兵
单子心
龚颖文
孙利国
牛晨晖
唐建辉
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Huaneng Power International Jiangsu Energy Development Co Ltd
Nantong Power Plant of Huaneng International Power Jiangsu Energy Development Co Ltd
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Huaneng Power International Jiangsu Energy Development Co Ltd
Nantong Power Plant of Huaneng International Power Jiangsu Energy Development Co Ltd
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Priority to CN202310443850.8A priority Critical patent/CN116614087A/en
Publication of CN116614087A publication Critical patent/CN116614087A/en
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    • HELECTRICITY
    • H02GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02SGENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
    • H02S50/00Monitoring or testing of PV systems, e.g. load balancing or fault identification
    • H02S50/10Testing of PV devices, e.g. of PV modules or single PV cells
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy

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Abstract

The application discloses a photovoltaic array fault diagnosis method and a system, which relate to the technical field of photovoltaic power generation and comprise the steps of obtaining basic information of a photovoltaic cell, determining a time period length based on the basic information of the photovoltaic cell, and obtaining corresponding photovoltaic cell IV curves in the time period length; determining an abnormal photovoltaic cell based on the basic information of the photovoltaic cell and the photovoltaic cell IV curve, and obtaining an abnormal grade of the abnormal photovoltaic cell; acquiring an inverter IV curve corresponding to the photovoltaic cell IV curve time, and correcting the inverter IV curve based on the abnormal photovoltaic cell and the corresponding abnormal grade; adjusting an inverter IV curve according to the correction result to obtain an adjusted inverter IV curve, and judging whether the inverter has faults or not based on the adjusted inverter IV curve; and judging whether the future photovoltaic array fails according to the future photovoltaic cell IV curve and the inverter IV curve. The prediction precision and the fault judgment accuracy are improved.

Description

Photovoltaic array fault diagnosis method and system
Technical Field
The application relates to the technical field of photovoltaic power generation, in particular to a photovoltaic array fault diagnosis method and system.
Background
The photovoltaic array fault diagnosis technology is mainly based on data acquisition and analysis, judges whether a fault exists or not by monitoring various parameters of the photovoltaic array, and provides fault diagnosis and maintenance suggestions. The data acquisition is mainly realized by installing a sensor and monitoring equipment on field equipment, such as a temperature sensor, a radiometer, a current voltmeter and the like; and the data analysis is mainly based on artificial intelligence and machine learning algorithm, and the collected data is processed and analyzed to rapidly and accurately judge whether the photovoltaic array has faults or not and give fault reasons and suggestions.
In the prior art, the past and real-time photovoltaic array fault diagnosis is mature, but the future photovoltaic array fault prediction technology is simpler, so that the prediction precision is lower.
Therefore, how to improve the prediction accuracy of the photovoltaic array is a technical problem to be solved at present.
Disclosure of Invention
The application provides a photovoltaic array fault diagnosis method and system, which are used for solving the technical problem of poor accuracy of photovoltaic array prediction faults in the prior art. The method comprises the following steps:
acquiring basic information of a photovoltaic cell, determining the length of a time period based on the basic information of the photovoltaic cell, and acquiring corresponding IV curves of each photovoltaic cell in the length of the time period;
determining an abnormal photovoltaic cell based on the basic information of the photovoltaic cell and the photovoltaic cell IV curve, and obtaining an abnormal grade of the abnormal photovoltaic cell;
acquiring an inverter IV curve corresponding to the photovoltaic cell IV curve time, and correcting the inverter IV curve based on the abnormal photovoltaic cell and the corresponding abnormal grade;
adjusting an inverter IV curve according to the correction result to obtain an adjusted inverter IV curve, and judging whether the inverter has faults or not based on the adjusted inverter IV curve;
predicting a future photovoltaic cell IV curve and an inverter IV curve based on the photovoltaic cell IV curve and the adjusted inverter IV curve;
and judging whether the future photovoltaic array fails according to the future photovoltaic cell IV curve and the inverter IV curve.
