CN116015486A - Radio frequency device testing system, method and device - Google Patents
Radio frequency device testing system, method and device Download PDFInfo
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- CN116015486A CN116015486A CN202211685091.8A CN202211685091A CN116015486A CN 116015486 A CN116015486 A CN 116015486A CN 202211685091 A CN202211685091 A CN 202211685091A CN 116015486 A CN116015486 A CN 116015486A
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Abstract
A system, a method and a device for testing a radio frequency device are applied to the technical field of electronics and comprise testing equipment, a transceiver, a coupler and the radio frequency device. The test equipment is used for receiving a test command from the user interaction interface, generating a test command according to the test command and sending the test command to the transceiver, and determining the performance of the radio frequency device according to the coupling power signal from the transceiver; the transceiver is used for sending a transmitting power signal to the radio frequency device according to the test instruction and returning the coupling power signal from the coupler to the test equipment; the radio frequency device is used for carrying out radio frequency processing on the transmitting power signal and then sending the transmitting power signal to the coupler; the coupler is used for radiating out the radio-frequency processed transmitting power signal from the radio-frequency device and generating a coupling power signal to return to the transceiver. According to the scheme, the test command is automatically generated according to the test command and sent to the transceiver, so that the test efficiency can be improved, and the labor cost required by reliability test of the radio frequency device can be effectively reduced.
Description
Technical Field
The present invention relates to the field of electronic technologies, and in particular, to a system, a method, and an apparatus for testing a radio frequency device.
Background
With the rapid development of domestic terminal markets, there is an increasing demand for reliability testing of radio frequency devices in terminals. The reliability test of the radio frequency device in the research and development stage can be helpful for objectively evaluating the design quality, the material quality and the process quality of the radio frequency device; reliability testing of the radio frequency device during mass production can facilitate periodic assessment management of the quality of the radio frequency device.
At present, a test instruction is usually input manually so as to perform reliability test on the radio frequency device, and the method has the advantages of complex flow, low test efficiency and great consumption of manpower resources and time.
In summary, there is a need for a testing system for a radio frequency device to solve the problem that the testing efficiency is low because the radio frequency device in the prior art needs manual testing.
Disclosure of Invention
The invention provides a system, a method and a device for testing a radio frequency device, which are used for solving the problems that the radio frequency device in the prior art needs manual testing and has low testing efficiency.
In a first aspect, the present invention provides a radio frequency device testing system comprising a testing device, a transceiver, a coupler, and a radio frequency device. The transceiver is respectively connected with the testing equipment, the radio frequency device and the coupler, and the radio frequency device is also connected with the coupler; the test equipment is used for receiving a test command from the user interaction interface, generating a test command according to the test command, sending the test command to the transceiver, and determining the performance of the radio frequency device according to the coupling power signal from the transceiver; the transceiver is used for sending a transmitting power signal to the radio frequency device according to the test instruction and returning the coupling power signal from the coupler to the test equipment; the radio frequency device is used for carrying out radio frequency processing on the transmitting power signal and then sending the transmitting power signal to the coupler; and the coupler is used for radiating out the radio-frequency processed transmitting power signal from the radio-frequency device, generating a coupling power signal according to the radiated power signal and returning the coupling power signal to the transceiver.
In the above scheme, the test device may receive the test command from the user interface, generate a test command according to the test command, and then automatically send the generated test command to the transceiver. In contrast, the prior art requires a technician to manually input test instructions and then send the test instructions to the transceiver. However, in the reliability test of the rf device, the durability test is required for the rf device to be tested, and thus, the test command needs to be transmitted to the transceiver multiple times. The prior art requires a technician to manually input test instructions and send the instructions multiple times, which is time consuming and inefficient. According to the scheme, the test command is automatically generated according to the test command, and then the generated test command is automatically sent to the transceiver, so that the test efficiency can be improved, and the labor cost required by the reliability test of the radio frequency device is effectively reduced.
In an alternative way, the test device is further configured to, prior to generating the test instruction from the test command: transmitting a path instruction to the transceiver; the transceiver is also for: transmitting allowance power to the radio frequency device according to the access instruction, wherein the allowance power is positioned in the working power range of the radio frequency device; radio frequency device, still is used for: and opening a hardware path of the radio frequency device according to the margin power.
In the above scheme, before the test equipment generates the test instruction according to the test command, that is, before the test equipment performs the reliability test of the radio frequency device, it is further required to determine whether the radio frequency device can work normally. Thus, by the test equipment sending a path instruction to the transceiver, the transceiver sends a margin power to the radio frequency device in accordance with the path instruction such that the radio frequency device opens a hardware path. And then judging whether the radio frequency device can work normally or not through a return result received by the test equipment. According to the scheme, whether the radio frequency device can normally work or not is judged in advance, the radio frequency device which normally works can be screened out for further reliability test, and the test efficiency is improved.
