CN116165448A - System and method for testing material plate in RFID - Google Patents
System and method for testing material plate in RFID Download PDFInfo
- Publication number
- CN116165448A CN116165448A CN202310135669.0A CN202310135669A CN116165448A CN 116165448 A CN116165448 A CN 116165448A CN 202310135669 A CN202310135669 A CN 202310135669A CN 116165448 A CN116165448 A CN 116165448A
- Authority
- CN
- China
- Prior art keywords
- rfid
- plate
- array
- card reader
- shielding layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
- G01R29/0871—Complete apparatus or systems; circuits, e.g. receivers or amplifiers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/10—Radiation diagrams of antennas
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Credit Cards Or The Like (AREA)
Abstract
The invention discloses a system and a method for testing a material plate in an RFID, wherein the system comprises the material plate in the RFID, a grid shielding layer and a card reader array plate which are sequentially arranged in a layering manner according to the sequence from top to bottom; a plurality of RFID antennas which are arranged in an array are arranged on the material plate in the RFID, a plurality of metal plates which are arranged in an array are arranged on the grid shielding layer, and a plurality of card readers which are arranged in an array are arranged on the card reader array plate; the array arrangement mode of the card reader is the same as that of the RFID antennas, and the distance between the metal plates is a distance between the RFID antennas; the grid shielding layer has the capability of moving relative to the material plate and the card reader array plate in the RFID, the moving distance of the grid shielding layer is the distance of one RFID antenna each time, and the grid shielding layer covers different RFID antennas through movement. According to the invention, through designing the arrangement mode of the metal plates, more RFID can be tested as much as possible, and meanwhile, the interference between test systems is reduced.
Description
Technical Field
The invention relates to the field of mass production of RFID chips, in particular to a system and a method for a material plate in an RFID.
Background
In the RFID label or card production process, the card is in a mid-web state prior to die cutting. The middle plate is simply laminated with the chip module through plastic, and the card picture printing operation is not performed. The card is tested at this stage, so that the production time and cost of the subsequent process can be reduced.
In the production process of conventional RFID tags or cards, no test is performed at this stage, or a simple serial test is performed manually, which is time-consuming and laborious. In order to improve the working efficiency and reduce the instability caused by manual testing, a high-efficiency parallel test device is urgently needed in a production factory.
Disclosure of Invention
Aiming at the defects of the prior art, the invention provides a system and a method for testing a material plate in RFID, which are used for testing more RFID as much as possible by designing the arrangement mode of metal plates and reducing the interference among test systems.
In order to solve the technical problems, the invention adopts the following technical scheme: the system for testing the RFID middle material plate comprises the RFID middle material plate, a grid shielding layer and a card reader array plate which are arranged in a layered mode, wherein the RFID middle material plate is positioned at the uppermost layer, the grid shielding layer is positioned at the middle layer, and the card reader array plate is positioned at the lowermost layer; a plurality of RFID antennas which are arranged in an array are arranged on the material plate in the RFID, a plurality of metal plates which are arranged in an array are arranged on the grid shielding layer, and a plurality of card readers which are arranged in an array are arranged on the card reader array plate; the array arrangement mode of the card reader is the same as that of the RFID antennas, and the distance between the metal plates is a distance between the RFID antennas; the grid shielding layer has the capability of moving relative to the material plate and the card reader array plate in the RFID, the moving distance of the grid shielding layer each time is the distance of one RFID antenna, the grid shielding layer covers different RFID antennas through movement, and when the grid shielding layer covers the RFID antennas, the centers of the RFID antennas, the metal plate and the card reader are on the same straight line.
Further, the metal plate is spaced apart from each other by a distance of one RFID antenna between the lateral and longitudinal directions.
Further, the metal plate is more than the RFID antennas on the material plate in the RFID in one row in the longitudinal direction or the transverse direction, and the more than one row is separated from other metal plates by a distance of one RFID antenna in the transverse direction or the longitudinal direction.
Further, the length and width of the metal plate and the length and width of the RFID antenna are within +/-5 mm.
Further, the grid shielding layer comprises a plastic substrate, and the metal plates are arranged on the plastic substrate at intervals.
Further, the number of card readers is equal to the number of RFID antennas.
Further, the card reader is fixed on the card reader array board without magnetism.