In some embodiments of the present application, obtaining basic information of a photovoltaic cell, and determining a time period length based on the basic information of the photovoltaic cell includes:
the basic information of the photovoltaic cell comprises photovoltaic cell position information and photovoltaic cell service information;
defining photovoltaic cell location information, comprising:
establishing coordinates of photovoltaic cells based on central points of the photovoltaic arrays, determining the area of each photovoltaic cell and boundary lines between the photovoltaic cells, sequentially marking each photovoltaic cell according to the boundary lines between the photovoltaic cells by taking the central points of the photovoltaic arrays as original points to obtain mark areas, and determining the relative distance and the orientation angle between each mark area and the solar cell, wherein the position information of the photovoltaic cells comprises the relative distance and the orientation angle between each mark area and the solar cell;
and determining the corresponding minimum time according to the relative distance and the orientation angle between each label area and the solar cell, and adjusting the corresponding minimum time based on the service information of the photovoltaic cell to obtain the time period length.
In some embodiments of the present application, determining an abnormal photovoltaic cell based on the basic information of the photovoltaic cell and the photovoltaic cell IV curve includes:
the basic information of the photovoltaic cell also comprises surrounding environment weather information and photovoltaic cell characteristic information;
determining a predicted IV curve of each photovoltaic cell according to the surrounding environment weather information and the photovoltaic cell characteristic information, and determining a first deviation degree based on the predicted IV curve of each photovoltaic cell and the corresponding photovoltaic cell IV curve;
calculating the average deviation degree of the IV curve of each label area and the IV curves of a plurality of label areas in adjacent first distances, and recording the average deviation degree as a first average deviation degree;
calculating the average deviation degree of the IV curve of each label area and the IV curves of a plurality of label areas in the adjacent second distance, and recording the average deviation degree as a second average deviation degree;
and determining a second deviation degree based on the first average deviation degree and the second average deviation degree, and taking the photovoltaic cells with the first deviation degree and the second deviation degree exceeding the corresponding threshold values as abnormal photovoltaic cells.
In some embodiments of the present application, and obtaining an anomaly rating for an anomalous photovoltaic cell, comprises:
determining an abnormal grade of the abnormal photovoltaic cell according to the first deviation degree and the second deviation degree;
wherein L is an abnormal grade, alpha 1 For the conversion weight corresponding to the first deviation degree difference value, Q 1 Alpha is the difference between the first deviation degree and the corresponding threshold value 2 For the conversion weight corresponding to the second deviation degree difference value, Q 2 For the difference between the second deviation degree and the corresponding threshold value, exp is an exponential function, k is a constant, n is a preset base number []Is a rounding symbol;
according to Q 1 And Q 2 The corresponding k value is determined by the size of (a).
In some embodiments of the present application, calibrating an inverter IV curve based on an abnormal photovoltaic cell and a corresponding abnormal grade includes:
acquiring a label area where an abnormal photovoltaic cell is located, marking the label area as an abnormal label area, and determining a predicted inverter IV curve according to the abnormal grade and the position relation between the abnormal label areas;
comparing the inverter IV curve with the predicted inverter IV curve, and if the similarity exceeds a preset similarity threshold, matching the comparison result;
if the similarity does not exceed the preset similarity threshold, the checking result is not in conformity, and the inverter IV curve is adjusted according to the similarity.
In some embodiments of the present application, adjusting an inverter IV curve according to a calibration result to obtain an adjusted inverter IV curve, and determining whether an inverter has a fault based on the adjusted inverter IV curve includes:
adjusting the part of the inverter IV curve similarity which does not exceed a preset similarity threshold value;
and judging whether the inverter has faults or not based on the characteristics of the adjusted inverter IV curve.
In some embodiments of the application, predicting future photovoltaic cell IV curves and inverter IV curves based on the photovoltaic cell IV curves and the adjusted inverter IV curves includes:
acquiring future meteorological information, and predicting a photovoltaic cell IV curve according to the future meteorological information and the photovoltaic cell IV curve to obtain a future photovoltaic cell IV curve;
comparing the future photovoltaic cell IV curve with the photovoltaic cell IV curve, if the future photovoltaic cell IV curve deviates relatively leftwards, determining the dark current according to the deviation, and predicting the future inverter IV curve based on the dark current and the inverter IV curve;
if the future photovoltaic cell IV curve does not deviate relatively to the left, a future inverter IV curve is predicted from the future photovoltaic cell IV curve.
Correspondingly, a photovoltaic array fault diagnosis system, the system comprising:
the acquisition module is used for acquiring the basic information of the photovoltaic cells, determining the time period length based on the basic information of the photovoltaic cells and acquiring corresponding photovoltaic cell IV curves in the time period length;
the determining module is used for determining an abnormal photovoltaic cell based on the basic information of the photovoltaic cell and the photovoltaic cell IV curve and obtaining an abnormal grade of the abnormal photovoltaic cell;
the calibration module is used for acquiring an inverter IV curve corresponding to the photovoltaic cell IV curve time and calibrating the inverter IV curve based on the abnormal photovoltaic cell and the corresponding abnormal grade;
the adjusting module is used for adjusting the inverter IV curve according to the correction result to obtain an adjusted inverter IV curve, and judging whether the inverter has faults or not based on the adjusted inverter IV curve;
the prediction module is used for predicting future photovoltaic cell IV curves and inverter IV curves based on the photovoltaic cell IV curves and the adjusted inverter IV curves;
and the judging module is used for judging whether the future photovoltaic array fails according to the future photovoltaic cell IV curve and the inverter IV curve.
By applying the technical scheme, the basic information of the photovoltaic cell is obtained, the time period length is determined based on the basic information of the photovoltaic cell, and each corresponding photovoltaic cell IV curve in the time period length is obtained; determining an abnormal photovoltaic cell based on the basic information of the photovoltaic cell and the photovoltaic cell IV curve, and obtaining an abnormal grade of the abnormal photovoltaic cell; acquiring an inverter IV curve corresponding to the photovoltaic cell IV curve time, and correcting the inverter IV curve based on the abnormal photovoltaic cell and the corresponding abnormal grade; adjusting an inverter IV curve according to the correction result to obtain an adjusted inverter IV curve, and judging whether the inverter has faults or not based on the adjusted inverter IV curve; predicting a future photovoltaic cell IV curve and an inverter IV curve based on the photovoltaic cell IV curve and the adjusted inverter IV curve; and judging whether the future photovoltaic array fails according to the future photovoltaic cell IV curve and the inverter IV curve. According to the application, the condition of the photovoltaic cell IV curve is firstly judged, so that the inverter IV curve is determined, whether the battery or the inverter is in fault or not is judged according to the IV curve, and the future IV curve is predicted. The prediction precision and the fault judgment accuracy are improved.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings that are needed in the description of the embodiments will be briefly described below, it being obvious that the drawings in the following description are only some embodiments of the present application, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
Fig. 1 shows a schematic flow chart of a photovoltaic array fault diagnosis method according to an embodiment of the present application;
fig. 2 shows a schematic structural diagram of a photovoltaic array fault diagnosis system according to an embodiment of the present application.
Detailed Description
The following description of the embodiments of the present application will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present application, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the application without making any inventive effort, are intended to be within the scope of the application.
The embodiment of the application provides a photovoltaic array fault diagnosis method, as shown in fig. 1, which comprises the following steps:
step S101, basic information of a photovoltaic cell is obtained, the length of a time period is determined based on the basic information of the photovoltaic cell, and corresponding photovoltaic cell IV curves in the length of the time period are obtained;
step S102, determining an abnormal photovoltaic cell based on the basic information of the photovoltaic cell and the photovoltaic cell IV curve, and obtaining an abnormal grade of the abnormal photovoltaic cell;
step S103, an inverter IV curve corresponding to the photovoltaic cell IV curve time is obtained, and the inverter IV curve is corrected based on the abnormal photovoltaic cell and the corresponding abnormal grade;
step S104, adjusting an inverter IV curve according to the correction result to obtain an adjusted inverter IV curve, and judging whether the inverter has faults or not based on the adjusted inverter IV curve;
step S105, predicting future photovoltaic cell IV curves and inverter IV curves based on the photovoltaic cell IV curves and the adjusted inverter IV curves;
and S106, judging whether the future photovoltaic array fails according to the future photovoltaic cell IV curve and the inverter IV curve.
In this embodiment, whether each fault occurs is determined according to the IV curve of the photovoltaic cell and the IV curve of the inverter, which belongs to a conventional technology in the art, and will not be described herein.
