CN115867778A - 光频域反射计测装置及方法 - Google Patents
光频域反射计测装置及方法 Download PDFInfo
- Publication number
- CN115867778A CN115867778A CN202080103152.8A CN202080103152A CN115867778A CN 115867778 A CN115867778 A CN 115867778A CN 202080103152 A CN202080103152 A CN 202080103152A CN 115867778 A CN115867778 A CN 115867778A
- Authority
- CN
- China
- Prior art keywords
- local
- optical
- light
- optical frequency
- frequency domain
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000002168 optical frequency-domain reflectometry Methods 0.000 title claims description 16
- 238000000034 method Methods 0.000 title claims description 9
- 230000003287 optical effect Effects 0.000 claims abstract description 51
- 239000000835 fiber Substances 0.000 claims abstract description 30
- 238000005259 measurement Methods 0.000 claims abstract description 26
- 230000003111 delayed effect Effects 0.000 claims abstract description 8
- 230000035559 beat frequency Effects 0.000 claims description 13
- 238000003745 diagnosis Methods 0.000 abstract description 2
- 239000006185 dispersion Substances 0.000 description 4
- 239000013307 optical fiber Substances 0.000 description 4
- 238000005070 sampling Methods 0.000 description 4
- 238000001228 spectrum Methods 0.000 description 4
- 238000012360 testing method Methods 0.000 description 4
- 239000000523 sample Substances 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 1
- 238000012512 characterization method Methods 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000004587 chromatography analysis Methods 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000001934 delay Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000001902 propagating effect Effects 0.000 description 1
- 238000002310 reflectometry Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
- G01D5/26—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
- G01D5/32—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light
- G01D5/34—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells
- G01D5/353—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells influencing the transmission properties of an optical fibre
- G01D5/35338—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells influencing the transmission properties of an optical fibre using other arrangements than interferometer arrangements
- G01D5/35354—Sensor working in reflection
- G01D5/35358—Sensor working in reflection using backscattering to detect the measured quantity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
- G01M11/31—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
- G01M11/3109—Reflectometers detecting the back-scattered light in the time-domain, e.g. OTDR
- G01M11/3127—Reflectometers detecting the back-scattered light in the time-domain, e.g. OTDR using multiple or wavelength variable input source
