CN115981937A - Memory automatic testing method and system based on hybrid cloud - Google Patents
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Abstract
An embodiment of the present specification provides a memory automated testing method and system based on a hybrid cloud, which belong to the field of memory automated testing, wherein the system includes: the system comprises a memory management module and a local test end module which are deployed on public cloud; the local test end module comprises at least one local test end; the local testing terminal comprises a local testing server and at least one testing device, the memory to be tested is installed on the testing device, the local testing server is in communication connection with the memory management module, the local testing server is used for downloading a testing strategy from the memory management module, the testing device is used for downloading the testing strategy from the local testing server and testing the memory to be tested according to the testing strategy to obtain testing data, and the testing device is also used for sending the testing data to the local testing server; the local test server is also used for sending the test data to the memory management module, and has the advantages of realizing the automatic test of the memory and improving the test efficiency.
Description
Technical Field
The present disclosure relates to the field of automated testing of memories, and in particular, to an automated testing method and system for memories based on a hybrid cloud.
Background
With the increase of the digitization degree, the requirements of the server and the storage device are more and more, and the reliability of the memory in the device directly influences the reliability of the whole device. The large memory requirements and advanced manufacturing processes place higher demands on memory testing. The conventional testing methods for memory are mainly divided into two types, one is testing on a BIOS (Basic Input Output System), and the other is testing under an operating System (e.g., windows, linux, etc.). However, the existing testing methods can be completed only by manual intervention, and the memory testing efficiency is low.
Therefore, it is desirable to provide a method and a system for automatically testing a memory based on a hybrid cloud, which are used to implement automatic testing of a memory and improve testing efficiency.
Disclosure of Invention
One of the embodiments of the present specification provides a hybrid cloud-based automated memory test system, where the system includes: the system comprises a memory management module and a local test end module which are deployed on public cloud; the local test end module comprises at least one local test end; the local testing terminal comprises a local testing server and at least one testing device, a memory to be tested is installed on the testing device, the local testing server is in communication connection with the memory management module, the local testing server is used for downloading a testing strategy from the memory management module, the testing device is used for downloading the testing strategy from the local testing server and testing the memory to be tested according to the testing strategy to obtain testing data, and the testing device is also used for sending the testing data to the local testing server; the local test server is also used for sending the test data to the memory management module.
In some embodiments, the establishing, by the local test server, a communication connection with the memory management module includes: the local test server sends a communication connection request; and the memory management module verifies and authenticates the local test server based on the communication connection request, and establishes communication connection with the local test server.
In some embodiments, the establishing, by the local test server, a communication connection with the memory management module includes: and the local test server establishes communication connection with the memory management module through a secret key.
In some embodiments, the local test server downloads the test policy from the memory management module, including: and the local test server downloads the test strategy corresponding to the memory to be tested from the memory management module according to the serial number of the test equipment.
In some embodiments, the test strategy includes at least a test script, a test algorithm tool, a test round, and test write data.
In some embodiments, the testing device tests the memory to be tested according to the testing policy, including: when the test device executes the test script, setting BIOS parameters, and then automatically performing cold restart; after the test equipment is cold restarted, executing a test algorithm carried by the BIOS based on the test strategy in a BIOS starting stage; after the test equipment executes the test algorithm carried by the BIOS, the test equipment enters an operating system; and after the test equipment enters the operating system, executing a test algorithm under the operating system based on the test strategy.
In some embodiments, the memory management module is further configured to: and analyzing the test data to determine a fault analysis result, wherein the fault analysis result at least comprises algorithm effectiveness, fault distribution and/or fault temperature distribution.
In some embodiments, the system further comprises an information display module for visualizing the test strategy and/or the test data.
One embodiment of the present specification provides a hybrid cloud-based automated memory testing method, including: establishing a communication connection, wherein the communication connection is used for interacting with a memory management module deployed on a public cloud; downloading a test strategy, wherein the test strategy is stored in the memory management module; distributing the test strategy, wherein the test strategy is used for testing the memory to be tested; and receiving test data, wherein the test data is uploaded by the test equipment where the memory to be tested is located.
In some embodiments, the downloading a test policy comprises: and downloading the test strategy corresponding to the memory to be tested according to the serial number of the test equipment.
One embodiment of the present specification provides a hybrid cloud-based automated memory testing method, including: downloading a test strategy, wherein the test strategy is obtained by a local test server from a memory management module deployed on a public cloud; testing the memory to be tested based on the testing strategy to obtain testing data; and uploading the test data.
In some embodiments, the testing the memory to be tested based on the testing policy includes: when the test script is executed, setting BIOS parameters, and then automatically cold restarting; after the cold restart, executing a test algorithm carried by the BIOS based on the test strategy in the BIOS starting stage; after the BIOS self-contained test algorithm is executed, the operating system is entered; and after the operating system is entered, executing a test algorithm under the operating system based on the test strategy.
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The present description will be further explained by way of exemplary embodiments, which will be described in detail by way of the accompanying drawings. These embodiments are not intended to be limiting, and in these embodiments like numerals are used to indicate like structures, wherein:
FIG. 1 is a block diagram of a hybrid cloud-based memory automation test system in accordance with some embodiments of the present description;
FIG. 2 is a block diagram of a hybrid cloud-based memory automation test system in accordance with some embodiments of the present description;
fig. 3 is a schematic flow diagram of a hybrid cloud-based automated memory testing method according to some embodiments of the present disclosure;
FIG. 4 is a schematic flow chart diagram illustrating a hybrid cloud-based automated memory testing method in accordance with some embodiments of the present disclosure;
fig. 5 is an interaction diagram of a hybrid cloud-based memory automation testing system according to some embodiments of the present description.
Detailed Description
In order to more clearly illustrate the technical solutions of the embodiments of the present disclosure, the drawings used in the description of the embodiments will be briefly described below. It is obvious that the drawings in the following description are only examples or embodiments of the present description, and that for a person skilled in the art, the present description can also be applied to other similar scenarios on the basis of these drawings without inventive effort. Unless otherwise apparent from the context, or otherwise indicated, like reference numbers in the figures refer to the same structure or operation.
It should be understood that "system", "apparatus", "unit" and/or "module" as used herein is a method for distinguishing different components, elements, parts, portions or assemblies at different levels. However, other words may be substituted by other expressions if they accomplish the same purpose.
As used in this specification and the appended claims, the terms "a," "an," "the," and/or "the" are not to be taken in a singular sense, but rather are to be construed to include a plural sense unless the context clearly dictates otherwise. In general, the terms "comprises" and "comprising" merely indicate that steps and elements are included which are explicitly identified, that the steps and elements do not form an exclusive list, and that a method or apparatus may include other steps or elements.
Flowcharts are used in this specification to illustrate the operations performed by the system according to embodiments of the present specification. It should be understood that the preceding or following operations are not necessarily performed in the exact order in which they are performed. Rather, the steps may be processed in reverse order or simultaneously. Meanwhile, other operations may be added to the processes, or a certain step or several steps of operations may be removed from the processes.
Fig. 1 is a block diagram of a hybrid cloud-based memory automated testing system according to some embodiments of the present disclosure, and as shown in fig. 1, a hybrid cloud-based memory automated testing system may include a memory management module and a local testing end module, which are deployed on a public cloud, where the local testing end module includes at least one local testing end, the local testing end includes a local testing server and at least one testing device, a memory to be tested is installed on the testing device, and the testing device may perform data interaction with the local testing server through a switch.
The memory to be tested can be classified into a main memory and an auxiliary memory according to purposes; the memory to be tested can be classified into a Read Only Memory (ROM), a Random Access Memory (RAM) and a Cache memory (Cache) according to the working principle, wherein the RAM can be divided into a Dynamic Random Access Memory (DRAM) and a Static Random Access Memory (SRAM); the memory to be tested can be classified into a Synchronous Dynamic Random Access Memory (SDRAM), a double-rate synchronous dynamic random access memory (DDR SDRAM), a DDR2 SDRAM, a DDR3 SDRAM and a DDR4 SDRAM according to the memory technical standard; the memories to be tested can be classified into extended memories, high-end memory areas, upper memories and shadow memories according to system logic. The memory to be tested may also be Static Random Access Memory (SRAM), RDRAM, XDR RAM, ferroelectric memory (Fe-RAM), magnetic memory (MRAM), phase change memory (OUM).
