CN116185747A - Method, device and readable storage medium for debugging memory granule card opening tool - Google Patents

Method, device and readable storage medium for debugging memory granule card opening tool Download PDF

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Publication number
CN116185747A
CN116185747A CN202211580433.XA CN202211580433A CN116185747A CN 116185747 A CN116185747 A CN 116185747A CN 202211580433 A CN202211580433 A CN 202211580433A CN 116185747 A CN116185747 A CN 116185747A
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China
Prior art keywords
debugging
opening tool
virtual
storage
error
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林寅
吴大畏
李晓强
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SHENZHEN SILICONGO MICROELECTRONICS CO Ltd
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SHENZHEN SILICONGO MICROELECTRONICS CO Ltd
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Publication of CN116185747A publication Critical patent/CN116185747A/en
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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/263—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2273—Test methods
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/36—Preventing errors by testing or debugging software
    • G06F11/362—Software debugging
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F8/00—Arrangements for software engineering
    • G06F8/60—Software deployment
    • G06F8/61—Installation
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02D—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
    • Y02D10/00—Energy efficient computing, e.g. low power processors, power management or thermal management

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  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Software Systems (AREA)
  • Debugging And Monitoring (AREA)

Abstract

The application discloses a method for debugging a storage particle card opening tool, a device for debugging the storage particle card opening tool and a computer readable storage medium, wherein the method comprises the following steps: when a virtual host receives a debugging instruction of a card opening tool, determining NAND parameters corresponding to the debugging instruction; generating virtual storage equipment based on the NAND parameters, and determining error storage points and corresponding error types; setting parameters to be set of the error storage point positions according to the error types, and updating the virtual storage equipment according to the parameters to be set; and controlling the updated virtual storage device to execute the debugging instruction and outputting an execution result of the debugging instruction. The technical problems that the number of the fault logs grasped in the related technology is insufficient and the debugging effect of the card opening tool is affected are solved, and the technical effects of covering as many business scenes as possible for debugging the logic flow of mass production and exception handling are achieved.

Description

Method, device and readable storage medium for debugging memory granule card opening tool
Technical Field
The present application relates to the field of storage devices, and in particular, to a method for debugging a storage particle card opening tool, a storage particle card opening tool debugging device, and a computer readable storage medium.
Background
The memory includes an MCU (Microcontroller Unit, micro control unit) and NAND die. And the MCU is stored with a control program for controlling the memory to complete corresponding storage actions. NAND is widely used in various large-capacity devices such as memory cards, usb discs, SSDs, emmcs, and the like.
In the related art, a memory manufacturer purchases NAND pellets from a flash pellet manufacturer and further manufactures the memory. After the finished product is produced, a corresponding card opening tool is debugged for the NAND particles of the memory, and the FTL (Flash Translation Layer, flash memory conversion layer) is burnt into the NAND particles by using the card opening tool.
However, the number of NAND particles obtained by a memory manufacturer in the debugging process of the card opening tool is limited, so that the number of the captured fault logs is insufficient, and the debugging effect of the card opening tool is affected.
Disclosure of Invention
According to the method, the device and the computer readable storage medium for debugging the memory particle card opening tool, the technical problems that the quantity of the captured bug logs is insufficient and the debugging effect of the card opening tool is affected due to the fact that the quantity of NAND particles obtained by a memory manufacturer in the debugging process of the card opening tool is limited in the related art are solved, and the technical effects of logic flow and exception handling for debugging mass production in a service scene as much as possible are achieved.
The embodiment of the application provides a method for debugging a memory particle card opening tool, which comprises the following steps:
when a virtual host receives a debugging instruction of a card opening tool, determining NAND parameters corresponding to the debugging instruction;
generating virtual storage equipment based on the NAND parameters, and determining error storage points and corresponding error types;
setting parameters to be set of the error storage point positions according to the error types, and updating the virtual storage equipment according to the parameters to be set;
and controlling the updated virtual storage device to execute the debugging instruction and outputting an execution result of the debugging instruction.