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
- G01B9/02002—Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies
- G01B9/02004—Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies using frequency scans
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02055—Reduction or prevention of errors; Testing; Calibration
- G01B9/02062—Active error reduction, i.e. varying with time
- G01B9/02067—Active error reduction, i.e. varying with time by electronic control systems, i.e. using feedback acting on optics or light
- G01B9/02069—Synchronization of light source or manipulator and detector
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02055—Reduction or prevention of errors; Testing; Calibration
- G01B9/02075—Reduction or prevention of errors; Testing; Calibration of particular errors
- G01B9/02078—Caused by ambiguity
- G01B9/02079—Quadrature detection, i.e. detecting relatively phase-shifted signals
- G01B9/02081—Quadrature detection, i.e. detecting relatively phase-shifted signals simultaneous quadrature detection, e.g. by spatial phase shifting
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02083—Interferometers characterised by particular signal processing and presentation
- G01B9/02084—Processing in the Fourier or frequency domain when not imaged in the frequency domain
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/0209—Low-coherence interferometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
- G01M11/31—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
- G01M11/3109—Reflectometers detecting the back-scattered light in the time-domain, e.g. OTDR
- G01M11/3145—Details of the optoelectronics or data analysis
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
- G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
- G01S17/06—Systems determining position data of a target
- G01S17/08—Systems determining position data of a target for measuring distance only
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
- G01S7/481—Constructional features, e.g. arrangements of optical elements
- G01S7/4816—Constructional features, e.g. arrangements of optical elements of receivers alone
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
- G01S7/497—Means for monitoring or calibrating
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B2290/60—Reference interferometer, i.e. additional interferometer not interacting with object
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Networks & Wireless Communication (AREA)
- Optics & Photonics (AREA)
- Remote Sensing (AREA)
- Radar, Positioning & Navigation (AREA)
- Analytical Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- Electromagnetism (AREA)
- Signal Processing (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Mathematical Physics (AREA)
- Automation & Control Theory (AREA)
- Optical Transform (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
本公开的目的在于,能够以100μm以下的空间分辨率测量超过1km的远距离,使对设置在远距离的光学设备的健全性进行诊断成为可能。本公开的装置为光频域反射计测装置,包括:本地光延迟光纤,使本地光延迟;光90度混合器,输入通过所述本地光延迟光纤延迟后的本地光以及来自测量对象的后向散射光,使本地光和后向散射光发生干涉,生成由该干涉产生的节拍信号的同相分量以及正交分量;和,平衡光电检测器,检测所述节拍信号的同相分量和正交分量;所述装置对以所述本地光延迟光纤为基准的相对距离,测量测量对象的光频率响应。
Description
技术领域
本公开涉及光频域反射计测技术。
背景技术
在光频域反射计测技术(OFDR)中,对绝对距离z来测量测量对象的光频率响应,通过计算其傅立叶变换,得到后向散射波形(例如,参照非专利文献1。)。此时,通过由参考干涉仪得到的时钟信号,以等间隔的光频率(参考干涉仪的FSR)对测量对象的光频率响应进行采样。
根据采样定理,在OFDR中可测量的距离由参考干涉仪的光纤长度决定。此外,如果使参考干涉仪的光纤长度比光源的相干长度长,则时钟的质量变差,无法以等间隔对节拍信号进行采样,无法正确地测量光频率响应(无法分析后向散射光波形)。因此,现有的测量性能为测量距离数10m、空间分辨率100μm以下(例如,参照非专利文献2)。
现有技术文献
非专利文献
非专利文献1:U.Glombitza and E.Brinkmeyer,"Cohenret frequency-domainreflectometry for characterization of single-mode integrated-opticalwaveguides",IEEE JLT,vol.11,no.8,pp.1377-1384,Aug.1993.
非专利文献2:B.J.Soller等,"High resolution optical frequency domainreflectometry for characterization of components and assemblies",Opt.Exp.,vol.13,no.2,pp.666-674,Jan.2005.
发明内容
发明要解决的问题
本公开的目的在于,能够以100μm以下的空间分辨率测量超过1km的远距离,使对设置在远距离的光学设备的健全性进行诊断成为可能。
解决问题的手段
本公开的装置,
在光频域反射计测装置中,包括:
本地光延迟光纤,使本地光延迟;
光90度混合器,输入通过所述本地光延迟光纤延迟后的本地光以及来自测量对象的后向散射光,使本地光和后向散射光发生干涉,生成由该干涉产生的节拍信号的同相分量和正交分量;和,
平衡光电检测器,检测所述节拍信号的同相分量和正交分量;
所述装置对以所述本地光延迟光纤为基准的相对距离,测量测量对象的光频率响应。
本公开的方法为光频域反射计测装置执行的方法,
所述光频域反射计测装置包括:
本地光延迟光纤,使本地光延迟;
光90度混合器,输入通过所述本地光延迟光纤延迟后的本地光以及来自测量对象的后向散射光,分别输出由本地光和后向散射光的干涉产生的节拍信号的同相分量以及正交分量;和,
平衡光电检测器,检测所述节拍信号的同相分量和正交分量;
所述方法对以所述本地光延迟光纤为基准的相对距离,测量测量对象的光频率响应。
发明效果
根据本公开,能够以100μm以下的空间分辨率测量超过1km的远距离,能够使对设置在远距离的光学设备的健全性进行诊断成为可能。
附图说明
图1表示本公开的测试***的结构例。
图2表示观测与绝对距离z对应的拍频fbeat的情况下的***结构例。
图3表示本公开的拍频与距离的关系的一例。
图4表示使用图2的结构测量的拍频与距离的关系的一例。
图5表示使用图2的结构测量的频谱的一例。
图6表示使用本公开的结构测量的频谱的一例。
图7表示3km处的菲涅耳反射测量结果的一例。
具体实施方式
以下,将参照附图详细地说明本公开的实施方式。另外,本公开不限于以下所示的实施方式。这些实施的示例仅仅是示例,本公开能够基于本领域技术人员的知识,以实施各种改变、改良的方式来实施。另外,在本说明书以及附图中,附图标记相同的结构要素表示彼此相同的结构要素。
图1示出了本公开的测试***的结构例。在本公开的测试***中,光频域反射计测装置91连接到作为测量对象的待测光纤92。光频域反射计测装置91包括:波长扫描光源(TLS,Swept Light Source)11、耦合器12、循环器13、光90度混合器21、平衡光电检测器(BPD)22、LPF(Low Pass Filter,低通滤波器)23、A/D转换电路24、辅助干涉仪30、本地延迟光纤40。
耦合器12将来自TLS11的光分支为本地光和探测光。耦合器14对来自耦合器12的本地光进行分支。一本地光被输入到辅助干涉仪30,另一本地光被输入到90度混合器21。循环器13将探测光输入到待测光纤92,将待测光纤92散射的后向散射光输出到90度混合器21。
90度混合器21使本地光与后向散射光干涉,生成因该干涉而产生的信号(节拍信号)的同相分量和正交分量。
BPD22分别检测节拍信号的同相分量以及正交分量。
LPF23仅使来自BPD22的输出信号、即本地光和后向散射光的节拍信号的低频分量透过。
A/D124按照来自辅助干涉仪30的采样时钟,将从LPF23输出的模拟信号转换成数字信号。
此处,将参照图2,表示观测与绝对距离z对应的拍频fbeat的情况下的***结构例。在图2所示的结构中,不包括本地延迟光纤40以及光90度混合器21,只有1个平衡光电检测器122以及LPF123。
在图2所示的结构中,代替90度混合器21而包括耦合器121。该情况下,由耦合器121生成本地光和后向散射光的节拍信号,并输入到BPD122。此外,A/D124以由辅助干涉仪130赋予了延迟τAUX的采样时钟,将模拟信号转换成数字信号。在该情况下,测量对象的光频率响应r~(ν)由下式表示(例如,参照非专利文献1的式(5)。)。
[数学式1]
其中,参数如下所示。
r(τ):反射系数
v:光频率
τ:往返传播距离z引起的延迟,为τ=2z/c。
z:测量对象的长度方向距离