The local test server may establish a communication connection with the memory management module.
Fig. 5 is an interaction diagram of a hybrid cloud-based memory automation test system according to some embodiments of the present disclosure, as shown in fig. 5, in some embodiments, a local test server establishes a communication connection with a memory management module, including:
the local test server sends a communication connection request, for example, the communication connection request may be an http request with authentication and a corresponding work order number;
the memory management module verifies and authenticates the local test server based on the communication connection request, after the verification and the authentication are passed, the memory management module can establish communication connection with the local test server, and if the verification and/or the authentication are not passed, the memory management module does not establish communication connection with the local test server.
In some embodiments, the local test server may establish a communication connection with the memory management module through the key.
It can be understood that the test strategies for testing different memories to be tested may be different, and therefore, the memory management module may store a plurality of test strategies. In some embodiments, the memory management module may issue a corresponding test policy to the local test server according to the work order number.
In some embodiments, the local test server may download the test policy corresponding to the memory to be tested from the memory management module according to a Serial Number (Serial Number) of the test device. For example, after the communication connection is established, the local test server may send the serial number of the connected test device to the memory management module, and the memory management module distributes the test policy corresponding to the serial number of the test device to the local test server.
In some embodiments, the test strategy includes at least a test script, a test algorithm tool, a test round, and test write data.
The test algorithm tools may include Memtest 86+, RST pro2, *** stress test, linpack, and the like.
It is understood that the test write data may include a timing characteristic (Pattern), and during the process of testing the memory, a series of timings are sent to the input pin of the memory to be tested, and the output timings are compared at the output pin of the memory to be tested, so as to test whether the memory to be tested satisfies the function.
In some embodiments, the test content of the test device for testing the memory to be tested according to the test policy may include: testing all faults in the memory, wherein the fault modes comprise: stuck-At Fault (SAF), transition Fault (TF), address-Decoder Fault (AF), data Retention Fault (DRF), disturb Fault (DF), stuck-Open Fault (SOF), coupling Fault (CF).
In some embodiments, the testing device tests the memory to be tested according to the testing policy, including:
when the test device executes the test script, setting BIOS parameters, and then automatically cold restarting;
after the test equipment is cold restarted, executing a test algorithm carried by the BIOS based on a test strategy in a BIOS starting stage;
after the test equipment executes the test algorithm carried by the BIOS, the test equipment enters an operating system;
and after the test equipment enters the operating system, executing a test algorithm under the operating system based on the test strategy.
Specifically, the testing device tests the memory to be tested according to the testing policy, including:
after the test equipment is started, the test equipment is booted from PXE (Pre-boot Execution Environment) on a local test server;
after the test equipment is started and enters the operating system, a test strategy corresponding to the serial number of the test equipment is downloaded from a local test server through a self-starting script of the operating system, and the test script in the test strategy is executed;
when the test device executes the test script, setting BIOS (Basic Input Output System) parameters, and then automatically cold restarting;
after the test equipment is cold restarted, executing a self-contained test algorithm of the BIOS based on a test strategy in a BIOS starting stage to generate test data of the self-contained test algorithm of the BIOS;
after the test equipment executes the test algorithm carried by the BIOS, the test equipment enters an operating system;
after the test equipment enters the operating system, a test algorithm under the operating system is executed based on the test strategy, and test data of the test algorithm under the operating system is generated.
As shown in fig. 5, in some embodiments, the test device may upload test data of a BIOS-owned test algorithm and test data of a test algorithm under an operating system to the local test server, and the local test server may generate a corresponding test report according to the received test data of the BIOS-owned test algorithm and the test data of the test algorithm under the operating system, and then automatically upload the test report to the cloud.
In some embodiments, the memory management module is further configured to: and analyzing the test data to determine a fault analysis result, wherein the fault analysis result at least comprises algorithm effectiveness, fault distribution and/or fault temperature distribution. The test data are uploaded to the cloud end, the cloud end exists in a database form, and various query interfaces of the database table are called through the http interface to sort out corresponding data.