Optionally, when the virtual host receives a debug instruction of the card opening tool, the step of determining the NAND parameter corresponding to the debug instruction includes:
when the virtual host receives the debugging instruction, determining a storage particle performance file corresponding to the debugging instruction;
determining a wear function, performance parameters and basic attribute parameters corresponding to the stored particle performance file;
the NAND parameter is determined from the wear function, the performance parameter, and the base attribute parameter.
Optionally, the step of generating a virtual storage device based on the NAND parameter and determining an error storage point location and a corresponding error type includes:
running a preset generation algorithm, and generating the virtual storage device based on the NAND parameters;
determining a target memory block based on the wear function;
determining a position coordinate corresponding to the target storage block as the error storage point position;
and acquiring the error type in the fault log, and randomly distributing the error type to the error storage point.
Optionally, the step of setting the parameter to be set of the error storage point according to the error type, and updating the virtual storage device according to the parameter to be set includes:
determining a target parameter value corresponding to the error type;
setting the parameters to be set corresponding to the error storage points according to the target parameter values;
and determining the target storage particles corresponding to the error storage points, and controlling the target storage particles to enter corresponding error states according to the parameters to be set.
Optionally, the step of controlling the updated virtual storage device to execute the debug instruction and outputting an execution result of the debug instruction includes:
determining a control file corresponding to the virtual storage device based on the card opening tool;
updating the virtual micro control unit according to the control file;
and controlling the virtual micro control unit to execute the debugging instruction and outputting an execution result of the debugging instruction.
Optionally, the step of determining, based on the card opening tool, a control file corresponding to the stored particle model includes:
operating the card opening tool to obtain a map table of virtual storage particles in the virtual storage device;
and generating the control file according to the map table based on the NAND parameters and the error storage point positions.
Optionally, the step of controlling the virtual micro control unit to execute the debug instruction and outputting an execution result of the debug instruction includes:
the virtual micro control unit performs read-write test on the virtual flash memory particles according to the control file;
when the read-write test has errors, outputting an error report corresponding to the read-write test.
In addition, the application also provides a memory particle card opening tool debugging device, which comprises a memory, a processor and a memory particle card opening tool debugging program stored on the memory and capable of running on the processor, wherein the processor realizes the steps of the memory particle card opening tool debugging method when executing the memory particle card opening tool debugging program.
In addition, the application further provides a computer readable storage medium, wherein the computer readable storage medium is stored with a storage grain card opening tool debugging program, and the storage grain card opening tool debugging program realizes the steps of the storage grain card opening tool debugging method when being executed by a processor.
One or more technical solutions provided in the embodiments of the present application at least have the following technical effects or advantages:
1. due to the adoption of the method, when the virtual host receives the debugging instruction of the card opening tool, the NAND parameters corresponding to the debugging instruction are determined; generating virtual storage equipment based on the NAND parameters, and determining error storage points and corresponding error types; setting parameters to be set of the error storage point positions according to the error types, and updating the virtual storage equipment according to the parameters to be set; and controlling the updated virtual storage device to execute the debugging instruction and outputting an execution result of the debugging instruction. Therefore, the technical problems that the quantity of the NAND particles obtained by a memory manufacturer in the debugging process of the card opening tool is limited, so that the quantity of the captured bug logs is insufficient and the debugging effect of the card opening tool is affected are effectively solved, and the technical effects of logic flow and exception handling which cover as many service scenes as possible for debugging mass production are realized.
Drawings
FIG. 1 is a schematic flow chart of a first embodiment of a method for debugging a memory granule card opening tool of the present application;
FIG. 2 is a flowchart illustrating a method for debugging a memory granule card opening tool according to an embodiment of the present application, wherein the step S120 is detailed;
fig. 3 is a schematic diagram of a hardware structure involved in an embodiment of the memory granule card opening tool debugging device in the present application.
