CN116598040A - Ion trap ion control experiment system - Google Patents
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- 238000005040 ion trap Methods 0.000 title claims abstract description 83
- 238000002474 experimental method Methods 0.000 title claims abstract description 25
- 150000002500 ions Chemical class 0.000 claims abstract description 156
- 238000012544 monitoring process Methods 0.000 claims abstract description 60
- 238000010276 construction Methods 0.000 claims abstract description 18
- 230000033228 biological regulation Effects 0.000 claims description 25
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- 230000006698 induction Effects 0.000 description 3
- 238000012545 processing Methods 0.000 description 3
- 239000002096 quantum dot Substances 0.000 description 3
- 230000006641 stabilisation Effects 0.000 description 3
- 238000011105 stabilization Methods 0.000 description 3
- 230000005684 electric field Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
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- 230000003750 conditioning effect Effects 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 238000004812 paul trap Methods 0.000 description 1
- 238000004150 penning trap Methods 0.000 description 1
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- 238000004886 process control Methods 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
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- G06N10/40—Physical realisations or architectures of quantum processors or components for manipulating qubits, e.g. qubit coupling or qubit control
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Abstract
The invention provides an ion trap ion control experiment system, which relates to the technical field of quantum computation and comprises the following components: the device comprises a potential field construction module, an ion capturing module, a potential field adjusting module, a weak force measuring module, a potential monitoring module, a voltage adjusting monitoring module and a fluorescence counting monitoring module, wherein the potential field construction module is connected with the ion capturing module. According to the invention, through the cooperation of the ion capturing module and the potential field adjusting module, the voltage value sequence input by the upper computer is converted, the high-level pulse is output to the circuit board through the I/O port, the electrode potential value is modified to realize the lifting or lowering of the electrode voltage to carry the ions back to the initial position, and the change condition of the potential field is calculated through the voltage difference value, so that the accurate value of the external acting force is obtained.
Description
Technical Field
The invention relates to the technical field of quantum computing, in particular to an ion trap ion control experiment system.
Background
Ion traps are today already the main physical system for implementing quantum computing. Whereas the principle of the ion trap itself is in fact very simple: the action of the charged particles is controlled by utilizing interaction force generated between the charges and the magnetic field. Two of the most common types of ion traps are Penning traps, proposed by Dehmelt, which create an electrical potential through a combination of an electric field and a magnetic field; paul trap, proposed by WolfgangPaul (Nobel physics prize in 1989 shared with Dehmelt), forms electric potential by a combination of static and oscillating electric fields, unlike superconducting, optical quantum etc. routes, ion trap quantum computers need to integrate technologies in many different fields: vacuum, laser and optical systems, radio frequency and microwave technology, and coherent electronic control, in particular, ion trap quantum computers have several advantages: longer coherence time, single-qubit gate, double-qubit gate fidelity, more direct state preparation and readout, and high qubit repeatability.
However, in the prior art, when a planar ion trap is used to trap ions, a specific potential field needs to be formed by combining voltages released by a plurality of electrodes, so as to limit charged ions to a specific area, for example, chinese patent application discloses an ion trap system and an ion manipulation method, CN112750681B, which includes a process control module, a beam splitting module, a beam conditioning module, and an ion trapping module, where the ion trapping module includes P trapped ions and electrodes. The electrode is used for trapping the P ions in M first partitions according to first control signals generated by the processing control module according to P ion arrangement; the beam splitting module is used for splitting the laser beam according to the second control signals generated by the processing control module according to the P ion arrangement and the maximum ion number required to be controlled simultaneously in each second division, so as to obtain N first light beams, dividing the N first light beams into M second partitions, and respectively transmitting the first light beams in the M second partitions to the M light beam regulation and control modules; the beam regulation and control module is used for modulating the received first beam and transmitting the modulated first beam to corresponding ions of the corresponding first partition.
Although the above scheme has the advantages as above, the above scheme has disadvantages in that: because the use of the planar ion trap to trap ions requires the combination of voltages released by a plurality of electrodes to form a specific potential field, thereby confining charged ions to a specific region, while the planar ion trap system, while meeting the requirements of trapping ions, conventional planar ion trap systems have shortcomings in the control plane of the potential field, thereby resulting in the fact that when trapped ions are subjected to additional environmental influences to generate a series of experimental errors, experimenters cannot eliminate the additional environmental influences by adjusting the experimental system, so that the additionally generated experimental errors are introduced, and the experimental results are not accurate enough. This has a great impact on the field of quantum precision measurement, and therefore an ion trap ion manipulation experiment system is needed to solve such problems.