In an alternative, in the case where the radio frequency device is a power amplifier: the test command comprises the transmission interval time of the test command, the cycle number of the test command and the gain switching coefficient of the power amplifier.
In the above scheme, when the radio frequency device is a power amplifier, the test command includes a transmission interval time of the test command, a cycle number of the test command, and a gain coefficient of the power amplifier. The transmission interval time of the test instruction can be used for indicating the frequency of the test instruction transmitted by the test equipment; the number of cycles of the test instruction may be used to represent the frequency with which the test instruction is sent by the test equipment; the power amplifier refers to the number of times the gain of the power amplifier (i.e., the radio frequency device) is switched.
In an alternative, the test device is specifically configured to: the performance of the radio frequency device is determined based on the coupled power signal and the transmit power signal from the transceiver, and a preset power threshold and a preset power consumption threshold.
In the above scheme, when the radio frequency device is a power amplifier, the test device compares the received coupling power signal and the transmitting power signal from the transceiver with a preset power threshold and a preset power consumption threshold, so that the performance of the power amplifier can be determined.
In an alternative way, in the case where the radio frequency device is a radio frequency switch: the test command includes an interval time of the test command, a cycle number of the test command, and a transmission path of the test command.
In the above scheme, when the radio frequency device is a radio frequency switch, the test command includes a transmission interval time of the test command, a cycle number of the test command, and a transmission path of the test command. The transmission interval time of the test instruction can be used for indicating the frequency of the test instruction transmitted by the test equipment; the number of cycles of the test instruction may be used to represent the frequency with which the test instruction is sent by the test equipment; the transmission path of the test instruction refers to the transmission path of the radio frequency switch.
In an alternative, the test device is specifically configured to: the performance of the radio frequency device is determined based on the register address from the transceiver and a preset register address.
In the above scheme, when the radio frequency device is a radio frequency switch, the test device compares the register address received from the transceiver with a preset register address, so that the performance of the radio frequency switch can be determined.
In an alternative, the test device is specifically adapted to: and generating a test instruction in a format corresponding to the chip type according to the chip type of the chip deployed by the radio frequency device.
In the scheme, the types of the chips deployed by the radio frequency device are different, and the formats of the test instructions which can be identified by the chips of different types are also different, so that the test instructions in the corresponding formats of the chip types are generated according to the types of the chips deployed by the radio frequency device, the test instructions can be accurately identified, and the radio frequency device can be tested.
In an alternative mode, the test device is further configured to receive the coupled power signals when the radio frequency device is located in different environments, and determine the performance of the radio frequency device according to the coupled power signals of the different environments.
In the scheme, the test equipment can determine the performance of the radio frequency devices in different environments by receiving the coupling power signals when the radio frequency devices are in different environments.
In a second aspect, the present invention provides a method for testing a radio frequency device, including a testing apparatus, a transceiver, a coupler, and a radio frequency device, the method comprising: receiving a test command from a user interaction interface through the test equipment; generating a test instruction by the test equipment according to the test command; transmitting a transmitting power signal to the radio frequency device through the transceiver according to the test instruction; performing radio frequency processing on the transmitting power signal through the radio frequency device; radiating the radio-frequency processed transmitting power signal through the coupler, and generating a coupling power signal according to the radiated power signal; receiving the coupling power signal through the transceiver and returning the coupling power signal to the test equipment; and determining the performance of the radio frequency device through the test equipment according to the coupling power signal.
Optionally, the method further comprises: transmitting a path instruction to the transceiver through a test device; transmitting margin power to the radio frequency device through the transceiver according to the path instruction, wherein the margin power is positioned in the working power range of the radio frequency device; and opening a hardware path of the radio frequency device through the radio frequency device according to the allowance power.
Optionally, in the case that the radio frequency device is a power amplifier: the test command comprises the sending interval time of the test command, the cycle number of the test command and the gain switching coefficient of the power amplifier.
Optionally, the determining, by the testing device, the performance of the radio frequency device according to the coupled power signal includes: and determining the performance of the radio frequency device through the test equipment according to the coupling power signal and the transmitting power signal, and a preset power threshold value and a preset power consumption threshold value.
Optionally, in the case that the radio frequency device is a radio frequency switch: the test command comprises the interval time of the test command, the cycle number of the test command and the transmission path of the test command.
Optionally, the determining, by the testing device, the performance of the radio frequency device according to the coupled power signal includes: and determining the performance of the radio frequency device according to the received register address of the radio frequency device and a preset register address.