Detailed Description
In the related art, the memory manufacturer has limited quantity of NAND particles obtained in the process of debugging the card opening tool, so that the quantity of the captured bug logs is insufficient, and the debugging effect of the card opening tool is affected; meanwhile, the conventional debugging needs to frequently read and write the NAND, which affects the service life. The main technical scheme adopted by the embodiment of the application is as follows: acquiring NAND parameters corresponding to storage particles, and generating corresponding virtual storage equipment; determining bad blocks in virtual storage particles in the virtual storage equipment as error storage points; updating the virtual storage device based on the error storage point; and controlling the updated virtual storage device to execute the debugging instruction and outputting an execution result of the debugging instruction. Thus, logic flow and exception handling for debugging mass production are realized, which cover as many business scenarios as possible.
In order to better understand the above technical solution, exemplary embodiments of the present application will be described in more detail below with reference to the accompanying drawings. While exemplary embodiments of the present application are shown in the drawings, it should be understood that the present application may be embodied in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the disclosure to those skilled in the art.
Example 1
An embodiment of the application discloses a method for debugging a memory particle card opening tool, referring to fig. 1, the method for debugging the memory particle card opening tool includes:
step S110, when a virtual host receives a debugging instruction of a card opening tool, determining NAND parameters corresponding to the debugging instruction;
in this embodiment, the card opening tool is used to perform a card opening operation on a storage device, such as a solid state disk, so that the solid state disk can work normally. The NAND parameters are parameters of storage particles corresponding to the debugging instructions. The virtual host operates on a terminal, such as a computer, and can call a processor of the computer to execute corresponding operations.
Optionally, step S110 includes:
step S111, when the virtual host receives the debug instruction, determining a storage particle performance file corresponding to the debug instruction;
step S112, determining a wear function, performance parameters and basic attribute parameters corresponding to the stored particle performance file;
step S113, determining the NAND parameter according to the wear function, the performance parameter, and the basic attribute parameter.
As an optional implementation manner, when the virtual host receives the debug instruction, the storage grain model corresponding to the debug instruction is determined. Determining a stored particle performance file according to the model; determining a wear function and a performance parameter corresponding to the stored particle performance file, wherein the wear function is a theoretical wear curve of the stored particle, and the performance parameter is a theoretical performance index of the stored particle; the NAND parameter is determined from the wear function and the performance parameter.
As another optional implementation manner, determining a storage grain model corresponding to the debug instruction, and determining a storage grain performance file according to the model; determining a wear function, performance parameters and basic attribute parameters corresponding to the stored particle performance file; wherein the basic attribute parameters include a block size of NAND, a page length, a page number, a NAND basic operation instruction, and the like; and acquiring a preset parameter generation model, taking the wear function and the performance parameter as variables of the model, generating a NAND dynamic parameter, and generating the NAND parameter according to the NAND dynamic parameter and the basic attribute parameter.
Step S120, generating virtual storage equipment based on the NAND parameters, and determining error storage points and corresponding error types;
in this embodiment, the virtual storage device includes a virtual micro control unit and a virtual storage grain.
Optionally, referring to fig. 2, step S120 includes:
step S121, running a preset generation algorithm, and generating the virtual storage device based on the NAND parameters;
step S122, determining a target storage block based on the abrasion function;
step S123, determining a position coordinate corresponding to the target storage block as the error storage point location;
step S124, obtaining the error type in the fault log, and randomly distributing the error type to the error storage point.
As an optional implementation manner, running a preset generation algorithm, and generating a virtual storage device based on the NAND parameters, wherein the virtual micro-control unit can control the virtual storage grain to execute corresponding read-write actions; randomly selecting a preset number of target storage particles from the virtual storage particles according to the abrasion function; determining a target storage block corresponding to the target storage particle, and locating coordinates in a map table corresponding to the virtual storage particle; taking the position coordinates as error storage points; obtaining an error record in a fault log; binding an error type to the error memory point positions randomly, wherein different error memory point positions can have the same error type.