In this embodiment, the future IV curve is predicted according to the IV curve of the photovoltaic cell and the IV curve of the inverter, and the specific implementation means is not limited and can meet the requirements.
In some embodiments of a photovoltaic array fault diagnosis method of the present application, obtaining basic information of a photovoltaic cell, and determining a time period length based on the basic information of the photovoltaic cell, includes:
the basic information of the photovoltaic cell comprises photovoltaic cell position information and photovoltaic cell service information;
defining photovoltaic cell location information, comprising:
establishing coordinates of photovoltaic cells based on central points of the photovoltaic arrays, determining the area of each photovoltaic cell and boundary lines between the photovoltaic cells, sequentially marking each photovoltaic cell according to the boundary lines between the photovoltaic cells by taking the central points of the photovoltaic arrays as original points to obtain mark areas, and determining the relative distance and the orientation angle between each mark area and the solar cell, wherein the position information of the photovoltaic cells comprises the relative distance and the orientation angle between each mark area and the solar cell;
and determining the corresponding minimum time according to the relative distance and the orientation angle between each label area and the solar cell, and adjusting the corresponding minimum time based on the service information of the photovoltaic cell to obtain the time period length.
In this embodiment, each labeled region is equivalent to a photovoltaic cell, and the relative distance between each labeled region and the solar cell and the orientation angle both correspond together for a minimum time, where the minimum time refers to the shortest duration that characterizes the performance of the cell. The relative distance and orientation angle between each numbered area and the sun may be a range value or a point value.
In this embodiment, the service information of the photovoltaic cells is life information of the photovoltaic cells, the minimum time of the photovoltaic cells with different lives is different, each photovoltaic cell service information corresponds to one adjustment time in a preset adjustment table, and a critical line for addition and subtraction is arranged in the adjustment table. And obtaining the time period length according to the adjustment time and the minimum time.
In some embodiments of the photovoltaic array fault diagnosis method of the present application, determining an abnormal photovoltaic cell based on basic information of the photovoltaic cell and a photovoltaic cell IV curve includes:
the basic information of the photovoltaic cell also comprises surrounding environment weather information and photovoltaic cell characteristic information;
determining a predicted IV curve of each photovoltaic cell according to the surrounding environment weather information and the photovoltaic cell characteristic information, and determining a first deviation degree based on the predicted IV curve of each photovoltaic cell and the corresponding photovoltaic cell IV curve;
calculating the average deviation degree of the IV curve of each label area and the IV curves of a plurality of label areas in adjacent first distances, and recording the average deviation degree as a first average deviation degree;
calculating the average deviation degree of the IV curve of each label area and the IV curves of a plurality of label areas in the adjacent second distance, and recording the average deviation degree as a second average deviation degree;
and determining a second deviation degree based on the first average deviation degree and the second average deviation degree, and taking the photovoltaic cells with the first deviation degree and the second deviation degree exceeding the corresponding threshold values as abnormal photovoltaic cells.
In the present embodiment, the manner of calculating the average deviation degree is not limited here, as long as data representing the average can be obtained.
In this embodiment, the abnormal cell is determined by the lateral contrast of the photovoltaic cell, which means that the vertical contrast is compared with the predicted IV curve, compared with the photovoltaic cell at different distances.
In this embodiment, if only one of the first deviation degree and the second deviation degree exceeds the corresponding threshold value, or neither of them exceeds the corresponding threshold value, the abnormal battery is not determined.
In this embodiment, the second distance is greater than the first distance.
In some embodiments of the method for diagnosing faults of a photovoltaic array, and obtaining an abnormal grade of an abnormal photovoltaic cell, the method includes:
determining an abnormal grade of the abnormal photovoltaic cell according to the first deviation degree and the second deviation degree;
wherein L is an abnormal grade, alpha 1 For the conversion weight corresponding to the first deviation degree difference value, Q 1 Alpha is the difference between the first deviation degree and the corresponding threshold value 2 For the conversion weight corresponding to the second deviation degree difference value, Q 2 For the difference between the second deviation degree and the corresponding threshold value, exp is an exponential function, k is a constant, n is a preset base number []Is a rounding symbol;
according to Q 1 And Q 2 The corresponding k value is determined by the size of (a).
