CN116312732A - Testing device and testing method - Google Patents

Abstract

The application provides a testing device and a testing method, wherein the testing device comprises an adapter card and a control module; the switching card is used for accessing the memory to be tested, and responding to the insertion of the memory to be tested into the switching card, the switching card outputs a pulse signal; the control module is detachably connected with the transfer card, determines the use parameters of the transfer card based on the pulse signals, and determines whether to replace the transfer card based on the use parameters. Specifically, the testing device can detect the use parameters of the transfer card, accurately manage the use of the transfer card, quantitatively evaluate the service life of the transfer card, and improve the service life management capability of the transfer card in the testing device.

Description

Testing device and testing method

Technical Field

The present disclosure relates to the field of semiconductor technologies, and in particular, to a testing apparatus and a testing method.

Background

At present, because frequent plugging is required during memory test, the frequent plugging damages a main board slot, which can cause the problem of contact of the main board slot, thereby causing the main board to be abnormal.

In order to solve the problem, an adapter card is invented, and the purpose is that: the number of plugging times of the mainboard slot is reduced through the adapter card; however, the problem is also accompanied by the frequent insertion and removal of the adapter card, which also damages the pins (Pin) of the adapter card. Currently, the use management of the riser card has defects, which cause the unqualified evaluation of the service life of the riser card.

Disclosure of Invention

The application provides a testing device and a testing method, wherein the testing device can detect the use parameters of a transfer card, accurately manage the use of the transfer card, quantitatively evaluate the service life of the transfer card, and improve the service life management capability of the transfer card in the testing device.

For solving the technical problem, the first technical scheme provided by the application is as follows: there is provided a test apparatus comprising: the transfer card is used for accessing the memory to be tested, and responding to the insertion of the memory to be tested into the transfer card, the transfer card outputs a pulse signal; the control module is detachably connected with the transfer card, determines the use parameters of the transfer card based on the pulse signals, and determines whether to replace the transfer card based on the use parameters.

Wherein, the transfer card includes: the slot is used for accessing the memory to be tested; the sensor group is connected with the slot and outputs the pulse signal when the memory to be tested is inserted into the slot.

Wherein, the sensor group includes: a first sensor and a second sensor; when the memory to be tested is inserted into the slot, the first sensor outputs a first pulse signal, and the second sensor outputs a second pulse signal; or when the memory to be tested is inserted into the slot, the first sensor outputs a first pulse signal or the second sensor outputs a second pulse signal; the control module determines the usage parameter based on the first pulse signal and/or the second pulse signal.

Wherein, the control module includes: the judging module is used for responding to the first pulse signal and the second pulse signal received by the judging module, determining the mode of inserting the memory to be tested into the slot based on the time difference of the first pulse signal and the second pulse signal, and outputting a first detection signal or a second detection signal based on the mode; and the controller is connected with the judging module, counts based on the first detection signal and the second detection signal, and determines the use parameters of the transfer card based on the counting result.

The judging module is used for outputting a first detection signal, wherein the time difference is determined to be not beyond a preset range in response to the judging module, the memory to be tested is determined to be inserted into the slot in a first mode, and the judging module is used for outputting a first detection signal; and in response to the judging module determining that the time difference exceeds the preset range, determining that the memory to be tested is inserted into the slot in a second mode, and outputting a second detection signal by the judging module; the controller includes: a first counter that counts based on the first detection signal, and a second counter that counts based on the second detection signal; the controller determines the usage parameter of the adapter card based on the counting result of the first counter and the counting result of the second counter.

Wherein the second detection signal is output in response to the judging module receiving only the first pulse signal or only the second pulse signal; the first detection signal represents that the memory to be tested is normally inserted into the slot, and the second detection signal represents that the memory to be tested is abnormally inserted into the slot.

Wherein, the testing arrangement still includes: and the reset module is used for resetting the technical results of the first counter and the second counter after the transfer card is replaced.

Wherein, the testing arrangement still includes: and the display module is connected with the control module and used for displaying the use parameters of the transfer card.

In order to solve the technical problems, a second technical scheme provided by the application is as follows: there is provided a test method comprising: responding to the insertion of the memory to be tested into the adapter card, and outputting a pulse signal by the adapter card; determining a use parameter of the adapter card based on the pulse signal; and determining whether to replace the transfer card based on the use parameter.

The step of determining the usage parameter of the transit card based on the pulse signal comprises the following steps: in response to receiving the first pulse signal and the second pulse signal, determining whether a time difference between the first pulse signal and the second pulse signal exceeds the preset range; if the time difference does not exceed the preset range, determining that the memory to be tested is inserted into the slot in a first mode, and outputting a first detection signal; if the time difference does not exceed the preset range, determining that the memory to be tested is inserted into the slot in a second mode, and outputting a second detection signal; outputting the second detection signal if only the first pulse signal or only the second pulse signal is received; a first counter counts based on the first detection signal, and a second counter counts based on the second detection signal; determining a use parameter of the adapter card based on the counting result of the first counter and the counting result of the second counter; the first detection signal represents that the memory to be tested is normally inserted into the slot, and the second detection signal represents that the memory to be tested is abnormally inserted into the slot.

The test device has the beneficial effects that, unlike the prior art, when the memory to be tested is inserted into the adapter card, the adapter card outputs a pulse signal; the control module is detachably connected with the transfer card, determines the use parameters of the transfer card based on the pulse signals, and determines whether to replace the transfer card based on the use parameters. Specifically, the testing device can detect the use parameters of the transfer card, accurately manage the use of the transfer card, quantitatively evaluate the service life of the transfer card, and improve the service life management capability of the transfer card in the testing device.

Drawings

For a clearer description of the technical solutions in the embodiments of the present application, the drawings that are needed in the description of the embodiments will be briefly introduced below, it being obvious that the drawings in the following description are only some embodiments of the present application, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art, wherein:

FIG. 1 is a schematic structural diagram of a first embodiment of a testing device provided in the present application;

FIG. 2 is a schematic structural diagram of a second embodiment of the testing device provided in the present application;

FIG. 3 is a control block diagram of a control module provided herein;

fig. 4 is a flow chart of an embodiment of the test method provided in the present application.

Detailed description of the preferred embodiments

The terms "first," "second," "third," and the like in this application are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first", "a second", and "a third" may explicitly or implicitly include at least one such feature. In the description of the present application, the meaning of "plurality" means at least two, for example, two, three, etc., unless specifically defined otherwise. All directional indications (such as up, down, left, right, front, back … …) in the embodiments of the present application are merely used to explain the relative positional relationship, movement, etc. between the components in a particular gesture (as shown in the drawings), and if the particular gesture changes, the directional indication changes accordingly. Furthermore, the terms "comprise" and "have," as well as any variations thereof, are intended to cover a non-exclusive inclusion. For example, a process, method, system, article, or apparatus that comprises a list of steps or elements is not limited to only those listed steps or elements but may include other steps or elements not listed or inherent to such process, method, article, or apparatus.

Reference herein to "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment may be included in at least one embodiment of the present application. The appearances of such phrases in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments. Those of skill in the art will explicitly and implicitly appreciate that the embodiments described herein may be combined with other embodiments.

The following description of the technical solutions in the embodiments of the present application will be made clearly and completely with reference to the accompanying drawings in the embodiments of the present application, and it is apparent that the described embodiments are only some embodiments of the present application, not all embodiments. All other embodiments, which can be made by one of ordinary skill in the art without undue burden from the present disclosure, are within the scope of the present disclosure.

Referring to fig. 1, fig. 1 is a schematic structural diagram of a first embodiment of a testing device provided in the present application, and specifically, the testing device includes: the adapter card 11 and the control module 12. The adapter card 11 is used for accessing the memory to be tested. In response to the memory to be tested being inserted into the adapter card 11, the adapter card 11 outputs a pulse signal. The control module 12 is detachably connected to the adapter card 11, determines the use parameters of the adapter card 11 based on the pulse signal, and determines whether to replace the adapter card 11 based on the use parameters.