Illustratively, a target memory block is randomly selected and assigned an error type.
Step S130, setting parameters to be set of the error storage point positions according to the error types, and updating the virtual storage equipment according to the parameters to be set;
in this embodiment, by setting the parameter of the storage granule corresponding to the error storage point location, the storage granule enters the working state corresponding to the parameter.
Optionally, step S130 includes:
step S131, determining a target parameter value corresponding to the error type;
step S132, setting the parameters to be set corresponding to the error storage point positions according to the target parameter values;
step S133, determining a target storage particle corresponding to the error storage point, and controlling the target storage particle to enter a corresponding error state according to the parameter to be set.
As an optional implementation manner, determining a target parameter value corresponding to the error type, and modifying a parameter to be set of a target storage particle corresponding to the error storage point location to the target parameter value, so that the target storage particle enters an error state corresponding to the error type; until all the error memory points are set.
And step S140, controlling the updated virtual storage device to execute the debugging instruction and outputting an execution result of the debugging instruction.
As an alternative implementation manner, a card opening tool is used for generating a control file based on a virtual storage device, the control file is sent to a virtual storage particle for storage, and when the virtual storage device simulates power-on operation, the virtual storage particle sends the control file to a virtual micro control unit; executing the corresponding debugging action and outputting the debugging result.
The technical scheme in the embodiment of the application at least has the following technical effects or advantages:
due to the adoption of the method, when the virtual host receives the debugging instruction of the card opening tool, the NAND parameters corresponding to the debugging instruction are determined; generating virtual storage equipment based on the NAND parameters, and determining error storage points and corresponding error types; setting parameters to be set of the error storage point positions according to the error types, and updating the virtual storage equipment according to the parameters to be set; and controlling the updated virtual storage device to execute the debugging instruction and outputting an execution result of the debugging instruction. Therefore, the technical problems that the quantity of the NAND particles obtained by a memory manufacturer in the debugging process of the card opening tool is limited, so that the quantity of the captured bug logs is insufficient and the debugging effect of the card opening tool is affected are effectively solved, and the technical effects of logic flow and exception handling which cover as many service scenes as possible for debugging mass production are realized.
Example two
Based on the first embodiment, a second embodiment of the present application provides a method for debugging a memory granule card opening tool, where step S140 includes:
step S210, determining a control file corresponding to the virtual storage device based on the card opening tool;
optionally, step S210 includes:
step S211, operating the card opening tool to obtain a map table of virtual storage particles in the virtual storage device;
and step S212, generating the control file according to the map table based on the NAND parameters and the error storage point positions.
As an optional implementation manner, the card opening tool is operated to obtain a three-dimensional map of the virtual storage particles, and the target storage particles can be determined according to the three-dimensional coordinates; and generating the control file according to the storage grain model corresponding to the NAND parameter, the storage grain performance parameter, the card opening tool model and the error type corresponding to the error storage point.
Step S220, updating the virtual micro control unit according to the control file;
optionally, step S220 includes:
step S221, compiling the control file into a binary file, and sending the binary file to the virtual storage granules;
step S222, when the virtual storage device receives a working instruction, controlling the virtual storage granule to send the binary file to the virtual micro control unit.
As an alternative implementation mode, after the control file is generated, the control file is sent to the virtual storage particles; and when the virtual storage device receives a working instruction for the first time, the binary file is sent to the virtual micro control unit from the virtual storage particle so as to update the main control of the virtual micro control unit according to the control file.
Step S230, controlling the virtual micro control unit to execute the debug instruction, and outputting the execution result of the debug instruction.
Optionally, step S230 includes:
step S231, the virtual micro control unit performs read-write test on the virtual flash memory particles according to the control file;
step S232, when an error occurs in the read-write test, outputting an error report corresponding to the read-write test.
As an optional implementation manner, after receiving the control file, the virtual micro control unit sends a read instruction and a write instruction corresponding to the debug instruction to the virtual storage grain so as to control the virtual storage grain to respond and execute corresponding read action and write action; when errors occur in the reading operation and the writing operation, a corresponding error report is output.