Further, the RFID antennas are arranged on the RFID medium material plate, and the card readers are arranged on the card reader array plate in a 5*5 rectangular array, and 25 RFID antennas and 25 card readers are uniformly arranged in a 5*5 matrix array; the metal plates are arranged in a 6*5 rectangular array on the grid shielding layer, and 15 metal plates are arranged in a 6*5 rectangular array at staggered intervals.
The invention also discloses a method for testing the material plate in the RFID, which is based on the system for testing the material plate in the RFID and comprises the following steps:
s01), layering the material plate, the grid shielding layer and the card reader array plate in the RFID, and aligning the centers of the metal plates on the edges of the grid shielding layer with the centers of the card reader and the RFID antenna;
s02), selecting card readers arranged at intervals in the transverse direction and the longitudinal direction of the card reader array plate, dividing the card readers into a group A, and dividing the rest card readers into a group B; similarly, RFID antennas which are arranged at intervals are selected in the transverse direction and the longitudinal direction of the material plate in the RFID, and are divided into a group A, and the rest card readers are divided into a group B;
s03), selecting a card reader without metal plate shielding, sending a test script to an RFID chip of a material plate in the RFID by the card reader, and starting the test;
s04), after the test is completed, the metal plate is moved, the distance is the distance of one row of RFID tags, another group of card readers without shielding coverage of the metal plate are selected, the card readers send test scripts to RFID chips of the material plate in the RFID, and the test is started;
s05), completing all the tests, resetting the metal plate, and recording test data.
The invention has the beneficial effects that: according to the invention, the grid shielding layer array is combined through the card reader array, and the interference between card readers in working is reduced when the RFID is tested in parallel by moving the grid shielding layer. The RFID antennas, the card readers and the metal plates are all in an array, so that the RFID antennas can be subjected to high-efficiency parallel test, more RFID can be tested as much as possible, and meanwhile, the interference between test systems can be reduced.
Drawings
FIG. 1 is a schematic diagram of a layout of a web, grid shield, and reader array layer layers in an RFID;
FIG. 2 is a schematic diagram of a web in an RFID;
FIG. 3 is a schematic view of a grid shielding layer;
FIG. 4 is a schematic diagram of a card reader array plate;
FIG. 5 is a schematic diagram of RFID in two batches;
in the figure: 1. the RFID reader comprises an RFID middle material plate, 2, a grid shielding layer, 3, a card reader array plate, 4, a middle material plate substrate, 5, an RFID antenna, 6, a metal plate, 7, a plastic substrate, 8, a card reader array plate substrate, 9 and a card reader.
Detailed Description
The invention will be further described with reference to the accompanying drawings and specific examples.
Example 1
The embodiment discloses a system for testing a material plate in RFID, as shown in FIG. 1, which comprises a material plate 1 in RFID, a grid shielding layer 2 and a card reader array plate 3 which are arranged in a layered mode, wherein the material plate 1 in RFID is positioned at the uppermost layer, the grid shielding layer 2 is positioned at the middle layer, and the card reader array plate 3 is positioned at the lowermost layer.
As shown in fig. 2, the RFID center board 1 includes a center board substrate 4, and 25 RFID antennas 5 uniformly arranged in a 5*5 rectangular array on the center board substrate. As shown in fig. 3, the grid shielding layer 2 includes a plastic substrate 7, and 15 metal plates 6 arranged on the plastic substrate 7 at a 6*5 rectangular array staggered interval, and the plastic substrate 7 itself does not contain a metal material or a magnetic material. As shown in fig. 4, the card reader array board 3 includes a card reader array board 8 and 25 card readers 9 uniformly arranged on the card reader array board 8 according to a 5*5 rectangular matrix, and the card reader array board 8 is used for fixing the card readers 9 and is made of plastic or other non-magnetic materials.
In this embodiment, the number of card readers 9 is equal to the number of RFID antennas 5, and the array arrangement mode of the card readers 9 is the same as the array arrangement mode of the RFID antennas 5, and the length-width error of the metal plate 6 and the length-width error of the RFID antennas 5 are within ±5 mm. The metal plate 6 is spaced apart from each other by a distance of the RFID antenna 5 in both the transverse and longitudinal directions. The metal plate 6 is one more row than the RFID antennas 5 on the stock plate in the RFID in the longitudinal or transverse direction, and the one more row is separated from the other metal plates by a distance of one RFID antenna in the transverse or longitudinal direction.
In this embodiment, the grid shielding layer 2 has the capability of moving relative to the material plate 1 and the card reader array plate 3 in the RFID (when the material plate 1 and the card reader array plate 3 in the RFID are horizontally arranged, the grid shielding layer 2 is horizontally moved, and when the material plate 1 and the card reader array plate 3 in the RFID are vertically arranged, the grid shielding layer 2 is vertically moved), and the moving distance of each time of the grid shielding layer 2 is the distance of one RFID antenna, and the grid shielding layer covers different RFID antennas by moving. When the grid shielding layer covers the RFID antenna, the centers of the RFID antenna, the metal plate and the card reader are on the same straight line.
In other embodiments, the RFID material plates may be in a matrix arrangement of 3*8, and the grid shielding layer and the card reader array plate may be modified accordingly according to the arrangement described in this embodiment.
Example 2
The embodiment discloses a method for testing a material plate in an RFID, which is based on the system for testing a material plate in an RFID in embodiment 1 and comprises the following steps:
s01), layering the material plate in the RFID, the grid shielding layer and the card reader array plate, and aligning the center of the metal plate on the side of the grid shielding layer with the centers of the card reader and the RFID antenna in the center of the material plate in the RFID;
s02), selecting card readers arranged at intervals in the transverse direction and the longitudinal direction of the card reader array plate, dividing the card readers into a group A (marked as A in FIG. 5), and dividing the rest card readers into a group B (marked as B in FIG. 5); similarly, RFID antennas which are arranged at intervals are selected in the transverse direction and the longitudinal direction of the material plate in the RFID, the RFID antennas are divided into A groups, the rest card readers are divided into B groups, and the grouping mode is shown in FIG. 5;
s03), selecting a card reader without metal plate shielding, such as a tag with an A mark in FIG. 5, sending a test script to an RFID chip of a material plate in the RFID by the card reader, and starting the test;
s04), after the test is completed, the metal plate is moved, the distance is the distance of one row of RFID tags, another group of card readers without shielding coverage of the metal plate is selected, for example, the RFID tag with the mark B in FIG. 5 is used, and the card readers send test scripts to RFID chips of the material plate in the RFID, so that the test is started;
s05), completing all the tests, resetting the metal plate, and recording test data.
According to the invention, different RFID antennas are covered each time through the metal plates distributed at intervals, uncovered RFID antennas can be tested simultaneously, the testing efficiency is greatly improved, the tested RFID antennas are also spaced, and the interference between card readers during operation can be reduced.
The foregoing description is only of the basic principles and preferred embodiments of the present invention, and modifications and alternatives thereto will occur to those skilled in the art in light of the present invention.
Claims (9)
1. A system for testing a web in an RFID, comprising: the RFID medium-sized RFID reader comprises a RFID medium-sized material plate, a grid shielding layer and a card reader array plate which are arranged in a layered mode, wherein the RFID medium-sized material plate is positioned at the uppermost layer, the grid shielding layer is positioned at the middle layer, and the card reader array plate is positioned at the lowermost layer; a plurality of RFID antennas which are arranged in an array are arranged on the material plate in the RFID, a plurality of metal plates which are arranged in an array are arranged on the grid shielding layer, and a plurality of card readers which are arranged in an array are arranged on the card reader array plate; the array arrangement mode of the card reader is the same as that of the RFID antennas, and the distance between the metal plates is a distance between the RFID antennas; the grid shielding layer has the capability of moving relative to the material plate and the card reader array plate in the RFID, the moving distance of the grid shielding layer each time is the distance of one RFID antenna, the grid shielding layer covers different RFID antennas through movement, and when the grid shielding layer covers the RFID antennas, the centers of the RFID antennas, the metal plate and the card reader are on the same straight line.
2. The system for testing a web in an RFID device of claim 1, wherein: the metal plate is spaced apart from each other by a distance of one RFID antenna between the transverse and longitudinal directions.
3. The system for testing a web in an RFID device of claim 1, wherein: the metal plate is more than one row of RFID antennas on the material plate in the RFID in the longitudinal direction or the transverse direction, and the more row is separated from other metal plates by a distance of one RFID antenna in the transverse direction or the longitudinal direction.
4. The system for testing a web in an RFID device of claim 1, wherein: the length and width errors of the metal plate and the RFID antenna are within +/-5 mm.
5. The system for testing a web in an RFID device of claim 1, wherein: the grid shielding layer comprises a plastic substrate, and the metal plates are arranged on the plastic substrate at intervals.
6. The system for testing a web in an RFID device of claim 1, wherein: the number of card readers is equal to the number of RFID antennas.