Specifically, since the memory test needs to be frequently plugged and unplugged, the motherboard socket 111 is damaged by the frequent plugging and unplugging. In order to protect the motherboard slot 111, a switch card 11 is provided, and the switch card 11 is used to replace the motherboard slot to access the memory to be tested. When the memory to be tested is inserted into the adapter card 11, the adapter card 11 outputs a pulse signal, and the control module 12 can obtain the use parameters of the adapter card 11 based on the pulse signal. Specifically, the control module 12 may record the number of times the adapter card 11 is used once when receiving the pulse signal. Because the service life of the adapter card 11 is limited, for example, 1200 times, that is, after the adapter card 11 is plugged and unplugged for 1200 times, the reliability cannot be guaranteed, and the control module 12 can determine that the adapter card 11 can be replaced after recording the usage of the adapter card 11 for more than 1200 times, so that the usage management of the adapter card 11 can be realized, the service life of the adapter card 11 can be evaluated quantitatively, and the service life management capability of the adapter card 11 in the testing device can be improved.

In an embodiment, please refer to fig. 2 and fig. 3, fig. 2 is a schematic structural diagram of a second embodiment of the testing device provided in the present application; fig. 3 is a control block diagram of the control module provided in the present application. The adapter card 11 includes a slot 111 and a sensor group 112, wherein the sensor group 112 is connected to the slot 111, and the sensor group 112 outputs a pulse signal when the memory to be tested is inserted into the slot 111.

In one embodiment, the sensor group 112 includes: a first sensor 113 and a second sensor 114. When the memory to be tested is inserted into the slot 111, the first sensor 113 outputs a first pulse signal key_in_1, and the second sensor 114 outputs a second pulse signal key_in_2; or when the memory to be tested is inserted into the slot 111, the first sensor 113 outputs the first pulse signal key_in_1 or the second sensor 114 outputs the second pulse signal key_in_2. The control module 12 determines the usage parameter based on the first pulse signal key_in_1 and/or the second pulse signal key_in_2.

It should be noted that, when the memory to be tested is inserted into the adapter card 11, there are two cases, one is normal insertion, and the normal test can be performed on the memory to be tested by the normal insertion finger; the other is abnormal insertion, which means that the memory to be tested cannot be normally tested. Typical abnormal insertion is, for example, not fully inserting the memory to be tested into the slot 111, inserting the memory to be tested into the slot 111 in an oblique direction, or inserting the memory to be tested into the slot 111 in a reverse direction, and the like, and is not particularly limited. It can be understood that the memory to be tested is inserted into the slot 111 for a longer time than the memory to be tested is inserted into the slot 111 for normal insertion or cannot be completely inserted into the slot 111 and has a longer service life of the adapter card 11 than normal insertion, so that it is necessary to further determine whether the memory to be tested is normally inserted into the adapter card 11 or abnormally inserted into the adapter card 11. For example, when the adapter card 11 is plugged normally, the service life of the adapter card 11 is 1200 times, and when there is abnormal plugging, the service life of the adapter card 11 is less than 1200 times, such as 1000 times, 800 times, etc., which can be specifically set according to practical situations.

Further, the control module 12 determines whether the memory to be tested is normally inserted into the riser card 11 or abnormally inserted into the riser card 11 based on the first pulse signal key_in_1 and/or the second pulse signal key_in_2, and specifically, in this embodiment, the control module 12 includes: a judgment module 121 and a controller 122. The judging module 121 is configured to determine whether the memory to be tested is normally inserted into the adapter card 11 or abnormally inserted into the adapter card 11 based on the first pulse signal key_in_1 and/or the second pulse signal key_in_2; the controller 122 is used for determining the usage parameters of the riser card 11.

Specifically, in response to the determination module 121 receiving the first pulse signal key_in_1 and the second pulse signal key_in_2, a manner of inserting the memory to be tested into the slot 111 is determined based on a time difference between the first pulse signal key_in_1 and the second pulse signal key_in_2, and a first detection signal key_flag_1 and a second detection signal key_flag_2 are output based on the manner of inserting.

In one embodiment, in response to the determining module 121 determining that the time difference does not exceed the preset range, it is determined that the memory to be tested is inserted into the slot 111 in the first manner, and the determining module 121 outputs the first detection signal key_flag_1. Specifically, when the time difference between the first pulse signal key_in_1 and the second pulse signal key_in_2 does not exceed the preset range, it can be determined that the memory to be tested is normally inserted into the adapter card 11, and the judging module 121 outputs the first detection signal key_flag_1.

In response to the determining module 121 determining that the time difference exceeds the preset range, it is determined that the memory to be tested is inserted into the slot 111 in the second manner, and the determining module 121 outputs the second detection signal key_flag_2. That is, when the time difference between the first pulse signal key_in_1 and the second pulse signal key_in_2 exceeds the preset range, it is determined that the memory to be tested is abnormally inserted into the adapter card 11, and the judging module 121 outputs the second detection signal key_flag_2.

The controller 122 is connected to the judging module 121, counts based on the first detection signal key_flag_1 and the second detection signal key_flag_2, and determines the usage parameters of the transit card 11 based on the count result. Specifically, the controller 122 includes a first counter (not shown) that counts based on the first detection signal key_flag_1 and a second counter (not shown) that counts based on the second detection signal key_flag_2. The controller 122 further determines the usage parameter of the adapter card 11 based on the count result of the first counter and the count result of the second counter.

The first detection signal key_flag_1 represents that the memory to be tested is normally inserted into the slot 111, and the second detection signal key_flag_2 represents that the memory to be tested is abnormally inserted into the slot 111.

Specifically, the first counter is configured to calculate the number of times that the memory to be tested is normally inserted into the adapter card 11, and specifically, if it is determined that the memory to be tested is normally inserted into the adapter card 11 based on the first pulse signal key_in_1 and the second pulse signal key_in_2, the determining module 121 outputs the first detection signal key_flag_1, and the first counter is incremented based on the first detection signal key_flag_1. The second counter is configured to calculate the number of times the memory to be tested is abnormally inserted into the adapter card 11, specifically, if the memory to be tested is abnormally inserted into the adapter card 11 is determined based on the first pulse signal key_in_1 and the second pulse signal key_in_2, the judging module 121 outputs a second detection signal key_flag_2, and the second counter is incremented based on the second detection signal key_flag_2.

Further, in order to enable the user to intuitively know the usage parameters, the testing device further includes a display module 13, where the display module 13 is connected to the control module 12, and is configured to display the usage parameters of the adapter card 11. Specifically, by switching between different display modes, the display module 13 may display the count result of the first counter and the count result of the second counter, respectively.

Alternatively, the display module 13 may be a nixie tube, for example, a six-bit eight-pair nixie tube FJ3661BH. To optimize the pins, two displacement buffers 74HC595 may be used to control the nixie tube.

In one embodiment, the two shift registers 74HC595 may be coupled either together by a common positive or a common negative connection.

In an embodiment, when the memory to be tested is inserted into the adapter card 11 in an abnormal manner, there is a case that only the first sensor 113 outputs the first pulse signal key_in_1 or only the second sensor 114 outputs the second pulse signal key_in_2. In this case, the second detection signal key_flag_2 is output in response to the determination module 121 receiving only the first pulse signal key_in_1 or only the second pulse signal key_in_2.

It is understood that the controller 122 may determine the usage parameter, i.e. the number of times of usage, of the riser card 11 based on the sum of the calculation result of the first counter and the calculation result of the second counter. Alternatively, the controller 122 may determine the usage parameter of the transit card 11 based on the security coefficient and the sum of the calculation result of the first counter and the calculation result of the second counter. Wherein the safety factor is determined by experience of the engineer.