Optionally, the generating, by the test device, a test instruction according to the test command includes: and generating the test instruction in a format corresponding to the chip type through the test equipment according to the test command and the chip type of the chip deployed by the radio frequency device.
Optionally, the method further comprises: and receiving coupling power signals of the radio frequency device in different environments through the test equipment, and determining the performance of the radio frequency device according to the coupling power signals of the different environments.
In a third aspect, the present invention provides a radio frequency device testing apparatus, the radio frequency deviceThe test device includes: an acquisition unit configured to acquire the data of the object,for use inAcquiring a test command from a user interaction interface; the processing unit is used for generating a test instruction according to the test command; transmitting a transmitting power signal to the radio frequency device according to the test instruction; performing radio frequency processing on the transmitting power signal; radiating the radio-frequency processed transmitting power signal, and generating a coupling power signal according to the radiated power signal; the coupling power signal is received and returned to the test equipment; and determining the performance of the radio frequency device according to the coupling power signal.
Optionally, the processing unit is specifically configured to send a path instruction to the transceiver through a test device; transmitting margin power to the radio frequency device through the transceiver according to the path instruction, wherein the margin power is positioned in the working power range of the radio frequency device; and opening a hardware path of the radio frequency device through the radio frequency device according to the allowance power.
Optionally, in the case that the radio frequency device is a power amplifier: the test command comprises the sending interval time of the test command, the cycle number of the test command and the gain switching coefficient of the power amplifier.
Optionally, the processing unit is specifically configured to determine, according to the coupling power signal and the transmitting power signal, and a preset power threshold and a preset power consumption threshold, performance of the radio frequency device through the test device.
Optionally, in the case that the radio frequency device is a radio frequency switch: the test command comprises the interval time of the test command, the cycle number of the test command and the transmission path of the test command.
Optionally, the processing unit is specifically configured to determine the performance of the radio frequency device according to the received register address of the radio frequency device and a preset register address.
Optionally, the processing unit is specifically configured to generate, by using the test device, the test instruction in a format corresponding to the chip type according to the test command and the chip type of the chip to which the radio frequency device is deployed.
Optionally, the processing unit is specifically configured to receive, through the test device, the coupling power signals when the radio frequency device is located in different environments, and determine the performance of the radio frequency device according to the coupling power signals in different environments.
In a fourth aspect, the present invention provides a computing device comprising at least one processor and at least one memory, wherein the memory stores a computer program which, when executed by the processor, causes the processor to perform the method of testing a radio frequency device of any of the second aspects above.
In a fifth aspect, the present invention also provides a computer readable storage medium storing a program which, when run on a computer, causes the computer to implement the method for testing a radio frequency device as described in any of the second aspects above.
The beneficial effects of the second aspect to the fifth aspect are specifically referred to the technical effects that can be achieved by the corresponding designs in the first aspect, and the detailed description is not repeated here.
Drawings
In order to more clearly illustrate the technical solutions of the present invention, the drawings that are needed in the description of the embodiments will be briefly described below, it being obvious that the drawings in the following description are only some embodiments of the present invention, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
Fig. 1 is a schematic diagram of an application scenario of a radio frequency device testing system provided by the present invention;
FIG. 2 is a schematic diagram of a system for testing RF devices according to the present invention;
FIG. 3 is a schematic diagram of a system for testing a RF device when the RF device is a power amplifier;
FIG. 4 is a schematic diagram of a system for testing a RF device when the RF device is an RF switch;
FIG. 5 is a schematic diagram of a testing device for a radio frequency device according to an embodiment of the present invention;
fig. 6 is a schematic structural diagram of a computing device according to an embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention will be described in further detail below with reference to the accompanying drawings, and it is apparent that the described embodiments are only some embodiments of the present invention, not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
A radio frequency device refers to a device for processing radio frequency signals. Wherein radio frequency signals, i.e. high frequency electrical signals, are typically in the frequency range of several megahertz to several gigahertz. Common radio frequency devices include power amplifiers, radio frequency switches, and the like, and are widely used in various communication devices, such as cellular phones, wireless network routers, satellite communication systems, and the like.
As described in the background art, the reliability test of the rf device at the present stage usually uses a manner of manually inputting a test instruction, and the method has a complex flow, low test efficiency and consumes a great amount of manpower resources and time.
In view of this, the embodiment of the invention provides a system for testing a radio frequency device, which is used for solving the problems that in the prior art, the radio frequency device needs manual testing and the testing efficiency is low.
Fig. 1 is a schematic diagram of an application scenario of a radio frequency device testing system according to an embodiment of the present invention. The application scenario includes a test device 101 and a device under test 102. Wherein the test device 101 may be in communication with the device under test 102, e.g., the test device 101 is communicatively coupled to at least one device under test 102. Illustratively, the test device 101 may communicate with the device under test 102 via a universal serial bus (universal serial bus, USB) connection.