Disclosure of Invention
The invention aims to solve the problems that in the prior art, due to the fact that the traditional planar ion trap system is insufficient in the control layer of an electric potential field, when a series of experimental errors are generated due to the fact that trapped ions are influenced by additional environments, an experimenter cannot eliminate the additional environmental influences by adjusting the experimental system, the additionally generated experimental errors are introduced, and the experimental results are not accurate enough.
In order to achieve the above purpose, the present invention adopts the following technical scheme: an ion trap ion manipulation experiment system comprising: the potential field construction module is connected with the ion capturing module, the ion capturing module is connected with the potential field adjusting module, and the potential field adjusting module is connected with the weak force measuring module, wherein:
the potential field construction module is provided with an upper computer, an FPGA is arranged in the upper computer, an ion trap device is opened, and meanwhile, voltages of all electrodes are loaded to construct a potential field in the ion trap;
the ion capturing module is used for carrying a laser, a CCD and an ion preparation device, and monitoring the ion position in the ion trap through the CCD after capturing ions;
the potential field adjusting module adjusts the potential field control layer;
and the weak force measurement module acquires, displays and stores the information of the trapped ions.
As a preferred embodiment, the ion capturing module includes a parameter loading unit, a stability adjusting unit, an ion position adjusting unit, and an ion information feedback unit, wherein:
the parameter loading unit uses the parameter setting stored last time to load the ion trap device after being started, loads the CCD image window and loads the fluorescence counter data body, and the parameter setting comprises: the potential value of each electrode and the shooting time of CCD equipment;
and the stability adjusting unit monitors the current state of the ions obtained after the parameter loading unit loads the ions, and starts the test after the stable state is reached.
As a preferred embodiment, the parameter loading unit is connected to a stability adjustment unit, which is connected to an ion position adjustment unit, wherein:
the ion position adjusting unit changes the ion position by changing the environment and adjusts the electrode potential value.
As a preferred embodiment, the ion position adjusting unit is connected to an ion information feedback unit, wherein:
the ion information feedback unit records the voltage value and the fluorescence count of each electrode, and the steps of the stability adjusting unit and the ion position adjusting unit are repeated to enable the fluorescence count to be stable.
As a preferred embodiment, the voltage regulation monitoring module includes a power supply starting unit, an instruction receiving unit, a voltage value converting unit, and a voltage loading unit, wherein:
the voltage regulation monitoring module is internally provided with a DAC chip and bears a digital circuit controller to regulate the voltage loaded on the ion trap electrode, the output ports of the DAC chip of the circuit board are matched in pairs, and the voltage is loaded on the ion trap electrode after passing through the differential circuit.
As a preferred embodiment, the power supply starting unit is connected to a command receiving unit, which is connected to a voltage value converting unit, wherein:
the power supply starting unit is used for serving the voltage regulation monitoring module and the potential field construction module, is responsible for system starting of the voltage regulation monitoring module and is used for loading power supply voltage;
the instruction receiving unit is used for receiving an instruction sent by the upper computer, inputting a switching voltage to the ion capturing module, enabling the ion capturing module to start working and cutting off power supply.
As a preferred embodiment, the voltage value conversion unit is connected to a voltage application unit, wherein:
the voltage value conversion unit converts an input voltage value of the upper computer into a 0-1 sequence through the digital circuit controller, and outputs high-level pulses to the circuit board through the I/O ports, wherein 14 ports are connected in parallel for output;
the voltage loading unit receives level pulses of a control end of the digital circuit from the DAC chip of the circuit board, converts the level pulses into analog signals and outputs voltages, wherein 3 of 14 input ports are used for selecting output ports, 8 are used for voltage control, and the other 3 are used for working switches and working protection.
As a preferred embodiment, the electric potential position monitoring module, the voltage regulation monitoring module and the fluorescence counting monitoring module are each connected to the electric potential field regulation module, wherein:
the fluorescence count monitoring module monitors fluorescence counts in real time;
the potential monitoring module monitors the ion position in real time.
Compared with the prior art, the invention has the advantages and positive effects that,
1. according to the invention, through the cooperation of the ion capturing module and the potential field adjusting module, the voltage value input by the upper computer is converted into a 0-1 sequence, and high-level pulse is output to the circuit board through the I/O port, the electrode potential value is modified to realize lifting or lowering of electrode voltage to carry ions back to the initial position, the potential field changing condition is calculated through the voltage difference value, so that the accurate value of external acting force is obtained, and the problem that the experimental result is inaccurate due to the fact that the traditional planar ion trap system in the prior art is insufficient in the potential field control layer is solved, so that when trapped ions are influenced by additional environment to generate a series of experimental errors, an experimenter cannot eliminate the additional environment influence through adjusting the experimental system, and the additionally generated experimental error is introduced.
2. According to the invention, through the arrangement of the potential field adjusting module and the FPGA, the minimum potential difference of direct current voltage adjustment can be adjusted to 0.6mV, the minimum potential difference adjustable on the direct current electrode of the existing known equipment is about 20mV, and when the potential field is controlled, a smaller voltage adjustable value can generate more accurate control of the potential field, so that more precise ion control and stronger weak force induction capability are obtained.
3. According to the invention, through the coordination of the ion capturing module and the potential field adjusting module and the parallel line control, the synchronous output of voltage can be realized, so that the generation and stabilization time of the potential field are accelerated.
4. According to the invention, the digital circuit control module is introduced, so that the processing time of an upper computer control system built in the potential field construction module is reduced, and the measurement data is more accurate.
Drawings
FIG. 1 is a block diagram of an overall system of an ion trap ion manipulation experiment system of the present invention;
FIG. 2 is a block diagram of an ion trapping module unit of an ion trap ion manipulation experiment system of the present invention;
FIG. 3 is a block diagram of a voltage regulation monitoring module unit of an ion trap ion manipulation experiment system according to the present invention;
fig. 4 is a workflow diagram 1 of an ion trap operating system of an ion trap ion manipulation experiment system of the present invention;
fig. 5 is a workflow diagram 2 of an ion trap operating system of an ion trap ion manipulation experiment system of the present invention;
fig. 6 is a flow chart of the starting of the voltage operation module of the ion trap ion manipulation experiment system of the present invention;
fig. 7 is a flow chart of a voltage operation module shutdown of an ion trap ion manipulation experiment system according to the present invention;
FIG. 8 is a circuit diagram of an FPGA of an ion trap ion manipulation experiment system of the present invention;
legend description:
100. a potential field construction module; 200. an ion trapping module; 300. a potential field adjusting module; 400. a weak force measurement module; 500. a potential position monitoring module; 600. a voltage regulation monitoring module; 700. a fluorescence counting monitoring module; 201. a parameter loading unit; 202. a stability adjusting unit; 203. an ion position adjustment unit; 204. an ion information feedback unit; 601. a power supply starting unit; 602. an instruction receiving unit; 603. a voltage value conversion unit; 604. and a voltage loading unit.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
Referring to fig. 1-8, the present invention provides a technical solution: an ion trap ion manipulation experiment system comprising: the potential field construction module 100, the ion capturing module 200, the potential field adjusting module 300, the weak force measuring module 400, the potential monitoring module 500, the voltage adjusting monitoring module 600, the fluorescence counting monitoring module 700, the potential field construction module 100 is connected with the ion capturing module 200, the ion capturing module 200 is connected with the potential field adjusting module 300, and the potential field adjusting module 300 is connected with the weak force measuring module 400, wherein:
the potential field construction module 100 is provided with an upper computer, an FPGA is built in, an ion trap device is opened, and meanwhile, voltages of all electrodes are loaded to construct a potential field in the ion trap;
the ion capturing module 200 carries a laser, a CCD and an ion preparation device, and monitors the ion position in the ion trap through the CCD after capturing ions;
the potential field adjusting module 300 adjusts the potential field control plane;
the invention discloses a method for acquiring, displaying and storing information of trapped ions by a weak force measurement module 400, which is different from the traditional planar ion trap system, by introducing a high-precision voltage control module, combining a new ion trap control system and an existing planar ion trap device, realizing ion precision control, greatly breaking through quantum weak force induction, based on the existing Labview control system, improving on the basis, wherein the voltage control module comprises a potential position monitoring module 500, a voltage regulation monitoring module 600 and a fluorescence counting monitoring module 700, firstly, carrying out signal transmission with a built-in upper computer of the potential field construction module 100, starting an ion trap system by a power supply starting unit 601, carrying out power supply voltage loading by a power supply starting unit 601, synchronously carrying out the ion trap system and the last stored parameter setting, wherein the parameter setting comprises the potential value of each electrode and the shooting time of a CCD device, simultaneously carrying out the loading of an image window of the CCD and a data diagram of a fluorescence counter, carrying out the fluorescence counting monitoring module 700 in real time, carrying out the monitoring on the position information of the ions in real time, carrying out the position monitoring module 500, carrying out the direct current voltage regulation on the position of each electrode by the current electrode, and the current position of the electrode 203, and changing the current position of the electrode by the current position of the electrode, and the current position of the electrode can be changed by the current position of the electrode is changed, the current position is changed by the current voltage regulation of the electrode is changed, and the current position is changed, and the current position of the current position is changed by the electrode is adjusted by the current voltage is adjusted by the electrode voltage, and the current voltage is adjusted, when a certain electrode voltage is lifted to enable ions to move towards the opposite direction of the electrode, when a certain electrode voltage is lowered to enable ions to move towards the direction of the electrode, finally, each electrode voltage value is recorded, and in actual operation, the actual adjustment range of each electrode voltage is far smaller than the adjustable range of each electrode voltage due to the limit of the CCD window size and the chip trap potential field, the data of a fluorescence counter are required to be observed in each electrode potential value modification and ion information recording step to ensure that the fluorescence count is relatively stable, then the environment is restored to an initial state, each electrode potential value modification, ion information recording and fluorescence count stabilization step is repeated, experimental analysis is carried out after repeated for a plurality of times, so that additional weak force values generated after changing the environment are obtained, and the adjustment of a voltage control module is carried out, through the cooperation of the potential position monitoring module 500, the voltage regulation monitoring module 600 and the fluorescence counting monitoring module 700, signals are output by an upper computer, a power supply starting unit 601 starts the system, loads power supply, a working instruction is sent by the upper computer, an ion trap control system inputs switching voltage, the module starts working, a digital circuit control end of the module converts voltage values input by the upper computer into 0 and 1 sequences and outputs high-level pulses to a circuit board through an I/O port, 14 ports are output in parallel, a DAC chip of the circuit board converts the voltage pulses received by the digital circuit control end into analog signals and outputs the analog signals, 3 of the 14 input ports are used for selecting output ports, 8 are used for voltage control, the other 3 are used for working switch and working protection, the output ports of the DAC chip of the circuit board are matched in pairs, and the voltage is loaded on an ion trap electrode after passing through a differential circuit, when the ion trap is closed, the upper computer sends a stop working instruction, the ion trap control system cuts off the switching voltage, and the power supply voltage is cut off after the ion trap control system stops working.
Briefly, the ion trap ion manipulation experiment system comprises the following implementation steps: opening an ion trap device, loading voltage direct current and alternating current of each electrode, constructing an electric potential field in the ion trap, capturing ions, observing the position of the ions in the ion trap through a CCD, finely adjusting the electric potential field, transferring the ions to an ideal position, and carrying out weak force measurement, wherein the weak force measurement comprises the following steps: changing or introducing external environment, observing the change of ion position, recording coordinate information of current ion position and voltage value of each electrode, regulating DC electrode voltage to make ion position return to initial position, recording voltage value of each electrode, calculating change condition of potential field by voltage difference value so as to obtain accurate value of external acting force.
Different from the traditional planar ion trap system, the voltage value input by the upper computer can be converted into 0 and 1 sequences through the arrangement of the ion capturing module 200 and the potential field adjusting module 300, high-level pulses are output to the circuit board through the I/O port, the electrode potential value is modified to realize lifting or lowering of electrode voltage to transport ions back to the initial position, and the change condition of the potential field is calculated through the voltage difference value, so that the accurate value of external acting force is obtained.
Referring to fig. 1 to 8, the ion capturing module 200 includes a parameter loading unit 201, a stability adjusting unit 202, an ion position adjusting unit 203, and an ion information feedback unit 204, wherein:
the parameter loading unit 201 uses the parameter setting stored last time to load the ion trap device after being turned on, loads the CCD image window, and loads the fluorescence counter data body, where the parameter setting includes: the potential value of each electrode and the shooting time of CCD equipment;
the stability adjusting unit 202 monitors the current state of the ion obtained after the parameter loading unit 201 loads, and starts the test after reaching the stable state.
Referring to fig. 1 to 8, a parameter loading unit 201 is connected to a stability adjusting unit 202, and the stability adjusting unit 202 is connected to an ion position adjusting unit 203, wherein:
the ion position adjusting unit 203 changes the ion position by an environmental change, and adjusts the electrode potential value.
Referring to fig. 1 to 8, the ion position adjusting unit 203 is connected to the ion information feedback unit 204, wherein:
the ion information feedback unit 204 records the voltage value of each electrode and the fluorescence count, and repeats the steps of the stability adjustment unit 202 and the ion position adjustment unit 203 to stabilize the fluorescence count.
Referring to fig. 1 to 8, the voltage regulation monitoring module 600 includes a power supply start unit 601, an instruction receiving unit 602, a voltage value converting unit 603, and a voltage loading unit 604, wherein:
the voltage regulation monitoring module 600 is internally provided with DAC chips and carries a digital circuit controller to regulate the voltage loaded on the ion trap electrode, the output ports of the DAC chips of the circuit board are matched in pairs, and the voltage is loaded on the ion trap electrode after passing through a differential circuit.
Referring to fig. 1 to 8, a power supply starting unit 601 is connected to an instruction receiving unit 602, the instruction receiving unit 602 is connected to a voltage value converting unit 603, wherein:
the power supply starting unit 601 serves the voltage regulation monitoring module 600 and the potential field construction module 100, is responsible for system starting of the voltage regulation monitoring module 600, and loads power supply voltage;
the instruction receiving unit 602 is configured to receive an instruction sent by the host computer, and input a switching voltage to the ion capturing module 200, so that the ion capturing module starts to operate and cuts off power supply.
Referring to fig. 1-8, the voltage value converting unit 603 is connected to the voltage loading unit 604, wherein:
the voltage value conversion unit 603 converts the input voltage value of the upper computer into a 0, 1 sequence through the digital circuit controller, and outputs high-level pulse to the circuit board through the I/O port, wherein 14 ports are output in parallel;
the voltage loading unit 604 receives the level pulses from the control terminal of the digital circuit from the DAC chip of the circuit board, converts the level pulses into analog signals, and outputs voltages, wherein 3 of the 14 input ports are used for selecting output ports, 8 are used for voltage control, and the other 3 are used for operation switching and operation protection.
Referring to fig. 1 to 8, the electric potential position monitoring module 500, the voltage adjusting monitoring module 600 and the fluorescence counting monitoring module 700 are respectively connected with the electric potential field adjusting module 300, wherein:
the fluorescence count monitoring module 700 monitors fluorescence counts in real time;
the potential monitoring module 500 monitors ion positions in real time.
Principle of operation
Different from the traditional planar ion trap system, the invention realizes ion precise control by introducing a high-precision voltage control module and combining a new ion trap control system and an existing planar ion trap device, has great breakthrough in quantum weak force induction, is improved based on the existing Labview control system, the voltage control module comprises a potential position monitoring module 500, a voltage regulation monitoring module 600 and a fluorescence counting monitoring module 700, firstly, the voltage control module carries out signal transmission with a built-in upper computer of a potential field construction module 100, the potential field construction module 100 starts the ion trap system, a power supply starting unit 601 carries out power supply voltage loading, the ion capturing module 200 starts a laser and a CCD and loads parameter settings which are saved for the last time, the parameter settings comprise potential values of electrodes and shooting time length of CCD equipment, simultaneously loading an image window of a CCD and a data diagram of a fluorescence counter, matching, monitoring fluorescence in real time by a fluorescence counting monitoring module 700, monitoring ion position information in real time by a potential monitoring module 500, starting testing after the ions reach a stable state by other equipment, changing the environment to change the ion position by matching of a parameter loading unit 201, a stability adjusting unit 202 and an ion position adjusting unit 203, shooting the position by the CCD, recording the ion position information, recording the current electrode voltage value, realizing lifting or lowering the electrode voltage to carry the ions back to the initial position by modifying the electrode potential value, lifting the DC electrode voltage to enable the ion position to rise, lowering the DC electrode voltage to enable the ion position to fall, and shifting the ions to the opposite direction of the electrode by lifting a certain electrode voltage, when a certain electrode voltage is reduced to enable ions to move towards the electrode, the voltage value of each electrode is finally recorded, and in actual operation, the actual adjustment range of each electrode voltage is far smaller than the adjustable range of each electrode voltage due to the limit of the CCD window size and the chip trap potential field, the data of a fluorescence counter are required to be observed in each electrode potential value modification and ion information recording step, the fluorescence count is ensured to be relatively stable, the environment is restored to the initial state, each electrode potential value modification, ion information recording and fluorescence count stabilization ensuring step is repeated, experimental analysis is carried out after repeated for a plurality of times, so that an additional weak force value generated after changing the environment is obtained, and for the adjustment of a voltage control module, the coordination of the electric position monitoring module 500, the voltage adjustment monitoring module 600 and the fluorescence count monitoring module 700 is carried out, signals are firstly output by an upper computer, the power supply starting unit 601 starts the system, loads power supply, the host computer sends working instructions, the ion trap control system inputs switching voltage, the module starts working, the digital circuit control end of the module converts the voltage value input by the host computer into 0, 1 sequence and outputs high-level pulse to the circuit board through the I/O port, 14 ports are output in parallel, the circuit board DAC chip receives the level pulse of the digital circuit control end and converts the level pulse into analog signal and outputs voltage, 3 of the 14 input ports are used for selecting output ports, 8 are voltage control, the other 3 are used for working switch and working protection, the output ports of the circuit board DAC chip are matched in pairs, the voltage is loaded on the ion trap electrode after the differential circuit, the host computer sends working stopping instructions when the ion trap control system is closed, the ion trap control system cuts off the switching voltage, and cutting off the power supply voltage after stopping working.
Briefly, the ion trap ion manipulation experiment system comprises the following implementation steps: opening an ion trap device, loading voltage direct current and alternating current of each electrode, constructing an electric potential field in the ion trap, capturing ions, observing the position of the ions in the ion trap through a CCD, finely adjusting the electric potential field, transferring the ions to an ideal position, and carrying out weak force measurement, wherein the weak force measurement comprises the following steps: changing or introducing external environment, observing the change of ion position, recording coordinate information of current ion position and voltage value of each electrode, regulating DC electrode voltage to make ion position return to initial position, recording voltage value of each electrode, calculating change condition of potential field by voltage difference value so as to obtain accurate value of external acting force.
Different from the traditional planar ion trap system, the voltage value input by the upper computer can be converted into 0 and 1 sequences through the arrangement of the ion capturing module 200 and the potential field adjusting module 300, high-level pulses are output to the circuit board through the I/O port, the electrode potential value is modified to realize lifting or lowering of electrode voltage to transport ions back to the initial position, and the change condition of the potential field is calculated through the voltage difference value, so that the accurate value of external acting force is obtained.
The present invention is not limited to the above-mentioned embodiments, and any equivalent embodiments which can be changed or modified by the technical content disclosed above can be applied to other fields, but any simple modification, equivalent changes and modification made to the above-mentioned embodiments according to the technical substance of the present invention without departing from the technical content of the present invention still belong to the protection scope of the technical solution of the present invention.
Claims (8)
1. An ion trap ion manipulation experiment system comprising: the device comprises a potential field construction module (100), an ion capturing module (200), a potential field adjusting module (300), a weak force measuring module (400), a potential monitoring module (500), a voltage adjusting monitoring module (600) and a fluorescence counting monitoring module (700), and is characterized in that: the potential field construction module (100) is connected with the ion capturing module (200), the ion capturing module (200) is connected with the potential field adjusting module (300), and the potential field adjusting module (300) is connected with the weak force measuring module (400), wherein:
the potential field construction module (100) is provided with an upper computer, an FPGA is arranged in the upper computer, an ion trap device is opened, and meanwhile, voltages of all electrodes are loaded to construct a potential field in the ion trap;
the ion capturing module (200) carries a laser, a CCD and an ion preparation device, and the ion position in the ion trap is monitored through the CCD after the ions are captured;
the potential field adjusting module (300) adjusts a potential field control layer;
the weak force measurement module (400) acquires, displays and stores the information of the trapped ions.
2. An ion trap ion manipulation experiment system as defined in claim 1 wherein: the ion capturing module (200) comprises a parameter loading unit (201), a stability adjusting unit (202), an ion position adjusting unit (203) and an ion information feedback unit (204), wherein:
the parameter loading unit (201) uses the parameter setting stored last time to load the ion trap device after being started, loads the CCD image window and loads the fluorescence counter data body, and the parameter setting comprises: the potential value of each electrode and the shooting time of CCD equipment;
the stability adjusting unit (202) monitors the current state of the ions obtained after the parameter loading unit (201) loads the ions, and starts the test after the stable state is reached.
3. An ion trap ion manipulation experiment system as defined in claim 2 wherein: the parameter loading unit (201) is connected with a stability adjusting unit (202), the stability adjusting unit (202) is connected with an ion position adjusting unit (203), wherein:
the ion position adjustment unit (203) changes the ion position by changing the environment, and adjusts the electrode potential value.
4. An ion trap ion manipulation experiment system as claimed in claim 3 wherein: the ion position adjusting unit (203) is connected with the ion information feedback unit (204), wherein:
the ion information feedback unit (204) records the voltage value and the fluorescence count of each electrode, and the steps of the stability adjusting unit (202) and the ion position adjusting unit (203) are repeated to enable the fluorescence count to be stable.
5. An ion trap ion manipulation experiment system as defined in claim 4 wherein: the voltage regulation monitoring module (600) comprises a power supply starting unit (601), an instruction receiving unit (602), a voltage value converting unit (603) and a voltage loading unit (604), wherein:
the voltage regulation monitoring module (600) is internally provided with DAC chips and bears a digital circuit controller to regulate the voltage loaded on the ion trap electrode, the output ports of the DAC chips of the circuit board are matched in pairs, and the voltage is loaded on the ion trap electrode after passing through a differential circuit.
6. An ion trap ion manipulation experiment system as defined in claim 5 wherein: the power supply starting unit (601) is connected with the instruction receiving unit (602), and the instruction receiving unit (602) is connected with the voltage value converting unit (603), wherein:
the power supply starting unit (601) is used for serving the voltage regulation monitoring module (600) and the potential field construction module (100), is responsible for starting a system of the voltage regulation monitoring module (600), and is used for loading power supply voltage;
the instruction receiving unit (602) is used for receiving an instruction sent by the upper computer, inputting a switching voltage to the ion capturing module (200) and enabling the ion capturing module to start working and cut off power supply.
7. An ion trap ion manipulation experiment system as defined in claim 6 wherein: the voltage value conversion unit (603) is connected to a voltage application unit (604), wherein:
the voltage value conversion unit (603) converts an input voltage value of the upper computer into a 0-1 sequence through the digital circuit controller, and outputs high-level pulses to the circuit board through the I/O ports, wherein 14 ports are connected in parallel for output;
the voltage loading unit (604) receives the level pulse of the control end of the digital circuit from the DAC chip of the circuit board, converts the level pulse into an analog signal and outputs voltage, wherein 3 of 14 input ports are used for selecting output ports, 8 are used for voltage control, and the other 3 are used for working switch and working protection.
8. An ion trap ion manipulation experiment system as defined in claim 7 wherein: the electric potential monitoring module (500), the voltage regulation monitoring module (600) and the fluorescence counting monitoring module (700) are respectively connected with the electric potential field regulation module (300), wherein:
the fluorescence count monitoring module (700) monitors fluorescence counts in real time;
the potential monitoring module (500) monitors ion positions in real time.
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Citations (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5793091A (en) * | 1996-12-13 | 1998-08-11 | International Business Machines Corporation | Parallel architecture for quantum computers using ion trap arrays |
| CA2339548A1 (en) * | 1998-08-05 | 2000-02-17 | National Research Council Of Canada | Apparatus and method for atmospheric pressure 3-dimensional ion trapping |
| US6124592A (en) * | 1998-03-18 | 2000-09-26 | Technispan Llc | Ion mobility storage trap and method |
| CN103714878A (en) * | 2014-01-15 | 2014-04-09 | 中国科学院武汉物理与数学研究所 | Integrated ion trapping device |
| CN210199398U (en) * | 2019-05-22 | 2020-03-27 | 中国科学技术大学 | Control device for light trapping particles |
| WO2020219586A1 (en) * | 2019-04-23 | 2020-10-29 | Radiabeam Technologies, Llc | Quantum computing structures using ion traps |
| CN111899909A (en) * | 2020-08-10 | 2020-11-06 | 中国科学技术大学 | Device for cooling and trapping ions |
| CN112529192A (en) * | 2020-12-01 | 2021-03-19 | 中国科学技术大学 | Electronic device for ion trap quantum experiment and control method thereof |
| CN113970662A (en) * | 2021-10-19 | 2022-01-25 | 中山大学 | Electric field force detection system based on single imprisoned ion |
| CN114388334A (en) * | 2021-12-21 | 2022-04-22 | 上海裕达实业有限公司 | Ion isolation method, system and medium for ion trap mass spectrometer |
| CN114429063A (en) * | 2021-12-31 | 2022-05-03 | 西安空间无线电技术研究所 | Method and system for calibrating charge state and relative spatial distribution of trapped ions |
| CN115047259A (en) * | 2022-04-15 | 2022-09-13 | 安徽省太微量子科技有限公司 | Particle charge-to-mass ratio measuring method based on frequency-adjustable two-dimensional linear ion trap |
| CN115482952A (en) * | 2021-05-31 | 2022-12-16 | 华为技术有限公司 | Ion trap integrated chip, preparation method thereof and ion trap quantum computing system |
| CN115795806A (en) * | 2022-11-07 | 2023-03-14 | 兰州空间技术物理研究所 | Method for quickly optimizing geometric parameters of ion trap |
| CN115829043A (en) * | 2022-12-08 | 2023-03-21 | 国仪量子(合肥)技术有限公司 | Ion trap quantum computer |
| CN116136965A (en) * | 2021-11-16 | 2023-05-19 | 华为技术有限公司 | Particle trap system |
-
2023
- 2023-05-26 CN CN202310602806.7A patent/CN116598040B/en active Active
Patent Citations (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5793091A (en) * | 1996-12-13 | 1998-08-11 | International Business Machines Corporation | Parallel architecture for quantum computers using ion trap arrays |
| US6124592A (en) * | 1998-03-18 | 2000-09-26 | Technispan Llc | Ion mobility storage trap and method |
| CA2339548A1 (en) * | 1998-08-05 | 2000-02-17 | National Research Council Of Canada | Apparatus and method for atmospheric pressure 3-dimensional ion trapping |
| CN103714878A (en) * | 2014-01-15 | 2014-04-09 | 中国科学院武汉物理与数学研究所 | Integrated ion trapping device |
| WO2020219586A1 (en) * | 2019-04-23 | 2020-10-29 | Radiabeam Technologies, Llc | Quantum computing structures using ion traps |
| CN210199398U (en) * | 2019-05-22 | 2020-03-27 | 中国科学技术大学 | Control device for light trapping particles |
| CN111899909A (en) * | 2020-08-10 | 2020-11-06 | 中国科学技术大学 | Device for cooling and trapping ions |
| CN112529192A (en) * | 2020-12-01 | 2021-03-19 | 中国科学技术大学 | Electronic device for ion trap quantum experiment and control method thereof |
| CN115482952A (en) * | 2021-05-31 | 2022-12-16 | 华为技术有限公司 | Ion trap integrated chip, preparation method thereof and ion trap quantum computing system |
| CN113970662A (en) * | 2021-10-19 | 2022-01-25 | 中山大学 | Electric field force detection system based on single imprisoned ion |
| CN116136965A (en) * | 2021-11-16 | 2023-05-19 | 华为技术有限公司 | Particle trap system |
| CN114388334A (en) * | 2021-12-21 | 2022-04-22 | 上海裕达实业有限公司 | Ion isolation method, system and medium for ion trap mass spectrometer |
| CN114429063A (en) * | 2021-12-31 | 2022-05-03 | 西安空间无线电技术研究所 | Method and system for calibrating charge state and relative spatial distribution of trapped ions |
| CN115047259A (en) * | 2022-04-15 | 2022-09-13 | 安徽省太微量子科技有限公司 | Particle charge-to-mass ratio measuring method based on frequency-adjustable two-dimensional linear ion trap |
| CN115795806A (en) * | 2022-11-07 | 2023-03-14 | 兰州空间技术物理研究所 | Method for quickly optimizing geometric parameters of ion trap |
| CN115829043A (en) * | 2022-12-08 | 2023-03-21 | 国仪量子(合肥)技术有限公司 | Ion trap quantum computer |
Non-Patent Citations (6)
| Title |
|---|
| H WATANABE ET.AL: ""Control System of the Tokyo Electron Beam Ion Trap"", 《PHYSICA SCRIPTA》, vol. 73, pages 365 - 367 * |
| JI LI( 李冀 ) 等: ""Three-Dimensional Compensation for Minimizing Heating of the Ion in Surface-Electrode Trap"", 《CHIN. PHYS. LETT.》, vol. 30, no. 5, pages 053701 - 1 * |
| YUAN-HUA LI ET.AL: ""Controlled Teleportation of an Arbitrary Three-ion State in Ion-trap Systems"", 《INT J THEOR PHYS》, no. 53, pages 3756 * |
| 刘志超: ""芯片离子阱中温度与受力的精密感知"", 《CNKI博士学位论文全文库 基础科学辑》, pages 1 - 102 * |
| 周飞 等: ""线形离子阱中量子比特的制备"", 《第十六届全国原子与分子物理学术会议论文摘要集》, pages 30 * |
| 章嘉伟: ""囚禁离子体系中实验探索量子体系的不可逆性和快速容错的量子逻辑操作"", 《CNKI博士学位论文全文库 基础科学辑》, pages 31 - 46 * |
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