Specifically, the controller 122 further determines whether the change-over card 11 is required after determining the usage parameters. For example, the usage parameter is compared with a preset parameter of the riser card 11, and if the usage parameter exceeds the preset parameter, the lifetime of the riser card 11 is determined to be insufficient, and the riser card 11 can be replaced at this time to avoid influencing the test. It should be noted that the preset parameter may be a predetermined number of plugging times of the adapter card 11.

Further, after the change of the adapter card 11, the values of the first counter and the second counter need to be reset, so as to accurately count the changed adapter card 11. Therefore, the testing device further includes a reset module 14, and the reset module 14 is configured to output a reset signal sys_rst_n to zero the count results of the first counter and the second counter after the change of the adapter card 11.

In an embodiment, the control module 12 of the present application may select a single chip microcomputer, a programmable logic controller 122PLC, a data acquisition card, a field programmable gate array FPGA, or the like, which is not limited in particular.

In an embodiment of the present application, referring to fig. 3, after the control module 12 further includes an anti-shake unit 123 and a data conversion unit 124, when the to-be-detected memory is plugged into the adapter card 11, the first sensor 113 generates a first pulse signal key_in_1 and/or the second sensor 114 generates a second pulse signal key_in_2, the anti-shake unit 123 receives the first pulse signal key_in_1 and/or the second pulse signal key_in_2, generates a corresponding first filter signal key_in_1_f based on the first pulse signal key_in_1, and/or generates a corresponding second filter signal key_in_2_f based on the second pulse signal key_in_2, if the judgment module 121 receives the first filter signal key_in_1_f and the second filter signal key_in_2_f, calculates a time difference between the first filter signal key_in_1_f and the second filter signal key_in_2_f, if the time difference is within a preset range, and/or outputs a first normal count signal key_121 to the first detector module; if the time difference exceeds the preset range, the judging module 121 outputs a second detection signal key_flag_2 for abnormal plugging, and the second counter in the controller 122 is incremented by one. The controller 122 outputs control signals data [19:0], point [5 ] based on the count results of the first counter and the second counter: 0], sign, seg_en to data conversion unit 124, and data conversion unit 124 generates corresponding serial data based on the control signal, and converts the serial data into parallel data ds, oe, shcp, stcp to output to display module 13, so that display module 13 displays the count results of the first counter and the second counter.

It should be noted that, the data conversion unit 124 may generate corresponding serial data based on the control signal and directly output the serial data to the display module 13, so that the display module 13 displays the count results of the first counter and the second counter, and in this application, the data conversion unit 124 further converts the serial data into parallel data, so as to reduce the data output ports.

Wherein, data [19:0] characterizes the actual display data.

Point [5:0 characterizes the position of the decimal point.

sign characterizes the sign.

seg_en characterizes the enable signal.

ds characterizes the serial display data.

oe characterizes the output valid signal.

shcp characterizes the data clock signal.

stcp characterizes the memory latch clock signal.

In an embodiment, if the judging module 121 only receives the first filter signal key_in_1_f or the second filter signal key_in_2_f, the judging module 121 outputs the second detection signal key_flag_2 for abnormal plugging, and the second counter in the controller 122 is incremented by one.

Of course, in other embodiments, the anti-shake unit 123 may not be provided, and the determination module 121 may directly receive the first pulse signal key_in_1 and/or the second pulse signal key_in_2.

It should be noted that, in order to ensure the normal operation of the testing device, the testing device may be further connected to a crystal oscillator (not shown), which is used to provide the clock signal sys_clk to the sensor group 112, the controller 122, and the display module 13.

Specifically, after the change of the adapter card 11, the reset module 14 is required to input the reset signal sys_rst_n to zero the counting results of the first counter and the second counter. It can be understood that after the counting results of the first counter and the second counter are cleared, the counting result displayed by the display module 13 is also reset to the initial state.

In an embodiment, the display module 13 may also be a liquid crystal display, a display, or the like.