For example, the virtual storage granule uses the running memory of the computer on which the virtual storage device is running when performing the read action and the write action; meanwhile, the read and written files are compressed, so that the testing speed is increased, and the testing efficiency is improved.
The technical scheme in the embodiment of the application at least has the following technical effects or advantages:
because the control file corresponding to the virtual storage device is determined based on the card opening tool; updating the virtual micro control unit according to the control file; and controlling the virtual micro control unit to execute the debugging instruction and outputting an execution result of the debugging instruction. Therefore, the technical problem that the service life of NAND particles is greatly reduced because NAND particles are required to be read and written frequently when the card opening tool is debugged in the related technology is effectively solved, the service life of the NAND particles is not influenced, and meanwhile, the debugging efficiency of the card opening tool is improved.
The application further provides a memory grain card opening tool debugging device, referring to fig. 3, fig. 3 is a schematic structural diagram of the memory grain card opening tool debugging device of the hardware running environment according to the embodiment of the application.
As shown in fig. 3, the memory granule card opening tool debugging device may include: a processor 1001, such as a central processing unit (Central Processing Unit, CPU), a communication bus 1002, a user interface 1003, a network interface 1004, a memory 1005. Wherein the communication bus 1002 is used to enable connected communication between these components. The user interface 1003 may include a Display, an input unit such as a Keyboard (Keyboard), and the optional user interface 1003 may further include a standard wired interface, a wireless interface. The network interface 1004 may optionally include a standard wired interface, a WIreless interface (e.g., a WIreless-FIdelity (WI-FI) interface). The Memory 1005 may be a high-speed random access Memory (Random Access Memory, RAM) Memory or a stable nonvolatile Memory (NVM), such as a disk Memory. The memory 1005 may also optionally be a storage device separate from the processor 1001 described above.
It will be appreciated by those skilled in the art that the structure shown in fig. 3 is not limiting of the stored particle card opening tool debugging apparatus and may include more or fewer components than shown, or certain components in combination, or a different arrangement of components.
Optionally, the memory 1005 is electrically connected to the processor 1001, and the processor 1001 may be configured to control operation of the memory 1005, and may also read data in the memory 1005 to implement the stored particle card opening tool debug.
Optionally, as shown in fig. 3, an operating system, a data storage module, a network communication module, a user interface module, and a storage granule opening tool debugging program may be included in the memory 1005 as one storage medium.
Optionally, in the storage granule card opening tool debugging device shown in fig. 3, the network interface 1004 is mainly used for data communication with other devices; the user interface 1003 is mainly used for data interaction with a user; the processor 1001 and the memory 1005 in the memory granule opening tool debugging device of the present application may be provided in the memory granule opening tool debugging device.
As shown in fig. 3, the device for debugging a storage grain card opening tool calls a storage grain card opening tool debugging program stored in a memory 1005 through a processor 1001, and executes related steps of the method for debugging a storage grain card opening tool provided in the embodiment of the present application:
when a virtual host receives a debugging instruction of a card opening tool, determining NAND parameters corresponding to the debugging instruction;
generating virtual storage equipment based on the NAND parameters, and determining error storage points and corresponding error types;
setting parameters to be set of the error storage point positions according to the error types, and updating the virtual storage equipment according to the parameters to be set;
and controlling the updated virtual storage device to execute the debugging instruction and outputting an execution result of the debugging instruction.
Optionally, the processor 1001 may call a memory granule card opening tool debug program stored in the memory 1005, and further perform the following operations:
when the virtual host receives the debugging instruction, determining a storage particle performance file corresponding to the debugging instruction;
determining a wear function, performance parameters and basic attribute parameters corresponding to the stored particle performance file;
the NAND parameter is determined from the wear function, the performance parameter, and the base attribute parameter.
