CN116295864A - Infrared detection multi-step integrating circuit - Google Patents

Infrared detection multi-step integrating circuit Download PDF

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CN116295864A
CN116295864A CN202310066632.7A CN202310066632A CN116295864A CN 116295864 A CN116295864 A CN 116295864A CN 202310066632 A CN202310066632 A CN 202310066632A CN 116295864 A CN116295864 A CN 116295864A
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integrating
integration
voltage
signal
int
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周同
吴奇龙
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Nanjing University of Science and Technology
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Nanjing University of Science and Technology
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/48Thermography; Techniques using wholly visual means
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • G01J5/34Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using capacitors, e.g. pyroelectric capacitors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • G01J5/34Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using capacitors, e.g. pyroelectric capacitors
    • G01J5/35Electrical features thereof
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02BCLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO BUILDINGS, e.g. HOUSING, HOUSE APPLIANCES OR RELATED END-USER APPLICATIONS
    • Y02B70/00Technologies for an efficient end-user side electric power management and consumption
    • Y02B70/10Technologies improving the efficiency by using switched-mode power supplies [SMPS], i.e. efficient power electronics conversion e.g. power factor correction or reduction of losses in power supplies or efficient standby modes

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Abstract

The invention provides an infrared detection multi-step integrating circuit which comprises an integrator and a multi-step integrating control module, wherein the integrator is formed by an analog circuit, the multi-step integrating control module is formed by a digital circuit, and the integrator and the multi-step integrating control module are connected through 4 signal paths and are respectively used for logic control, time sequence control, pre-integrating voltage and sensor signal integrating voltage transmission. The invention can realize the dynamic adjustment of the signal grabbing capacity of the infrared detector under a high dynamic scene, and thereby improves the quality of the infrared thermal image.

Description

Infrared detection multi-step integrating circuit
Technical Field
The invention relates to the field of infrared detection, in particular to an infrared detection multi-step integrating circuit for an infrared thermal imaging signal reading circuit.
Background
Infrared thermal imaging is a passive-based optoelectronic imaging technique that uses differences in thermal radiation of portions of a target to obtain details of the image, converting infrared radiation signals into a visual thermal image. The infrared thermal imager is composed of a non-refrigeration optical system, a photosensitive element, an optical window and the like, wherein the optical system is used for transmitting received infrared heat to a photodiode in an electronic circuit, so that the received infrared heat is changed into current, a certain voltage pulse is generated, the current is conditioned by a signal and then enters an integrating circuit, and finally the current is converted into an electric signal corresponding to temperature. The parameters of the integrating circuit determine the infrared thermal imaging effect, and under the high dynamic scene, the integration time is greatly limited, so that the adoption of a constant-value integrating capacitor can cause the problem of insufficient or over-strong capturing capacity of the radiation signal of the high dynamic scene, and the distortion of the thermal image is caused.
At present, the control mode of the infrared signal reading circuit integrator mainly comprises two modes of integration time control and integration capacitance control, the former mode is widely adopted, but the infrared signal reading circuit integrator is not suitable for a high-dynamic scene, and the latter mode has the defects of time consumption, high cost, high adjustment difficulty and the like, so that the infrared detection still has performance bottleneck under the high-dynamic scene.
Disclosure of Invention
The invention aims to provide an infrared detection multi-step integrating circuit, so as to solve the problem of insufficient or over-strong capturing capability of a high-dynamic scene radiation signal.
The technical solution for realizing the purpose of the invention is as follows: an infrared detection multi-step integrating circuit comprises an integrator and a multi-step integrating control module, wherein the integrator is formed by an analog circuit, the multi-step integrating control module is formed by a digital circuit, and the integrator and the multi-step integrating control module are connected through 4 signal paths and are respectively used for logic control, time sequence control and pre-integrating voltage V int Sensor signal integrated voltage V out Is transmitted by the base station;
the integrator performs pre-integration on the input sensor current signal under the driving of the output time sequence control signal of the multi-step integration control module to obtain pre-integration voltage V int Synchronously transmitting to a multi-step integral control module; the multi-step integral control module is used for controlling the voltage V according to pre-integral int Generating a logic control signal, and realizing the self-adaptive adjustment of an integrating capacitor by controlling an analog switch in the integrator; after the integration capacitor configuration is completed, the integrator formally integrates the sensor current signal and obtains an integrated voltage V out The digital signals are converted into digital signals through the sampling holder and the ADC module and stored in the output register.