7. The system for testing a web in an RFID device of claim 1, wherein: the card reader is fixed on a card reader array board without magnetism.
8. The system for testing a web in an RFID device of claim 1, wherein: the RFID antennas are arranged on a material plate in the RFID, the card readers are arranged on a card reader array plate in a 5*5 rectangular array, and 25 RFID antennas and 25 card readers are uniformly arranged in a 5*5 matrix array; the metal plates are arranged in a 6*5 rectangular array on the grid shielding layer, and 15 metal plates are arranged in a 6*5 rectangular array at staggered intervals.
9. A method of testing a web in an RFID, comprising: the method is based on the system of claim 1, comprising the steps of:
s01), layering the material plate, the grid shielding layer and the card reader array plate in the RFID, and aligning the centers of the metal plates on the edges of the grid shielding layer with the centers of the card reader and the RFID antenna;
s02), selecting card readers arranged at intervals in the transverse direction and the longitudinal direction of the card reader array plate, dividing the card readers into a group A, and dividing the rest card readers into a group B; similarly, RFID antennas which are arranged at intervals are selected in the transverse direction and the longitudinal direction of the material plate in the RFID, and are divided into a group A, and the rest card readers are divided into a group B;
s03), selecting a card reader without metal plate shielding, sending a test script to an RFID chip of a material plate in the RFID by the card reader, and starting the test;
s04), after the test is completed, the metal plate is moved, the distance is the distance of one row of RFID tags, another group of card readers without shielding coverage of the metal plate are selected, the card readers send test scripts to RFID chips of the material plate in the RFID, and the test is started;
s05), completing all the tests, resetting the metal plate, and recording test data.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202310135669.0A CN116165448A (en) | 2023-02-20 | 2023-02-20 | System and method for testing material plate in RFID |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202310135669.0A CN116165448A (en) | 2023-02-20 | 2023-02-20 | System and method for testing material plate in RFID |
Publications (1)
Publication Number | Publication Date |
---|---|
CN116165448A true CN116165448A (en) | 2023-05-26 |
Family
ID=86417900
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN202310135669.0A Pending CN116165448A (en) | 2023-02-20 | 2023-02-20 | System and method for testing material plate in RFID |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN116165448A (en) |
-
2023
- 2023-02-20 CN CN202310135669.0A patent/CN116165448A/en active Pending
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US10229886B2 (en) | Discrete component backward traceability and semiconductor device forward traceability | |
US7659822B2 (en) | Method and apparatus for testing RFID devices | |
CN101889338B (en) | Method for wafer test and probe card for the same | |
US20110156033A1 (en) | Method and system for tracing die at unit level | |
WO2000057458A1 (en) | Method of manufacturing semiconductor device and semiconductor device manufactured by it | |
JPH10199777A (en) | System, method, and device for storing information during semiconductor manufacture process period | |
CN103295035A (en) | Method and device for online detecting RFID electronic tag | |
US20070139057A1 (en) | System and method for radio frequency identification tag direct connection test | |
CN104022058A (en) | Discrete assembly backward traceability and semiconductor device forward traceability | |
US20080174407A1 (en) | Method and apparatus for inspecting radio frequency identification tags | |
JP2007025762A (en) | Inspection equipment for rfid tag and base sheet to be used for the same | |
KR20130143365A (en) | Pcb array code traceability system and method for tracing and managing pcb array code | |
US7884629B2 (en) | Probe card layout | |
CN116165448A (en) | System and method for testing material plate in RFID | |
US20230394270A1 (en) | Inline testing of rfid inlays | |
US3503500A (en) | Sorting apparatus and method | |
CN104614658B (en) | Method for testing high-frequency chip wafers through multi-channel probe card | |
KR100798724B1 (en) | Method for wafer test and probe card for the same | |
CN201852913U (en) | Four-channel testing device for RFID high-frequency chips | |
US6279141B1 (en) | Preburn-in dynamic random access memory module and preburn-in circuit board thereof | |
US10504801B2 (en) | Method and apparatus for detecting and removing defective integrated circuit packages | |
JP2024035890A (en) | Inspection device of communication medium, and manufacturing method of communication medium | |
JP4356207B2 (en) | Non-contact type IC card manufacturing method | |
JP3943043B2 (en) | IC product inspection apparatus and inspection method | |
JPS59136942A (en) | Acceptable chip selecting device |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination |