CN116097106A8 - 芯片及时钟检测方法 - Google Patents

芯片及时钟检测方法 Download PDF

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Publication number
CN116097106A8
CN116097106A8 CN202080104997.9A CN202080104997A CN116097106A8 CN 116097106 A8 CN116097106 A8 CN 116097106A8 CN 202080104997 A CN202080104997 A CN 202080104997A CN 116097106 A8 CN116097106 A8 CN 116097106A8
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CN
China
Prior art keywords
chip
clock signal
detection
clock
circuit
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Pending
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CN202080104997.9A
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English (en)
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CN116097106A (zh
Inventor
商新超
童海涛
黄涛
余芳
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Huawei Technologies Co Ltd
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Huawei Technologies Co Ltd
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Publication date
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Publication of CN116097106A publication Critical patent/CN116097106A/zh
Publication of CN116097106A8 publication Critical patent/CN116097106A8/zh
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manipulation Of Pulses (AREA)
  • Pulse Circuits (AREA)

Abstract

一种芯片及时钟检测方法，涉及计算机技术领域。在芯片上配置参考时钟产生电路、毛刺检测电路和占空比检测电路中的至少一项。以便于后续基于参考时钟产生电路对芯片上的时钟信号的频率进行检测，从而避免了在对芯片上的时钟信号检测时需要额外通过模拟电路引出一个标准参考时钟，因此节省了芯片资源。此外，通过该芯片，还可以实现对同一芯片上的时钟信号包含的毛刺以及时钟信号的占空比的检测，提高了检测时钟信号的灵活性。
CN202080104997.9A 2020-11-30 2020-11-30 芯片及时钟检测方法 Pending CN116097106A (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/CN2020/132967 WO2022110235A1 (zh) 2020-11-30 2020-11-30 芯片及时钟检测方法

Publications (2)

Publication Number Publication Date
CN116097106A CN116097106A (zh) 2023-05-09
CN116097106A8 true CN116097106A8 (zh) 2024-05-28

Family

ID=81753939

Family Applications (1)

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CN202080104997.9A Pending CN116097106A (zh) 2020-11-30 2020-11-30 芯片及时钟检测方法

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CN (1) CN116097106A (zh)
WO (1) WO2022110235A1 (zh)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115334264B (zh) * 2022-08-17 2024-04-09 中国电子科技集团公司第四十四研究所 Cmos图像传感器片上时钟产生电路、模块及方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6794912B2 (en) * 2002-02-18 2004-09-21 Matsushita Electric Industrial Co., Ltd. Multi-phase clock transmission circuit and method
CN102223143A (zh) * 2010-04-16 2011-10-19 电信科学技术研究院 时钟信号保护的装置、方法及时钟检测补偿电路
CN103728516B (zh) * 2014-01-09 2016-05-11 福州瑞芯微电子股份有限公司 Soc芯片时钟检测电路
CN104133409B (zh) * 2014-08-07 2016-08-17 电子科技大学 一种对称性可调的三角波合成装置
CN105629772B (zh) * 2014-10-30 2019-05-07 深圳开阳电子股份有限公司 一种延时控制装置
CN107797442B (zh) * 2017-11-08 2023-06-23 广州安凯微电子股份有限公司 时间数字转换装置及数字锁相环

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Publication number Publication date
CN116097106A (zh) 2023-05-09
WO2022110235A1 (zh) 2022-06-02

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Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
CI02 Correction of invention patent application

Correction item: PCT international application to national stage day

Correct: 2023.03.10

False: 2023.03.09

Number: 19-01

Page: The title page

Volume: 39

Correction item: PCT international application to national stage day

Correct: 2023.03.10

False: 2023.03.09

Number: 19-01

Volume: 39

CI02 Correction of invention patent application