CN116542024A - Missile storage integrity rate assessment method based on residual strength and service life - Google Patents
Missile storage integrity rate assessment method based on residual strength and service life Download PDFInfo
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Abstract
The invention discloses a missile storage integrity rate assessment method based on residual strength and service life, and relates to the technical field of reliability design. The technical proposal is as follows: according to daily use and test conditions of the missile, the equipment on the missile is divided into undetectable equipment, measurable electronic equipment and measurable electromechanical equipment; the non-measurable equipment calculates the storage integrity rate by adopting a stress intensity model according to the residual intensity, and the measurable electronic equipment calculates the storage integrity rate by adopting exponential distribution or Weibull distribution according to the residual storage life and the residual working life; the electromechanical equipment calculates the storage integrity rate by adopting Weibull distribution according to the residual storage life and the residual working life; and calculating the storage integrity rate of the missile according to the first refurbishment period, the storage period and the reliability model of the missile. The relevant parameters in the assessment method can be obtained through experiments in the process of missile development and use, the storage integrity of the missiles can be conveniently and rapidly calculated, and the method is convenient and practical.
Description
Technical Field
The invention belongs to the technical field of reliability design, and particularly relates to a missile storage integrity rate assessment method based on residual strength and service life.
Background
The storage integrity of missiles is the ratio of the number of missiles capable of performing a combat mission at any time to the total number of missiles in a storage state under a predetermined condition and for a predetermined period of time. The fight mission is to guide the bullet to fly successfully after storage and ground use. The storage integrity rate of the missile is evaluated scientifically and reasonably, and the important use problems such as purchase planning, quantity scale configuration and the like are directly related, so that the method is a very concerned problem for a user.
After missile delivery, part of missile-borne equipment is gradually aged and the performance is gradually reduced along with the increase of calendar time, and meanwhile, the capability of reliable operation of the missile is gradually consumed in the ground use processes of combat training, ground maneuvering, annual detection and the like. The research on the storage integrity rate of the missile at home and abroad mostly belongs to model research and academic discussion, and an evaluation method which can reflect the actual condition of products on the missile, can obtain model parameters and has operability and model engineering application value is lacking.
Disclosure of Invention
In view of the above, the invention provides a missile storage integrity rate assessment method based on residual strength and service life, which can reflect actual conditions of products on a missile, can obtain model parameters, and has operability and model engineering application value.
A missile storage integrity rate assessment method based on residual strength and service life is characterized in that the missile undergoes storage, launching and flying to form 3 sections, and the storage reliability R is used respectively Z Emission reliability R S And flight reliability R X Measured, let the storage period of missile be T 0 Only 1 time of refurbishment in the storage period, the first refurbishment period is T F The test period is T C The method comprises the steps of carrying out a first treatment on the surface of the Based on the assumption, the method comprises the following steps:
step one: the equipment on the missile is divided into undetectable equipment, electronic equipment and electromechanical equipment;
step two: calculating a storage integrity rate of the undetectable apparatus based on the residual intensity;
step three: calculating a storage integrity rate of the electronic device based on the remaining storage and operational lifetime;
step four: storage integrity rates based on remaining storage and operational life of the electromechanical device;
step five: and calculating the storage integrity rate of the missile according to the reliability model.
Further, the undetectable structure comprises an elastomer structural member, a solid engine, various springs, an on-bullet battery or an initiating explosive device, and an index set of the undetectable structure is set as P; the electronic equipment comprises a flight control computer and a comprehensive controller, and an index set of the electronic equipment is set as E; the electromechanical device comprises a servo mechanism and an inertia measurement combination, and an index set of the electromechanical device is set as M.
Further, in the second step, mu is used for the undetectable device i E P i,S (t) represents the residual intensity mean value, sigma, of the intensity S at the time t i,S Is the variance of intensity, obeys normal distribution N (mu) i,S ,σ 2 i,S ) The method comprises the steps of carrying out a first treatment on the surface of the Average value of load L is mu i,L Variance is sigma i,L Obeys normal distribution N (mu) i,L ,σ 2 i,L ) The turnover period of i is t i,0 The method comprises the steps of carrying out a first treatment on the surface of the After the missile passes the time t, i storage integrity rate A i The set of calculation equations of (t) is:
wherein phi (·) is a standard normal distribution function;
for equipment with large dispersion of performance parameters, flight reliability after long-term storage is calculated by adopting lognormal distribution, and if the performance is X and X obeys the lognormal distribution, lnX or lgX obeys the normal distribution, and the calculation process is similar to the normal distribution.
Further, in the third step, for the electronic device j E whose working life and storage life both obey the exponential distribution, the storage life obeys the exponential distribution, and the storage life is set to be T j,Z ，t j,0 Turnover period of j; the service life clothes are also distributed exponentially, and the expected value of the service life is T j,G ，t j,D (t) is the accumulated working time of the ground test and the use process before the moment t, t j,S To transmit the task time, t j,X Is equivalent flight mission time; after the missile passes the time t, the storage integrity rate A of the electronic equipment j j The set of calculation equations of (t) is:
wherein, l is the number of periodical tests passed by j before t, and t is the number of periodical tests passed by j before t j,S =0, take R j，s [t j，s |t j，D (t)]＝1；
For the electronic equipment j E with working life obeying the exponential distribution and storage life obeying the Weibull distribution, the storage life obeying the Weibull distribution is set to be T j,Z Shape parameter m j ，t j,0 Turnover period of j; working life obeys the exponential distribution, and the expected value of the working life is T j,G ，t j,D (t) is the accumulated working time of the ground test and the use process before the moment t, t j,S To transmit the task time, t j,X Is equivalent flight mission time; after the missile passes the time t, the electronic equipment jStorage integrity rate A j The set of calculation equations of (t) is:
wherein, l is the number of periodical tests that k passes before t; Γ (·) is a Γ function, t for a device that does not operate during transmission j,S =0, take R j，s [t j，s |t j，D (t)]＝1。
Further, in the fourth step, the electromechanical device k e M is set to have a storage life conforming to Weibull distribution and a shape parameter M k,Z The storage period is T k,Z ，t k,0 For the turnover of k, the service life clothes are also distributed from Weibull, and the shape parameter is m k,G The expected value of the service life is T k,G ，t k,D (t) is the accumulated working time of the ground test and the use process before the moment t, t k,S To transmit the task time, t k,X For equivalent flight mission time, after missile passing time t is stored, k is stored in integrity rate A k The set of calculation equations of (t) is:
wherein, l is the number of periodical tests that k passes before t; Γ (·) is a Γ function, t for a device that does not operate during transmission k,S =0, take R k，s [t k，s |t k，D (t)]＝1。
In the fifth step, the storage integrity rate of the missile is comprehensively obtained by utilizing the storage integrity rate of the on-board equipment according to the reliability model of the missile, and when the missile is a serial system, the storage integrity rate is the product of the storage integrity rates of the on-board equipment, and after the missile leaves the factory t, the storage integrity rate is
Wherein A is i (t) is the storage integrity of the undetectable equipment, i ε P; a is that j (t) is the storage integrity of the electronic device, j E E; a is that k (t) is the storage integrity of the electromechanical device, k ε M;
missile during storage period T 0 The storage integrity rate is not less than:
A D ＝min{A D (T F )，A D (T 0 )}
wherein A is D (T F ) To correspond to the first refurbishment period T F Is a storage integrity rate of (2); a is that D (T 0 ) To correspond to the storage period T 0 Storage integrity at that time.
When calculating the storage integrity of any equipment h on the bullet, the equipment which is not replaced after the first refurbishment has the storage integrity corresponding to the first refurbishment period and the storage period of A respectively h (T F ) And A h (T 0 ). Equipment for changing to new products during the first refurbishment, corresponding to the storage integrity rates during the first refurbishment period and the storage period, respectively, being A h (T F ) And A h (T 0 -T F )。
The beneficial effects are that:
1. the invention comprehensively considers the influences of the processes of storage, test, maintenance and the like of the actual missile experience on the fight mission, firstly proposes to measure the storage integrity of the missile by adopting the storage reliability, the launching reliability, the product of the flight reliability and the ratio of the product of the delivery of the missile after the storage and the use of the missile, so that the calculation result is more approximate to the true value, and the related parameters can be obtained through tests in the development and the use of the missile, thereby conveniently and rapidly calculating the storage integrity of the missile, and being convenient and practical.