Specifically, the testing device provided by the application comprises the adapter card 11 and the control module 12 which are detachably connected, when the memory to be tested is inserted into the adapter card 11, the adapter card 11 outputs pulse signals, the control module 12 determines the use parameters of the adapter card based on the pulse signals, and whether to replace the adapter card 11 is determined based on the use parameters. Therefore, the test equipment can detect the use parameters of the adapter card 11 through the control module 12, accurately manage the use of the adapter card 11, quantitatively evaluate the service life of the adapter card 11, and improve the service life management capability of the adapter card 11 in the test device.

Referring to fig. 4, fig. 4 is a flow chart of an embodiment of a testing method provided in the present application, which specifically includes:

step S1: and responding to the insertion of the memory to be tested into the adapter card, and outputting a pulse signal by the adapter card.

Specifically, the adapter card comprises a slot and a sensor group, wherein the sensor group is connected with the slot, and when the memory to be tested is inserted into the slot, the sensor group outputs pulse signals.

In one embodiment, a sensor group includes: a first sensor and a second sensor. When the memory to be tested is inserted into the slot, the first sensor outputs a first pulse signal, and the second sensor outputs a second pulse signal; or when the memory to be tested is inserted into the slot, the first sensor outputs a first pulse signal or the second sensor outputs a second pulse signal.

Step S2: and determining the use parameters of the transfer card based on the pulse signals.

Specifically, the control module comprises a judging module and a controller. The judging module is used for determining whether the memory to be tested is normally inserted into the adapter card or abnormally inserted into the adapter card based on the first pulse signal and/or the second pulse signal; the controller is used for determining the use parameters of the adapter card.

Responding to the first pulse signal and the second pulse signal received by the judging module, and determining whether the time of the first pulse signal and the second pulse signal exceeds a preset range or not; if the time difference does not exceed the preset range, determining that the memory to be tested is inserted into the slot in a first mode, and outputting a first detection signal representing that the memory to be tested is normally inserted into the slot to the controller; if the time difference exceeds the preset range, determining that the memory to be tested is inserted into the slot in a second mode, and outputting a second detection signal representing that the memory to be tested is abnormally inserted into the slot to the controller; or only receiving the first pulse signal or only receiving the second pulse signal, and outputting a second detection signal to the controller; a first counter in the controller counts based on the first detection signal, and a second counter counts based on the second detection signal; the controller determines the usage parameter of the adapter card based on the counting result of the first counter and the counting result of the second counter.

Specifically, when the memory to be tested is inserted into the adapter card, two conditions exist, one is normal insertion, and the normal test can be carried out on the memory to be tested by the normal insertion finger; the other is abnormal insertion, which means that the memory to be tested cannot be normally tested. Typical abnormal insertion is, for example, not completely inserting the memory to be tested into the slot, inserting the memory to be tested into the slot obliquely or inserting the memory to be tested into the slot reversely, and the like, and the method is not particularly limited. It can be understood that the memory to be tested is inserted into the slot longer than the time of normal insertion or cannot be completely inserted into the slot, and has a longer service life than normal insertion, so that it is necessary to further determine whether the memory to be tested is normally inserted into the adapter card or abnormally inserted into the adapter card. For example, when the adapter card is plugged normally, the service life of the adapter card is twice, and when the adapter card is plugged abnormally, the service life of the adapter card is less than 1200 times, such as 1000 times, 800 times, and the like, and the adapter card can be specifically set according to practical situations.

Step S3: it is determined whether to replace the transit card based on the usage parameters.

It is understood that the controller may determine the usage parameter, i.e. the number of uses, of the transit card based on the sum of the calculation result of the first counter and the calculation result of the second counter. Alternatively, the controller may determine the usage parameter of the transit card based on the security coefficient and a sum of the calculation result of the first counter and the calculation result of the second counter. Wherein the safety factor is determined by experience of the engineer.

Specifically, after determining the usage parameters, the controller further determines whether the change-over card is required to be replaced. For example, the usage parameter is compared with a preset parameter of the adapter card, and if the usage parameter exceeds the preset parameter, the service life of the adapter card is determined to be insufficient, and the adapter card can be replaced at this time so as to avoid influencing the test. It should be noted that the preset parameter may be a predetermined number of plugging times of the adapter card.

The foregoing is only an implementation method of the present application, and is not limited to the patent scope of the present application, and all equivalent structures or equivalent processes using the contents of the specification and the drawings of the present application or direct or indirect application in other related technical fields are included in the patent protection scope of the present application.

Claims (10)

1. A test device, comprising:

the transfer card is used for accessing the memory to be tested, and responding to the insertion of the memory to be tested into the transfer card, the transfer card outputs a pulse signal;

the control module is detachably connected with the transfer card, determines the use parameters of the transfer card based on the pulse signals, and determines whether to replace the transfer card based on the use parameters.

2. The test device of claim 1, wherein the adapter card comprises:

the slot is used for accessing the memory to be tested;

the sensor group is connected with the slot and outputs the pulse signal when the memory to be tested is inserted into the slot.

3. The test device of claim 2, wherein the sensor set comprises: a first sensor and a second sensor;

when the memory to be tested is inserted into the slot, the first sensor outputs a first pulse signal, and the second sensor outputs a second pulse signal; or when the memory to be tested is inserted into the slot, the first sensor outputs a first pulse signal or the second sensor outputs a second pulse signal;

the control module determines the usage parameter based on the first pulse signal and/or the second pulse signal.

4. A test device according to claim 3, wherein the control module comprises:

the judging module is used for responding to the first pulse signal and the second pulse signal received by the judging module, determining the mode of inserting the memory to be tested into the slot based on the time difference of the first pulse signal and the second pulse signal, and outputting a first detection signal or a second detection signal based on the mode;

and the controller is connected with the judging module, counts based on the first detection signal and the second detection signal, and determines the use parameters of the transfer card based on the counting result.

5. The test device of claim 4, wherein the determination module outputs a first detection signal in response to the determination module determining that the time difference does not exceed a preset range, determining that the memory under test is inserted into the socket in a first manner; and

determining that the memory to be tested is inserted into the slot in a second mode in response to the determination module determining that the time difference exceeds the preset range, and outputting a second detection signal by the determination module;

the controller includes: a first counter that counts based on the first detection signal, and a second counter that counts based on the second detection signal; the controller determines the usage parameter of the adapter card based on the counting result of the first counter and the counting result of the second counter.

6. The test device of claim 4, wherein the second detection signal is output in response to the determination module receiving only the first pulse signal or only the second pulse signal;

the first detection signal represents that the memory to be tested is normally inserted into the slot, and the second detection signal represents that the memory to be tested is abnormally inserted into the slot.

7. The test device of claim 5, further comprising: and the reset module is used for resetting the technical results of the first counter and the second counter after the transfer card is replaced.

8. The test device of claim 1, wherein the test device further comprises: and the display module is connected with the control module and used for displaying the use parameters of the transfer card.

9. A method of testing, comprising:

responding to the insertion of the memory to be tested into the adapter card, and outputting a pulse signal by the adapter card;

determining a use parameter of the adapter card based on the pulse signal;

and determining whether to replace the transfer card based on the use parameter.

10. The method of testing according to claim 9, wherein the step of determining the usage parameters of the transit card based on the pulse signal comprises:

in response to receiving the first pulse signal and the second pulse signal, determining whether a time difference between the first pulse signal and the second pulse signal exceeds a preset range;

if the time difference does not exceed the preset range, determining that the memory to be tested is inserted into the slot in a first mode, and outputting a first detection signal;

if the time difference exceeds the preset range, determining that the memory to be tested is inserted into the slot in a second mode, and outputting a second detection signal; outputting the second detection signal if only the first pulse signal or only the second pulse signal is received;

a first counter counts based on the first detection signal, and a second counter counts based on the second detection signal;

determining a use parameter of the adapter card based on the counting result of the first counter and the counting result of the second counter;

the first detection signal represents that the memory to be tested is normally inserted into the slot, and the second detection signal represents that the memory to be tested is abnormally inserted into the slot.

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