Further, the integrator is composed of an operational amplifier A 1 Integrating capacitorC 1 Integrating capacitor C 2 Pre-integration capacitor C int And analog switch S 0 ~S 5 The analog switches are all realized by MOS tubes, and the capacitor C is pre-integrated int With analogue switch S 5 Series connected cross-over to operational amplifier A 1 Wherein the switch S is an analog switch 5 Is a single pole double throw switch, the contact 1 and the contact 2 of which are respectively connected with an operational amplifier A 1 The inverting input terminal and the output terminal of (a), the pre-integration capacitor C int Respectively connected with an operational amplifier A 1 A reverse input terminal of the analog switch S5 and a remote electric shock side of the analog switch S5; integrating capacitor C 1 Analog switch S 2 Integrating capacitor C 2 Series connected cross-over to operational amplifier A 1 Wherein the switch S is an analog switch 2 The contact 1 is connected with V for a double-pole double-throw switch com Contact 3 is connected with analog switch S 3 Integrating capacitor C 1 Respectively connected with an operational amplifier A 1 Is an inverting input terminal of (a) and analog switch S 2 2 knife of (2), integrating capacitor C 2 Respectively connected with an operational amplifier A 1 Output of (d) and analog switch S 2 Contact 2 of (2); s is S 0 Is a single pole single throw switch, two ends of which are respectively connected with an operational amplifier A 1 An output terminal and an inverting input terminal; analog switch S 1 Is a single pole single throw switch, the two ends of which are respectively connected to an operational amplifier A 1 Is an inverting input terminal of (a) and analog switch S 2 1 knife of (2); analog switch S 3 Is a single-pole single-throw switch, and two ends of the single-pole single-throw switch are respectively connected with an analog switch S 2 Contact 3 of (2) and operational amplifier a 1 An output terminal of (a); analog switch S 4 Is a single-pole single-throw switch connected in series with an analog switch S 3 Contact of (d) and analog switch S 5 Is arranged between the contacts 2;
the input signal of the integrator comprises: logic control signals, timing control signals, and sensor current signals, the output signals comprising: pre-integral voltage V int And integral voltage V out The principle of the integrator is as follows: from an integrating capacitor C 1 、C 2 The multi-stage adjustable integrating capacitor is connected across the output end and the inverting input end of the operational amplifier to form an integrating circuit, and the modeThe quasi-switch is used for controlling the adjustment of the integral capacitance value, the zero clearing of the integral capacitance and the execution of the circuit timing control signal.
Further, the multi-step integration control module comprises seven parts, namely a comparator, an encoder, a combination logic circuit, a sampling retainer, an ADC, a register and a multi-step integration time sequence controller, wherein the multi-step integration time sequence controller is connected with the combination logic circuit, the encoder, the comparator and the sampling retainer through output signal lines; the sampling holder is connected with the ADC through an output signal line; the ADC is connected with the register through an output signal line; the comparator is connected with the encoder through an output signal line; the encoder is connected with the combinational logic circuit through an output signal line;
the input signals of the multi-step integral control module include: pre-integral voltage V int And integral voltage V out The output signal includes: logic control signals and time sequence control signals, wherein the principle of the multi-step integral control module is as follows: under the driving control of the multi-step integration time sequence controller, the comparator pre-integrates the voltage V int Comparing the signal with a set threshold voltage, temporarily storing the result, and comparing the pre-integrated voltage V int After the grading comparison of the (2) is completed, the comparison result is subjected to control word coding through an encoder, the obtained control word is input into a combinational logic circuit, a logic control signal is obtained through mapping and is output, under the action of the logic control signal and a time sequence control signal, the integrator completes the self-adaptive adjustment of an integration capacitor, then the sensor current signal is subjected to formal integration, and after the fixed integration time is reached, the sampling holder carries out the integration voltage V out And (3) sampling and holding, wherein the ADC converts the integral voltage locked in the sampling holder into a digital signal and stores the digital signal into a register.
Further, in the pre-integration stage, the pre-integration capacitor C int Across to operational amplifier A 1 Both ends are disconnected with the integrating capacitor C 1 、C 2 And hold C 1 、C 2 Zero clearing the voltages at two ends, and setting a sensor current signal in a pre-integration capacitor C int Integral voltage V on out Comparator input into multi-step integral control module in real time, and pass ratio in pre-integral processThe comparator integrates the voltage V out 3 comparisons with the threshold voltage are made, each time the comparator outputs a binary bit, the integral voltage is represented by 0 when it is less than the threshold voltage, and thus the result of the voltage comparison: "000", "001", "011", "111", the result is mapped into a control word by an encoder, the control word represents the above 4 output results by two-bit binary system, and sequentially represents "00", "01", "10", "11", and the combinational logic circuit maps logic control signals according to the control word, and further controls the analog switch to realize the integration capacitor C by the logic control signals 1 And an integrating capacitor C 2 The specific process of adjusting the integrating capacitance by the control word is as follows: the specific process of adjusting the integrating capacitor by the control word is as follows: when the control word is "00", the combinational logic circuit controls the integrating capacitor C 1 、C 2 Serial connection; when the control word is "01", the combinational logic circuit controls to access only the integrating capacitor C 1 The method comprises the steps of carrying out a first treatment on the surface of the When the control word is 10, the combinational logic circuit controls to only access the integrating capacitor C 2 The method comprises the steps of carrying out a first treatment on the surface of the When the control word is 11, the combinational logic circuit controls the integrating capacitor C 1 、C 2 Parallel connection;
the pre-integration stage is finished, and the pre-integration capacitor C is disconnected and cleared int An integrating capacitor C is connected 1 、C 2 To integrate the sensor current signal, to convert the high quality infrared image voltage signal obtained by the integrator into a digital signal through the sample holder and ADC, and to store it in a register for output.
Further, an integral capacitor C is provided 1 、C 2 0.1uf and 0.2uf, respectively, 4 different integration capacitance values are obtained: series C 1 And C 2 Connect only C 1 Connect only C 2 Parallel C 1 And C 2 Pre-integration capacitor C int Between two smaller integrating capacitance values, i.e. 0.067uf < C int <0.1uf。
The control method of the infrared signal reading circuit integrator is realized based on the infrared detection multi-step integrating circuit.
Compared with the prior art, the invention has the remarkable advantages that: the method can realize dynamic adjustment of the signal grabbing capacity of the infrared detector in a high dynamic scene, and improve the quality of infrared thermal images.
Drawings
FIG. 1 is a block diagram of an infrared detection multi-step integrating circuit of the present invention.
FIG. 2 is a diagram of a combinational logic circuit decoding control word according to the present invention.
FIG. 3 is a timing diagram illustrating the operation of the infrared detection multi-step integrating circuit of the present invention.
Fig. 4 is a schematic diagram of the working principle of the infrared detection multi-step integrating circuit of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the present application will be further described in detail with reference to the accompanying drawings and examples. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the present application.
The structure of the infrared detection multi-step integrating circuit comprises an integrator and a multi-step integrating control module, as shown in figure 1, wherein the integrator is connected with the multi-step integrating module through 4 signal paths and is respectively used for logic control, time sequence control and pre-integration voltage V int Sensor signal integrated voltage V out The input of the infrared detection multi-step integrating circuit is a sensor current signal applied with compensation, the output is a digital signal representing infrared thermal image voltage, and the specific process of input mapping output is as follows: firstly, under the drive of the output time sequence control signal of the multi-step integration control module, an integrator performs pre-integration on an input sensor current signal to obtain a pre-integrated voltage V int Synchronously transmitting to a multi-step integral control module, and then, the multi-step integral control module is used for controlling the voltage V according to the pre-integral voltage int Generating a logic control signal, wherein the logic control signal realizes the self-adaptive adjustment of an integral capacitor by controlling an analog switch in the integrator, and finally, after the integral capacitor of the integrator is configured, the integrator performs formal integration on a sensor current signal and obtains an integral voltage V out By passing throughThe sample holder and the ADC module are converted into digital signals in a register for output.
The integrator is composed of an operational amplifier A 1 Integrating capacitor C 1 And C 2 Pre-integration capacitor C int And analog switch S 0 ~S 5 The structure of the circuit is shown in figure 1. C (C) int And S is equal to 5 Series back cross-over to A 1 An output terminal and an inverting input terminal (C int Respectively connect A 1 And the far shock side of S5); c (C) 1 、S 2 、C 2 Series back cross-over to A 1 An output terminal and an inverting input terminal (C 1 Respectively connect A 1 Is the inverting input terminal of S 2 2 knife, C 2 Respectively connect A 1 Output terminal of (2) and S 2 Contact 2) of (a); s is S 0 Is a single pole single throw switch, two ends of which are respectively connected with A 1 An output terminal and an inverting input terminal; s is S 1 Is a single pole single throw switch, two ends of which are respectively connected to A 1 Is the inverting input terminal of S 2 1 knife of (2); s is S 2 Is a double pole double throw switch (opening 1 pole contact point 1,2 pole contact point 2; closing 1 pole contact point 2,2 pole contact point 3), the contact point 1 is connected with V com Contact 3 is connected with S 3 ;S 3 Is a single pole single throw switch, two ends of which are respectively connected with S 2 Contacts 3 and a of (2) 1 An output terminal of (a); s is S 4 Is a single pole single throw switch connected in series with S 3 Contact and S of (2) 5 Is arranged between the contacts of the first and second circuit board; s is S 5 In the single pole double throw switch (contact point 1 when open, contact point 2 when closed), contact points 1 and 2 are respectively connected with A 1 Is provided, and an inverting input and an output of the same.
The analog switch is defined as "off state" when in the state shown in fig. 1, i.e. the switching signal is at logic low level, where S 0 From phi rst (zero clearing time sequence control signal for integral capacitor) control, S 2 From the following components
Figure BDA0004062455960000041
(series-parallel switching logic control signal s) w Non +.>
Figure BDA0004062455960000042
) Control, S 4 And S is equal to 5 Respectively by->
Figure BDA0004062455960000051
And phi is int (Pre-integration Enable timing control Signal) control, S 1 And S is equal to 3 Respectively controlled directly by logic control signals of the same name. Pre-integration capacitor C int With analogue switch S 5 Series connected jumper to operational amplifier A 1 Reverse input and output of (1), when S 5 C when disconnected int Is shorted (cleared), when S 5 C when closed int Pre-integrating the signal; when S is 2 When off, the integrating capacitor C 1 、C 2 Series connected and then connected with switch S 4 In series, then the whole is connected across to the operational amplifier A 1 The switch S is then switched between the inverting input and the inverting output 1 And S is equal to 3 Failure, its actual state does not affect the overall circuit function, when S 2 When closed, the integrating capacitor C 1 、C 2 Respectively with switch S 3 、S 1 Series connected and then connected with switch S 4 In series, then the whole is connected across to the operational amplifier A 1 The switch S is then switched between the inverting input and the inverting output 1 And S is equal to 3 The opening or closing of the corresponding capacitor is controlled to be opened or connected; switch S 0 And capacitor C 1 、C 2 Is connected in parallel with the combined structure of the switch S 4 In series when S 0 Capacitor C when closed 1 、C 2 Is cleared.
The input signal of the integrator comprises: logic control signals, timing control signals, and sensor current signals, the output signals comprising: pre-integral voltage V int And integral voltage V out . The principle of the integrator is as follows: from C int The pre-integral circuit is connected across the reverse input end and the output end and is used for pre-scoring the sensor current signal; from C 1 、C 2 The formed adjustable integrating capacitor structure is connected with the operational amplifier A in a crossing way 1 An integrating circuit is formed by the inverting input end and the output end of the capacitor for integrating the sensor currentIntegrating the signals; the integrator performs pre-integration, capacitance zero clearing and integral capacitance value adjustment under the control of logic control signals and time sequence control signals output by the multi-step integration control module.
The multi-step integration control module comprises seven parts including a comparator, an encoder, a combination logic circuit, a sampling holder, an ADC, a register and a multi-step integration time sequence controller, and the specific circuit structure of the multi-step integration control module is shown in figure 1. The integration time sequence controllers are connected with the combinational logic circuit, the encoder, the comparator and the sampling retainer through output signal lines; the sampling holder is connected with the ADC through an output signal line; the ADC is connected with the register through an output signal line; the comparator is connected with the encoder through an output signal line; the encoder is connected with the combinational logic circuit through an output signal line.
The function of the comparator is to pre-integrate the voltage V int And threshold V TH Comparing when V int Greater than V TH Output 1, otherwise output 0 (V TH Can be set to 90% of the maximum integrated voltage); the function of the encoder is to map "000", "001", "011", "111" to control words "00", "01", "10", "11", respectively; the function of the combinational logic circuit is to map control words into logic control signals (S 1 、S 3 、S w ) The control word decoding is schematically shown in FIG. 2, C in FIG. 2 H 、C L Respectively the high and low positions of the control word; the combinational logic circuit maps logic control signals according to the control words, and further controls the analog switch to realize the integration capacitor C through the logic control signals 1 、C 2 The specific process of adjusting the integrating capacitance by the control word is as follows: when the control word is "00", the combinational logic circuit outputs a control signal S w =0、S 1 =0、S 3 =0, at this time, integrating capacitance C 1 、C 2 For combination 1: series C 1 、C 2 (the combined capacitance value is minimal); when the control word is "01", the combinational logic circuit outputs a control signal S w =1、S 1 =0、S 3 =1, at this time, integrating capacitance C 1 、C 2 For combination 2: access only C 1 (the combined capacitance value is small); when the control word is "10", the combinational logic circuit outputs a control signal S w =1、S 1 =1、S 3 =0, at this time, integrating capacitance C 1 、C 2 For combination 3: access only C 2 (the combined capacitance value is large); when the control word is "11", the combinational logic circuit outputs a control signal S w =1、S 1 =1、S 3 =1, at this time, integrating capacitance C 1 、C 2 For combination 4: parallel C 1 、C 2 (the combined capacitance value is maximum).
The function of the sample-and-hold is to integrate the voltage V out Sampling and holding are carried out so as to be taken by the ADC; the ADC is used for performing analog-to-digital conversion on the voltage value locked by the sampling retainer; the register has the function of latching the digital-to-analog conversion result for output; the multi-step integration time sequence controller has the function of providing time sequence control signals for the infrared detection multi-step integration circuit, wherein the time sequence control signals comprise phi rst 、Φ int And phi is smp (sampling/comparing timing control signals) and CLK (clock signals), the timing signals generated by the multi-step integration timing controller, that is, the timing of the infrared detection multi-step integration circuit are as shown in fig. 3.