c:在测量对象中传播的光速
对光频率响应r~(ν)进行傅立叶变换,得到后向散射光波形r(τ)。
[数学式2]
此外,在光频域中对光频率响应r~(ν)进行采样。例如,采样周期是1/τAux.=FSR的情况下,则可测量的最大延迟(奈奎斯特频率)是1/(2*FSR)=τAux./2。因此,参考干涉仪130的长度决定可测量的绝对距离的大小。
在图2所示的现有方式中,由于本地光的延迟量为零,因此如图3所示,根据后向散射光的延迟量(绝对距离)来分配拍频。因此,在图2所示的结构中,不需要90度混合器21。
(光90度混合器21的作用)
在本公开中,用本地光的延迟光纤40对测量距离施加距离偏移来选择测量距离。此时,如图4所示,本地光的延迟量的前侧和后侧的后向散射光发生干涉。尽管根据相对距离来分配拍频,但是相对距离相同的2个地点(以本地光的延迟量为对称点的前后2个地点)具有相同的拍频。比本地光的延迟τD短的距离的反射光具有负的拍频,比本地光的延迟τD长的距离具有正的拍频。因此,本公开用光90度混合器21以及BPD22分别检测节拍信号的同相分量以及正交分量。由此,能够判别拍频的正负,判定是比本地光的延迟τD短还是长。
本公开的光频率响应可由下式表示:
[数学式3]
其中,参数如下所示。
r(τR):反射系数
LD:本地光的延迟光纤长度
τR:以本地光的延迟光纤赋予的延迟量为基准的相对延迟
zR:以本地光的延迟光纤长度为基准的相对长度
因此,本公开中,延迟量τAux.决定可测量的最大相对延迟τR。可测量的延迟范围为|τR|<τAux/2,对相对距离zR,对数学式4的范围的光频率响应进行测量。
[数学式4]
|z-LD/2|≤cτAux./4 (4)
这样,在本公开中,参考干涉仪30中的延迟τAux.决定可测量的相对距离的大小。
(本地光延迟光纤40的作用)
本公开中,不仅对本地光赋予延迟τAux,还赋予传播了与延迟τD相当的光纤长度时的波长色散,生成传播了延迟τD的后向散射光的副本。通过使该副本在90度混合器21中与后向散射光干涉,能够补偿波长色散,并能够选择性地检测与来自延迟τD周边的后向散射光的节拍信号。
此外,在本公开中,参考干涉仪30中的延迟τAux.决定可测量的相对距离的大小。因此,即使是在待测光纤92超过激光器的相干长度的远距离测量,也可以使用比激光器的相干长度短的参考干涉仪30。因此,本公开没有劣化时钟信号的质量。
图5中表示了使用图2的结构测量的频谱的一例。在A/D124中,观测了与绝对距离z相对应的拍频fbeat。
图6中表示了使用本公开的结构测量的频谱的一例。在本公开中,观测了与以本地光延迟光纤40中的延迟τD为基准的相对距离z相对应的拍频fbeat。
(实现远距离超高空间分辨率测量)
图7中表示了3km处的菲涅耳反射测量结果的一例。可知能够检测40μm的反射。这样,根据本公开,可以以100μm以下的空间分辨率测量超过km的远距离。因此,使对设置在远距离的光学设备的健全性进行诊断成为可能。
(本公开的要点)
·能够测量在以本地光延迟光纤为基准的相对距离内的后向散射光。
·延迟光纤起相对距离测量的基准距离和波长色散补偿的作用。
·通过加长本地光延迟光纤,可以测量远距离的后向散射光。
另外,本公开的光频域反射计测装置中包括的信号处理装置(未图示)能够由计算机和程序实现,程序既可以存储在存储介质中,也可以通过网络提供。
产业上的应用可能性
本公开可应用于信息通信产业。
附图标记说明
11:TLS
12、14、31、34:耦合器
13:循环器
21:90度混合器
22、35、122:BPD
23、123:LPF
24、124:A/D
30、130:辅助干涉仪
32、33:传输路径
91:光频域反射计测装置
92:待测光纤。
Claims (3)
1.光频域反射计测装置,
在光频域反射计测装置中,包括:
本地光延迟光纤,使本地光延迟;
光90度混合器,输入通过所述本地光延迟光纤延迟后的本地光以及来自测量对象的后向散射光,使本地光和后向散射光发生干涉,生成由该干涉产生的节拍信号的同相分量和正交分量;和,
平衡光电检测器,检测所述节拍信号的同相分量和正交分量;
所述装置对以所述本地光延迟光纤为基准的相对距离,测量测量对象的光频率响应。
2.根据权利要求1所述的光频域反射计测装置,
基于所述节拍信号的同相分量以及正交分量,判别拍频的正负。
3.光频域反射计测方法,为光频域反射计测装置执行的方法,
所述光频域反射计测装置包括:
本地光延迟光纤,使本地光延迟;
光90度混合器,输入通过所述本地光延迟光纤延迟后的本地光以及来自测量对象的后向散射光,分别输出由本地光和后向散射光的干涉产生的节拍信号的同相分量以及正交分量;和,
平衡光电检测器,检测所述节拍信号的同相分量和正交分量;
所述方法对以所述本地光延迟光纤为基准的相对距离,测量测量对象的光频率响应。
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2020/034817 WO2022059050A1 (ja) | 2020-09-15 | 2020-09-15 | 光周波数領域反射計測装置及び方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
CN115867778A true CN115867778A (zh) | 2023-03-28 |
Family
ID=80776537
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN202080103152.8A Pending CN115867778A (zh) | 2020-09-15 | 2020-09-15 | 光频域反射计测装置及方法 |
Country Status (5)
Country | Link |
---|---|
US (1) | US20230341245A1 (zh) |
EP (1) | EP4215894A4 (zh) |
JP (1) | JP7367879B2 (zh) |
CN (1) | CN115867778A (zh) |
WO (1) | WO2022059050A1 (zh) |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5202485B2 (ja) * | 2009-09-09 | 2013-06-05 | 日本電信電話株式会社 | 光線路反射分布測定方法と装置及び光線路設備監視システム |