Specifically, the device under test 102 includes a radio frequency device. The device under test 102 may be a mobile terminal such as a mobile phone, a personal computer (personal computer, PC), a tablet (PAD), a palm computer (Personal Digital Assistant, PDA), etc.
The test equipment 101 is configured to receive a test command from the user interface, generate a test command according to the test command, send the test command to the device under test 102, and determine the performance of the radio frequency device according to the result returned by the device under test 102.
Specifically, the test device 101 may be a terminal device such as a mobile phone, a personal computer, a tablet computer, a palm computer, a notebook computer, and the like. The terminal device 101 may have a radio frequency test program installed therein, or the terminal device 101 may have a browser application running therein, or the terminal device 101 may have an applet application running therein, and the applet application may have a radio frequency test program running therein.
Fig. 2 is a schematic diagram of a radio frequency device testing system according to an embodiment of the present invention. The radio frequency device testing system comprises a testing device 201, a transceiver 202, a radio frequency device 203 and a coupler 204. Wherein, in conjunction with fig. 1, the device under test 102 includes a transceiver 202, a radio frequency device 203, and a coupler 204. In detail, the transceiver 202 is connected to the test device 201, the radio frequency device 203, and the coupler 204, respectively, and the radio frequency device 203 is also connected to the coupler 204.
In the above example, the test device 201 is configured to receive a test command from the user interface, generate a test instruction according to the test command, send the test instruction to the transceiver 202, and determine the performance of the radio frequency device according to the coupled power signal from the transceiver 202.
The transceiver 202 is configured to receive a test instruction sent by the test device 201, send a corresponding transmit power signal to the radio frequency device 203 according to the test instruction, and return a coupled power signal from the coupler 204 to the test device 201;
the radio frequency device 203 is configured to perform radio frequency processing on a transmission power signal sent by the radio frequency device 203, and send the processed transmission power signal to the coupler 204;
the coupler 204 is configured to radiate the rf processed transmit power signal from the rf device 203, and generate a coupled power signal according to the radiated power signal, and return the coupled power signal to the transceiver 202.
In one possible embodiment, the rf device testing system further includes an antenna 205, the antenna 205 being coupled to the coupler 204 for radiating signals from the coupler 204.
In the above scheme, the test device may receive the test command from the user interface, generate a test command according to the test command, and then automatically send the generated test command to the transceiver. In contrast, the prior art requires a technician to manually input test instructions and then send the test instructions to the transceiver. However, in the reliability test of the rf device, the durability test is required for the rf device to be tested, and thus, the test command needs to be transmitted to the transceiver multiple times. The prior art requires a technician to manually input test instructions and send the instructions multiple times, which is time consuming and inefficient. According to the scheme, the test command is automatically generated according to the test command, and then the generated test command is automatically sent to the transceiver, so that the test efficiency can be improved, and the labor cost required by the reliability test of the radio frequency device is effectively reduced.
In a possible embodiment, the test device 201 is further configured to, prior to generating the test instruction according to the test command: transmitting a path instruction to transceiver 202;
specifically, before the test device generates a test instruction according to the test command, that is, before the test device performs the reliability test of the radio frequency device, it is further required to determine whether the radio frequency device can normally operate. Thus, the test equipment 201 sends a path instruction to the transceiver 202 causing the transceiver 202 to transmit the margin power of the radio frequency device, thereby opening the hardware path of the radio frequency device.
Wherein, the hardware path of the radio frequency device refers to a physical circuit for transmitting, amplifying or detecting radio frequency signals. The hardware pathways may be a combination of physical structures of electronic components, circuit boards, connectors, antennas, and the like. These physical structures are typically used to perform the functions of radio frequency devices, such as amplifying signals, filtering signals, combining signals, and the like. The hardware paths of the radio frequency devices can be divided into two main categories: single ended and differential paths. The single-ended path refers to a path that takes a single-ended signal as input and output. The differential path is a path to which differential signals are input and output.
The transceiver 202 is also configured to: transmitting margin power to the radio frequency device 203 according to the path instruction, wherein the margin power is within the working power range of the radio frequency device 203;
Specifically, transceiver 202 transmits margin power to radio frequency device 203 in accordance with the received path instructions such that radio frequency device 203 opens a hardware path, and transceiver 202 receives the coupling power of coupler 204, returning a coupling power signal from coupler 204 to test equipment 201.
The radio frequency device 203 is also for: and opening a hardware path of the radio frequency device according to the margin power.