As shown in fig. 5, in some embodiments, the analyzing the test data by the memory management module to determine the validity of the algorithm may include: for each fault mode, a large amount of test data is analyzed to determine which test algorithms have a high probability of detecting the fault mode, so that the test algorithms used for each fault mode are sorted out to be more effective.
In some embodiments, the analyzing the test data and determining the fault distribution by the memory management module may include: through analysis of the test data, the failure probabilities reported by different addresses of the memory to be tested and the probabilities of different addresses of the memory to be tested in a certain failure mode are sorted out.
In some embodiments, the analyzing the test data by the memory management module to determine the fault temperature distribution may include: the probability of each failure mode occurring at a different temperature is collated.
In some embodiments, the hybrid cloud-based memory automated testing system may further include an information display module for visualizing the testing policy and/or the testing data. For example, the information display module may include a display screen that may display test strategies, test data, and/or failure analysis results.
Fig. 2 is a block diagram of a hybrid cloud-based memory automation test system according to some embodiments of the present disclosure, and as shown in fig. 2, in some embodiments, a local test end module may include only at least one test device, and the test device may directly download a test policy corresponding to a serial number of the test device installed in the local test end module from a memory management module deployed on a public cloud, test a memory to be tested according to the test policy, and may directly send test data to a local test server after the test is completed.
Fig. 3 is a flowchart illustrating a hybrid cloud-based memory automation testing method according to some embodiments of the present disclosure, and as shown in fig. 3, the hybrid cloud-based memory automation testing method may include the following steps. In some embodiments, the hybrid cloud-based memory automated testing method may be performed by a local test server of the hybrid cloud-based memory automated testing system.
Step 310, establishing a communication connection.
The communication connection is used for interacting with a memory management module deployed on a public cloud.
Step 320, download the test strategy.
Wherein the test policy is stored in the memory management module.
Step 330, distributing the test strategy.
The test strategy is used for testing the memory to be tested.
Step 340, receiving test data.
The test data is uploaded by the test equipment where the memory to be tested is located.
In some embodiments, downloading a test policy comprises: and downloading the test strategy corresponding to the memory to be tested according to the serial number of the test equipment.
Fig. 4 is a flowchart illustrating a hybrid cloud-based memory automation testing method according to some embodiments of the present disclosure, and as shown in fig. 4, the hybrid cloud-based memory automation testing method may include the following steps. In some embodiments, the hybrid cloud-based memory automated testing method may be performed by a testing device of the hybrid cloud-based memory automated testing system.
Step 410, download the test strategy.
The testing strategy is acquired by a local testing server from a memory management module deployed on a public cloud.
Step 420, testing the memory to be tested based on the testing strategy to obtain testing data;
and step 430, uploading the test data.
In some embodiments, testing the memory to be tested based on the testing policy includes:
when the test script is executed, setting BIOS parameters, and then automatically cold restarting;
after cold restart, a test algorithm carried by the BIOS is executed based on a test strategy in the BIOS starting stage;
after the BIOS self-contained test algorithm is executed, the operating system is entered;
and after entering the operating system, executing a test algorithm under the operating system based on the test strategy.
In some embodiments, the hybrid cloud-based memory automated testing method and system may include at least the following technical effects:
1. by using the test method and the test system, different strategies (including algorithms, rounds, pat and the like) can be executed on different test equipment, the test result can be automatically reported, and the like, so that a full-automatic unattended high-efficiency memory test scheme can be realized, and the test result can be monitored and statistically analyzed;
2. by using the test method and the test system, the test progress can be configured and monitored at any time at the cloud;
3. by using the test method and the test system, a plurality of test devices can be controlled to test at the same time, and the efficiency is greatly improved;
4. by using the test method and the test system, the information of all the test memories of each local factory can be displayed on a large screen, and the information of all the test memories can also be displayed on the large screen of a super administrator, so that the factories in each region can be conveniently managed in an integrated manner, and the test method and the test system comprise information in various aspects such as test time, test round and the like.
5. By using the test method and the test system, statistical analysis can be carried out on test data, including effectiveness, fault distribution, fault temperature distribution and the like of an algorithm, the algorithm is optimized in later stages in the aspect, and a fault point is found in advance to provide support.
Having thus described the basic concept, it will be apparent to those skilled in the art that the foregoing detailed disclosure is to be regarded as illustrative only and not as limiting the present specification. Various modifications, improvements and adaptations to the present description may occur to those skilled in the art, although not explicitly described herein. Such modifications, improvements and adaptations are proposed in the present specification and thus fall within the spirit and scope of the exemplary embodiments of the present specification.
Also, the description uses specific words to describe embodiments of the description. Reference to "one embodiment," "an embodiment," and/or "some embodiments" means a feature, structure, or characteristic described in connection with at least one embodiment of the specification. Therefore, it is emphasized and should be appreciated that two or more references to "an embodiment" or "one embodiment" or "an alternative embodiment" in various places throughout this specification are not necessarily all referring to the same embodiment. Furthermore, some features, structures, or characteristics of one or more embodiments of the specification may be combined as appropriate.
Additionally, the order in which the elements and sequences of the process are recited in the specification, the use of alphanumeric characters, or other designations, is not intended to limit the order in which the processes and methods of the specification occur, unless otherwise specified in the claims. While various presently contemplated embodiments of the invention have been discussed in the foregoing disclosure by way of example, it is to be understood that such detail is solely for that purpose and that the appended claims are not limited to the disclosed embodiments, but, on the contrary, are intended to cover all modifications and equivalent arrangements that are within the spirit and scope of the embodiments herein. For example, although the system components described above may be implemented by hardware devices, they may also be implemented by software-only solutions, such as installing the described system on an existing server or mobile device.
Similarly, it should be noted that in the foregoing description of embodiments of the present specification, various features are sometimes grouped together in a single embodiment, figure, or description thereof for the purpose of streamlining the disclosure aiding in the understanding of one or more of the embodiments. This method of disclosure, however, is not intended to imply that more features than are expressly recited in a claim. Indeed, the embodiments may be characterized as having less than all of the features of a single disclosed embodiment.
Finally, it should be understood that the embodiments described herein are merely illustrative of the principles of the embodiments of the present disclosure. Other variations are also possible within the scope of this description. Thus, by way of example, and not limitation, alternative configurations of the embodiments of the specification can be considered consistent with the teachings of the specification. Accordingly, the embodiments of the present description are not limited to only those embodiments explicitly described and depicted herein.
Claims (12)
1. A memory automatic test system based on a hybrid cloud is characterized by comprising a memory management module and a local test end module, wherein the memory management module and the local test end module are deployed on a public cloud;
the local test end module comprises at least one local test end;
the local testing terminal comprises a local testing server and at least one testing device, a memory to be tested is installed on the testing device, the local testing server is in communication connection with the memory management module, the local testing server is used for downloading a testing strategy from the memory management module, the testing device is used for downloading the testing strategy from the local testing server and testing the memory to be tested according to the testing strategy to obtain testing data, and the testing device is also used for sending the testing data to the local testing server;
the local test server is also used for sending the test data to the memory management module.
2. The hybrid cloud-based memory automated testing system of claim 1, wherein the local test server establishes a communication connection with the memory management module, comprising:
the local test server sends a communication connection request;
and the memory management module verifies and authenticates the local test server based on the communication connection request, and establishes communication connection with the local test server.
3. The hybrid cloud-based automated memory testing system of claim 1, wherein the local test server establishes a communication connection with the memory management module, and wherein the communication connection comprises:
and the local test server establishes communication connection with the memory management module through a secret key.
4. The hybrid cloud-based memory automated testing system of claim 1, wherein the local test server downloads the test policy from the memory management module, comprising:
and the local test server downloads the test strategy corresponding to the memory to be tested from the memory management module according to the serial number of the test equipment.
5. The hybrid cloud-based automated memory testing system of claim 1, wherein the testing policy comprises at least a testing script, a testing algorithm tool, a testing round, and testing write data.
6. The hybrid cloud-based automated memory testing system of claim 1, wherein the testing device tests the memory to be tested according to the testing policy, comprising:
when the test device executes the test script, setting BIOS parameters, and then automatically performing cold restart;
after the test equipment is cold restarted, executing a test algorithm carried by the BIOS based on the test strategy in a BIOS starting stage;
after the test equipment executes the test algorithm carried by the BIOS, the test equipment enters an operating system;
and after the test equipment enters the operating system, executing a test algorithm under the operating system based on the test strategy.
7. The hybrid cloud-based memory automated testing system of any one of claims 1-6, wherein the memory management module is further configured to:
analyzing the test data to determine a fault analysis result, wherein the fault analysis result at least comprises algorithm effectiveness, fault distribution and/or fault temperature distribution.
8. The hybrid cloud-based automated memory testing system of any one of claims 1-6, further comprising an information display module configured to visualize the testing policy and/or the testing data.
9. A memory automatic testing method based on a hybrid cloud is characterized by comprising the following steps:
establishing a communication connection, wherein the communication connection is used for interacting with a memory management module deployed on a public cloud;
downloading a test strategy, wherein the test strategy is stored in the memory management module;
distributing the test strategy, wherein the test strategy is used for testing the memory to be tested;
and receiving test data, wherein the test data is uploaded by the test equipment where the memory to be tested is located.
10. The hybrid cloud-based automated memory testing method according to claim 9, wherein the downloading of the test policy comprises:
and downloading the test strategy corresponding to the memory to be tested according to the serial number of the test equipment.
11. A memory automatic testing method based on a hybrid cloud is characterized by comprising the following steps:
downloading a test strategy, wherein the test strategy is obtained by a local test server from a memory management module deployed on a public cloud;
testing the memory to be tested based on the testing strategy to obtain testing data;
and uploading the test data.
12. The hybrid cloud-based automated memory testing method of claim 11, wherein the testing the memory to be tested based on the testing policy comprises:
when the test script is executed, setting BIOS parameters, and then automatically cold restarting;
after cold restart, a test algorithm carried by the BIOS is executed based on the test strategy in the BIOS starting stage;
after the BIOS self-contained test algorithm is executed, entering an operating system;
and after entering the operating system, executing a test algorithm under the operating system based on the test strategy.
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Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1781083A (en) * | 2001-11-27 | 2006-05-31 | 摩托罗拉公司 | System for providing continuity between messaging clients and method therefor |
| CN101281485A (en) * | 2007-04-06 | 2008-10-08 | 深圳市顶星数码网络技术有限公司 | Computer testing method without hard disc |
| CN102455919A (en) * | 2010-10-19 | 2012-05-16 | 英业达股份有限公司 | Automatic optimization setting method for basic input output system(BIOS) |
| CA2770789A1 (en) * | 2011-03-11 | 2012-09-11 | Desktopsites Inc. | System and method for lauching a resource in a network |
| CN113986719A (en) * | 2021-10-09 | 2022-01-28 | 湖南麒麟信安科技股份有限公司 | Automatic test method and system for large-scale cluster performance based on cloud service |
| CN114286358A (en) * | 2020-09-27 | 2022-04-05 | 大唐移动通信设备有限公司 | Method, device and system for processing test data and readable storage medium |
| CN114546747A (en) * | 2021-12-31 | 2022-05-27 | 中电科技(北京)股份有限公司 | BMC cold restart pressure test system and method |
-
2022
- 2022-12-23 CN CN202211665140.1A patent/CN115981937A/en active Pending
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1781083A (en) * | 2001-11-27 | 2006-05-31 | 摩托罗拉公司 | System for providing continuity between messaging clients and method therefor |
| CN101281485A (en) * | 2007-04-06 | 2008-10-08 | 深圳市顶星数码网络技术有限公司 | Computer testing method without hard disc |
| CN102455919A (en) * | 2010-10-19 | 2012-05-16 | 英业达股份有限公司 | Automatic optimization setting method for basic input output system(BIOS) |
| CA2770789A1 (en) * | 2011-03-11 | 2012-09-11 | Desktopsites Inc. | System and method for lauching a resource in a network |
| CN114286358A (en) * | 2020-09-27 | 2022-04-05 | 大唐移动通信设备有限公司 | Method, device and system for processing test data and readable storage medium |
| CN113986719A (en) * | 2021-10-09 | 2022-01-28 | 湖南麒麟信安科技股份有限公司 | Automatic test method and system for large-scale cluster performance based on cloud service |
| CN114546747A (en) * | 2021-12-31 | 2022-05-27 | 中电科技(北京)股份有限公司 | BMC cold restart pressure test system and method |
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