CN116097106A8 - 芯片及时钟检测方法 - Google Patents
芯片及时钟检测方法 Download PDFInfo
- Publication number
- CN116097106A8 CN116097106A8 CN202080104997.9A CN202080104997A CN116097106A8 CN 116097106 A8 CN116097106 A8 CN 116097106A8 CN 202080104997 A CN202080104997 A CN 202080104997A CN 116097106 A8 CN116097106 A8 CN 116097106A8
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- Prior art keywords
- chip
- clock signal
- detection
- clock
- circuit
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- 238000001514 detection method Methods 0.000 title abstract 6
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Manipulation Of Pulses (AREA)
- Pulse Circuits (AREA)
Abstract
一种芯片及时钟检测方法,涉及计算机技术领域。在芯片上配置参考时钟产生电路、毛刺检测电路和占空比检测电路中的至少一项。以便于后续基于参考时钟产生电路对芯片上的时钟信号的频率进行检测,从而避免了在对芯片上的时钟信号检测时需要额外通过模拟电路引出一个标准参考时钟,因此节省了芯片资源。此外,通过该芯片,还可以实现对同一芯片上的时钟信号包含的毛刺以及时钟信号的占空比的检测,提高了检测时钟信号的灵活性。
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/CN2020/132967 WO2022110235A1 (zh) | 2020-11-30 | 2020-11-30 | 芯片及时钟检测方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN116097106A CN116097106A (zh) | 2023-05-09 |
CN116097106A8 true CN116097106A8 (zh) | 2024-05-28 |
Family
ID=81753939
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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CN202080104997.9A Pending CN116097106A (zh) | 2020-11-30 | 2020-11-30 | 芯片及时钟检测方法 |
Country Status (2)
Country | Link |
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CN (1) | CN116097106A (zh) |
WO (1) | WO2022110235A1 (zh) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN115334264B (zh) * | 2022-08-17 | 2024-04-09 | 中国电子科技集团公司第四十四研究所 | Cmos图像传感器片上时钟产生电路、模块及方法 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6794912B2 (en) * | 2002-02-18 | 2004-09-21 | Matsushita Electric Industrial Co., Ltd. | Multi-phase clock transmission circuit and method |
CN102223143A (zh) * | 2010-04-16 | 2011-10-19 | 电信科学技术研究院 | 时钟信号保护的装置、方法及时钟检测补偿电路 |
CN103728516B (zh) * | 2014-01-09 | 2016-05-11 | 福州瑞芯微电子股份有限公司 | Soc芯片时钟检测电路 |
CN104133409B (zh) * | 2014-08-07 | 2016-08-17 | 电子科技大学 | 一种对称性可调的三角波合成装置 |
CN105629772B (zh) * | 2014-10-30 | 2019-05-07 | 深圳开阳电子股份有限公司 | 一种延时控制装置 |
CN107797442B (zh) * | 2017-11-08 | 2023-06-23 | 广州安凯微电子股份有限公司 | 时间数字转换装置及数字锁相环 |
-
2020
- 2020-11-30 WO PCT/CN2020/132967 patent/WO2022110235A1/zh active Application Filing
- 2020-11-30 CN CN202080104997.9A patent/CN116097106A/zh active Pending
Also Published As
Publication number | Publication date |
---|---|
CN116097106A (zh) | 2023-05-09 |
WO2022110235A1 (zh) | 2022-06-02 |
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CI02 | Correction of invention patent application |
Correction item: PCT international application to national stage day Correct: 2023.03.10 False: 2023.03.09 Number: 19-01 Page: The title page Volume: 39 Correction item: PCT international application to national stage day Correct: 2023.03.10 False: 2023.03.09 Number: 19-01 Volume: 39 |
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CI02 | Correction of invention patent application |