The input signals of the multi-step integral control module include: pre-integral voltage V int And integral voltage V out The output signal includes: logic control signals and timing control signals. The principle of the multi-step integral control module is as follows: under the driving control of the multi-step integration time sequence controller, the comparator pre-integrates the voltage V int And threshold voltage V TH Comparing and temporarily storing the result, and applying the result to the pre-integrated voltage V int After the grading comparison of the (2) is completed, the comparison result is subjected to control word coding through an encoder, the obtained control word is input into a combinational logic circuit, the obtained control word is mapped to obtain an output logic control signal, under the action of the logic control signal and a time sequence control signal, the integrator completes the self-adaptive adjustment of an integrating capacitor, then the sensor current signal is subjected to formal integration, and after the fixed integration time is reached, the sampling holder carries out the integration voltage V out Sample and hold, ADC will takeThe integrated voltage locked in the sample holder is converted into a digital signal and stored in a register.
The principle of the infrared detection multi-step integrating circuit is shown in fig. 4, and fig. 4a to 4d respectively illustrate 4 kinds of integrating capacitance adjustment schemes of multi-step integration, so that the functions of the infrared detection multi-step integrating circuit can be summarized as follows: and realizing self-adaptive adjustment of an integrating capacitor according to a pre-integration result of the sensor current signal so as to enhance the grabbing quality of the infrared thermal radiation signal of the infrared detector in a high dynamic scene (namely under the condition of limited integration time).
Assume that the integrating capacitor C of the present embodiment 1 、C 2 0.1uf and 0.2uf, respectively, 4 different integration capacitance values can be obtained: series C 1 And C 2 (0.067 uf), C only 1 (0.1 uf), C alone 2 (0.2 uf), parallel C 1 And C 2 (0.3 uf), pre-integration capacitor C int Typically between the smaller two integrating capacitance values, i.e. 0.067uf < C int < 0.1uf. As shown in fig. 3, Φ int When the rising edge comes, the pre-integration stage is entered, and only the capacitor C int Is connected across to the operational amplifier A 1 At both ends, and pre-integrate the sensor current signal whenever phi smp When the rising edge of (a) arrives, the comparator generates a one-bit result, the pre-integration process generates a three-bit comparison result (the comparison result is shifted left and expanded), and the sum phi is int When the falling edge of (1) comes, the pre-integration is finished, and the capacitor C is disconnected and cleared int Capacitance C 1 、C 2 In the process of simulating the switch delay in fig. 3, the encoder encodes the voltage comparison result into a control word, the logic circuit maps the control word into a logic control signal, the integrator completes the adjustment of the integrating capacitance value according to the logic control signal, and the integrator adjusts the integrating capacitance value according to phi rst When the falling edge of (C) comes, capacitance C 1 、C 2 Is composed of a combined structure and an operational amplifier A 1 The integration circuit is configured to begin integrating the sensor current signal when Φ smp On arrival of the falling edge of (2), the sample-and-hold pair integrates the voltage V out Sample and hold, ADC analog-to-digital convert the voltage and send it into registerDevice, when phi rst When the rising edge of (C) arrives, capacitor C 1 、C 2 The infrared detection multi-step integrating circuit is cleared, and the grabbing of the infrared heat radiation signals based on the infrared detection multi-step integrating circuit is completed once.
It should be understood that, in order to more clearly illustrate the implementation method of the present invention, the sampling integration capacitor C of this embodiment 1 、C 2 In practical application, the integration capacitance can be increased to richer adjustable capacitance value according to the situation, in this case, the invention can still realize the dynamic adjustment of the signal grabbing capability of the infrared detector in a high dynamic scene, and the quality of the infrared thermal image can be improved.
The technical features of the above embodiments may be arbitrarily combined, and all possible combinations of the technical features in the above embodiments are not described for brevity of description, however, as long as there is no contradiction between the combinations of the technical features, they should be considered as the scope of the description.
The above examples only represent a few embodiments of the present application, which are described in more detail and are not to be construed as limiting the scope of the present application. It should be noted that it would be apparent to those skilled in the art that various modifications and improvements could be made without departing from the spirit of the present application, which would be within the scope of the present application. Accordingly, the scope of protection of the present application shall be subject to the appended claims.

Claims (6)

1. The infrared detection multi-step integrating circuit is characterized by comprising an integrator and a multi-step integrating control module, wherein the integrator is formed by an analog circuit, the multi-step integrating control module is formed by a digital circuit, and the integrator and the multi-step integrating control module are connected through 4 signal paths and are respectively used for logic control, time sequence control and pre-integrating voltage V int Sensor signal integrated voltage V out Is transmitted by the base station;
the integrator outputs a time sequence control signal to the input sensor under the driving of the multi-step integration control moduleThe current signal is pre-integrated to obtain pre-integrated voltage V int Synchronously transmitting to a multi-step integral control module; the multi-step integral control module is used for controlling the voltage V according to pre-integral int Generating a logic control signal, and realizing the self-adaptive adjustment of an integrating capacitor by controlling an analog switch in the integrator; after the integration capacitor configuration is completed, the integrator formally integrates the sensor current signal and obtains an integrated voltage V out The digital signals are converted into digital signals through the sampling holder and the ADC module and stored in the output register.
2. The infrared detection multi-step integrating circuit according to claim 1, wherein said integrator is composed of an operational amplifier a 1 Integrating capacitor C 1 Integrating capacitor C 2 Pre-integration capacitor C int And analog switch S 0 ~S 5 The analog switches are all realized by MOS tubes, and the capacitor C is pre-integrated int With analogue switch S 5 Series connected cross-over to operational amplifier A 1 Wherein the switch S is an analog switch 5 Is a single pole double throw switch, the contact 1 and the contact 2 of which are respectively connected with an operational amplifier A 1 The inverting input terminal and the output terminal of (a), the pre-integration capacitor C int Respectively connected with an operational amplifier A 1 A reverse input terminal of the analog switch S5 and a remote electric shock side of the analog switch S5; integrating capacitor C 1 Analog switch S 2 Integrating capacitor C 2 Series connected cross-over to operational amplifier A 1 Wherein the switch S is an analog switch 2 The contact 1 is connected with V for a double-pole double-throw switch com Contact 3 is connected with analog switch S 3 Integrating capacitor C 1 Respectively connected with an operational amplifier A 1 Is an inverting input terminal of (a) and analog switch S 2 2 knife of (2), integrating capacitor C 2 Respectively connected with an operational amplifier A 1 Output of (d) and analog switch S 2 Contact 2 of (2); s is S 0 Is a single pole single throw switch, two ends of which are respectively connected with an operational amplifier A 1 An output terminal and an inverting input terminal; analog switch S 1 Is a single pole single throw switch, the two ends of which are respectively connected to an operational amplifier A 1 Is an inverting input terminal of (a) and analog switch S 2 1 knife of (2); analog switch S 3 Is a single-pole single-throw switch, and two ends of the single-pole single-throw switch are respectively connected with an analog switch S 2 Contact 3 of (2) and operational amplifier a 1 An output terminal of (a); analog switch S 4 Is a single-pole single-throw switch connected in series with an analog switch S 3 Contact of (d) and analog switch S 5 Is arranged between the contacts 2;
the input signal of the integrator comprises: logic control signals, timing control signals, and sensor current signals, the output signals comprising: pre-integral voltage V int And integral voltage V out The principle of the integrator is as follows: from an integrating capacitor C 1 、C 2 The analog switch is used for controlling the adjustment of the integral capacitance value, the zero clearing of the integral capacitance and the execution of a circuit time sequence control signal.
3. The infrared detection multi-step integration circuit according to claim 1, wherein the multi-step integration control module comprises seven parts of a comparator, an encoder, a combinational logic circuit, a sampling holder, an ADC, a register and a multi-step integration time sequence controller, and the multi-step integration time sequence controller is connected with the combinational logic circuit, the encoder, the comparator and the sampling holder through output signal lines; the sampling holder is connected with the ADC through an output signal line; the ADC is connected with the register through an output signal line; the comparator is connected with the encoder through an output signal line; the encoder is connected with the combinational logic circuit through an output signal line;
the input signals of the multi-step integral control module include: pre-integral voltage V int And integral voltage V out The output signal includes: logic control signals and time sequence control signals, wherein the principle of the multi-step integral control module is as follows: under the driving control of the multi-step integration time sequence controller, the comparator pre-integrates the voltage V int Comparing the signal with a set threshold voltage, temporarily storing the result, and comparing the pre-integrated voltage V int After the grading comparison of the (C) is completed, the comparison result is subjected to control word coding by an encoder, and the obtained control word is input into a combinational logic circuitMapping to obtain logic control signal and outputting, under the action of logic control signal and time sequence control signal, the integrator completes self-adaptive regulation of integrating capacitor, then makes formal integration to sensor current signal, after the fixed integration time is reached, the sampling holder makes integration voltage V out And (3) sampling and holding, wherein the ADC converts the integral voltage locked in the sampling holder into a digital signal and stores the digital signal into a register.
4. The infrared detection multi-step integrating circuit according to claim 1, wherein the pre-integrating capacitor C is used in the pre-integrating stage int Across to operational amplifier A 1 Both ends are disconnected with the integrating capacitor C 1 、C 2 And hold C 1 、C 2 Zero clearing the voltages at two ends, and setting a sensor current signal in a pre-integration capacitor C int Integral voltage V on out A comparator which is input into the multi-step integration control module in real time, and an integrated voltage V is input into the comparator in the pre-integration process out 3 comparisons with the threshold voltage are made, each time the comparator outputs a binary bit, the integral voltage is represented by 0 when it is less than the threshold voltage, and thus the result of the voltage comparison: "000", "001", "011", "111", the result is mapped into a control word by an encoder, the control word represents the above 4 output results by two-bit binary system, and sequentially represents "00", "01", "10", "11", and the combinational logic circuit maps logic control signals according to the control word, and further controls the analog switch to realize the integration capacitor C by the logic control signals 1 、C 2 The specific process of adjusting the integrating capacitance by the control word is as follows: when the control word is "00", the combinational logic circuit controls the integrating capacitor C 1 、C 2 Serial connection; when the control word is "01", the combinational logic circuit controls to access only the integrating capacitor C 1 The method comprises the steps of carrying out a first treatment on the surface of the When the control word is 10, the combinational logic circuit controls to only access the integrating capacitor C 2 The method comprises the steps of carrying out a first treatment on the surface of the When the control word is 11, the combinational logic circuit controls the integrating capacitor C 1 、C 2 Parallel connection;
the pre-integration stage is finished, and the pre-integration stage is disconnected and clearedPartial capacitance C int An integrating capacitor C is connected 1 、C 2 To integrate the sensor current signal, to convert the high quality infrared image voltage signal obtained by the integrator into a digital signal through the sample holder and ADC, and to store it in a register for output.
5. The infrared detection multi-step integrating circuit according to claim 1, wherein an integrating capacitor C is provided 1 、C 2 0.1uf and 0.2uf, respectively, 4 different integration capacitance values are obtained: series C 1 And C 2 Connect only C 1 Connect only C 2 Parallel C 1 And C 2 Pre-integration capacitor C int Between two smaller integrating capacitance values, i.e. 0.067uf < C int <0.1uf。
6. A control method of an infrared signal readout circuit integrator, characterized by being implemented based on the infrared detection multi-step integrating circuit according to any one of claims 1 to 5.
CN202310066632.7A 2023-01-20 2023-01-20 Infrared detection multi-step integrating circuit Pending CN116295864A (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117939319A (en) * 2024-03-22 2024-04-26 中国科学院云南天文台 Optimized sampling method and system for short wave infrared detector

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117939319A (en) * 2024-03-22 2024-04-26 中国科学院云南天文台 Optimized sampling method and system for short wave infrared detector
CN117939319B (en) * 2024-03-22 2024-06-04 中国科学院云南天文台 Optimized sampling method and system for short wave infrared detector

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