Optionally, the processor 1001 may call a memory granule card opening tool debug program stored in the memory 1005, and further perform the following operations:
running a preset generation algorithm, and generating the virtual storage device based on the NAND parameters;
determining a target memory block based on the wear function;
determining a position coordinate corresponding to the target storage block as the error storage point position;
and acquiring the error type in the fault log, and randomly distributing the error type to the error storage point.
Optionally, the processor 1001 may call a memory granule card opening tool debug program stored in the memory 1005, and further perform the following operations:
determining a target parameter value corresponding to the error type;
setting the parameters to be set corresponding to the error storage points according to the target parameter values;
and determining the target storage particles corresponding to the error storage points, and controlling the target storage particles to enter corresponding error states according to the parameters to be set.
Optionally, the processor 1001 may call a memory granule card opening tool debug program stored in the memory 1005, and further perform the following operations:
determining a control file corresponding to the virtual storage device based on the card opening tool;
updating the virtual micro control unit according to the control file;
and controlling the virtual micro control unit to execute the debugging instruction and outputting an execution result of the debugging instruction.
Optionally, the processor 1001 may call a memory granule card opening tool debug program stored in the memory 1005, and further perform the following operations:
operating the card opening tool to obtain a map table of virtual storage particles in the virtual storage device;
and generating the control file according to the map table based on the NAND parameters and the error storage point positions.
Optionally, the processor 1001 may call a memory granule card opening tool debug program stored in the memory 1005, and further perform the following operations:
compiling the control file into a binary file and sending the binary file to the virtual storage granules;
and when the virtual storage equipment receives a working instruction, controlling the virtual storage particles to send the binary files to the virtual micro control unit.
Optionally, the processor 1001 may call a memory granule card opening tool debug program stored in the memory 1005, and further perform the following operations:
the virtual micro control unit performs read-write test on the virtual flash memory particles according to the control file;
when the read-write test has errors, outputting an error report corresponding to the read-write test.
In addition, the embodiment of the application further provides a computer readable storage medium, wherein the computer readable storage medium stores a storage grain card opening tool debugging program, and the storage grain card opening tool debugging program realizes the relevant steps of any embodiment of the storage grain card opening tool debugging method when being executed by a processor.
It will be appreciated by those skilled in the art that embodiments of the present application may be provided as a method, system, or computer program product. Accordingly, the present application may take the form of an entirely hardware embodiment, an entirely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, the present application may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein.
The present application is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems) and computer program products according to embodiments of the application. It will be understood that each flow and/or block of the flowchart illustrations and/or block diagrams, and combinations of flows and/or blocks in the flowchart illustrations and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
It should be noted that in the claims, any reference signs placed between parentheses shall not be construed as limiting the claim. The word "comprising" does not exclude the presence of elements or steps not listed in a claim. The word "a" or "an" preceding an element does not exclude the presence of a plurality of such elements. The application may be implemented by means of hardware comprising several distinct elements, and by means of a suitably programmed computer. In the unit claims enumerating several means, several of these means may be embodied by one and the same item of hardware. The use of the words first, second, third, etc. do not denote any order. These words may be interpreted as names.
While preferred embodiments of the present application have been described, additional variations and modifications in those embodiments may occur to those skilled in the art once they learn of the basic inventive concepts. It is therefore intended that the following claims be interpreted as including the preferred embodiments and all such alterations and modifications as fall within the scope of the application.
It will be apparent to those skilled in the art that various modifications and variations can be made in the present application without departing from the spirit or scope of the application. Thus, if such modifications and variations of the present application fall within the scope of the claims and the equivalents thereof, the present application is intended to cover such modifications and variations.

Claims (10)

1. The method for debugging the memory particle card opening tool is characterized by comprising the following steps of:
when a virtual host receives a debugging instruction of a card opening tool, determining NAND parameters corresponding to the debugging instruction;
generating virtual storage equipment based on the NAND parameters, and determining error storage points and corresponding error types;
setting parameters to be set of the error storage point positions according to the error types, and updating the virtual storage equipment according to the parameters to be set;
and controlling the updated virtual storage device to execute the debugging instruction and outputting an execution result of the debugging instruction.
2. The method for debugging a memory granule card opening tool according to claim 1, wherein when the virtual host receives a debug instruction of the card opening tool, the step of determining a NAND parameter corresponding to the debug instruction comprises:
when the virtual host receives the debugging instruction, determining a storage particle performance file corresponding to the debugging instruction;
determining a wear function, performance parameters and basic attribute parameters corresponding to the stored particle performance file;
the NAND parameter is determined from the wear function, the performance parameter, and the base attribute parameter.
3. The method of claim 2, wherein the steps of generating a virtual memory device based on the NAND parameters and determining the error memory location and the corresponding error type comprise:
running a preset generation algorithm, and generating the virtual storage device based on the NAND parameters;
determining a target memory block based on the wear function;
determining a position coordinate corresponding to the target storage block as the error storage point position;
and acquiring the error type in the fault log, and randomly distributing the error type to the error storage point.
4. The method for debugging a memory granule opening tool according to claim 1, wherein the step of setting a parameter to be set of the error memory point location according to the error type, and updating the virtual memory device according to the parameter to be set comprises:
determining a target parameter value corresponding to the error type;
setting the parameters to be set corresponding to the error storage points according to the target parameter values;
and determining the target storage particles corresponding to the error storage points, and controlling the target storage particles to enter corresponding error states according to the parameters to be set.
5. The method for debugging a memory granule opening tool according to claim 1, wherein the step of controlling the updated virtual memory device to execute the debug instruction and outputting the execution result of the debug instruction comprises:
determining a control file corresponding to the virtual storage device based on the card opening tool;
updating the virtual micro control unit according to the control file;
and controlling the virtual micro control unit to execute the debugging instruction and outputting an execution result of the debugging instruction.
6. The method for debugging a memory granule opening tool according to claim 5, wherein the step of determining the control file corresponding to the memory granule model based on the opening tool comprises:
operating the card opening tool to obtain a map table of virtual storage particles in the virtual storage device;
and generating the control file according to the map table based on the NAND parameters and the error storage point positions.
7. The method of claim 5, wherein updating the virtual micro control unit based on the control file comprises:
compiling the control file into a binary file and sending the binary file to the virtual storage granules;
and when the virtual storage equipment receives a working instruction, controlling the virtual storage particles to send the binary files to the virtual micro control unit.
8. The method of claim 5, wherein the step of controlling the virtual micro control unit to execute the debug instruction and outputting an execution result of the debug instruction comprises:
the virtual micro control unit performs read-write test on the virtual flash memory particles according to the control file;
when the read-write test has errors, outputting an error report corresponding to the read-write test.
9. A memory granule opening tool debugging device, characterized by comprising a memory, a processor and a memory granule opening tool debugging program stored on the memory and operable on the processor, wherein the processor implements the steps of the memory granule opening tool debugging method according to any one of claims 1 to 8 when executing the memory granule opening tool debugging program.
10. A computer readable storage medium, wherein a memory granule opening tool debugging program is stored on the computer readable storage medium, and the memory granule opening tool debugging program, when executed by a processor, implements the steps of the memory granule opening tool debugging method of any one of claims 1 to 8.
CN202211580433.XA 2022-12-09 2022-12-09 Method, device and readable storage medium for debugging memory granule card opening tool Pending CN116185747A (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117971583A (en) * 2024-03-28 2024-05-03 合肥康芯威存储技术有限公司 Method and system for testing storage particles, electronic equipment and storage medium

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117971583A (en) * 2024-03-28 2024-05-03 合肥康芯威存储技术有限公司 Method and system for testing storage particles, electronic equipment and storage medium
CN117971583B (en) * 2024-03-28 2024-06-11 合肥康芯威存储技术有限公司 Method and system for testing storage particles, electronic equipment and storage medium

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