CN116302738A - Method, system, equipment and storage medium for testing chip - Google Patents
Method, system, equipment and storage medium for testing chip Download PDFInfo
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Abstract
The invention provides a method, a system, equipment and a storage medium for testing chips, wherein the method comprises the following steps: responding to the power-on starting of the chip, acquiring a test script storage path, and running the test script to test the functions of each module; comparing the generated log information with the expected test case result to judge whether the log information accords with the test case result; in response to the running of the feasibility judgment of each module of the chip, counting the test results of the round; and placing the test result into a record file in a redirecting way, and respectively transmitting the record file to a test computer and a cloud. The invention improves the testing efficiency of each module of the SOC and can be effectively used for testing the stability of the chip.
Description
Technical Field
The present invention relates to the field of testing, and more particularly, to a method, system, device, and storage medium for testing a chip.
Background
The Shell language is an interface provided by the unix system for system and user space interactions, and can be used as a command in the system to implement operations intended for the system, such as installing software, deleting files, etc., or as a programming language to write programs. In order to enable the embedded system to run on the minimum linux system, a busy box tool is created. The busy box tool comprises more than 300 tools and commands commonly used by linux, an initrd root file System is compiled through the tools, and a minimum SOC (System on Chip) System capable of running is formed by matching with a dtb equipment tree file compiled by a linux kernel, a uImage image and a boot System start file uboot. Bin generated by uboot compiling. These provide room for shell operations to be performed on the SOC chip, for example, the minimal system will execute a boot script located under init.d. during the boot process, and perform initialization, where the boot script is written by the shell. Meanwhile, the test case can be executed in the system, the operation feasibility of the chip module is verified through log (log) information generated by the serial port, for example, a tool i2c-tool related instruction in a root file system is operated, and whether the writing function of the module i2c is feasible or not is verified by the i2cset according to log information printed by the serial port.
When verifying the feasibility of a single module, a tester and designer can manually input instructions according to the test cases of the module to verify the operation of the module through the generated log information. However, such a manual input method consumes a lot of time when verifying the operation feasibility and stability of the SOC multi-module. Therefore, a test system including an automatic operation script, a warning prompt function and a remote monitoring function is urgently needed to improve the efficiency of chip test and correct the module operation bug in time.
Disclosure of Invention
In view of this, an object of the embodiments of the present invention is to provide a method, a system, a computer device, and a computer readable storage medium for testing a chip, which implement a startup self-starting operation test script, automatically summarize error causes when errors are found, prompt modules to operate error information to testers and developers by a window prompt method, locate the error causes in time, and make targeted modification.
Based on the above objects, an aspect of the embodiments of the present invention provides a method for testing a chip, including the steps of: responding to the power-on starting of the chip, acquiring a test script storage path, and running the test script to test the functions of each module; comparing the generated log information with the expected test case result to judge whether the log information accords with the test case result; in response to the running of the feasibility judgment of each module of the chip, counting the test results of the round; and placing the test result into a record file in a redirecting way, and respectively transmitting the record file to a test computer and a cloud.
In some implementations, the acquiring the test script deposit path includes: copying the test script into the SD card through the card reader, modifying the starting script, adding the position for searching the test script and automatically executing the instruction of the test script.
In some embodiments, the running the test script to test the functionality of each module includes: executing a flash mounting instruction, and prompting whether the flash is successfully mounted according to the mounted log information.
In some embodiments, the comparing the generated log information with the test case expected results to determine whether the test case results are met comprises: and printing the typeface of the pass in response to the test case conforming result, printing the typeface of the failed in response to the test case not conforming result, and summarizing the reason of the failure of the operation of the printing module by searching the generated log information.
In some embodiments, the comparing the generated log information with the test case expected results to determine whether the test case results are met comprises: responding to the condition that the test computer receives module running warning or error in the window, popping up a window prompt of module running failure to the personal computer through a network, and printing out a reason of the running failure.
In some embodiments, the statistical test results of the present round include: and obtaining the times of failed, and judging whether the test is successful or not according to the times of failed.
In some embodiments, the transmitting the record file to the test computer and the cloud end respectively includes: and transmitting the test record file to a test computer in a tftp mode, and uploading the test record file to a public network disk through a network.
In another aspect of an embodiment of the present invention, there is provided a system for testing a chip, including: the acquisition module is configured to respond to the power-on starting of the chip, acquire a test script storage path and run the test script to test the functions of each module; the judging module is configured to compare the generated log information with the expected test case result to judge whether the generated log information accords with the test case result; the statistics module is configured for counting test results of the round in response to the running feasibility judgment of each module of the chip; and the transmission module is configured to put the test result into a record file in a redirection mode and transmit the record file to the test computer and the cloud end respectively.
In yet another aspect of the embodiment of the present invention, there is also provided a computer apparatus, including: at least one processor; and a memory storing computer instructions executable on the processor, which when executed by the processor, perform the steps of the method as above.
In yet another aspect of the embodiments of the present invention, there is also provided a computer-readable storage medium storing a computer program which, when executed by a processor, implements the method steps as described above.
The invention has the following beneficial technical effects: the method has the advantages that the startup self-starting operation test script is realized, the error reasons are automatically summarized when errors are found, the error information is prompted to testers and developers by a window prompting method, the error reasons are positioned in time and are modified in a targeted manner, in addition, the sd card, flash, test PC and cloud disk multi-path backup test report is realized, and the test records can be checked by using various methods.
Drawings
In order to more clearly illustrate the embodiments of the invention or the technical solutions in the prior art, the drawings that are necessary for the description of the embodiments or the prior art will be briefly described, it being obvious that the drawings in the following description are only some embodiments of the invention and that other embodiments may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic diagram of an embodiment of a method for testing a chip according to the present invention;
FIG. 2 is a schematic diagram of an embodiment of a system for testing chips according to the present invention;
FIG. 3 is a schematic diagram of a hardware structure of an embodiment of a computer device for testing chips according to the present invention;
fig. 4 is a schematic diagram of an embodiment of a computer storage medium of a test chip according to the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the following embodiments of the present invention will be described in further detail with reference to the accompanying drawings.
It should be noted that, in the embodiments of the present invention, all the expressions "first" and "second" are used to distinguish two entities with the same name but different entities or different parameters, and it is noted that the "first" and "second" are only used for convenience of expression, and should not be construed as limiting the embodiments of the present invention, and the following embodiments are not described one by one.
In a first aspect of the embodiments of the present invention, an embodiment of a method of testing a chip is presented. Fig. 1 is a schematic diagram of an embodiment of a method for testing a chip according to the present invention. As shown in fig. 1, the embodiment of the present invention includes the following steps:
s1, responding to the power-on starting of a chip, acquiring a test script storage path, and running the test script to test the functions of each module;
s2, comparing the generated log information with expected test case results to judge whether the generated log information accords with the test case results;
s3, responding to the feasibility judgment of each module of the chip after running, and counting the test result of the round; and
s4, placing the test result into a record file in a redirection mode, and transmitting the record file to a test computer and a cloud end respectively.
The embodiment of the invention takes the automatic test script as a core, and has the functions of remote monitoring, alarm reminding, result uploading and the like, so that the tester can know the overall operation condition of the chip, and can help the designer to quickly correct and modify the module with the operation error. The embodiment of the invention is also provided with a remote monitoring system which is similar to the connection of a remote desktop in practice, and the working principle is that a client and a server end are in communication connection with a standard local area network framework through a TCP/IP protocol, and information is input and transmitted to the server end through a terminal of the client and peripheral equipment comprising a mouse and a keyboard, and then display of the server end is transmitted back to the client. Compared with a common remote desktop, the remote monitoring system is further provided with a window prompt box, and the prompt box is used for reminding a designer of correcting the operation error information of the printing module when the operation error of the later module occurs. The TCP/IP transport protocol, the Transmission control/network protocol, is also known as the network communication protocol. It is the most basic communication protocol in use of the network. The TCP/IP protocol refers not only to two protocols, namely TCP and IP, but also to a protocol cluster composed of protocols such as FTP, SMTP, TCP, UDP, IP.
And responding to the power-on start of the chip, acquiring a test script storage path, and running the test script to test the functions of each module. After the chip is electrified and started, a testing system is opened at a personal PC (computer) end to remotely monitor the testing PC connected with a chip platform in a laboratory, and after the chip enters the system, a script storage path is automatically searched, a script is automatically operated, and the testing of each module is started.
In some implementations, the acquiring the test script deposit path includes: copying the test script into the SD card through the card reader, modifying the starting script, adding the position for searching the test script and automatically executing the instruction of the test script.
In some embodiments, the running the test script to test the functionality of each module includes: executing a flash mounting instruction, and prompting whether the flash is successfully mounted according to the mounted log information. The log information can display the flash mounting result, if the mounting is successful, the flash mounting is successful, if the mounting is failed, the flash mounting is carried out again, the mounting frequency is increased by one, and if the mounting frequency reaches a threshold value, alarm information can be generated.
In order to realize the function of self-starting of the chip, firstly, a test script is copied into an SD card through a card reader, after the first power-on, a starting script in a system is modified, the position of the through searching script is increased, the execution authority is given to the through searching script, and then the instruction of the script is automatically executed. After the reboot is input, the system can be restarted, and the test script is automatically operated so as to achieve the effect of automatic operation. After the script is operated, the instruction for mounting the flash is automatically executed, whether the flash is successfully mounted is prompted according to log information of the mounting, and preparation is made for storing the test record in the flash. When the monitoring system is opened, the modules can automatically operate related instructions according to the test cases of the modules.
And comparing the generated log information with the expected test case result to judge whether the log information accords with the test case result.
In some embodiments, the comparing the generated log information with the test case expected results to determine whether the test case results are met comprises: and printing the pass word in response to the test case result, printing the failed word in response to the test case result, and summarizing the reasons of the failure of the operation of the printing module by retrieving the generated log information. The log information generated by searching is compared with the expected result of the test case, if the result accords with the test case, a pass is displayed, if similar warning or error occurs in the search log in the test process, the failed is displayed, and the reason of the failure of the operation of the module is printed out.
In some embodiments, the comparing the generated log information with the test case expected results to determine whether the test case results are met comprises: responding to the condition that the test computer receives module running warning or error in the window, popping up a window prompt of module running failure to the personal computer through a network, and printing out a reason of the running failure. If similar warning or error occurs in the retrieval log in the test process, information of module running failure can be generated, the system can prompt that a word of module running failure exists at the personal PC end, and then, a designer can be reminded to check the cause of the error in time, and correction and modification are carried out on the module.
By comparing the log generated information with the expected correct results in the test case, if there is a match, the pass typeface is printed, otherwise, the failed condition is printed. And summarizing the reasons of the failure of the operation of the print-out module by retrieving the generated log information. In the test PC, when a module running warning or error condition is received in the window, a window prompt for the module running failure is popped up to the personal PC through the network, and the reason of the running failure is printed out. The mechanism is similar to the function of reminding the public number in time, when the test PC receives the operation error signal, a reminding window signal is automatically sent to the personal PC and synchronously printed into a window frame in the test system, so that a tester can know the situation in time, and meanwhile, a designer can know the bug in time and modify the bug. And responding to the feasibility judgment of each module of the chip after running, and counting the test results of the round. In some embodiments, the statistical test results of the present round include: and obtaining the times of failed, and judging whether the test is successful or not according to the times of failed.
After the feasibility of each module of the SOC is judged, the script counts the test results of the round, displays the running condition of each module, and judges whether the test of the round is passed or not by searching whether the frequency of failed is 0 or not. That is, after the script is run, the test results are summarized as a whole. The pass item number and the fail item number are counted through retrieving pass and failed items respectively, meanwhile, the failed times are judged, whether the test of the round is successful or not is judged through judging the failed times, and the test is recorded in a log file in the sd card/flash.
And putting the test result into a record file in a redirecting mode, and respectively transmitting the record file to a test computer and a cloud.
In some embodiments, the transmitting the record file to the test computer and the cloud end respectively includes: and transmitting the test record file to a test computer in a tftp mode, and uploading the test record file to a public network disk through a network.
The most basic function of a computer is to provide input and output operations. For Linux systems, a keyboard is usually used as a default input device, which is also called a standard input device; the display is taken as a default output device, which is also called a standard output device. The redirection is to input data which should be input from a standard input device (keyboard) by other files or devices, or to output content which should be output to a standard output device (display) by other files or devices.
The test results of the round also can be redirected, the statistical results are put into the record files in the sd card and the flash, the record files stored in the sd card or the flash are transmitted to the test PC for checking through tftp, and meanwhile, the record files can be uploaded to the shared cloud disk through a network, so that testers and designers can conveniently enter a website for downloading, and the situation is known. And finally, closing the main control, restarting the system to perform the next round of test through a reboot instruction. Tftp (Trivial File Transfer Protocol, simple file transfer protocol), a simple transfer protocol used between clients and servers in tcp/ip protocols, provides a file transfer service that is not costly and complex.
The embodiment of the invention firstly, the chip is self-started, a script is run, the basic condition of each module is automatically tested through the test case, whether the module is normal or not is judged, if the module is normal, the operation is normal, and a pass is printed; if the module is abnormal, the operation fails, the failed is printed, and meanwhile, the reason of the failure of the module is printed, and the system pops up a popup window to remind design and test personnel to check. And then printing the running condition of the module into the sd card or flash through redirection, and checking the running condition of the module through multiple ways. Counting the total number of tests, the total number of module tests passing and the total number of module test failures, adding information into a test record, transmitting a file into a test computer end through tftp network transmission, uploading the test record into a shared cloud disk through a network for a tester and a designer to download and check, executing a reboot (restart) instruction, and restarting the system.
The embodiment of the invention improves the testing efficiency of each module of the SOC (System on Chip) and can be effectively used for testing the stability of the Chip. The verification personnel and the designer can directly check the testing process of the SOC through a remote monitoring host, and download the testing report result through the cloud disk. The designer can also know the module operation error information in advance through the window prompt mechanism of the monitoring system, and timely locate and modify the module operation error reason.
It should be noted that, in the embodiments of the method for testing a chip, the steps may be intersected, replaced, added and subtracted, so that the method for testing a chip by using the reasonable permutation and combination should also belong to the protection scope of the present invention, and the protection scope of the present invention should not be limited to the embodiments.
Based on the above object, a second aspect of the embodiments of the present invention provides a system for testing a chip. As shown in fig. 2, the system 200 includes the following modules: the acquisition module is configured to respond to the power-on starting of the chip, acquire a test script storage path and run the test script to test the functions of each module; the judging module is configured to compare the generated log information with the expected test case result to judge whether the generated log information accords with the test case result; the statistics module is configured for counting test results of the round in response to the running feasibility judgment of each module of the chip; and the transmission module is configured to put the test result into a record file in a redirection mode and transmit the record file to the test computer and the cloud end respectively.
In some embodiments, the acquisition module is configured to: copying the test script into the SD card through the card reader, modifying the starting script, adding the position for searching the test script and automatically executing the instruction of the test script.
In some embodiments, the acquisition module is configured to: executing a flash mounting instruction, and prompting whether the flash is successfully mounted according to the mounted log information.
In some embodiments, the determination module is configured to: and printing the typeface of the pass in response to the test case conforming result, printing the typeface of the failed in response to the test case not conforming result, and summarizing the reason of the failure of the operation of the printing module by searching the generated log information.
In some embodiments, the determination module is configured to: responding to the condition that the test computer receives module running warning or error in the window, popping up a window prompt of module running failure to the personal computer through a network, and printing out a reason of the running failure.
In some embodiments, the statistics module is configured to: and obtaining the times of failed, and judging whether the test is successful or not according to the times of failed.
In some embodiments, the transmission module is configured to: and transmitting the test record file to a test computer in a tftp mode, and uploading the test record file to a public network disk through a network.
The embodiment of the invention realizes the startup self-starting operation of the test script, automatically summarizes the error reasons when errors are found, prompts the module to operate error information to testers and developers by a window prompt method, positions the error reasons in time and carries out targeted modification, in addition, realizes the sd card, flash, test PC and cloud disk multi-path backup test report, and can use various methods to check the test record.
In view of the above object, a third aspect of the embodiments of the present invention provides a computer device, including: at least one processor; and a memory storing computer instructions executable on the processor, the instructions being executable by the processor to perform the steps of: s1, responding to the power-on starting of a chip, acquiring a test script storage path, and running the test script to test the functions of each module; s2, comparing the generated log information with expected test case results to judge whether the generated log information accords with the test case results; s3, responding to the feasibility judgment of each module of the chip after running, and counting the test result of the round; s4, placing the test result into a record file in a redirection mode, and transmitting the record file to a test computer and a cloud end respectively.
In some implementations, the acquiring the test script deposit path includes: copying the test script into the SD card through the card reader, modifying the starting script, adding the position for searching the test script and automatically executing the instruction of the test script.
In some embodiments, the running the test script to test the functionality of each module includes: executing a flash mounting instruction, and prompting whether the flash is successfully mounted according to the mounted log information.
In some embodiments, the comparing the generated log information with the test case expected results to determine whether the test case results are met comprises: and printing the typeface of the pass in response to the test case conforming result, printing the typeface of the failed in response to the test case not conforming result, and summarizing the reason of the failure of the operation of the printing module by searching the generated log information.
In some embodiments, the comparing the generated log information with the test case expected results to determine whether the test case results are met comprises: responding to the condition that the test computer receives module running warning or error in the window, popping up a window prompt of module running failure to the personal computer through a network, and printing out a reason of the running failure.
In some embodiments, the statistical test results of the present round include: and obtaining the times of failed, and judging whether the test is successful or not according to the times of failed.
In some embodiments, the transmitting the record file to the test computer and the cloud end respectively includes: and transmitting the test record file to a test computer in a tftp mode, and uploading the test record file to a public network disk through a network.
The embodiment of the invention realizes the startup self-starting operation of the test script, automatically summarizes the error reasons when errors are found, prompts the module to operate error information to testers and developers by a window prompt method, positions the error reasons in time and carries out targeted modification, in addition, realizes the sd card, flash, test PC and cloud disk multi-path backup test report, and can use various methods to check the test record.
Fig. 3 is a schematic hardware structure of an embodiment of the computer device for testing a chip according to the present invention.
Taking the example of the device shown in fig. 3, a processor 301 and a memory 302 are included in the device.
The processor 301 and the memory 302 may be connected by a bus or otherwise, for example in fig. 3.
The memory 302 is used as a non-volatile computer readable storage medium for storing non-volatile software programs, non-volatile computer executable programs, and modules, such as program instructions/modules corresponding to the method for testing a chip in the embodiments of the present application. The processor 301 executes various functional applications of the server and data processing, i.e., a method of implementing a test chip, by running nonvolatile software programs, instructions, and modules stored in the memory 302.
Any one embodiment of a computer device that performs the method of testing a chip described above may achieve the same or similar effects as any of the method embodiments described above that correspond thereto.
The invention also provides a computer readable storage medium storing a computer program which when executed by a processor performs a method of testing a chip.
Fig. 4 is a schematic diagram of an embodiment of a computer storage medium of the test chip according to the present invention. Taking a computer storage medium as shown in fig. 4 as an example, the computer readable storage medium 401 stores a computer program 402 that when executed by a processor performs the above method.
Finally, it should be noted that, as will be understood by those skilled in the art, all or part of the processes in the methods of the embodiments described above may be implemented by a computer program to instruct related hardware, and the program of the method for testing a chip may be stored in a computer readable storage medium, and the program may include the processes of the embodiments of the methods described above when executed. The storage medium of the program may be a magnetic disk, an optical disk, a read-only memory (ROM), a random-access memory (RAM), or the like. The computer program embodiments described above may achieve the same or similar effects as any of the method embodiments described above.
The foregoing is an exemplary embodiment of the present disclosure, but it should be noted that various changes and modifications could be made herein without departing from the scope of the disclosure as defined by the appended claims. The functions, steps and/or actions of the method claims in accordance with the disclosed embodiments described herein need not be performed in any particular order. Furthermore, although elements of the disclosed embodiments may be described or claimed in the singular, the plural is contemplated unless limitation to the singular is explicitly stated.
It should be understood that as used herein, the singular forms "a", "an", and "the" are intended to include the plural forms as well, unless the context clearly supports the exception. It should also be understood that "and/or" as used herein is meant to include any and all possible combinations of one or more of the associated listed items.
The foregoing embodiment of the present invention has been disclosed with reference to the number of embodiments for the purpose of description only, and does not represent the advantages or disadvantages of the embodiments.
It will be understood by those skilled in the art that all or part of the steps for implementing the above embodiments may be implemented by hardware, or may be implemented by a program for instructing relevant hardware, and the program may be stored in a computer readable storage medium, where the storage medium may be a read-only memory, a magnetic disk or an optical disk, etc.
Those of ordinary skill in the art will appreciate that: the above discussion of any embodiment is merely exemplary and is not intended to imply that the scope of the disclosure of embodiments of the invention, including the claims, is limited to such examples; combinations of features of the above embodiments or in different embodiments are also possible within the idea of an embodiment of the invention, and many other variations of the different aspects of the embodiments of the invention as described above exist, which are not provided in detail for the sake of brevity. Therefore, any omission, modification, equivalent replacement, improvement, etc. of the embodiments should be included in the protection scope of the embodiments of the present invention.
Claims (10)
1. A method of testing a chip, comprising the steps of:
responding to the power-on starting of the chip, acquiring a test script storage path, and running the test script to test the functions of each module;
comparing the generated log information with the expected test case result to judge whether the log information accords with the test case result;
in response to the running of the feasibility judgment of each module of the chip, counting the test results of the round; and
and putting the test result into a record file in a redirecting mode, and respectively transmitting the record file to a test computer and a cloud.
2. The method of claim 1, wherein the obtaining a test script deposit path comprises:
copying the test script into the SD card through the card reader, modifying the starting script, adding the position for searching the test script and automatically executing the instruction of the test script.
3. The method of claim 1, wherein the running the test script to test the functionality of each module comprises:
executing a flash mounting instruction, and prompting whether the flash is successfully mounted according to the mounted log information.
4. The method of claim 1, wherein comparing the generated log information with the test case expected results to determine whether the test case results are met comprises:
and printing the typeface of the pass in response to the test case conforming result, printing the typeface of the failed in response to the test case not conforming result, and summarizing the reason of the failure of the operation of the printing module by searching the generated log information.
5. The method of claim 1, wherein comparing the generated log information with the test case expected results to determine whether the test case results are met comprises:
responding to the condition that the test computer receives module running warning or error in the window, popping up a window prompt of module running failure to the personal computer through a network, and printing out a reason of the running failure.
6. The method of claim 1, wherein the counting test results of the present round comprises:
and obtaining the times of failed, and judging whether the test is successful or not according to the times of failed.
7. The method of claim 1, wherein transmitting the log file to a test computer and a cloud, respectively, comprises:
and transmitting the test record file to a test computer in a tftp mode, and uploading the test record file to a public network disk through a network.
8. A system for testing a chip, comprising:
the acquisition module is configured to respond to the power-on starting of the chip, acquire a test script storage path and run the test script to test the functions of each module;
the judging module is configured to compare the generated log information with the expected test case result to judge whether the generated log information accords with the test case result;
the statistics module is configured for counting test results of the round in response to the running feasibility judgment of each module of the chip; and
and the transmission module is configured to put the test result into a record file in a redirecting way and transmit the record file to the test computer and the cloud end respectively.
9. A computer device, comprising:
at least one processor; and
a memory storing computer instructions executable on the processor, which when executed by the processor, perform the steps of the method of any one of claims 1-7.
10. A computer readable storage medium storing a computer program, characterized in that the computer program when executed by a processor implements the steps of the method of any one of claims 1-7.
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| CN117608947A (en) * | 2024-01-24 | 2024-02-27 | 合肥康芯威存储技术有限公司 | Fault testing system and method for memory |
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| CN117608947A (en) * | 2024-01-24 | 2024-02-27 | 合肥康芯威存储技术有限公司 | Fault testing system and method for memory |
| CN117608947B (en) * | 2024-01-24 | 2024-04-23 | 合肥康芯威存储技术有限公司 | Fault testing system and method for memory |
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