Thereafter, the test device 201 may determine whether the rf device 203 may operate properly by receiving the coupling power signal from the coupler 204 returned by the transceiver 202. In the embodiment of the invention, whether the radio frequency device can normally work or not is judged first, and the normally working radio frequency device can be screened out for further reliability test, so that the test efficiency is improved.
In one possible implementation, the radio frequency device may be a power amplifier. Power amplifiers are used to boost the level of an input power signal and convert it to a larger output power signal, and are widely used in industrial systems. In the reliability test of the power amplifier, whether the performance of the power amplifier meets the standard can be judged according to the ratio of the power received by the power amplifier to the power transmitted by the power amplifier and compared with a preset power threshold, and whether the performance of the power amplifier meets the standard can be judged by calculating the power consumption of the power amplifier and comparing with the preset power threshold.
Fig. 3 is a schematic diagram of a radio frequency device testing system when the radio frequency device is a power amplifier according to an embodiment of the present invention. The radio frequency device testing system comprises a testing device 301, a transceiver 302, a power amplifier 303 and a coupler 304. The transceiver 302 is connected to the test device 301, the power amplifier 303, and the coupler 304, and the power amplifier 303 is also connected to the coupler 304.
In the above example, the test device 301 is configured to receive a test command from the user interface, generate a test instruction according to the test command, send the test instruction to the transceiver, and determine the performance of the power amplifier 303 according to the coupling power signal and the transmitting power signal from the transceiver 302, and the preset power threshold and the preset power consumption threshold. Wherein the coupled power signal may be used to represent the power transmitted by the power amplifier. The test device 301 may determine the power consumption of the power amplifier from the received coupled power signal and the transmit power signal.
Optionally, the test command includes a transmission interval time of the test command, a cycle number of the test command, and a gain switching coefficient of the power amplifier. The transmission interval time of the test instruction can be used for indicating the frequency of the test instruction transmitted by the test equipment; the number of cycles of the test instruction may be used to represent the frequency with which the test instruction is sent by the test equipment; the power amplifier refers to the number of times the gain of the power amplifier (i.e., the radio frequency device) is switched.
In one possible implementation, whether the power amplifier is up to performance can be determined by determining the ratio of the power received by the power amplifier to the power transmitted by the power amplifier and the power consumption of the power amplifier at the same time. For example, the preset power threshold may be set to ±1.5dB of the power value of the transmission power signal, and the preset power consumption threshold may be set to 50mA. When the power value of the coupling power signal received by the test device 301 is within ±1.5dB of the power value of the transmitting power signal, and the power consumption of the power amplifier is within 50mA according to the calculated difference between the power consumption of the power amplifier and the single test report value from the manufacturing plant of the power amplifier, the performance of the power amplifier is determined to reach the standard.
The detailed description of transceiver 302 may be found in relation to transceiver 202 described above, and will not be repeated here.
The detailed description of the coupler 304 may be found in the transceiver 202 described above, and will not be repeated here.
In the above scheme, when the radio frequency device is a power amplifier, the test device compares the received coupling power signal and the transmitting power signal from the transceiver with a preset power threshold and a preset power consumption threshold, so that the performance of the power amplifier can be determined.
In one possible embodiment, the rf device testing system further includes an antenna 305, the antenna 305 being coupled to the coupler 304 for radiating signals from the coupler 304.
In one possible embodiment, the radio frequency device may be a radio frequency switch. A radio frequency switch is a switch used to control radio frequency signals. It may control the transmission of radio frequency signals by turning on or off the circuit. Such switches are commonly used in radio devices, such as cell phones and wireless network routers, for the transmission and reception of control signals. The radio frequency switch may be used to increase the energy efficiency of the device and to protect the circuitry from interference. Reliability testing of radio frequency switches may also be referred to as mobile industry processor interface (Mobile Industry Processor Interface, MIPI) device testing. MIPI is an interface standard specifically designed for mobile devices for connecting various components, including processors, displays, cameras, and storage devices, in smartphones, tablet computers, and other mobile devices. The MIPI interface standard can provide high-speed, low-power consumption and high-reliability data transmission, and thus is widely used in mobile devices.
In the reliability test of the radio frequency switch, whether the performance of the radio frequency switch meets the standard can be judged according to the register address of the read radio frequency switch and compared with a preset register address. The register of the radio frequency switch is a memory for controlling the state of the radio frequency switch. It can be used to store the on or off state of the radio frequency switch and to modify the state of the radio frequency switch when required. The register of the radio frequency switch is typically comprised of one or more chips containing a number of programmable memory cells. These memory cells may be programmed to an on or off state to control the state of the radio frequency switch. The registers of the radio frequency switch are typically composed of one or more inputs and one or more outputs. The input end is used for receiving external control signals, and the output end is used for outputting control signals. The registers of the radio frequency switch may be implemented using various techniques, such as CMOS, TTL, FPGA, etc. Their type and performance depend on the technology and design used.
Fig. 4 is a schematic diagram of a radio frequency device testing system when the radio frequency device is a radio frequency switch according to an embodiment of the present invention. The radio frequency device testing system comprises a testing device 401, a transceiver 402, a radio frequency switch 403 and a coupler 404. The transceiver 402 is respectively connected with the test device 401, the radio frequency switch 403 and the coupler 404, and the radio frequency switch 403 is also connected with the coupler 404.
In the above example, the test device 401 is configured to receive a test command from the user interface, generate a test instruction according to the test command, send the test instruction to the transceiver 402, and determine the performance of the radio frequency switch 403 according to the register address from the transceiver and the preset register address.
Optionally, the test command includes an interval time of the test command, a cycle number of the test command, and a transmission path of the test command. The transmission interval time of the test instruction can be used for indicating the frequency of the test instruction transmitted by the test equipment; the number of cycles of the test instruction may be used to represent the frequency with which the test instruction is sent by the test equipment; the transmission path of the test instruction refers to the transmission path of the radio frequency switch.
In one possible implementation manner, whether the performance of the radio frequency switch meets the standard can be judged by judging whether the read register address of the radio frequency switch is consistent with the preset register address. The preset register address may be a register address in a specification of the radio frequency switch. When the read register address of the radio frequency switch is consistent with a preset register address, judging that the performance of the radio frequency switch meets the standard; when the read register address of the radio frequency switch is inconsistent with the preset register address, judging that the performance of the radio frequency switch does not reach the standard.
In an alternative, the test device is specifically adapted to: and generating a test instruction in a format corresponding to the chip type according to the chip type of the chip deployed by the radio frequency device.
Illustratively, when the type of chip is a concurrency (MTK) chip, the test instructions are in a format beginning with AT instructions. An AT command is a command for controlling a terminal device (e.g., a module) of a chip type MTK chip, and can control the terminal device to perform various operations by setting various parameters in the command.
Illustratively, when the type of chip is a high-pass chip, the test instructions are in a format beginning with the diags instructions. The diags instruction is a command for controlling a terminal device (e.g., a module) of which chip type is a high-pass chip, and can control the terminal device to perform various operations by setting various parameters in the instruction.
In the scheme, the types of the chips deployed by the radio frequency device are different, and the formats of the test instructions which can be identified by the chips of different types are also different, so that the test instructions in the format corresponding to the types of the chips are generated according to the types of the chips deployed by the radio frequency device, the test instructions can be accurately identified, and the radio frequency device can be tested.
In one possible embodiment, the rf device testing system further includes an antenna 405, where the antenna 405 is coupled to the coupler 404 for radiating signals from the coupler 404.
In an alternative manner, the test device is further configured to receive the coupled power signals when the radio frequency device is located in different environments, and determine the performance of the radio frequency device according to the coupled power signals of the different environments.
Specifically, the test equipment can be respectively placed in three environments of normal temperature 26 degrees, high temperature 55 degrees and low temperature-10 degrees to perform reliability test for 48 hours, and whether the performance of the test equipment meets the standards is judged.
In the scheme, the test equipment can determine the performance of the radio frequency devices in different environments by receiving the coupling power signals when the radio frequency devices are in different environments.
Based on the same inventive concept, the invention also provides a radio frequency device testing device, which can execute the system and the method in the embodiment of the invention. The structure of the radio frequency device testing device provided by the invention can be seen in fig. 5. The radio frequency device testing apparatus 500 comprises an acquisition unit 501 and a processing unit 502. The acquiring unit 501 is configured to acquire a test command from a user interaction interface; a processing unit 502, configured to generate a test instruction according to the test command; transmitting a transmitting power signal to the radio frequency device according to the test instruction; performing radio frequency processing on the transmitting power signal; radiating the radio-frequency processed transmitting power signal, and generating a coupling power signal according to the radiated power signal; the coupling power signal is received and returned to the test equipment; and determining the performance of the radio frequency device according to the coupling power signal.
The above-mentioned more detailed descriptions of the acquiring unit 501 and the processing unit 502 may be directly obtained by referring to the related descriptions in the method embodiment shown in fig. 2, and will not be described in detail herein.
Based on the same technical concept, the present invention also provides a computing device, as shown in fig. 6, where the computing device 600 includes at least one processor 601 and a memory 602 connected to the at least one processor, and the specific connection medium between the processor 601 and the memory 602 is not limited in the present invention, and in fig. 6, the connection between the processor 601 and the memory 602 is exemplified by a bus. The buses may be divided into address buses, data buses, control buses, etc.
In the present invention, the memory 602 stores instructions executable by the at least one processor 601, and the at least one processor 601 can perform the steps included in the aforementioned method for testing a radio frequency device by executing the instructions stored in the memory 602.
Where the processor 601 is the control center of the computing device, various interfaces and lines may be utilized to connect various portions of the computing device, through execution or execution of instructions stored in the memory 602 and invocation of data stored in the memory 602, to effect the testing of the radio frequency device. Alternatively, processor 601 may include one or more processing units, and processor 601 may integrate an application processor that primarily processes operating systems, user interfaces, application programs, etc., and a modem processor that primarily processes issuing instructions. It will be appreciated that the modem processor described above may not be integrated into the processor 601. In some embodiments, processor 601 and memory 602 may be implemented on the same chip, or they may be implemented separately on separate chips in some embodiments.
The processor 601 may be a general purpose processor such as a central processing unit (Central Processing Unit, CPU), digital signal processor, application specific integrated circuit (Application Specific Integrated Circuit, ASIC), field programmable gate array or other programmable logic device, discrete gate or transistor logic, discrete hardware components, that can implement or perform the methods, steps, and logic blocks disclosed in the present invention. The general purpose processor may be a microprocessor or any conventional processor or the like. The steps of a method disclosed in connection with a radio frequency device testing embodiment may be embodied directly in a hardware processor for execution, or in a combination of hardware and software modules in the processor.
The memory 602 is a non-volatile computer readable storage medium that can be used to store non-volatile software programs, non-volatile computer executable programs, and modules. The Memory 602 may include at least one type of storage medium, which may include, for example, flash Memory, hard disk, multimedia card, card Memory, random access Memory (Random Access Memory, RAM), static random access Memory (Static Random Access Memory, SRAM), programmable Read-Only Memory (Programmable Read Only Memory, PROM), read-Only Memory (ROM), charged erasable programmable Read-Only Memory (Electrically Erasable Programmable Read-Only Memory), magnetic Memory, magnetic disk, optical disk, and the like. Memory 602 is any other medium that can be used to carry or store desired program code in the form of instructions or data structures and that can be accessed by a computer, but is not limited to such. The memory 602 in the present invention may also be circuitry or any other device capable of performing storage functions for storing program instructions and/or data.
Based on the same technical idea, the present invention also provides a computer-readable storage medium storing a computer program executable by a computing device, which when run on the computing device, causes the computing device to perform the steps of the above-described radio frequency device testing method.
It will be appreciated by those skilled in the art that embodiments of the present application may be provided as a method, system, or computer program product. Accordingly, the present application may take the form of an entirely hardware embodiment, an entirely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, the present application may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein.
The present application is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems) and computer program products according to the application. It will be understood that each flow and/or block of the flowchart illustrations and/or block diagrams, and combinations of flows and/or blocks in the flowchart illustrations and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
It will be apparent to those skilled in the art that various modifications and variations can be made in the present application without departing from the spirit or scope of the application. Thus, if such modifications and variations of the present application fall within the scope of the claims and the equivalents thereof, the present application is intended to cover such modifications and variations.
Claims (19)
1. The radio frequency device testing system is characterized by comprising testing equipment, a transceiver, a coupler and a radio frequency device, wherein the transceiver is respectively connected with the testing equipment, the radio frequency device and the coupler, and the radio frequency device is also connected with the coupler;
the test equipment is used for receiving a test command from a user interaction interface, generating a test command according to the test command, sending the test command to the transceiver, and determining the performance of the radio frequency device according to a coupling power signal from the transceiver;
the transceiver is used for sending a transmitting power signal to the radio frequency device according to the test instruction and returning a coupling power signal from the coupler to the test equipment;
the radio frequency device is used for carrying out radio frequency processing on the transmitting power signal and then sending the transmitting power signal to the coupler;
the coupler is used for radiating the radio-frequency processed transmitting power signal from the radio-frequency device, generating a coupling power signal according to the radiated power signal and returning the coupling power signal to the transceiver.
2. The system of claim 1, wherein,
The test equipment is further configured to, before generating the test instruction according to the test command:
transmitting a path instruction to the transceiver;
the transceiver is also for:
transmitting allowance power to the radio frequency device according to the access instruction, wherein the allowance power is positioned in the working power range of the radio frequency device;
the radio frequency device is further configured to:
and opening a hardware path of the radio frequency device according to the allowance power.
3. The system of claim 1, wherein in the case where the radio frequency device is a power amplifier:
the test command comprises the sending interval time of the test command, the cycle number of the test command and the gain switching coefficient of the power amplifier.
4. The system of claim 3, wherein the system comprises,
the test equipment is specifically used for: and determining the performance of the radio frequency device according to the coupling power signal and the transmitting power signal from the transceiver and a preset power threshold and a preset power consumption threshold.
5. The system of claim 1, wherein, in the case where the radio frequency device is the radio frequency switch:
the test command comprises the interval time of the test command, the cycle number of the test command and the transmission path of the test command.
6. The system of claim 5, wherein,
the test equipment is specifically used for: and determining the performance of the radio frequency device according to the register address from the transceiver and a preset register address.
7. The system according to claim 1, wherein the test device is specifically configured to:
and generating the test instruction in a format corresponding to the chip type according to the chip type of the chip deployed by the radio frequency device.
8. The system of claim 1, wherein,
the test equipment is also used for receiving the coupling power signals when the radio frequency device is located in different environments, and determining the performance of the radio frequency device according to the coupling power signals of the different environments.
9. A method for testing a radio frequency device, comprising a test device, a transceiver, a coupler, and a radio frequency device, the method comprising:
receiving a test command from a user interaction interface through the test equipment;
generating a test instruction by the test equipment according to the test command;
transmitting a transmitting power signal to the radio frequency device through the transceiver according to the test instruction;
performing radio frequency processing on the transmitting power signal through the radio frequency device;
Radiating the radio-frequency processed transmitting power signal through the coupler, and generating a coupling power signal according to the radiated power signal;
receiving the coupling power signal through the transceiver and returning the coupling power signal to the test equipment;
and determining the performance of the radio frequency device through the test equipment according to the coupling power signal.
10. The method of claim 9, wherein the method further comprises, prior to generating test instructions by the test equipment in accordance with the test command:
transmitting a path instruction to the transceiver through a test device;
transmitting margin power to the radio frequency device through the transceiver according to the path instruction, wherein the margin power is positioned in the working power range of the radio frequency device;
and opening a hardware path of the radio frequency device through the radio frequency device according to the allowance power.
11. The method of claim 9, wherein in the case where the radio frequency device is a power amplifier:
the test command comprises the sending interval time of the test command, the cycle number of the test command and the gain switching coefficient of the power amplifier.
12. The method of claim 11, wherein said determining, by said test device, performance of said radio frequency device based on said coupled power signal comprises:
and determining the performance of the radio frequency device through the test equipment according to the coupling power signal and the transmitting power signal, and a preset power threshold value and a preset power consumption threshold value.
13. The method of claim 9, wherein in the case where the radio frequency device is a radio frequency switch:
the test command comprises the interval time of the test command, the cycle number of the test command and the transmission path of the test command.
14. The method of claim 13, wherein said determining, by said test device, performance of said radio frequency device based on said coupled power signal comprises:
and determining the performance of the radio frequency device according to the received register address of the radio frequency device and a preset register address.
15. The method of claim 9, wherein generating, by the test device, a test instruction in accordance with the test command comprises:
and generating the test instruction in a format corresponding to the chip type through the test equipment according to the test command and the chip type of the chip deployed by the radio frequency device.
16. The method according to claim 9, wherein the method further comprises:
and receiving coupling power signals of the radio frequency device in different environments through the test equipment, and determining the performance of the radio frequency device according to the coupling power signals of the different environments.
17. A radio frequency device testing apparatus, comprising:
the acquisition unit is used for acquiring the test command from the user interaction interface; the processing unit is used for generating a test instruction according to the test command; transmitting a transmitting power signal to the radio frequency device according to the test instruction; performing radio frequency processing on the transmitting power signal; radiating the radio-frequency processed transmitting power signal, and generating a coupling power signal according to the radiated power signal; the coupling power signal is received and returned to the test equipment; and determining the performance of the radio frequency device according to the coupling power signal.
18. A computing device comprising at least one processor and at least one memory, wherein the memory stores a computer program that, when executed by the processor, causes the processor to perform the method of any of claims 9 to 16.
19. A computer readable storage medium, characterized in that the storage medium stores a program which, when run on a computer, causes the computer to implement the method of performing any one of claims 9 to 16.
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| CN202211685091.8A CN116015486A (en) | 2022-12-27 | 2022-12-27 | Radio frequency device testing system, method and device |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117395707A (en) * | 2023-12-11 | 2024-01-12 | 深圳市天龙世纪科技发展有限公司 | MTK coupling test method, system and medium |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117395707A (en) * | 2023-12-11 | 2024-01-12 | 深圳市天龙世纪科技发展有限公司 | MTK coupling test method, system and medium |
| CN117395707B (en) * | 2023-12-11 | 2024-03-19 | 深圳市天龙世纪科技发展有限公司 | MTK coupling test method, system and medium |
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