In this embodiment, the value of k is generally about 3, 3-3.5.Q (Q) 1 And Q 2 There is a k in common. Exp represents the pair (. Alpha.) 1 Q 12 Q 2 ) Is a modification of (a).
In this embodiment, n is a preset base number, and is an integer.
In some embodiments of a photovoltaic array fault diagnosis method of the present application, the calibration of an inverter IV curve based on an abnormal photovoltaic cell and a corresponding abnormal grade includes:
acquiring a label area where an abnormal photovoltaic cell is located, marking the label area as an abnormal label area, and determining a predicted inverter IV curve according to the abnormal grade and the position relation between the abnormal label areas;
comparing the inverter IV curve with the predicted inverter IV curve, and if the similarity exceeds a preset similarity threshold, matching the comparison result;
if the similarity does not exceed the preset similarity threshold, the checking result is not in conformity, and the inverter IV curve is adjusted according to the similarity.
In this embodiment, the IV curve of the inverter can be used to evaluate the conversion efficiency and output power of the inverter, and to detect the failure of the inverter.
In this embodiment, the degree of abnormality of the abnormal photovoltaic cells and the linkage effect caused by the positional relationship between the abnormal cells cause corresponding changes in the IV curve of the subsequent inverter.
In some embodiments of the photovoltaic array fault diagnosis method of the present application, an inverter IV curve is adjusted according to a calibration result to obtain an adjusted inverter IV curve, and determining whether the inverter has a fault based on the adjusted inverter IV curve includes:
adjusting the part of the inverter IV curve similarity which does not exceed a preset similarity threshold value;
and judging whether the inverter has faults or not based on the characteristics of the adjusted inverter IV curve.
In this embodiment, adjusting the portion of the inverter IV curve with the similarity not exceeding the preset similarity threshold refers to adjusting the portion of the inverter IV curve with the similarity not exceeding the preset similarity threshold, where the adjusting specifically includes balancing and adjusting a portion of the inverter IV curve with a portion of the inverter IV curve corresponding to the predicted inverter IV curve, and taking the intermediate amount, i.e., bringing the portion of the inverter IV curve closer to the intermediate amount.
In some embodiments of the photovoltaic array fault diagnosis method of the present application, predicting a future photovoltaic cell IV curve and an inverter IV curve based on the photovoltaic cell IV curve and the adjusted inverter IV curve includes:
acquiring future meteorological information, and predicting a photovoltaic cell IV curve according to the future meteorological information and the photovoltaic cell IV curve to obtain a future photovoltaic cell IV curve;
comparing the future photovoltaic cell IV curve with the photovoltaic cell IV curve, if the future photovoltaic cell IV curve deviates relatively leftwards, determining the dark current according to the deviation, and predicting the future inverter IV curve based on the dark current and the inverter IV curve;
if the future photovoltaic cell IV curve does not deviate relatively to the left, a future inverter IV curve is predicted from the future photovoltaic cell IV curve.
In this embodiment, if the dark current increases or occurs, the IV curve is shifted to the left as a whole, and the dark current affects the conversion efficiency of the inverter.
By applying the technical scheme, the basic information of the photovoltaic cell is obtained, the time period length is determined based on the basic information of the photovoltaic cell, and each corresponding photovoltaic cell IV curve in the time period length is obtained; determining an abnormal photovoltaic cell based on the basic information of the photovoltaic cell and the photovoltaic cell IV curve, and obtaining an abnormal grade of the abnormal photovoltaic cell; acquiring an inverter IV curve corresponding to the photovoltaic cell IV curve time, and correcting the inverter IV curve based on the abnormal photovoltaic cell and the corresponding abnormal grade; adjusting an inverter IV curve according to the correction result to obtain an adjusted inverter IV curve, and judging whether the inverter has faults or not based on the adjusted inverter IV curve; predicting a future photovoltaic cell IV curve and an inverter IV curve based on the photovoltaic cell IV curve and the adjusted inverter IV curve; and judging whether the future photovoltaic array fails according to the future photovoltaic cell IV curve and the inverter IV curve. According to the application, the condition of the photovoltaic cell IV curve is firstly judged, so that the inverter IV curve is determined, whether the battery or the inverter is in fault or not is judged according to the IV curve, and the future IV curve is predicted. The prediction precision and the fault judgment accuracy are improved.
In order to further explain the technical idea of the application, the technical scheme of the application is described with specific application scenarios.
Correspondingly, a photovoltaic array fault diagnosis system, as shown in fig. 2, includes:
the acquisition module 201 is configured to acquire basic information of a photovoltaic cell, determine a time period length based on the basic information of the photovoltaic cell, and acquire each corresponding photovoltaic cell IV curve within the time period length;
a determining module 202, configured to determine an abnormal photovoltaic cell based on the basic information of the photovoltaic cell and the photovoltaic cell IV curve, and obtain an abnormal level of the abnormal photovoltaic cell;
the calibration module 203 is configured to obtain an inverter IV curve corresponding to the photovoltaic cell IV curve time, and calibrate the inverter IV curve based on the abnormal photovoltaic cell and the corresponding abnormal level;
the adjusting module 204 is configured to adjust an inverter IV curve according to the calibration result, obtain an adjusted inverter IV curve, and determine whether the inverter has a fault based on the adjusted inverter IV curve;
a prediction module 205, configured to predict a future photovoltaic cell IV curve and an inverter IV curve based on the photovoltaic cell IV curve and the adjusted inverter IV curve;
the judging module 206 is configured to judge whether the future photovoltaic array is faulty according to the future photovoltaic cell IV curve and the inverter IV curve.
In some embodiments of the present application, the obtaining module 201 is configured to:
the basic information of the photovoltaic cell comprises photovoltaic cell position information and photovoltaic cell service information;
defining photovoltaic cell location information, comprising:
establishing coordinates of photovoltaic cells based on central points of the photovoltaic arrays, determining the area of each photovoltaic cell and boundary lines between the photovoltaic cells, sequentially marking each photovoltaic cell according to the boundary lines between the photovoltaic cells by taking the central points of the photovoltaic arrays as original points to obtain mark areas, and determining the relative distance and the orientation angle between each mark area and the solar cell, wherein the position information of the photovoltaic cells comprises the relative distance and the orientation angle between each mark area and the solar cell;
and determining the corresponding minimum time according to the relative distance and the orientation angle between each label area and the solar cell, and adjusting the corresponding minimum time based on the service information of the photovoltaic cell to obtain the time period length.
In some embodiments of the present application, the determining module 202 is configured to:
the basic information of the photovoltaic cell also comprises surrounding environment weather information and photovoltaic cell characteristic information;
determining a predicted IV curve of each photovoltaic cell according to the surrounding environment weather information and the photovoltaic cell characteristic information, and determining a first deviation degree based on the predicted IV curve of each photovoltaic cell and the corresponding photovoltaic cell IV curve;
calculating the average deviation degree of the IV curve of each label area and the IV curves of a plurality of label areas in adjacent first distances, and recording the average deviation degree as a first average deviation degree;
calculating the average deviation degree of the IV curve of each label area and the IV curves of a plurality of label areas in the adjacent second distance, and recording the average deviation degree as a second average deviation degree;
and determining a second deviation degree based on the first average deviation degree and the second average deviation degree, and taking the photovoltaic cells with the first deviation degree and the second deviation degree exceeding the corresponding threshold values as abnormal photovoltaic cells.
In some embodiments of the present application, the determining module 202 is configured to:
determining an abnormal grade of the abnormal photovoltaic cell according to the first deviation degree and the second deviation degree;
wherein L is an abnormal grade, alpha 1 For the conversion weight corresponding to the first deviation degree difference value, Q 1 Alpha is the difference between the first deviation degree and the corresponding threshold value 2 For the conversion weight corresponding to the second deviation degree difference value, Q 2 For the difference between the second deviation degree and the corresponding threshold value, exp is an exponential function, k is a constant, n is a preset base number []Is a rounding symbol;
according to Q 1 And Q 2 Corresponding to the size determination of (a)k value.
In some embodiments of the present application, the calibration module 203 is configured to:
acquiring a label area where an abnormal photovoltaic cell is located, marking the label area as an abnormal label area, and determining a predicted inverter IV curve according to the abnormal grade and the position relation between the abnormal label areas;
comparing the inverter IV curve with the predicted inverter IV curve, and if the similarity exceeds a preset similarity threshold, matching the comparison result;
if the similarity does not exceed the preset similarity threshold, the checking result is not in conformity, and the inverter IV curve is adjusted according to the similarity.
In some embodiments of the present application, the adjustment module 204 is configured to:
adjusting the part of the inverter IV curve similarity which does not exceed a preset similarity threshold value;
and judging whether the inverter has faults or not based on the characteristics of the adjusted inverter IV curve.
In some embodiments of the present application, the prediction module 205 is configured to:
acquiring future meteorological information, and predicting a photovoltaic cell IV curve according to the future meteorological information and the photovoltaic cell IV curve to obtain a future photovoltaic cell IV curve;
comparing the future photovoltaic cell IV curve with the photovoltaic cell IV curve, if the future photovoltaic cell IV curve deviates relatively leftwards, determining the dark current according to the deviation, and predicting the future inverter IV curve based on the dark current and the inverter IV curve;
if the future photovoltaic cell IV curve does not deviate relatively to the left, a future inverter IV curve is predicted from the future photovoltaic cell IV curve.
Those skilled in the art will appreciate that the modules in the system in the implementation scenario may be distributed in the system in the implementation scenario according to the implementation scenario description, or that corresponding changes may be located in one or more systems different from the implementation scenario. The modules of the implementation scenario may be combined into one module, or may be further split into a plurality of sub-modules.
Finally, it should be noted that: the above embodiments are only for illustrating the technical solution of the present application, and are not limiting; although the application has been described in detail with reference to the foregoing embodiments, it will be appreciated by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some technical features thereof can be replaced by equivalents; such modifications and substitutions do not drive the essence of the corresponding technical solutions to depart from the spirit and scope of the technical solutions of the embodiments of the present application.

Claims (8)

1. A method for diagnosing faults in a photovoltaic array, the method comprising:
acquiring basic information of a photovoltaic cell, determining the length of a time period based on the basic information of the photovoltaic cell, and acquiring corresponding IV curves of each photovoltaic cell in the length of the time period;
determining an abnormal photovoltaic cell based on the basic information of the photovoltaic cell and the photovoltaic cell IV curve, and obtaining an abnormal grade of the abnormal photovoltaic cell;
acquiring an inverter IV curve corresponding to the photovoltaic cell IV curve time, and correcting the inverter IV curve based on the abnormal photovoltaic cell and the corresponding abnormal grade;
adjusting an inverter IV curve according to the correction result to obtain an adjusted inverter IV curve, and judging whether the inverter has faults or not based on the adjusted inverter IV curve;
predicting a future photovoltaic cell IV curve and an inverter IV curve based on the photovoltaic cell IV curve and the adjusted inverter IV curve;
and judging whether the future photovoltaic array fails according to the future photovoltaic cell IV curve and the inverter IV curve.
2. The method of claim 1, wherein obtaining the base information of the photovoltaic cell and determining the time period length based on the base information of the photovoltaic cell comprises:
the basic information of the photovoltaic cell comprises photovoltaic cell position information and photovoltaic cell service information;
defining photovoltaic cell location information, comprising:
establishing coordinates of photovoltaic cells based on central points of the photovoltaic arrays, determining the area of each photovoltaic cell and boundary lines between the photovoltaic cells, sequentially marking each photovoltaic cell according to the boundary lines between the photovoltaic cells by taking the central points of the photovoltaic arrays as original points to obtain mark areas, and determining the relative distance and the orientation angle between each mark area and the solar cell, wherein the position information of the photovoltaic cells comprises the relative distance and the orientation angle between each mark area and the solar cell;
and determining the corresponding minimum time according to the relative distance and the orientation angle between each label area and the solar cell, and adjusting the corresponding minimum time based on the service information of the photovoltaic cell to obtain the time period length.
3. The method of claim 2, wherein determining an abnormal photovoltaic cell based on the base information of the photovoltaic cell and the photovoltaic cell IV curve comprises:
the basic information of the photovoltaic cell also comprises surrounding environment weather information and photovoltaic cell characteristic information;
determining a predicted IV curve of each photovoltaic cell according to the surrounding environment weather information and the photovoltaic cell characteristic information, and determining a first deviation degree based on the predicted IV curve of each photovoltaic cell and the corresponding photovoltaic cell IV curve;
calculating the average deviation degree of the IV curve of each label area and the IV curves of a plurality of label areas in adjacent first distances, and recording the average deviation degree as a first average deviation degree;
calculating the average deviation degree of the IV curve of each label area and the IV curves of a plurality of label areas in the adjacent second distance, and recording the average deviation degree as a second average deviation degree;
and determining a second deviation degree based on the first average deviation degree and the second average deviation degree, and taking the photovoltaic cells with the first deviation degree and the second deviation degree exceeding the corresponding threshold values as abnormal photovoltaic cells.
4. The method of claim 3, wherein and obtaining an anomaly rating for the anomalous photovoltaic cell comprises:
determining an abnormal grade of the abnormal photovoltaic cell according to the first deviation degree and the second deviation degree;
wherein L is an abnormal grade, alpha 1 For the conversion weight corresponding to the first deviation degree difference value, Q 1 Alpha is the difference between the first deviation degree and the corresponding threshold value 2 For the conversion weight corresponding to the second deviation degree difference value, Q 2 For the difference between the second deviation degree and the corresponding threshold value, exp is an exponential function, k is a constant, n is a preset base number []Is a rounding symbol;
according to Q 1 And Q 2 The corresponding k value is determined by the size of (a).
5. The method of claim 2, wherein calibrating the inverter IV curve based on the anomalous photovoltaic cells and the corresponding anomaly level comprises:
acquiring a label area where an abnormal photovoltaic cell is located, marking the label area as an abnormal label area, and determining a predicted inverter IV curve according to the abnormal grade and the position relation between the abnormal label areas;
comparing the inverter IV curve with the predicted inverter IV curve, and if the similarity exceeds a preset similarity threshold, matching the comparison result;
if the similarity does not exceed the preset similarity threshold, the checking result is not in conformity, and the inverter IV curve is adjusted according to the similarity.
6. The method of claim 5, wherein adjusting the inverter IV curve based on the collation results to obtain an adjusted inverter IV curve, and determining whether the inverter has a fault based on the adjusted inverter IV curve, comprises:
adjusting the part of the inverter IV curve similarity which does not exceed a preset similarity threshold value;
and judging whether the inverter has faults or not based on the characteristics of the adjusted inverter IV curve.
7. The method of claim 1, wherein predicting future photovoltaic cell IV curves and inverter IV curves based on the photovoltaic cell IV curves and the adjusted inverter IV curves comprises:
acquiring future meteorological information, and predicting a photovoltaic cell IV curve according to the future meteorological information and the photovoltaic cell IV curve to obtain a future photovoltaic cell IV curve;
comparing the future photovoltaic cell IV curve with the photovoltaic cell IV curve, if the future photovoltaic cell IV curve deviates relatively leftwards, determining the dark current according to the deviation, and predicting the future inverter IV curve based on the dark current and the inverter IV curve;
if the future photovoltaic cell IV curve does not deviate relatively to the left, a future inverter IV curve is predicted from the future photovoltaic cell IV curve.
8. A photovoltaic array fault diagnosis system, the system comprising:
the acquisition module is used for acquiring the basic information of the photovoltaic cells, determining the time period length based on the basic information of the photovoltaic cells and acquiring corresponding photovoltaic cell IV curves in the time period length;
the determining module is used for determining an abnormal photovoltaic cell based on the basic information of the photovoltaic cell and the photovoltaic cell IV curve and obtaining an abnormal grade of the abnormal photovoltaic cell;
the calibration module is used for acquiring an inverter IV curve corresponding to the photovoltaic cell IV curve time and calibrating the inverter IV curve based on the abnormal photovoltaic cell and the corresponding abnormal grade;
the adjusting module is used for adjusting the inverter IV curve according to the correction result to obtain an adjusted inverter IV curve, and judging whether the inverter has faults or not based on the adjusted inverter IV curve;
the prediction module is used for predicting future photovoltaic cell IV curves and inverter IV curves based on the photovoltaic cell IV curves and the adjusted inverter IV curves;
and the judging module is used for judging whether the future photovoltaic array fails according to the future photovoltaic cell IV curve and the inverter IV curve.
CN202310443850.8A 2023-04-23 2023-04-23 Photovoltaic array fault diagnosis method and system Pending CN116614087A (en)

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