2. The missile storage integrity rate assessment method reflects the use conditions of testing, refurbishment and the like after missile delivery: the degradation of the undetectable product directly affects the storage integrity of the missile. The test period directly affects the storage task time of the electronic equipment and the electromechanical equipment, thereby affecting the storage reliability. The consumption of the working life of the testable equipment in the test process directly affects the emission reliability and the flight reliability. Whether to replace a certain on-board equipment during refurbishment directly influences the storage task time of the equipment, and further influences the storage reliability, the emission reliability and the flight reliability. Therefore, the method is convenient to understand, accords with engineering practice, and has great engineering application value.
3. The calculation formula of the storage integrity rate of the missile is obtained based on an influence mechanism of using processes such as storage, testing, refurbishment and the like on a combat mission of the missile, the periodic test is carried out in the using process, the storage time after the test is qualified and before the next test is used as the storage mission time of the measurable equipment to calculate the storage reliability, and the influence of the test period on the storage integrity rate is reflected; the rest working life is used as the average life of the calculated emission reliability and the flight reliability, so that the influence of the working life consumption on the storage integrity is reflected; according to the difference of the storage period and the residual service life of the refurbishment replacement part and the replacement part, the storage reliability, the emission reliability and the flight reliability are calculated, and the influence of refurbishment on the storage integrity rate is reflected.
Drawings
FIG. 1 is a schematic flow chart of the method of the present invention.
Detailed Description
The invention will now be described in detail by way of example with reference to the accompanying drawings.
Example 1:
the method principle of the invention:
the missile is a high-value weapon, and has the characteristics of long-term storage and one-time flight, and in the storage process, the ground use links of test, maintenance, training, duty and the like are included, and in the life cycle, the missile mainly undergoes storage, emission and flight to form 3 sections, and the storage reliability R is respectively used Z Emission reliability R S And flight reliability R X To measure. The missile-borne equipment of the missile can be divided into 3 types, wherein the first type is equipment which cannot be detected or the detection result cannot reflect the real performance in the daily use and annual test process, and comprises a structural member of the missile, a solid engine, various springs, a battery on the missile, an initiating explosive device and the like, and an index set of the equipment is P; the second type is electronic equipment capable of being tested in the processes of daily use, annual test and the like, such asA flight control computer, a comprehensive controller and the like, wherein an index set of the flight control computer is E; the third category is electromechanical equipment which can be tested in the processes of daily use, annual test and the like, such as a servo mechanism, an inertial measurement unit and the like, and an index set of the electromechanical equipment is set as M. Let the storage period of the missile be T 0 Only 1 time of refurbishment in the storage period, the first refurbishment period is T F The test period is T C 。
a) Undetectable device
Undetectable device i e P is a stress-intensity type. As calendar time increases, its performance intensity S gradually decreases, using mu i,S (t) represents the mean value of the residual intensity at time t, σ i,S Representing the variance of the intensity, which is assumed to follow a normal distribution N (μ) i,S ,σ 2 i,S ). The use load L does not change with time, mu i,L For its mean value, σ i,L For its variance, also obey a normal distribution N (μ) i,L ,σ 2 i,L ). The probability that the residual strength is larger than the use load is the flight reliability R after storage i (t)：
R i (t)＝Φ(μ i (t))
Where Φ (·) is a standard normal distribution function.
Let the turnover period of the undetectable equipment i be t i，0 The total number is N. The flying reliability of the missile when leaving the factory is R i (0) Number NR of missions capable of being completed i (0). The long-term storage has the influence of flight reliability R i (t) after the missile has been stored for a period of time t after descent, the number of missiles that can be completed is NR i (t) its storage integrity rate
Thus, the storage integrity rate A of i i The set of calculation equations of (t) is:
where Φ (·) is a standard normal distribution function.
For equipment with large dispersion of performance parameters such as part of composite material components, the reliability after long-term storage can be calculated by adopting lognormal distribution, and if the performance is X and X follow lognormal distribution, lnX or lgX follow normal distribution, and other calculation processes are the same as normal distribution.
b) Exponential distribution type electronic equipment
The service life of the electronic product obeys the exponential distribution, and the distribution function is that
F(t)＝1-e -λt Or F (t) =1-e -t/θ
Where λ=1/θ is the failure rate, and θ is the average lifetime.
The reliability corresponding to the task time t is
R(t)＝e -λt ＝e -t/θ (2)
The on-board electronics are typically testable. For the electronic equipment j E, the storage life obeys the exponential distribution, and the storage life is T j,Z ，t j,0 Is the turnover period of j. The service life clothes are also distributed exponentially, and the expected value of the service life is T j,G ，t j,D (t) is the accumulated working time of the ground test, use and other processes before the moment t, t j,S To transmit the task time, t j,X Is equivalent flight mission time.
If at T C 、2T C 、…、(l-1)T C 、lT C Periodically detecting the moment to obtain the estimated point values R of the storage reliability 1 、R 2 、…、R l Then separate T C And (3) performing one-time detection, namely immediately repairing the failed product, wherein the residual life distribution of the product is the same as that of the unrepaired product, and the storage reliability considered in the first detection is performed under the condition that the failed product is completely repaired in the first-1 detection. Thus, periodicityIn the test case, the storage task time is at most T C . At a certain time t after missile delivery, checking the turnover period t of the electronic equipment j j,0 The remaining pot life is T j,Z -t-t j,0 It is not restricted to complete one-time periodic test, and the storage task time is t-lT C The storage reliability is as follows (2):
the missile is qualified in delivery test, and R is regulated j,Z ＝R j,Z (0)＝1。
Similarly, at time t after missile delivery, equipment j has accumulated to work for t j,D (T) remaining working Life is T j,G -t j,D (t), task time of emission t j,S Remains unchanged, so its emission reliability is:
device j has accumulated to work t before beginning its flight j,D (t)+t j,S The remaining working life is T j,G -t j,D (t)-t j,S Mission time t of flight j,X Remain unchanged, so its flight reliability is:
the analysis shows that the ground storage, the periodic detection, the training use and the like have influence on the storage reliability, the emission reliability and the flight reliability, the on-board electronic equipment needs to undergo storage, emission and flight with 3 serial task sections, and the number of the flight tasks which can be completed when leaving the factory is NR j,Z R j,S R j,X The number of the flight missions which can be completed after the storage of the time t is NR j,Z (t)R j,S (t j,S |t j,D )R j,X [t j,X |(t j,D +t j,S )]The storage integrity rate is as follows
To sum up, the storage integrity A of the electronic equipment j can be obtained j The set of calculation equations of (t) is:
wherein, l is the number of periodical tests passed by j before t. For devices not operating during transmission, t j,S =0, take R j，s [t j，s |t j，D (t)]＝1。
c) Electromechanical device
The shelf life of an electromechanical product generally obeys a two-parameter weibull distribution, the distribution function being:
where m is a shape parameter, and η is a characteristic lifetime (scale parameter).
Average shelf life of
Where Γ (·) is a Γ function.
Reliability is as follows
The on-board electromechanical device is typically testable. For the electromechanical device k E M, the storage life is set to be compliant with Weibull distribution, and the shape parameter is M k,Z The storage period is T k,Z ，t k,0 Turnover of kAnd (5) a period. The service life clothes are also distributed from Weibull, and the shape parameter is m k,G The expected value of the service life is T k,G ，t k,D (t) is the accumulated working time of the ground test, use and other processes before the moment t, t k,S To transmit the task time, t k,X Is equivalent flight mission time.
The shelf life of the electromechanical device k is T k,Z The storage characteristic life of the material is as follows:
similar to electronic equipment, for a certain time t after missile delivery, consider the turnover period t k,0 The remaining storage characteristic life of the electromechanical device k is
η k,Z -t-t k,0
K is not a limit to complete the periodic test for one time, and the storage task time is t-lT C The storage reliability of the formula (4) is:
the missile is qualified in delivery test, and R is regulated k,Z ＝R k,Z (0)＝1。
Similarly, the service life is T k,G The service life of the working characteristics is as follows (3)
Device k has already accumulated work t before time t k,D (t) remaining service life of working characteristics of
η k,G -t k,D (t)
Time of task of transmission t k,S Remains unchanged, so its emission reliability is:
device k has accumulated to work t before it begins to fly k,D (t)+t k,S The remaining service life of the working feature is:
η k,G -t k,D (t)-t k,S
mission time t of flight k,X Remain unchanged, so its flight reliability is:
the calculation of the storage integrity rate of the electromechanical equipment k is similar to that of an electronic product, and the calculation formula is that
To sum up, the storage integrity A of the electromechanical device k can be obtained k The set of calculation equations of (t) is:
where l is the number of periodic tests that k passes before t and Γ (·) is the Γ function. For devices not operating during transmission, t k,S =0, take R k，S [t k，S |t k，D (t)]＝1。
d) Hybrid distributed electronic device
The operating life and shelf life of some devices are subject to different profiles, mainly electronic devices. Some electronic equipment j E obeys weibull distribution if its storage life is set as T j,Z Shape parameter m j ，t j,0 Is the turnover period of j. Working life obeys the exponential distribution, and the expected value of the working life is T j,G ，t j,D (t) is the accumulated working time of the ground test, use and other processes before the moment t, t j,S To transmit the task time, t j,X Is equivalent flight mission time. The system of calculation equations from which the storage integrity rate can be similarly derived is:
where l is the number of periodic tests that k passes before t and Γ (·) is the Γ function.
For devices not operating during transmission, t j,S =0, take R j，s [t j，s |t j，D (t)]＝1。
e) Storage integrity rate of missile
The storage integrity of the missile can be obtained by utilizing the storage integrity of on-board equipment to perform systematic synthesis according to the reliability model of the missile. When the missile is a serial system, the storage integrity rate is the product of the storage integrity rate of equipment on the missile, and after the missile leaves the factory t, the storage integrity rate is as follows
Wherein A is i (t) is the storage integrity of the undetectable equipment, i ε P; a is that j (t) is the storage integrity of the electronic device, j E E; a is that k And (t) is the storage integrity rate of the electromechanical equipment, and k epsilon M.
Since the storage integrity of the missile is reduced under normal use conditions, the missile is lifted by refurbishment during the first refurbishment, and thus the storage period T 0 The storage integrity rate is not less than the first refurbishment period T F Storage integrity ratio A of (2) D (T F ) And shelf life T 0 Storage integrity rate A at time D (T 0 ) I.e.:
A D ＝min{A D (T F ),A D (T 0 )}
A D ＝min{A D (T F )，A D (T 0 )}
wherein, when the storage integrity rate of any equipment h on the bullet is calculated, the equipment h is firstly refurbishedNon-replacement equipment with storage integrity rates corresponding to the first refurbishment period and the storage period of A h (T F ) And A h (T 0 ). Equipment for changing to new products during the first refurbishment, corresponding to the storage integrity rates during the first refurbishment period and the storage period, respectively, being A h (T F ) And A h (T 0 -T F )。
Example 2:
the specific implementation steps of this embodiment are as follows:
simple bullet composed of typical device on bullet and U 1 、U 2 、U 3 、U 4 4 devices are connected in series to form the missile, and the storage period of the missile is T 0 =25a, only 1 refurbished during the pot life, the first refurbished period being T F Test period t=15a C =1a. The data for the device are as follows:
U 1 as undetectable equipment, cycle t 1 =2a, the breaking pressure gradually decreases with time, and when the missile leaves the factory (t 1 Mean value of =2) is μ 1,S (2) =16.75 MPa, mu at accelerated aging to 17a 1,S (17) = 16.248MPa, mu when accelerated ageing to 27a 1,S (27) 15.953MPa, variance sigma 1,S =0.875 MPa, obeying a normal distribution N (μ 1,S ,σ 2 1,S ). The load is the working pressure, the average mu 1,L =11.31 MPa, variance σ 1,L =0.35 MPa, also obeys the normal distribution N (μ 1,L ,σ 2 1,L )。
U 2 For hot standby operation of the electronic device, it is in operation during combat readiness. The storage life of the material is subjected to an exponential distribution, and the storage life is T j,Z =30a, turnover period t 2 =1a. The service life also obeys the exponential distribution, the expected value T 2,G The operation time of 14a is t, which is calculated according to the annual combat duty and the test section after 10h, such as test and inspection before missile delivery 2,D (14) 1032h, accumulated operating time t of 24a 2,D (24) Time t of transmission task =1762 h 2,S =0.25 h, equivalent mission time t 2,X ＝2h。
U 3 Is common electronic equipment, has a storage life conforming to Weibull distribution and a storage life T 3,Z =28a, shape parameter m 3,Z =2.4, turnover t 3 =1a. Working life obeys exponential distribution, expectation value T 3,G 10000h, 10h before missile delivery, calculated according to annual combat duty and test profile, 14a end accumulated working time t 3,D (14) The cumulative operating time t of 24h, 24a =24 h 3,D (14) Time of transmission task t =34 3,S =0.25 h, equivalent mission time t 3,X ＝2h。
U 4 For hot standby operation of the electromechanical device, it is in operation during combat readiness. The shelf life is distributed from Weibull, and the storage period is T 4,Z =29 a, shape parameter m 4,Z =2.8, turnover t 4 =1a. Working life obeys Weibull distribution, expected value T 4,G 7000h, shape parameter m 4,G =1.8, test and check before missile delivery have been done for 30h, calculated according to annual combat shift and test profile, cumulative working time t of 14a 4,D (14) The cumulative operating time t of 24a =1052 h 4,D (24) Transmit task time t=1782 h 4,S =0.25 h, equivalent mission time t 4,X ＝2h。
Step1. Classifying the sprung product. Undetectable device p= { U 1 Electronic device e= { U } 2 ,U 3 Electromechanical device
M＝{U 4 }。
Step2. Calculation of the storage integrity of the undetectable equipment.
According to the calculation formula and U 1 Is a function of the data of (a),
in the same way, the processing method comprises the steps of,
thus U 1 The storage integrity rates corresponding to 15 years and 25 years of missile are respectively:
step3. Calculation of storage integrity of electronic devices
U 2 Both the shelf life and the working life of (c) follow an exponential distribution,
for storage reliability, U 2 The turnover period of the missile is 1a, the missile 15a and 25 years respectively undergo 14 times of annual tests and 24 times of annual tests, and the storage reliability is respectively
For launch reliability, the missile leaves the factory:
for the degree of reliability of the flight,
thus U 2 The storage integrity rates corresponding to 15 years and 25 years of missile are respectively:
/>
for storage reliability, U 3 Is subject to Weibull distribution, storage characteristic life
U 3 The turnover period of the missile is 1a, the missile 15a and 25 years respectively undergo 14 times of annual tests and 24 times of annual tests, and the storage reliability is respectively
For emission reliability, U 3 The working life of the missile is subjected to exponential distribution, and when the missile leaves the factory:
for flight reliability
Thus U 3 The storage integrity rates corresponding to 15 years and 25 years of missile are respectively:
step4. Calculation of the storage integrity of the electromechanical device.
For storage reliability, U 4 Is subject to Weibull distribution, storage characteristic life
U 4 Is 1a, missile 15a. The storage reliability of the product is 14 times and 24 times respectively after 25 years
U 4 Working life of (C) is compliant with Weibull distribution, working characteristic life
For emission reliability
For flight reliability
Thus U 4 The storage integrity rates corresponding to 15 years and 25 years of missile are respectively:
step5. Calculation of storage integrity of missile.
A D (15)＝A 1 (T F )A 2 (T F )A 3 (T F )A 4 (T F )＝A 1 (15)A 2 (15)A 3 (15)A 4 (15)＝0.934078208
A D (25)＝A 1 (T 0 )A 2 (T 0 )A 3 (T 0 )A 4 (T 0 )＝A 1 (25)A 2 (25)A 3 (25)A 4 (25)＝0.807139573
Missile during storage period T 0 The storage integrity rate is not less than:
A D ＝min{A D (T 0 ),A D (T F )}＝0.807139573。
in summary, the above embodiments are only preferred embodiments of the present invention, and are not intended to limit the scope of the present invention. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (5)
1. A missile storage integrity rate assessment method based on residual strength and service life is characterized in that the missile undergoes storage, launching and flying to form 3 sections, and the storage reliability R is used respectively Z Emission reliability R S And flight reliability R X Measured, let the storage period of missile be T 0 Only 1 time of refurbishment in the storage period, the first refurbishment period is T F The test period is T C The method comprises the steps of carrying out a first treatment on the surface of the Based on the above assumption, itIs characterized in that the method comprises the following steps:
step one: the equipment on the missile is divided into undetectable equipment, electronic equipment and electromechanical equipment;
step two: calculating a storage integrity rate of the undetectable apparatus based on the residual intensity;
step three: calculating a storage integrity rate of the electronic device based on the remaining storage and operational lifetime;
step four: storage integrity rates based on remaining storage and operational life of the electromechanical device;
step five: calculating the storage integrity rate of the missile according to the reliability model;
the undetectable structure comprises an elastomer structural member, a solid engine, various springs, an on-bullet battery or an initiating explosive device, and an index set of the undetectable structure is set as P; the electronic equipment comprises a flight control computer and a comprehensive controller, and an index set of the electronic equipment is set as E; the electromechanical device comprises a servo mechanism and an inertia measurement combination, and an index set of the electromechanical device is set as M.
2. The method for evaluating the storage integrity rate of a missile based on residual strength and life according to claim 1, characterized by the step two, for undetectable equipment i e P, using μ i,S (t) represents the residual intensity mean value, sigma, of the intensity S at the time t i,S Is the variance of intensity, obeys normal distribution N (mu) i,S ,σ 2 i,S ) The method comprises the steps of carrying out a first treatment on the surface of the Average value of load L is mu i,L Variance is sigma i,L Obeys normal distribution N (mu) i,L ,σ 2 i,L ) The turnover period of i is t i,0 The method comprises the steps of carrying out a first treatment on the surface of the After the missile passes the time t, i storage integrity rate A i The set of calculation equations of (t) is:
wherein, phi (·) is a standard normal distribution function;
for equipment with large dispersion of performance parameters, flight reliability after long-term storage is calculated by adopting lognormal distribution, and if the performance is X and X obeys the lognormal distribution, lnX or lgX obeys the normal distribution, and the calculation process is similar to the normal distribution.
3. The method for evaluating the storage integrity rate of a missile based on residual strength and life as claimed in claim 2, wherein in said step three, for an electronic device j E whose working life and storage life both obey an exponential distribution, the storage life obey the exponential distribution is set to have a storage life of T j,Z ，t j,0 Turnover period of j; the service life clothes are also distributed exponentially, and the expected value of the service life is T j,G ，t j,D (t) is the accumulated working time of the ground test and the use process before the moment t, t j,S To transmit the task time, t j,X Is equivalent flight mission time; after the missile passes the time t, the storage integrity rate A of the electronic equipment j j The set of calculation equations of (t) is:
wherein, l is the number of periodical tests passed by j before t, and t is the number of periodical tests passed by j before t j,S =0, take R j，s [t j，s |t j，D (t)]＝1；
For the electronic equipment j E with working life obeying the exponential distribution and storage life obeying the Weibull distribution, the storage life obeying the Weibull distribution is set to be T j,Z Shape parameter m j ，t j,0 Turnover period of j; working life obeys the exponential distribution, and the expected value of the working life is T j,G ，t j,D (t) is the accumulated working time of the ground test and the use process before the moment t, t j,S To transmit the task time, t j,X Is equivalent flight mission time; after the missile passes the time t, the storage integrity rate A of the electronic equipment j j The set of calculation equations of (t) is:
wherein, l is the number of periodical tests that k passes before t; Γ (·) is a Γ function, t for a device that does not operate during transmission j,S =0, take R j，S [t j，S |t j，D (t)]＝1。
4. A method for evaluating the storage integrity of a missile based on residual strength and life as claimed in claim 3 wherein in said step four, the electromechanical device k e M is set to have a storage life subject to Weibull distribution, and the shape parameter is M k,Z The storage period is T k,Z ，t k,0 For the turnover of k, the service life clothes are also distributed from Weibull, and the shape parameter is m k,G The expected value of the service life is T k,G ，t k,D (t) is the accumulated working time of the ground test and the use process before the moment t, t k,S To transmit the task time, t k,X For equivalent flight mission time, after missile passing time t is stored, k is stored in integrity rate A k The set of calculation equations of (t) is:
wherein, l is the number of periodical tests that k passes before t; Γ (·) is a Γ function, t for a device that does not operate during transmission k,S =0, take R k，S [t k，S |t k，D (t)]＝1。
5. The method for evaluating the storage integrity rate of a missile based on the residual strength and the service life according to claim 3 or 4, wherein in the fifth step, the storage integrity rate of the missile is obtained by comprehensively utilizing the storage integrity rate of equipment on the missile according to a reliability model of the missile, and when the missile is a serial system, the storage integrity rate is the product of the storage integrity rates of the equipment on the missile, and after the missile leaves a factory, the storage integrity rate is
Wherein A is i (t) is the storage integrity of the undetectable equipment, i ε P; a is that j (t) is the storage integrity of the electronic device, j E E; a is that k (t) is the storage integrity of the electromechanical device, k ε M;
missile during storage period T 0 The storage integrity rate is not less than:
A D ＝min{A D (T P )，A D (T 0 )}
wherein A is D (T F ) To correspond to the first refurbishment period T F Is a storage integrity rate of (2); a is that D (T 0 ) To correspond to the storage period T 0 Storage integrity at that time.
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