EP2596387B1 (en) * | 2010-09-01 | 2021-10-06 | Services Pétroliers Schlumberger | Distributed fiber optic sensor system with improved linearity |
JP6277147B2 (ja) * | 2015-03-04 | 2018-02-07 | 日本電信電話株式会社 | 光ファイバ振動測定方法及びシステム |
IL243731B (en) * | 2016-01-23 | 2021-01-31 | Dsit Solutions Ltd | Optical reflectometry in the frequency plane by non-linear frequency scanning |
JP7331373B2 (ja) * | 2019-02-12 | 2023-08-23 | 日本電信電話株式会社 | 光周波数反射計測装置およびその計測方法 |
-
2020
- 2020-09-15 EP EP20954036.8A patent/EP4215894A4/en active Pending
- 2020-09-15 US US18/025,697 patent/US20230341245A1/en active Pending
- 2020-09-15 WO PCT/JP2020/034817 patent/WO2022059050A1/ja unknown
- 2020-09-15 CN CN202080103152.8A patent/CN115867778A/zh active Pending
- 2020-09-15 JP JP2022550053A patent/JP7367879B2/ja active Active
Also Published As
Publication number | Publication date |
---|---|
EP4215894A4 (en) | 2024-05-22 |
EP4215894A1 (en) | 2023-07-26 |
JP7367879B2 (ja) | 2023-10-24 |
WO2022059050A1 (ja) | 2022-03-24 |
US20230341245A1 (en) | 2023-10-26 |
JPWO2022059050A1 (zh) | 2022-03-24 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Froggatt et al. | Characterization of polarization-maintaining fiber using high-sensitivity optical-frequency-domain reflectometry | |
CN107515017A (zh) | 一种光波移频调制的光频域反射计 | |
JP2018048917A (ja) | 光ファイバ試験装置及び光ファイバ試験方法 | |
Badar et al. | Integrated auxiliary interferometer for self-correction of nonlinear tuning in optical frequency domain reflectometry | |
CN111678584A (zh) | 一种带光源频移校准辅助通道的光纤振动测量装置及方法 | |
US11463163B2 (en) | Device for measuring optical frequency reflection and measurement method thereof | |
US11522606B2 (en) | Phase measurement method, signal processing device, and program | |
US5654793A (en) | Method and apparatus for high resolution measurement of very low levels of polarization mode dispersion (PMD) in single mode optical fibers and for calibration of PMD measuring instruments | |
JP2017110953A (ja) | 伝搬モード間群遅延差測定方法及び伝搬モード間群遅延差測定システム | |
JP2019105530A (ja) | モード遅延時間差分布試験方法および試験装置 | |
JP2020051941A (ja) | 光ファイバ歪み及び温度測定装置並びに光ファイバ歪み及び温度測定方法 | |
CN212030564U (zh) | 一种光源频移校准辅助通道结构及光纤振动测量装置 | |
JP5053120B2 (ja) | 光ファイバの後方ブリルアン散乱光測定方法及び装置 | |
CN110375779B (zh) | 提高ofdr频域采样率的装置和方法 | |
WO2023160490A1 (zh) | 一种传输信号的方法和装置 | |
CA2219286A1 (en) | Measurement of polarization mode dispersion | |
JP5641178B2 (ja) | 光リフレクトメトリ測定方法及び光リフレクトメトリ測定装置 | |
WO2022259437A1 (ja) | 振動測定器及び振動測定方法 | |
CN115867778A (zh) | 光频域反射计测装置及方法 | |
CN113607074B (zh) | 一种光频域反射中基于重叠窗口的应变传感解调方法 | |
JP2006242634A (ja) | 光伝送媒体の分散測定方法及び装置 | |
JP6751371B2 (ja) | 空間モード分散測定方法及び空間モード分散測定装置 | |
CN114199514B (zh) | 基于光频域反射分布式传感的假峰消除方法 | |
JP7069993B2 (ja) | 光スペクトル線幅演算方法、装置およびプログラム | |
WO2023053263A1 (ja) | 光パルス試験方法及び光パルス試験装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination |